{"meta":{"query_hash":"f0612d48932d","filters":{"venue":"IEEE Design & Test of Computers"},"cohort_total":22,"direct_labels_cover":0,"predictions_cover":22,"exported":22,"export_cap":100000,"truncated":false,"label_status":"direct model label, unvalidated","prediction_status":"machine_predicted_unvalidated (Codex and Gemma teacher distillation)","score_status":"score_only:v0-immature-baseline","snapshot":{"source":"OpenAlex, pinned release, all 482 partitions","release":"2026-06-24","frame_built":"2026-07-12"},"permalink":"https://metacan.xera.ac/q/f0612d48932d","api":"https://metacan.xera.ac/api/v1/cohort?venue=IEEE+Design+%26+Test+of+Computers"},"results":[{"id":"W1759835074","doi":"10.1109/mdt.2003.10036","title":"ITC 2003: Breaking Test Interface Bottlenecks","year":2003,"lang":"en","type":"article","venue":"IEEE Design & Test of Computers","topic":"VLSI and Analog Circuit Testing","field":"Computer Science","cited_by":0,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"McGill University","funders":"","keywords":"Interface (matter); Computer science; Test (biology); Automatic test pattern generation; Embedded system; Computer architecture; Operating system; Engineering; Electrical engineering; Geology","score_opus":0.02991337581237798,"score_gpt":0.24577773844011958,"score_spread":0.21586436262774159,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W1759835074","genre_codex":"methods","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":null,"domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.050836373,0.009522209,0.83450145,0.008801431,0.0036812674,0.000599911,0.0011645873,0.030119918,0.06077276],"genre_scores_gemma":[0.6069882,0.0031116963,0.3110604,0.0071080257,0.0022191398,0.000607127,0.0046104398,0.007865264,0.05642965],"study_design_codex":"design_other","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9934296,0.0017383537,0.00044429227,0.000737055,0.00256568,0.0010849765],"domain_scores_gemma":[0.97006154,0.0075739226,0.0012586883,0.009282176,0.010460923,0.0013626504],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.010892896,0.002377446,0.0023456072,0.0025510944,0.002090762,0.0060139424,0.006085529,0.0031264634,0.035584547],"category_scores_gemma":[0.030599201,0.001465727,0.001311594,0.002063904,0.0020032923,0.011970941,0.0047031417,0.0053697485,0.008563856],"study_design_candidate":"bench_or_experimental","study_design_consensus":null,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.0032541065,0.00048404382,0.0034512056,0.00082695467,0.00023014171,0.00041190558,0.0005516602,0.02446727,0.032492667,0.12048897,0.28818595,0.5251552],"study_design_scores_gemma":[0.0009626854,0.0014631386,0.0023959228,0.00070848403,0.00067849195,0.0009669373,0.0003539663,0.45856017,0.12385804,0.15526353,0.2545787,0.00020992318],"about_ca_topic_score_codex":0.007028815,"about_ca_topic_score_gemma":0.008777441,"teacher_disagreement_score":0.035584547,"about_ca_system_score_codex":0.0031666968,"about_ca_system_score_gemma":0.006947354,"threshold_uncertainty_score":0.11904216},"labels":[],"label_agreement":null},{"id":"W1926711496","doi":"10.1109/mdt.2012.2183574","title":"Low-Power Design Using the Si2 Common Power Format","year":2012,"lang":"en","type":"article","venue":"IEEE Design & Test of Computers","topic":"Semiconductor materials and devices","field":"Engineering","cited_by":8,"is_retracted":false,"has_abstract":true,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Apache (Canada)","funders":"","keywords":"Power (physics); Key (lock); Interoperability; Cover (algebra); Computer science; Simple (philosophy); Power consumption; Reliability engineering; Power domains; Engineering; World Wide Web; Operating system","score_opus":0.03786900266198939,"score_gpt":0.24068288185766964,"score_spread":0.20281387919568025,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W1926711496","genre_codex":"methods","genre_gemma":"methods","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"methods","genre_consensus":"methods","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.004762706,0.00020043366,0.9089503,0.00031050967,0.00027681957,0.0001960825,0.00043912334,0.0026277227,0.08223626],"genre_scores_gemma":[0.1832102,0.0009249729,0.73342866,0.00077044696,0.00022878966,0.0005400008,0.0022126217,0.0015604013,0.07712389],"study_design_codex":"theoretical_or_conceptual","study_design_gemma":"not_applicable","domain_scores_codex":[0.998884,0.0002032599,0.00011102017,0.00010882458,0.0006096855,0.000083278755],"domain_scores_gemma":[0.9989741,0.00019524965,0.000062313535,0.00029223168,0.00045394478,0.000022198052],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0011691777,0.00078482076,0.00028234723,0.00083252793,0.00047654178,0.0025672794,0.0012066914,0.0006400912,0.0144593995],"category_scores_gemma":[0.0020350262,0.00030751957,0.00053586764,0.00087205676,0.0006816081,0.0023945007,0.0007528705,0.0012802143,0.004625257],"study_design_candidate":"not_applicable","study_design_consensus":null,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00014455333,0.00007225484,0.0004737999,0.00041634473,0.000028548022,0.00038024265,0.00058160676,0.019773621,0.047140405,0.6848303,0.030647459,0.21551087],"study_design_scores_gemma":[0.00008859388,0.00046854984,0.00038235544,0.00021354118,0.000056017325,0.0011135368,0.00020736527,0.10120033,0.14886881,0.14759879,0.59972847,0.00007367715],"about_ca_topic_score_codex":0.00070457614,"about_ca_topic_score_gemma":0.0013414109,"teacher_disagreement_score":0.0144593995,"about_ca_system_score_codex":0.00077431847,"about_ca_system_score_gemma":0.0008211851,"threshold_uncertainty_score":0.048371494},"labels":[],"label_agreement":null},{"id":"W1975396736","doi":"10.1109/mdt.2010.73","title":"Time to retire our benchmarks","year":2010,"lang":"en","type":"article","venue":"IEEE Design & Test of Computers","topic":"Distributed and Parallel Computing Systems","field":"Computer Science","cited_by":2,"is_retracted":false,"has_abstract":true,"route_ca_aff":false,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":true,"ca_institutions":"","funders":"","keywords":"Argument (complex analysis); Computer science; Quarter (Canadian coin); Sentence; Artificial intelligence; History","score_opus":0.014339787542969013,"score_gpt":0.23629756136494012,"score_spread":0.2219577738219711,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W1975396736","genre_codex":"other","genre_gemma":"commentary","domain_codex":null,"domain_gemma":"evaluation","model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"commentary","genre_consensus":null,"domain_candidate":"evaluation","domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.02955712,0.02473416,0.07945557,0.14689213,0.13818172,0.0018175499,0.020133752,0.047953747,0.5112743],"genre_scores_gemma":[0.12137684,0.013687396,0.09267772,0.070451126,0.028382266,0.0019069404,0.06806133,0.030361213,0.57309514],"study_design_codex":"not_applicable","study_design_gemma":"theoretical_or_conceptual","domain_scores_codex":[0.9909685,0.0012125196,0.00039359397,0.0004940469,0.0053672115,0.0015639986],"domain_scores_gemma":[0.9680797,0.0024477048,0.0006566011,0.0038520177,0.018898197,0.0060657356],"candidate_categories":["metaresearch"],"consensus_categories":[],"category_scores_codex":[0.00977832,0.0017883878,0.0013668154,0.0038527749,0.0024500415,0.0065160203,0.0035675706,0.0016021223,0.13569473],"category_scores_gemma":[0.04232169,0.00079755415,0.0012687269,0.00284465,0.00074414205,0.006335024,0.004303062,0.0054308595,0.11523358],"study_design_candidate":"theoretical_or_conceptual","study_design_consensus":null,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00012952663,0.00008815537,0.00039927955,0.00011071965,0.000011477574,0.000077487035,0.000059622515,0.00050741405,0.0012510247,0.0057980595,0.87764317,0.11392408],"study_design_scores_gemma":[0.00006481512,0.0002137128,0.0012414489,0.00015985893,0.00001858919,0.00012942623,0.00017047494,0.0009031508,0.0018322587,0.007262269,0.987948,0.00005604174],"about_ca_topic_score_codex":0.0075977794,"about_ca_topic_score_gemma":0.010938741,"teacher_disagreement_score":0.9902217,"about_ca_system_score_codex":0.0031531265,"about_ca_system_score_gemma":0.0043156776,"threshold_uncertainty_score":0.4539441},"labels":[],"label_agreement":null},{"id":"W1989828912","doi":"10.1109/mdt.2010.117","title":"Automatic TLM Generation for Early Validation of Multicore Systems","year":2010,"lang":"en","type":"article","venue":"IEEE Design & Test of Computers","topic":"Embedded Systems Design Techniques","field":"Computer Science","cited_by":15,"is_retracted":false,"has_abstract":true,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Concordia University","funders":"","keywords":"Multi-core processor; Computer science; Leverage (statistics); Software; Computer architecture; Task (project management); Transaction-level modeling; Embedded system; Software engineering; Parallel computing; Programming language; SystemC; Engineering; Systems engineering; Artificial intelligence","score_opus":0.04656795164786921,"score_gpt":0.27373132327564437,"score_spread":0.22716337162777517,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W1989828912","genre_codex":"methods","genre_gemma":"methods","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"methods","genre_consensus":"methods","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.018139629,0.00009705788,0.9666558,0.00013143168,0.000048430113,0.00013365531,0.00018036697,0.013335001,0.0012787111],"genre_scores_gemma":[0.43372926,0.00011168548,0.55829144,0.00025584828,0.00002995077,0.00037228313,0.0011853325,0.0029753465,0.003048849],"study_design_codex":"simulation_or_modeling","study_design_gemma":"simulation_or_modeling","domain_scores_codex":[0.99290985,0.0026409335,0.00051937497,0.0006523498,0.0027774977,0.0004999441],"domain_scores_gemma":[0.986912,0.00590309,0.0008623054,0.004008458,0.002190814,0.00012337882],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0036862763,0.0011303681,0.0007406884,0.001486379,0.0007362748,0.001286423,0.0027587689,0.0014301451,0.0049830875],"category_scores_gemma":[0.014184264,0.0009357107,0.0014753985,0.0005334314,0.001068232,0.0026694755,0.002404957,0.002259269,0.0012952195],"study_design_candidate":"simulation_or_modeling","study_design_consensus":"simulation_or_modeling","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.0009979182,0.00030810595,0.005519241,0.00092454266,0.00018426099,0.0013421633,0.0009131612,0.38065502,0.17139205,0.049517572,0.010532298,0.37771368],"study_design_scores_gemma":[0.00006655103,0.00015659067,0.00029164235,0.000058265083,0.000032942855,0.00020414843,0.000045360062,0.8678916,0.10845688,0.01458958,0.008167981,0.00003842411],"about_ca_topic_score_codex":0.0018072581,"about_ca_topic_score_gemma":0.0029909825,"teacher_disagreement_score":0.0049830875,"about_ca_system_score_codex":0.0011859698,"about_ca_system_score_gemma":0.00186556,"threshold_uncertainty_score":0.01949513},"labels":[],"label_agreement":null},{"id":"W1991073801","doi":"10.1109/mdt.2007.131","title":"Empirical Validation of Yield Recovery Using Idle-Cycle Insertion","year":2007,"lang":"en","type":"article","venue":"IEEE Design & Test of Computers","topic":"VLSI and Analog Circuit Testing","field":"Computer Science","cited_by":5,"is_retracted":false,"has_abstract":true,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Advanced Micro Devices (Canada)","funders":"Nvidia; Advanced Micro Devices; Semiconductor Research Corporation","keywords":"Idle; Computer science; Chip; Yield (engineering); Power (physics); Reliability engineering; Real-time computing; Embedded system; Electronic engineering; Engineering; Telecommunications","score_opus":0.09840035293056341,"score_gpt":0.2977852087607461,"score_spread":0.19938485583018267,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W1991073801","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9680881,0.00022697395,0.029250443,0.00010717555,0.000018490558,0.0000925621,0.00027053742,0.0003558397,0.001589964],"genre_scores_gemma":[0.9927781,0.000048470214,0.0065727653,0.000032525542,0.000005099533,0.000037318896,0.00018529534,0.000028971663,0.00031142245],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9943153,0.0018528403,0.00046740836,0.00094799575,0.002029466,0.0003869512],"domain_scores_gemma":[0.9134564,0.05459991,0.008226895,0.013608713,0.009609192,0.00049888977],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.007817468,0.00057879026,0.00036370778,0.0010974747,0.0004958457,0.00048484193,0.002019524,0.0010871026,0.0011640775],"category_scores_gemma":[0.04584212,0.00028206958,0.00034489296,0.0010082979,0.0012446104,0.0008407696,0.00093450706,0.00070764136,0.0004197609],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.0047572576,0.0045532244,0.20931403,0.00073783845,0.0003721516,0.0010196997,0.0013847717,0.13636722,0.48252115,0.0055313925,0.0020687722,0.15137255],"study_design_scores_gemma":[0.00014558938,0.012736762,0.050442003,0.000053594904,0.00020755727,0.00083481224,0.00042828007,0.21521679,0.71512413,0.0013740349,0.003321165,0.00011524914],"about_ca_topic_score_codex":0.001092613,"about_ca_topic_score_gemma":0.0012569843,"teacher_disagreement_score":0.007817468,"about_ca_system_score_codex":0.00068074604,"about_ca_system_score_gemma":0.00041225247,"threshold_uncertainty_score":0.041343212},"labels":[],"label_agreement":null},{"id":"W1992096905","doi":"10.1109/mdt.2007.204","title":"Security-Performance Trade-offs in Embedded Systems Using Flexible ECC Hardware","year":2007,"lang":"en","type":"article","venue":"IEEE Design & Test of Computers","topic":"Cryptography and Residue Arithmetic","field":"Computer Science","cited_by":5,"is_retracted":false,"has_abstract":true,"route_ca_aff":true,"route_ca_fund":true,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of Victoria","funders":"Division of Electrical, Communications and Cyber Systems; CMC Microsystems","keywords":"Coprocessor; Computer science; Cryptography; Embedded system; Elliptic curve cryptography; Computation; Computer hardware; Computer architecture; Public-key cryptography; Operating system; Encryption; Computer security; Algorithm","score_opus":0.02885568368236606,"score_gpt":0.2547353386458567,"score_spread":0.2258796549634906,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W1992096905","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.7526323,0.0065951524,0.21722406,0.0012330307,0.00009812879,0.00008644414,0.000073980846,0.001068907,0.02098795],"genre_scores_gemma":[0.988567,0.00045791475,0.010087584,0.000044045122,0.000025538522,0.000012485403,0.0000205791,0.000052420033,0.00073237997],"study_design_codex":"simulation_or_modeling","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.998749,0.0002989406,0.00009101572,0.00013734748,0.00047947807,0.00024427578],"domain_scores_gemma":[0.99480754,0.003430361,0.00042097172,0.00070289406,0.0005371993,0.0001010535],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0019219258,0.00078590855,0.00050303416,0.00090792245,0.00065219,0.0016322534,0.00076658785,0.000985989,0.0019573923],"category_scores_gemma":[0.007497037,0.00037190533,0.0002722553,0.00088193046,0.0009950058,0.0039032083,0.000949507,0.00082423823,0.00058769895],"study_design_candidate":"bench_or_experimental","study_design_consensus":null,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.0025078445,0.00023739446,0.0053942255,0.00055121665,0.000117428644,0.0010026193,0.00037277324,0.3828159,0.3237222,0.10054853,0.0015995149,0.18113042],"study_design_scores_gemma":[0.00021491245,0.0026977998,0.005762426,0.00019810788,0.0001575003,0.0025144843,0.00022600498,0.503348,0.39226845,0.08576496,0.006677803,0.00016955264],"about_ca_topic_score_codex":0.00013175987,"about_ca_topic_score_gemma":0.00021381435,"teacher_disagreement_score":0.0019573923,"about_ca_system_score_codex":0.0005931646,"about_ca_system_score_gemma":0.00031322558,"threshold_uncertainty_score":0.010164201},"labels":[],"label_agreement":null},{"id":"W1994356874","doi":"10.1109/mdt.2002.1033790","title":"Leakage and process variation effects in current testing on future CMOS circuits","year":2002,"lang":"en","type":"article","venue":"IEEE Design & Test of Computers","topic":"Integrated Circuits and Semiconductor Failure Analysis","field":"Engineering","cited_by":34,"is_retracted":false,"has_abstract":true,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of Waterloo","funders":"","keywords":"Leakage (economics); CMOS; Process variation; Transistor; Electronic engineering; Iddq testing; Electronic circuit; Sensitivity (control systems); Scaling; Integrated circuit; Computer science; Electrical engineering; Engineering; Voltage","score_opus":0.02343515816398593,"score_gpt":0.21238047146986502,"score_spread":0.1889453133058791,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W1994356874","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.6997759,0.005613426,0.27964777,0.0007916301,0.00007788715,0.000051803487,0.00018209421,0.0011343635,0.012725167],"genre_scores_gemma":[0.9923341,0.0003103486,0.006210122,0.000080421836,0.000033011886,0.000010340268,0.000059537793,0.00006532284,0.0008967641],"study_design_codex":"design_other","study_design_gemma":"simulation_or_modeling","domain_scores_codex":[0.9990834,0.00025988618,0.00002607823,0.00009712654,0.00046132554,0.00007221453],"domain_scores_gemma":[0.9961312,0.0026751377,0.00052306947,0.00025804623,0.00035450634,0.00005810807],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00085442176,0.00033169484,0.00022964066,0.0006710917,0.0002819268,0.0006525444,0.00051191915,0.00034455134,0.0011070363],"category_scores_gemma":[0.006049813,0.00018588568,0.00022427582,0.00064122694,0.00046853817,0.0011444231,0.00034556043,0.00034914658,0.00020842094],"study_design_candidate":"simulation_or_modeling","study_design_consensus":null,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00084031734,0.00022887121,0.051764324,0.00035054833,0.00014019801,0.0013810653,0.00047536197,0.2247485,0.28755987,0.043158267,0.0019634028,0.38738927],"study_design_scores_gemma":[0.000041922733,0.001823862,0.07891769,0.00014541158,0.00022689099,0.004189527,0.00016002034,0.6661385,0.20263773,0.03520571,0.010381592,0.00013117536],"about_ca_topic_score_codex":0.000784814,"about_ca_topic_score_gemma":0.0014237846,"teacher_disagreement_score":0.0011070363,"about_ca_system_score_codex":0.00053006754,"about_ca_system_score_gemma":0.00028767352,"threshold_uncertainty_score":0.004518628},"labels":[],"label_agreement":null},{"id":"W1997997233","doi":"10.1109/mdt.2011.62","title":"Guest Editors' Introduction: Multicore SoC Validation with Transaction-Level Models","year":2011,"lang":"en","type":"article","venue":"IEEE Design & Test of Computers","topic":"VLSI and Analog Circuit Testing","field":"Computer Science","cited_by":0,"is_retracted":false,"has_abstract":true,"route_ca_aff":true,"route_ca_fund":true,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"McGill University","funders":"University of Toronto; University of Florida","keywords":"Computer science; Debugging; Multi-core processor; Computer architecture; Database transaction; Software engineering; Embedded system; Database; Programming language; Parallel computing","score_opus":0.0877603150293892,"score_gpt":0.2274271205323582,"score_spread":0.139666805502969,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W1997997233","genre_codex":"editorial","genre_gemma":"editorial","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"editorial","genre_consensus":"editorial","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.0014605742,0.01675836,0.042505533,0.04605431,0.87856644,0.00007695639,0.00026639676,0.0011809426,0.013130435],"genre_scores_gemma":[0.030837264,0.026786769,0.024736146,0.03302908,0.7726353,0.0001425993,0.0007249412,0.0014471065,0.109660715],"study_design_codex":"not_applicable","study_design_gemma":"not_applicable","domain_scores_codex":[0.99735105,0.00033186143,0.00024148935,0.00037039278,0.0015286779,0.00017650628],"domain_scores_gemma":[0.9840844,0.004096093,0.0005347427,0.0007940097,0.009568492,0.00092239515],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0032767993,0.0010418822,0.0010430531,0.0017944844,0.0007610799,0.003354067,0.001491344,0.0023493303,0.011760429],"category_scores_gemma":[0.012791181,0.0005653519,0.0008475904,0.001272138,0.00076268334,0.0027097345,0.0012908082,0.0053009596,0.0053339],"study_design_candidate":"not_applicable","study_design_consensus":"not_applicable","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.000065202774,0.000035644516,0.00023080572,0.00022472625,0.000022307366,0.00015163684,0.00004004969,0.0012749858,0.00074951694,0.0028315824,0.9305159,0.06385759],"study_design_scores_gemma":[0.00003454369,0.00012625077,0.0004063146,0.00023983287,0.00004143551,0.000582887,0.0000614968,0.008988871,0.0016896356,0.0039595338,0.9838275,0.000041771804],"about_ca_topic_score_codex":0.00064473855,"about_ca_topic_score_gemma":0.0013652262,"teacher_disagreement_score":0.011760429,"about_ca_system_score_codex":0.0007525205,"about_ca_system_score_gemma":0.0010462053,"threshold_uncertainty_score":0.039342582},"labels":[],"label_agreement":null},{"id":"W2000766102","doi":"10.1109/mdt.2010.58","title":"Wireless Interconnect and the Potential for Carbon Nanotubes","year":2010,"lang":"en","type":"article","venue":"IEEE Design & Test of Computers","topic":"Carbon Nanotubes in Composites","field":"Materials Science","cited_by":10,"is_retracted":false,"has_abstract":true,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of British Columbia","funders":"","keywords":"Carbon nanotube; Wireless; Interconnection; Materials science; Nanotechnology; Key (lock); Absorption (acoustics); Electronic engineering; Computer science; Telecommunications; Engineering","score_opus":0.010364664115136321,"score_gpt":0.22875865055805608,"score_spread":0.21839398644291977,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2000766102","genre_codex":"review","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":null,"domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.104504555,0.42580408,0.059709046,0.022493582,0.004776314,0.00007703677,0.00022218043,0.00059904053,0.38181424],"genre_scores_gemma":[0.6811244,0.21411926,0.02421495,0.0017951576,0.0022195012,0.00014706448,0.00017575113,0.00009658779,0.07610736],"study_design_codex":"theoretical_or_conceptual","study_design_gemma":"theoretical_or_conceptual","domain_scores_codex":[0.99989235,0.000016171132,0.000002620738,0.000016487753,0.00005526581,0.000017013028],"domain_scores_gemma":[0.9997811,0.00011418052,0.000021291375,0.000014258586,0.00004916429,0.000019892526],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00016347623,0.0003131904,0.00016886709,0.00034225528,0.00046129903,0.0009913397,0.00031854725,0.0010371009,0.0039312113],"category_scores_gemma":[0.0005989804,0.00015537611,0.00013547027,0.00040838012,0.00061109534,0.0017043938,0.00060449936,0.00072806043,0.00086617866],"study_design_candidate":"theoretical_or_conceptual","study_design_consensus":"theoretical_or_conceptual","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.000100295605,0.000072216935,0.00069070584,0.0008522802,0.000022944487,0.0010538833,0.00027930803,0.007936242,0.06896366,0.7705158,0.01699517,0.13251752],"study_design_scores_gemma":[0.0000203081,0.0002722867,0.0005963429,0.00041013476,0.000028916254,0.0018606992,0.0002002788,0.013146085,0.04467264,0.20539093,0.73334134,0.000060099173],"about_ca_topic_score_codex":0.00024309629,"about_ca_topic_score_gemma":0.00042473132,"teacher_disagreement_score":0.0039312113,"about_ca_system_score_codex":0.00036903843,"about_ca_system_score_gemma":0.00023834962,"threshold_uncertainty_score":0.013151228},"labels":[],"label_agreement":null},{"id":"W2019142168","doi":"10.1109/mdt.2011.93","title":"Powering the Future: Organic Solar Cells with Polymer Energy Storage","year":2011,"lang":"en","type":"article","venue":"IEEE Design & Test of Computers","topic":"Conducting polymers and applications","field":"Materials Science","cited_by":5,"is_retracted":false,"has_abstract":true,"route_ca_aff":true,"route_ca_fund":true,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Simon Fraser University","funders":"Natural Sciences and Engineering Research Council of Canada; Mitacs","keywords":"Energy storage; Organic solar cell; Solar energy; Engineering physics; Computer science; Electrical engineering; Nanotechnology; Engineering; Photovoltaic system; Materials science; Physics","score_opus":0.020564604508249873,"score_gpt":0.19843454523468634,"score_spread":0.17786994072643647,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2019142168","genre_codex":"review","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":null,"domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.0039215474,0.3994891,0.0040932866,0.16470972,0.39414153,0.000060291655,0.00011107325,0.00024177342,0.03323174],"genre_scores_gemma":[0.03252441,0.25364104,0.004238164,0.080553494,0.5199908,0.000049539605,0.000085626976,0.00013597257,0.10878104],"study_design_codex":"not_applicable","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.99979633,0.000027067204,0.000017245322,0.000031175558,0.000109141496,0.000018950002],"domain_scores_gemma":[0.99963856,0.00016026574,0.000032240932,0.000011564526,0.00010345552,0.00005388388],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00071296527,0.00062588096,0.00031490895,0.0005562651,0.00055250555,0.0017290653,0.0007079941,0.001463728,0.0039980654],"category_scores_gemma":[0.0011318901,0.00016597848,0.00025784265,0.0003847712,0.00070155907,0.0023972942,0.00037034918,0.0023300282,0.0018302822],"study_design_candidate":"bench_or_experimental","study_design_consensus":null,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00018797939,0.000064235624,0.00023284124,0.0007768817,0.000027883967,0.00045728224,0.00019657788,0.00025084018,0.0049719526,0.012671784,0.7862993,0.19386251],"study_design_scores_gemma":[0.000019195646,0.00005331229,0.00018623422,0.00009214481,0.000013436347,0.00027918784,0.00008418373,0.00024203505,0.0013982189,0.0044431486,0.9931774,0.000011467219],"about_ca_topic_score_codex":0.00036103188,"about_ca_topic_score_gemma":0.0018324702,"teacher_disagreement_score":0.0039980654,"about_ca_system_score_codex":0.00036066773,"about_ca_system_score_gemma":0.00031181215,"threshold_uncertainty_score":0.013374865},"labels":[],"label_agreement":null},{"id":"W2026407389","doi":"10.1109/mdt.2011.50","title":"A Brief History of Multiprocessors and EDA","year":2011,"lang":"en","type":"article","venue":"IEEE Design & Test of Computers","topic":"Embedded Systems Design Techniques","field":"Computer Science","cited_by":1,"is_retracted":false,"has_abstract":true,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"McGill University","funders":"","keywords":"Byte; Computer science; Multiprocessing; Commodity; Computer architecture; Parallel computing; Embedded system; Programming language; Business","score_opus":0.06243552895008139,"score_gpt":0.22845344494542213,"score_spread":0.16601791599534074,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2026407389","genre_codex":"review","genre_gemma":"other","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"other","genre_consensus":null,"domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.0023942506,0.6569899,0.03100096,0.013896616,0.01592508,0.00012339157,0.00047179547,0.00072619907,0.2784718],"genre_scores_gemma":[0.03434182,0.5956277,0.044327777,0.015413725,0.013322637,0.00020516814,0.0007926599,0.00067928643,0.29528922],"study_design_codex":"design_other","study_design_gemma":"not_applicable","domain_scores_codex":[0.9990532,0.00015535086,0.00009305735,0.00012577,0.00046843497,0.00010421571],"domain_scores_gemma":[0.99868673,0.0005681178,0.00007058203,0.00014525678,0.00040978647,0.00011954684],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0009989028,0.0007157104,0.00046299974,0.0022637125,0.0013859419,0.0036095146,0.0010782554,0.0018539038,0.028409947],"category_scores_gemma":[0.0028272092,0.0007353366,0.00045670298,0.004572178,0.0011291568,0.005766214,0.0014054518,0.0034612715,0.013482317],"study_design_candidate":"not_applicable","study_design_consensus":null,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00014617908,0.00015022558,0.000565509,0.0019946792,0.000020891743,0.00039059718,0.00039886014,0.0015808524,0.0022595846,0.13446173,0.26215455,0.5958763],"study_design_scores_gemma":[0.000002093457,0.000029158318,0.0001321695,0.00032706087,0.0000031273319,0.00026533144,0.000047254973,0.00027191336,0.0004468148,0.0076237633,0.99084,0.000011294145],"about_ca_topic_score_codex":0.0012594176,"about_ca_topic_score_gemma":0.0017732362,"teacher_disagreement_score":0.028409947,"about_ca_system_score_codex":0.0014558752,"about_ca_system_score_gemma":0.001303646,"threshold_uncertainty_score":0.0950408},"labels":[],"label_agreement":null},{"id":"W2028808037","doi":"10.1109/mdt.2011.83","title":"FPGAs, Programming Models, and Kit Cars","year":2011,"lang":"en","type":"article","venue":"IEEE Design & Test of Computers","topic":"Embedded Systems Design Techniques","field":"Computer Science","cited_by":0,"is_retracted":false,"has_abstract":true,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of Toronto","funders":"","keywords":"Field-programmable gate array; Computer science; Application-specific integrated circuit; Computer architecture; Computation; Embedded system; Parallelism (grammar); Reconfigurable computing; Code (set theory); Parallel computing; Path (computing); Architecture; Programming language","score_opus":0.08427044704270062,"score_gpt":0.24752933183277798,"score_spread":0.16325888479007736,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2028808037","genre_codex":"methods","genre_gemma":"methods","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"methods","genre_consensus":"methods","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.024461133,0.010663119,0.49817887,0.0043254257,0.0011667956,0.00014293691,0.0010078255,0.0063633327,0.45369056],"genre_scores_gemma":[0.36025032,0.017689263,0.30526724,0.0018889343,0.0004347323,0.0003325266,0.0014843794,0.0012692224,0.31138346],"study_design_codex":"theoretical_or_conceptual","study_design_gemma":"not_applicable","domain_scores_codex":[0.9997371,0.000057391608,0.0000118795015,0.00004127574,0.00012966139,0.000022666254],"domain_scores_gemma":[0.9998344,0.000045827463,0.000012534064,0.000049455277,0.000038455102,0.000019222427],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00022290782,0.00063659484,0.00015645321,0.00057249935,0.0003706197,0.0018033098,0.00063640106,0.00065537205,0.0155603],"category_scores_gemma":[0.0007678358,0.00033451992,0.00017992881,0.00043555957,0.00084744743,0.0018719995,0.0006575722,0.0009177484,0.0048657707],"study_design_candidate":"not_applicable","study_design_consensus":null,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00009910272,0.000037361136,0.0006055778,0.00023391811,0.00001103414,0.0001831412,0.00021206247,0.027025992,0.0035176976,0.7368505,0.031381287,0.19984242],"study_design_scores_gemma":[0.00003149467,0.00015261066,0.0006499213,0.0002650575,0.000016690872,0.0005634924,0.00024156614,0.046485428,0.0045533176,0.19749624,0.74949706,0.00004712371],"about_ca_topic_score_codex":0.0021726287,"about_ca_topic_score_gemma":0.0025693902,"teacher_disagreement_score":0.0155603,"about_ca_system_score_codex":0.00036353947,"about_ca_system_score_gemma":0.0004008095,"threshold_uncertainty_score":0.052054405},"labels":[],"label_agreement":null},{"id":"W2037181413","doi":"10.1109/mdt.2007.151","title":"A Survey and Taxonomy of GALS Design Styles","year":2007,"lang":"en","type":"article","venue":"IEEE Design & Test of Computers","topic":"Parallel Computing and Optimization Techniques","field":"Computer Science","cited_by":177,"is_retracted":false,"has_abstract":true,"route_ca_aff":true,"route_ca_fund":true,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of British Columbia","funders":"University of Waterloo","keywords":"Computer science; Asynchronous communication; Embedded system; Computer architecture; Asynchronous circuit; Block (permutation group theory); Reuse; Synchronous circuit; Computer hardware; Clock signal; Engineering; Computer network","score_opus":0.07293608293102576,"score_gpt":0.2720912248614472,"score_spread":0.19915514193042144,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2037181413","genre_codex":"methods","genre_gemma":"methods","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"methods","genre_consensus":"methods","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.015037252,0.089654006,0.76380914,0.0019672187,0.0009934041,0.00043420302,0.0011452149,0.004654955,0.12230469],"genre_scores_gemma":[0.15183029,0.12544009,0.64144665,0.0029337471,0.0009894369,0.00079847354,0.00307272,0.0027554238,0.070733234],"study_design_codex":"design_other","study_design_gemma":"not_applicable","domain_scores_codex":[0.99727434,0.00044363807,0.00030262594,0.0003104354,0.0014794044,0.00018951505],"domain_scores_gemma":[0.99745303,0.000799676,0.00022597816,0.00052958383,0.00087178237,0.00011995282],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0021366207,0.0019979912,0.0008932648,0.004657227,0.00069306797,0.0034754535,0.003984126,0.0016900718,0.015387194],"category_scores_gemma":[0.004951673,0.0013518191,0.0014985151,0.0073706554,0.0009432031,0.0035094232,0.0016284775,0.0019145336,0.0064727315],"study_design_candidate":"not_applicable","study_design_consensus":null,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00023675287,0.00008338832,0.0018346639,0.0030604529,0.0000850747,0.00030137144,0.0006408915,0.020100905,0.00927321,0.11981393,0.028979965,0.8155894],"study_design_scores_gemma":[0.00008174368,0.00040034513,0.00096127787,0.0013336511,0.00012867963,0.0026877979,0.0004071413,0.044162523,0.012206363,0.074508764,0.8629608,0.00016095956],"about_ca_topic_score_codex":0.0011967522,"about_ca_topic_score_gemma":0.0016099893,"teacher_disagreement_score":0.015387194,"about_ca_system_score_codex":0.0013404238,"about_ca_system_score_gemma":0.0009124668,"threshold_uncertainty_score":0.051475346},"labels":[],"label_agreement":null},{"id":"W2077217887","doi":"10.1109/mdt.2011.2179849","title":"Bringing up a chip on the cheap","year":2011,"lang":"en","type":"article","venue":"IEEE Design & Test of Computers","topic":"Semiconductor materials and devices","field":"Engineering","cited_by":4,"is_retracted":false,"has_abstract":true,"route_ca_aff":false,"route_ca_fund":true,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"","funders":"McMaster University","keywords":"Debugging; Booting; Chip; Embedded system; Computer science; System on a chip; Silicon chip; Computer architecture; Transistor; Software bug; Silicon; Engineering; Operating system; Software; Electrical engineering; Telecommunications","score_opus":0.07077978310952662,"score_gpt":0.20918962590732837,"score_spread":0.13840984279780175,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2077217887","genre_codex":"other","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":null,"domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.05734971,0.011310003,0.4175928,0.027656563,0.015434937,0.00084256945,0.001232389,0.02857654,0.4400046],"genre_scores_gemma":[0.26691997,0.007836542,0.38522404,0.014754968,0.0030262829,0.00051415485,0.001361269,0.0034538684,0.3169089],"study_design_codex":"design_other","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.99903893,0.00006556119,0.000027331791,0.0001173996,0.0005814299,0.00016948531],"domain_scores_gemma":[0.9986664,0.00018369123,0.000042703523,0.00037485344,0.00048214366,0.00025016075],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0008250708,0.000991666,0.0004836524,0.0009278366,0.0011785002,0.0030573253,0.0016344741,0.0016117126,0.05752389],"category_scores_gemma":[0.0028517626,0.00054157525,0.0006218935,0.00057003397,0.00081688946,0.0038623873,0.0027581826,0.0017950312,0.022507733],"study_design_candidate":"bench_or_experimental","study_design_consensus":null,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00029898674,0.00014572956,0.0014707446,0.00057311583,0.00012593658,0.0009168204,0.0007118122,0.0012491561,0.10878599,0.059850406,0.2966559,0.52921546],"study_design_scores_gemma":[0.000054365475,0.00029812404,0.0010408439,0.00012402973,0.00007512624,0.0009978175,0.00043382004,0.002556138,0.022879098,0.011494221,0.9599873,0.00005909922],"about_ca_topic_score_codex":0.0009107773,"about_ca_topic_score_gemma":0.0014670052,"teacher_disagreement_score":0.05752389,"about_ca_system_score_codex":0.0005127904,"about_ca_system_score_gemma":0.000767337,"threshold_uncertainty_score":0.19243658},"labels":[],"label_agreement":null},{"id":"W2094764060","doi":"10.1109/mdt.2008.81","title":"Overview of Debug Standardization Activities","year":2008,"lang":"en","type":"article","venue":"IEEE Design & Test of Computers","topic":"Engineering and Test Systems","field":"Engineering","cited_by":20,"is_retracted":false,"has_abstract":true,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Advanced Micro Devices (Canada)","funders":"","keywords":"Nexus (standard); Standardization; Debugging; Background debug mode interface; Computer science; General partnership; Software engineering; Embedded system; Traceability; Protocol (science); Test (biology); Operating system; Telecommunications; Business; Medicine","score_opus":0.041149660765311416,"score_gpt":0.22365418559896452,"score_spread":0.1825045248336531,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2094764060","genre_codex":"methods","genre_gemma":"review","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"review","genre_consensus":null,"domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.0143759865,0.13463347,0.6335739,0.012241158,0.005356936,0.0016753391,0.0040358137,0.012053841,0.18205358],"genre_scores_gemma":[0.10414032,0.25121737,0.5004528,0.0056544985,0.0032411483,0.003051454,0.028032137,0.008053911,0.09615629],"study_design_codex":"design_other","study_design_gemma":"not_applicable","domain_scores_codex":[0.98933023,0.0025240441,0.0017247963,0.0012032741,0.0043284707,0.00088927895],"domain_scores_gemma":[0.9807201,0.0044831657,0.001443358,0.004012082,0.008269551,0.0010717451],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.018492758,0.0024580352,0.001215051,0.018940201,0.0020899007,0.008847944,0.0032512764,0.0029751896,0.011270175],"category_scores_gemma":[0.022480162,0.0014795208,0.001303423,0.014357064,0.0012243481,0.012082323,0.0051468113,0.0038558617,0.008918061],"study_design_candidate":"not_applicable","study_design_consensus":null,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00018978662,0.00023424032,0.003781569,0.0023155627,0.00006052873,0.0002142339,0.0010545446,0.003572398,0.004020163,0.13008764,0.06154729,0.792922],"study_design_scores_gemma":[0.000021050097,0.00012150297,0.00095385243,0.0016739402,0.00005345736,0.00054784416,0.00047017608,0.0018712643,0.004997906,0.02087096,0.96836835,0.00004970216],"about_ca_topic_score_codex":0.0024652493,"about_ca_topic_score_gemma":0.001852257,"teacher_disagreement_score":0.018940201,"about_ca_system_score_codex":0.00239957,"about_ca_system_score_gemma":0.007911467,"threshold_uncertainty_score":0.097800195},"labels":[],"label_agreement":null},{"id":"W2096735058","doi":"10.1109/mdt.2004.10","title":"DFT for delay fault testing of high-performance digital circuits","year":2004,"lang":"en","type":"article","venue":"IEEE Design & Test of Computers","topic":"Semiconductor materials and devices","field":"Engineering","cited_by":11,"is_retracted":false,"has_abstract":true,"route_ca_aff":true,"route_ca_fund":true,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of Waterloo","funders":"University of Waterloo","keywords":"Domino logic; Parametric statistics; Logic gate; Computer science; Domino; Automatic test pattern generation; Design for testing; Digital electronics; Electronic engineering; Fault coverage; Combinational logic; Fault (geology); Electronic circuit; Logic synthesis; Logic family; Reliability engineering; Engineering; Electrical engineering; Testability; Mathematics","score_opus":0.030038921913970187,"score_gpt":0.21271149550010168,"score_spread":0.18267257358613148,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2096735058","genre_codex":"methods","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":null,"domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.06895899,0.003495831,0.9157472,0.0006837635,0.00033845424,0.00010729062,0.00042977443,0.0029129912,0.00732562],"genre_scores_gemma":[0.84947956,0.0013632809,0.14477785,0.00019338366,0.00019659357,0.00010934297,0.0005010375,0.00007342249,0.0033054936],"study_design_codex":"design_other","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.99973196,0.000076790224,0.000014563507,0.000027600332,0.00012826531,0.0000209105],"domain_scores_gemma":[0.9992249,0.00052450085,0.000060013863,0.000093454284,0.00007223399,0.000024947167],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00023968368,0.00047446924,0.00025625626,0.00073333946,0.0002478959,0.00037294635,0.00043544872,0.00046784952,0.002749996],"category_scores_gemma":[0.0018943802,0.00010700678,0.000188825,0.00048345028,0.00041938934,0.0005024109,0.0002531366,0.00042333096,0.00063014915],"study_design_candidate":"bench_or_experimental","study_design_consensus":null,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.0006990394,0.00011682878,0.0027916424,0.0005441767,0.000059719827,0.00073144556,0.000086749176,0.11550871,0.12386468,0.1372538,0.008574646,0.6097686],"study_design_scores_gemma":[0.00008608521,0.0004869972,0.0015870404,0.00010856463,0.000043008204,0.0009884305,0.000034121458,0.820274,0.07772699,0.08133524,0.017290933,0.00003856223],"about_ca_topic_score_codex":0.0009923957,"about_ca_topic_score_gemma":0.0012837793,"teacher_disagreement_score":0.002749996,"about_ca_system_score_codex":0.0005113817,"about_ca_system_score_gemma":0.00047862975,"threshold_uncertainty_score":0.009199679},"labels":[],"label_agreement":null},{"id":"W2098685036","doi":"10.1109/mdt.2009.117","title":"Mixed-Signal Production Test: A Measurement Principle Perspective","year":2009,"lang":"en","type":"article","venue":"IEEE Design & Test of Computers","topic":"Advancements in PLL and VCO Technologies","field":"Engineering","cited_by":10,"is_retracted":false,"has_abstract":true,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"McGill University","funders":"","keywords":"Production (economics); Test (biology); Perspective (graphical); Computer science; SIGNAL (programming language); Key (lock); Automatic test equipment; Industrial engineering; Reliability engineering; Engineering; Artificial intelligence; Computer security","score_opus":0.04579763987425376,"score_gpt":0.24804956341235768,"score_spread":0.20225192353810392,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2098685036","genre_codex":"methods","genre_gemma":"methods","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"methods","genre_consensus":"methods","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.004129666,0.0032840588,0.96485907,0.002039267,0.00035815162,0.00007852203,0.000035476085,0.00037419348,0.024841603],"genre_scores_gemma":[0.5401254,0.008446734,0.42714635,0.0029060515,0.0019168044,0.00040082762,0.00016279836,0.00040874412,0.018486142],"study_design_codex":"theoretical_or_conceptual","study_design_gemma":"theoretical_or_conceptual","domain_scores_codex":[0.9968412,0.0007404051,0.00008874124,0.00023989835,0.0019810728,0.00010863703],"domain_scores_gemma":[0.9975561,0.0015944449,0.000121627985,0.0002398125,0.00043887313,0.0000490778],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0017398744,0.0008762326,0.0009240281,0.001262737,0.0004913679,0.0033438809,0.0021191663,0.002051172,0.0028425811],"category_scores_gemma":[0.0037941725,0.00054766715,0.0003732677,0.0008120125,0.0032901948,0.0033046564,0.0015375883,0.0024731148,0.001133785],"study_design_candidate":"theoretical_or_conceptual","study_design_consensus":"theoretical_or_conceptual","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.0002548412,0.00013796212,0.0013259335,0.0006466122,0.000067774614,0.0007575911,0.00046518128,0.009622853,0.098452196,0.59965277,0.005393334,0.28322288],"study_design_scores_gemma":[0.00013572413,0.0022353334,0.0029149756,0.00072883593,0.000117908145,0.007270775,0.00052370725,0.16243216,0.2387727,0.4068084,0.17782688,0.00023266421],"about_ca_topic_score_codex":0.00019761547,"about_ca_topic_score_gemma":0.00016631877,"teacher_disagreement_score":0.0033438809,"about_ca_system_score_codex":0.000828029,"about_ca_system_score_gemma":0.0005545082,"threshold_uncertainty_score":0.009509385},"labels":[],"label_agreement":null},{"id":"W2107554922","doi":"10.1109/mdt.2009.17","title":"Test Access Mechanism in the Quad-Core AMD Opteron Microprocessor","year":2009,"lang":"en","type":"article","venue":"IEEE Design & Test of Computers","topic":"VLSI and Analog Circuit Testing","field":"Computer Science","cited_by":6,"is_retracted":false,"has_abstract":true,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Advanced Micro Devices (Canada)","funders":"","keywords":"Multi-core processor; Computer science; Microprocessor; Embedded system; Computer architecture; Operating system; Core (optical fiber); Mechanism (biology); Telecommunications","score_opus":0.06320719244794462,"score_gpt":0.2865287305203363,"score_spread":0.22332153807239166,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2107554922","genre_codex":"empirical","genre_gemma":"methods","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"methods","genre_consensus":null,"domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.826206,0.0010970405,0.15551442,0.0006591757,0.00017435686,0.00012722203,0.00022650017,0.004261193,0.011734083],"genre_scores_gemma":[0.9880221,0.000057993144,0.009165192,0.0001073563,0.000014594046,0.000027313414,0.00004845194,0.000028627243,0.00252827],"study_design_codex":"design_other","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.99920976,0.00014978927,0.00008606597,0.000120212455,0.0002957157,0.0001382877],"domain_scores_gemma":[0.9983228,0.0004926238,0.00027061702,0.00041954138,0.00039726833,0.00009720802],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.000798526,0.00016575199,0.00023071845,0.0008198102,0.0005273276,0.0009607153,0.0012492602,0.0004029582,0.0025305287],"category_scores_gemma":[0.0029198618,0.00015105144,0.00014011115,0.0004990182,0.00050180743,0.0012708064,0.0007354985,0.0003490773,0.00032730337],"study_design_candidate":"bench_or_experimental","study_design_consensus":null,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.0044048554,0.0006268792,0.045334913,0.00047952918,0.00014159898,0.002239899,0.0016475488,0.027789034,0.21500073,0.12906668,0.018145405,0.555123],"study_design_scores_gemma":[0.0003464366,0.0026300005,0.023140574,0.00019445614,0.00019581315,0.004213034,0.0004658241,0.5295423,0.34244055,0.050120648,0.04653389,0.0001765417],"about_ca_topic_score_codex":0.0021717045,"about_ca_topic_score_gemma":0.0030155485,"teacher_disagreement_score":0.0025305287,"about_ca_system_score_codex":0.0008082288,"about_ca_system_score_gemma":0.0011637727,"threshold_uncertainty_score":0.008465409},"labels":[],"label_agreement":null},{"id":"W2116355244","doi":"10.1109/mdt.2002.1018134","title":"FlexWare: a retargetable, embedded-software development environment","year":2002,"lang":"en","type":"article","venue":"IEEE Design & Test of Computers","topic":"Parallel Computing and Optimization Techniques","field":"Computer Science","cited_by":22,"is_retracted":false,"has_abstract":true,"route_ca_aff":false,"route_ca_fund":true,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"","funders":"Université Laval","keywords":"Computer science; Embedded software; Exploit; Embedded system; Software; Computer architecture; Microcontroller; Software development; Ranging; Operating system","score_opus":0.032843429543215785,"score_gpt":0.21645051993184686,"score_spread":0.18360709038863107,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2116355244","genre_codex":"methods","genre_gemma":"methods","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"methods","genre_consensus":"methods","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.024106393,0.0003087565,0.8333244,0.0001886793,0.000091126996,0.00030611045,0.0005816456,0.1348437,0.006249229],"genre_scores_gemma":[0.20780729,0.0006386213,0.7540995,0.0003911774,0.00006315752,0.0006083634,0.0032859098,0.018185372,0.0149206985],"study_design_codex":"design_other","study_design_gemma":"not_applicable","domain_scores_codex":[0.9987062,0.00026914038,0.00012858688,0.00020778982,0.00056461693,0.00012372331],"domain_scores_gemma":[0.9957967,0.0018351395,0.00035679006,0.0011273435,0.0006442637,0.00023975602],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.001953841,0.0011167187,0.00044159588,0.00071848015,0.00025614072,0.0008738546,0.002448676,0.0007507184,0.0052728388],"category_scores_gemma":[0.008224694,0.00069703563,0.0004389639,0.00036672747,0.00046227474,0.0025942668,0.0016308428,0.0017092817,0.0027532827],"study_design_candidate":"not_applicable","study_design_consensus":null,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00096500706,0.00038401675,0.0029214788,0.00065185106,0.00009478734,0.001092257,0.0005795892,0.03637714,0.11017584,0.016489683,0.038217813,0.7920506],"study_design_scores_gemma":[0.000558227,0.0017130598,0.0053914203,0.00028255273,0.00014994846,0.0031796005,0.00015698826,0.40675825,0.34702817,0.02307314,0.21138439,0.0003242135],"about_ca_topic_score_codex":0.00048926467,"about_ca_topic_score_gemma":0.00072804035,"teacher_disagreement_score":0.0052728388,"about_ca_system_score_codex":0.00032138661,"about_ca_system_score_gemma":0.00077255175,"threshold_uncertainty_score":0.017639399},"labels":[],"label_agreement":null},{"id":"W2149287920","doi":"10.1109/mdt.2006.23","title":"Source-synchronous testing of multilane PCI Express and HyperTransport buses","year":2006,"lang":"en","type":"article","venue":"IEEE Design & Test of Computers","topic":"VLSI and Analog Circuit Testing","field":"Computer Science","cited_by":16,"is_retracted":false,"has_abstract":true,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"IBM (Canada)","funders":"Georgia Institute of Technology","keywords":"Jitter; PCI Express; Modular design; Computer science; Embedded system; PCI configuration space; Conventional PCI; Differential (mechanical device); Computer hardware; Gigabit; Electronic engineering; Engineering; Operating system; Field-programmable gate array","score_opus":0.028955385651755886,"score_gpt":0.20999959175611352,"score_spread":0.18104420610435762,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2149287920","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.8193702,0.0002609444,0.1749161,0.000068847155,0.000035390807,0.00009557068,0.00008275482,0.0008672982,0.0043029557],"genre_scores_gemma":[0.97888947,0.000062213745,0.019471837,0.000031877804,0.000013083124,0.000035509733,0.00006370349,0.000053509288,0.0013788705],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9991843,0.00013082025,0.0000395397,0.00012629498,0.00042749924,0.00009148974],"domain_scores_gemma":[0.99872154,0.00037552355,0.00036152892,0.00024371316,0.00021453777,0.00008313896],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00044948145,0.00039079608,0.00019064167,0.00041769588,0.00016219297,0.00046560037,0.0008236377,0.0002382896,0.0012217078],"category_scores_gemma":[0.0014757519,0.00017867633,0.00013724806,0.00025321794,0.0003568541,0.00096274354,0.0006573144,0.00038068302,0.00018258533],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00079238036,0.00021008428,0.011789826,0.00018347272,0.000059320373,0.00068914995,0.0004644966,0.013237181,0.8545557,0.009593529,0.00055477984,0.10787011],"study_design_scores_gemma":[0.00004980822,0.0018918326,0.0040863547,0.000012641237,0.000045161174,0.0009528126,0.00009474935,0.037837666,0.94894606,0.0011839553,0.004874296,0.00002480171],"about_ca_topic_score_codex":0.00020555379,"about_ca_topic_score_gemma":0.00042543357,"teacher_disagreement_score":0.0012217078,"about_ca_system_score_codex":0.00027574538,"about_ca_system_score_gemma":0.00027163044,"threshold_uncertainty_score":0.004087031},"labels":[],"label_agreement":null},{"id":"W2158373603","doi":"10.1109/mdt.2008.124","title":"A Quality-Driven Design Approach for NoCs","year":2008,"lang":"en","type":"article","venue":"IEEE Design & Test of Computers","topic":"Interconnection Networks and Systems","field":"Computer Science","cited_by":5,"is_retracted":false,"has_abstract":true,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"McGill University","funders":"","keywords":"Debugging; Computer science; Computer architecture; Quality (philosophy); Test (biology); Embedded system; Software engineering; Design for testing; Reliability engineering; Engineering; Programming language; Testability","score_opus":0.11945995191426304,"score_gpt":0.2827301218498564,"score_spread":0.16327016993559337,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2158373603","genre_codex":"methods","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":null,"domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.0011849165,0.0013133447,0.97606814,0.006783068,0.0020921263,0.00015530045,0.00006142062,0.00066578656,0.011675744],"genre_scores_gemma":[0.04559074,0.0025080647,0.92256755,0.003190353,0.0015599432,0.00033938338,0.00012223385,0.0004060675,0.023715759],"study_design_codex":"design_other","study_design_gemma":"theoretical_or_conceptual","domain_scores_codex":[0.9983511,0.00037366233,0.00009909719,0.00009190138,0.0010184679,0.00006565553],"domain_scores_gemma":[0.9971144,0.0007467019,0.00009218282,0.0002812333,0.0016467997,0.00011864219],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0031770242,0.00070641027,0.00029833138,0.0009869636,0.00054547936,0.0013490026,0.0016671171,0.0009855448,0.0061193723],"category_scores_gemma":[0.0054026092,0.00038722114,0.00074185437,0.00042715194,0.0010484552,0.0011675335,0.00084162847,0.0018271252,0.0016525452],"study_design_candidate":"theoretical_or_conceptual","study_design_consensus":null,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00014219148,0.00010436837,0.0009943036,0.00088963594,0.0001379198,0.00053437595,0.00059687847,0.0851714,0.015514951,0.33797503,0.10533434,0.4526046],"study_design_scores_gemma":[0.00017669727,0.0002964677,0.00030979974,0.0002665674,0.000119396296,0.0006416865,0.00012405487,0.22589219,0.008996954,0.21370645,0.54941666,0.000053134954],"about_ca_topic_score_codex":0.0012276792,"about_ca_topic_score_gemma":0.0038857684,"teacher_disagreement_score":0.0061193723,"about_ca_system_score_codex":0.0011058773,"about_ca_system_score_gemma":0.0011549856,"threshold_uncertainty_score":0.020471334},"labels":[],"label_agreement":null},{"id":"W2168901237","doi":"10.1109/mdt.2004.34","title":"Jitter models for the design and test of Gbps-speed serial interconnects","year":2004,"lang":"en","type":"article","venue":"IEEE Design & Test of Computers","topic":"Advancements in PLL and VCO Technologies","field":"Engineering","cited_by":85,"is_retracted":false,"has_abstract":true,"route_ca_aff":true,"route_ca_fund":true,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of British Columbia","funders":"University of British Columbia","keywords":"Jitter; Bit error rate; Computer science; Gigabit; Serial communication; Noise (video); Electronic engineering; Computer hardware; Engineering; Telecommunications; Decoding methods","score_opus":0.0395368072549954,"score_gpt":0.23755968270765948,"score_spread":0.1980228754526641,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2168901237","genre_codex":"methods","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":null,"domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.009150851,0.0009857016,0.9854812,0.00011133636,0.000050843482,0.00007814211,0.00010835114,0.00080934993,0.0032242497],"genre_scores_gemma":[0.71375513,0.003939715,0.26925635,0.0003281703,0.00030926144,0.00078163116,0.0007103477,0.0004808863,0.01043842],"study_design_codex":"simulation_or_modeling","study_design_gemma":"simulation_or_modeling","domain_scores_codex":[0.9979925,0.0004408092,0.00010807203,0.0001642279,0.0011095828,0.00018479982],"domain_scores_gemma":[0.99762744,0.0012268627,0.00048186947,0.00023396076,0.0003707448,0.000059116588],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00178155,0.0016142543,0.00092360424,0.0013779465,0.00056253216,0.0010872014,0.0016869154,0.0009881797,0.0016299386],"category_scores_gemma":[0.0061644064,0.0006168992,0.00086305913,0.0008597543,0.00069159956,0.0012700683,0.00072398386,0.0009605881,0.00066378684],"study_design_candidate":"simulation_or_modeling","study_design_consensus":"simulation_or_modeling","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00003681853,0.000017899889,0.00047932361,0.00004104972,0.000016401442,0.000040260544,0.000022851118,0.9721415,0.002143079,0.014276041,0.00032024525,0.010464475],"study_design_scores_gemma":[0.000005982334,0.00003812303,0.000105069914,0.000009588595,0.000013277756,0.00002116977,0.0000028199747,0.9910541,0.0014480833,0.0063758306,0.0009215346,0.000004483724],"about_ca_topic_score_codex":0.0048426054,"about_ca_topic_score_gemma":0.0031883006,"teacher_disagreement_score":0.0048426054,"about_ca_system_score_codex":0.0016003927,"about_ca_system_score_gemma":0.0011821644,"threshold_uncertainty_score":0.01161176},"labels":[],"label_agreement":null}]}