{"meta":{"query_hash":"6c8990258fa9","filters":{"venue":"ICCAD-2003. International Conference on Computer Aided Design (IEEE Cat. No.03CH37486)"},"cohort_total":6,"direct_labels_cover":0,"predictions_cover":6,"exported":6,"export_cap":100000,"truncated":false,"label_status":"direct model label, unvalidated","prediction_status":"machine_predicted_unvalidated (Codex and Gemma teacher distillation)","score_status":"score_only:v0-immature-baseline","snapshot":{"source":"OpenAlex, pinned release, all 482 partitions","release":"2026-06-24","frame_built":"2026-07-12"},"permalink":"https://metacan.xera.ac/q/6c8990258fa9","api":"https://metacan.xera.ac/api/v1/cohort?venue=ICCAD-2003.+International+Conference+on+Computer+Aided+Design+%28IEEE+Cat.+No.03CH37486%29"},"results":[{"id":"W4230169210","doi":"10.1109/iccad.2003.159685","title":"Efficient generation of monitor circuits for GSTE assertion graphs","year":2003,"lang":"en","type":"article","venue":"ICCAD-2003. International Conference on Computer Aided Design (IEEE Cat. No.03CH37486)","topic":"Formal Methods in Verification","field":"Computer Science","cited_by":17,"is_retracted":false,"has_abstract":true,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of British Columbia","funders":"","keywords":"Computer science; Assertion; Formal verification; Scalability; Overhead (engineering); Automaton; Programming language; Abstraction; Theoretical computer science; Symbolic trajectory evaluation; Electronic circuit; Model checking; Computer engineering","score_opus":0.1474870650686887,"score_gpt":0.33515202622466794,"score_spread":0.18766496115597925,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W4230169210","genre_codex":"methods","genre_gemma":"methods","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"methods","genre_consensus":"methods","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.08590234,0.000057421716,0.90165776,0.00014073683,0.000034625547,0.00019084923,0.00026452154,0.008711477,0.0030402709],"genre_scores_gemma":[0.71805185,0.000067605804,0.27766928,0.000084793115,0.000011223878,0.00026459302,0.0006794277,0.0007453228,0.0024258539],"study_design_codex":"design_other","study_design_gemma":"simulation_or_modeling","domain_scores_codex":[0.99938774,0.00017984225,0.000031487485,0.00011675024,0.0002262615,0.000057910485],"domain_scores_gemma":[0.9974692,0.0016934759,0.0002034299,0.00039163372,0.00021168804,0.000030669213],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00050996884,0.00040856664,0.00028481512,0.0003669614,0.00023692944,0.0004924794,0.0005159112,0.0003607066,0.0036418422],"category_scores_gemma":[0.0037815971,0.00024073856,0.00038593865,0.00026422978,0.0005242989,0.0008004706,0.0006322619,0.0005457795,0.00049647846],"study_design_candidate":"simulation_or_modeling","study_design_consensus":null,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00078818615,0.00020889826,0.0060652923,0.0005639909,0.0000568831,0.0013594948,0.00054999423,0.16548377,0.3119968,0.10078416,0.0051242346,0.40701833],"study_design_scores_gemma":[0.000112152964,0.00022983494,0.001270533,0.000030678988,0.000042072006,0.00033894466,0.000072953575,0.6678694,0.2849454,0.034551565,0.010509163,0.000027358008],"about_ca_topic_score_codex":0.0005748281,"about_ca_topic_score_gemma":0.0010155994,"teacher_disagreement_score":0.0036418422,"about_ca_system_score_codex":0.00034778056,"about_ca_system_score_gemma":0.0005488304,"threshold_uncertainty_score":0.012183189},"labels":[],"label_agreement":null},{"id":"W4230566481","doi":"10.1109/iccad.2003.159687","title":"Timing analysis in presence of power supply and ground voltage variations","year":2003,"lang":"en","type":"article","venue":"ICCAD-2003. International Conference on Computer Aided Design (IEEE Cat. No.03CH37486)","topic":"Low-power high-performance VLSI design","field":"Engineering","cited_by":47,"is_retracted":false,"has_abstract":true,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of Toronto","funders":"","keywords":"Voltage; Power (physics); Switched-mode power supply; Electrical engineering; Switched-mode power supply applications; Environmental science; Computer science; Constant power circuit; Physics; Engineering","score_opus":0.031060140783514774,"score_gpt":0.251325132103137,"score_spread":0.22026499131962224,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W4230566481","genre_codex":"methods","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":null,"domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.22059168,0.0006898366,0.7718253,0.00018027259,0.00004161001,0.000053159296,0.00035611383,0.0014834696,0.004778591],"genre_scores_gemma":[0.95096105,0.00036403973,0.046718173,0.00004162606,0.000034873603,0.000049615657,0.00021365116,0.00012315728,0.0014936842],"study_design_codex":"simulation_or_modeling","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9992298,0.00016147424,0.00004463635,0.00014822965,0.00029193008,0.00012383446],"domain_scores_gemma":[0.9982504,0.0010623315,0.0002821698,0.0002077461,0.00016403002,0.000033289874],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0007281389,0.00070867385,0.0004860712,0.0009712239,0.00032254934,0.0007019536,0.00087517494,0.0004935848,0.0014478859],"category_scores_gemma":[0.0030601737,0.00038160972,0.00053305225,0.001087819,0.00045339487,0.0010878759,0.00037176782,0.00045855937,0.00022767787],"study_design_candidate":"bench_or_experimental","study_design_consensus":null,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00015575523,0.000019208977,0.0013583775,0.000067290945,0.000036131918,0.00027022418,0.0000450515,0.9296067,0.027833702,0.017864972,0.00043184133,0.022310792],"study_design_scores_gemma":[0.0000044423477,0.000035531848,0.00017080584,0.000003535711,0.000014128486,0.00007410709,0.0000053030453,0.98717684,0.0066032447,0.0054759686,0.00043133114,0.000004842317],"about_ca_topic_score_codex":0.0019734136,"about_ca_topic_score_gemma":0.0026600978,"teacher_disagreement_score":0.0019734136,"about_ca_system_score_codex":0.0009597351,"about_ca_system_score_gemma":0.00090067874,"threshold_uncertainty_score":0.006963432},"labels":[],"label_agreement":null},{"id":"W4236090814","doi":"10.1109/iccad.2003.159711","title":"Performance efficiency of context-flow system-on-chip platform","year":2003,"lang":"en","type":"article","venue":"ICCAD-2003. International Conference on Computer Aided Design (IEEE Cat. No.03CH37486)","topic":"Interconnection Networks and Systems","field":"Computer Science","cited_by":1,"is_retracted":false,"has_abstract":true,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of Toronto","funders":"","keywords":"Computer science; Computer architecture; System on a chip; Architecture; Programming paradigm; Embedded system; Context (archaeology); Network on a chip; Bandwidth (computing); Distributed computing; Computer network","score_opus":0.0535743858993818,"score_gpt":0.25545042713158195,"score_spread":0.20187604123220015,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W4236090814","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9592362,0.00035267745,0.034221996,0.00014963456,0.000026635953,0.000049495433,0.00006263334,0.0013691711,0.004531575],"genre_scores_gemma":[0.99115,0.000084499625,0.007932753,0.00003256772,0.000004725815,0.00002504772,0.00005718692,0.000059544265,0.0006536843],"study_design_codex":"simulation_or_modeling","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9993117,0.00023531516,0.000026782303,0.00008146985,0.00016319574,0.00018149252],"domain_scores_gemma":[0.99874973,0.00056120625,0.0001261984,0.0002446611,0.0002198036,0.00009841124],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0008791366,0.0006795103,0.00034920464,0.0004105964,0.00037881447,0.0006955158,0.00094869133,0.0005188121,0.0015684232],"category_scores_gemma":[0.0023007558,0.00021438656,0.00026330331,0.00035825063,0.00042927047,0.0012562972,0.0004571224,0.0006384404,0.00022489576],"study_design_candidate":"bench_or_experimental","study_design_consensus":null,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.0013252911,0.00033317512,0.005160893,0.00018747179,0.000085552005,0.0002170161,0.00015217152,0.8584412,0.05450157,0.0114208395,0.0018255027,0.06634935],"study_design_scores_gemma":[0.000049371665,0.0005902127,0.0007101009,0.000007076236,0.000035900775,0.00005395089,0.00002220651,0.97418004,0.02217901,0.0014302224,0.00072694954,0.000014936169],"about_ca_topic_score_codex":0.0021282376,"about_ca_topic_score_gemma":0.0018325888,"teacher_disagreement_score":0.0021282376,"about_ca_system_score_codex":0.00069489196,"about_ca_system_score_gemma":0.001045729,"threshold_uncertainty_score":0.0052469373},"labels":[],"label_agreement":null},{"id":"W4240581163","doi":"10.1109/iccad.2003.159764","title":"Statistical verification of power grids considering process-induced leakage current variations","year":2003,"lang":"en","type":"article","venue":"ICCAD-2003. International Conference on Computer Aided Design (IEEE Cat. No.03CH37486)","topic":"Low-power high-performance VLSI design","field":"Engineering","cited_by":27,"is_retracted":false,"has_abstract":true,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of Toronto","funders":"","keywords":"Leakage (economics); Voltage drop; Voltage; Transistor; Electrical engineering; Scaling; Grid; Drop (telecommunication); Exponential function; Computer science; Electronic engineering; Engineering; Mathematics","score_opus":0.054677636114714226,"score_gpt":0.2897904621042547,"score_spread":0.23511282598954047,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W4240581163","genre_codex":"methods","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":null,"domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.46692762,0.00013724048,0.5270646,0.00016389984,0.000032294975,0.0000611272,0.0004212394,0.0040988037,0.0010931909],"genre_scores_gemma":[0.97365755,0.000035327823,0.025748855,0.000023428916,0.000013085465,0.00003520211,0.00026107862,0.000065301094,0.00016022308],"study_design_codex":"simulation_or_modeling","study_design_gemma":"simulation_or_modeling","domain_scores_codex":[0.9961437,0.0012429128,0.00028058543,0.00057129405,0.001546041,0.00021544051],"domain_scores_gemma":[0.9505923,0.03470811,0.00434635,0.005973764,0.0040297825,0.00034971745],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0036006148,0.0004668125,0.00052626786,0.0009166578,0.0003545587,0.000862501,0.001578102,0.00059450796,0.0008122757],"category_scores_gemma":[0.040331382,0.00044778382,0.00048713476,0.0010551382,0.0009301569,0.0013359339,0.00076427235,0.00072243524,0.00020073605],"study_design_candidate":"simulation_or_modeling","study_design_consensus":"simulation_or_modeling","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.0010284509,0.00011230355,0.03784072,0.00012746356,0.00018308076,0.00051492103,0.00019947547,0.84665346,0.035441827,0.0129661495,0.0008394572,0.064092614],"study_design_scores_gemma":[0.000024331206,0.00010324666,0.0020544962,0.0000045370125,0.000012273157,0.000081892205,0.000020170624,0.97447723,0.018754361,0.0042384556,0.00022097996,0.000008046293],"about_ca_topic_score_codex":0.0020952157,"about_ca_topic_score_gemma":0.0019499989,"teacher_disagreement_score":0.0036006148,"about_ca_system_score_codex":0.0008132775,"about_ca_system_score_gemma":0.0013830536,"threshold_uncertainty_score":0.019042075},"labels":[],"label_agreement":null},{"id":"W4241249008","doi":"10.1109/iccad.2003.159755","title":"On the interaction between power-aware FPGA CAD Algorithms","year":2003,"lang":"en","type":"article","venue":"ICCAD-2003. International Conference on Computer Aided Design (IEEE Cat. No.03CH37486)","topic":"VLSI and FPGA Design Techniques","field":"Engineering","cited_by":71,"is_retracted":false,"has_abstract":true,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of British Columbia","funders":"","keywords":"Field-programmable gate array; Computer science; CAD; Cluster analysis; Routing (electronic design automation); Power analysis; Design flow; Energy consumption; Power (physics); Embedded system; Algorithm; Power optimization; Electronic design automation; Energy (signal processing); FPGA prototype; Reconfigurable computing; Field (mathematics); Power consumption; Artificial intelligence; Engineering; Electrical engineering","score_opus":0.06249537015885398,"score_gpt":0.28237616494298573,"score_spread":0.21988079478413175,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W4241249008","genre_codex":"methods","genre_gemma":"methods","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"methods","genre_consensus":"methods","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.08857738,0.001194087,0.8974617,0.0003588987,0.000061731116,0.000085861015,0.000032903987,0.0014183812,0.010809019],"genre_scores_gemma":[0.5168613,0.0012308946,0.475296,0.00023416385,0.000046761274,0.0000816556,0.00009084408,0.00029902408,0.0058593503],"study_design_codex":"simulation_or_modeling","study_design_gemma":"theoretical_or_conceptual","domain_scores_codex":[0.9992181,0.00024000483,0.000036311936,0.000087402535,0.0003647299,0.000053404103],"domain_scores_gemma":[0.99670035,0.0025416957,0.00016635172,0.00024310284,0.0003191263,0.000029314699],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0011205785,0.00068339135,0.00045553167,0.0007717127,0.00029081528,0.0014872638,0.0007505943,0.0005670946,0.0021301252],"category_scores_gemma":[0.006280598,0.00047663378,0.00033856655,0.00062750553,0.0003517007,0.0013915217,0.0004563657,0.00049724214,0.00041665093],"study_design_candidate":"theoretical_or_conceptual","study_design_consensus":null,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00020560605,0.000119765056,0.002536708,0.00010351613,0.000061595,0.00009585188,0.0000793172,0.53402305,0.015508985,0.014608542,0.0009740002,0.431683],"study_design_scores_gemma":[0.000023095216,0.00009924905,0.00064506603,0.000013924114,0.000023915394,0.000074350835,0.000019644633,0.9855112,0.006873457,0.0043003866,0.0024048735,0.0000108964305],"about_ca_topic_score_codex":0.00238821,"about_ca_topic_score_gemma":0.0062608593,"teacher_disagreement_score":0.00238821,"about_ca_system_score_codex":0.0006355809,"about_ca_system_score_gemma":0.0005214747,"threshold_uncertainty_score":0.0071259737},"labels":[],"label_agreement":null},{"id":"W4241836984","doi":"10.1109/iccad.2003.1257872","title":"Hardware/software co-testing of embedded memories in complex SOCs","year":2004,"lang":"en","type":"article","venue":"ICCAD-2003. International Conference on Computer Aided Design (IEEE Cat. No.03CH37486)","topic":"VLSI and Analog Circuit Testing","field":"Computer Science","cited_by":5,"is_retracted":false,"has_abstract":true,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"McMaster University","funders":"","keywords":"Embedded system; Overhead (engineering); Computer science; Scalability; System on a chip; Embedded software; Software; Chip; Design for testing; Computer hardware; Reliability engineering; Engineering; Operating system","score_opus":0.13819382706692487,"score_gpt":0.316617270461211,"score_spread":0.17842344339428615,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W4241836984","genre_codex":"methods","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":null,"domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.31328997,0.0006584524,0.68076366,0.00015877663,0.000043348868,0.000094710995,0.000031728443,0.0017927547,0.0031665785],"genre_scores_gemma":[0.9009363,0.0001273078,0.09742887,0.00006982687,0.00002594488,0.000059038928,0.000049441147,0.00006388319,0.0012393089],"study_design_codex":"design_other","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.99928504,0.0001911084,0.00004603385,0.00009531405,0.00030342297,0.00007914544],"domain_scores_gemma":[0.998467,0.00066291634,0.00024377168,0.00033778406,0.00022899773,0.000059502006],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0004620897,0.00045232923,0.00033719366,0.00051085744,0.00019720457,0.0006249904,0.0008297873,0.0004726861,0.0010159744],"category_scores_gemma":[0.0016645081,0.00019192879,0.00032584375,0.00032108524,0.00051245495,0.00084427505,0.0005881842,0.0004217357,0.00013727463],"study_design_candidate":"bench_or_experimental","study_design_consensus":null,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.0008735032,0.00033313103,0.0070674247,0.0003560504,0.00014550141,0.0014378461,0.00028340842,0.12728146,0.29490453,0.019870145,0.0011021399,0.5463448],"study_design_scores_gemma":[0.00006861755,0.00089303986,0.0019467296,0.000025522013,0.00008296558,0.0016083803,0.00005653753,0.7354902,0.24693528,0.008927674,0.0039413255,0.00002371264],"about_ca_topic_score_codex":0.0003060834,"about_ca_topic_score_gemma":0.00051347,"teacher_disagreement_score":0.0010159744,"about_ca_system_score_codex":0.00024053482,"about_ca_system_score_gemma":0.00042588884,"threshold_uncertainty_score":0.0033987164},"labels":[],"label_agreement":null}]}