{"meta":{"query_hash":"2781a8efe57b","filters":{"venue":"Frontiers in electronic testing"},"cohort_total":1,"direct_labels_cover":0,"predictions_cover":1,"exported":1,"export_cap":100000,"truncated":false,"label_status":"direct model label, unvalidated","prediction_status":"machine_predicted_unvalidated (Codex and Gemma teacher distillation)","score_status":"score_only:v0-immature-baseline","snapshot":{"source":"OpenAlex, pinned release, all 482 partitions","release":"2026-06-24","frame_built":"2026-07-12"},"permalink":"https://metacan.xera.ac/q/2781a8efe57b","api":"https://metacan.xera.ac/api/v1/cohort?venue=Frontiers+in+electronic+testing"},"results":[{"id":"W1519290835","doi":"10.1007/0-387-46547-2","title":"Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits","year":2007,"lang":"en","type":"book","venue":"Frontiers in electronic testing","topic":"Integrated Circuits and Semiconductor Failure Analysis","field":"Engineering","cited_by":53,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of Waterloo","funders":"","keywords":"Very-large-scale integration; CMOS; Nano-; Metric (unit); Electronic circuit; Computer science; Electronic engineering; Materials science; Embedded system; Engineering; Electrical engineering; Composite material","score_opus":0.013518676340707617,"score_gpt":0.21189447028364705,"score_spread":0.19837579394293944,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W1519290835","genre_codex":"methods","genre_gemma":"other","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"other","genre_consensus":null,"domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.02549511,0.01958097,0.7755463,0.0011149353,0.0008596545,0.00015783585,0.00031871346,0.0020196652,0.17490679],"genre_scores_gemma":[0.42706913,0.0142030185,0.37506613,0.0011816965,0.0003770095,0.00024117106,0.00079405674,0.0008547411,0.18021312],"study_design_codex":"design_other","study_design_gemma":"not_applicable","domain_scores_codex":[0.99963963,0.000021356827,0.0000088630695,0.000027929647,0.0002866104,0.000015617064],"domain_scores_gemma":[0.99960107,0.00017364752,0.000027380342,0.000057300953,0.00012796628,0.000012640109],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00022358386,0.0007409154,0.00046170616,0.00091163383,0.00016653174,0.00071777496,0.0012092637,0.00049958075,0.0047221417],"category_scores_gemma":[0.00056702405,0.00025556184,0.00025454976,0.0006626646,0.0007403994,0.0011710135,0.00041291953,0.00065233983,0.0011531464],"study_design_candidate":"not_applicable","study_design_consensus":null,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00009736488,0.00008253075,0.000736374,0.0006804678,0.000038496637,0.00029716187,0.00023511068,0.014849689,0.11734509,0.24092227,0.028517691,0.5961977],"study_design_scores_gemma":[0.00003719885,0.00052174646,0.002148722,0.00042522245,0.0000712194,0.0032383325,0.00014906428,0.13025366,0.13406898,0.45024616,0.2787601,0.00007958802],"about_ca_topic_score_codex":0.00029701146,"about_ca_topic_score_gemma":0.000613369,"teacher_disagreement_score":0.0047221417,"about_ca_system_score_codex":0.00041984196,"about_ca_system_score_gemma":0.0002969271,"threshold_uncertainty_score":0.015797138},"labels":[],"label_agreement":null}]}