{"meta":{"query_hash":"215ca0fc7a49","filters":{"venue":"Characterization of Materials"},"cohort_total":7,"direct_labels_cover":0,"predictions_cover":7,"exported":7,"export_cap":100000,"truncated":false,"label_status":"direct model label, unvalidated","prediction_status":"machine_predicted_unvalidated (Codex and Gemma teacher distillation)","score_status":"score_only:v0-immature-baseline","snapshot":{"source":"OpenAlex, pinned release, all 482 partitions","release":"2026-06-24","frame_built":"2026-07-12"},"permalink":"https://metacan.xera.ac/q/215ca0fc7a49","api":"https://metacan.xera.ac/api/v1/cohort?venue=Characterization+of+Materials"},"results":[{"id":"W1568483219","doi":"10.1002/0471266965.com140","title":"Elastic Recoil Detection Analysis","year":2012,"lang":"en","type":"other","venue":"Characterization of Materials","topic":"Ion-surface interactions and analysis","field":"Engineering","cited_by":3,"is_retracted":false,"has_abstract":true,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Université de Montréal; Université du Québec à Montréal","funders":"","keywords":"Elastic recoil detection; Stopping power; Recoil; Resolution (logic); Beam (structure); FOIL method; Ion beam analysis; Energy (signal processing); Sensitivity (control systems); Filter (signal processing); Ion; Ion beam; Materials science; Optics; Physics; Nuclear physics; Computer science; Engineering; Detector; Electronic engineering; Artificial intelligence","score_opus":0.00625915773150544,"score_gpt":0.1985492072386786,"score_spread":0.19229004950717318,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W1568483219","genre_codex":"methods","genre_gemma":"methods","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"methods","genre_consensus":"methods","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.32967496,0.009051543,0.5245036,0.00037242114,0.0006350534,0.0003315533,0.0039724675,0.006111802,0.12534669],"genre_scores_gemma":[0.82077175,0.0033020726,0.109770276,0.00033308542,0.000081454426,0.0001509866,0.0045505757,0.0012697547,0.059770096],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9986099,0.000059398993,0.00004809387,0.0002562091,0.0008780482,0.0001483321],"domain_scores_gemma":[0.9992349,0.00013406735,0.000100192745,0.00009221364,0.00041071585,0.000027967988],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0005990569,0.0010884508,0.0006616508,0.004157513,0.00057161856,0.0014385292,0.0013366432,0.0006217992,0.014371856],"category_scores_gemma":[0.00090504845,0.0005063453,0.0005062541,0.0020741995,0.00042202204,0.00096143136,0.0010233963,0.00068719557,0.00415853],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.0005812248,0.00009560052,0.012072743,0.0010125512,0.00019588287,0.0008357896,0.00037486848,0.00500224,0.702166,0.011025664,0.0069635822,0.25967386],"study_design_scores_gemma":[0.000014879109,0.00012899934,0.010046083,0.000108226515,0.000097876095,0.0010991337,0.00036398813,0.026628215,0.8836714,0.0020990896,0.07566533,0.00007677037],"about_ca_topic_score_codex":0.00084092986,"about_ca_topic_score_gemma":0.0014063208,"teacher_disagreement_score":0.014371856,"about_ca_system_score_codex":0.0005710876,"about_ca_system_score_gemma":0.00039242223,"threshold_uncertainty_score":0.048078597},"labels":[],"label_agreement":null},{"id":"W1578705465","doi":"10.1002/0471266965.com123","title":"Magnetization Characterization of Superconductors","year":2012,"lang":"en","type":"other","venue":"Characterization of Materials","topic":"Physics of Superconductivity and Magnetism","field":"Physics and Astronomy","cited_by":0,"is_retracted":false,"has_abstract":true,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Polytechnique Montréal; Hydro-Québec","funders":"","keywords":"Superconductivity; Diamagnetism; Meissner effect; Magnetization; Condensed matter physics; Liquid helium; Characterization (materials science); Magnetic field; High-temperature superconductivity; Flux pumping; Critical field; Materials science; Liquid nitrogen; Engineering physics; Electrical resistivity and conductivity; Physics; Helium; Nanotechnology","score_opus":0.013102544333229313,"score_gpt":0.21890702766003076,"score_spread":0.20580448332680146,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W1578705465","genre_codex":"empirical","genre_gemma":"methods","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"methods","genre_consensus":null,"domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.93954074,0.0046853144,0.026873542,0.00017207974,0.000086336964,0.000076263714,0.00095979206,0.00038584013,0.027220028],"genre_scores_gemma":[0.9880129,0.00051460566,0.006698455,0.000026253536,0.000022623675,0.000023205148,0.0005119238,0.000039566687,0.0041504954],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9997857,0.000030711373,0.000015689364,0.000031540516,0.00011647927,0.000019819452],"domain_scores_gemma":[0.9996588,0.000043735705,0.0000472258,0.000026911992,0.00020300457,0.000020264102],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00022824516,0.00023251584,0.00020999758,0.0016242292,0.0003216297,0.00036837324,0.00025692632,0.00024072733,0.0021877247],"category_scores_gemma":[0.00041531696,0.000060054466,0.00007121526,0.00052303704,0.000281313,0.0003933074,0.00022173033,0.00018723404,0.0005057645],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.000089572786,0.000029922488,0.0059347413,0.00023277347,0.000009729782,0.00018096858,0.0001709777,0.00041564403,0.96169835,0.0019864596,0.0006194008,0.02863152],"study_design_scores_gemma":[0.000007132238,0.00012973185,0.02664752,0.00003638883,0.000012741865,0.00083626655,0.00020066148,0.0048403023,0.94523466,0.0008138222,0.021221371,0.000019473637],"about_ca_topic_score_codex":0.00040914214,"about_ca_topic_score_gemma":0.0006890088,"teacher_disagreement_score":0.0021877247,"about_ca_system_score_codex":0.0001917157,"about_ca_system_score_gemma":0.00015880496,"threshold_uncertainty_score":0.0073186755},"labels":[],"label_agreement":null},{"id":"W1949785881","doi":"10.1002/0471266965.com094","title":"Particle‐Induced X‐Ray Emission","year":2002,"lang":"en","type":"other","venue":"Characterization of Materials","topic":"X-ray Spectroscopy and Fluorescence Analysis","field":"Physics and Astronomy","cited_by":40,"is_retracted":false,"has_abstract":true,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of Guelph","funders":"","keywords":"Microbeam; Microprobe; Beam (structure); Proton; Spectrometer; Materials science; Charged particle; Ion beam; Quadrupole; Micrometer; Atomic physics; Optics; Ion; Chemistry; Nuclear physics; Physics","score_opus":0.013050480391595377,"score_gpt":0.24318785949655447,"score_spread":0.2301373791049591,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W1949785881","genre_codex":"empirical","genre_gemma":"other","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"other","genre_consensus":null,"domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.67727834,0.00554072,0.23576257,0.0006664757,0.00045089828,0.0003672231,0.0032463113,0.0036382717,0.07304908],"genre_scores_gemma":[0.8716214,0.0024195728,0.0672672,0.0004143795,0.00004497015,0.00031110353,0.003547856,0.00049259537,0.053880934],"study_design_codex":"bench_or_experimental","study_design_gemma":"not_applicable","domain_scores_codex":[0.99969065,0.000022966515,0.000016377404,0.000105453706,0.0001257279,0.000038944378],"domain_scores_gemma":[0.9997937,0.00007292357,0.000018520193,0.00003248158,0.00006317982,0.000019237654],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00025659046,0.00034177676,0.00025242608,0.00030176295,0.00027144587,0.00045566433,0.00047805387,0.0003168058,0.010030958],"category_scores_gemma":[0.0002556028,0.00027509755,0.00022425124,0.00034130397,0.00025848803,0.00033313263,0.000565664,0.0005375986,0.0020717888],"study_design_candidate":"not_applicable","study_design_consensus":null,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00007764093,0.00001740913,0.000403425,0.00017246071,0.000012660447,0.000106073494,0.000043854703,0.0001522483,0.9861704,0.0009865329,0.0012613921,0.010595991],"study_design_scores_gemma":[0.0000105211,0.000037629965,0.0013677876,0.000011395937,0.0000061091605,0.00013571854,0.000015384361,0.00077936234,0.9802674,0.00013925125,0.017222876,0.0000065458958],"about_ca_topic_score_codex":0.0002440359,"about_ca_topic_score_gemma":0.00031597447,"teacher_disagreement_score":0.010030958,"about_ca_system_score_codex":0.00031841913,"about_ca_system_score_gemma":0.00022164642,"threshold_uncertainty_score":0.03355688},"labels":[],"label_agreement":null},{"id":"W1954480451","doi":"10.1002/0471266965.com102.pub2","title":"Thermal Diffusivity by The Laser Flash Technique","year":2012,"lang":"en","type":"other","venue":"Characterization of Materials","topic":"Thermography and Photoacoustic Techniques","field":"Engineering","cited_by":8,"is_retracted":false,"has_abstract":true,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Advantage Forensics (Canada); Dalhousie University","funders":"","keywords":"Thermal diffusivity; Laser flash analysis; Heat transfer; Laser; Mechanics; Thermal; Materials science; Thermal conduction; Thermodynamics; Optics; Physics","score_opus":0.005336620920365236,"score_gpt":0.18743550830567596,"score_spread":0.18209888738531071,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W1954480451","genre_codex":"methods","genre_gemma":"methods","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"methods","genre_consensus":"methods","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.45072454,0.020812478,0.48276225,0.00064108655,0.00066142925,0.00050027156,0.0027801625,0.0024450477,0.03867275],"genre_scores_gemma":[0.829374,0.007568803,0.1401563,0.00014404311,0.000054639604,0.00044287127,0.00070214836,0.0002784639,0.021278644],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.99924064,0.00013800187,0.00004194098,0.0002333794,0.00028748022,0.000058634967],"domain_scores_gemma":[0.9989849,0.00036833223,0.00017591917,0.00010153397,0.0003442698,0.000025092697],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0006406649,0.00067207543,0.0004020885,0.0018949927,0.00034421333,0.0005132767,0.00077523105,0.00051218027,0.005322323],"category_scores_gemma":[0.0011366134,0.0005158252,0.00035227233,0.001076675,0.0004929244,0.0013612463,0.0004464364,0.00091891165,0.0016336334],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00014715258,0.00003916096,0.0008794482,0.00037678928,0.000022467757,0.00006861561,0.00017864263,0.0010682851,0.95981866,0.0022720613,0.0012128319,0.033915937],"study_design_scores_gemma":[0.000008955399,0.00009096838,0.0016286669,0.00003342805,0.000020993222,0.00016921836,0.00005555814,0.010435527,0.9800776,0.00031994804,0.00711726,0.000041791554],"about_ca_topic_score_codex":0.0010609304,"about_ca_topic_score_gemma":0.0015835983,"teacher_disagreement_score":0.005322323,"about_ca_system_score_codex":0.00071624195,"about_ca_system_score_gemma":0.00041846564,"threshold_uncertainty_score":0.01780498},"labels":[],"label_agreement":null},{"id":"W2118947349","doi":"10.1002/0471266965.com057.pub2","title":"Reflected‐Light Optical Microscopy","year":2012,"lang":"en","type":"other","venue":"Characterization of Materials","topic":"Advanced Fluorescence Microscopy Techniques","field":"Biochemistry, Genetics and Molecular Biology","cited_by":0,"is_retracted":false,"has_abstract":true,"route_ca_aff":true,"route_ca_fund":true,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"McGill University","funders":"Canada Research Chairs","keywords":"Microscopy; Light sheet fluorescence microscopy; Bright-field microscopy; Optics; Opacity; Polarized light microscopy; Differential interference contrast microscopy; Optical microscope; Instrumentation (computer programming); Phase contrast microscopy; Materials science; Interference microscopy; Computer science; Scanning confocal electron microscopy; Physics","score_opus":0.00774858680836305,"score_gpt":0.28157785286330567,"score_spread":0.2738292660549426,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2118947349","genre_codex":"methods","genre_gemma":"other","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"other","genre_consensus":null,"domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.054886088,0.009709529,0.66499215,0.00080992834,0.000841497,0.000601248,0.002815219,0.008938433,0.2564059],"genre_scores_gemma":[0.20394398,0.012768399,0.5673135,0.0007892149,0.00026353326,0.00045782773,0.002862237,0.00095989293,0.21064135],"study_design_codex":"bench_or_experimental","study_design_gemma":"not_applicable","domain_scores_codex":[0.9993709,0.00006239432,0.000028067054,0.00016642912,0.00031507187,0.00005707018],"domain_scores_gemma":[0.9996197,0.00007258412,0.000039890496,0.000087786255,0.00015225104,0.000027689688],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0005089384,0.0008527337,0.00042545935,0.0013181738,0.0004948586,0.0011308183,0.0012368571,0.00070522854,0.015147528],"category_scores_gemma":[0.0005321578,0.00042062634,0.0002821153,0.00072955026,0.00050597574,0.0009959214,0.00080626074,0.0009161037,0.009699711],"study_design_candidate":"not_applicable","study_design_consensus":null,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.000119493576,0.00006434666,0.0006209215,0.0007947127,0.000027854994,0.00026467358,0.00013376214,0.0008371352,0.7748474,0.02627959,0.022760935,0.17324911],"study_design_scores_gemma":[0.000020680864,0.00008298389,0.001244346,0.00010747212,0.000024498966,0.0010727433,0.00006276714,0.00528844,0.691739,0.0025027823,0.29781204,0.000042213105],"about_ca_topic_score_codex":0.0005562906,"about_ca_topic_score_gemma":0.0010902435,"teacher_disagreement_score":0.015147528,"about_ca_system_score_codex":0.00068584026,"about_ca_system_score_gemma":0.0005168299,"threshold_uncertainty_score":0.050673544},"labels":[],"label_agreement":null},{"id":"W4243848910","doi":"10.1002/0471266965.com056.pub2","title":"Optical Microscopy","year":2012,"lang":"en","type":"other","venue":"Characterization of Materials","topic":"Force Microscopy Techniques and Applications","field":"Physics and Astronomy","cited_by":0,"is_retracted":false,"has_abstract":true,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"McGill University","funders":"","keywords":"Optical microscope; Microscopy; Microscope; Fluorescence microscope; Instrumentation (computer programming); Microstructure; Materials science; Nanotechnology; Optics; Computer science; Fluorescence; Physics; Scanning electron microscope; Composite material","score_opus":0.00800210042735736,"score_gpt":0.26698295005426576,"score_spread":0.25898084962690837,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W4243848910","genre_codex":"other","genre_gemma":"other","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"other","genre_consensus":"other","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.018407812,0.012238157,0.39667332,0.0035550827,0.0039292136,0.00084036164,0.0075701647,0.017229928,0.5395559],"genre_scores_gemma":[0.13184997,0.0131960055,0.37075123,0.0038421513,0.0009884087,0.0011790516,0.01082853,0.0025880882,0.46477672],"study_design_codex":"design_other","study_design_gemma":"not_applicable","domain_scores_codex":[0.9982426,0.00013099518,0.00008796018,0.0004359514,0.0009453071,0.00015715824],"domain_scores_gemma":[0.99866617,0.00015933924,0.0000840791,0.00030576345,0.00071528467,0.00006949137],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00086825766,0.0010904133,0.00060382823,0.0034923675,0.0014351474,0.002168416,0.0016233278,0.0017282818,0.08719997],"category_scores_gemma":[0.0014576869,0.0006422205,0.000627313,0.0017315513,0.00078062667,0.0018691567,0.001932304,0.001559161,0.04270621],"study_design_candidate":"not_applicable","study_design_consensus":null,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00018728207,0.00007618093,0.0011362673,0.0011732947,0.00005998117,0.00047626527,0.00025371957,0.0014743187,0.24142401,0.054474004,0.25654227,0.44272256],"study_design_scores_gemma":[0.000029683892,0.00004791494,0.0012262627,0.00019790535,0.000020551042,0.00096061645,0.00009461181,0.003521021,0.08511964,0.0043250173,0.9043987,0.000058021546],"about_ca_topic_score_codex":0.001537803,"about_ca_topic_score_gemma":0.002285993,"teacher_disagreement_score":0.08719997,"about_ca_system_score_codex":0.0018023958,"about_ca_system_score_gemma":0.0012631658,"threshold_uncertainty_score":0.29171294},"labels":[],"label_agreement":null},{"id":"W4250781788","doi":"10.1002/0471266965.com094.pub2","title":"Particle‐Induced<scp>X</scp>‐Ray Emission","year":2012,"lang":"en","type":"other","venue":"Characterization of Materials","topic":"X-ray Spectroscopy and Fluorescence Analysis","field":"Physics and Astronomy","cited_by":0,"is_retracted":false,"has_abstract":true,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of Guelph","funders":"","keywords":"Microprobe; Ion beam analysis; Beam (structure); Ion beam; Materials science; Resolution (logic); Electron microprobe; Scattering; Particle (ecology); Single particle analysis; Micrometer; Optics; Analytical Chemistry (journal); Physics; Chemistry; Nuclear physics; Aerosol","score_opus":0.012200048717775287,"score_gpt":0.24634927709587623,"score_spread":0.23414922837810095,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W4250781788","genre_codex":"other","genre_gemma":"methods","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"methods","genre_consensus":null,"domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.16207153,0.005986016,0.12380028,0.00077249744,0.00063588895,0.00029885626,0.0063006524,0.0086291535,0.6915052],"genre_scores_gemma":[0.38581082,0.0052624834,0.06892372,0.0003801687,0.00014852642,0.00021519884,0.009355183,0.0022588333,0.527645],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.99957997,0.000022694117,0.000016599017,0.0000979876,0.00023422782,0.000048549075],"domain_scores_gemma":[0.9998473,0.000018254956,0.000019423294,0.000031822732,0.00006182808,0.000021327474],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00042757802,0.00069940416,0.0003783345,0.0012613571,0.000591325,0.0016558912,0.00089992606,0.00054754765,0.035234194],"category_scores_gemma":[0.00027552908,0.0002224717,0.00026537268,0.0013361038,0.00047492332,0.0007118101,0.0009573509,0.00045293887,0.01313754],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00045816432,0.00018713428,0.002383798,0.0013108877,0.000058097183,0.001041965,0.00019026456,0.002002594,0.6550821,0.03766491,0.074655205,0.22496484],"study_design_scores_gemma":[0.000019729665,0.000044741155,0.0038450498,0.000041424206,0.000018311212,0.0006512616,0.000051277253,0.0036592528,0.6338966,0.0017360459,0.35600498,0.000031320295],"about_ca_topic_score_codex":0.001101863,"about_ca_topic_score_gemma":0.0016228195,"teacher_disagreement_score":0.035234194,"about_ca_system_score_codex":0.0008318305,"about_ca_system_score_gemma":0.00053357915,"threshold_uncertainty_score":0.11787009},"labels":[],"label_agreement":null}]}