{"meta":{"query_hash":"4ba337c56c75","filters":{"venue":"Engineering materials and processes"},"cohort_total":1,"direct_labels_cover":0,"predictions_cover":1,"exported":1,"export_cap":100000,"truncated":false,"label_status":"direct model label, unvalidated","prediction_status":"machine_predicted_unvalidated (Codex and Gemma teacher distillation)","score_status":"score_only:v0-immature-baseline","snapshot":{"source":"OpenAlex, pinned release, all 482 partitions","release":"2026-06-24","frame_built":"2026-07-12"},"permalink":"https://metacan.xera.ac/q/4ba337c56c75","api":"https://metacan.xera.ac/api/v1/cohort?venue=Engineering+materials+and+processes"},"results":[{"id":"W1011275229","doi":"10.1007/1-84628-235-7_39","title":"Electron Backscatter Diffraction: Application to Cu Interconnects in Top-View and Cross Section","year":2006,"lang":"en","type":"book-chapter","venue":"Engineering materials and processes","topic":"Integrated Circuits and Semiconductor Failure Analysis","field":"Engineering","cited_by":13,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Advanced Micro Devices (Canada)","funders":"","keywords":"Electron backscatter diffraction; Cross section (physics); Backscatter (email); Diffraction; Section (typography); Materials science; Electron diffraction; Electron; Optics; Physics; Computer science; Nuclear physics; Telecommunications; Astronomy","score_opus":0.00463241910086786,"score_gpt":0.20000278907922778,"score_spread":0.1953703699783599,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W1011275229","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"codex-gemma-dda1882f352a","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.963573,0.00966674,0.007219092,0.00012487023,0.0012739747,0.00087390584,0.00011759184,0.000647466,0.016503353],"genre_scores_gemma":[0.9917465,0.0014564757,0.000060646507,0.000040549738,0.00059051963,0.00008586652,0.00013218114,0.00010465268,0.0057826205],"study_design_codex":"bench_or_experimental","study_design_gemma":"not_applicable","domain_scores_codex":[0.9990563,0.0000038789294,0.0003326183,0.0003135853,0.00008237136,0.00021129534],"domain_scores_gemma":[0.99967676,0.000028272758,0.0000471079,0.00013158834,0.00006263125,0.00005365091],"candidate_categories":["metaepi_narrow"],"consensus_categories":[],"category_scores_codex":[0.000090469475,0.0003346215,0.0003993822,0.00024465474,0.00003203274,0.00020249636,0.00006717805,0.00026369948,0.000089409805],"category_scores_gemma":[0.000011889576,0.00032978645,0.000023862878,0.00008370048,0.000011655105,0.0001661612,0.000017235981,0.00019920232,0.000013461019],"study_design_candidate":"bench_or_experimental","study_design_consensus":null,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.000043525084,0.000025878264,0.00016600752,0.011050383,0.00033354538,0.000019376372,0.0006819551,0.03351057,0.93992907,0.0038116728,0.0026625653,0.007765477],"study_design_scores_gemma":[0.0008179329,0.00024951686,0.0023922683,0.0033064107,0.00037612702,0.00017668972,0.000034470715,0.0026518188,0.3056486,0.0018294447,0.6790434,0.0034733198],"about_ca_topic_score_codex":0.000092892464,"about_ca_topic_score_gemma":0.00009578997,"teacher_disagreement_score":0.6763808,"about_ca_system_score_codex":0.00007384166,"about_ca_system_score_gemma":0.000012237628,"threshold_uncertainty_score":0.9999154},"labels":[],"label_agreement":null}]}