{"meta":{"query_hash":"ac28bff08752","filters":{"venue":"Journal of Electronic Materials"},"cohort_total":147,"direct_labels_cover":0,"predictions_cover":147,"exported":147,"export_cap":100000,"truncated":false,"label_status":"direct model label, unvalidated","prediction_status":"machine_predicted_unvalidated (Codex and Gemma teacher distillation)","score_status":"score_only:v0-immature-baseline","snapshot":{"source":"OpenAlex, pinned release, all 482 partitions","release":"2026-06-24","frame_built":"2026-07-12"},"permalink":"https://metacan.xera.ac/q/ac28bff08752","api":"https://metacan.xera.ac/api/v1/cohort?venue=Journal+of+Electronic+Materials"},"results":[{"id":"W1812293979","doi":"10.1007/s11664-015-4006-z","title":"International Round-Robin Study of the Thermoelectric Transport Properties of an n-Type Half-Heusler Compound from 300 K to 773 K","year":2015,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Advanced Thermoelectric Materials and Devices","field":"Materials Science","cited_by":66,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of Waterloo","funders":"Oak Ridge National Laboratory; Battelle; National Aeronautics and Space Administration; U.S. Department of Energy","keywords":"Bismuth telluride; Telluride; Round robin test; Thermoelectric effect; Thermoelectric generator; Thermoelectric materials; Engineering physics; Materials science; Physics; Mathematics; Thermodynamics; Metallurgy; Statistics","score_opus":0.029765758701074622,"score_gpt":0.26978854845971134,"score_spread":0.24002278975863672,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W1812293979","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.99506503,0.0002128623,0.00027947818,0.00003008272,0.000008384126,0.0000059067265,0.00009195703,0.000020051628,0.004286248],"genre_scores_gemma":[0.9971221,0.00008000356,0.00031049724,0.000006347725,0.0000029675275,0.000004953486,0.00011604316,0.000016311942,0.0023407775],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9999472,0.000005925176,0.0000018292533,0.000015736048,0.000013585569,0.000015750687],"domain_scores_gemma":[0.9998988,0.000026160991,0.000013328104,0.000014885627,0.000032672284,0.000014136019],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00019109793,0.00017394673,0.00024158451,0.0003106964,0.0005908731,0.00033444053,0.00038751675,0.00023777375,0.0026728383],"category_scores_gemma":[0.00022600386,0.000081427104,0.00017539453,0.00032159133,0.00035680257,0.00059939275,0.00021161723,0.000196769,0.00026469625],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.0017943699,0.00015598701,0.004870245,0.0003190208,0.000050866733,0.0009426825,0.00055862474,0.0061938767,0.96556294,0.0050644684,0.0014304292,0.0130565595],"study_design_scores_gemma":[0.0000880995,0.001534317,0.027841458,0.000032437732,0.00006484581,0.00063623633,0.0005030407,0.033856705,0.9272954,0.0009961332,0.0070977025,0.000053585387],"about_ca_topic_score_codex":0.0022679844,"about_ca_topic_score_gemma":0.0023652248,"teacher_disagreement_score":0.0026728383,"about_ca_system_score_codex":0.00036294575,"about_ca_system_score_gemma":0.00032170236,"threshold_uncertainty_score":0.008941591},"labels":[],"label_agreement":null},{"id":"W1964491071","doi":"10.1007/s11664-010-1398-7","title":"Erratum to: A Cryo-XPS Study of Triammonium Citrate-KAuCl4-Na2SO3 Electroplating Solutions for Pb-Free Solder Packaging","year":2010,"lang":"en","type":"erratum","venue":"Journal of Electronic Materials","topic":"Electronic Packaging and Soldering Technologies","field":"Engineering","cited_by":1,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of Alberta","funders":"","keywords":"X-ray photoelectron spectroscopy; Chemistry; Sodium sulfite; Sulfite; Sodium citrate; Chemical engineering; Cyanide; Inorganic chemistry; Sodium; Organic chemistry","score_opus":0.017509780371548284,"score_gpt":0.25395640955817467,"score_spread":0.23644662918662637,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W1964491071","genre_codex":"editorial","genre_gemma":"other","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"other","genre_consensus":null,"domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.043502532,0.015105976,0.008406623,0.05018496,0.8600116,0.00014594184,0.0032006903,0.0010861433,0.018355548],"genre_scores_gemma":[0.2028409,0.031363837,0.043057352,0.055056274,0.026713697,0.00021908166,0.014758581,0.0023404271,0.6236499],"study_design_codex":"not_applicable","study_design_gemma":"not_applicable","domain_scores_codex":[0.99927837,0.000028493008,0.000109473585,0.000108331056,0.00041282407,0.0000624788],"domain_scores_gemma":[0.99854636,0.00018216806,0.00009342209,0.00009403635,0.0009989428,0.00008509601],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00056008797,0.001339366,0.0010247935,0.0009850552,0.0020623363,0.00077194616,0.0016564714,0.0029803396,0.013761929],"category_scores_gemma":[0.0025788648,0.00063917314,0.0006982104,0.0009763379,0.00067054445,0.001314518,0.0004996067,0.0023155161,0.006829493],"study_design_candidate":"not_applicable","study_design_consensus":"not_applicable","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00089645095,0.00025126283,0.000996881,0.0016739047,0.00007596339,0.0066253827,0.00025703502,0.00035533027,0.08989132,0.0018490969,0.83229935,0.064827956],"study_design_scores_gemma":[0.000087110064,0.0005368827,0.010628621,0.00021442556,0.00031097082,0.0060454463,0.00060311327,0.0012489518,0.14026864,0.0011941997,0.8387039,0.0001578646],"about_ca_topic_score_codex":0.0043773465,"about_ca_topic_score_gemma":0.009508855,"teacher_disagreement_score":0.013761929,"about_ca_system_score_codex":0.0013597077,"about_ca_system_score_gemma":0.0015299094,"threshold_uncertainty_score":0.04603827},"labels":[],"label_agreement":null},{"id":"W1965852723","doi":"10.1007/s11664-001-0038-7","title":"Microstructural characterization of inlaid copper interconnect lines","year":2001,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Copper Interconnects and Reliability","field":"Materials Science","cited_by":70,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Advanced Micro Devices (Canada)","funders":"","keywords":"Materials science; Trench; Microstructure; Annealing (glass); Grain size; Copper; Texture (cosmology); Diffraction; Composite material; Grain boundary; Metallurgy; Optics","score_opus":0.008954485509622353,"score_gpt":0.24996902846438349,"score_spread":0.24101454295476113,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W1965852723","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9941089,0.00015726798,0.00247931,0.000035607583,0.000008441305,0.000010438133,0.00019663203,0.000071629875,0.002931877],"genre_scores_gemma":[0.9974451,0.000033663782,0.0009808723,0.000007951592,0.000003668826,0.0000064372343,0.00014826776,0.000010844663,0.0013632909],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.99987173,0.000013868284,0.0000062755107,0.000025838992,0.000056875037,0.000025327141],"domain_scores_gemma":[0.99949384,0.000050875242,0.00011414248,0.0000630754,0.00024744167,0.000030520587],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00012446487,0.0001619332,0.00015421449,0.00062824396,0.0005082517,0.00037721242,0.00030655653,0.00029995988,0.0013606936],"category_scores_gemma":[0.00048522378,0.0001986409,0.000070193535,0.00042220714,0.00022770154,0.00038836052,0.00016263836,0.00016987711,0.00015217748],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00037316067,0.00006175113,0.0074591683,0.000095436655,0.000013938377,0.00024986203,0.0003742466,0.0025446522,0.9781139,0.0005496169,0.00072102394,0.009443225],"study_design_scores_gemma":[0.000021941009,0.00053764955,0.12661715,0.00001735579,0.000036976067,0.0006547998,0.0006904779,0.02820942,0.8349265,0.00022836514,0.008033138,0.000026280593],"about_ca_topic_score_codex":0.003094885,"about_ca_topic_score_gemma":0.0069557023,"teacher_disagreement_score":0.003094885,"about_ca_system_score_codex":0.0005144697,"about_ca_system_score_gemma":0.00020533321,"threshold_uncertainty_score":0.0061537623},"labels":[],"label_agreement":null},{"id":"W1965867179","doi":"10.1007/s11664-005-0054-0","title":"Fluxon pinning in the nodeless pairing state of superconducting YBa2Cu3O7","year":2005,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Physics of Superconductivity and Magnetism","field":"Physics and Astronomy","cited_by":5,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":true,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of British Columbia; University of Alberta","funders":"Air Force Office of Scientific Research; Army Research Office; Office of Naval Research; U.S. Air Force; TRIUMF","keywords":"Fluxon; Condensed matter physics; Physics; Pairing; Superconductivity; Penetration depth; Magnetic field; Josephson effect; Pi Josephson junction; Quantum mechanics","score_opus":0.011424222320501946,"score_gpt":0.24421984099075983,"score_spread":0.2327956186702579,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W1965867179","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9940363,0.000080846396,0.00077442115,0.0001019023,0.00005055568,0.0000068780937,0.000020194335,0.00007418578,0.0048545883],"genre_scores_gemma":[0.9987723,0.000021601776,0.00018107414,0.00002228738,0.000007978805,0.0000057321818,0.000030920874,0.000017519595,0.0009404679],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9999149,0.000013476403,0.0000039035203,0.000012708537,0.000019648802,0.00003536184],"domain_scores_gemma":[0.9998128,0.000050463666,0.000029503375,0.000034464596,0.000026662798,0.00004604384],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00019516007,0.00017492937,0.00040444563,0.00070909713,0.0016307785,0.0010903266,0.00039275663,0.00049588067,0.0044635506],"category_scores_gemma":[0.0005166112,0.00022826954,0.00015232775,0.00033867906,0.0010194231,0.00065963,0.0007194847,0.0004339679,0.00021783751],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.0040460527,0.00062903966,0.00839547,0.00041972223,0.000088387016,0.0036504043,0.0027048916,0.008810408,0.6431189,0.29616606,0.004798684,0.027172016],"study_design_scores_gemma":[0.00093478896,0.002040511,0.046153296,0.0002464712,0.00015120432,0.002019489,0.004336028,0.21591721,0.47845292,0.23556924,0.013897428,0.00028142205],"about_ca_topic_score_codex":0.0009359029,"about_ca_topic_score_gemma":0.0019638098,"teacher_disagreement_score":0.0044635506,"about_ca_system_score_codex":0.0003382823,"about_ca_system_score_gemma":0.00041752707,"threshold_uncertainty_score":0.014932096},"labels":[],"label_agreement":null},{"id":"W1968528795","doi":"10.1007/s11664-010-1432-9","title":"Electrical and Optical Characterization of Melt-Grown Bulk InAs1−y P y Crystals","year":2010,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Advanced Semiconductor Detectors and Materials","field":"Engineering","cited_by":1,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"General Dynamics (Canada)","funders":"Air Force Office of Scientific Research","keywords":"Materials science; Alloy; Substrate (aquarium); Ternary operation; Electrical resistivity and conductivity; Characterization (materials science); Solid-state physics; Ternary alloy; Wavelength; Analytical Chemistry (journal); Mineralogy; Crystallography; Condensed matter physics; Optoelectronics; Chemistry; Metallurgy; Nanotechnology; Geology","score_opus":0.004373369324278517,"score_gpt":0.2078799138906868,"score_spread":0.2035065445664083,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W1968528795","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9979272,0.00027948082,0.0005632983,0.000036086858,0.000013988306,0.000005287942,0.0004656199,0.000051620314,0.00065735175],"genre_scores_gemma":[0.99742484,0.00019088549,0.00067220913,0.000011170748,0.000013786352,0.000010999807,0.00042009988,0.000035863377,0.0012201191],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9998627,0.000008849454,0.000008655775,0.00003917277,0.000051487754,0.00002910773],"domain_scores_gemma":[0.99967265,0.00010367347,0.00006463967,0.00003845145,0.000101050464,0.000019534174],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.000119658456,0.00019938588,0.0003459659,0.00025629267,0.0003123891,0.00042500594,0.00025810066,0.00028211877,0.0017994163],"category_scores_gemma":[0.0004482752,0.00016433018,0.000171663,0.0003347107,0.00018162094,0.0003890017,0.00015223234,0.000259471,0.00031015006],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00021413695,0.000018918554,0.0009819189,0.00003932893,0.0000090823205,0.00008613221,0.00006944375,0.00017076703,0.99690515,0.00008347703,0.00012592543,0.0012957634],"study_design_scores_gemma":[0.000024410561,0.00030855736,0.017912103,0.000014405995,0.000021286216,0.00017473107,0.00014240068,0.0035382267,0.9764748,0.000079163714,0.0012978776,0.00001192685],"about_ca_topic_score_codex":0.0014885063,"about_ca_topic_score_gemma":0.0020141273,"teacher_disagreement_score":0.0017994163,"about_ca_system_score_codex":0.00031084454,"about_ca_system_score_gemma":0.00024947597,"threshold_uncertainty_score":0.0060195923},"labels":[],"label_agreement":null},{"id":"W1972394143","doi":"10.1007/s11664-014-3478-6","title":"Nanocopper Based Solder-Free Electronic Assembly","year":2014,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Nanoporous metals and alloys","field":"Materials Science","cited_by":33,"is_retracted":false,"has_abstract":true,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Lockheed Martin (Canada)","funders":"Integrated Electronics Engineering Center, Binghamton University; Binghamton University","keywords":"Soldering; Solder paste; Materials science; Copper; Printed circuit board; Surface-mount technology; Scanning electron microscope; Electronics; Composite material; Electronic packaging; Porosity; Reliability (semiconductor); Drop test; Nanocrystalline material; Metallurgy; Optoelectronics; Nanotechnology; Electrical engineering; Structural engineering","score_opus":0.005585365731552009,"score_gpt":0.22087416992772624,"score_spread":0.21528880419617422,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W1972394143","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.86215943,0.0015495744,0.0982549,0.00020055554,0.0003756189,0.00046107368,0.0007811272,0.0037525836,0.032465093],"genre_scores_gemma":[0.88885856,0.00055253063,0.091034204,0.00009598293,0.000023848104,0.00030417688,0.0003820088,0.00020188758,0.018546816],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.99975127,0.000014067664,0.000018265951,0.000090924164,0.00009589385,0.000029512703],"domain_scores_gemma":[0.99985003,0.000014318357,0.000030156862,0.000045702567,0.000040376435,0.000019312194],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00015380816,0.00044260477,0.00037054764,0.00026874585,0.00030803282,0.00028125025,0.0005040927,0.00034848347,0.002484847],"category_scores_gemma":[0.00025782592,0.00024191296,0.00020537902,0.00021614286,0.00015874622,0.00027643554,0.00035889534,0.00028407018,0.0013976623],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.000026486177,0.00003490392,0.00012372424,0.00007288782,0.000008960358,0.000119661076,0.000038833114,0.00062935665,0.9874843,0.00057915464,0.00058511435,0.010296722],"study_design_scores_gemma":[0.0000069450825,0.00012900557,0.00052254077,0.0000039278466,0.00000752016,0.00012763983,0.00000746682,0.0033605918,0.9883978,0.000060336097,0.0073660444,0.000010182571],"about_ca_topic_score_codex":0.00059510523,"about_ca_topic_score_gemma":0.0015497104,"teacher_disagreement_score":0.002484847,"about_ca_system_score_codex":0.000437359,"about_ca_system_score_gemma":0.00015898737,"threshold_uncertainty_score":0.008312702},"labels":[],"label_agreement":null},{"id":"W1973558699","doi":"10.1007/s11664-012-2396-8","title":"Transport Properties of Bulk Thermoelectrics—An International Round-Robin Study, Part I: Seebeck Coefficient and Electrical Resistivity","year":2013,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Advanced Thermoelectric Materials and Devices","field":"Materials Science","cited_by":137,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Université du Québec à Chicoutimi; University of Waterloo","funders":"Oak Ridge National Laboratory; U.S. Department of Energy; Office of Energy Efficiency and Renewable Energy; Deutsches Zentrum für Luft- und Raumfahrt; UT-Battelle; National Aeronautics and Space Administration","keywords":"Thermoelectric materials; Bismuth telluride; Thermoelectric effect; Thermoelectric generator; Seebeck coefficient; Engineering physics; Materials science; Electricity; Photovoltaics; Mechanical engineering; Engineering; Electrical engineering; Photovoltaic system; Physics; Thermodynamics","score_opus":0.015684128626440936,"score_gpt":0.25000544324191076,"score_spread":0.23432131461546982,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W1973558699","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9705723,0.007299844,0.0061043864,0.00015826312,0.000053335538,0.000018452072,0.00032653977,0.00013833922,0.015328558],"genre_scores_gemma":[0.99031657,0.0017800231,0.0021415113,0.00002031754,0.00003518043,0.0000115671055,0.0003497155,0.00008652962,0.005258635],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9998714,0.000020815378,0.0000056639587,0.000037547376,0.00004021605,0.000024370062],"domain_scores_gemma":[0.9997309,0.00010117738,0.000036162153,0.0000397742,0.000075121556,0.000016967588],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.000460672,0.00040489523,0.00048655004,0.00063110003,0.00028628853,0.00066630944,0.00044188305,0.0003594391,0.00205989],"category_scores_gemma":[0.0006117591,0.00020364122,0.0002715124,0.00048040462,0.00041893925,0.0013343456,0.00031107164,0.00040550166,0.00069879426],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.0009944356,0.00024498298,0.0032834094,0.0004780103,0.000066024615,0.000275759,0.00028013872,0.01137071,0.9332069,0.014640289,0.0025134173,0.032645952],"study_design_scores_gemma":[0.00004531077,0.0014044429,0.012844732,0.000097609154,0.0001385826,0.00087879325,0.00022470806,0.10039253,0.8682558,0.0046619936,0.010992362,0.00006314676],"about_ca_topic_score_codex":0.00067423616,"about_ca_topic_score_gemma":0.00064865383,"teacher_disagreement_score":0.00205989,"about_ca_system_score_codex":0.0002826489,"about_ca_system_score_gemma":0.0002162156,"threshold_uncertainty_score":0.0068909526},"labels":[],"label_agreement":null},{"id":"W1973649465","doi":"10.1007/s11664-012-2191-6","title":"Densification and Electrical Properties of Zinc Oxide Varistors Microwave-Sintered Under Different Oxygen Partial Pressures","year":2012,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"ZnO doping and properties","field":"Materials Science","cited_by":3,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Optech (Canada)","funders":"","keywords":"Varistor; Sintering; Materials science; Partial pressure; Microwave; Zinc; Oxygen; Solid-state physics; Capacitance; Oxide; Composite material; Voltage; Metallurgy; Electrode; Chemistry; Electrical engineering","score_opus":0.028908397142523422,"score_gpt":0.24135933850079752,"score_spread":0.2124509413582741,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W1973649465","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9990194,0.0002058458,0.00031404087,0.000013451434,0.0000054035777,0.0000020242767,0.00007180118,0.000012727815,0.0003553784],"genre_scores_gemma":[0.9991636,0.00008847666,0.00015596126,0.0000041572735,0.0000025361235,0.0000025182308,0.00011435763,0.0000058706287,0.00046264846],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.99990535,0.000007082708,0.00000769632,0.000020232483,0.000037715356,0.000021859678],"domain_scores_gemma":[0.9998685,0.00004143602,0.00003222507,0.000012191825,0.000031129654,0.000014531268],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00013851773,0.00012399742,0.00018420264,0.00024739085,0.00016222267,0.00023270548,0.00016936359,0.00017738773,0.0011929969],"category_scores_gemma":[0.00034234632,0.00013768114,0.00011402459,0.0002529185,0.00022880711,0.0002741364,0.00013505238,0.0001956732,0.00009796218],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00030057572,0.000013049019,0.0014235151,0.000031185362,0.000007841147,0.00006313275,0.00010907456,0.00030686293,0.9957196,0.0001510865,0.00004151698,0.0018326181],"study_design_scores_gemma":[0.000011597193,0.00010831181,0.010345727,0.0000051651537,0.00001432554,0.000056339366,0.00006932087,0.001732908,0.9870919,0.000031954467,0.0005282838,0.000004002444],"about_ca_topic_score_codex":0.001362592,"about_ca_topic_score_gemma":0.0018750179,"teacher_disagreement_score":0.001362592,"about_ca_system_score_codex":0.00022393887,"about_ca_system_score_gemma":0.00010492689,"threshold_uncertainty_score":0.003990948},"labels":[],"label_agreement":null},{"id":"W1978698051","doi":"10.1007/s11664-010-1473-0","title":"Development of Thermoelectric Self-Powered Heating Equipment","year":2010,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Advanced Thermoelectric Materials and Devices","field":"Materials Science","cited_by":23,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Natural Resources Canada","funders":"","keywords":"Thermoelectric generator; Thermoelectric effect; Electricity; Boiler (water heating); Heating system; Automotive engineering; Thermoelectric cooling; Electric heating; Process engineering; Electricity generation; Electric power; Thermoelectric materials; Mechanical engineering; Electrical engineering; Nuclear engineering; Engineering; Power (physics); Waste management","score_opus":0.007134676897559273,"score_gpt":0.25148395525305955,"score_spread":0.24434927835550027,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W1978698051","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.73865294,0.0028083785,0.23718245,0.00022797547,0.0002695371,0.0005525895,0.00037119718,0.0020936471,0.017841337],"genre_scores_gemma":[0.75032675,0.0017998274,0.22770728,0.000076942946,0.000054235083,0.00033754267,0.0007681055,0.00020601883,0.018723361],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9998241,0.0000151504355,0.000012534902,0.00003531091,0.00009162484,0.000021321937],"domain_scores_gemma":[0.9998442,0.00002541878,0.000016392076,0.000029850951,0.000064582244,0.000019425515],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0003118835,0.00029857355,0.00028634613,0.00039714252,0.00020520226,0.0003312742,0.00070251245,0.00033656418,0.0025948896],"category_scores_gemma":[0.00028854673,0.00027449103,0.00024859697,0.00024478507,0.00013915384,0.00071213854,0.00035134514,0.0005267233,0.001016583],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00003826838,0.000068919944,0.00051239965,0.00018912567,0.000010759703,0.00008768695,0.00006618151,0.0004064891,0.95548743,0.0017037927,0.0003616689,0.041067395],"study_design_scores_gemma":[0.000008163985,0.00025691692,0.0012937378,0.000013554686,0.000011278607,0.00018942455,0.000013573546,0.0031892958,0.9855751,0.000088919965,0.009354174,0.0000058889964],"about_ca_topic_score_codex":0.0000790394,"about_ca_topic_score_gemma":0.00015114278,"teacher_disagreement_score":0.0025948896,"about_ca_system_score_codex":0.00014906943,"about_ca_system_score_gemma":0.00025898535,"threshold_uncertainty_score":0.008680761},"labels":[],"label_agreement":null},{"id":"W1979863234","doi":"10.1007/s11664-011-1594-0","title":"Silver Nanoparticle Paste for Low-Temperature Bonding of Copper","year":2011,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Electronic Packaging and Soldering Technologies","field":"Engineering","cited_by":152,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":true,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of Waterloo","funders":"Natural Sciences and Engineering Research Council of Canada","keywords":"Copper; Sintering; Materials science; Silver nanoparticle; Silver nitrate; FOIL method; Metallurgy; Nanoparticle; Transmission electron microscopy; Soldering; Chemical engineering; Composite material; Inorganic chemistry; Nuclear chemistry; Chemistry; Nanotechnology","score_opus":0.012078348170661545,"score_gpt":0.2133303931270409,"score_spread":0.20125204495637936,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W1979863234","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.95380855,0.0045637772,0.026415104,0.00034808964,0.0008179456,0.00010782779,0.00009846356,0.00088922185,0.012951002],"genre_scores_gemma":[0.9749117,0.00075721,0.012835047,0.000074190626,0.000040678045,0.000048495258,0.00007383482,0.0001238977,0.01113506],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9997719,0.00002415072,0.000013169898,0.000058161095,0.00009601625,0.00003652769],"domain_scores_gemma":[0.99986506,0.000021065853,0.000020585067,0.00002078565,0.00005252011,0.000019921139],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00017312831,0.0003654571,0.00038180276,0.0003844337,0.00036470706,0.00034128333,0.0005296438,0.0006560026,0.0018573119],"category_scores_gemma":[0.0003409755,0.00041335946,0.00026011476,0.00018352208,0.0001534958,0.0003969525,0.00034440716,0.0005058038,0.00084940915],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00006385723,0.000029065639,0.00008018288,0.00013004098,0.000008391005,0.00008592348,0.000046461464,0.00015600542,0.9910959,0.00021660984,0.00060859154,0.007479022],"study_design_scores_gemma":[0.0000064913656,0.00011664735,0.00029439185,0.0000054479124,0.000010954237,0.000067860885,0.000014493764,0.001424799,0.9964922,0.000034921162,0.0015261922,0.000005532923],"about_ca_topic_score_codex":0.00030583082,"about_ca_topic_score_gemma":0.0010245026,"teacher_disagreement_score":0.0018573119,"about_ca_system_score_codex":0.00027645082,"about_ca_system_score_gemma":0.00018185696,"threshold_uncertainty_score":0.0062133074},"labels":[],"label_agreement":null},{"id":"W1980553139","doi":"10.1007/s11664-013-2681-1","title":"Advancements in THM-Grown CdZnTe for Use as Substrates for HgCdTe","year":2013,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Advanced Semiconductor Detectors and Materials","field":"Engineering","cited_by":33,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Redlen Technologies (Canada)","funders":"","keywords":"Wafer; Etch pit density; Materials science; Infrared; Substrate (aquarium); Analytical Chemistry (journal); Fourier transform infrared spectroscopy; Crystal (programming language); Infrared spectroscopy; Etching (microfabrication); Chemistry; Optoelectronics; Optics; Composite material; Physics; Geology","score_opus":0.013421996424930742,"score_gpt":0.2508255908126461,"score_spread":0.23740359438771536,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W1980553139","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.96162426,0.015271653,0.006699375,0.0011212666,0.00023572858,0.000054973043,0.0003143916,0.00017881695,0.014499542],"genre_scores_gemma":[0.9612232,0.008250639,0.020804487,0.00014044066,0.00008362775,0.000032468528,0.00037053518,0.00008346473,0.009011058],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9996531,0.00004276537,0.000031764797,0.00007887502,0.00014191573,0.00005153266],"domain_scores_gemma":[0.9995828,0.00006510354,0.00006532638,0.000055601147,0.00020178476,0.000029417033],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0009062639,0.00035674797,0.00023510982,0.00050308614,0.00034805518,0.0010924418,0.0005685967,0.0006794682,0.0012877285],"category_scores_gemma":[0.0006850639,0.00035509703,0.00030991124,0.0004955012,0.00029629082,0.0008228594,0.0005005975,0.0005691078,0.00047951064],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00014901675,0.00005039775,0.0023428572,0.00030861062,0.000014317133,0.00012970911,0.000106014915,0.0004977404,0.9766386,0.0018095024,0.00033732332,0.01761591],"study_design_scores_gemma":[0.0000087252165,0.00021441342,0.003587306,0.000023356704,0.000014649856,0.0002495008,0.00008704775,0.0010831605,0.9809302,0.00010400502,0.013690604,0.0000070413225],"about_ca_topic_score_codex":0.0011772403,"about_ca_topic_score_gemma":0.0034638133,"teacher_disagreement_score":0.0012877285,"about_ca_system_score_codex":0.0008839386,"about_ca_system_score_gemma":0.00062568946,"threshold_uncertainty_score":0.00641346},"labels":[],"label_agreement":null},{"id":"W1983452926","doi":"10.1007/s11664-013-2785-7","title":"Composite Semiconductor Material of Carbon Nanotubes and Poly[5,5′-bis(3-dodecyl-2-thienyl)-2,2′-bithiophene] for High-Performance Organic Thin-Film Transistors","year":2013,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Organic Electronics and Photovoltaics","field":"Engineering","cited_by":8,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":true,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"McMaster University; Xerox (Canada)","funders":"Natural Sciences and Engineering Research Council of Canada","keywords":"Carbon nanotube; Materials science; Thin-film transistor; Semiconductor; Chemical engineering; Nanotechnology; Composite number; Polymer; Layer (electronics); Nanotube; Thin film; Dielectric; Field-effect transistor; Electron mobility; Transistor; Composite material; Optoelectronics","score_opus":0.004012173392620564,"score_gpt":0.1768614535559932,"score_spread":0.17284928016337264,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W1983452926","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9753155,0.0031658795,0.016856864,0.00014627972,0.00029871755,0.00007834891,0.00033554118,0.00031551855,0.0034874096],"genre_scores_gemma":[0.9865671,0.00076127326,0.009113182,0.00003830813,0.000024051207,0.00005042924,0.00020850018,0.000030027246,0.0032069988],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9999378,0.0000053418134,0.000003419657,0.000019838199,0.000021601318,0.000012027692],"domain_scores_gemma":[0.99993145,0.000011165974,0.000007995166,0.0000045615384,0.000024691002,0.000020125552],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00010800239,0.00024507957,0.00018622132,0.0003805894,0.0002673793,0.00027061484,0.0002881014,0.00042537617,0.0011200006],"category_scores_gemma":[0.00009818841,0.00021685584,0.0001791832,0.00021122617,0.000083772225,0.00031931073,0.000093078714,0.00030137078,0.00030201938],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.000039911734,0.000015291249,0.000029716253,0.000032867305,0.0000043840714,0.000019051566,0.000003843184,0.00008281836,0.9988337,0.00011346398,0.000050585168,0.0007743126],"study_design_scores_gemma":[0.000014857845,0.00012668892,0.00060588337,0.0000037725993,0.000017225559,0.000057987865,0.000006417659,0.0015417879,0.99659073,0.000038086895,0.0009922158,0.000004317563],"about_ca_topic_score_codex":0.0002563017,"about_ca_topic_score_gemma":0.0012616062,"teacher_disagreement_score":0.0011200006,"about_ca_system_score_codex":0.00026324083,"about_ca_system_score_gemma":0.00021396464,"threshold_uncertainty_score":0.003746748},"labels":[],"label_agreement":null},{"id":"W1985667342","doi":"10.1007/s11664-003-0153-8","title":"Steady-state electron transport in the III–V nitride semiconductors: A sensitivity analysis","year":2003,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"GaN-based semiconductor devices and materials","field":"Physics and Astronomy","cited_by":35,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":true,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of Regina","funders":"Natural Sciences and Engineering Research Council of Canada; Office of Naval Research; Multidisciplinary University Research Initiative","keywords":"Saturation velocity; Drift velocity; Velocity saturation; Condensed matter physics; Electron; Electric field; Thermal conduction; Solid-state physics; Saturation (graph theory); Effective mass (spring–mass system); Conduction band; Quasi Fermi level; Steady state (chemistry); Semiconductor; Chemistry; Band gap; Physics; Direct and indirect band gaps; Voltage; Optoelectronics","score_opus":0.0092104134224139,"score_gpt":0.24486734945222077,"score_spread":0.23565693602980686,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W1985667342","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.89680356,0.0008518612,0.094132476,0.0006525787,0.000047560105,0.000078314624,0.00036797207,0.00038942622,0.0066762967],"genre_scores_gemma":[0.9979079,0.00011342997,0.0012206592,0.000032570802,0.0000064657847,0.000010746305,0.0000646183,0.000014273055,0.0006294664],"study_design_codex":"simulation_or_modeling","study_design_gemma":"simulation_or_modeling","domain_scores_codex":[0.9996853,0.00011343169,0.000011325945,0.00006949948,0.00006343286,0.00005703932],"domain_scores_gemma":[0.9965391,0.002970125,0.00009709489,0.00015948355,0.00020124209,0.000033019565],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00125871,0.00053964317,0.0005293634,0.00046337658,0.0003551353,0.0007461374,0.00058165105,0.000763245,0.0010515051],"category_scores_gemma":[0.004004089,0.0003783927,0.0009250913,0.00026010137,0.00056357007,0.0009917151,0.0005160863,0.00057298795,0.00013103492],"study_design_candidate":"simulation_or_modeling","study_design_consensus":"simulation_or_modeling","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00038373077,0.00012635575,0.0033538945,0.00013790443,0.00015715258,0.00025693054,0.0001024504,0.93306553,0.04565185,0.008621091,0.00050686335,0.007636228],"study_design_scores_gemma":[0.0000051285056,0.00005652981,0.0015190305,0.000006737463,0.000029876805,0.00006925477,0.00001717735,0.9879259,0.008161262,0.0020719091,0.000121832905,0.000015442323],"about_ca_topic_score_codex":0.005690864,"about_ca_topic_score_gemma":0.0027704479,"teacher_disagreement_score":0.005690864,"about_ca_system_score_codex":0.0017724035,"about_ca_system_score_gemma":0.0004347362,"threshold_uncertainty_score":0.012859762},"labels":[],"label_agreement":null},{"id":"W1985915218","doi":"10.1007/s11664-007-0336-9","title":"Scanning Ion Probe Studies of Silicon Implantation Profiles in AlGaN/GaN HEMT Heterostructures","year":2007,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"GaN-based semiconductor devices and materials","field":"Physics and Astronomy","cited_by":3,"is_retracted":false,"has_abstract":false,"route_ca_aff":false,"route_ca_fund":true,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"","funders":"Office of Naval Research; Australian Research Council; Ontario Ministry of Natural Resources and Forestry","keywords":"High-electron-mobility transistor; Ohmic contact; Heterojunction; Materials science; Optoelectronics; Ion implantation; Silicon; Transistor; Semiconductor; Ion; Nanotechnology; Chemistry; Layer (electronics); Electrical engineering; Voltage","score_opus":0.01530409765518108,"score_gpt":0.29925274064928065,"score_spread":0.28394864299409955,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W1985915218","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9979609,0.0001691733,0.00056590076,0.000027179938,0.0000040097448,0.000006143179,0.000116482646,0.000021826994,0.0011282571],"genre_scores_gemma":[0.99797434,0.00013702139,0.0005899106,0.000016484744,0.0000031316144,0.0000068824493,0.00010644797,0.000008519002,0.0011573274],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9999491,0.000004195517,0.000002746988,0.000011435004,0.000018531058,0.000014009966],"domain_scores_gemma":[0.99980515,0.00007868917,0.000037747126,0.000013117388,0.000048561917,0.000016713451],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00012434482,0.0001773588,0.00017660347,0.00021554602,0.00022293036,0.00028530406,0.0002674805,0.0002797217,0.0013236079],"category_scores_gemma":[0.0002243584,0.0001668789,0.00014852686,0.00025287992,0.00024836574,0.00029788117,0.00016417122,0.00022358747,0.00020698161],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00031170814,0.00002036005,0.0011005957,0.000029573479,0.0000069749,0.000101417776,0.00010623496,0.00042613866,0.9963154,0.0001625963,0.00006107331,0.0013580049],"study_design_scores_gemma":[0.000030832343,0.00044519652,0.020108381,0.000008003982,0.000016614415,0.00027394405,0.00026990514,0.005043605,0.9729484,0.00010995336,0.0007352836,0.000009965848],"about_ca_topic_score_codex":0.0016853758,"about_ca_topic_score_gemma":0.0018440472,"teacher_disagreement_score":0.0016853758,"about_ca_system_score_codex":0.00031282363,"about_ca_system_score_gemma":0.0001617377,"threshold_uncertainty_score":0.00442791},"labels":[],"label_agreement":null},{"id":"W1986245249","doi":"10.1007/s11664-012-1934-8","title":"Microstructure, Phase Transition, and Piezoelectric Properties of Cerium-Substituted Bismuth Titanate Nanofibers","year":2012,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Advanced Sensor and Energy Harvesting Materials","field":"Engineering","cited_by":9,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Geological Survey of Canada","funders":"","keywords":"Materials science; Bismuth titanate; Nanofiber; Raman spectroscopy; Scanning electron microscope; Crystallinity; Piezoresponse force microscopy; Transmission electron microscopy; Bismuth; Microstructure; Piezoelectric coefficient; Calcium titanate; Titanate; Analytical Chemistry (journal); Ferroelectricity; Piezoelectricity; Nanotechnology; Composite material; Ceramic; Chemistry; Optics; Dielectric","score_opus":0.009391333014466959,"score_gpt":0.2115238070230483,"score_spread":0.20213247400858134,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W1986245249","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9989905,0.000146063,0.00028818718,0.00001344244,0.000005039069,0.0000022362312,0.000046675235,0.000010408675,0.000497479],"genre_scores_gemma":[0.99905664,0.00006385618,0.0002540754,0.000006560885,0.0000032627004,0.0000041540934,0.00006683027,0.000004592115,0.0005400971],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.999941,0.0000040151112,0.0000036109284,0.000015120911,0.000024461873,0.000011896982],"domain_scores_gemma":[0.9998568,0.000028912986,0.000042813834,0.000008374236,0.00004628679,0.000016797634],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.000097812546,0.000085683125,0.00006799553,0.00020384483,0.00016671921,0.00013583944,0.00011007037,0.00016438392,0.0006503627],"category_scores_gemma":[0.00019069658,0.00011791717,0.00008833812,0.0001087759,0.00015547303,0.00024294568,0.000058950172,0.00015543686,0.00006938183],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00005064847,0.000007829053,0.0002649299,0.000012344041,0.0000018547795,0.000030375188,0.00002324471,0.000109959044,0.99897313,0.00006880057,0.000022429302,0.00043443177],"study_design_scores_gemma":[0.000011938198,0.00011029427,0.016640546,0.000005167044,0.000009751567,0.00009348322,0.000052214218,0.0028602781,0.97973424,0.00004885399,0.00042640785,0.000006922167],"about_ca_topic_score_codex":0.0010237586,"about_ca_topic_score_gemma":0.0016423935,"teacher_disagreement_score":0.0010237586,"about_ca_system_score_codex":0.00018645354,"about_ca_system_score_gemma":0.00009036575,"threshold_uncertainty_score":0.0021757483},"labels":[],"label_agreement":null},{"id":"W1987178666","doi":"10.1007/s11664-000-0225-y","title":"Composition and thickness control of thin LPE HgCdTe layers using x-ray diffraction","year":2000,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Advanced Semiconductor Detectors and Materials","field":"Engineering","cited_by":3,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Lockheed Martin (Canada)","funders":"","keywords":"Wafer; Heterojunction; Materials science; Diffraction; Photodiode; Epitaxy; X-ray; Layer (electronics); Thin film; Optics; X-ray crystallography; Optoelectronics; Composition (language); Analytical Chemistry (journal); Chemistry; Composite material; Nanotechnology; Physics","score_opus":0.00674404834780673,"score_gpt":0.22400534836924968,"score_spread":0.21726130002144295,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W1987178666","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.99311006,0.0005332644,0.004494464,0.000073777024,0.000024322864,0.000021851125,0.00021236611,0.00010529029,0.0014246096],"genre_scores_gemma":[0.99042964,0.0004070562,0.0071394076,0.000030519375,0.0000075290754,0.000020959023,0.0001841007,0.000048590857,0.0017321986],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9997911,0.00002302477,0.000020763628,0.00004585048,0.00008371286,0.00003569511],"domain_scores_gemma":[0.99977607,0.000044005603,0.00005082423,0.000027745991,0.000083662366,0.000017795443],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00031412902,0.00020893448,0.00022883655,0.0003569977,0.0004040587,0.0007071162,0.0002952041,0.00029454488,0.00072924304],"category_scores_gemma":[0.0005010326,0.00030361765,0.000097651035,0.00023919625,0.0003130459,0.00033842018,0.00028357364,0.00034015812,0.00017336552],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00007194629,0.000007992813,0.00018323188,0.000018874121,0.0000026096277,0.0000146611865,0.000022972708,0.000116336945,0.9985241,0.000075139505,0.000021654276,0.0009404938],"study_design_scores_gemma":[0.00000597549,0.000013546348,0.0007838676,0.0000017923409,0.0000031395214,0.000011815673,0.000014014676,0.0006906204,0.9981364,0.000014676249,0.00032207448,0.0000021319904],"about_ca_topic_score_codex":0.0016115537,"about_ca_topic_score_gemma":0.0021601717,"teacher_disagreement_score":0.0016115537,"about_ca_system_score_codex":0.00050274533,"about_ca_system_score_gemma":0.00027218004,"threshold_uncertainty_score":0.0036477447},"labels":[],"label_agreement":null},{"id":"W1994529439","doi":"10.1007/s11664-013-2705-x","title":"Characterizing Corrosion Effects of Weak Organic Acids Using a Modified Bono Test","year":2013,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Corrosion Behavior and Inhibition","field":"Materials Science","cited_by":13,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Blackberry (Canada); University of Waterloo","funders":"Science and Technology Facilities Council","keywords":"Adipic acid; Corrosion; Materials science; Characterization (materials science); Succinic acid; Scanning electron microscope; Metallurgy; Metal; Chemical engineering; Composite material; Chemistry; Nanotechnology; Organic chemistry","score_opus":0.010501065663780444,"score_gpt":0.23945255309086605,"score_spread":0.2289514874270856,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W1994529439","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.98073226,0.0016940408,0.013760318,0.00010950085,0.00015640131,0.00007564343,0.000366901,0.000118628304,0.0029863112],"genre_scores_gemma":[0.9744546,0.0020052106,0.016029797,0.00012525146,0.000037552767,0.000108724205,0.00082748564,0.000051509935,0.0063599334],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.99912316,0.00016250437,0.000057867386,0.00011296094,0.0003490103,0.00019457813],"domain_scores_gemma":[0.9992036,0.00014021293,0.00015149577,0.0000628134,0.0003508998,0.00009094172],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0005097176,0.0012023018,0.0005013286,0.0006242025,0.00034025626,0.00044050338,0.0008011635,0.0008113343,0.0013858964],"category_scores_gemma":[0.00076141686,0.00029158735,0.0005071947,0.00053316075,0.00032370578,0.00038390723,0.0005608725,0.00070261955,0.0005412086],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00024706186,0.000042739648,0.0006994622,0.00009055408,0.0000214996,0.0000472733,0.000047862304,0.00008331801,0.9964011,0.00008643245,0.000061123304,0.0021716603],"study_design_scores_gemma":[0.0000068259437,0.0008363832,0.002614579,0.000009680291,0.000031168096,0.000105189225,0.000060466755,0.0011079306,0.99429744,0.000041194107,0.0008736287,0.000015442516],"about_ca_topic_score_codex":0.0011847069,"about_ca_topic_score_gemma":0.0021815463,"teacher_disagreement_score":0.0013858964,"about_ca_system_score_codex":0.00021946905,"about_ca_system_score_gemma":0.00029500324,"threshold_uncertainty_score":0.0046362877},"labels":[],"label_agreement":null},{"id":"W1995131811","doi":"10.1007/s11664-002-0012-z","title":"The effect of flux chemistry, applied voltage, conductor spacing, and temperature on conductive anodic filament formation","year":2002,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Recycling and Waste Management Techniques","field":"Environmental Science","cited_by":46,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of Toronto","funders":"Eurostars","keywords":"Conductor; Composite material; Humidity; Anode; Flux (metallurgy); Protein filament; Electrical conductor; Voltage; Materials science; Analytical Chemistry (journal); Thermal conduction; Chemistry; Electrical engineering; Electrode; Thermodynamics; Metallurgy","score_opus":0.004896501889562894,"score_gpt":0.20618007371666588,"score_spread":0.201283571827103,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W1995131811","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.99814725,0.0005482607,0.0005679035,0.000028908506,0.000015995272,0.000009785624,0.00005586249,0.000030148056,0.00059603335],"genre_scores_gemma":[0.9982912,0.00033146414,0.00077541504,0.000017112852,0.0000111986765,0.0000073790234,0.00007876193,0.000023409399,0.00046402047],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.99982953,0.00003889641,0.000024268154,0.000030943684,0.00003595519,0.00004025377],"domain_scores_gemma":[0.99809533,0.0013314994,0.0001841315,0.00008798092,0.00018551196,0.000115553165],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0006070304,0.00024370039,0.0003121917,0.00024348112,0.00026299775,0.0005804567,0.0003667937,0.00034523642,0.0016675228],"category_scores_gemma":[0.0017001301,0.00037780913,0.00019595551,0.00021189748,0.000322101,0.00065641914,0.00020552575,0.00037563065,0.0002260879],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.0014842988,0.00011620268,0.001092171,0.00014725905,0.000022875969,0.00014992939,0.00010761144,0.00089959987,0.99050236,0.00019545975,0.00011426135,0.005167921],"study_design_scores_gemma":[0.000050707924,0.0005321501,0.0032237344,0.000011179333,0.00003123974,0.000103792394,0.000038538827,0.0018671018,0.9937064,0.000062083396,0.000365657,0.000007430243],"about_ca_topic_score_codex":0.00033171318,"about_ca_topic_score_gemma":0.0005962234,"teacher_disagreement_score":0.0016675228,"about_ca_system_score_codex":0.0002595054,"about_ca_system_score_gemma":0.00019303159,"threshold_uncertainty_score":0.0055784583},"labels":[],"label_agreement":null},{"id":"W2000093093","doi":"10.1007/bf02665872","title":"HgCdTe growth on (552) oriented CdZnTe by metalorganic vapor phase epitaxy","year":2001,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Advanced Semiconductor Detectors and Materials","field":"Engineering","cited_by":7,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Lockheed Martin (Canada)","funders":"Space and Missile Defense Command","keywords":"Metalorganic vapour phase epitaxy; Hillock; Etch pit density; Epitaxy; Photodiode; Materials science; Thin film; Chemistry; Optoelectronics; Analytical Chemistry (journal); Etching (microfabrication); Nanotechnology","score_opus":0.005897934862019006,"score_gpt":0.2316903151775858,"score_spread":0.22579238031556678,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2000093093","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.99577266,0.0002734777,0.0013429172,0.0000617483,0.000028609296,0.000014052723,0.00012600726,0.00010192212,0.0022785615],"genre_scores_gemma":[0.9932783,0.00035302897,0.0033553077,0.0000136333765,0.000007780238,0.000011203072,0.00016630518,0.00003300871,0.0027813707],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9999114,0.000007033278,0.000004960242,0.000016768492,0.00003302884,0.000026730584],"domain_scores_gemma":[0.99995506,0.000008948023,0.000009852555,0.000006281734,0.000012046164,0.000007835658],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00008216357,0.00021126524,0.0002586468,0.00027306168,0.00032387866,0.0007132799,0.00026169184,0.00022790658,0.0006515358],"category_scores_gemma":[0.00017488618,0.000263781,0.00008441728,0.00030460692,0.00018563382,0.00017292636,0.00026112457,0.00020790727,0.00027538964],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00005881731,0.00000789096,0.0004425908,0.000038826518,0.0000030591975,0.00006677026,0.000041335894,0.00020638324,0.99757427,0.00027463274,0.000094957344,0.0011903647],"study_design_scores_gemma":[0.000018989118,0.000032940276,0.00178616,0.000004944687,0.000008153251,0.00006495322,0.000034005396,0.0014039909,0.9944448,0.00003619103,0.0021603077,0.000004552645],"about_ca_topic_score_codex":0.0040213782,"about_ca_topic_score_gemma":0.008700031,"teacher_disagreement_score":0.0040213782,"about_ca_system_score_codex":0.0005561212,"about_ca_system_score_gemma":0.00034707505,"threshold_uncertainty_score":0.007995963},"labels":[],"label_agreement":null},{"id":"W2000896261","doi":"10.1007/s11664-009-0875-3","title":"Thermodynamic Descriptions for the Cd-Te, Pb-Te, Cd-Pb and Cd-Pb-Te Systems","year":2009,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Thermodynamic and Structural Properties of Metals and Alloys","field":"Engineering","cited_by":16,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"American Water (Canada)","funders":"","keywords":"Liquidus; CALPHAD; Phase diagram; Thermodynamics; Ternary operation; Stoichiometry; Chemistry; Phase (matter); Work (physics); Ternary numeral system; Solid solution; Mixing (physics); Physical chemistry; Physics","score_opus":0.008870092321460592,"score_gpt":0.20405533629741904,"score_spread":0.19518524397595843,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2000896261","genre_codex":"methods","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":null,"domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.1268136,0.01646547,0.6078045,0.003450782,0.0012903279,0.00036753446,0.001975958,0.00048178478,0.24135007],"genre_scores_gemma":[0.8453043,0.0054560835,0.06117001,0.0006687133,0.00080159085,0.0009855125,0.0011392435,0.00059584575,0.08387864],"study_design_codex":"theoretical_or_conceptual","study_design_gemma":"simulation_or_modeling","domain_scores_codex":[0.9995764,0.00008089512,0.000033079985,0.000027705604,0.00022444762,0.000057367553],"domain_scores_gemma":[0.99969625,0.00010709004,0.000024768766,0.00005195092,0.00009463217,0.00002532622],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0009997388,0.0005609259,0.0010445685,0.0012527233,0.0015522594,0.0011660602,0.0015613812,0.00081620325,0.010057172],"category_scores_gemma":[0.0014696221,0.00046449256,0.0008239795,0.00085216586,0.0011113093,0.0021533761,0.00094447867,0.00103435,0.0015460897],"study_design_candidate":"simulation_or_modeling","study_design_consensus":null,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.000010575457,0.000023544268,0.00012614862,0.000080426034,0.000009157027,0.000051788775,0.00007651089,0.03024395,0.0018309805,0.9626794,0.0012733703,0.0035941303],"study_design_scores_gemma":[0.000015320196,0.000025574005,0.00043975096,0.00004155812,0.0000125071165,0.00022617364,0.0000934448,0.2577132,0.0026274137,0.72169733,0.017057098,0.000050633633],"about_ca_topic_score_codex":0.0013848994,"about_ca_topic_score_gemma":0.0025362102,"teacher_disagreement_score":0.010057172,"about_ca_system_score_codex":0.00089218066,"about_ca_system_score_gemma":0.0011304251,"threshold_uncertainty_score":0.033644617},"labels":[],"label_agreement":null},{"id":"W2002795605","doi":"10.1007/s11664-014-3023-7","title":"Phosphor-Free InGaN/GaN Dot-in-a-Wire White Light-Emitting Diodes on Copper Substrates","year":2014,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"GaN-based semiconductor devices and materials","field":"Physics and Astronomy","cited_by":20,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"McGill University","funders":"","keywords":"Light-emitting diode; Optoelectronics; Materials science; Phosphor; Copper; Diode; Substrate (aquarium); Layer (electronics); Nanowire; Nanotechnology; Metallurgy","score_opus":0.0070010808163266805,"score_gpt":0.22823145490366253,"score_spread":0.22123037408733584,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2002795605","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9927556,0.0002593404,0.0013611539,0.000043958073,0.000035143155,0.000014437378,0.00020091329,0.00014137726,0.005188129],"genre_scores_gemma":[0.993846,0.00014756464,0.0017483189,0.000009537322,0.0000057711113,0.000011386139,0.00013964146,0.00005540169,0.004036368],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9999064,0.0000095197165,0.0000045138618,0.000021638372,0.000031355605,0.000026574538],"domain_scores_gemma":[0.9999051,0.000014095103,0.000020771204,0.00002214783,0.000021752638,0.000016198104],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00010189611,0.00022493779,0.00021527224,0.0001698959,0.00017849226,0.0003242386,0.00046541778,0.0001404469,0.0022126061],"category_scores_gemma":[0.00017969255,0.00018556304,0.0000919056,0.00017724452,0.00011159711,0.0002925213,0.00016412769,0.00020108085,0.0004427611],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00016042609,0.00003192531,0.00039477443,0.00012158684,0.000011404954,0.00014649972,0.00006810258,0.0005648369,0.9941269,0.0007946266,0.0007991515,0.002779733],"study_design_scores_gemma":[0.00001983269,0.00010255058,0.0022955185,0.0000069953126,0.000008775083,0.00006844155,0.000032476095,0.002948107,0.9927315,0.00007165707,0.00170569,0.000008389196],"about_ca_topic_score_codex":0.0011245442,"about_ca_topic_score_gemma":0.0027722705,"teacher_disagreement_score":0.0022126061,"about_ca_system_score_codex":0.00043810156,"about_ca_system_score_gemma":0.00017544052,"threshold_uncertainty_score":0.007401943},"labels":[],"label_agreement":null},{"id":"W2003436788","doi":"10.1007/s11664-009-1049-z","title":"Finite Element Thermomechanical Modeling of Large Area Thermoelectric Generators based on Bismuth Telluride Alloys","year":2010,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Advanced Thermoelectric Materials and Devices","field":"Materials Science","cited_by":57,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":true,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Polytechnique Montréal","funders":"Polytechnique Montréal","keywords":"Materials science; Bismuth telluride; Finite element method; Thermoelectric generator; Stress (linguistics); Deformation (meteorology); Displacement (psychology); Temperature gradient; Soldering; Ceramic; Thermoelectric effect; Composite material; Generator (circuit theory); Die (integrated circuit); Thermoelectric materials; Structural engineering; Thermodynamics; Physics; Engineering; Power (physics)","score_opus":0.010684538323268211,"score_gpt":0.25010883885572627,"score_spread":0.23942430053245806,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2003436788","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.63957536,0.0008337256,0.3080413,0.0007172251,0.00015718874,0.00017034306,0.00041187555,0.00069375295,0.049399126],"genre_scores_gemma":[0.97817695,0.00021172328,0.013083642,0.000043760538,0.000012954874,0.00009346315,0.00009055883,0.00007505708,0.008211888],"study_design_codex":"simulation_or_modeling","study_design_gemma":"simulation_or_modeling","domain_scores_codex":[0.99989283,0.00002996044,0.0000054231564,0.000016356955,0.000041761305,0.000013754077],"domain_scores_gemma":[0.99977416,0.000108080305,0.0000319447,0.000023905359,0.000047232057,0.000014707186],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00026157062,0.00044854812,0.0006600667,0.0004490917,0.0005258281,0.0007403663,0.0010073094,0.0014446754,0.0030746884],"category_scores_gemma":[0.00069767825,0.00063449604,0.00051961956,0.00037200112,0.00067019754,0.0006494026,0.00035174916,0.0004259396,0.00045226672],"study_design_candidate":"simulation_or_modeling","study_design_consensus":"simulation_or_modeling","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00003237709,0.000029856375,0.0002706437,0.000022217862,0.000011870327,0.000055735076,0.000030275138,0.99025935,0.0050961217,0.00199842,0.000108868066,0.0020842564],"study_design_scores_gemma":[0.0000038122764,0.0000122520305,0.00011902133,0.0000020278924,0.0000029397133,0.000007899597,0.000008107727,0.9989548,0.0005200604,0.0001825576,0.00018395712,0.0000025678883],"about_ca_topic_score_codex":0.004858886,"about_ca_topic_score_gemma":0.005102662,"teacher_disagreement_score":0.004858886,"about_ca_system_score_codex":0.00062810356,"about_ca_system_score_gemma":0.0007188541,"threshold_uncertainty_score":0.010285795},"labels":[],"label_agreement":null},{"id":"W2005586075","doi":"10.1007/s11664-004-0106-x","title":"Interface reaction between Ni and amorphous SiC","year":2004,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Silicon Carbide Semiconductor Technologies","field":"Engineering","cited_by":14,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of Alberta","funders":"","keywords":"Interface (matter); Amorphous solid; Materials science; Solid-state physics; Engineering physics; Chemistry; Crystallography; Condensed matter physics; Physics; Composite material","score_opus":0.008846037972213972,"score_gpt":0.22640991993521234,"score_spread":0.21756388196299836,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2005586075","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9888474,0.0006179959,0.00095259387,0.0000663547,0.0000933652,0.000021101612,0.00013239066,0.00005430168,0.009214574],"genre_scores_gemma":[0.9958117,0.00014617338,0.0003914844,0.000022122718,0.00000833851,0.0000050370427,0.00018843877,0.0000111304325,0.0034155843],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9998573,0.000017338529,0.0000057077023,0.000025295853,0.000044026303,0.000050340932],"domain_scores_gemma":[0.99991,0.000027534494,0.000009591972,0.000016321988,0.000024835756,0.000011809742],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.000118494616,0.00021740592,0.00027829324,0.00027124796,0.00048382944,0.00039652115,0.0004028391,0.00030584948,0.0037104012],"category_scores_gemma":[0.0003642305,0.00012137673,0.00017265041,0.00019155456,0.00023437256,0.00038414483,0.00027382007,0.00040011437,0.00046163754],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.001100211,0.00009610557,0.0010580666,0.00035501106,0.000033464567,0.0003331325,0.00032373393,0.0005747127,0.98317045,0.0019962622,0.0011041058,0.009854772],"study_design_scores_gemma":[0.000034868688,0.00032224148,0.003388516,0.000011065695,0.000025128245,0.00017217692,0.0002510143,0.0034425799,0.98711616,0.0002926779,0.004933333,0.000010152003],"about_ca_topic_score_codex":0.0024786063,"about_ca_topic_score_gemma":0.0033591334,"teacher_disagreement_score":0.0037104012,"about_ca_system_score_codex":0.00029962804,"about_ca_system_score_gemma":0.00021454318,"threshold_uncertainty_score":0.012412488},"labels":[],"label_agreement":null},{"id":"W2006457756","doi":"10.1007/s11664-012-2008-7","title":"Polymer-Protected Cu-Ag Mixed NPs for Low-Temperature Bonding Application","year":2012,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Electronic Packaging and Soldering Technologies","field":"Engineering","cited_by":44,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of Waterloo","funders":"","keywords":"Polymer; Materials science; Sintering; Copper; Interconnection; Nanoparticle; Direct bonding; Chemical engineering; Shear strength (soil); Composite material; Nanotechnology; Metallurgy; Silicon","score_opus":0.006530330088236304,"score_gpt":0.22335219766801948,"score_spread":0.21682186757978317,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2006457756","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.97135913,0.0021177162,0.01719308,0.00015243428,0.00017672402,0.00005940471,0.00011878275,0.00039469555,0.008428133],"genre_scores_gemma":[0.98700327,0.00049098773,0.0067314445,0.000038879476,0.000014011582,0.000032940112,0.00007274526,0.000040519815,0.0055751745],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9999317,0.0000062093045,0.0000035689425,0.000022129498,0.000020325479,0.000016037873],"domain_scores_gemma":[0.9999542,0.0000069509197,0.0000075965445,0.0000062853965,0.000017558503,0.0000073574815],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00007672872,0.00028333472,0.00014883805,0.00015024816,0.00025496414,0.0002090706,0.00022243735,0.0003252736,0.0017970497],"category_scores_gemma":[0.00011556232,0.00018127233,0.00013483479,0.00013058401,0.00011435703,0.0002972089,0.00016457339,0.00036419352,0.000509033],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.000037978334,0.000016544212,0.000042635613,0.000052159485,0.0000032371938,0.000022203854,0.000017970156,0.00011654955,0.9962037,0.00011629861,0.00017314748,0.0031975748],"study_design_scores_gemma":[0.0000022337626,0.000052011215,0.00019681538,0.000001674042,0.0000061023816,0.000021226442,0.000007858459,0.00046843747,0.9981713,0.000015090292,0.0010553366,0.0000018631403],"about_ca_topic_score_codex":0.00037760372,"about_ca_topic_score_gemma":0.0011459095,"teacher_disagreement_score":0.0017970497,"about_ca_system_score_codex":0.0002019262,"about_ca_system_score_gemma":0.00017065101,"threshold_uncertainty_score":0.0060117245},"labels":[],"label_agreement":null},{"id":"W2008754381","doi":"10.1007/s11664-006-0085-1","title":"Thermoelectric Properties of Mo3Sb5.4Te1.6 and Ni0.06Mo3Sb5.4Te1.6","year":2007,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Advanced Thermoelectric Materials and Devices","field":"Materials Science","cited_by":19,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":true,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of Waterloo","funders":"Natural Sciences and Engineering Research Council of Canada; South Carolina EPSCoR; Clemson University; U.S. Department of Energy","keywords":"Thermoelectric effect; Seebeck coefficient; Solid-state physics; Materials science; Electrical resistivity and conductivity; Thermal conductivity; Thermoelectric materials; Condensed matter physics; Thermal; Metal; Crystal structure; Chemistry; Metallurgy; Thermodynamics; Composite material; Crystallography; Physics","score_opus":0.00813570268328147,"score_gpt":0.2275084762058437,"score_spread":0.2193727735225622,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2008754381","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9976452,0.00035200344,0.00017415507,0.000038459006,0.000010202088,0.0000018067705,0.000098007826,0.000013228647,0.00166688],"genre_scores_gemma":[0.9970469,0.000120206125,0.00014630513,0.00000990879,0.0000049776936,0.0000030370832,0.00020672966,0.000008946734,0.0024529593],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.99992836,0.000007101945,0.000003306285,0.000010977994,0.000031182353,0.000019014711],"domain_scores_gemma":[0.9998882,0.00002180912,0.000016084166,0.000010894347,0.000047461188,0.000015558206],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00014217784,0.00011460724,0.00017804469,0.00035627096,0.00018591812,0.00024411036,0.00025669395,0.000250829,0.0025245526],"category_scores_gemma":[0.00035336096,0.000094567884,0.00013762865,0.00026505638,0.00019638588,0.00020084057,0.00023742442,0.00020782721,0.00045568147],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.001064899,0.00005675598,0.0022670305,0.00013494445,0.000023564835,0.00007568428,0.00014966134,0.0010676156,0.9869304,0.0016321384,0.00071879075,0.0058785537],"study_design_scores_gemma":[0.000046744124,0.00036047935,0.014620767,0.000020758469,0.00003708027,0.0001891376,0.00014501433,0.013570581,0.96574414,0.00036094253,0.0048830495,0.000021299662],"about_ca_topic_score_codex":0.0012288884,"about_ca_topic_score_gemma":0.0014864482,"teacher_disagreement_score":0.0025245526,"about_ca_system_score_codex":0.00019916204,"about_ca_system_score_gemma":0.00008808434,"threshold_uncertainty_score":0.008445501},"labels":[],"label_agreement":null},{"id":"W2009719407","doi":"10.1007/s11664-004-0159-x","title":"The solid solubility of Ag and Cu in the Sn phase of eutectic and near-eutectic Sn-Ag-Cu solder alloys","year":2004,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Electronic Packaging and Soldering Technologies","field":"Engineering","cited_by":27,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of Toronto","funders":"","keywords":"Eutectic system; Solubility; Materials science; Solid solution; Soldering; Microprobe; Phase (matter); Supersaturation; Metallurgy; Solid solubility; Analytical Chemistry (journal); Precipitation; Microstructure; Thermodynamics; Chemistry; Mineralogy; Physical chemistry; Chromatography","score_opus":0.012324915718326642,"score_gpt":0.26679822938288333,"score_spread":0.25447331366455667,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2009719407","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9972429,0.0006846596,0.0006405729,0.000017634387,0.0000065125887,0.0000044805083,0.00015802684,0.000017530145,0.0012275949],"genre_scores_gemma":[0.99867755,0.00017443723,0.0001626157,0.000004329501,0.0000028819497,0.0000032951589,0.00019986628,0.000009430283,0.0007656435],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9998197,0.00003793476,0.000021820984,0.000032188604,0.000060922328,0.000027532584],"domain_scores_gemma":[0.99973303,0.00011925306,0.000038831506,0.000012833169,0.000076989025,0.000019045512],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00021197366,0.00020699167,0.00024293386,0.00069913425,0.0002905221,0.00040137026,0.0002239613,0.00028356686,0.0011351731],"category_scores_gemma":[0.0005475766,0.00024230192,0.00016345037,0.00032944907,0.000426058,0.0004462224,0.00031279292,0.00023186672,0.00032269358],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.0018640569,0.000045900135,0.0038310515,0.00014479329,0.00002423089,0.00022156232,0.00028265998,0.0034549935,0.98261654,0.0020611514,0.00014053694,0.0053125694],"study_design_scores_gemma":[0.000016009499,0.0002297759,0.0042732935,0.000007037146,0.000015455575,0.00010596927,0.00013056713,0.007425758,0.9862459,0.00052910764,0.0010111415,0.000010106949],"about_ca_topic_score_codex":0.0015118417,"about_ca_topic_score_gemma":0.0015885411,"teacher_disagreement_score":0.0015118417,"about_ca_system_score_codex":0.00034638122,"about_ca_system_score_gemma":0.00028814867,"threshold_uncertainty_score":0.0037975311},"labels":[],"label_agreement":null},{"id":"W2012026784","doi":"10.1007/s11664-008-0651-9","title":"Thermoelectric Properties of Heavily Doped n-Type SrTiO3 Bulk Materials","year":2009,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Advanced Thermoelectric Materials and Devices","field":"Materials Science","cited_by":37,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Defence Research and Development Canada; University of Waterloo","funders":"","keywords":"Seebeck coefficient; Thermoelectric effect; Electron microprobe; Crystallite; Materials science; Electrical resistivity and conductivity; Thermoelectric materials; Strontium titanate; Doping; Analytical Chemistry (journal); Thermal conductivity; Strontium; Mineralogy; Chemistry; Metallurgy; Nanotechnology; Composite material; Thin film; Thermodynamics; Optoelectronics; Physics","score_opus":0.012842341172603581,"score_gpt":0.24444832550849185,"score_spread":0.23160598433588828,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2012026784","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.99790704,0.0002788745,0.0001492426,0.000031546828,0.000009841757,0.0000028667762,0.00009689411,0.000019400566,0.0015042437],"genre_scores_gemma":[0.9986254,0.00012970707,0.00018580283,0.000010141466,0.00000715398,0.0000044116064,0.00012987664,0.000011532881,0.0008959262],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9998894,0.000010210469,0.0000067040933,0.000021576165,0.00003927987,0.00003277458],"domain_scores_gemma":[0.9998292,0.000060350303,0.000028546257,0.000019823356,0.000047170375,0.000014804067],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00015916728,0.00022571743,0.00035648738,0.00024874255,0.00019636942,0.00028762277,0.00026687147,0.00027195565,0.0019928575],"category_scores_gemma":[0.0003705063,0.00014339831,0.00015321898,0.0003222822,0.00027176307,0.00031635215,0.00018799162,0.00025975442,0.0003761112],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00055910094,0.000024170096,0.0007578243,0.0000719363,0.000012748935,0.00008271073,0.00005171292,0.00026901648,0.99597377,0.00023219196,0.00017267157,0.00179219],"study_design_scores_gemma":[0.00009607489,0.0005509642,0.013194792,0.000036890797,0.00005808599,0.0003270771,0.00020392405,0.007188156,0.9764232,0.0002581916,0.0016391127,0.000023596873],"about_ca_topic_score_codex":0.001125801,"about_ca_topic_score_gemma":0.0021987737,"teacher_disagreement_score":0.0019928575,"about_ca_system_score_codex":0.00025583027,"about_ca_system_score_gemma":0.0001956273,"threshold_uncertainty_score":0.0066667795},"labels":[],"label_agreement":null},{"id":"W2013509200","doi":"10.1007/s11664-002-0032-8","title":"Process optimization of polymetal (W/WN/Polysilicon) gate and its impact on dynamic random-access memory chip performance in 0.14-µm technology","year":2002,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Advancements in Semiconductor Devices and Circuit Design","field":"Engineering","cited_by":4,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Simon Fraser University","funders":"","keywords":"Dram; Dynamic random-access memory; Materials science; Optoelectronics; SIGNAL (programming language); Process (computing); Tungsten; Interface (matter); Diffusion; Computer science; Electronic engineering; Computer hardware; Semiconductor memory; Physics; Engineering; Composite material; Metallurgy","score_opus":0.008045562530576261,"score_gpt":0.2593503948685521,"score_spread":0.25130483233797585,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2013509200","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.99652416,0.0005792922,0.0014462651,0.00007926266,0.000026980779,0.000008588194,0.00009497741,0.000074590724,0.0011659076],"genre_scores_gemma":[0.9978855,0.0002545792,0.0009856494,0.000017090604,0.000008523582,0.0000064155442,0.00007619203,0.000024827963,0.0007412038],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.99990547,0.000007858843,0.000005474623,0.000026929389,0.000024585588,0.000029721821],"domain_scores_gemma":[0.9998191,0.00004629709,0.00007325156,0.000010067216,0.000033133805,0.000018179773],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00016140769,0.0002980684,0.00021843775,0.00019054428,0.0002035102,0.0004173506,0.0003582532,0.00023044586,0.0010171875],"category_scores_gemma":[0.00029878854,0.00018594241,0.00013163492,0.00026595528,0.00013492495,0.0003884177,0.00017065184,0.0001755334,0.00021454747],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00046493538,0.00009554007,0.0012506128,0.00013471895,0.000028950417,0.00015603368,0.00006300671,0.00579492,0.98467535,0.00070292276,0.00034916424,0.0062837186],"study_design_scores_gemma":[0.000035780144,0.0007354405,0.002504832,0.000007911452,0.000046189383,0.00008920268,0.00003876848,0.017784487,0.9775348,0.00014041917,0.0010682326,0.00001397526],"about_ca_topic_score_codex":0.0010121106,"about_ca_topic_score_gemma":0.003143459,"teacher_disagreement_score":0.0010171875,"about_ca_system_score_codex":0.0004890649,"about_ca_system_score_gemma":0.00041065295,"threshold_uncertainty_score":0.003548503},"labels":[],"label_agreement":null},{"id":"W2013716430","doi":"10.1007/s11664-012-1984-y","title":"Modeling and Design of a Thin-Film CdTe/Ge Tandem Solar Cell","year":2012,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Chalcogenide Semiconductor Thin Films","field":"Engineering","cited_by":2,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of British Columbia","funders":"Australian Research Council; Australian National Fabrication Facility","keywords":"Cadmium telluride photovoltaics; Tandem; Thin film solar cell; Thin film; Optoelectronics; Solar cell; Materials science; Solid-state physics; Engineering physics; Nanotechnology; Computer science; Physics","score_opus":0.018819680309692135,"score_gpt":0.21934133704770503,"score_spread":0.2005216567380129,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2013716430","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.6543133,0.002018711,0.22687475,0.001723727,0.0002602704,0.00040802525,0.0018366977,0.0014773947,0.111087136],"genre_scores_gemma":[0.9707519,0.0005177754,0.012154752,0.00015773905,0.000031794632,0.0002028096,0.00023064774,0.000093778166,0.015858691],"study_design_codex":"simulation_or_modeling","study_design_gemma":"simulation_or_modeling","domain_scores_codex":[0.999882,0.000017515424,0.0000042332667,0.000023682867,0.00004917075,0.000023290944],"domain_scores_gemma":[0.9999019,0.000028129492,0.000011034656,0.0000085810225,0.000037450212,0.000012863816],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00014596191,0.0004737132,0.0010224384,0.00027078702,0.0009464546,0.0012171471,0.0016198956,0.001744766,0.004077288],"category_scores_gemma":[0.00029832654,0.00062954106,0.0008449003,0.00037296413,0.0004279842,0.00069642876,0.00042868487,0.00056148303,0.0007301846],"study_design_candidate":"simulation_or_modeling","study_design_consensus":"simulation_or_modeling","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.000042303975,0.000027067106,0.00040052828,0.000043838536,0.00003815971,0.00016095527,0.000031172207,0.9858124,0.0095216185,0.0013626334,0.0003643975,0.0021949066],"study_design_scores_gemma":[0.0000122740585,0.000026803436,0.00015105568,0.000004685705,0.000017310947,0.000018059067,0.000015686428,0.9971079,0.0017511431,0.0002466063,0.00064231304,0.000006094392],"about_ca_topic_score_codex":0.028759817,"about_ca_topic_score_gemma":0.018444313,"teacher_disagreement_score":0.028759817,"about_ca_system_score_codex":0.001557129,"about_ca_system_score_gemma":0.0020649473,"threshold_uncertainty_score":0.057184815},"labels":[],"label_agreement":null},{"id":"W2014176204","doi":"10.1007/s11664-012-2435-5","title":"Numerical Simulation of Performance and Thermomechanical Behavior of Thermoelectric Modules with Segmented Bismuth-Telluride-Based Legs","year":2013,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Advanced Thermoelectric Materials and Devices","field":"Materials Science","cited_by":40,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":true,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Polytechnique Montréal","funders":"Natural Sciences and Engineering Research Council of Canada","keywords":"Bismuth telluride; Materials science; Extrusion; Thermoelectric generator; Thermoelectric effect; Figure of merit; Multiphysics; Ternary operation; Composite material; Finite element method; Thermoelectric materials; Bismuth; Telluride; Metallurgy; Optoelectronics; Thermal conductivity; Computer science; Structural engineering; Thermodynamics","score_opus":0.006663577734419614,"score_gpt":0.22631893985942736,"score_spread":0.21965536212500775,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2014176204","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9752881,0.00013999842,0.009211251,0.00019847773,0.000041982385,0.000022301145,0.00023486793,0.00012647743,0.0147364605],"genre_scores_gemma":[0.9962341,0.000031819025,0.0021648246,0.000019239194,0.0000030923445,0.000017810631,0.000054562777,0.000013703475,0.0014608512],"study_design_codex":"simulation_or_modeling","study_design_gemma":"simulation_or_modeling","domain_scores_codex":[0.9999236,0.000012300539,0.0000026585576,0.000010731925,0.000025334664,0.00002531346],"domain_scores_gemma":[0.9996834,0.0001441984,0.000051403513,0.000025613532,0.00006184584,0.000033569664],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00017324538,0.0003029526,0.000439316,0.00029873013,0.00046294968,0.00044532557,0.00067289034,0.00094699586,0.0028864339],"category_scores_gemma":[0.0006518162,0.00028329313,0.00035716518,0.00043475733,0.00059084245,0.00033056404,0.0002357745,0.00031005222,0.00018504639],"study_design_candidate":"simulation_or_modeling","study_design_consensus":"simulation_or_modeling","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00008472032,0.00006751202,0.000853734,0.00004220381,0.000016439908,0.000072566036,0.000037472822,0.9870083,0.008469843,0.0015323987,0.00023301011,0.0015818212],"study_design_scores_gemma":[0.000009792158,0.00003543285,0.00034690058,0.0000033009148,0.000003917856,0.000006346887,0.0000105035,0.99797684,0.001379082,0.00012212036,0.00010214832,0.0000036214617],"about_ca_topic_score_codex":0.0059801857,"about_ca_topic_score_gemma":0.004899244,"teacher_disagreement_score":0.0059801857,"about_ca_system_score_codex":0.00080026814,"about_ca_system_score_gemma":0.00062731537,"threshold_uncertainty_score":0.011890769},"labels":[],"label_agreement":null},{"id":"W2014461726","doi":"10.1007/s11664-011-1863-y","title":"Thermoelectric Power and ZT in Conducting Organic Semiconductor","year":2011,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Advanced Thermoelectric Materials and Devices","field":"Materials Science","cited_by":9,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":true,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of Victoria","funders":"Natural Sciences and Engineering Research Council of Canada","keywords":"Materials science; Thermoelectric effect; Condensed matter physics; Seebeck coefficient; Scattering; Electron mobility; Charge carrier; PEDOT:PSS; Ionized impurity scattering; Semiconductor; Thermoelectric materials; Doping; Carrier scattering; Thermal conductivity; Optoelectronics; Nanotechnology; Thermodynamics; Physics; Optics; Composite material","score_opus":0.025599817739994975,"score_gpt":0.2431266183241931,"score_spread":0.21752680058419813,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2014461726","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9954308,0.00042936648,0.001256508,0.00006897612,0.000016240043,0.0000051459347,0.00016445875,0.000033421766,0.002594955],"genre_scores_gemma":[0.9988966,0.00013167952,0.000107406486,0.000004082668,0.0000060404996,0.0000021535664,0.0000759028,0.000010122602,0.00076604704],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9999471,0.0000057319776,0.000002176298,0.000011259083,0.000017988123,0.000015812286],"domain_scores_gemma":[0.99974436,0.00017110237,0.00003719858,0.0000115129715,0.000021399357,0.000014338323],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00016025813,0.00019183914,0.00014193064,0.0003797569,0.00016759089,0.0004235485,0.00028635975,0.00028335338,0.0025627082],"category_scores_gemma":[0.00054897397,0.00016529336,0.000080630394,0.00037110673,0.00051116996,0.0004629933,0.00017863204,0.00037739353,0.0003098929],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.0008359303,0.00008425296,0.004011266,0.00010019074,0.000015555146,0.0004302627,0.0002271773,0.0030503548,0.9707747,0.013760649,0.00037894235,0.0063308002],"study_design_scores_gemma":[0.000055542787,0.0002434392,0.014337377,0.00002380469,0.000034723533,0.00030314966,0.00014795626,0.026218753,0.9528701,0.0042045694,0.0015347201,0.000025865289],"about_ca_topic_score_codex":0.0006263921,"about_ca_topic_score_gemma":0.00059995253,"teacher_disagreement_score":0.0025627082,"about_ca_system_score_codex":0.00028116314,"about_ca_system_score_gemma":0.0001149097,"threshold_uncertainty_score":0.008573115},"labels":[],"label_agreement":null},{"id":"W2016489274","doi":"10.1007/s11664-005-0180-8","title":"Texture investigation of copper interconnects with a different line width","year":2005,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Copper Interconnects and Reliability","field":"Materials Science","cited_by":15,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"McGill University","funders":"","keywords":"Materials science; Electron backscatter diffraction; Copper interconnect; Microstructure; Annealing (glass); Line width; Texture (cosmology); Diffraction; Grain boundary; Interconnection; Composite material; Copper; Optics; Metallurgy","score_opus":0.008532280155451485,"score_gpt":0.23428638282725167,"score_spread":0.22575410267180018,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2016489274","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.99841106,0.000097657634,0.000721723,0.000011573273,0.0000071389377,0.0000035476457,0.00003241186,0.00001593349,0.0006990628],"genre_scores_gemma":[0.99910754,0.00003806561,0.0004492141,0.0000068453996,0.0000045793995,0.0000029851537,0.00003683111,0.000008644042,0.00034522646],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9998871,0.000012803556,0.0000044818785,0.000021071603,0.00004167465,0.00003271992],"domain_scores_gemma":[0.99965847,0.000057585392,0.00007719288,0.00003802904,0.00012997727,0.00003874516],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.000112626054,0.00009087152,0.00017938801,0.00027788096,0.00023059708,0.00032574034,0.00017078026,0.00022611658,0.0009285414],"category_scores_gemma":[0.00044682898,0.00013364258,0.00010346989,0.00037620423,0.00024897367,0.0001803749,0.00010720727,0.00019780512,0.00008966847],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00081977266,0.000041952666,0.0026239317,0.000043236407,0.000009458134,0.00013960569,0.000095307376,0.00045955376,0.99231684,0.00015286855,0.00012188208,0.0031755373],"study_design_scores_gemma":[0.00010069203,0.00097305956,0.03733992,0.0000072544663,0.00005511246,0.00043899048,0.00030077316,0.008143242,0.9507292,0.000071428716,0.00182462,0.000015803966],"about_ca_topic_score_codex":0.00095856894,"about_ca_topic_score_gemma":0.0009996102,"teacher_disagreement_score":0.00095856894,"about_ca_system_score_codex":0.00023827123,"about_ca_system_score_gemma":0.00011470192,"threshold_uncertainty_score":0.003106296},"labels":[],"label_agreement":null},{"id":"W2016560641","doi":"10.1007/bf02692448","title":"Lead contamination of a transient liquid-phase-processed Sn-Bi lead-free solder paste","year":2006,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Electronic Packaging and Soldering Technologies","field":"Engineering","cited_by":5,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of Waterloo","funders":"","keywords":"Ternary operation; Eutectic system; Materials science; Soldering; Metallurgy; Differential scanning calorimetry; Phase (matter); Alloy; Ternary numeral system; Solder paste; Chemistry; Thermodynamics","score_opus":0.007506330567121766,"score_gpt":0.22947374295218967,"score_spread":0.2219674123850679,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2016560641","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9973047,0.00013264139,0.0017644379,0.000025516132,0.000018744517,0.000005772877,0.00007281907,0.000080175334,0.00059515407],"genre_scores_gemma":[0.9984627,0.000045059158,0.00046637026,0.00001112977,0.000002826667,0.0000024648868,0.00007179567,0.000021735825,0.0009160358],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.99978656,0.000034271332,0.000012681483,0.000044770557,0.00008669949,0.00003508626],"domain_scores_gemma":[0.9997743,0.000060341692,0.00002571195,0.00003448339,0.000081360464,0.000023807623],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00018347203,0.00021465818,0.00040323316,0.00023607908,0.0003324147,0.00041928125,0.00032033309,0.00044614245,0.0009724795],"category_scores_gemma":[0.00042454756,0.00014609433,0.00016405854,0.00026762363,0.00023762215,0.00025336645,0.0001953779,0.00023829144,0.000267468],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.0007089987,0.000035704623,0.0009001623,0.000040358864,0.000009572541,0.0006612576,0.00008631579,0.00033732306,0.995154,0.00009082131,0.00007295498,0.0019026129],"study_design_scores_gemma":[0.000020971725,0.00050854025,0.0048214067,0.000004805402,0.000029393455,0.00034499113,0.00007432981,0.0037221753,0.98988885,0.0000554886,0.0005214069,0.000007700512],"about_ca_topic_score_codex":0.001012246,"about_ca_topic_score_gemma":0.00071611465,"teacher_disagreement_score":0.001012246,"about_ca_system_score_codex":0.00022809353,"about_ca_system_score_gemma":0.00020009321,"threshold_uncertainty_score":0.0032532811},"labels":[],"label_agreement":null},{"id":"W2017258162","doi":"10.1007/s11664-000-0127-z","title":"Effect of UV-ozone oxidation on the device characteristics of InP-based heterostructure bipolar transistors","year":2000,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Semiconductor materials and devices","field":"Engineering","cited_by":4,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of Toronto; Institute for Microstructural Sciences","funders":"","keywords":"Heterojunction bipolar transistor; Bipolar junction transistor; Heterojunction; Passivation; Optoelectronics; Ozone; Materials science; Transistor; Breakdown voltage; Degradation (telecommunications); Voltage; Chemistry; Electrical engineering; Nanotechnology","score_opus":0.004369592719567921,"score_gpt":0.20320514472817341,"score_spread":0.1988355520086055,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2017258162","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9990017,0.00031343033,0.00017583725,0.000028198694,0.000019258268,0.000003775042,0.000099558514,0.000015101145,0.00034326615],"genre_scores_gemma":[0.9992248,0.00020140549,0.00011439899,0.000012594135,0.0000065967256,0.0000025139266,0.000085054824,0.000008257112,0.00034445364],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.99982435,0.00001848272,0.000009461915,0.00003402843,0.00004838187,0.000065355496],"domain_scores_gemma":[0.9995272,0.00023039899,0.00008810378,0.000030129335,0.000076404765,0.000047882517],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00018120976,0.00032156127,0.00032378573,0.0002090989,0.00031838543,0.00054512,0.0003866109,0.00044201958,0.0015365734],"category_scores_gemma":[0.0005475521,0.00021391244,0.00023975907,0.00029116456,0.0002709414,0.00033347774,0.00014115713,0.0003818632,0.00016086578],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.0008108126,0.000046304704,0.001066194,0.00007843219,0.000034251676,0.00018352785,0.000106020016,0.00026419893,0.9953166,0.00007520986,0.00009630474,0.0019220525],"study_design_scores_gemma":[0.000024590709,0.0005410175,0.0118049765,0.000009196696,0.000069661204,0.00015394512,0.00009347107,0.0018308522,0.98488164,0.00004055943,0.0005390839,0.000011086733],"about_ca_topic_score_codex":0.0018051569,"about_ca_topic_score_gemma":0.0030717945,"teacher_disagreement_score":0.0018051569,"about_ca_system_score_codex":0.00035601156,"about_ca_system_score_gemma":0.00020717905,"threshold_uncertainty_score":0.005140364},"labels":[],"label_agreement":null},{"id":"W2018095575","doi":"10.1007/s11664-014-3310-3","title":"Elemental Compositions of Over 80 Cell Phones","year":2014,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"History and advancements in chemistry","field":"Chemistry","cited_by":29,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"NutriAg (Canada); Blackberry (Canada)","funders":"","keywords":"Cadmium; Metalloid; Elemental analysis; Materials science; Chemistry; Analytical Chemistry (journal); Metallurgy; Nuclear chemistry; Environmental chemistry; Inorganic chemistry; Metal","score_opus":0.003726646856547026,"score_gpt":0.2282460604546798,"score_spread":0.22451941359813277,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2018095575","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.98833513,0.00092348654,0.00088685023,0.00004153649,0.000018599543,0.000013436746,0.0038943954,0.00010286156,0.005783682],"genre_scores_gemma":[0.9858819,0.00082426745,0.0019246518,0.00008975887,0.000012679904,0.000018652014,0.0033404632,0.00012130185,0.007786333],"study_design_codex":"bench_or_experimental","study_design_gemma":"observational","domain_scores_codex":[0.999894,0.000004488925,0.0000066093453,0.000038727096,0.00003862301,0.000017550614],"domain_scores_gemma":[0.99990714,0.000028516293,0.00001143448,0.0000074136856,0.000038759677,0.000006705108],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00010055,0.00027545632,0.0002145712,0.0012100069,0.0004839464,0.0004027101,0.00021710762,0.00036355195,0.0044096005],"category_scores_gemma":[0.00029090678,0.00015661516,0.00017215936,0.0008450904,0.00013259967,0.00045200723,0.00030287608,0.00014427872,0.0013082287],"study_design_candidate":"observational","study_design_consensus":null,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.0017585766,0.00006867407,0.08231268,0.00043032735,0.00014433899,0.0012492333,0.0009039337,0.0015225338,0.78390646,0.0005815198,0.0021114675,0.12501028],"study_design_scores_gemma":[0.000042043743,0.00049052335,0.30069664,0.00007721075,0.00033000574,0.003010558,0.0013319305,0.0037428644,0.64618105,0.00083653093,0.043198507,0.00006216531],"about_ca_topic_score_codex":0.0014616882,"about_ca_topic_score_gemma":0.0024092726,"teacher_disagreement_score":0.0044096005,"about_ca_system_score_codex":0.00023857424,"about_ca_system_score_gemma":0.00014840724,"threshold_uncertainty_score":0.014751613},"labels":[],"label_agreement":null},{"id":"W2020252669","doi":"10.1007/s11664-002-0204-6","title":"Electronic structure mechanism for the wettability of Sn-based solder alloys","year":2002,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Electronic Packaging and Soldering Technologies","field":"Engineering","cited_by":49,"is_retracted":false,"has_abstract":false,"route_ca_aff":false,"route_ca_fund":true,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"","funders":"Ryerson University","keywords":"Wetting; Soldering; Solid-state physics; Molecular orbital; Electronic structure; Materials science; Atomic orbital; Chemical physics; Chemistry; Computational chemistry; Metallurgy; Condensed matter physics; Physics; Composite material; Molecule; Quantum mechanics; Electron","score_opus":0.010299574756804411,"score_gpt":0.20874940429755023,"score_spread":0.19844982954074583,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2020252669","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.98782116,0.00070414133,0.0044853957,0.0001052971,0.00007275564,0.000023291763,0.00004159157,0.00005456988,0.0066917473],"genre_scores_gemma":[0.9978383,0.00015811637,0.0004305416,0.000014940753,0.000009239259,0.000006467653,0.00003727482,0.0000060073153,0.00149898],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9999496,0.0000038210287,0.0000025220393,0.000006758312,0.000022427555,0.000014871682],"domain_scores_gemma":[0.9999201,0.00001901539,0.000014956568,0.000013912937,0.000025294572,0.000006720726],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0001300374,0.00017755796,0.00016411126,0.00039049718,0.0003402671,0.00035474854,0.00047083225,0.00040120078,0.0038022448],"category_scores_gemma":[0.000236243,0.00018472556,0.00022877961,0.00009154575,0.00036420726,0.00041519388,0.00028028365,0.00022780057,0.00040876318],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00033631086,0.00008824245,0.0025819698,0.0002610449,0.00004138752,0.0007477543,0.00024873472,0.0062624104,0.92563605,0.051102683,0.00061309093,0.012080233],"study_design_scores_gemma":[0.00007906553,0.00055117294,0.011254043,0.000022474462,0.000054694177,0.0007063367,0.00029797785,0.06105458,0.9068438,0.014533905,0.0045671533,0.000034792633],"about_ca_topic_score_codex":0.0004482453,"about_ca_topic_score_gemma":0.0006946943,"teacher_disagreement_score":0.0038022448,"about_ca_system_score_codex":0.0002820857,"about_ca_system_score_gemma":0.00013699729,"threshold_uncertainty_score":0.01271975},"labels":[],"label_agreement":null},{"id":"W2020878413","doi":"10.1007/bf02657726","title":"Weldability of thin sheet metals by small-scale resistance spot welding using high-frequency inverter and capacitor-discharge power supplies","year":2001,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Advanced Welding Techniques Analysis","field":"Engineering","cited_by":37,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":true,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of Waterloo","funders":"University of Waterloo","keywords":"Spot welding; Weldability; Materials science; Welding; Electric resistance welding; Electrode; Electrolytic capacitor; Metallurgy; Welding power supply; Composite material; Capacitor; Electrical engineering; Arc welding; Filler metal; Voltage; Engineering; Chemistry","score_opus":0.007265916338556005,"score_gpt":0.21812935102421416,"score_spread":0.21086343468565816,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2020878413","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.994393,0.00026668416,0.004368566,0.000018350996,0.000011553648,0.0000133778085,0.000026101037,0.00009241266,0.00080994196],"genre_scores_gemma":[0.9982924,0.000074229094,0.0010689719,0.0000047482276,0.000003700968,0.000005330319,0.000026920352,0.00001963809,0.00050410914],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.99976414,0.000025315434,0.000012212591,0.00004177194,0.00012541523,0.000031275264],"domain_scores_gemma":[0.9993722,0.00025419833,0.00009336703,0.00011308741,0.00012747456,0.000039665698],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00034297793,0.0002826796,0.00037484133,0.0003821622,0.00026509986,0.00037345992,0.00041319418,0.00033962363,0.0012905827],"category_scores_gemma":[0.0010867319,0.00026142277,0.0002741406,0.00039247313,0.00033268132,0.00041152295,0.00030115852,0.00027386055,0.00017604546],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00037478114,0.00002571854,0.00089945924,0.000062166946,0.000014167359,0.00005752442,0.00013140474,0.0015959734,0.99044716,0.00014173365,0.00005694551,0.006193078],"study_design_scores_gemma":[0.00003860884,0.0010312092,0.011069497,0.000006058042,0.000045020297,0.00012039385,0.00006577162,0.009277404,0.9776422,0.000120936085,0.0005680368,0.000014899904],"about_ca_topic_score_codex":0.00095076207,"about_ca_topic_score_gemma":0.0012624165,"teacher_disagreement_score":0.0012905827,"about_ca_system_score_codex":0.00030836658,"about_ca_system_score_gemma":0.00019333886,"threshold_uncertainty_score":0.0043174624},"labels":[],"label_agreement":null},{"id":"W2022704404","doi":"10.1007/s11664-011-1694-x","title":"Characterization and Electrochemical Mechanism for Bromide-Containing Conductive Anodic Filament (CAF) Failure","year":2011,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Electrochemical Analysis and Applications","field":"Chemistry","cited_by":7,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":true,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Blackberry (Canada); University of Toronto","funders":"University of Toronto","keywords":"X-ray photoelectron spectroscopy; Fourier transform infrared spectroscopy; Scanning electron microscope; Bromide; Anode; Materials science; Copper; Analytical Chemistry (journal); Chemical engineering; Chemistry; Composite material; Inorganic chemistry; Metallurgy; Electrode; Organic chemistry; Physical chemistry","score_opus":0.014055071281816251,"score_gpt":0.22802197408633476,"score_spread":0.21396690280451852,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2022704404","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9922999,0.00073886995,0.004922179,0.00018380722,0.000036427045,0.000042157095,0.00035010322,0.000104217084,0.0013223625],"genre_scores_gemma":[0.99618644,0.0001677481,0.0019431018,0.000040827916,0.0000100686975,0.00001943211,0.00019051561,0.000013357722,0.0014285401],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9997013,0.000020995181,0.00002476856,0.00006046874,0.00012773003,0.00006470136],"domain_scores_gemma":[0.99932146,0.00017188108,0.00014491931,0.00007778151,0.00024769196,0.000036403002],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00040747484,0.00025248312,0.00031139326,0.0005676226,0.00044952086,0.0004231449,0.000898657,0.0010302071,0.0024211083],"category_scores_gemma":[0.0010072807,0.00017674277,0.00030733406,0.00033785007,0.00028357445,0.0006593768,0.00023008426,0.00045441792,0.00034638515],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00025143797,0.000027639651,0.0024251267,0.000092524526,0.000012165199,0.00064025447,0.00013074445,0.00015110777,0.9920312,0.00019657373,0.00024442637,0.003796839],"study_design_scores_gemma":[0.000017164792,0.0004029755,0.015501112,0.000013451181,0.000029805033,0.0009551847,0.00014299378,0.0032788059,0.977816,0.00010361928,0.0017246336,0.00001427848],"about_ca_topic_score_codex":0.001555944,"about_ca_topic_score_gemma":0.0020042106,"teacher_disagreement_score":0.0024211083,"about_ca_system_score_codex":0.00042574678,"about_ca_system_score_gemma":0.00017336667,"threshold_uncertainty_score":0.008099437},"labels":[],"label_agreement":null},{"id":"W2023752051","doi":"10.1007/s11664-012-2284-2","title":"p-Type Bismuth Telluride-Based Composite Thermoelectric Materials Produced by Mechanical Alloying and Hot Extrusion","year":2012,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Advanced Thermoelectric Materials and Devices","field":"Materials Science","cited_by":33,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Polytechnique Montréal","funders":"","keywords":"Materials science; Bismuth telluride; Thermoelectric effect; Crystallite; Composite material; Extrusion; Thermoelectric materials; Grain size; Phonon scattering; Composite number; Alloy; Bismuth; Thermal conductivity; Metallurgy","score_opus":0.009554572753848866,"score_gpt":0.24506708414701872,"score_spread":0.23551251139316987,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2023752051","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.99005973,0.0008506881,0.004610189,0.00003501859,0.0000476216,0.000020989473,0.00012561718,0.00010775442,0.0041424683],"genre_scores_gemma":[0.9929264,0.0002882978,0.0035090896,0.000009080318,0.0000066505795,0.000012494955,0.00011151447,0.000050420313,0.0030860833],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.99992204,0.000008537256,0.000005505174,0.000017158374,0.000029927789,0.000016836468],"domain_scores_gemma":[0.99992776,0.000013567321,0.000016186888,0.0000073049555,0.000021935683,0.00001326926],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0001427933,0.00025882095,0.00028381762,0.0006169842,0.00029149564,0.0003864471,0.00026284333,0.00031794165,0.0015251683],"category_scores_gemma":[0.00018552323,0.00027363113,0.00021368696,0.00051736046,0.00019088341,0.0004099448,0.00018914412,0.00035261185,0.0004114798],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00011743308,0.000012847935,0.0000985161,0.000051530238,0.0000045973534,0.00005918877,0.00002098325,0.00010785971,0.9979601,0.00020539334,0.000045319757,0.001316273],"study_design_scores_gemma":[0.000007774233,0.000048600963,0.00079738075,0.0000025747324,0.000010804629,0.00007556977,0.00001139026,0.000539084,0.997682,0.00002776069,0.0007944611,0.0000026458722],"about_ca_topic_score_codex":0.00019400143,"about_ca_topic_score_gemma":0.00078974327,"teacher_disagreement_score":0.0015251683,"about_ca_system_score_codex":0.00017513533,"about_ca_system_score_gemma":0.0001698447,"threshold_uncertainty_score":0.0051021576},"labels":[],"label_agreement":null},{"id":"W2023950870","doi":"10.1007/s11664-000-0150-0","title":"Creep phenomena in lead-free solders","year":2000,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Electronic Packaging and Soldering Technologies","field":"Engineering","cited_by":50,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":true,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Integrity Testing Laboratory (Canada)","funders":"Natural Sciences and Engineering Research Council of Canada","keywords":"Creep; Nucleation; Materials science; Soldering; Microstructure; Dislocation; Solid-state physics; Activation energy; Diffusion creep; Lead (geology); Metallurgy; Thermodynamics; Composite material; Condensed matter physics; Chemistry; Physical chemistry; Physics; Geology","score_opus":0.005631849206873233,"score_gpt":0.1974411546996596,"score_spread":0.19180930549278635,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2023950870","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.98117507,0.0028481542,0.008913293,0.00019871909,0.0000983532,0.000023913504,0.000027141648,0.000120386314,0.0065949783],"genre_scores_gemma":[0.99814355,0.00024374688,0.00021369706,0.000010877456,0.000016597767,0.0000048103625,0.000012300618,0.000010097151,0.0013444226],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9999236,0.000018543635,0.000004494052,0.000010782439,0.000026680813,0.000015899222],"domain_scores_gemma":[0.9996804,0.00013894255,0.000046764028,0.000030394258,0.000079884085,0.000023752456],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00014408445,0.0002338681,0.00026787532,0.00068258,0.0003659019,0.00038755426,0.00025071806,0.0004037509,0.0014657611],"category_scores_gemma":[0.0010736857,0.00017116549,0.0001477663,0.00031194475,0.00059520704,0.000633442,0.00029524072,0.00024816385,0.00017145526],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.0015918366,0.00069779187,0.01396986,0.0007713723,0.000099425815,0.00427126,0.0021138536,0.049812082,0.7920601,0.06393846,0.0037348866,0.06693912],"study_design_scores_gemma":[0.0003543481,0.0016423184,0.05054455,0.00014064323,0.00011039793,0.0043909163,0.0014022465,0.5181181,0.34740862,0.062394533,0.013348829,0.00014460157],"about_ca_topic_score_codex":0.00036069492,"about_ca_topic_score_gemma":0.00033746765,"teacher_disagreement_score":0.0014657611,"about_ca_system_score_codex":0.00016899112,"about_ca_system_score_gemma":0.00011905389,"threshold_uncertainty_score":0.0049034953},"labels":[],"label_agreement":null},{"id":"W2028178109","doi":"10.1007/s11664-000-0061-0","title":"Influence of crystalline defects on transport properties of GaN grown by ammonia-molecular beam epitaxy and magnetron sputter epitaxy","year":2000,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"GaN-based semiconductor devices and materials","field":"Physics and Astronomy","cited_by":12,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Institute for Microstructural Sciences","funders":"","keywords":"Molecular beam epitaxy; Photoluminescence; Materials science; Sputter deposition; Dislocation; Epitaxy; Optoelectronics; Electron mobility; Luminescence; Doping; Sputtering; Thin film; Crystallography; Chemistry; Nanotechnology; Layer (electronics)","score_opus":0.004046065083347794,"score_gpt":0.19383362158233325,"score_spread":0.18978755649898546,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2028178109","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9988555,0.00035020142,0.00015161351,0.0000398676,0.000011651808,0.000004272128,0.000080740014,0.000010476327,0.00049565645],"genre_scores_gemma":[0.9991487,0.00018782713,0.00017988635,0.000013960849,0.000007526517,0.00000408477,0.00007540027,0.000017657929,0.0003649899],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9998696,0.000023549424,0.000010101307,0.000022882467,0.000039003615,0.000034853052],"domain_scores_gemma":[0.99930084,0.00038814088,0.00012675789,0.000035763525,0.00008146819,0.0000669824],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00026992374,0.00019946307,0.00033045912,0.00019090872,0.00029705762,0.0007365156,0.0002729594,0.00030375778,0.0008886276],"category_scores_gemma":[0.0010263973,0.0002167374,0.0001316191,0.00020577027,0.00032602833,0.00034640418,0.0001615033,0.00026506776,0.00011794249],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.0010167937,0.00004559516,0.0025514178,0.000079635705,0.00003096205,0.00015306797,0.000077587276,0.00075458677,0.99335927,0.00018599763,0.00009181753,0.0016532877],"study_design_scores_gemma":[0.00005639353,0.00034955665,0.010322672,0.000008813906,0.000029648345,0.00009379782,0.00008564515,0.0040428718,0.98448086,0.000043248318,0.00047613026,0.000010223754],"about_ca_topic_score_codex":0.0036816737,"about_ca_topic_score_gemma":0.0044537657,"teacher_disagreement_score":0.0036816737,"about_ca_system_score_codex":0.00062286627,"about_ca_system_score_gemma":0.00037548068,"threshold_uncertainty_score":0.0073204637},"labels":[],"label_agreement":null},{"id":"W2029882310","doi":"10.1007/s11664-007-0341-z","title":"Ambient Temperature Ultrasonic Bonding of Si-Dice Using Sn-3.5wt.%Ag","year":2007,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Electronic Packaging and Soldering Technologies","field":"Engineering","cited_by":18,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of Waterloo","funders":"","keywords":"Intermetallic; Soldering; Materials science; Ultrasonic sensor; Dice; Metallurgy; FOIL method; Composite material; Aluminium; Alloy","score_opus":0.00872334453249144,"score_gpt":0.23953473483377802,"score_spread":0.23081139030128658,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2029882310","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9933949,0.00050017977,0.002371244,0.00008687031,0.000077434604,0.00001690499,0.0001106269,0.00014738196,0.0032944167],"genre_scores_gemma":[0.9914603,0.00025648135,0.0030647933,0.00002568305,0.000013958519,0.000011742253,0.00013071546,0.00003613049,0.0050001997],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.999861,0.000010585817,0.000008425394,0.000037190115,0.00004763925,0.000035012363],"domain_scores_gemma":[0.9998692,0.00002552949,0.00001633325,0.000019954648,0.000055510995,0.000013352428],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00015334086,0.00018651133,0.00022156737,0.00017580223,0.00026149355,0.0001603902,0.00035491108,0.00037583843,0.0056859124],"category_scores_gemma":[0.00033356357,0.00020372395,0.00014276526,0.00018962499,0.00015241244,0.00025484845,0.00021696379,0.0002448754,0.00089951715],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00014786517,0.000019919598,0.00032333733,0.000105042156,0.000008773199,0.00007575361,0.00010092677,0.00016420822,0.9934956,0.00017450926,0.00063024304,0.004753719],"study_design_scores_gemma":[0.000008809304,0.00028134967,0.002911672,0.0000055279356,0.000014225206,0.00006946382,0.00006619056,0.0013416216,0.99331975,0.000030491834,0.0019452177,0.0000056690633],"about_ca_topic_score_codex":0.000731442,"about_ca_topic_score_gemma":0.0018271843,"teacher_disagreement_score":0.0056859124,"about_ca_system_score_codex":0.00018907218,"about_ca_system_score_gemma":0.0001614825,"threshold_uncertainty_score":0.019021332},"labels":[],"label_agreement":null},{"id":"W2029998295","doi":"10.1007/s11664-009-0965-2","title":"Conductive Anodic Filament Formation Part II: Electrochemical Reactions Leading to CAF","year":2009,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Corrosion Behavior and Inhibition","field":"Materials Science","cited_by":19,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Blackberry (Canada); University of Toronto","funders":"","keywords":"Electrochemistry; Copper; Chemistry; Chlorine; Chloride; X-ray photoelectron spectroscopy; Protein filament; Anode; Reaction mechanism; Inorganic chemistry; Electrode; Chemical engineering; Physical chemistry; Catalysis; Organic chemistry","score_opus":0.01818150590118529,"score_gpt":0.28231121650789576,"score_spread":0.2641297106067105,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2029998295","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.934564,0.006356801,0.02748308,0.00039748498,0.00018712491,0.00021185192,0.00050016557,0.00037032293,0.029929206],"genre_scores_gemma":[0.9891038,0.0011522732,0.0037439347,0.00007024859,0.000026924945,0.00005039134,0.00024917955,0.00005167132,0.005551621],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.99984765,0.000016360958,0.000007700031,0.000032869557,0.000042064188,0.000053295505],"domain_scores_gemma":[0.99977523,0.00009535454,0.000029229244,0.000041904754,0.00004052413,0.000017823757],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0001738391,0.0003512614,0.00033224333,0.00035148952,0.00053824723,0.00038310344,0.00057649415,0.00046284244,0.004174871],"category_scores_gemma":[0.00047623776,0.00021100696,0.00041341365,0.0002831314,0.0002662676,0.0005730729,0.00023354788,0.0005972696,0.0005573032],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00014955884,0.00005722947,0.00052327715,0.0002584027,0.00002185922,0.00047092946,0.00021910887,0.00026274315,0.9855737,0.002157112,0.0008352505,0.009470764],"study_design_scores_gemma":[0.000012308261,0.00014845343,0.002389086,0.000008877838,0.000013457036,0.00032343983,0.000043519,0.00078896014,0.99309057,0.00027116964,0.0029033301,0.0000068950762],"about_ca_topic_score_codex":0.0013547105,"about_ca_topic_score_gemma":0.0008483519,"teacher_disagreement_score":0.004174871,"about_ca_system_score_codex":0.00034250302,"about_ca_system_score_gemma":0.00016802242,"threshold_uncertainty_score":0.013966322},"labels":[],"label_agreement":null},{"id":"W2030191989","doi":"10.1007/s11664-000-0188-z","title":"Engineering phase formation thermo-chemistry for crystal growth of homogeneous ternary and quaternary III–V compound semiconductors from melts","year":2000,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Chemical Thermodynamics and Molecular Structure","field":"Chemistry","cited_by":20,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Lockheed Martin (Canada)","funders":"","keywords":"Ternary operation; Thermochemistry; Phase (matter); Homogeneous; Thermodynamics; Chemistry; Crystallite; Solid-state physics; Semiconductor; Mineralogy; Materials science; Crystallography; Physical chemistry; Condensed matter physics; Organic chemistry; Optoelectronics","score_opus":0.004202029685951957,"score_gpt":0.2121756004273871,"score_spread":0.20797357074143513,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2030191989","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9855326,0.0009133306,0.009554258,0.00014392486,0.000050712675,0.000035583496,0.00008593106,0.00016991324,0.0035137727],"genre_scores_gemma":[0.99369544,0.00044282022,0.0045966804,0.000019253725,0.000010797291,0.000022431987,0.00006534419,0.0000909168,0.0010562937],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9999299,0.0000065678973,0.000006465603,0.000013024134,0.000025831429,0.000018216377],"domain_scores_gemma":[0.99992335,0.00002022081,0.000023120436,0.0000081009875,0.000015840556,0.000009339773],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00017452452,0.0001624733,0.00024220813,0.0002113539,0.00029951124,0.00048411064,0.00025087828,0.0001966938,0.0010542254],"category_scores_gemma":[0.00027335554,0.0002862563,0.00019567787,0.00017038794,0.00021645427,0.00046280384,0.00028817888,0.00048829656,0.00030110625],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.000071471055,0.000034200806,0.00021791986,0.00008607952,0.000005048912,0.00002946107,0.000053404172,0.000986348,0.99187076,0.002347341,0.00014577078,0.0041521187],"study_design_scores_gemma":[0.000016121256,0.00008151616,0.0002867531,0.0000069139824,0.0000051634356,0.000025046053,0.000018267934,0.008990095,0.98882574,0.0005151052,0.0012249589,0.0000043715486],"about_ca_topic_score_codex":0.00047000984,"about_ca_topic_score_gemma":0.0016917145,"teacher_disagreement_score":0.0010542254,"about_ca_system_score_codex":0.000584923,"about_ca_system_score_gemma":0.00038400423,"threshold_uncertainty_score":0.00424397},"labels":[],"label_agreement":null},{"id":"W2030853341","doi":"10.1007/s11664-012-2347-4","title":"Dielectric Tunability of DNA Biopolymer Films with Varying Amounts of Hexadecyltrimethylammonium Chloride","year":2013,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Acoustic Wave Resonator Technologies","field":"Engineering","cited_by":4,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"General Dynamics (Canada)","funders":"","keywords":"Dielectric; Materials science; Capacitance; Microwave; Biopolymer; Capacitive sensing; Permittivity; Optoelectronics; Chemical engineering; Analytical Chemistry (journal); Chemistry; Electrode; Composite material; Organic chemistry; Electrical engineering; Polymer","score_opus":0.004426859345925388,"score_gpt":0.19167718279093013,"score_spread":0.18725032344500475,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2030853341","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9981832,0.00035715144,0.00066821114,0.00004544468,0.000025407015,0.000007419695,0.00008122208,0.000024308369,0.00060761906],"genre_scores_gemma":[0.997413,0.0003428886,0.0010301031,0.000035092577,0.000004605924,0.000010658161,0.00010616471,0.000015726584,0.0010418035],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.99986386,0.000013161015,0.000012985907,0.000034951277,0.000034647415,0.00004035571],"domain_scores_gemma":[0.99961627,0.000116473304,0.000109906185,0.000025380967,0.00006995649,0.00006204414],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00017642691,0.00029506063,0.00013979475,0.00013887693,0.00014658956,0.00032299306,0.0002346854,0.00029654684,0.0012755624],"category_scores_gemma":[0.00050221296,0.00023296675,0.00015937169,0.00017486233,0.00020078197,0.00034264493,0.00014068709,0.00046316703,0.00018486475],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.0000735809,0.000008285077,0.00004289174,0.000015052225,0.0000031284035,0.000018670247,0.000014174982,0.000030779982,0.99946815,0.000012011271,0.000007197466,0.0003060817],"study_design_scores_gemma":[0.000006071855,0.00005523346,0.00036992753,0.0000024085234,0.0000060375733,0.000013786535,0.000013587391,0.00016221528,0.9992299,0.0000038437583,0.00013517088,0.0000017945048],"about_ca_topic_score_codex":0.00087481854,"about_ca_topic_score_gemma":0.0013534153,"teacher_disagreement_score":0.0012755624,"about_ca_system_score_codex":0.00023830324,"about_ca_system_score_gemma":0.00022370243,"threshold_uncertainty_score":0.0042672157},"labels":[],"label_agreement":null},{"id":"W2031285528","doi":"10.1007/s11664-009-1055-1","title":"Generation of Nanosized Particles during Mechanical Alloying and Their Evolution through the Hot Extrusion Process in Bismuth-Telluride-Based Alloys","year":2010,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Advanced Thermoelectric Materials and Devices","field":"Materials Science","cited_by":32,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":true,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Polytechnique Montréal","funders":"Natural Sciences and Engineering Research Council of Canada","keywords":"Bismuth telluride; Materials science; Nanocrystalline material; Extrusion; High-resolution transmission electron microscopy; Thermoelectric effect; Crystallite; Thermoelectric materials; Texture (cosmology); Metallurgy; Nanotechnology; Composite material; Transmission electron microscopy; Thermal conductivity","score_opus":0.017276672357020656,"score_gpt":0.2641076736324666,"score_spread":0.24683100127544597,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2031285528","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9963811,0.00029056668,0.002409859,0.000028639393,0.000019860341,0.0000074813706,0.000031137024,0.000030176676,0.00080131844],"genre_scores_gemma":[0.9976277,0.00009010329,0.0011826636,0.000008224495,0.000003652759,0.0000058770975,0.000036081638,0.000021456177,0.0010241531],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.99994063,0.0000057384054,0.0000035893108,0.00001259369,0.000023927587,0.000013490894],"domain_scores_gemma":[0.9999132,0.0000243316,0.00002106078,0.000010452046,0.00002169466,0.000009212162],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00011777749,0.00010973626,0.00016293189,0.00013561102,0.0002133834,0.00035702714,0.00014872129,0.00022611205,0.00067986426],"category_scores_gemma":[0.0001858219,0.0002081068,0.00015487289,0.000091881586,0.00026328626,0.00028966,0.00015447866,0.00023686663,0.00022130476],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.000115055824,0.000017430271,0.0002694639,0.000031623065,0.0000057868792,0.00007483342,0.00009845668,0.00031676024,0.9966564,0.000536159,0.00006289741,0.0018150822],"study_design_scores_gemma":[0.00000940612,0.000039449933,0.0013069315,0.0000011722767,0.000004034822,0.000032989545,0.00002091876,0.0012980351,0.99670583,0.000048981707,0.0005288763,0.0000034361476],"about_ca_topic_score_codex":0.00027917553,"about_ca_topic_score_gemma":0.00051435764,"teacher_disagreement_score":0.00067986426,"about_ca_system_score_codex":0.00021145587,"about_ca_system_score_gemma":0.000110506386,"threshold_uncertainty_score":0.0022743344},"labels":[],"label_agreement":null},{"id":"W2032584242","doi":"10.1007/s11664-005-0158-6","title":"Influence of substrate on high-temperature behavior of copper film studied in situ by electron backscatter diffraction","year":2005,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Copper Interconnects and Reliability","field":"Materials Science","cited_by":6,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"McGill University","funders":"","keywords":"Electron backscatter diffraction; Materials science; Texture (cosmology); Scanning electron microscope; Copper; Electron diffraction; Dislocation; Diffraction; Substrate (aquarium); Composite material; Silicon; Crystallography; Condensed matter physics; Analytical Chemistry (journal); Optics; Microstructure; Chemistry; Metallurgy; Geology","score_opus":0.005200924861074285,"score_gpt":0.25440586543738014,"score_spread":0.24920494057630585,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2032584242","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9968382,0.00076552626,0.00082394975,0.00004713321,0.000024923967,0.00000639027,0.00011809576,0.00002918173,0.0013465029],"genre_scores_gemma":[0.99851257,0.0003617202,0.0005048032,0.00001922125,0.000006993469,0.0000051727566,0.000097283366,0.000026414427,0.00046573085],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9998498,0.000023440536,0.0000097011525,0.00003403225,0.000041446743,0.00004153506],"domain_scores_gemma":[0.99933064,0.00035498384,0.000086622036,0.00007419229,0.00011693322,0.000036567428],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0001988063,0.00029758344,0.00043133597,0.00016170823,0.0003215705,0.00068382843,0.00023738277,0.0002960951,0.0018630497],"category_scores_gemma":[0.0006292435,0.00042379647,0.00014755539,0.00028982325,0.00038340362,0.00041882542,0.00018759143,0.00042221116,0.00026973517],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.0004084273,0.000020726264,0.001334462,0.00010311455,0.000022080738,0.0002709601,0.00015143289,0.00029461712,0.99579775,0.00009787775,0.00010623081,0.0013923127],"study_design_scores_gemma":[0.000012921226,0.00015505479,0.008306762,0.0000075115618,0.000020704634,0.00011057271,0.00011217546,0.0013265854,0.98941857,0.000026723967,0.0004939283,0.000008425493],"about_ca_topic_score_codex":0.0012970194,"about_ca_topic_score_gemma":0.002173254,"teacher_disagreement_score":0.0018630497,"about_ca_system_score_codex":0.0002958093,"about_ca_system_score_gemma":0.00018005616,"threshold_uncertainty_score":0.0062325597},"labels":[],"label_agreement":null},{"id":"W2033036982","doi":"10.1007/s11664-004-0276-6","title":"Recombination parameters for antimonide-based semiconductors using the radio frequency photoreflectance technique","year":2004,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Semiconductor Quantum Structures and Devices","field":"Physics and Astronomy","cited_by":6,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Lockheed Martin (Canada)","funders":"University of New South Wales","keywords":"Auger effect; Auger; Antimonide; Semiconductor; Doping; Materials science; Radiative transfer; Carrier lifetime; Epitaxy; Recombination; Optoelectronics; Atomic physics; Layer (electronics); Chemistry; Optics; Physics; Silicon; Nanotechnology","score_opus":0.02016678131932178,"score_gpt":0.2887090141479427,"score_spread":0.26854223282862094,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2033036982","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.96934086,0.0020397038,0.018799916,0.00016870636,0.00003724631,0.000056044024,0.00059015997,0.00048361806,0.008483812],"genre_scores_gemma":[0.9929716,0.00049501745,0.0048777494,0.0000146231605,0.000005163151,0.000013023981,0.0001834513,0.000077685356,0.0013615733],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9998274,0.00002228596,0.000011493225,0.000038821283,0.00008370376,0.000016422908],"domain_scores_gemma":[0.9996772,0.00016363796,0.00006202365,0.000039224447,0.000049117985,0.000008950075],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0004373261,0.0002848716,0.00030122916,0.0005398703,0.00018908948,0.0005132855,0.00082387624,0.00051927735,0.002156562],"category_scores_gemma":[0.00076778024,0.00022421917,0.00027779012,0.0005143037,0.00018763205,0.0007002255,0.00016334846,0.0004487808,0.0005535173],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00013122857,0.000033626264,0.00076190603,0.00016047196,0.000024339197,0.00008826005,0.00023724929,0.0029765647,0.98553,0.003580484,0.00042292345,0.006052927],"study_design_scores_gemma":[0.000038890856,0.00017395943,0.00431505,0.000028934626,0.000047085006,0.00025152278,0.00009334468,0.03031882,0.9610657,0.0007083129,0.0029263948,0.000032103337],"about_ca_topic_score_codex":0.0015136112,"about_ca_topic_score_gemma":0.003961158,"teacher_disagreement_score":0.002156562,"about_ca_system_score_codex":0.00073258363,"about_ca_system_score_gemma":0.00018861715,"threshold_uncertainty_score":0.007214427},"labels":[],"label_agreement":null},{"id":"W2038104491","doi":"10.1007/s11664-008-0648-4","title":"A Natural-Gas-Fired Thermoelectric Power Generation System","year":2009,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Advanced Thermoelectric Materials and Devices","field":"Materials Science","cited_by":44,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Natural Resources Canada","funders":"","keywords":"Thermoelectric generator; Natural gas; Thermoelectric effect; Electricity generation; Solid-state physics; Thermoelectric materials; Seebeck coefficient; Engineering physics; Materials science; Power (physics); Nuclear engineering; Physics; Engineering; Waste management; Thermodynamics; Condensed matter physics","score_opus":0.005780626536680072,"score_gpt":0.2275922638093412,"score_spread":0.22181163727266112,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2038104491","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9358001,0.00039925537,0.041375175,0.00045733136,0.00020364276,0.00018000878,0.00039958942,0.0014526721,0.01973237],"genre_scores_gemma":[0.99285626,0.00007057155,0.003382507,0.000021590271,0.000011568988,0.00002925387,0.000054740434,0.000007535777,0.0035658588],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.999933,0.000012152607,0.0000037587972,0.000021932536,0.000019965002,0.000009230046],"domain_scores_gemma":[0.9999497,0.000010118982,0.0000037115833,0.000007802538,0.000017112716,0.000011563096],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.000106013984,0.00018516925,0.0004069725,0.00017150301,0.0008300312,0.00034226407,0.00066671625,0.0002739564,0.0042192885],"category_scores_gemma":[0.00007968616,0.00012442772,0.00019332465,0.00016522844,0.00024501694,0.0004679153,0.00028930316,0.00024664638,0.0005018856],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.0029569643,0.0008480187,0.0115998555,0.00083047926,0.00015100284,0.0029258418,0.00040315377,0.0702602,0.7453892,0.01093228,0.008435795,0.1452672],"study_design_scores_gemma":[0.0005883532,0.0022577576,0.011707748,0.00005037361,0.00017784636,0.0011748478,0.00019881583,0.6677743,0.29071262,0.0031473406,0.022114646,0.00009518523],"about_ca_topic_score_codex":0.0015391888,"about_ca_topic_score_gemma":0.0019765971,"teacher_disagreement_score":0.0042192885,"about_ca_system_score_codex":0.00035837034,"about_ca_system_score_gemma":0.00048540605,"threshold_uncertainty_score":0.014114916},"labels":[],"label_agreement":null},{"id":"W2038693278","doi":"10.1007/s11664-011-1528-x","title":"Nanostructure Characterization of Bismuth Telluride-Based Powders and Extruded Alloys by Various Experimental Methods","year":2011,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Advanced Thermoelectric Materials and Devices","field":"Materials Science","cited_by":6,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":true,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Polytechnique Montréal","funders":"Natural Sciences and Engineering Research Council of Canada","keywords":"High-resolution transmission electron microscopy; Materials science; Grain size; Bismuth telluride; Nanostructure; Telluride; Microstructure; Thermoelectric effect; Transmission electron microscopy; Thermoelectric materials; Metallurgy; Chemical engineering; Nanotechnology; Composite material","score_opus":0.010505254286577958,"score_gpt":0.26462582933328216,"score_spread":0.2541205750467042,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2038693278","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9895621,0.00082865433,0.007452418,0.000040925373,0.000024211666,0.000026567232,0.00048652836,0.00006301115,0.0015156304],"genre_scores_gemma":[0.9849161,0.0006580521,0.011526358,0.000029589182,0.000008335115,0.000054087963,0.0006268109,0.00004544545,0.002135267],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.99985635,0.000009141408,0.000014952391,0.00003468875,0.00006976069,0.0000151533795],"domain_scores_gemma":[0.999879,0.000025815878,0.000024997733,0.000016717016,0.00004808395,0.000005332313],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00017246185,0.00018759967,0.0002341432,0.00022183965,0.00021021695,0.00020851695,0.00028961667,0.0003160088,0.0011421602],"category_scores_gemma":[0.0002581671,0.0002601671,0.00018149751,0.00022945399,0.00021367229,0.00023422469,0.00012970477,0.00031097644,0.0002609516],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.000028518907,0.000005072492,0.00013299198,0.000033715063,0.0000026089544,0.000020854734,0.000029897366,0.000040223284,0.9988055,0.00004672221,0.000016394019,0.00083738717],"study_design_scores_gemma":[0.000003721407,0.00002974828,0.0022603325,0.000002183394,0.0000067680107,0.000046248537,0.000020061256,0.0004497684,0.9966486,0.000015465235,0.0005143563,0.0000027894598],"about_ca_topic_score_codex":0.00045578447,"about_ca_topic_score_gemma":0.0011788051,"teacher_disagreement_score":0.0011421602,"about_ca_system_score_codex":0.00016183442,"about_ca_system_score_gemma":0.00009907759,"threshold_uncertainty_score":0.0038209558},"labels":[],"label_agreement":null},{"id":"W2039196003","doi":"10.1007/s11664-004-0142-6","title":"High mobility poly-Ge thin-film transistors fabricated on flexible plastic substrates at temperatures below 130°C","year":2004,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Thin-Film Transistor Technologies","field":"Engineering","cited_by":34,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Acadia University","funders":"","keywords":"Materials science; Crystallization; Composite material; Thin-film transistor; Substrate (aquarium); Stress (linguistics); Polyethylene terephthalate; Layer (electronics); Thin film; Transistor; Drop (telecommunication); Optoelectronics; Nanotechnology; Electrical engineering; Chemical engineering","score_opus":0.006659441537930648,"score_gpt":0.20159875664110188,"score_spread":0.19493931510317122,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2039196003","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.99520516,0.00077399943,0.0017329666,0.00007106761,0.0000484866,0.000020177054,0.00024216172,0.00009394461,0.0018120658],"genre_scores_gemma":[0.99445903,0.00044236775,0.0024152782,0.000022661747,0.000010823008,0.00002723474,0.00020857746,0.000046444104,0.002367684],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9998561,0.00001010868,0.000006656003,0.0000324176,0.000041290456,0.00005345956],"domain_scores_gemma":[0.999742,0.0001061665,0.000040927553,0.000044255095,0.00003733974,0.00002938644],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00015835572,0.00043318365,0.0004309209,0.00035283042,0.0004195531,0.0004599123,0.0006114271,0.00043740866,0.0014930961],"category_scores_gemma":[0.00034074593,0.00039739377,0.00020926085,0.00035193967,0.0003607255,0.0006048996,0.0002818392,0.0004811424,0.00044513162],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.000117182215,0.000008793126,0.00014599328,0.000048384893,0.000010479605,0.00014228708,0.000049414823,0.00011498444,0.99852705,0.00009981898,0.00009407041,0.0006416125],"study_design_scores_gemma":[0.000018460323,0.00012838101,0.002653787,0.000010811172,0.000018523158,0.000110641166,0.00003991292,0.00070454413,0.99576366,0.00005491943,0.00048764554,0.000008548859],"about_ca_topic_score_codex":0.0010405186,"about_ca_topic_score_gemma":0.0034853597,"teacher_disagreement_score":0.0014930961,"about_ca_system_score_codex":0.0003201853,"about_ca_system_score_gemma":0.00018995725,"threshold_uncertainty_score":0.004994929},"labels":[],"label_agreement":null},{"id":"W2040796693","doi":"10.1007/s11664-009-0906-0","title":"Primary Creep in Sn-3.8Ag-0.7Cu Solder, Part II: Constitutive Creep Model Development and Finite Element Analysis","year":2009,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Electronic Packaging and Soldering Technologies","field":"Engineering","cited_by":5,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of Toronto","funders":"","keywords":"Creep; Stress relaxation; Materials science; Diffusion creep; Constitutive equation; Steady state (chemistry); Activation energy; Thermodynamics; Strain rate; Saturation (graph theory); Finite element method; Composite material; Mechanics; Microstructure; Chemistry; Physics; Mathematics; Physical chemistry; Grain boundary","score_opus":0.010315227796620129,"score_gpt":0.21495104683134666,"score_spread":0.20463581903472652,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2040796693","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.50167984,0.0024673145,0.47225773,0.0004784362,0.00011667084,0.00019674852,0.0005089349,0.0008593761,0.021434903],"genre_scores_gemma":[0.96601915,0.00094577053,0.018116001,0.00006829234,0.000032062813,0.00017495247,0.00039430958,0.00016908497,0.014080395],"study_design_codex":"simulation_or_modeling","study_design_gemma":"simulation_or_modeling","domain_scores_codex":[0.9998764,0.000028680664,0.00001005669,0.000021198113,0.00004603781,0.000017740966],"domain_scores_gemma":[0.99982005,0.000061871644,0.00002135767,0.000026755022,0.000062101186,0.000007875907],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0002899421,0.000492513,0.0006254191,0.00048600585,0.0003053789,0.00058725436,0.0007071462,0.00096960366,0.001120442],"category_scores_gemma":[0.00068194175,0.00039326635,0.0008630723,0.00035484985,0.00046761904,0.0006462045,0.00033675562,0.0003451821,0.00044313312],"study_design_candidate":"simulation_or_modeling","study_design_consensus":"simulation_or_modeling","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00006770816,0.000118618096,0.0017249362,0.00016822574,0.000026117294,0.00023232316,0.00020344272,0.9315035,0.037669964,0.008389913,0.001080048,0.018815305],"study_design_scores_gemma":[0.000004533891,0.00003609213,0.00047523045,0.000013702805,0.0000085209,0.000046133973,0.000018006158,0.99257225,0.00497243,0.00081024,0.0010367137,0.000006124756],"about_ca_topic_score_codex":0.0049980734,"about_ca_topic_score_gemma":0.005874799,"teacher_disagreement_score":0.0049980734,"about_ca_system_score_codex":0.00045693136,"about_ca_system_score_gemma":0.0007356163,"threshold_uncertainty_score":0.009938002},"labels":[],"label_agreement":null},{"id":"W2041163185","doi":"10.1007/s11664-000-0119-z","title":"Fracture of Sn-3.5%Ag solder alloy under creep","year":2000,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Electronic Packaging and Soldering Technologies","field":"Engineering","cited_by":21,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Integrity Testing Laboratory (Canada)","funders":"","keywords":"Soldering; Creep; Materials science; Metallurgy; Alloy; Fracture (geology); Composite material","score_opus":0.005338649677321479,"score_gpt":0.2088506631329091,"score_spread":0.20351201345558761,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2041163185","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9976355,0.00023115025,0.00061438145,0.00005273986,0.000032562348,0.0000056248336,0.00017569393,0.000045189976,0.001207251],"genre_scores_gemma":[0.9979512,0.000048733007,0.00024158167,0.000019542444,0.0000046166306,0.0000037798538,0.0001088708,0.000019068691,0.001602543],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.99965715,0.000033160017,0.000018684716,0.000060199844,0.0001653518,0.00006542382],"domain_scores_gemma":[0.99951696,0.00007769685,0.000046750316,0.000095559015,0.00021938584,0.000043694647],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00029200467,0.00021788402,0.00056068273,0.00040457153,0.0005934366,0.00040403448,0.00058908446,0.0010843674,0.003279499],"category_scores_gemma":[0.0008555321,0.00026230357,0.00030208705,0.00039135656,0.00048692655,0.00038258138,0.0003000869,0.00039146625,0.0005979614],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.002602792,0.00007974918,0.011703806,0.00017734803,0.000053107386,0.002689135,0.00073777884,0.0075691706,0.9597542,0.0010545315,0.001227817,0.0123505285],"study_design_scores_gemma":[0.00005635987,0.0015166387,0.06942863,0.000044820936,0.00007955068,0.0012738892,0.0010352617,0.04875499,0.87299055,0.0007369043,0.004021288,0.00006104903],"about_ca_topic_score_codex":0.002654756,"about_ca_topic_score_gemma":0.004047568,"teacher_disagreement_score":0.003279499,"about_ca_system_score_codex":0.00046012123,"about_ca_system_score_gemma":0.00030489656,"threshold_uncertainty_score":0.010971069},"labels":[],"label_agreement":null},{"id":"W2042267485","doi":"10.1007/s11664-013-2516-0","title":"Transport Properties of Bulk Thermoelectrics: An International Round-Robin Study, Part II: Thermal Diffusivity, Specific Heat, and Thermal Conductivity","year":2013,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Advanced Thermoelectric Materials and Devices","field":"Materials Science","cited_by":160,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Université du Québec à Chicoutimi; University of Waterloo","funders":"","keywords":"Thermal diffusivity; Thermal conductivity; Bismuth telluride; Thermoelectric materials; Materials science; Thermal effusivity; Figure of merit; Thermodynamics; Thermal; Thermal contact conductance; Thermal resistance; Composite material; Physics; Optoelectronics","score_opus":0.02099674099068531,"score_gpt":0.24389385247561784,"score_spread":0.22289711148493252,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2042267485","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.95739657,0.006350451,0.019075943,0.00024984145,0.00007128743,0.000037768146,0.0004474142,0.00024598656,0.016124733],"genre_scores_gemma":[0.98658574,0.0015794765,0.005356425,0.000029131223,0.000038825056,0.000031134663,0.0003436149,0.00018350496,0.0058521503],"study_design_codex":"bench_or_experimental","study_design_gemma":"observational","domain_scores_codex":[0.9998185,0.000029458644,0.0000076186557,0.00005411034,0.00005177268,0.000038565697],"domain_scores_gemma":[0.9995591,0.00017626588,0.00006163027,0.000064757696,0.00011152587,0.000026747324],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.000634097,0.0005939866,0.00073608896,0.00064120034,0.0003921896,0.0009046579,0.0006758847,0.0005024028,0.002290649],"category_scores_gemma":[0.0009689669,0.00028057964,0.00040797173,0.0005320832,0.00061704445,0.0018540573,0.00034137297,0.00047239717,0.0006837842],"study_design_candidate":"observational","study_design_consensus":null,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.0014231455,0.00035117936,0.0030845513,0.0006539471,0.000076591394,0.00037613057,0.0003280563,0.045336317,0.890083,0.021609118,0.0036091942,0.033068754],"study_design_scores_gemma":[0.000055477605,0.0008684342,0.005676325,0.00006534628,0.000116514,0.00061885227,0.00019644896,0.344599,0.6361074,0.004365015,0.0072587975,0.00007235561],"about_ca_topic_score_codex":0.0011269705,"about_ca_topic_score_gemma":0.0008862908,"teacher_disagreement_score":0.002290649,"about_ca_system_score_codex":0.000571301,"about_ca_system_score_gemma":0.00043735467,"threshold_uncertainty_score":0.007662952},"labels":[],"label_agreement":null},{"id":"W2048603698","doi":"10.1007/s11664-009-0695-5","title":"Extruded Bismuth-Telluride-Based n-Type Alloys for Waste Heat Thermoelectric Recovery Applications","year":2009,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Advanced Thermoelectric Materials and Devices","field":"Materials Science","cited_by":32,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":true,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Polytechnique Montréal","funders":"Natural Sciences and Engineering Research Council of Canada","keywords":"Bismuth telluride; Thermoelectric effect; Materials science; Thermoelectric materials; Bismuth; Thermoelectric generator; Atmospheric temperature range; Telluride; Analytical Chemistry (journal); Electron mobility; Solid-state physics; Alloy; Extrusion; Thermal conductivity; Tellurium; Metallurgy; Thermodynamics; Condensed matter physics; Optoelectronics; Chemistry; Composite material; Physics","score_opus":0.00959871085898324,"score_gpt":0.2599262660354399,"score_spread":0.25032755517645666,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2048603698","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9940064,0.0011152659,0.0023210733,0.000037651513,0.00003755856,0.000009361635,0.00011519858,0.000050476403,0.0023069684],"genre_scores_gemma":[0.9925384,0.00043406355,0.0023427713,0.00001093612,0.0000039602673,0.0000049013524,0.000120535784,0.000026609554,0.004517974],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9999331,0.000008670066,0.000006304234,0.000011510469,0.000028574557,0.000011749476],"domain_scores_gemma":[0.9999497,0.000008201841,0.000009415257,0.0000071561813,0.000020775993,0.000004828626],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00013940738,0.00019596654,0.00019333277,0.00021277208,0.00022926983,0.00027259818,0.00031744462,0.00021912155,0.0008872823],"category_scores_gemma":[0.00018678844,0.00013897827,0.00013988127,0.00029391036,0.00011739368,0.00037433123,0.00014876015,0.00023531256,0.0002922768],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00021142405,0.000017430944,0.0001720822,0.00007747046,0.000004555233,0.00005708414,0.000025424015,0.00022641837,0.99558145,0.00014967825,0.00007446766,0.0034025505],"study_design_scores_gemma":[0.0000033063172,0.000047419675,0.00047647924,0.0000029008568,0.000006794878,0.000034842386,0.000015137056,0.000426605,0.99797565,0.000015857131,0.0009934776,0.0000015658294],"about_ca_topic_score_codex":0.000569312,"about_ca_topic_score_gemma":0.0025596567,"teacher_disagreement_score":0.0008872823,"about_ca_system_score_codex":0.00021173047,"about_ca_system_score_gemma":0.00020577831,"threshold_uncertainty_score":0.0029682517},"labels":[],"label_agreement":null},{"id":"W2049436157","doi":"10.1007/s11664-004-0270-z","title":"Weldability of thin sheet metals during small-scale resistance spot welding using an alternating-current power supply","year":2000,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Advanced Welding Techniques Analysis","field":"Engineering","cited_by":72,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":true,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of Waterloo","funders":"University of Waterloo","keywords":"Weldability; Spot welding; Materials science; Welding; Brass; Metallurgy; Composite material; Sheet resistance; Electrode; Electrical resistivity and conductivity; Sheet metal; Electric resistance welding; Copper; Electrical engineering; Chemistry","score_opus":0.010252016132371675,"score_gpt":0.25727765916875195,"score_spread":0.24702564303638028,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2049436157","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.99744654,0.0001789383,0.0015937104,0.000011797265,0.000008812163,0.000008803125,0.00003232538,0.000058032518,0.00066106324],"genre_scores_gemma":[0.9991253,0.00003514159,0.00027340508,0.0000032533083,0.0000031142174,0.0000036747151,0.00003149883,0.000015609001,0.0005091003],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.99981374,0.000028756127,0.000010270154,0.000043840664,0.00007110404,0.000032247903],"domain_scores_gemma":[0.9993001,0.00031741336,0.000084692605,0.00009543701,0.00015764794,0.000044688946],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0003156559,0.00024144333,0.00032450823,0.0003108573,0.00034975505,0.00033090427,0.0002581543,0.00026139137,0.0018026987],"category_scores_gemma":[0.0011715501,0.00020206334,0.00022336184,0.0002895537,0.00032717138,0.00040048716,0.00021110153,0.0002282023,0.0002760605],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.0008447718,0.000018803881,0.001203957,0.000060853043,0.000012447136,0.00010640433,0.00026201,0.00077956467,0.9915971,0.000082048835,0.000071729075,0.004960399],"study_design_scores_gemma":[0.00002641528,0.0011316142,0.021685285,0.0000062240233,0.000040651583,0.00016333837,0.00015827674,0.005668184,0.9703995,0.00007145654,0.00063470146,0.0000144209325],"about_ca_topic_score_codex":0.0010409242,"about_ca_topic_score_gemma":0.0012024547,"teacher_disagreement_score":0.0018026987,"about_ca_system_score_codex":0.00024637798,"about_ca_system_score_gemma":0.00018985041,"threshold_uncertainty_score":0.0060306787},"labels":[],"label_agreement":null},{"id":"W2053136932","doi":"10.1007/s11664-001-0197-6","title":"P-type carbon doping of GaSb","year":2001,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Semiconductor Quantum Structures and Devices","field":"Physics and Astronomy","cited_by":18,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":true,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Simon Fraser University","funders":"Natural Sciences and Engineering Research Council of Canada","keywords":"Triethylgallium; Materials science; Doping; Photoluminescence; Carbon fibers; Impurity; Acceptor; Analytical Chemistry (journal); Hall effect; Metalorganic vapour phase epitaxy; Chemistry; Optoelectronics; Condensed matter physics; Nanotechnology; Epitaxy; Electrical resistivity and conductivity; Organic chemistry","score_opus":0.009401536288048823,"score_gpt":0.2562706612303141,"score_spread":0.2468691249422653,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2053136932","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.97847223,0.0012526747,0.0008886708,0.00032905038,0.00018143975,0.000012747589,0.00031196588,0.00012460946,0.018426554],"genre_scores_gemma":[0.99347126,0.00029195007,0.00086395093,0.000044099474,0.000016608885,0.0000081758235,0.00017597833,0.00005166609,0.0050762594],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9999052,0.000012950676,0.0000029704063,0.000017356468,0.000028075958,0.000033370798],"domain_scores_gemma":[0.99989605,0.000021931224,0.000013904458,0.000017969867,0.00002672961,0.000023396393],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.000103952996,0.00023453555,0.00020413852,0.00040504563,0.0005867455,0.0004330377,0.00035030447,0.00050420855,0.0058835703],"category_scores_gemma":[0.00029008923,0.0001427839,0.00010079009,0.0003159907,0.00024233956,0.0003250346,0.00021029956,0.00023113836,0.0006978728],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.0006530193,0.00007450631,0.00096748205,0.000204629,0.000014015737,0.00031796188,0.00009779249,0.00045667158,0.9810254,0.006958734,0.0020695978,0.0071601053],"study_design_scores_gemma":[0.000035168858,0.0002949031,0.0029328703,0.00003549083,0.000009859507,0.0002787085,0.00009516334,0.0053587537,0.9803783,0.0010963382,0.009467511,0.00001693653],"about_ca_topic_score_codex":0.0018237178,"about_ca_topic_score_gemma":0.0027217062,"teacher_disagreement_score":0.0058835703,"about_ca_system_score_codex":0.00049533125,"about_ca_system_score_gemma":0.00018738209,"threshold_uncertainty_score":0.019682527},"labels":[],"label_agreement":null},{"id":"W2058053857","doi":"10.1007/s11664-005-0264-5","title":"Ultralow-k silicon containing fluorocarbon films prepared by plasma-enhanced chemical vapor deposition","year":2005,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Semiconductor materials and devices","field":"Engineering","cited_by":10,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Advanced Micro Devices (Canada)","funders":"Louisiana State University","keywords":"Disilane; Dielectric; Chemical vapor deposition; Materials science; Plasma-enhanced chemical vapor deposition; Silicon; Fluorocarbon; Residual stress; Composite material; Analytical Chemistry (journal); Chemistry; Optoelectronics; Organic chemistry","score_opus":0.004412634243393932,"score_gpt":0.20538579903768972,"score_spread":0.20097316479429578,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2058053857","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.99389726,0.0007638427,0.0026239771,0.000050484054,0.000040775376,0.000016079312,0.00013237075,0.00008265795,0.0023926687],"genre_scores_gemma":[0.993884,0.00042321288,0.0036192932,0.000023848388,0.000010710824,0.000009966093,0.00018850603,0.00003468332,0.0018057876],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9999294,0.000003852863,0.0000034792718,0.000015856434,0.0000235182,0.00002397755],"domain_scores_gemma":[0.99991834,0.00002626565,0.000018338233,0.000009956945,0.000014287878,0.0000128150605],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00008461741,0.00028223312,0.00025834143,0.0001882896,0.0002597648,0.00039491113,0.0003400093,0.0003658433,0.0013729256],"category_scores_gemma":[0.00016355873,0.0002964222,0.00014289682,0.0001435677,0.0002284422,0.00038280155,0.00016653778,0.00045533583,0.0002489129],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00002719981,0.000002576259,0.000034149736,0.000020212141,0.000001783092,0.000032637778,0.000008689122,0.000022121516,0.99944705,0.000040522882,0.00002065205,0.00034241585],"study_design_scores_gemma":[0.000007823275,0.000048979386,0.0007706289,0.0000023160828,0.000004712559,0.000067654684,0.000009714982,0.00021816156,0.9984452,0.000015918833,0.0004064348,0.000002402337],"about_ca_topic_score_codex":0.0005236252,"about_ca_topic_score_gemma":0.001592487,"teacher_disagreement_score":0.0013729256,"about_ca_system_score_codex":0.0002154591,"about_ca_system_score_gemma":0.00013215635,"threshold_uncertainty_score":0.0045928955},"labels":[],"label_agreement":null},{"id":"W2060212911","doi":"10.1007/s11664-007-0237-y","title":"Can Whiskers Grow on Bulk Lead-Free Solder?","year":2007,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Electronic Packaging and Soldering Technologies","field":"Engineering","cited_by":9,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of Alberta","funders":"","keywords":"Whisker; Materials science; Residual stress; Soldering; Whiskers; Intermetallic; Metallurgy; Lead (geology); Composite material; Oxide; Thin film; Thermal shock; Alloy; Nanotechnology","score_opus":0.007547055824817737,"score_gpt":0.2160262830845844,"score_spread":0.20847922725976667,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2060212911","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.85786813,0.020267138,0.014914827,0.010312801,0.003397416,0.00007097746,0.00031978398,0.00137237,0.09147647],"genre_scores_gemma":[0.9716752,0.005620045,0.0023024697,0.0004154069,0.00030131085,0.000025323397,0.00015892193,0.00021635115,0.019285],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.99984884,0.000008222314,0.000003398498,0.000029895818,0.000056689998,0.000052845728],"domain_scores_gemma":[0.99974126,0.00011264665,0.00003123136,0.00003973943,0.000046113404,0.000029024783],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00021805507,0.00044958582,0.0004885843,0.0002890586,0.0004876767,0.0010830258,0.0005980557,0.0012032723,0.008722736],"category_scores_gemma":[0.0011888037,0.00045683424,0.0003232161,0.0001796898,0.0006316157,0.003574846,0.0008265069,0.0009662327,0.0033457663],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00041225486,0.00017026626,0.003001935,0.0016155923,0.00007964625,0.002740353,0.0012037327,0.004563067,0.82372314,0.065991044,0.022554394,0.073944606],"study_design_scores_gemma":[0.00011450881,0.00048315042,0.0064002117,0.00027076033,0.00012074579,0.0022495748,0.0033618254,0.026128637,0.7636376,0.123933725,0.07317843,0.0001208625],"about_ca_topic_score_codex":0.00045463,"about_ca_topic_score_gemma":0.0009119049,"teacher_disagreement_score":0.008722736,"about_ca_system_score_codex":0.00025151655,"about_ca_system_score_gemma":0.00016081134,"threshold_uncertainty_score":0.029180408},"labels":[],"label_agreement":null},{"id":"W2060528362","doi":"10.1007/s11664-009-0964-3","title":"Conductive Anodic Filament (CAF) Formation Part I: the Influence of Water-Soluble Flux on Its Formation","year":2009,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Electrodeposition and Electroless Coatings","field":"Engineering","cited_by":14,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Blackberry (Canada); University of Toronto","funders":"","keywords":"Epoxy; Anode; X-ray photoelectron spectroscopy; Materials science; Copper; Composite material; Polyethylene; Cathode; Scanning electron microscope; Energy-dispersive X-ray spectroscopy; Relative humidity; Polymer; Chemical engineering; Polymer chemistry; Chemistry; Metallurgy; Electrode","score_opus":0.01039274634066576,"score_gpt":0.22164591625777832,"score_spread":0.21125316991711257,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2060528362","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.99026346,0.0025315827,0.003410825,0.00013421229,0.000060958795,0.00005257062,0.00033550145,0.000085785185,0.0031252587],"genre_scores_gemma":[0.9949325,0.00092587253,0.0022691379,0.000029746321,0.000013985192,0.000023702314,0.00032845215,0.00003121904,0.0014454128],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.999859,0.00001830873,0.000011993105,0.00003734803,0.00003255087,0.000040779607],"domain_scores_gemma":[0.9997061,0.00016050281,0.000043226395,0.000025513184,0.00004641524,0.000018246148],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0002518681,0.00025685408,0.00025122368,0.00017832691,0.0003457214,0.000343927,0.00030402376,0.00037286745,0.0022494723],"category_scores_gemma":[0.0006407214,0.0001319569,0.00023654233,0.00019705702,0.00024171743,0.00045152774,0.0001574732,0.00028545997,0.0002498092],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00021576004,0.000024090357,0.00027773232,0.00012371567,0.0000069923985,0.00008207427,0.000077363555,0.00012976682,0.994735,0.0002772962,0.00021010914,0.0038401536],"study_design_scores_gemma":[0.0000063203092,0.00009552284,0.0011413447,0.000004285513,0.0000063538873,0.000038664122,0.000016625392,0.00041979572,0.9971643,0.000028334063,0.0010752322,0.0000032594164],"about_ca_topic_score_codex":0.0019820065,"about_ca_topic_score_gemma":0.0010703161,"teacher_disagreement_score":0.0022494723,"about_ca_system_score_codex":0.00030316727,"about_ca_system_score_gemma":0.00021223312,"threshold_uncertainty_score":0.007525265},"labels":[],"label_agreement":null},{"id":"W2062518759","doi":"10.1007/s11664-008-0623-0","title":"New Ternary Arsenides for High-Temperature Thermoelectric Applications","year":2009,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Advanced Thermoelectric Materials and Devices","field":"Materials Science","cited_by":4,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":true,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of Waterloo","funders":"Natural Sciences and Engineering Research Council of Canada; Canada Research Chairs; Clemson University; Office of Experimental Program to Stimulate Competitive Research; U.S. Department of Energy","keywords":"Isostructural; Seebeck coefficient; Ternary operation; Thermoelectric effect; Thermoelectric materials; Materials science; Rietveld refinement; Crystallography; Chemistry; Thermodynamics; Crystal structure; Physics","score_opus":0.0046008681992281706,"score_gpt":0.24604818234439985,"score_spread":0.24144731414517168,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2062518759","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.90005404,0.014421595,0.023769317,0.0010661125,0.0011205246,0.00021982547,0.00062083435,0.0009775636,0.0577502],"genre_scores_gemma":[0.97431785,0.002970082,0.011317735,0.00014388829,0.00008778108,0.000094448515,0.00027183135,0.00014007687,0.010656192],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9999354,0.000010493586,0.000005578924,0.000011676069,0.000019951725,0.00001697794],"domain_scores_gemma":[0.99996114,0.0000059650088,0.000005864991,0.000005638833,0.000011512273,0.000009874983],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00012583629,0.00034286416,0.00053730066,0.0003774565,0.00048406012,0.0009534368,0.00050533947,0.00041134216,0.003247093],"category_scores_gemma":[0.00019007736,0.00025352568,0.00021437836,0.00029670127,0.00021933537,0.0007901283,0.00071775547,0.00041333915,0.0009477482],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.0004606181,0.00007175128,0.0003617449,0.0006001379,0.000034191453,0.00019288267,0.00009353903,0.0005372186,0.9593312,0.017427526,0.002124221,0.018764868],"study_design_scores_gemma":[0.00014193369,0.0004528868,0.0005959662,0.000044441676,0.000091102076,0.00064294506,0.00012048353,0.0063271914,0.942197,0.0044818805,0.044873577,0.000030564126],"about_ca_topic_score_codex":0.0002018646,"about_ca_topic_score_gemma":0.0008427721,"teacher_disagreement_score":0.003247093,"about_ca_system_score_codex":0.00037973735,"about_ca_system_score_gemma":0.000267918,"threshold_uncertainty_score":0.010862589},"labels":[],"label_agreement":null},{"id":"W2062795510","doi":"10.1007/s11664-005-0157-7","title":"Effect of film thickness on the evolution of annealing texture in sputtered copper films","year":2005,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Copper Interconnects and Reliability","field":"Materials Science","cited_by":36,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Advanced Micro Devices (Canada)","funders":"Advanced Micro Devices","keywords":"Annealing (glass); Grain boundary; Electron backscatter diffraction; Materials science; Crystal twinning; Condensed matter physics; Copper; Sputtering; Diffraction; Texture (cosmology); Grain size; Electron diffraction; Microstructure; Thin film; Crystallography; Composite material; Optics; Metallurgy; Chemistry; Nanotechnology; Physics","score_opus":0.0056073387672300875,"score_gpt":0.25205405644024315,"score_spread":0.24644671767301307,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2062795510","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9981698,0.0005713774,0.00032888606,0.000041784828,0.000021150028,0.000007451881,0.000102620186,0.000026135638,0.00073082204],"genre_scores_gemma":[0.99877435,0.00024614952,0.00031229304,0.000020393585,0.000011016559,0.000005444135,0.000076007804,0.000027296008,0.0005270199],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9998938,0.000011586724,0.000009200402,0.000024543908,0.0000272543,0.000033561813],"domain_scores_gemma":[0.99953747,0.00020447031,0.00009709954,0.00004100739,0.00008040773,0.00003954602],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00015184368,0.00018308373,0.00026014826,0.00014469188,0.000240151,0.00049840735,0.00022219127,0.00026019983,0.001828728],"category_scores_gemma":[0.00079781556,0.0003640571,0.00012811858,0.00024130501,0.00025136647,0.00028979563,0.00012328343,0.00040105413,0.00015616481],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.000699107,0.000020604755,0.0009446739,0.00005784961,0.00001587144,0.0001368143,0.00008375071,0.00027892797,0.9958895,0.00003665241,0.000083428175,0.0017528313],"study_design_scores_gemma":[0.00003671515,0.00035861522,0.010020581,0.0000074271015,0.000033844073,0.00008650988,0.000064973276,0.0014038224,0.9874371,0.000017494644,0.00052405806,0.000008806714],"about_ca_topic_score_codex":0.0019809287,"about_ca_topic_score_gemma":0.0025889063,"teacher_disagreement_score":0.0019809287,"about_ca_system_score_codex":0.0003305688,"about_ca_system_score_gemma":0.00016900981,"threshold_uncertainty_score":0.0061177015},"labels":[],"label_agreement":null},{"id":"W2063409056","doi":"10.1007/s11664-009-0762-y","title":"Comparison of Insulated with Bare Au Bonding Wire: HAZ Length, HAZ Breaking Force, and FAB Deformability","year":2009,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Electronic Packaging and Soldering Technologies","field":"Engineering","cited_by":10,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of Waterloo","funders":"","keywords":"Materials science; Composite material; Wire bonding; Die (integrated circuit); Electrical engineering; Nanotechnology; Engineering","score_opus":0.008487177226183066,"score_gpt":0.25008633188509993,"score_spread":0.24159915465891688,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2063409056","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9980422,0.0001767022,0.0012515262,0.000011042667,0.000009889232,0.0000033332851,0.000041108735,0.000034030712,0.0004301383],"genre_scores_gemma":[0.9987759,0.00005837013,0.00044587403,0.000004485744,0.0000030000683,0.0000014185896,0.0000530161,0.0000072595117,0.0006506569],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9998098,0.000010778025,0.000008555573,0.000036049998,0.00010154304,0.00003322865],"domain_scores_gemma":[0.99930084,0.00022576636,0.00014265886,0.00008146601,0.00020405688,0.000045169592],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00022195982,0.00021690258,0.00025796756,0.00031936006,0.00019316822,0.00026040658,0.00046562942,0.0004229441,0.0017887377],"category_scores_gemma":[0.00083702133,0.00017915416,0.00025112118,0.00020124465,0.00021341168,0.00044550328,0.00018534128,0.00021851106,0.00021717387],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.0015380887,0.0000963363,0.0066814707,0.00005800159,0.000043133507,0.00021486795,0.000094034614,0.0036633445,0.97591984,0.00013281773,0.00010802992,0.011449999],"study_design_scores_gemma":[0.000029047853,0.0016090074,0.05573436,0.00000725765,0.000109245455,0.00031672147,0.00014197659,0.015409092,0.9259394,0.000059670005,0.0006253351,0.00001886474],"about_ca_topic_score_codex":0.0014935376,"about_ca_topic_score_gemma":0.0026145035,"teacher_disagreement_score":0.0017887377,"about_ca_system_score_codex":0.00034677057,"about_ca_system_score_gemma":0.00015958001,"threshold_uncertainty_score":0.005983889},"labels":[],"label_agreement":null},{"id":"W2067661602","doi":"10.1007/s11664-011-1895-3","title":"Effect of Surface Preparation on Mechanical Properties of Ni Contacts on Polycrystalline (Bi1−x Sb x )2(Te1−y Se y )3 Alloys","year":2012,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Advanced Thermoelectric Materials and Devices","field":"Materials Science","cited_by":11,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":true,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Polytechnique Montréal","funders":"Natural Sciences and Engineering Research Council of Canada","keywords":"Scanning electron microscope; Materials science; Etching (microfabrication); Isotropic etching; Crystallite; Composite material; Surface roughness; Ultimate tensile strength; Surface finish; Adhesion; Metallurgy; Layer (electronics)","score_opus":0.014460114516077536,"score_gpt":0.282572569393431,"score_spread":0.26811245487735347,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2067661602","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9984622,0.0005448436,0.00017421559,0.000046549667,0.000032059,0.0000060735,0.00008381674,0.000020635538,0.00062964705],"genre_scores_gemma":[0.99899596,0.00017492539,0.00018148952,0.00001864933,0.000012429318,0.000006424864,0.000106435684,0.000024901665,0.000478785],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.99976295,0.00003333825,0.00002543587,0.000046643218,0.000061054496,0.00007069193],"domain_scores_gemma":[0.9992674,0.00031180368,0.00012046442,0.00009348768,0.00014048596,0.00006641202],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00023675058,0.00029829924,0.0004363315,0.00021770211,0.0004886229,0.0006583115,0.0003609147,0.00043081597,0.003063641],"category_scores_gemma":[0.0010552353,0.0003995744,0.00022234999,0.00035260193,0.00031615255,0.00038830258,0.00028301048,0.00038570823,0.00036663725],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00068970944,0.00003772087,0.00082121085,0.00011319559,0.000026311194,0.00012425086,0.00010300434,0.00019251766,0.99617934,0.000046742814,0.00010174238,0.0015642153],"study_design_scores_gemma":[0.00002214472,0.00030009693,0.008190728,0.000008686548,0.000034314904,0.00005706688,0.00014048984,0.00093174406,0.98979414,0.000015110362,0.0004970808,0.000008319966],"about_ca_topic_score_codex":0.000978778,"about_ca_topic_score_gemma":0.0026032547,"teacher_disagreement_score":0.003063641,"about_ca_system_score_codex":0.00032081568,"about_ca_system_score_gemma":0.00019503468,"threshold_uncertainty_score":0.010248899},"labels":[],"label_agreement":null},{"id":"W2068154593","doi":"10.1007/s11664-010-1342-x","title":"Recrystallization of Electrodeposited Copper Thin Films During Annealing","year":2010,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Copper Interconnects and Reliability","field":"Materials Science","cited_by":9,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of British Columbia","funders":"","keywords":"Recrystallization (geology); Copper; Isothermal process; Annealing (glass); Materials science; Thermodynamics; Microstructure; Kinetics; Metallurgy; Thin film; Nanotechnology","score_opus":0.00482495346902307,"score_gpt":0.23298060703243897,"score_spread":0.2281556535634159,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2068154593","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.99315953,0.0012301652,0.0013396499,0.00008079829,0.000044132965,0.000021871687,0.0002801245,0.00014994055,0.0036937334],"genre_scores_gemma":[0.99483716,0.0004273209,0.0010553594,0.000017957815,0.000010535543,0.000010189908,0.00031736627,0.00007595413,0.0032482238],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9998642,0.000009636763,0.000008815253,0.000026687092,0.00004158548,0.00004907248],"domain_scores_gemma":[0.9998425,0.000044492645,0.00002502826,0.000035779256,0.000041473406,0.000010650348],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0001240012,0.0002542061,0.00031191146,0.00028926838,0.0003284189,0.00032613124,0.00044387,0.00027837444,0.0031959552],"category_scores_gemma":[0.00046738575,0.0003033367,0.00013489138,0.0004024185,0.00021795655,0.00028425088,0.00011884926,0.00056688517,0.00047848266],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00018175837,0.00001637564,0.00020213379,0.00009626425,0.000011916634,0.00018825765,0.00012423481,0.00017640398,0.9962502,0.000084520005,0.00020675348,0.0024612434],"study_design_scores_gemma":[0.000007679621,0.00007557419,0.0014737183,0.0000041091353,0.0000068350682,0.000045373738,0.00003109369,0.0002455957,0.9971583,0.000011389613,0.00093718164,0.0000030566418],"about_ca_topic_score_codex":0.0030992918,"about_ca_topic_score_gemma":0.004786287,"teacher_disagreement_score":0.0031959552,"about_ca_system_score_codex":0.00028354768,"about_ca_system_score_gemma":0.00021514052,"threshold_uncertainty_score":0.010691464},"labels":[],"label_agreement":null},{"id":"W2071662033","doi":"10.1007/s11664-001-0193-x","title":"In-situ monitoring, structural, and optical properties of ultrathin GaSb/GaAs quantum wells grown by OMVPE","year":2001,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Semiconductor Quantum Structures and Devices","field":"Physics and Astronomy","cited_by":11,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Simon Fraser University","funders":"","keywords":"Photoluminescence; Quantum well; Epitaxy; Materials science; Anisotropy; Band gap; Optoelectronics; Spectral line; Condensed matter physics; Solid-state physics; Spectroscopy; Excitation; Layer (electronics); Chemistry; Optics; Nanotechnology; Physics","score_opus":0.010961943214288686,"score_gpt":0.248072959768467,"score_spread":0.23711101655417832,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2071662033","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9980039,0.00020680083,0.0010330186,0.00003092199,0.00000604731,0.0000027554424,0.000091482274,0.00001871636,0.00060626795],"genre_scores_gemma":[0.99761885,0.00013597665,0.0012628394,0.000011926918,0.0000031125214,0.000005870346,0.00007605292,0.000012902557,0.00087239436],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9999192,0.000008016493,0.0000034659893,0.000023337923,0.000022839344,0.000023077428],"domain_scores_gemma":[0.99985385,0.0000681026,0.000025685467,0.000017586268,0.000022120475,0.000012654766],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00012885775,0.0001554013,0.0001971694,0.00012350452,0.00023029273,0.00035380403,0.0003320356,0.00034932487,0.0011625107],"category_scores_gemma":[0.00024410826,0.0002093257,0.00008914262,0.00015541211,0.00029084715,0.00035223455,0.000179316,0.00032920603,0.00013870436],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00006483566,0.000008362714,0.00032260144,0.000018046707,0.0000032111916,0.000035984827,0.000037091148,0.00007063524,0.9987907,0.00008796802,0.000023305472,0.0005371732],"study_design_scores_gemma":[0.0000062180843,0.00003546732,0.0033235003,0.000003357455,0.000004879653,0.000042426444,0.000048290647,0.001127647,0.9949791,0.000037834387,0.0003884321,0.0000029659545],"about_ca_topic_score_codex":0.001478247,"about_ca_topic_score_gemma":0.0021031518,"teacher_disagreement_score":0.001478247,"about_ca_system_score_codex":0.00022599546,"about_ca_system_score_gemma":0.00009299452,"threshold_uncertainty_score":0.0038889647},"labels":[],"label_agreement":null},{"id":"W2072061559","doi":"10.1007/s11664-011-1597-x","title":"Effect of Pd Surface Roughness on the Bonding Process and High Temperature Reliability of Au Ball Bonds","year":2011,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Electronic Packaging and Soldering Technologies","field":"Engineering","cited_by":4,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of Waterloo","funders":"Intel Corporation","keywords":"Materials science; Surface roughness; Surface finish; Scanning electron microscope; Composite material; Aluminium; Substrate (aquarium); Analytical Chemistry (journal); Metallurgy; Chemistry","score_opus":0.006125212214679872,"score_gpt":0.22019698271119117,"score_spread":0.2140717704965113,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2072061559","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9983469,0.00047325686,0.00059685344,0.000038345413,0.000038291004,0.0000058165697,0.000040659033,0.00003322794,0.00042651183],"genre_scores_gemma":[0.9994216,0.00008828892,0.00023868971,0.000009828862,0.000009492606,0.0000020588784,0.000020520773,0.000011477818,0.00019806103],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9996649,0.000057334022,0.00002500008,0.00006237233,0.000107294814,0.00008312476],"domain_scores_gemma":[0.9982449,0.00091118034,0.00021239034,0.00019254776,0.00035929662,0.000079673424],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0003967217,0.0002750868,0.00032079488,0.00027222285,0.00035683607,0.0005461122,0.00029725223,0.000583569,0.0017044798],"category_scores_gemma":[0.0018858443,0.00043725045,0.0003876769,0.00024686637,0.00035604704,0.0005240753,0.0002632549,0.00048448387,0.00028386846],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.0015621125,0.00012122111,0.0037401333,0.00017381817,0.0000942539,0.00040921962,0.00023245494,0.004344871,0.98180604,0.00024102688,0.0004064046,0.0068684593],"study_design_scores_gemma":[0.000038559676,0.001202905,0.01395335,0.000007965614,0.00010923143,0.0002053125,0.00015073303,0.010904803,0.9727716,0.000064903026,0.00055669335,0.000033958644],"about_ca_topic_score_codex":0.0010192086,"about_ca_topic_score_gemma":0.0013784316,"teacher_disagreement_score":0.0017044798,"about_ca_system_score_codex":0.00032019723,"about_ca_system_score_gemma":0.00020048296,"threshold_uncertainty_score":0.0057020783},"labels":[],"label_agreement":null},{"id":"W2075634472","doi":"10.1007/s11664-015-3748-y","title":"Analytical and Numerical Studies of Heat Transfer in Nanocomposite Thermoelectric Coolers","year":2015,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Advanced Thermoelectric Materials and Devices","field":"Materials Science","cited_by":4,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of Guelph","funders":"","keywords":"Nanocomposite; Heat transfer; Thermoelectric effect; Thermoelectric cooling; Materials science; Solid-state physics; Thermoelectric materials; Thermodynamics; Engineering physics; Mechanics; Physics; Nanotechnology; Condensed matter physics","score_opus":0.027852279968884806,"score_gpt":0.3039023198211307,"score_spread":0.2760500398522459,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2075634472","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.957174,0.0006812388,0.022560034,0.00020437571,0.000054049124,0.000042004194,0.00008087099,0.00018196146,0.019021438],"genre_scores_gemma":[0.994293,0.0000998349,0.0027813178,0.000007378545,0.000008265894,0.000014650385,0.000017553106,0.000021443497,0.002756571],"study_design_codex":"simulation_or_modeling","study_design_gemma":"simulation_or_modeling","domain_scores_codex":[0.99988866,0.000025736848,0.0000045656648,0.000015496613,0.000043827727,0.000021721535],"domain_scores_gemma":[0.99938893,0.00041920575,0.00004203242,0.000032915195,0.00010132292,0.00001555397],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00029215697,0.0002545847,0.00034474093,0.0004654901,0.00053617725,0.00064151693,0.00055894407,0.00045969003,0.0022565606],"category_scores_gemma":[0.0014168202,0.0001898573,0.00022995377,0.00039792352,0.00076399086,0.0006623318,0.0002561727,0.00043822915,0.00018782626],"study_design_candidate":"simulation_or_modeling","study_design_consensus":"simulation_or_modeling","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.000677833,0.0005605131,0.0030467466,0.00044134655,0.000030008987,0.000321614,0.0005516348,0.7312259,0.21244659,0.026969664,0.0011002535,0.022627871],"study_design_scores_gemma":[0.000014734412,0.00003874219,0.00049199536,0.000006291396,0.000003847919,0.000020003588,0.000049953895,0.98244375,0.015854906,0.0005639912,0.00050225854,0.000009476406],"about_ca_topic_score_codex":0.0027923244,"about_ca_topic_score_gemma":0.0021950086,"teacher_disagreement_score":0.0027923244,"about_ca_system_score_codex":0.0006024104,"about_ca_system_score_gemma":0.00033018296,"threshold_uncertainty_score":0.007548988},"labels":[],"label_agreement":null},{"id":"W2077240011","doi":"10.1007/s11664-011-1741-7","title":"Traps in 4H-SiC Field-Effect Transistors Characterized by Capacitance- and Current-Mode Deep-Level Transient Spectroscopy","year":2011,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Silicon Carbide Semiconductor Technologies","field":"Engineering","cited_by":2,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Microsemi (Canada)","funders":"Air Force Research Laboratory","keywords":"Deep-level transient spectroscopy; Capacitance; Materials science; Wafer; Optoelectronics; Field-effect transistor; Penning trap; Transistor; Semiconductor; Spectroscopy; Electron; Atomic physics; Analytical Chemistry (journal); Chemistry; Silicon; Electrical engineering; Physics; Voltage","score_opus":0.015203955548654287,"score_gpt":0.23225372674417252,"score_spread":0.21704977119551824,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2077240011","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.99671775,0.0003352821,0.0013570368,0.00008206034,0.000018631321,0.000014236468,0.00018188564,0.00006814502,0.0012248366],"genre_scores_gemma":[0.99875164,0.00005427953,0.00033585881,0.000025327156,0.0000062729655,0.000007060516,0.000110152214,0.000009432395,0.00069997617],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.99984014,0.000013485435,0.000004182305,0.00003582742,0.00006125197,0.000045046592],"domain_scores_gemma":[0.9996873,0.00012279183,0.000055059743,0.000020108897,0.00007268808,0.000042076575],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00032188857,0.0002955567,0.00030809772,0.0009415631,0.0006375211,0.00059439323,0.00072008214,0.0006485358,0.0017677122],"category_scores_gemma":[0.00050042983,0.0002105112,0.00018607969,0.00046730577,0.0007082583,0.0007723998,0.0002930519,0.00051615987,0.00014222502],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00073785416,0.00021705082,0.0049097105,0.000102268474,0.00004792614,0.00035321238,0.00064664334,0.0020938981,0.9821062,0.002124467,0.0008037191,0.005857182],"study_design_scores_gemma":[0.00013662316,0.0011410628,0.064391844,0.00006595497,0.00010659886,0.0007686875,0.0010672149,0.10801992,0.81881994,0.002321189,0.003064992,0.00009594708],"about_ca_topic_score_codex":0.0028207346,"about_ca_topic_score_gemma":0.0049122423,"teacher_disagreement_score":0.0028207346,"about_ca_system_score_codex":0.00087377883,"about_ca_system_score_gemma":0.00034387453,"threshold_uncertainty_score":0.006339729},"labels":[],"label_agreement":null},{"id":"W2078813529","doi":"10.1007/s11664-005-0058-9","title":"Textural and microstructural transformation of Cu damascene interconnects after annealing","year":2005,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Copper Interconnects and Reliability","field":"Materials Science","cited_by":12,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"McGill University","funders":"","keywords":"Annealing (glass); Copper interconnect; Materials science; Electron backscatter diffraction; Diffraction; Microstructure; Grain boundary; Composite material; Metallurgy; Copper; Optics","score_opus":0.005182863311793434,"score_gpt":0.23839266541615833,"score_spread":0.2332098021043649,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2078813529","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.99836,0.00018059694,0.00021035378,0.000012338324,0.0000044834146,0.0000028958973,0.00013976428,0.000026614409,0.0010629578],"genre_scores_gemma":[0.9983816,0.000045193898,0.00013156784,0.000004062252,0.0000017454275,0.000002986355,0.00013050142,0.0000133695885,0.0012889433],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9999198,0.0000044446697,0.0000036993727,0.000017403327,0.000025820724,0.000028870883],"domain_scores_gemma":[0.9998036,0.00004001321,0.00006369571,0.000028346842,0.000045789224,0.000018635965],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00007648589,0.00012304267,0.00013248138,0.00032424662,0.00033998437,0.00023939203,0.00023258725,0.00018032554,0.0029732976],"category_scores_gemma":[0.00032067287,0.0001617013,0.00007915925,0.00037123324,0.000266127,0.00035358116,0.000116525225,0.00021326116,0.00023907654],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00038066055,0.00002485862,0.0012324131,0.000046020745,0.000009383875,0.00018746823,0.00023900523,0.00053347566,0.9947178,0.00016076073,0.00015668562,0.002311524],"study_design_scores_gemma":[0.000010420479,0.00027042348,0.04701543,0.00000618895,0.000019223748,0.00012202897,0.00020162547,0.0020584164,0.9484632,0.00005686717,0.0017595213,0.000016756669],"about_ca_topic_score_codex":0.0027230254,"about_ca_topic_score_gemma":0.005388193,"teacher_disagreement_score":0.0029732976,"about_ca_system_score_codex":0.0002648414,"about_ca_system_score_gemma":0.0001412829,"threshold_uncertainty_score":0.009946644},"labels":[],"label_agreement":null},{"id":"W2080108517","doi":"10.1007/s11664-001-0157-1","title":"Pulsed electrodeposition of the eutectic Au/Sn solder for optoelectronic packaging","year":2001,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Electronic Packaging and Soldering Technologies","field":"Engineering","cited_by":36,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of Alberta","funders":"","keywords":"Eutectic system; Materials science; Soldering; Electroplating; Metallurgy; Eutectic bonding; Wafer; Alloy; Deposition (geology); Brass; Phase (matter); Optoelectronics; Composite material; Copper; Layer (electronics); Chemistry","score_opus":0.006036651892884634,"score_gpt":0.2086420870340927,"score_spread":0.20260543514120807,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2080108517","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9800408,0.002186069,0.01286457,0.00011217099,0.00016612156,0.000021706925,0.00008817948,0.00010441814,0.004416052],"genre_scores_gemma":[0.9904991,0.00050023117,0.0053126663,0.00002556609,0.00001268327,0.0000064355418,0.00004007645,0.000019087258,0.0035842443],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.99992085,0.00000933041,0.000005420531,0.000017856248,0.000034622866,0.000012038171],"domain_scores_gemma":[0.9999504,0.000012015989,0.000006844383,0.000009238749,0.000016662625,0.000004870448],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00010998591,0.00013255946,0.00019488987,0.0001306413,0.00013432367,0.00023131206,0.00024680895,0.00025478526,0.00089612603],"category_scores_gemma":[0.00017349633,0.00015900361,0.00010329964,0.00018725012,0.00011820661,0.00023651683,0.00022055884,0.00018237722,0.00029522946],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.000066571134,0.000010837797,0.00012524694,0.00004706813,0.0000034017246,0.00008012043,0.00003105011,0.0001829004,0.9918514,0.00018054005,0.00009887968,0.0073219733],"study_design_scores_gemma":[0.0000032846815,0.00008911171,0.0005050395,0.0000017532473,0.000004650557,0.00008395831,0.000014435187,0.0011606689,0.99719715,0.00005384473,0.00088423886,0.0000018443886],"about_ca_topic_score_codex":0.00015969541,"about_ca_topic_score_gemma":0.0004512603,"teacher_disagreement_score":0.00089612603,"about_ca_system_score_codex":0.00015909127,"about_ca_system_score_gemma":0.000094763054,"threshold_uncertainty_score":0.0029978156},"labels":[],"label_agreement":null},{"id":"W2083225856","doi":"10.1007/bf02690530","title":"Footprint study of ultrasonic wedge-bonding with aluminum wire on copper substrate","year":2006,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Mechanical stress and fatigue analysis","field":"Engineering","cited_by":70,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":true,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of Waterloo","funders":"Natural Sciences and Engineering Research Council of Canada","keywords":"Materials science; Wedge (geometry); Ultrasonic sensor; Composite material; Copper; Wire bonding; Aluminium; Scanning electron microscope; Metallurgy; Optics","score_opus":0.008117698654407618,"score_gpt":0.21258242360629306,"score_spread":0.20446472495188545,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2083225856","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.99710995,0.00009837353,0.0019480578,0.0000074491677,0.0000065241275,0.0000041088183,0.000019641671,0.00003083898,0.00077510445],"genre_scores_gemma":[0.99874425,0.000029234601,0.0007891525,0.0000023122493,0.0000017266823,0.0000022731535,0.000017308988,0.000003624848,0.0004099467],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.999933,0.0000071753334,0.000001978157,0.000015684884,0.000030248344,0.000011849556],"domain_scores_gemma":[0.9998078,0.000044690456,0.000032274595,0.00002812832,0.00007048909,0.000016708842],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00008826537,0.00009643822,0.000184746,0.0001320222,0.00018895413,0.00008732953,0.00030272076,0.00021628798,0.0019765152],"category_scores_gemma":[0.00023058652,0.00012844114,0.000088058136,0.0001468659,0.00016511504,0.000249534,0.00012829584,0.00009419286,0.00014865267],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.0003387383,0.000074097436,0.004340159,0.000103708444,0.000012616273,0.00047294292,0.0002391516,0.002845192,0.9785678,0.0005014969,0.0002187862,0.012285272],"study_design_scores_gemma":[0.000043550463,0.0027477494,0.09671181,0.000027075652,0.00006373768,0.001102651,0.0010044127,0.07782332,0.81756335,0.00036261836,0.0025124175,0.00003729334],"about_ca_topic_score_codex":0.00067086436,"about_ca_topic_score_gemma":0.0010243093,"teacher_disagreement_score":0.0019765152,"about_ca_system_score_codex":0.00014933418,"about_ca_system_score_gemma":0.00011691087,"threshold_uncertainty_score":0.006612122},"labels":[],"label_agreement":null},{"id":"W2083347163","doi":"10.1007/s11664-005-0021-9","title":"Optical and microstructural characterization of the effects of rapid thermal annealing of CdTe thin films grown on Si (100) substrates","year":2005,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Advanced Semiconductor Detectors and Materials","field":"Engineering","cited_by":14,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"McMaster University","funders":"","keywords":"Cadmium telluride photovoltaics; Materials science; Annealing (glass); Crystallite; Nucleation; Thin film; Scanning electron microscope; Heterojunction; Epitaxy; Crystallinity; Analytical Chemistry (journal); Crystallography; Optoelectronics; Nanotechnology; Composite material; Chemistry; Metallurgy","score_opus":0.003936685989701532,"score_gpt":0.1980868730866806,"score_spread":0.19415018709697907,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2083347163","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.99787736,0.0003542015,0.00046107676,0.000028764855,0.000011750954,0.00000654903,0.00015725604,0.000023704824,0.0010792877],"genre_scores_gemma":[0.9981761,0.00014123115,0.0006388636,0.00001165765,0.0000040721593,0.000008065204,0.00014454479,0.000014334055,0.00086113735],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.99990594,0.0000070038286,0.000006264268,0.000021155462,0.000033950364,0.000025619527],"domain_scores_gemma":[0.99966514,0.00012329803,0.000056678826,0.000042638094,0.000092551454,0.000019661416],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0001354615,0.0001832023,0.00020655773,0.00021406382,0.00022103585,0.00026104567,0.00018630427,0.00026709138,0.0017933454],"category_scores_gemma":[0.00035047065,0.00029434246,0.00015281627,0.0002391543,0.00020264817,0.00021106229,0.00010875837,0.00026795018,0.00014479541],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00014333367,0.000012589659,0.00043368284,0.000037131773,0.00000723386,0.00003276924,0.000023666493,0.00029013187,0.9981839,0.000043495857,0.000054701377,0.00073722843],"study_design_scores_gemma":[0.000016300253,0.00018763098,0.016160432,0.000004882686,0.000016683463,0.000056869725,0.000059294973,0.0017786389,0.98104596,0.000017931172,0.00064978516,0.0000056096287],"about_ca_topic_score_codex":0.0022146124,"about_ca_topic_score_gemma":0.004887592,"teacher_disagreement_score":0.0022146124,"about_ca_system_score_codex":0.00029634815,"about_ca_system_score_gemma":0.00017686246,"threshold_uncertainty_score":0.0059993863},"labels":[],"label_agreement":null},{"id":"W2084647979","doi":"10.1007/s11664-001-0007-1","title":"The temperature dependence of the thermal conductivity of single crystal GaN films","year":2001,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"GaN-based semiconductor devices and materials","field":"Physics and Astronomy","cited_by":30,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Western University","funders":"Office of Naval Research","keywords":"Thermal conductivity; Materials science; Atmospheric temperature range; Solid-state physics; Dislocation; Conductivity; Single crystal; Thermal conductivity measurement; Thermal conduction; Condensed matter physics; Thermal; Composite material; Chemistry; Thermodynamics; Crystallography","score_opus":0.00950745460568299,"score_gpt":0.22894940778263537,"score_spread":0.21944195317695236,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2084647979","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.99503654,0.00073560263,0.0007450751,0.000111358044,0.000033513577,0.0000068825457,0.00028105782,0.000056196557,0.0029936458],"genre_scores_gemma":[0.9978771,0.0002419617,0.00030406186,0.00002045589,0.000010317226,0.0000054396796,0.00022649829,0.000025620855,0.0012885801],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.99988496,0.000008907949,0.000004986515,0.000027796848,0.00004185866,0.000031505166],"domain_scores_gemma":[0.9995536,0.00019329267,0.0000702192,0.00004198774,0.000112965,0.000027933771],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00012610079,0.00015627802,0.0002101418,0.00019994445,0.00017417426,0.00040597707,0.00022211777,0.00027686576,0.002504217],"category_scores_gemma":[0.00054723746,0.00019928059,0.00015037687,0.00016423056,0.00028701877,0.0003795589,0.00011454682,0.00064593856,0.0003707634],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.0002188499,0.000022379367,0.0007649175,0.00006466668,0.000015391504,0.00007050074,0.00007129478,0.00053625164,0.9963367,0.00027540707,0.0002171025,0.0014065083],"study_design_scores_gemma":[0.000009105846,0.00015444924,0.011180209,0.000011899277,0.000013834518,0.00014869467,0.000056681234,0.0048579364,0.98273414,0.00008717316,0.00073421054,0.000011670938],"about_ca_topic_score_codex":0.00073274144,"about_ca_topic_score_gemma":0.0008663991,"teacher_disagreement_score":0.002504217,"about_ca_system_score_codex":0.00032843486,"about_ca_system_score_gemma":0.00012876219,"threshold_uncertainty_score":0.008377492},"labels":[],"label_agreement":null},{"id":"W2086283911","doi":"10.1007/s11664-012-2313-1","title":"Texturing of (Bi0.2Sb0.8)2Te3 Nanopowders by Open Die Pressing","year":2012,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Advanced Thermoelectric Materials and Devices","field":"Materials Science","cited_by":11,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Polytechnique Montréal","funders":"","keywords":"Materials science; Sintering; Pressing; Hexagonal crystal system; Dimensionless quantity; Thermoelectric effect; Die (integrated circuit); Hot pressing; Composite material; Lamination; Crystallography; Nanotechnology; Chemistry","score_opus":0.011874306673553168,"score_gpt":0.2817275988224597,"score_spread":0.2698532921489065,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2086283911","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9927961,0.00024439915,0.003974222,0.000049642375,0.00004565426,0.000014966065,0.00028396014,0.00018194604,0.002409181],"genre_scores_gemma":[0.9924846,0.00013421988,0.0037594486,0.000020774261,0.0000102950735,0.000015815185,0.00022913699,0.00010056345,0.0032451397],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9998933,0.0000037508419,0.000009174962,0.000030193047,0.000035171724,0.000028444438],"domain_scores_gemma":[0.99989355,0.000024627067,0.000023289258,0.000024233215,0.000022400221,0.000011961469],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00011110919,0.0001975695,0.00019871781,0.0002264333,0.00024442896,0.0002755199,0.00023273233,0.0003002609,0.0021833978],"category_scores_gemma":[0.0002216143,0.00018693614,0.00024331934,0.00018850983,0.00019175812,0.00042561226,0.0002710241,0.0003937741,0.00062993536],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00004320361,0.0000052946657,0.00007321807,0.000026599182,0.0000030488218,0.00005064577,0.000043026106,0.00014113354,0.9979563,0.00013310896,0.00007938883,0.0014450469],"study_design_scores_gemma":[0.0000036084336,0.000022569711,0.0005997739,0.0000017743785,0.0000022083382,0.00003102989,0.000012139075,0.0005799528,0.99820244,0.000039768875,0.00050153193,0.00000312867],"about_ca_topic_score_codex":0.00035920698,"about_ca_topic_score_gemma":0.00097303616,"teacher_disagreement_score":0.0021833978,"about_ca_system_score_codex":0.00018798248,"about_ca_system_score_gemma":0.00012677064,"threshold_uncertainty_score":0.007304251},"labels":[],"label_agreement":null},{"id":"W2088291734","doi":"10.1007/s11664-009-0901-5","title":"Primary Creep in Sn3.8Ag0.7Cu Solder. Part I: Theory, Experiments, and Data Reduction","year":2009,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Electronic Packaging and Soldering Technologies","field":"Engineering","cited_by":3,"is_retracted":false,"has_abstract":true,"route_ca_aff":true,"route_ca_fund":true,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of Toronto","funders":"Natural Sciences and Engineering Research Council of Canada; University of Toronto; Ontario Centres of Excellence","keywords":"Creep; Stress relaxation; Materials science; Relaxation (psychology); Stress (linguistics); Soldering; Hardening (computing); Composite material; Thermodynamics; Metallurgy; Physics","score_opus":0.019188861148340983,"score_gpt":0.26399464358226854,"score_spread":0.24480578243392756,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2088291734","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.89871323,0.0010367861,0.09462916,0.00014115393,0.00004839712,0.00022800313,0.00095876167,0.0017435645,0.002500867],"genre_scores_gemma":[0.9587674,0.0009332963,0.036350727,0.000053897802,0.0000306858,0.00032902652,0.001205564,0.00020834708,0.0021211228],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.99931765,0.00009725137,0.00004381043,0.00013319906,0.00034877678,0.000059318147],"domain_scores_gemma":[0.9989096,0.00034259254,0.00008329351,0.0002619861,0.0003749168,0.00002774059],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0007807907,0.00069845165,0.0009834925,0.0010285832,0.00064549485,0.0003603651,0.0009145902,0.00037952943,0.0017915877],"category_scores_gemma":[0.0014549397,0.00039034442,0.0004601098,0.0012321126,0.00054460374,0.00067923125,0.00040458445,0.00046455432,0.0004398765],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.0007952496,0.00036759186,0.0057226853,0.0006203968,0.000046787933,0.0005217991,0.00076324446,0.0073761293,0.90860695,0.00081053784,0.0009513109,0.07341742],"study_design_scores_gemma":[0.000029099949,0.0011622803,0.014703506,0.000027051312,0.000045242236,0.00051657273,0.00019104456,0.052464295,0.9272719,0.00057616615,0.0029602216,0.000052659798],"about_ca_topic_score_codex":0.0013709218,"about_ca_topic_score_gemma":0.0021254253,"teacher_disagreement_score":0.0017915877,"about_ca_system_score_codex":0.0005417286,"about_ca_system_score_gemma":0.00038999013,"threshold_uncertainty_score":0.0059934855},"labels":[],"label_agreement":null},{"id":"W2089562367","doi":"10.1007/s11664-003-0174-3","title":"Influence of 4H-SiC semi-insulating substrate purity on SiC metal-semiconductor field-effect transistor performance","year":2003,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Silicon Carbide Semiconductor Technologies","field":"Engineering","cited_by":10,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Lockheed Martin (Canada)","funders":"","keywords":"Materials science; Deep-level transient spectroscopy; Silicon carbide; Substrate (aquarium); Field-effect transistor; Optoelectronics; Transistor; Doping; Silicon; Secondary ion mass spectrometry; Semiconductor; Analytical Chemistry (journal); Composite material; Mass spectrometry; Electrical engineering; Chemistry","score_opus":0.008145377145754902,"score_gpt":0.21713711757997725,"score_spread":0.20899174043422236,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2089562367","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9973431,0.00038632884,0.0005740265,0.000052656014,0.000013608517,0.000003853941,0.000090559,0.0000460038,0.0014898168],"genre_scores_gemma":[0.9991866,0.000119133336,0.00022558065,0.0000145703525,0.000007667616,0.0000015663634,0.00009651917,0.00002683302,0.00032156185],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9997582,0.00004859702,0.000018818104,0.00003232154,0.00006721877,0.00007483729],"domain_scores_gemma":[0.9989761,0.0005218226,0.00016678942,0.00007538508,0.0001584344,0.000101526115],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00036435208,0.00026014948,0.00034285046,0.00029758087,0.00038967055,0.0008374318,0.0003038438,0.0003078569,0.0014328928],"category_scores_gemma":[0.0011705256,0.00028737198,0.0001670158,0.00036384148,0.0002991856,0.0004228427,0.00026899477,0.0003613638,0.00040386137],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.0012784459,0.000071399445,0.0023441864,0.000049197606,0.00002933068,0.0001642904,0.000069928436,0.0009960697,0.9914819,0.00017207996,0.00014642393,0.003196714],"study_design_scores_gemma":[0.000009264949,0.0002518547,0.0028154668,0.0000029234805,0.000021490003,0.000081040576,0.00003258091,0.0014993944,0.9950316,0.000018451223,0.00023103511,0.000004989007],"about_ca_topic_score_codex":0.0009005608,"about_ca_topic_score_gemma":0.0012985262,"teacher_disagreement_score":0.0014328928,"about_ca_system_score_codex":0.00023458271,"about_ca_system_score_gemma":0.00032350895,"threshold_uncertainty_score":0.0047935247},"labels":[],"label_agreement":null},{"id":"W2089568355","doi":"10.1007/s11664-009-0756-9","title":"Numerical Simulation of the Thermomechanical Behavior of Extruded Bismuth Telluride Alloy Module","year":2009,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Advanced Thermoelectric Materials and Devices","field":"Materials Science","cited_by":60,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Polytechnique Montréal","funders":"","keywords":"Materials science; Bismuth telluride; Extrusion; Fabrication; Stress (linguistics); Crystallite; Texture (cosmology); Composite material; Ceramic; Alloy; Die (integrated circuit); Rod; Thermoelectric materials; Metallurgy; Thermal conductivity; Nanotechnology","score_opus":0.01048343304908565,"score_gpt":0.2703599633213682,"score_spread":0.2598765302722825,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2089568355","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9762211,0.00014813211,0.009462236,0.00017308806,0.000051467076,0.000027119793,0.00031609987,0.00017142657,0.013429358],"genre_scores_gemma":[0.9954175,0.0000436685,0.0022305711,0.000015722071,0.000003542518,0.000016789018,0.000076010256,0.000015144893,0.0021810404],"study_design_codex":"simulation_or_modeling","study_design_gemma":"simulation_or_modeling","domain_scores_codex":[0.99993193,0.000009906804,0.000003212562,0.000010666813,0.00002569355,0.000018548122],"domain_scores_gemma":[0.9997589,0.00010997513,0.000035632234,0.000019832836,0.000049552847,0.000026114758],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00016410109,0.0003053402,0.0005013489,0.00037419406,0.00050613517,0.00048071286,0.00067796686,0.0009912584,0.0037858281],"category_scores_gemma":[0.00058551034,0.00030217262,0.00037715977,0.0004127519,0.00052238983,0.0003282671,0.0002655319,0.0003922139,0.00020504012],"study_design_candidate":"simulation_or_modeling","study_design_consensus":"simulation_or_modeling","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00009223874,0.00006389739,0.0010387161,0.000040902793,0.000015182374,0.00012702425,0.000045393073,0.9870194,0.008260614,0.0013639317,0.00017388536,0.0017587316],"study_design_scores_gemma":[0.000010307272,0.00003247702,0.0005490091,0.000002964262,0.0000037447205,0.000009909495,0.000017762417,0.9975896,0.0015305191,0.00009914776,0.00015007301,0.0000045251613],"about_ca_topic_score_codex":0.008911097,"about_ca_topic_score_gemma":0.006027343,"teacher_disagreement_score":0.008911097,"about_ca_system_score_codex":0.000672021,"about_ca_system_score_gemma":0.0006587341,"threshold_uncertainty_score":0.017718494},"labels":[],"label_agreement":null},{"id":"W2090034236","doi":"10.1007/s11664-013-2738-1","title":"History of the “Detector Materials Engineering” Crystal Growth Process for Bulk Hg1−x Cd x Te","year":2013,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Advanced Semiconductor Detectors and Materials","field":"Engineering","cited_by":2,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Loud Crow Interactive","funders":"","keywords":"Crystal growth; Ampoule; Photoconductivity; Crystal (programming language); Materials science; Zone melting; Impurity; Analytical Chemistry (journal); Recrystallization (geology); Etch pit density; Crucible (geodemography); Mineralogy; Chemistry; Optoelectronics; Crystallography; Nanotechnology; Metallurgy; Composite material","score_opus":0.007039562238790011,"score_gpt":0.1976027100832995,"score_spread":0.19056314784450948,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2090034236","genre_codex":"other","genre_gemma":"other","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"other","genre_consensus":"other","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.16263804,0.2630703,0.08355489,0.02294392,0.009175256,0.0007993883,0.0030483634,0.00091806654,0.4538518],"genre_scores_gemma":[0.47014847,0.25254497,0.08883882,0.008063994,0.0025308048,0.00046651633,0.0031596676,0.0005193354,0.17372742],"study_design_codex":"design_other","study_design_gemma":"not_applicable","domain_scores_codex":[0.99961424,0.00008064238,0.000038974915,0.00010532022,0.00012266418,0.00003816658],"domain_scores_gemma":[0.9993855,0.0002641863,0.00004839417,0.00008150026,0.00019029442,0.000030146819],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0012752557,0.00037935853,0.00028473532,0.0010658086,0.000964407,0.0011154291,0.0005367696,0.00089413975,0.0038539462],"category_scores_gemma":[0.001340685,0.00040561147,0.00025650486,0.001304854,0.0010799746,0.0013179666,0.0010354518,0.0011889674,0.0013145393],"study_design_candidate":"not_applicable","study_design_consensus":null,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00074090314,0.0005203263,0.0030861925,0.004687242,0.00008488871,0.00071974855,0.0010816593,0.005277676,0.15099582,0.1593336,0.04630666,0.6271653],"study_design_scores_gemma":[0.000020453585,0.00023616242,0.0026045886,0.00033542726,0.000021040716,0.000362376,0.000115365714,0.0011044136,0.1585929,0.0066959215,0.8298641,0.00004731417],"about_ca_topic_score_codex":0.0040867594,"about_ca_topic_score_gemma":0.005127943,"teacher_disagreement_score":0.0040867594,"about_ca_system_score_codex":0.002298028,"about_ca_system_score_gemma":0.001539314,"threshold_uncertainty_score":0.016673446},"labels":[],"label_agreement":null},{"id":"W2091633879","doi":"10.1007/s11664-014-3019-3","title":"Effect of Suppression of Grain Growth of Hot Extruded (Bi0.2Sb0.8)2Te3 Thermoelectric Alloys by MoS2 Nanoparticles","year":2014,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Advanced Thermoelectric Materials and Devices","field":"Materials Science","cited_by":19,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Polytechnique Montréal","funders":"","keywords":"Materials science; Bismuth telluride; Thermoelectric effect; Extrusion; Crystallite; Grain size; Scanning electron microscope; Grain growth; Metallurgy; Alloy; Thermal conductivity; Thermoelectric materials; Nanoparticle; Seebeck coefficient; Chemical engineering; Composite material; Nanotechnology","score_opus":0.0034610398315802426,"score_gpt":0.2345603008802772,"score_spread":0.23109926104869696,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2091633879","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9987336,0.0001878646,0.0002029113,0.000022859,0.000015167316,0.0000036439205,0.000071822345,0.000021527292,0.0007406359],"genre_scores_gemma":[0.99889296,0.00008782137,0.00016841044,0.0000116842375,0.000003621711,0.00000402609,0.000056046432,0.000012743925,0.0007627634],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9999255,0.000008286751,0.000007517556,0.00001773213,0.000017792807,0.00002325449],"domain_scores_gemma":[0.9998596,0.00004870807,0.000024188059,0.00001289164,0.00003119121,0.000023404174],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.000094072035,0.00025724474,0.00018896908,0.00008102719,0.00013704288,0.00026029337,0.00017618635,0.00028929877,0.0018372979],"category_scores_gemma":[0.00016404288,0.0001741349,0.000150678,0.00007488492,0.0001717665,0.00016894215,0.00011802606,0.00023045004,0.00024694618],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00036327948,0.000015554222,0.00010241655,0.00002227277,0.0000051803895,0.000023035449,0.000016012425,0.00006785829,0.9989717,0.00003895796,0.000029177718,0.00034456397],"study_design_scores_gemma":[0.000010364491,0.00008573136,0.00071763305,0.0000011798082,0.000005517721,0.00000843637,0.000010609378,0.0005481313,0.99844897,0.0000053071403,0.0001560603,0.0000020140599],"about_ca_topic_score_codex":0.0011527098,"about_ca_topic_score_gemma":0.0017980848,"teacher_disagreement_score":0.0018372979,"about_ca_system_score_codex":0.00020962549,"about_ca_system_score_gemma":0.00011988288,"threshold_uncertainty_score":0.0061463118},"labels":[],"label_agreement":null},{"id":"W2091746611","doi":"10.1007/s11664-009-0811-6","title":"Femtosecond Laser Drilling of Alumina Wafers","year":2009,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Laser Material Processing Techniques","field":"Engineering","cited_by":26,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"National Research Council Canada","funders":"","keywords":"Materials science; Femtosecond; Laser drilling; Laser; Laser ablation; Scanning electron microscope; Wafer; Composite material; Optics; Metallurgy; Optoelectronics; Drilling","score_opus":0.003905774694660334,"score_gpt":0.20692919745306237,"score_spread":0.20302342275840204,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2091746611","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.98361015,0.0009680239,0.008949985,0.00013836403,0.00011318269,0.000050559378,0.00025653187,0.00021295085,0.0057002655],"genre_scores_gemma":[0.98485446,0.00026705553,0.012291029,0.00001728182,0.000014146449,0.000023007766,0.00013442889,0.000017941586,0.00238075],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9997898,0.000010678303,0.00001876862,0.000030861996,0.00010438877,0.000045580855],"domain_scores_gemma":[0.9997024,0.00008737971,0.00006568636,0.000059928243,0.000064722655,0.000019920957],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00024503705,0.00017974585,0.00035641552,0.00045366285,0.00055473257,0.00044291964,0.00026181462,0.00045368643,0.0015333738],"category_scores_gemma":[0.00042337997,0.00030048398,0.00024166558,0.00027139075,0.0003821908,0.0005365799,0.00041267986,0.00035091466,0.00029493266],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00039433432,0.00002113383,0.00061828416,0.00015053448,0.000007769107,0.00021342236,0.00029442148,0.00072210596,0.98631465,0.001260251,0.00023140061,0.009771681],"study_design_scores_gemma":[0.000046622146,0.00039035166,0.0077270363,0.000024906081,0.000012737412,0.00066685484,0.00035330234,0.0039421786,0.97755504,0.0006277062,0.00862021,0.000033154043],"about_ca_topic_score_codex":0.00089947047,"about_ca_topic_score_gemma":0.0019298538,"teacher_disagreement_score":0.0015333738,"about_ca_system_score_codex":0.00038857435,"about_ca_system_score_gemma":0.00061902485,"threshold_uncertainty_score":0.0051295757},"labels":[],"label_agreement":null},{"id":"W2091960683","doi":"10.1007/s11664-002-0173-9","title":"Effect of the underlayer on the microstructure and surface evolution in Al-0.5wt.%Cu polycrystalline thin films","year":2002,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Copper Interconnects and Reliability","field":"Materials Science","cited_by":7,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Advanced Micro Devices (Canada)","funders":"","keywords":"Materials science; Crystallite; Thin film; Microstructure; Deposition (geology); Texture (cosmology); Composite material; Coalescence (physics); Grain size; Surface finish; Grain growth; Sputter deposition; Sputtering; Metallurgy; Nanotechnology; Geology","score_opus":0.006050005988310131,"score_gpt":0.2288986451714663,"score_spread":0.22284863918315617,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2091960683","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9992163,0.00026370966,0.00008787317,0.000018487342,0.000008828985,0.0000021586834,0.000051167033,0.000013969811,0.00033759006],"genre_scores_gemma":[0.9992716,0.00013841712,0.00015019077,0.000012233903,0.000004793877,0.0000033982917,0.00004896932,0.000012443269,0.00035791477],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.99991643,0.000006899757,0.0000065642903,0.00002157037,0.000020283711,0.000028213457],"domain_scores_gemma":[0.99976367,0.000061666404,0.000063502666,0.000022640932,0.00005579379,0.00003277059],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00008384407,0.00016852866,0.00019567563,0.00012046663,0.00027248226,0.0004968435,0.00024524576,0.00025883305,0.0012687034],"category_scores_gemma":[0.00033565782,0.00030771756,0.00010743006,0.00016369196,0.00019381283,0.0002567001,0.00013790057,0.00025647893,0.00014251309],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00026879602,0.000019041861,0.00076968333,0.00005077195,0.000016406018,0.00012161254,0.000044824723,0.00026617802,0.99728763,0.000040559848,0.00006889744,0.0010455196],"study_design_scores_gemma":[0.000029304376,0.00024920504,0.010083939,0.000009884932,0.000049249633,0.000103456216,0.00009957802,0.0020549637,0.98660094,0.000020475904,0.0006917545,0.000007258884],"about_ca_topic_score_codex":0.003311862,"about_ca_topic_score_gemma":0.007210054,"teacher_disagreement_score":0.003311862,"about_ca_system_score_codex":0.00039779232,"about_ca_system_score_gemma":0.00017672897,"threshold_uncertainty_score":0.0065851808},"labels":[],"label_agreement":null},{"id":"W2092141857","doi":"10.1007/s11664-003-0221-0","title":"New copper seed-layer enhancement process metrology for advanced dual-damascene interconnects","year":2003,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Copper Interconnects and Reliability","field":"Materials Science","cited_by":5,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Advanced Micro Devices (Canada)","funders":"Advanced Micro Devices","keywords":"Copper interconnect; Electroplating; Copper; Plating (geology); Copper plating; Layer (electronics); Materials science; Deposition (geology); Metrology; Electrochemistry; Surface roughness; Ion chromatography; Electrode; Chemical engineering; Analytical Chemistry (journal); Optoelectronics; Chemistry; Chromatography; Nanotechnology; Metallurgy; Composite material; Optics","score_opus":0.01202037644450073,"score_gpt":0.29190433710604224,"score_spread":0.27988396066154153,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2092141857","genre_codex":"methods","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":null,"domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.46075627,0.0022556297,0.51971924,0.00047907498,0.00026706597,0.0003389804,0.0002498305,0.0038790205,0.012054997],"genre_scores_gemma":[0.6236863,0.0003013826,0.3716711,0.000088069,0.000058743753,0.00009817745,0.00013325749,0.00010754421,0.003855472],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9988696,0.00014291737,0.0000534193,0.00023052731,0.00060699665,0.00009648137],"domain_scores_gemma":[0.99880075,0.00022000252,0.00020803852,0.00025248638,0.00042964987,0.00008911008],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0010346811,0.0005733644,0.0005530503,0.0010710724,0.00064003264,0.0008677242,0.0013955795,0.00070911366,0.0012830365],"category_scores_gemma":[0.0013973196,0.0005023001,0.00019510405,0.0005472836,0.00067140034,0.0016827575,0.0013086238,0.0007009706,0.00039810775],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00016463421,0.00005396549,0.0013449886,0.000105464205,0.000014881711,0.000115162395,0.00019017133,0.00064009166,0.9498341,0.004692905,0.00061800715,0.042225625],"study_design_scores_gemma":[0.000043067746,0.00030742094,0.0021343722,0.000020040667,0.000032258038,0.0007404222,0.000059971535,0.03435022,0.95081586,0.0010001116,0.0104429275,0.000053214542],"about_ca_topic_score_codex":0.0006839944,"about_ca_topic_score_gemma":0.0030663176,"teacher_disagreement_score":0.0013955795,"about_ca_system_score_codex":0.0011267419,"about_ca_system_score_gemma":0.0008295604,"threshold_uncertainty_score":0.008175075},"labels":[],"label_agreement":null},{"id":"W2092646598","doi":"10.1007/s11664-000-0048-x","title":"Inelastic light scattering from electronic excitations in quantum dots","year":2000,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Semiconductor Quantum Structures and Devices","field":"Physics and Astronomy","cited_by":14,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Institute for Microstructural Sciences","funders":"","keywords":"Condensed matter physics; Quantum dot; Solid-state physics; Physics; Quasiparticle; Inelastic scattering; Magnetic field; Spectroscopy; Scattering; Electron; Electronic structure; Spin (aerodynamics); Resonant inelastic X-ray scattering; Inelastic neutron scattering; Quantum mechanics; Superconductivity","score_opus":0.005447085983740708,"score_gpt":0.23508065151279592,"score_spread":0.2296335655290552,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2092646598","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.89828783,0.0007340632,0.049520854,0.00083098985,0.00022662216,0.00006562349,0.00018303077,0.00015417882,0.049996763],"genre_scores_gemma":[0.9917024,0.00028384264,0.0018540922,0.000111138375,0.0000202127,0.000018127379,0.00011581641,0.00003218109,0.0058622025],"study_design_codex":"theoretical_or_conceptual","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9993424,0.00009192229,0.00003580036,0.00011321071,0.00022913924,0.00018752218],"domain_scores_gemma":[0.9989427,0.0005113464,0.00010098111,0.00018293706,0.00012605677,0.00013598618],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00090819504,0.00080919825,0.00079572084,0.0016676236,0.0014559417,0.002518786,0.0009795929,0.0015212744,0.007966968],"category_scores_gemma":[0.0018844492,0.0010464021,0.00069619017,0.0012418263,0.0023531443,0.0017546345,0.001939579,0.0016370261,0.0011552145],"study_design_candidate":"bench_or_experimental","study_design_consensus":null,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.0015064377,0.00093753997,0.011588938,0.00048962364,0.0002025007,0.0026653286,0.00231819,0.09868705,0.32156324,0.53857607,0.0018883938,0.019576691],"study_design_scores_gemma":[0.00035895477,0.00040603784,0.018575763,0.00014745769,0.00013456953,0.0018342054,0.0024316057,0.572901,0.16111414,0.23596774,0.0057167457,0.00041171364],"about_ca_topic_score_codex":0.0011640021,"about_ca_topic_score_gemma":0.0011925112,"teacher_disagreement_score":0.007966968,"about_ca_system_score_codex":0.0007773938,"about_ca_system_score_gemma":0.000362824,"threshold_uncertainty_score":0.026652157},"labels":[],"label_agreement":null},{"id":"W2095025832","doi":"10.1007/s11664-014-3052-2","title":"Effects of Metal Particles Decoration on n-Type Chalcogenides Processed by Open Die Pressing","year":2014,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Advanced Thermoelectric Materials and Devices","field":"Materials Science","cited_by":4,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Polytechnique Montréal","funders":"","keywords":"Materials science; Copper; Sintering; Metallurgy; Alloy; Thermoelectric effect; Chalcogenide; Composite material; Pressing","score_opus":0.009119620359417881,"score_gpt":0.2730692529481398,"score_spread":0.2639496325887219,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2095025832","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9989114,0.00015099457,0.0001752465,0.000012144105,0.000018051833,0.0000047631984,0.000049550614,0.000025582185,0.0006522468],"genre_scores_gemma":[0.99881834,0.00007337104,0.00022520436,0.00001253729,0.000004012371,0.0000042087604,0.000041746312,0.000021721515,0.0007987943],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.99982697,0.000015168536,0.00001180526,0.000042423195,0.00004587881,0.000057837617],"domain_scores_gemma":[0.99980766,0.00006297426,0.00004032866,0.000024605632,0.0000470237,0.00001740564],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00013147936,0.00026532996,0.00032003608,0.00013482271,0.00027761166,0.0004300204,0.00022742034,0.00037313678,0.0029304202],"category_scores_gemma":[0.00031656242,0.00023435157,0.00019893392,0.00014048722,0.0002888294,0.0003233625,0.00024004592,0.0002865441,0.0004018036],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.0008560389,0.000034272605,0.0002970249,0.00008938451,0.000014901325,0.00013519988,0.000073032796,0.00023404261,0.9964045,0.00006497455,0.00008029923,0.0017162586],"study_design_scores_gemma":[0.000012358612,0.0001781638,0.0016078254,0.000002271949,0.00001226508,0.00002556723,0.00004092647,0.00035493483,0.9974528,0.000010410171,0.00029741906,0.0000050519498],"about_ca_topic_score_codex":0.00050787954,"about_ca_topic_score_gemma":0.0011457741,"teacher_disagreement_score":0.0029304202,"about_ca_system_score_codex":0.0001720737,"about_ca_system_score_gemma":0.00013216694,"threshold_uncertainty_score":0.009803295},"labels":[],"label_agreement":null},{"id":"W2095391271","doi":"10.1007/s11664-006-0245-3","title":"The role of lattice mismatch in the deposition of CdTe thin films","year":2006,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Chalcogenide Semiconductor Thin Films","field":"Engineering","cited_by":29,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":true,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Brockhouse Institute for Materials Research; McMaster University","funders":"Natural Sciences and Engineering Research Council of Canada; European Commission","keywords":"Cadmium telluride photovoltaics; Thin film; Materials science; Pulsed laser deposition; Lattice (music); Substrate (aquarium); Deposition (geology); Optoelectronics; Crystal structure; Nanotechnology; Crystallography; Chemistry; Physics; Geology","score_opus":0.004051234733032555,"score_gpt":0.19709538298449084,"score_spread":0.19304414825145827,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2095391271","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9962748,0.00097254367,0.0011784756,0.00015575538,0.000043154265,0.0000084466365,0.000041295123,0.00001889183,0.0013067651],"genre_scores_gemma":[0.9989427,0.00018773126,0.00036904696,0.000016633026,0.0000038944736,0.0000025716631,0.000014978915,0.0000095595,0.0004528366],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9998221,0.000023278979,0.000019670077,0.000032273212,0.000066083434,0.000036667916],"domain_scores_gemma":[0.99949896,0.0003041076,0.0000706707,0.000030077726,0.00006540679,0.00003080789],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00037871173,0.00017387673,0.00019107807,0.00014880869,0.00030714716,0.00072303234,0.00021799956,0.0003598011,0.0012317308],"category_scores_gemma":[0.0014073465,0.00028310844,0.000061168765,0.00013361913,0.00024255502,0.00058414054,0.00031353423,0.0003264787,0.00017983533],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00040878847,0.00002496579,0.001755975,0.00008669305,0.000009077494,0.00015561712,0.000058796726,0.00088480185,0.9929178,0.00069669524,0.000061137,0.0029395872],"study_design_scores_gemma":[0.000016220127,0.00005800514,0.00088406587,0.0000053814792,0.0000074149134,0.000059330992,0.000051698647,0.0038144835,0.9946189,0.000100596,0.00037890242,0.0000048586285],"about_ca_topic_score_codex":0.00091011066,"about_ca_topic_score_gemma":0.001680816,"teacher_disagreement_score":0.0012317308,"about_ca_system_score_codex":0.0004171195,"about_ca_system_score_gemma":0.0002926867,"threshold_uncertainty_score":0.0041205287},"labels":[],"label_agreement":null},{"id":"W2102066139","doi":"10.1007/s11664-009-0732-4","title":"In Situ Studies of the Effect of Ultrasound During Deformation on Residual Hardness of a Metal","year":2009,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Surface Treatment and Residual Stress","field":"Engineering","cited_by":16,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":true,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of Waterloo","funders":"Natural Sciences and Engineering Research Council of Canada","keywords":"Materials science; Ultrasonic sensor; Ultrasound; Residual; Hardening (computing); Deformation (meteorology); Composite material; Indentation hardness; Strain hardening exponent; Solid-state physics; In situ; Metallurgy; Metal; Microstructure; Acoustics; Chemistry; Condensed matter physics","score_opus":0.0068561494562778035,"score_gpt":0.2479036777891678,"score_spread":0.24104752833289,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2102066139","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.99767023,0.0002578688,0.0011812014,0.000034472174,0.000014384263,0.000008827245,0.000045781064,0.000017292337,0.0007698739],"genre_scores_gemma":[0.99821895,0.000085000975,0.0005314912,0.00001834396,0.000011219588,0.000006602616,0.000037156493,0.000012424259,0.0010788256],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9998318,0.000019338344,0.00000802843,0.000035647918,0.000060082566,0.000045168945],"domain_scores_gemma":[0.9996556,0.00016221305,0.00005693904,0.00004104714,0.00006348303,0.000020701225],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00017061587,0.00022950757,0.0002998195,0.00014621,0.00027857412,0.00027993994,0.00041176192,0.0005070741,0.002708718],"category_scores_gemma":[0.0003831166,0.00020774142,0.00021762533,0.00021889913,0.00055153156,0.00038798695,0.00024798195,0.0004851739,0.00021421022],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00014488115,0.000025245718,0.00024267912,0.00003570741,0.0000044381263,0.000057995392,0.000109768705,0.00008125423,0.9981469,0.000031957738,0.000024168952,0.0010950705],"study_design_scores_gemma":[0.000014131419,0.0005201902,0.0058968132,0.0000030581743,0.000014782902,0.000118951335,0.00020857387,0.0013335119,0.9912368,0.000035744906,0.00060776103,0.000009673972],"about_ca_topic_score_codex":0.0007017219,"about_ca_topic_score_gemma":0.00090907206,"teacher_disagreement_score":0.002708718,"about_ca_system_score_codex":0.00020901937,"about_ca_system_score_gemma":0.000089085006,"threshold_uncertainty_score":0.009061515},"labels":[],"label_agreement":null},{"id":"W2104502055","doi":"10.1007/s11664-011-1557-5","title":"Thermoelectric-Generator-Based DC–DC Conversion Networks for Automotive Applications","year":2011,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Advanced Thermoelectric Materials and Devices","field":"Materials Science","cited_by":35,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Royal Ottawa Mental Health Centre","funders":"","keywords":"Thermoelectric generator; Automotive industry; Thermoelectric effect; Thermoelectric materials; Waste heat; Energy transformation; Computer science; Generator (circuit theory); Energy conversion efficiency; Electricity generation; Efficient energy use; Waste heat recovery unit; Automotive engineering; Power (physics); Electrical engineering; Engineering; Mechanical engineering","score_opus":0.015663148008996392,"score_gpt":0.2469314288046198,"score_spread":0.2312682807956234,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2104502055","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.49639478,0.0074806362,0.35540903,0.0027184703,0.00091789995,0.00030271264,0.0006196818,0.002867301,0.13328944],"genre_scores_gemma":[0.96190155,0.000744835,0.020462887,0.0001401642,0.00006464,0.00004910082,0.00015980545,0.00004463464,0.016432356],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9999498,0.000008742513,0.0000019595711,0.000014900519,0.000016987691,0.000007640955],"domain_scores_gemma":[0.9999045,0.0000255796,0.0000079939,0.0000114180175,0.000042772248,0.000007700102],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00011946966,0.00016383671,0.00014400973,0.00023084717,0.0003869968,0.00037424846,0.0008290641,0.00028798607,0.008339737],"category_scores_gemma":[0.00017379933,0.00014614532,0.00009091165,0.00030330115,0.00017904963,0.00072091055,0.00023687816,0.00039878176,0.0014915422],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00051411055,0.0003578709,0.0010259091,0.00045527975,0.0000429076,0.00018839004,0.000165629,0.014852195,0.73923284,0.043442365,0.017335735,0.18238679],"study_design_scores_gemma":[0.000058765097,0.00029298212,0.0012292697,0.00006516973,0.00005335016,0.00033931984,0.00007072919,0.22915809,0.69306964,0.01061853,0.065013096,0.000031108753],"about_ca_topic_score_codex":0.00031596754,"about_ca_topic_score_gemma":0.0019283831,"teacher_disagreement_score":0.008339737,"about_ca_system_score_codex":0.00040489293,"about_ca_system_score_gemma":0.00017242336,"threshold_uncertainty_score":0.027899206},"labels":[],"label_agreement":null},{"id":"W2118650894","doi":"10.1007/s11664-012-1926-8","title":"Thermoelectric and Mechanical Properties of Novel Hot-Extruded PbTe n-Type Material","year":2012,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Advanced Thermoelectric Materials and Devices","field":"Materials Science","cited_by":20,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Polytechnique Montréal","funders":"","keywords":"Materials science; Lead telluride; Thermoelectric materials; Thermoelectric effect; Extrusion; Composite material; Thermoelectric generator; Crystallite; Microstructure; Rod; Wafer dicing; Doping; Metallurgy; Optoelectronics; Thermal conductivity","score_opus":0.02209874205292231,"score_gpt":0.2500017491519157,"score_spread":0.2279030070989934,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2118650894","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.99802977,0.00029005416,0.0006186435,0.000025157751,0.000016828486,0.0000032916685,0.0000628359,0.000016721764,0.000936734],"genre_scores_gemma":[0.9967816,0.000114547234,0.00067722687,0.000009521478,0.000004461767,0.0000050880294,0.00009891149,0.0000080135305,0.0023005574],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9999434,0.0000043073164,0.0000030998115,0.000014810844,0.000025628551,0.00000879905],"domain_scores_gemma":[0.9999505,0.000010154991,0.00001131282,0.0000056461563,0.000015507198,0.0000068023464],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.000088199246,0.00013277541,0.00016461278,0.00014246485,0.00013600144,0.00014096036,0.0002739253,0.00025398587,0.0011330281],"category_scores_gemma":[0.00012231237,0.00013137836,0.00011312656,0.00016018572,0.00013512155,0.0002837884,0.0001110809,0.00014921534,0.00016739413],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00014109872,0.000015596137,0.0002512264,0.00005282399,0.0000046066325,0.00008906601,0.000022169204,0.00017594987,0.99758255,0.00009039572,0.00006696952,0.0015075167],"study_design_scores_gemma":[0.00001595407,0.00021121332,0.0077009327,0.000007762575,0.000017860077,0.00023728222,0.00005840277,0.002665149,0.9876852,0.000035910834,0.0013556633,0.000008481777],"about_ca_topic_score_codex":0.00026428973,"about_ca_topic_score_gemma":0.0007858801,"teacher_disagreement_score":0.0011330281,"about_ca_system_score_codex":0.00011150242,"about_ca_system_score_gemma":0.0000989089,"threshold_uncertainty_score":0.003790319},"labels":[],"label_agreement":null},{"id":"W2120601835","doi":"10.1007/s11664-007-0121-9","title":"The Feasibility of Au Ball Bonding on Sn-Plated Cu","year":2007,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Electronic Packaging and Soldering Technologies","field":"Engineering","cited_by":3,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of Waterloo","funders":"","keywords":"Intermetallic; Materials science; Wire bonding; Soldering; Microstructure; Metallurgy; Ball (mathematics); Composite material; Shear force; Metallizing; Shear strength (soil); Copper; Alloy; Metal; Electrical engineering","score_opus":0.01751146220012007,"score_gpt":0.2704750650428842,"score_spread":0.25296360284276415,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2120601835","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9723334,0.0012693261,0.0081466315,0.00023160942,0.00039430527,0.00006997391,0.000072482595,0.0002289113,0.017253224],"genre_scores_gemma":[0.98470634,0.0003024028,0.0071005584,0.0000313617,0.000027156359,0.00002701295,0.00008520784,0.000032629425,0.007687341],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.999653,0.000057484118,0.00001555998,0.000064359265,0.00015817839,0.00005147283],"domain_scores_gemma":[0.9994711,0.00013546953,0.00003577279,0.00008334343,0.00023159126,0.00004267468],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.000543197,0.00025834067,0.00019778023,0.00026973413,0.0005470161,0.00049578707,0.0005153096,0.00050109165,0.0024393306],"category_scores_gemma":[0.0012392092,0.00029783888,0.0001425381,0.00013651687,0.00026282028,0.000708206,0.000359189,0.00032539922,0.0006210222],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.0006361702,0.000106180254,0.0019946324,0.00027969704,0.000031162712,0.0002727253,0.00037486322,0.0014351762,0.96519053,0.004798469,0.0017822313,0.023098152],"study_design_scores_gemma":[0.000027670032,0.0008496983,0.0032061853,0.000015990472,0.00004302572,0.00022204476,0.00022094509,0.011372064,0.9755545,0.00039791586,0.008072488,0.000017461425],"about_ca_topic_score_codex":0.0016042282,"about_ca_topic_score_gemma":0.0025198164,"teacher_disagreement_score":0.0024393306,"about_ca_system_score_codex":0.00027742618,"about_ca_system_score_gemma":0.00039991437,"threshold_uncertainty_score":0.008160353},"labels":[],"label_agreement":null},{"id":"W2124025304","doi":"10.1007/s11664-010-1297-y","title":"Analysis of Ultraviolet Curing Effect on the Dielectric Constant and Molecular Structure of a Porous Dielectric Film","year":2010,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Phase-change materials and chalcogenides","field":"Materials Science","cited_by":9,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of Waterloo","funders":"","keywords":"Polarizability; Dielectric; Ionic bonding; X-ray photoelectron spectroscopy; Fourier transform infrared spectroscopy; Ultraviolet; Dipole; Ultraviolet photoelectron spectroscopy; Chemistry; Materials science; Analytical Chemistry (journal); Physical chemistry; Electronic structure; Molecule; Computational chemistry; Optics; Organic chemistry; Nuclear magnetic resonance; Ion; Optoelectronics; Physics","score_opus":0.005335635069322722,"score_gpt":0.23554572529182116,"score_spread":0.23021009022249844,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2124025304","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.99849856,0.00016349631,0.0009095416,0.000008122956,0.0000037910272,0.0000015622202,0.00003691887,0.000014704722,0.0003634099],"genre_scores_gemma":[0.9991572,0.000097591095,0.00036267465,0.0000048333013,0.0000016379493,0.000001626195,0.000042052103,0.0000061643896,0.00032620243],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9999609,0.0000031152022,0.0000014749161,0.000010195767,0.000013522882,0.000010830001],"domain_scores_gemma":[0.99978167,0.00010483337,0.000048457332,0.000016219754,0.000026084937,0.000022701404],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00008770683,0.000099069555,0.00008354837,0.00013146632,0.000100992605,0.000101295074,0.00011210318,0.00012736677,0.0008959246],"category_scores_gemma":[0.00021210285,0.000096961616,0.00012049959,0.00011372674,0.00018735048,0.00013660517,0.00006044043,0.000268447,0.00008277801],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00008470851,0.00000935873,0.00034434343,0.000011934148,0.000003437782,0.000033545526,0.00001890977,0.00008680345,0.99856645,0.000033963293,0.000010897631,0.00079566496],"study_design_scores_gemma":[0.000003144006,0.00009640354,0.006981179,0.0000015294222,0.000011949524,0.00005887654,0.000017574097,0.00086531934,0.9917532,0.000013911937,0.0001938254,0.000003102382],"about_ca_topic_score_codex":0.00035823803,"about_ca_topic_score_gemma":0.00037713262,"teacher_disagreement_score":0.0008959246,"about_ca_system_score_codex":0.0000942553,"about_ca_system_score_gemma":0.00007864986,"threshold_uncertainty_score":0.00299716},"labels":[],"label_agreement":null},{"id":"W2126996003","doi":"10.1007/s11664-012-2336-7","title":"Physicochemical Properties of Sn-Zn and SAC + Bi Alloys","year":2012,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Electronic Packaging and Soldering Technologies","field":"Engineering","cited_by":44,"is_retracted":false,"has_abstract":true,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of Alberta","funders":"","keywords":"Crucible (geodemography); Surface tension; Viscosity; Capillary action; Soldering; Chemistry; Alloy; Analytical Chemistry (journal); Bubble; Thermodynamics; Maximum bubble pressure method; Materials science; Metallurgy; Composite material; Chromatography; Mechanics","score_opus":0.011700776939403974,"score_gpt":0.20956947393010553,"score_spread":0.19786869699070156,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2126996003","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9941935,0.0011576078,0.0016094255,0.000022068492,0.000020685928,0.000020012123,0.00080496375,0.00004841357,0.0021232294],"genre_scores_gemma":[0.99363774,0.00054991775,0.0023193099,0.000012631177,0.000006692208,0.00002523523,0.0009760846,0.00002536886,0.0024470934],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9995839,0.000038275975,0.000044060966,0.0000655518,0.00024239888,0.000025853169],"domain_scores_gemma":[0.9996923,0.000040286268,0.000050458835,0.000015007435,0.00017562152,0.000026347914],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00025165614,0.00024674824,0.0002479238,0.0007047961,0.00024951523,0.0003411267,0.00022094,0.00025530564,0.0009595097],"category_scores_gemma":[0.00067854964,0.00018390798,0.00017174504,0.00059582,0.00016556102,0.00016238965,0.00014723228,0.00017830615,0.00039668143],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00009751733,0.000007731671,0.0016054953,0.000065365544,0.000009325598,0.00005805864,0.000055297223,0.00022835081,0.9954651,0.00008101906,0.000047874062,0.0022787307],"study_design_scores_gemma":[0.0000069510293,0.00023373579,0.029415522,0.000008431088,0.00004208932,0.00032060244,0.00016151096,0.0022409093,0.9639912,0.000070165624,0.003490053,0.000018985296],"about_ca_topic_score_codex":0.0022210884,"about_ca_topic_score_gemma":0.0030746432,"teacher_disagreement_score":0.0022210884,"about_ca_system_score_codex":0.00030601982,"about_ca_system_score_gemma":0.0001986032,"threshold_uncertainty_score":0.0044163465},"labels":[],"label_agreement":null},{"id":"W2138842164","doi":"10.1007/s11664-014-3538-y","title":"Three-Layer Zn/Al/Zn Clad Solder for Die Attachment","year":2014,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Electronic Packaging and Soldering Technologies","field":"Engineering","cited_by":7,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Nexen (Canada)","funders":"","keywords":"Soldering; Materials science; Eutectic system; Metallurgy; Shear strength (soil); Wetting; Layer (electronics); Oxide; Substrate (aquarium); Die (integrated circuit); Joint (building); Composite material; Microstructure","score_opus":0.01572327839340312,"score_gpt":0.26101871365634416,"score_spread":0.24529543526294104,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2138842164","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.8637259,0.0014243833,0.11457851,0.00020181811,0.00049094984,0.00015886726,0.0005388809,0.0021078673,0.016772712],"genre_scores_gemma":[0.9496592,0.00043575923,0.03805638,0.00004629893,0.000015787551,0.000033943514,0.00022558843,0.00010103825,0.011426128],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.99990547,0.000006293451,0.000005908785,0.00002230452,0.000043195614,0.000016813421],"domain_scores_gemma":[0.9999001,0.0000057262664,0.000014504867,0.000020385927,0.000045982124,0.000013217137],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0001310769,0.0003687334,0.00023854831,0.00024618732,0.00032979503,0.00039831956,0.00063606724,0.00031402483,0.001507699],"category_scores_gemma":[0.00019493727,0.0002539522,0.00019017201,0.00023392473,0.00011456725,0.0003687304,0.00052210985,0.00024508682,0.0009778324],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00008383806,0.000031649914,0.0008059141,0.00016010429,0.000012069048,0.00011276771,0.00005992207,0.0011060277,0.9779871,0.00085476454,0.00083020667,0.01795554],"study_design_scores_gemma":[0.000017557433,0.00020674174,0.0025564376,0.000019748995,0.000026549162,0.00027017976,0.00004992859,0.011412736,0.9746874,0.00021670976,0.010519973,0.000016199796],"about_ca_topic_score_codex":0.00073341175,"about_ca_topic_score_gemma":0.0027264396,"teacher_disagreement_score":0.001507699,"about_ca_system_score_codex":0.00032591211,"about_ca_system_score_gemma":0.00036272715,"threshold_uncertainty_score":0.005043745},"labels":[],"label_agreement":null},{"id":"W2146190951","doi":"10.1007/s11664-008-0401-z","title":"Fabrication and Microstructures of Sequentially Electroplated Sn-Rich Au-Sn Alloy Solders","year":2008,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Electronic Packaging and Soldering Technologies","field":"Engineering","cited_by":18,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":true,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of Alberta","funders":"Natural Sciences and Engineering Research Council of Canada; China Scholarship Council","keywords":"Eutectic system; Materials science; Alloy; Soldering; Microstructure; Electroplating; Metallurgy; Annealing (glass); Indentation hardness; Intermetallic; Layer (electronics); Composite material","score_opus":0.007669195649521457,"score_gpt":0.202235826769345,"score_spread":0.19456663111982356,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2146190951","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9894209,0.0006386051,0.0065007275,0.0000581086,0.0000652543,0.00004567334,0.00027991013,0.00017223167,0.0028187733],"genre_scores_gemma":[0.98067206,0.00027317525,0.016351437,0.000017790888,0.000010656401,0.00003246681,0.0001598173,0.000035097124,0.002447477],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9998684,0.000008923234,0.000011865731,0.000036485395,0.000055430275,0.000018794564],"domain_scores_gemma":[0.999838,0.000016474456,0.000045853332,0.000032652853,0.00005059659,0.000016342618],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00018050688,0.0001713577,0.0002621176,0.00027127407,0.00022774562,0.0003038887,0.00033457924,0.00022383683,0.0005352706],"category_scores_gemma":[0.00037259187,0.00033286185,0.00011881505,0.00020942773,0.00019786585,0.00021800456,0.00017488735,0.00018802444,0.00017317882],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.000030039831,0.000008442843,0.00025542115,0.000036431768,0.0000042502215,0.000050500108,0.000034178815,0.00039915985,0.9973928,0.00031351997,0.00007022514,0.0014050078],"study_design_scores_gemma":[0.000015045279,0.00016952773,0.006038271,0.00000443248,0.000011199559,0.00010974748,0.00002927022,0.0028356998,0.9887967,0.00007738404,0.0019067742,0.000005915936],"about_ca_topic_score_codex":0.0016520362,"about_ca_topic_score_gemma":0.004944386,"teacher_disagreement_score":0.0016520362,"about_ca_system_score_codex":0.00049828266,"about_ca_system_score_gemma":0.00039387413,"threshold_uncertainty_score":0.0036153197},"labels":[],"label_agreement":null},{"id":"W2146656434","doi":"10.1007/s11664-015-4133-6","title":"Effect of Solder Joint Length on Fracture Under Bending","year":2015,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Mechanical Behavior of Composites","field":"Engineering","cited_by":11,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of Toronto","funders":"","keywords":"Soldering; Joint (building); Materials science; Composite material; Fracture (geology); Bending; Stress (linguistics); Deformation (meteorology); Strain energy release rate; Cantilever; Structural engineering","score_opus":0.014972224883153971,"score_gpt":0.2593661094457384,"score_spread":0.24439388456258443,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2146656434","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9979845,0.00038692623,0.00069593603,0.000033751283,0.000019950397,0.0000047322314,0.00010383731,0.00006795065,0.00070229394],"genre_scores_gemma":[0.9987835,0.000093143106,0.0003057052,0.000023673801,0.0000074864683,0.000004817975,0.000065202774,0.000032887416,0.000683517],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.999653,0.00007777437,0.000029830473,0.000057768848,0.000073941264,0.0001077707],"domain_scores_gemma":[0.9970108,0.001919129,0.00025603775,0.00021932006,0.00036698877,0.0002276906],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00062289595,0.00040135533,0.00043607267,0.0003445857,0.00029753576,0.00044863063,0.0003876361,0.0006123217,0.0055098985],"category_scores_gemma":[0.0019813192,0.0003928278,0.00029708847,0.00034456156,0.00045591485,0.0005244869,0.00035245254,0.0004048711,0.0006668777],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.0066566058,0.00020906453,0.00368964,0.00021723521,0.0000470151,0.0003894703,0.0003759569,0.005216848,0.9710693,0.00014331487,0.00026420093,0.01172147],"study_design_scores_gemma":[0.00006301646,0.0030498644,0.01687695,0.000032636402,0.00011281546,0.00017083692,0.00025787094,0.0064662932,0.97203696,0.000085525855,0.00080116215,0.000046076795],"about_ca_topic_score_codex":0.00059408374,"about_ca_topic_score_gemma":0.0015753335,"teacher_disagreement_score":0.0055098985,"about_ca_system_score_codex":0.00026150153,"about_ca_system_score_gemma":0.0002513607,"threshold_uncertainty_score":0.018432498},"labels":[],"label_agreement":null},{"id":"W2146992540","doi":"10.1007/s11664-007-0289-z","title":"Influence of Ta-based Diffusion Barriers on the Microstructure of Copper Thin Films","year":2007,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Copper Interconnects and Reliability","field":"Materials Science","cited_by":10,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of British Columbia","funders":"Deutsche Forschungsgemeinschaft; Deutscher Akademischer Austauschdienst","keywords":"Microstructure; Copper; Materials science; Electroplating; Diffusion barrier; Recrystallization (geology); Thin film; Copper interconnect; Interconnection; Diffusion; Layer (electronics); Physical vapor deposition; Barrier layer; Metallurgy; Composite material; Nanotechnology","score_opus":0.005065075584577547,"score_gpt":0.23876065449638426,"score_spread":0.2336955789118067,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2146992540","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9981982,0.00063392683,0.00035396314,0.00003909268,0.000019798137,0.0000038076419,0.00006154859,0.000017623997,0.00067210326],"genre_scores_gemma":[0.99897265,0.0003165045,0.00030494365,0.000009798202,0.0000054750367,0.0000046925475,0.000043122203,0.000014386458,0.00032838807],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9999249,0.000009253716,0.000004615362,0.000016234304,0.000019538338,0.00002542597],"domain_scores_gemma":[0.9996939,0.00011346589,0.00007341182,0.000025708214,0.00006945111,0.000024097097],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00012934019,0.000168846,0.00022130096,0.00014680876,0.0002994507,0.00055080664,0.00021966101,0.00021323819,0.0011182437],"category_scores_gemma":[0.0005908005,0.0002592304,0.000091263864,0.00017744287,0.0002387877,0.00033062804,0.0001332921,0.00033536117,0.00014010689],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00030058925,0.00001796965,0.00034368696,0.00007483628,0.00001132274,0.00008751284,0.00006584155,0.00039837253,0.9973678,0.0002922483,0.00009860854,0.0009412986],"study_design_scores_gemma":[0.000027997012,0.00015159439,0.003032041,0.000011351215,0.000026640619,0.000061976156,0.00007672289,0.002765113,0.9929061,0.00004731103,0.00088635297,0.000006788406],"about_ca_topic_score_codex":0.0024749942,"about_ca_topic_score_gemma":0.002948343,"teacher_disagreement_score":0.0024749942,"about_ca_system_score_codex":0.0004026848,"about_ca_system_score_gemma":0.00025401564,"threshold_uncertainty_score":0.0049212575},"labels":[],"label_agreement":null},{"id":"W2151789206","doi":"10.1007/s11664-012-1965-1","title":"Improvement of Bondability by Depressing the Inhomogeneous Distribution of Nanoparticles in a Sintering Bonding Process with Silver Nanoparticles","year":2012,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Nanomaterials and Printing Technologies","field":"Engineering","cited_by":30,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of Waterloo","funders":"","keywords":"Sintering; Materials science; Polyol; Nanoparticle; Aqueous solution; Composite material; Silver nanoparticle; Shear strength (soil); Chemical engineering; Metallurgy; Nanotechnology; Chemistry; Organic chemistry","score_opus":0.005277202072084653,"score_gpt":0.2142826312477094,"score_spread":0.20900542917562476,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2151789206","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.99448264,0.00021773801,0.00421625,0.00004373422,0.000023911936,0.000011401508,0.000011163296,0.00005625941,0.0009369083],"genre_scores_gemma":[0.9968862,0.00014292689,0.0017709661,0.000019348347,0.0000072370335,0.000010128353,0.000012870132,0.00002340516,0.0011268165],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.99990976,0.000011420975,0.000007241069,0.000024775734,0.000025343472,0.000021337719],"domain_scores_gemma":[0.99989736,0.000025107642,0.000030806652,0.000013574688,0.000018993822,0.000014245999],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00016939492,0.00030854304,0.0001845013,0.00014433499,0.00018091266,0.00022419308,0.00019084047,0.0003394359,0.0008410997],"category_scores_gemma":[0.00019781209,0.00029752983,0.00021121006,0.00011297403,0.00020902955,0.00026348262,0.00020202232,0.00041159513,0.00019171479],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00003808213,0.000012205721,0.000048285292,0.000019800622,0.0000029768805,0.000021314418,0.000018244371,0.00011099481,0.9987987,0.00009668803,0.000020544374,0.00081209105],"study_design_scores_gemma":[0.0000049240184,0.000045670706,0.00018267706,7.567433e-7,0.0000061062683,0.000014651362,0.0000051573948,0.00094314764,0.99864143,0.000012807108,0.00014123018,0.0000015052939],"about_ca_topic_score_codex":0.00023174606,"about_ca_topic_score_gemma":0.00055338885,"teacher_disagreement_score":0.0008410997,"about_ca_system_score_codex":0.00013119832,"about_ca_system_score_gemma":0.00014204938,"threshold_uncertainty_score":0.002813816},"labels":[],"label_agreement":null},{"id":"W2162022104","doi":"10.1007/s11664-008-0547-8","title":"Growth and Structural Characterization of Spherical Silicon Crystals Grown from Polysilicon","year":2008,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Thin-Film Transistor Technologies","field":"Engineering","cited_by":7,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of Waterloo","funders":"","keywords":"Recrystallization (geology); Materials science; Impurity; Silicon; SPHERES; Crystallinity; Crystalline silicon; Crystallography; Analytical Chemistry (journal); Composite material; Metallurgy; Chemistry","score_opus":0.005607287936448928,"score_gpt":0.18341736803005698,"score_spread":0.17781008009360805,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2162022104","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.99723023,0.00018031175,0.0010841457,0.000036993562,0.000009474248,0.000010284523,0.00032032956,0.00003009182,0.0010980396],"genre_scores_gemma":[0.9962962,0.00015847628,0.0016652731,0.000011573619,0.0000039977303,0.000012501542,0.000552235,0.000032954773,0.0012666145],"study_design_codex":"bench_or_experimental","study_design_gemma":"observational","domain_scores_codex":[0.9999045,0.0000046654245,0.00000469877,0.000020671732,0.00005088217,0.000014570827],"domain_scores_gemma":[0.9997826,0.000059889742,0.00004544784,0.000022276228,0.00006816032,0.000021655902],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.000097319265,0.00015341575,0.0001920075,0.00013682248,0.00024205438,0.00028418232,0.00021829784,0.00025431396,0.0006122905],"category_scores_gemma":[0.0003386837,0.00018446064,0.00012086924,0.00018171692,0.00022920602,0.00024299341,0.00013208493,0.0002344061,0.00021312213],"study_design_candidate":"observational","study_design_consensus":null,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.0000317432,0.0000046626587,0.00024557064,0.000019935098,0.0000019033806,0.00003144575,0.000027738392,0.00018642018,0.9989248,0.00006394458,0.000039959206,0.0004218166],"study_design_scores_gemma":[0.0000056470826,0.00006710424,0.003542736,0.0000015676717,0.0000032364267,0.0000423545,0.000037537175,0.0021605243,0.9937257,0.000014496775,0.00039556745,0.0000035245175],"about_ca_topic_score_codex":0.003319139,"about_ca_topic_score_gemma":0.004994468,"teacher_disagreement_score":0.003319139,"about_ca_system_score_codex":0.00044563794,"about_ca_system_score_gemma":0.00038127974,"threshold_uncertainty_score":0.0065996647},"labels":[],"label_agreement":null},{"id":"W2213941067","doi":"10.1007/s11664-015-3853-y","title":"Orientation Dependence of Etch Pit Density in (111) and (211) CdZnTe Everson Etch","year":2015,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Advanced Semiconductor Detectors and Materials","field":"Engineering","cited_by":17,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Redlen Technologies (Canada)","funders":"","keywords":"Misorientation; Etch pit density; Wafer; Etching (microfabrication); Cadmium telluride photovoltaics; Materials science; Dislocation; Crystallography; Orientation (vector space); Isotropic etching; Chemistry; Optoelectronics; Analytical Chemistry (journal); Geometry; Composite material; Microstructure; Mathematics","score_opus":0.01244435440144583,"score_gpt":0.23992368464509162,"score_spread":0.22747933024364578,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2213941067","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9991309,0.000068686604,0.00018824267,0.000009164976,0.0000030456756,9.863995e-7,0.00006643621,0.000009091278,0.0005234244],"genre_scores_gemma":[0.99894077,0.00007282113,0.00022343446,0.000005409546,0.0000012039885,0.0000016706769,0.00009254828,0.000005174975,0.0006570781],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9999356,0.0000055360274,0.000003026451,0.000010424495,0.000027288994,0.000018144268],"domain_scores_gemma":[0.9997365,0.00010287697,0.00006775356,0.000013489144,0.000062602,0.000016701533],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00010152832,0.00007669646,0.000082574996,0.00010659737,0.00010866156,0.00023193285,0.00016790502,0.00012595009,0.0012842824],"category_scores_gemma":[0.00037153135,0.00012794521,0.00005093051,0.00012759445,0.00016668536,0.00013070622,0.00008875957,0.00013928568,0.00013841475],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00037971252,0.000026428517,0.0062876856,0.000043218624,0.000008566927,0.00013017916,0.00010580727,0.00092567876,0.98861384,0.00045594038,0.00017103,0.002851857],"study_design_scores_gemma":[0.000015492113,0.0001227933,0.042563815,0.000005220738,0.000016242875,0.0001510065,0.00020679645,0.0063683433,0.9497333,0.00004579585,0.0007628806,0.000008238571],"about_ca_topic_score_codex":0.0028404777,"about_ca_topic_score_gemma":0.0054943324,"teacher_disagreement_score":0.0028404777,"about_ca_system_score_codex":0.00026061345,"about_ca_system_score_gemma":0.0001319871,"threshold_uncertainty_score":0.005647838},"labels":[],"label_agreement":null},{"id":"W2461169865","doi":"10.1007/s11664-011-1846-z","title":"Thermoelectric Properties of TlGdQ2 (Q = Se, Te) and Tl9GdTe6","year":2011,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Advanced Thermoelectric Materials and Devices","field":"Materials Science","cited_by":32,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of Waterloo","funders":"","keywords":"Seebeck coefficient; Thermoelectric effect; Isostructural; Thermoelectric materials; Semiconductor; Electrical resistivity and conductivity; Materials science; Telluride; Ternary operation; Bismuth telluride; Condensed matter physics; Band gap; Figure of merit; Thermal conductivity; Chemistry; Optoelectronics; Crystallography; Thermodynamics; Crystal structure; Physics; Metallurgy; Composite material","score_opus":0.026279393528418116,"score_gpt":0.22628911418660547,"score_spread":0.20000972065818734,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2461169865","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.99854445,0.0002030608,0.0002923911,0.000033680517,0.000008416395,0.0000018514763,0.000091963804,0.000015361984,0.0008088451],"genre_scores_gemma":[0.9976125,0.000076989876,0.00023158907,0.000012944698,0.0000028571098,0.0000034392274,0.00016220543,0.000010937288,0.0018866084],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9999013,0.000012827841,0.000005511795,0.000019248864,0.000032483713,0.000028551203],"domain_scores_gemma":[0.99986887,0.000037916725,0.000018550669,0.0000151100185,0.00004219079,0.000017241673],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00020330114,0.0001490572,0.000188674,0.00020640554,0.00015668014,0.0002750388,0.000292608,0.00031151652,0.0025552376],"category_scores_gemma":[0.00038833995,0.00010455575,0.00014917948,0.00025386625,0.0002465453,0.00025343458,0.00027695234,0.00023001495,0.00040244783],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00073875673,0.000022417276,0.0012048371,0.00008871449,0.000014683198,0.00008871779,0.00010741572,0.00061403576,0.9945015,0.00044793807,0.00024272318,0.0019283958],"study_design_scores_gemma":[0.000035362893,0.00023914783,0.0043974314,0.00000856757,0.000020504021,0.00011954479,0.00009917163,0.0055399155,0.98763543,0.00007861104,0.0018131064,0.000013296239],"about_ca_topic_score_codex":0.0009716488,"about_ca_topic_score_gemma":0.0008618138,"teacher_disagreement_score":0.0025552376,"about_ca_system_score_codex":0.00021327559,"about_ca_system_score_gemma":0.00010515857,"threshold_uncertainty_score":0.0085481405},"labels":[],"label_agreement":null},{"id":"W2472744151","doi":"10.1007/s11664-013-2500-8","title":"Microwave Sintering of Bi2Te3- and PbTe-Based Alloys: Structure and Thermoelectric Properties","year":2013,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Advanced Thermoelectric Materials and Devices","field":"Materials Science","cited_by":16,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":true,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Polytechnique Montréal","funders":"Natural Sciences and Engineering Research Council of Canada","keywords":"Bismuth telluride; Materials science; Lead telluride; Sintering; Telluride; Thermoelectric effect; Thermoelectric materials; Grain size; Metallurgy; Composite material; Mineralogy; Doping; Optoelectronics; Chemistry; Thermal conductivity","score_opus":0.006669419241168614,"score_gpt":0.19970876425931303,"score_spread":0.1930393450181444,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2472744151","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9983979,0.0004312173,0.00021406262,0.000015730257,0.0000066262583,0.0000021530495,0.000056722947,0.000010310116,0.0008652269],"genre_scores_gemma":[0.9986816,0.00012811586,0.00018241424,0.0000059913627,0.000002306055,0.0000023353393,0.00009596726,0.000010070147,0.00089119247],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.99993527,0.0000074487198,0.0000042405113,0.000013639281,0.000023514885,0.000015857342],"domain_scores_gemma":[0.9999062,0.000028714909,0.00001923281,0.000011956465,0.000025675277,0.000008354379],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0001399021,0.00014177333,0.00023659578,0.00021975192,0.00024693392,0.00025615658,0.00019631739,0.00022286065,0.0019258877],"category_scores_gemma":[0.00023660324,0.00018417859,0.00012770157,0.00037471828,0.00021269298,0.00023015733,0.0001278523,0.00019233585,0.0002361741],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.0007185241,0.000021414762,0.0012789036,0.00009622019,0.000014176003,0.00006848046,0.00010795458,0.00043388354,0.99426454,0.0002875093,0.00012266816,0.0025857324],"study_design_scores_gemma":[0.00001780671,0.000108809196,0.007874531,0.000006317818,0.000012557977,0.00006103322,0.000090797985,0.001980251,0.9890511,0.00005056528,0.0007423459,0.000003785014],"about_ca_topic_score_codex":0.0010367824,"about_ca_topic_score_gemma":0.0028462398,"teacher_disagreement_score":0.0019258877,"about_ca_system_score_codex":0.0001949382,"about_ca_system_score_gemma":0.00016196209,"threshold_uncertainty_score":0.0064427257},"labels":[],"label_agreement":null},{"id":"W2508213031","doi":"10.1007/s11664-016-4892-8","title":"Effect of Silicon Carbide Nanoparticles on the Grain Boundary Segregation and Thermoelectric Properties of Bismuth Doped Mg2Si0.7Ge0.3","year":2016,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Advanced Thermoelectric Materials and Devices","field":"Materials Science","cited_by":21,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":true,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"McMaster University; University of Waterloo","funders":"AUTO21 Network of Centres of Excellence; Natural Sciences and Engineering Research Council of Canada","keywords":"Materials science; Bismuth; Seebeck coefficient; Grain boundary; Thermoelectric effect; Silicon carbide; Thermal conductivity; Analytical Chemistry (journal); Electrical resistivity and conductivity; Doping; Silicon; Thermoelectric materials; Nanoparticle; Metallurgy; Nanotechnology; Composite material; Microstructure; Chemistry; Optoelectronics; Thermodynamics","score_opus":0.007914874520958516,"score_gpt":0.2278121841060126,"score_spread":0.21989730958505407,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2508213031","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9990274,0.0002129409,0.00011009387,0.00002198241,0.000014210289,0.0000025474776,0.00005197794,0.000013690398,0.0005452322],"genre_scores_gemma":[0.9993772,0.00007863142,0.00012467898,0.00001526708,0.000002495193,0.0000031283098,0.00004362617,0.000009827563,0.00034518432],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9999299,0.000006900054,0.000006240258,0.000017106064,0.000019729463,0.00002010344],"domain_scores_gemma":[0.9998801,0.00003567256,0.00002276582,0.00000895998,0.000026643063,0.000025755904],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.000095165844,0.00016422241,0.00019741415,0.00014557732,0.00016831298,0.0002842785,0.0002011731,0.00025583245,0.0013852847],"category_scores_gemma":[0.00020506163,0.00016903157,0.00013439181,0.000107506305,0.00018994295,0.00018369258,0.00013377875,0.00022948746,0.0001993374],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.0007611603,0.000051213137,0.0002876812,0.000050619048,0.000015705386,0.000047073914,0.000033881402,0.00020348762,0.99696845,0.00010213195,0.00008423994,0.001394478],"study_design_scores_gemma":[0.000020877756,0.0001332816,0.0016546346,0.000003570081,0.0000129423815,0.000016044274,0.000019945934,0.0013460984,0.996523,0.000018082637,0.00024685686,0.0000046429695],"about_ca_topic_score_codex":0.0012569196,"about_ca_topic_score_gemma":0.0020388898,"teacher_disagreement_score":0.0013852847,"about_ca_system_score_codex":0.0002676438,"about_ca_system_score_gemma":0.00015801015,"threshold_uncertainty_score":0.0046342015},"labels":[],"label_agreement":null},{"id":"W2510029875","doi":"10.1007/s11664-016-4859-9","title":"First-Principles Study on the Structural, Electronic, Magnetic and Thermodynamic Properties of Full Heusler Alloys Co2VZ (Z = Al, Ga)","year":2016,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Heusler alloys: electronic and magnetic properties","field":"Materials Science","cited_by":44,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Institut National de la Recherche Scientifique","funders":"","keywords":"Debye model; Condensed matter physics; Magnetic moment; Materials science; Lattice constant; Thermodynamics; Thermal expansion; Density functional theory; Solid-state physics; Atom (system on chip); Electronic structure; Chemistry; Physics; Computational chemistry; Quantum mechanics","score_opus":0.018883236365563584,"score_gpt":0.2241105229139114,"score_spread":0.20522728654834782,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2510029875","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9400197,0.0016498951,0.023324342,0.0009112551,0.00012912591,0.00013489142,0.00034877702,0.00029070402,0.033191357],"genre_scores_gemma":[0.9881523,0.00040044024,0.006104049,0.00013816557,0.000029754232,0.00008112264,0.00019298872,0.00007189172,0.0048292363],"study_design_codex":"simulation_or_modeling","study_design_gemma":"simulation_or_modeling","domain_scores_codex":[0.999764,0.000049034166,0.000003848246,0.000013605587,0.00010491363,0.000064649714],"domain_scores_gemma":[0.99952626,0.00022021735,0.000026523578,0.00008095783,0.00010689665,0.000039095594],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00071798154,0.0004496518,0.001557459,0.0005749642,0.0012778522,0.000868323,0.0019248191,0.0011350634,0.003998324],"category_scores_gemma":[0.0006855038,0.0004560511,0.0008693554,0.0005235216,0.0011061281,0.0006970888,0.0005247016,0.0011233253,0.0003381375],"study_design_candidate":"simulation_or_modeling","study_design_consensus":"simulation_or_modeling","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.0007092888,0.00085215777,0.0033386482,0.0012577644,0.00023493817,0.0012852084,0.0006590324,0.7465207,0.048920013,0.16728124,0.006962512,0.021978544],"study_design_scores_gemma":[0.00006893284,0.000106802225,0.001876252,0.000022763332,0.000021843358,0.00007072653,0.00011780131,0.9850445,0.0037957726,0.007703355,0.0011497372,0.000021611204],"about_ca_topic_score_codex":0.0044228756,"about_ca_topic_score_gemma":0.007732062,"teacher_disagreement_score":0.0044228756,"about_ca_system_score_codex":0.0008236121,"about_ca_system_score_gemma":0.00094954675,"threshold_uncertainty_score":0.0133756995},"labels":[],"label_agreement":null},{"id":"W2516673327","doi":"10.1007/s11664-016-4868-8","title":"Hot Extruded Polycrystalline Mg2Si with Embedded XS2 Nano-particles (X: Mo, W)","year":2016,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Advanced Thermoelectric Materials and Devices","field":"Materials Science","cited_by":2,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":true,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Polytechnique Montréal","funders":"Natural Sciences and Engineering Research Council of Canada","keywords":"Materials science; Extrusion; Crystallite; Grain boundary; Thermoelectric effect; Microstructure; Analytical Chemistry (journal); Grain size; Nanoscopic scale; Thermoelectric materials; Metallurgy; Composite material; Thermal conductivity; Nanotechnology; Chemistry; Thermodynamics","score_opus":0.0066829065881463395,"score_gpt":0.2297080394929021,"score_spread":0.22302513290475579,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2516673327","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9983847,0.000118259915,0.0003031412,0.0000117881855,0.000012473126,0.0000050440985,0.00025802123,0.000031575837,0.0008750263],"genre_scores_gemma":[0.9977913,0.000054041124,0.0005708435,0.0000056346844,0.0000036304732,0.0000041150074,0.0002123718,0.000017368733,0.0013406895],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9999162,0.0000030189549,0.000006919333,0.000026070242,0.000029504345,0.000018251863],"domain_scores_gemma":[0.99992573,0.0000146772845,0.000023198412,0.0000127087715,0.000013387278,0.000010231369],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00008853867,0.00022750838,0.00017055293,0.00013314524,0.00016425388,0.00032506837,0.00026061694,0.00025420415,0.0023903206],"category_scores_gemma":[0.00012210436,0.00016368837,0.00011555404,0.00027397074,0.00018671186,0.0002489276,0.00012297886,0.00020532656,0.0003429557],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00022581681,0.000010869784,0.0004463468,0.000047912923,0.000009446589,0.00012274239,0.000037535698,0.00023291967,0.9980715,0.00009099145,0.000061026414,0.0006428951],"study_design_scores_gemma":[0.000016535952,0.00008738731,0.003729416,0.0000031803515,0.0000081543885,0.000033392076,0.000051634244,0.00075163,0.9944395,0.000018991464,0.0008566322,0.0000036762353],"about_ca_topic_score_codex":0.0014745663,"about_ca_topic_score_gemma":0.0034294866,"teacher_disagreement_score":0.0023903206,"about_ca_system_score_codex":0.00023448971,"about_ca_system_score_gemma":0.00014598209,"threshold_uncertainty_score":0.00799644},"labels":[],"label_agreement":null},{"id":"W2525232038","doi":"10.1007/s11664-016-4947-x","title":"Molybdenum-Loaded Anatase TiO2 Nanoparticles With Enhanced Optoelectronics Properties","year":2016,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"TiO2 Photocatalysis and Solar Cells","field":"Energy","cited_by":9,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Université du Québec à Montréal","funders":"","keywords":"Materials science; Band gap; Anatase; Diffuse reflectance infrared fourier transform; Dielectric spectroscopy; Nanoparticle; Spectroscopy; Analytical Chemistry (journal); Photocatalysis; Optoelectronics; Nanotechnology; Chemistry; Electrochemistry; Catalysis; Physical chemistry","score_opus":0.007931016760310645,"score_gpt":0.20246606416138963,"score_spread":0.194535047401079,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2525232038","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.99566036,0.00052526104,0.0017009153,0.000056613615,0.000037726393,0.000010514797,0.00007513931,0.00011060037,0.0018227443],"genre_scores_gemma":[0.99598724,0.00016968232,0.0012333118,0.00002941491,0.000009596924,0.000011901837,0.00009335673,0.00002963428,0.0024357613],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.999913,0.0000071319164,0.0000063371203,0.00002438828,0.00002380618,0.000025289639],"domain_scores_gemma":[0.9999238,0.000013288711,0.000020080612,0.000010320233,0.00001962686,0.000012880425],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00012347166,0.00038844958,0.00022672559,0.00018207575,0.00014560173,0.00046440025,0.0003365162,0.000562203,0.0009111358],"category_scores_gemma":[0.00019499917,0.00024203223,0.00019343178,0.00017129659,0.00015570641,0.00036933515,0.00017386829,0.00028106637,0.0002785696],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00007284497,0.000015481466,0.000030352923,0.000020863448,0.0000031681388,0.000026161988,0.000007723857,0.00007842562,0.99896276,0.00005447694,0.00004095498,0.0006866244],"study_design_scores_gemma":[0.000015579615,0.00009765847,0.0006085022,0.0000015348619,0.00000936036,0.000040979037,0.0000075492585,0.0013724164,0.9973053,0.000017033068,0.00051978236,0.0000042329816],"about_ca_topic_score_codex":0.0006387855,"about_ca_topic_score_gemma":0.00115795,"teacher_disagreement_score":0.0009111358,"about_ca_system_score_codex":0.0003469128,"about_ca_system_score_gemma":0.000118082804,"threshold_uncertainty_score":0.0030480623},"labels":[],"label_agreement":null},{"id":"W2568653059","doi":"10.1007/s11664-016-5181-2","title":"Effect of Ag, Ni and Bi Additions on Solderability of Lead-Free Solders","year":2017,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Electronic Packaging and Soldering Technologies","field":"Engineering","cited_by":19,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":true,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"McGill University","funders":"Mitacs","keywords":"Solderability; Wetting; Supercooling; Soldering; Materials science; Alloy; Metallurgy; Melting temperature; Composite material; Thermodynamics","score_opus":0.007823564524767448,"score_gpt":0.24656780779420678,"score_spread":0.23874424326943933,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2568653059","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.99715436,0.0008810087,0.00034447727,0.00004170261,0.00008674562,0.000016254653,0.00013746259,0.00004971088,0.0012883544],"genre_scores_gemma":[0.99728703,0.00043337705,0.0005565088,0.000032034706,0.000016329395,0.000010125064,0.00009873408,0.000024348927,0.001541484],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9995116,0.00009563717,0.00007593592,0.00009134548,0.00012509237,0.00010041758],"domain_scores_gemma":[0.9989968,0.00040337254,0.000107730666,0.00008886158,0.00027137055,0.00013183839],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0004164266,0.0005742178,0.00040517884,0.00039304091,0.00032828524,0.0005647514,0.0005145057,0.000469415,0.003508423],"category_scores_gemma":[0.0015615952,0.00038067665,0.00020496742,0.0005103258,0.00040796533,0.00061961246,0.00026600066,0.0005138291,0.00051815057],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.0056871446,0.00026244938,0.0010279474,0.0004643753,0.00006320627,0.00031914283,0.00037000602,0.0012681842,0.98197097,0.00022699285,0.0002260346,0.008113541],"study_design_scores_gemma":[0.000024740859,0.00056598725,0.0014786149,0.000011225447,0.000049750834,0.000029376124,0.00007901725,0.00086002203,0.99614537,0.00002556566,0.00071854074,0.000011847292],"about_ca_topic_score_codex":0.0026030082,"about_ca_topic_score_gemma":0.0044337716,"teacher_disagreement_score":0.003508423,"about_ca_system_score_codex":0.0002656988,"about_ca_system_score_gemma":0.00034163834,"threshold_uncertainty_score":0.01173681},"labels":[],"label_agreement":null},{"id":"W2594719958","doi":"10.1007/s11664-017-5395-y","title":"Atmospheric Corrosion Behavior of Tin Under an Alternating Current Electric Field","year":2017,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Corrosion Behavior and Inhibition","field":"Materials Science","cited_by":6,"is_retracted":false,"has_abstract":false,"route_ca_aff":false,"route_ca_fund":true,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"","funders":"China Postdoctoral Science Foundation; National Natural Science Foundation of China; Canadian Association for the Study of the Liver","keywords":"Tin; Polarization (electrochemistry); Corrosion; Square wave; Electric field; Materials science; Overheating (electricity); Metallurgy; Composite material; Chemistry; Voltage; Electrical engineering; Physics","score_opus":0.023533694858330463,"score_gpt":0.3270401948270675,"score_spread":0.303506499968737,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2594719958","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.99723685,0.00026714226,0.00039815274,0.000030402573,0.000027750844,0.000005024854,0.00011666463,0.000022166256,0.0018957445],"genre_scores_gemma":[0.9981346,0.00014268995,0.00026455763,0.0000110254105,0.000013130337,0.0000014477425,0.0001483663,0.000004121514,0.0012800616],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9998758,0.000017253504,0.0000062969625,0.000024833556,0.000047461144,0.00002833067],"domain_scores_gemma":[0.9998091,0.00003940315,0.000024026416,0.00001799547,0.000088567096,0.000020902364],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00017061361,0.00020155073,0.00014994974,0.00018135548,0.00019825016,0.00022373677,0.00028898916,0.0003029142,0.0016760422],"category_scores_gemma":[0.0003700051,0.00007611176,0.00018061724,0.00016020176,0.00020085972,0.00022314898,0.000104472725,0.0003042911,0.00019185907],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.0014205868,0.00009572829,0.0059609353,0.000102399266,0.0000239965,0.00036931332,0.00013635974,0.0006304212,0.982811,0.00024193898,0.00037593694,0.0078314375],"study_design_scores_gemma":[0.000034107998,0.0017332932,0.04028983,0.0000132567575,0.00004493891,0.00035677868,0.00021280511,0.007210782,0.94692343,0.0001268677,0.0030384115,0.000015504249],"about_ca_topic_score_codex":0.0034631207,"about_ca_topic_score_gemma":0.0024275628,"teacher_disagreement_score":0.0034631207,"about_ca_system_score_codex":0.00019696986,"about_ca_system_score_gemma":0.00014641565,"threshold_uncertainty_score":0.006885946},"labels":[],"label_agreement":null},{"id":"W2746882327","doi":"10.1007/s11664-017-5734-z","title":"Graphene-Decorated Nanocomposites for Printable Electrodes in Thin Wafer Devices","year":2017,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Nanomaterials and Printing Technologies","field":"Engineering","cited_by":5,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of Waterloo","funders":"","keywords":"Materials science; Nanocomposite; Graphene; Wafer; Thermogravimetric analysis; Composite material; Differential scanning calorimetry; Scanning electron microscope; Nanotechnology; Chemical engineering","score_opus":0.01038675727819401,"score_gpt":0.24596593075559073,"score_spread":0.2355791734773967,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2746882327","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9621495,0.0038502936,0.017080043,0.00042947882,0.00046187968,0.000057458914,0.0005333794,0.00088566245,0.014552344],"genre_scores_gemma":[0.9847696,0.00080957846,0.008779456,0.00007465968,0.000025656778,0.00002341293,0.00015036517,0.00007282072,0.005294442],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9998777,0.000011850156,0.0000067643573,0.000028537626,0.00005062959,0.00002445426],"domain_scores_gemma":[0.9999144,0.00002480358,0.000015452533,0.00001396819,0.000016683269,0.000014667633],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.000108994354,0.00032332703,0.0001896326,0.0003332473,0.00017856987,0.0005713818,0.00046537252,0.0006059411,0.0018856075],"category_scores_gemma":[0.000229545,0.00024277435,0.00021904132,0.00018710803,0.00015972952,0.0004892915,0.00029537643,0.0005230029,0.0005837904],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.000033857443,0.000026612039,0.000048366215,0.00008188061,0.000009857213,0.00010282086,0.000020939347,0.0003611667,0.99497014,0.0003489094,0.00030018252,0.003695322],"study_design_scores_gemma":[0.0000035407907,0.0000419012,0.00026913264,0.000004693077,0.000007558536,0.00003501694,0.0000131510915,0.0017427736,0.99638677,0.0000673455,0.0014226057,0.000005406331],"about_ca_topic_score_codex":0.00017541744,"about_ca_topic_score_gemma":0.00086213247,"teacher_disagreement_score":0.0018856075,"about_ca_system_score_codex":0.00024171144,"about_ca_system_score_gemma":0.00007436586,"threshold_uncertainty_score":0.0063079596},"labels":[],"label_agreement":null},{"id":"W2752686933","doi":"10.1007/s11664-017-5755-7","title":"Structural and Thermoelectric Properties of Bi85Sb15 Prepared by Non-equal Channel Angular Extrusion","year":2017,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Advanced Thermoelectric Materials and Devices","field":"Materials Science","cited_by":9,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of Ontario Institute of Technology","funders":"Japan International Cooperation Agency","keywords":"Equal channel angular extrusion; Materials science; Thermoelectric effect; Extrusion; Microstructure; Seebeck coefficient; Severe plastic deformation; Grain size; Crystallite; Thermal conductivity; Phonon scattering; Composite material; Grain boundary; Thermoelectric materials; Metallurgy; Analytical Chemistry (journal); Chemistry; Thermodynamics","score_opus":0.011710396575140851,"score_gpt":0.24500349468335852,"score_spread":0.23329309810821766,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2752686933","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9984124,0.00021943159,0.00022314531,0.000014626714,0.000008089256,0.0000014384581,0.00010249566,0.000014494339,0.0010039873],"genre_scores_gemma":[0.9980369,0.00007134592,0.0003241766,0.000008562143,0.000001354361,0.0000029084147,0.00025093465,0.0000113493925,0.0012925733],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9999237,0.000006932198,0.0000047244503,0.000016471706,0.000027715123,0.000020296206],"domain_scores_gemma":[0.99993896,0.00000995772,0.0000145645645,0.000007195008,0.000019582545,0.000009808072],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00014112215,0.00018236278,0.00018199766,0.0003047568,0.00020653292,0.00025498308,0.00027561316,0.00025424946,0.0023841383],"category_scores_gemma":[0.0001595108,0.00015448543,0.00012970317,0.0003727409,0.00021255676,0.00021350366,0.00015973242,0.00018359208,0.0004244632],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.0005454883,0.000030971434,0.00091304374,0.00007702664,0.000011964774,0.000051905,0.000077136836,0.0004571353,0.99444145,0.0004957774,0.00019053428,0.0027076132],"study_design_scores_gemma":[0.000018778355,0.00023136627,0.007689223,0.000010365824,0.000024107516,0.00004970791,0.00007904761,0.0024275635,0.98785514,0.00006185235,0.0015407446,0.000012141759],"about_ca_topic_score_codex":0.0010469401,"about_ca_topic_score_gemma":0.002034414,"teacher_disagreement_score":0.0023841383,"about_ca_system_score_codex":0.0001676887,"about_ca_system_score_gemma":0.00017167104,"threshold_uncertainty_score":0.0079756975},"labels":[],"label_agreement":null},{"id":"W2754012463","doi":"10.1007/s11664-017-5780-6","title":"Films of Transition Metal Complexes Including Ionic Liquids: Dramatic Effects of Processing Parameters and Substrate on the Film Morphology","year":2017,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Organic Light-Emitting Diodes Research","field":"Engineering","cited_by":1,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":true,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Polytechnique Montréal","funders":"Natural Sciences and Engineering Research Council of Canada","keywords":"Hexafluorophosphate; Ionic liquid; Polystyrene sulfonate; Indium tin oxide; Materials science; PEDOT:PSS; Tetrafluoroborate; Trifluoromethanesulfonate; Transition metal; Iridium; Substrate (aquarium); Chemical engineering; Thin film; Polymer chemistry; Inorganic chemistry; Chemistry; Nanotechnology; Organic chemistry; Layer (electronics)","score_opus":0.01825048251676989,"score_gpt":0.2659481189785579,"score_spread":0.24769763646178802,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2754012463","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.995659,0.0009712935,0.0011197114,0.000071112634,0.000023160039,0.000010521764,0.00016210577,0.00007264582,0.0019104539],"genre_scores_gemma":[0.9957488,0.0006952026,0.0013523138,0.00004287361,0.000009310595,0.000010091647,0.00020228828,0.000054445256,0.001884621],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9999335,0.000006232251,0.0000067802234,0.00001419644,0.000018497065,0.000020871457],"domain_scores_gemma":[0.99990344,0.000029355666,0.000023205772,0.000009930718,0.000019050176,0.000014971317],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0000843205,0.00028479937,0.00018487427,0.000105783845,0.00013028203,0.00037299006,0.0002674558,0.00023693823,0.0014738152],"category_scores_gemma":[0.00024220443,0.00018339595,0.000113610215,0.00015932489,0.00011346612,0.0003350916,0.00015139188,0.00033631286,0.00022548513],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00008470584,0.000007675365,0.000055800683,0.000026022217,0.0000030351807,0.000027017206,0.000010563615,0.000013688677,0.9991485,0.000022123028,0.00003819102,0.00056279404],"study_design_scores_gemma":[0.000004132053,0.000032376414,0.00023929641,0.0000021950173,0.000006799733,0.00003123561,0.000006419251,0.00012701654,0.99926513,0.0000035959868,0.0002806351,0.0000011311595],"about_ca_topic_score_codex":0.0005112043,"about_ca_topic_score_gemma":0.00085369137,"teacher_disagreement_score":0.0014738152,"about_ca_system_score_codex":0.00012289247,"about_ca_system_score_gemma":0.00009375609,"threshold_uncertainty_score":0.004930377},"labels":[],"label_agreement":null},{"id":"W2765580054","doi":"10.1007/s11664-017-5866-1","title":"The Effect of Varying Ultrafast Pulse Laser Energies on the Electrical Properties of Reduced Graphene Oxide Sheets in Solution","year":2017,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Graphene research and applications","field":"Materials Science","cited_by":4,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of Waterloo","funders":"","keywords":"Graphene; Materials science; Oxide; Sheet resistance; Laser; Optoelectronics; Ultrashort pulse; Graphene oxide paper; Irradiation; Nanotechnology; Optics; Metallurgy","score_opus":0.01732909294903149,"score_gpt":0.2719379447461459,"score_spread":0.2546088517971144,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2765580054","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9986436,0.00022580322,0.0004600125,0.000044388293,0.000011870289,0.0000037534921,0.00005200883,0.0000135122555,0.00054502685],"genre_scores_gemma":[0.9985569,0.00020501934,0.00048604846,0.000025343745,0.000004527977,0.000005721105,0.00006605548,0.000008652397,0.00064175896],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9998797,0.000019600853,0.0000073577407,0.000023283605,0.0000348329,0.00003517534],"domain_scores_gemma":[0.9995876,0.0002842044,0.00004631291,0.000024598008,0.00003886794,0.000018414625],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00021056723,0.00018789737,0.00013242378,0.00010758136,0.00019285774,0.00031141553,0.00021065638,0.00031633495,0.0018781162],"category_scores_gemma":[0.000591899,0.00016080015,0.00014050062,0.00014329934,0.00034784203,0.00042291326,0.00012298203,0.00058826915,0.00017022197],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00037491386,0.000035324796,0.00018086287,0.00004008711,0.000012294077,0.000057138623,0.00007575285,0.0003926857,0.99654585,0.0001431824,0.00005543772,0.0020865398],"study_design_scores_gemma":[0.00001184809,0.000119686934,0.00090452505,0.000003100472,0.000006497273,0.000019978988,0.000031219373,0.00093576877,0.9977043,0.000040687464,0.0002160424,0.0000063076445],"about_ca_topic_score_codex":0.0005921913,"about_ca_topic_score_gemma":0.000692995,"teacher_disagreement_score":0.0018781162,"about_ca_system_score_codex":0.00024729912,"about_ca_system_score_gemma":0.00016437782,"threshold_uncertainty_score":0.0062829256},"labels":[],"label_agreement":null},{"id":"W2773706332","doi":"10.1007/s11664-017-6011-x","title":"Study of Solid-State Diffusion of Bi in Polycrystalline Sn Using Electron Probe Microanalysis","year":2017,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Electronic Packaging and Soldering Technologies","field":"Engineering","cited_by":28,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":true,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of Toronto","funders":"University of Toronto; Ohio State University","keywords":"Microstructure; Crystallite; Analytical Chemistry (journal); Microanalysis; Electron microprobe; Materials science; Diffusion; Tin; Arrhenius equation; Bismuth; Atomic diffusion; Electron probe microanalysis; Thermal diffusivity; Lattice diffusion coefficient; Effective diffusion coefficient; Chemistry; Metallurgy; Activation energy; Crystallography; Thermodynamics; Physical chemistry; Chromatography","score_opus":0.015797614973927825,"score_gpt":0.2819901205645798,"score_spread":0.26619250559065194,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2773706332","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.99710864,0.00034527224,0.0011923017,0.00004389656,0.000009221134,0.0000050565773,0.00010172382,0.000024710096,0.0011691531],"genre_scores_gemma":[0.9976271,0.00013935713,0.0009954734,0.0000076080782,0.0000032459586,0.00000505531,0.00006481407,0.000005992295,0.0011514988],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9999392,0.0000054899383,0.000002502167,0.00001944202,0.000025258078,0.000008122623],"domain_scores_gemma":[0.99990976,0.000036540918,0.000012076237,0.000008580141,0.000026699203,0.0000064207034],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00009502882,0.00017268614,0.00017702747,0.0002113696,0.00028397646,0.00036369116,0.00028953163,0.00027548705,0.0010239322],"category_scores_gemma":[0.00022835161,0.00017574693,0.00009187896,0.00024946834,0.00022100259,0.0004811383,0.0001567414,0.00027358704,0.00015876771],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00013831073,0.000016756687,0.00079186703,0.000038197722,0.000006899397,0.000067042405,0.00009121219,0.00014615785,0.99635845,0.00027173266,0.000060479055,0.0020130062],"study_design_scores_gemma":[0.000012713931,0.00013882175,0.010417665,0.000006100036,0.000013684566,0.00017070759,0.00016678401,0.008809989,0.978864,0.00009503927,0.0012955607,0.00000893132],"about_ca_topic_score_codex":0.0022113242,"about_ca_topic_score_gemma":0.0029810285,"teacher_disagreement_score":0.0022113242,"about_ca_system_score_codex":0.0003178274,"about_ca_system_score_gemma":0.00015891145,"threshold_uncertainty_score":0.0043969154},"labels":[],"label_agreement":null},{"id":"W2788672754","doi":"10.1007/s11664-018-6152-6","title":"Mechanical Stress in InP Structures Etched in an Inductively Coupled Plasma Reactor with Ar/Cl2/CH4 Plasma Chemistry","year":2018,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Semiconductor materials and devices","field":"Engineering","cited_by":2,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"McMaster University","funders":"Junta de Castilla y León","keywords":"Inductively coupled plasma; Chemistry; Ultimate tensile strength; Luminescence; Plasma; Plasma etching; Deformation (meteorology); Etching (microfabrication); Stress (linguistics); Analytical Chemistry (journal); Composite material; Materials science; Optoelectronics","score_opus":0.010251159574922102,"score_gpt":0.23240678640772816,"score_spread":0.22215562683280607,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2788672754","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9992168,0.000050317227,0.00015621532,0.000027090418,0.000009562287,0.000002511393,0.0000669684,0.000009560564,0.00046103544],"genre_scores_gemma":[0.9992893,0.000026198482,0.00010836334,0.000007214566,0.0000031132229,0.000003834303,0.000056851717,0.0000039401652,0.0005011131],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.99987566,0.000009411696,0.000003920256,0.000029519924,0.000045278884,0.000036136018],"domain_scores_gemma":[0.99982303,0.000045923716,0.000047649934,0.000015833983,0.000039443326,0.000028163402],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00012450998,0.0001984353,0.00020217203,0.00014418382,0.00033991615,0.00030857188,0.00038186993,0.0003757306,0.002332103],"category_scores_gemma":[0.00031926355,0.00020565513,0.00011944859,0.00018548661,0.00044815452,0.00027787648,0.00016507803,0.0003282211,0.00023522934],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.0004214463,0.00004363908,0.0010986862,0.00004144625,0.000015387077,0.00024997958,0.00015642338,0.00073558866,0.9955041,0.00017061894,0.00015336774,0.0014093014],"study_design_scores_gemma":[0.000081025,0.0010687185,0.051487982,0.000011929018,0.00003294298,0.00017213445,0.0004588814,0.010855474,0.9346927,0.00021152636,0.00090196216,0.000024712524],"about_ca_topic_score_codex":0.0012449927,"about_ca_topic_score_gemma":0.0018251921,"teacher_disagreement_score":0.002332103,"about_ca_system_score_codex":0.00035123812,"about_ca_system_score_gemma":0.0001939219,"threshold_uncertainty_score":0.007801652},"labels":[],"label_agreement":null},{"id":"W2795328348","doi":"10.1007/s11664-018-6253-2","title":"Evolution of the Thermal Conductivity of Sintered Silver Joints with their Porosity Predicted by the Finite Element Analysis of Real 3D Microstructures","year":2018,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Aluminum Alloys Composites Properties","field":"Engineering","cited_by":16,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"École de Technologie Supérieure","funders":"","keywords":"Materials science; Thermal conductivity; Porosity; Soldering; Sintering; Composite material; Microstructure; Finite element method; Electronic packaging; Thermal; Porous medium; Electrical resistivity and conductivity; Thermodynamics","score_opus":0.005513079544818025,"score_gpt":0.1897786291987304,"score_spread":0.18426554965391237,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2795328348","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9958093,0.00004303939,0.003367231,0.000010963719,0.000002670711,0.0000016160001,0.000044490935,0.0000779168,0.00064276764],"genre_scores_gemma":[0.99920183,0.000011088621,0.00064727396,0.0000010266615,2.8270912e-7,0.0000011785019,0.000017245658,0.0000056782133,0.0001144471],"study_design_codex":"bench_or_experimental","study_design_gemma":"simulation_or_modeling","domain_scores_codex":[0.9999622,0.000004194403,0.0000022988302,0.000010222983,0.000013887963,0.000007156182],"domain_scores_gemma":[0.9998104,0.000098576755,0.000029717581,0.000020700423,0.00003256624,0.000008105141],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00010572969,0.00011070963,0.00011467568,0.00019655861,0.000095794894,0.0003162499,0.00016886565,0.0002569038,0.0006611834],"category_scores_gemma":[0.00044018522,0.00019571779,0.00011968666,0.00013757957,0.00034029843,0.00017721257,0.00007285886,0.00017155845,0.000076473705],"study_design_candidate":"simulation_or_modeling","study_design_consensus":null,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00044556046,0.000079048834,0.010495366,0.000112786576,0.000031894084,0.00024644184,0.0002796212,0.33380696,0.6421247,0.0023462048,0.00017990117,0.009851405],"study_design_scores_gemma":[0.000014828306,0.00007091176,0.021218995,0.000007677139,0.000016512271,0.0000779793,0.00007270605,0.82829195,0.14954142,0.00037719923,0.00028592188,0.000023959772],"about_ca_topic_score_codex":0.0016920302,"about_ca_topic_score_gemma":0.0019204299,"teacher_disagreement_score":0.0016920302,"about_ca_system_score_codex":0.00028512595,"about_ca_system_score_gemma":0.00017343496,"threshold_uncertainty_score":0.0033644438},"labels":[],"label_agreement":null},{"id":"W2800347908","doi":"10.1007/s11664-018-6293-7","title":"Thermodynamic Optimization of the Ag–Bi–Cu–Ni Quaternary System: Part I, Binary Subsystems","year":2018,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Electronic Packaging and Soldering Technologies","field":"Engineering","cited_by":9,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"McGill University","funders":"Natural Science Foundation of Jiangsu Province; National Natural Science Foundation of China","keywords":"CALPHAD; Intermetallic; Phase diagram; Thermodynamics; Binary number; Gibbs free energy; Solid-state physics; Solid solution; Materials science; Phase (matter); Chemistry; Metallurgy; Physics; Mathematics; Condensed matter physics","score_opus":0.007375943713972743,"score_gpt":0.20530570703150505,"score_spread":0.19792976331753231,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2800347908","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.97959566,0.00052755704,0.0054766876,0.00018908505,0.000040191477,0.000032389016,0.00022645804,0.000081473045,0.013830481],"genre_scores_gemma":[0.99553347,0.00010199546,0.001748554,0.000014093941,0.000005617154,0.000026609692,0.00013926734,0.000029335384,0.002401079],"study_design_codex":"simulation_or_modeling","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9999229,0.000017199805,0.000003868866,0.000012755422,0.000024318197,0.00001901613],"domain_scores_gemma":[0.999925,0.000021207275,0.000007151141,0.000009297539,0.000026595495,0.000010703249],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00024660688,0.000212863,0.0005341274,0.00031702485,0.00081039383,0.00057709776,0.00044175246,0.000288324,0.005896472],"category_scores_gemma":[0.00036555604,0.00022625654,0.00020728972,0.00035459182,0.0004662403,0.0003849062,0.0003595203,0.00027222675,0.00054534344],"study_design_candidate":"bench_or_experimental","study_design_consensus":null,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.0020841402,0.0004483059,0.0044002915,0.0011455328,0.000121891404,0.0004188553,0.00039347328,0.5395916,0.35377526,0.057153746,0.0061051343,0.034361664],"study_design_scores_gemma":[0.000111874324,0.00087256246,0.0054981597,0.000023400138,0.0000621059,0.000081635495,0.0002860257,0.89550966,0.084922,0.0047834534,0.0078039113,0.000045253422],"about_ca_topic_score_codex":0.0042130407,"about_ca_topic_score_gemma":0.00873362,"teacher_disagreement_score":0.005896472,"about_ca_system_score_codex":0.0007000053,"about_ca_system_score_gemma":0.00078785437,"threshold_uncertainty_score":0.01972568},"labels":[],"label_agreement":null},{"id":"W2805916563","doi":"10.1007/s11664-018-6404-5","title":"From Transparent Conducting Material to Gas-Sensing Application of SnO2:Sb Thin Films","year":2018,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Gas Sensing Nanomaterials and Sensors","field":"Engineering","cited_by":25,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Institut National de la Recherche Scientifique","funders":"","keywords":"Thin film; Materials science; Doping; Crystallite; Nanocrystalline material; Analytical Chemistry (journal); Antimony; Scanning electron microscope; Tin oxide; Substrate (aquarium); Nanotechnology; Optoelectronics; Composite material; Chemistry; Metallurgy","score_opus":0.019601073202036683,"score_gpt":0.24628093204651338,"score_spread":0.2266798588444767,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2805916563","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9553418,0.0068608792,0.016424313,0.0007589403,0.0003463199,0.00003939244,0.00018960935,0.00063404546,0.019404644],"genre_scores_gemma":[0.984364,0.002788435,0.007035706,0.00013215326,0.00006332455,0.00001532685,0.00013147843,0.000064058964,0.005405535],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9999058,0.000011671171,0.000006118993,0.000019672885,0.000038681563,0.00001795377],"domain_scores_gemma":[0.9999285,0.000014277112,0.000009030941,0.000009492222,0.000022520355,0.000016208389],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00014271095,0.00042556316,0.00017912581,0.00031866235,0.00022084166,0.00063166174,0.00032414123,0.0005037702,0.0008824298],"category_scores_gemma":[0.0001464817,0.0002735453,0.00023876833,0.00016433519,0.00030182768,0.0004291414,0.00027122753,0.0002846018,0.00035397374],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.000039195995,0.000008580307,0.000049943086,0.000058313813,0.000003709539,0.000108067776,0.000025050842,0.00006251984,0.99706656,0.0004506841,0.00014869285,0.0019787312],"study_design_scores_gemma":[0.000004790786,0.000070243754,0.0004001054,0.00001023309,0.000014480627,0.00015381647,0.000042669115,0.0011633344,0.9954646,0.00023023938,0.0024400176,0.000005527576],"about_ca_topic_score_codex":0.00037258034,"about_ca_topic_score_gemma":0.0007860164,"teacher_disagreement_score":0.0008824298,"about_ca_system_score_codex":0.00015508186,"about_ca_system_score_gemma":0.00017700587,"threshold_uncertainty_score":0.0029519796},"labels":[],"label_agreement":null},{"id":"W2810749958","doi":"10.1007/s11664-018-6458-4","title":"Effect of Bi Additions on the Creep Behaviour of SAC Solder Alloys","year":2018,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Electronic Packaging and Soldering Technologies","field":"Engineering","cited_by":21,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":true,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"McGill University","funders":"Mitacs","keywords":"Creep; Materials science; Intermetallic; Soldering; Alloy; Scanning electron microscope; Metallurgy; Dislocation; Phase (matter); Diffusion creep; Composite material; Deformation (meteorology); Microstructure; Grain boundary","score_opus":0.006526883767466549,"score_gpt":0.23322145806854372,"score_spread":0.22669457430107717,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2810749958","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.99819106,0.0005587017,0.00010857612,0.000031264048,0.000050405455,0.000006010705,0.000110009576,0.000027588007,0.00091642526],"genre_scores_gemma":[0.9973736,0.00032043853,0.00027732758,0.000024692255,0.000013687237,0.0000063150314,0.00011101998,0.000021320653,0.0018516887],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.99966204,0.00006988802,0.000053608357,0.000053677628,0.000088425535,0.00007233799],"domain_scores_gemma":[0.99916315,0.00022775754,0.00010316685,0.000073369214,0.00033032004,0.00010232907],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00031093313,0.00033492263,0.00042313486,0.00044033045,0.00039898863,0.0005391039,0.00034663922,0.00038398887,0.00317779],"category_scores_gemma":[0.0011163056,0.0003119635,0.0001725283,0.00048415217,0.0003250687,0.0004523514,0.00024130617,0.00046189793,0.0005772672],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.006332571,0.00025433328,0.0018226894,0.00031102245,0.000046068584,0.00025116387,0.00033747885,0.0010015651,0.98272735,0.00017652503,0.0003114502,0.0064277602],"study_design_scores_gemma":[0.000020382986,0.0008548391,0.0054225815,0.000024889516,0.000060160615,0.000051249615,0.00014923375,0.0020002483,0.98953885,0.000024674917,0.0018346614,0.000018187447],"about_ca_topic_score_codex":0.003387682,"about_ca_topic_score_gemma":0.005824721,"teacher_disagreement_score":0.003387682,"about_ca_system_score_codex":0.00025795007,"about_ca_system_score_gemma":0.00035570847,"threshold_uncertainty_score":0.010630786},"labels":[],"label_agreement":null},{"id":"W2887700423","doi":"10.1007/s11664-018-6588-8","title":"Correction to: Fracture of Sn-3.5%Ag Solder Alloy Under Creep","year":2018,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Electronic Packaging and Soldering Technologies","field":"Engineering","cited_by":2,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Integrity Testing Laboratory (Canada)","funders":"","keywords":"Creep; Soldering; Alloy; Fracture (geology); Metallurgy; Materials science; Solid-state physics; Composite material; Physics; Condensed matter physics","score_opus":0.006897593295816186,"score_gpt":0.23422406261975628,"score_spread":0.2273264693239401,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2887700423","genre_codex":"editorial","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":null,"domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.004502309,0.0021598893,0.0049053226,0.065027,0.91372144,0.00014095366,0.0018369242,0.0016825977,0.006023491],"genre_scores_gemma":[0.25832063,0.014418689,0.03943537,0.089200534,0.31116956,0.0007041548,0.0028442056,0.004114287,0.2797927],"study_design_codex":"not_applicable","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9969312,0.00021940819,0.00072025787,0.0006052692,0.0011665346,0.00035722484],"domain_scores_gemma":[0.9909169,0.0024422249,0.0008558802,0.0010585082,0.0039320677,0.00079444115],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0013186779,0.0026003034,0.0036326093,0.0035412246,0.0025347183,0.002943242,0.005853173,0.016085552,0.041533],"category_scores_gemma":[0.017671378,0.0014414459,0.0022106038,0.0023663647,0.004080226,0.0023031456,0.0021047085,0.013190694,0.019664891],"study_design_candidate":"bench_or_experimental","study_design_consensus":null,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00026544943,0.000053544252,0.0006700696,0.0010216498,0.00010281825,0.035351127,0.00019792351,0.00061114045,0.0010714689,0.0027881053,0.91333765,0.044529162],"study_design_scores_gemma":[0.0002006832,0.00015958378,0.0044871024,0.0005699292,0.0001365547,0.06696254,0.00065661693,0.0030202505,0.005027704,0.0067596138,0.9117907,0.00022869308],"about_ca_topic_score_codex":0.008370394,"about_ca_topic_score_gemma":0.012287168,"teacher_disagreement_score":0.041533,"about_ca_system_score_codex":0.0030552896,"about_ca_system_score_gemma":0.0024736451,"threshold_uncertainty_score":0.1389417},"labels":[],"label_agreement":null},{"id":"W2889681236","doi":"10.1007/s11664-018-6621-y","title":"Solid-State Diffusion of Bi in Sn: Effects of β-Sn Grain Orientation","year":2018,"lang":"fr","type":"article","venue":"Journal of Electronic Materials","topic":"Electronic Packaging and Soldering Technologies","field":"Engineering","cited_by":14,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of Toronto","funders":"","keywords":"Materials science; Microstructure; Thermal diffusivity; Electron microprobe; Grain size; Tin; Soldering; Grain boundary; Anisotropy; Metallurgy; Annealing (glass); Bismuth; Thermodynamics","score_opus":0.004836421805871912,"score_gpt":0.2602506274340912,"score_spread":0.2554142056282193,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2889681236","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9982039,0.00024936645,0.00039627397,0.000054265027,0.000009728719,0.0000028645293,0.00009244103,0.00002009331,0.0009709566],"genre_scores_gemma":[0.9990969,0.00010117069,0.00014556192,0.000005453626,0.0000018756766,0.0000011962833,0.00008254335,0.000007217677,0.00055813155],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9999502,0.000005567765,0.0000027049084,0.000012458596,0.000012911044,0.000016230657],"domain_scores_gemma":[0.99985015,0.00005710496,0.000025849968,0.000007845596,0.00003917784,0.000019745978],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00014797965,0.00017738061,0.00019588882,0.00020396497,0.00028991833,0.00058815174,0.00030551577,0.00023375862,0.0016774869],"category_scores_gemma":[0.00041256324,0.00020760737,0.000122025565,0.00025708217,0.00026890475,0.0004502061,0.00015455263,0.00024117898,0.00026266245],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.0017064386,0.00014958877,0.0027170556,0.00013267247,0.000022565022,0.00013094611,0.00029904253,0.0039183144,0.98428863,0.0021535782,0.00039608197,0.004085156],"study_design_scores_gemma":[0.00007341836,0.0003577446,0.010211757,0.000026875161,0.00006822478,0.000105339386,0.00045300726,0.06318747,0.9229881,0.00043208303,0.0020457618,0.00005020879],"about_ca_topic_score_codex":0.018724373,"about_ca_topic_score_gemma":0.020482799,"teacher_disagreement_score":0.018724373,"about_ca_system_score_codex":0.00086710474,"about_ca_system_score_gemma":0.00047421464,"threshold_uncertainty_score":0.03723079},"labels":[],"label_agreement":null},{"id":"W2903838587","doi":"10.1007/s11664-018-06856-2","title":"A Phenomenological Model of Unconventional Heat Transport Induced by Phase Transition in Cu2−xSe","year":2018,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Advanced Thermoelectric Materials and Devices","field":"Materials Science","cited_by":4,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Polytechnique Montréal; Hôtel-Dieu de Montréal","funders":"","keywords":"Thermal conductivity; Thermal diffusivity; Thermal conduction; Thermodynamics; Heat transfer; Condensed matter physics; Materials science; Heat transfer coefficient; Seebeck coefficient; Temperature gradient; Thermoelectric effect; Laser flash analysis; Thermoelectric materials; Phase transition; Chemistry; Physics","score_opus":0.019447129523983912,"score_gpt":0.2885820550311172,"score_spread":0.2691349255071333,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2903838587","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.7400904,0.0025708207,0.117408216,0.005952347,0.0011660473,0.0002657661,0.00059365673,0.00066664594,0.13128607],"genre_scores_gemma":[0.98077637,0.00038908937,0.0035483695,0.00030965664,0.00011644406,0.00010725631,0.000093420815,0.00006910725,0.014590239],"study_design_codex":"theoretical_or_conceptual","study_design_gemma":"simulation_or_modeling","domain_scores_codex":[0.99985325,0.00003647006,0.000006106604,0.000019092795,0.000038690967,0.00004637862],"domain_scores_gemma":[0.9997603,0.00009088521,0.000024377721,0.000047934718,0.000037736216,0.000038659815],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00040713817,0.00055370835,0.0009506575,0.0007478936,0.001318637,0.0015215513,0.0017566719,0.0020761685,0.0058699665],"category_scores_gemma":[0.0008921998,0.0004908578,0.0007438864,0.0006041416,0.0022470409,0.002345606,0.0008355284,0.0010693973,0.0004336501],"study_design_candidate":"simulation_or_modeling","study_design_consensus":null,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00016372703,0.00014138942,0.00034961625,0.00015914238,0.00002365183,0.00056263624,0.00023274963,0.08684166,0.011567149,0.89608574,0.0021175642,0.0017549306],"study_design_scores_gemma":[0.00009110933,0.00005044306,0.00050157664,0.00002589148,0.000012520732,0.00018075434,0.000117278476,0.7811941,0.0016948178,0.21486637,0.0012267786,0.000038383034],"about_ca_topic_score_codex":0.0018962395,"about_ca_topic_score_gemma":0.0014927307,"teacher_disagreement_score":0.0058699665,"about_ca_system_score_codex":0.00094297575,"about_ca_system_score_gemma":0.00073173485,"threshold_uncertainty_score":0.019636929},"labels":[],"label_agreement":null},{"id":"W2914572130","doi":"10.1007/s11664-019-06984-3","title":"A Predictive Model for Thermal Conductivity of Nano-Ag Sintered Interconnect for a SiC Die","year":2019,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Aluminum Alloys Composites Properties","field":"Engineering","cited_by":22,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of Waterloo","funders":"National Key Research and Development Program of China; National Natural Science Foundation of China","keywords":"Die (integrated circuit); Materials science; Sintering; Thermal conductivity; Interconnection; Porosity; Composite material; Finite element method; Reliability (semiconductor); Electronic packaging; Nanotechnology; Computer science; Power (physics); Structural engineering; Thermodynamics; Engineering; Physics","score_opus":0.014636868916725856,"score_gpt":0.22381502399839906,"score_spread":0.2091781550816732,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2914572130","genre_codex":"methods","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":null,"domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.42975363,0.0014969512,0.5028351,0.0014036282,0.0002971743,0.00019095524,0.0012055157,0.0032769844,0.059540074],"genre_scores_gemma":[0.98988426,0.000139112,0.0039446787,0.00006732556,0.000018134968,0.00005716451,0.00011812612,0.00006107275,0.00571008],"study_design_codex":"simulation_or_modeling","study_design_gemma":"simulation_or_modeling","domain_scores_codex":[0.9998846,0.00002430558,0.0000037999769,0.000029527733,0.00003668546,0.000021064478],"domain_scores_gemma":[0.9996482,0.00016478737,0.000034134853,0.000037241927,0.00010221337,0.000013474941],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0002996792,0.0004889742,0.0005999543,0.00035091065,0.00042920664,0.0006559757,0.0013153133,0.0017316797,0.0030525692],"category_scores_gemma":[0.000989725,0.0004399413,0.00060068496,0.00034931453,0.0006398637,0.000809118,0.00028134976,0.00083115743,0.0005505904],"study_design_candidate":"simulation_or_modeling","study_design_consensus":"simulation_or_modeling","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.000019922063,0.000015376954,0.00015943451,0.000023765493,0.0000061972937,0.000033559045,0.000018201732,0.99519944,0.0016874837,0.0012662775,0.00029848106,0.0012718538],"study_design_scores_gemma":[0.0000014265606,0.0000033942213,0.00004516979,0.0000015401663,0.0000015504409,0.0000018892769,0.0000016757583,0.9995396,0.00021536706,0.00013936475,0.000047802627,0.0000011832075],"about_ca_topic_score_codex":0.017706493,"about_ca_topic_score_gemma":0.015763663,"teacher_disagreement_score":0.017706493,"about_ca_system_score_codex":0.0011702825,"about_ca_system_score_gemma":0.0008380597,"threshold_uncertainty_score":0.035206854},"labels":[],"label_agreement":null},{"id":"W2953683935","doi":"10.1007/s11664-019-07371-8","title":"Tailoring MWCNT Dispersion, Blend Morphology and EMI Shielding Properties by Sequential Mixing Strategy in Immiscible PS/PVDF Blends","year":2019,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Electromagnetic wave absorption materials","field":"Materials Science","cited_by":45,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":true,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of Calgary","funders":"Natural Sciences and Engineering Research Council of Canada","keywords":"Materials science; Nanocomposite; Composite material; Carbon nanotube; Scanning electron microscope; Dispersion (optics); Polymer blend; Phase (matter); Polystyrene; Dielectric; Polymer; Copolymer; Optics","score_opus":0.013280654875890087,"score_gpt":0.23774268562367779,"score_spread":0.2244620307477877,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2953683935","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9956031,0.00023610133,0.003095151,0.000032313215,0.000014913299,0.000016156431,0.000084519495,0.00005743071,0.00086027634],"genre_scores_gemma":[0.99531627,0.00026099538,0.0030433082,0.000017235865,0.000004235342,0.000022977067,0.00007147461,0.000027553819,0.0012358873],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9999248,0.0000058104592,0.00000904934,0.000027505192,0.000015416776,0.000017437622],"domain_scores_gemma":[0.9999205,0.000012267524,0.00003053519,0.00000877269,0.000014048458,0.000013840052],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00013130985,0.00040023908,0.0001383679,0.00016866578,0.00012309643,0.0002707116,0.00015251538,0.00022655359,0.0008257169],"category_scores_gemma":[0.00022890027,0.00016031438,0.00012716072,0.00022922046,0.00013388466,0.00042003233,0.00018531142,0.0003902051,0.0002776834],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00006434207,0.00001730845,0.00006815126,0.000019174686,0.000002652505,0.000018327768,0.000014838089,0.000080495956,0.99823135,0.00008040167,0.000015079734,0.0013879006],"study_design_scores_gemma":[0.0000037865084,0.00004622587,0.0003007087,0.0000016181227,0.0000046763207,0.000013627786,0.0000054533,0.00059385115,0.9986847,0.000012637798,0.00033076952,0.0000019814765],"about_ca_topic_score_codex":0.00031622368,"about_ca_topic_score_gemma":0.00070666854,"teacher_disagreement_score":0.0008257169,"about_ca_system_score_codex":0.00019997438,"about_ca_system_score_gemma":0.00011442696,"threshold_uncertainty_score":0.002762258},"labels":[],"label_agreement":null},{"id":"W2957715785","doi":"10.1007/s11664-019-07410-4","title":"Effect of Sb Additions on the Creep Behaviour of Bi Containing SAC Alloys","year":2019,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Metallurgical and Alloy Processes","field":"Materials Science","cited_by":3,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":true,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"McGill University","funders":"Mitacs","keywords":"Creep; Materials science; Isothermal process; Diffusion creep; Scanning electron microscope; Work hardening; Deformation (meteorology); Metallurgy; Composite material; Hardening (computing); Stress (linguistics); Microstructure; Thermodynamics; Grain boundary","score_opus":0.008795345289473979,"score_gpt":0.25367468058700066,"score_spread":0.24487933529752667,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2957715785","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9984864,0.000507389,0.00008471965,0.000028851804,0.00003376468,0.0000068100876,0.00010903031,0.000023318267,0.0007196279],"genre_scores_gemma":[0.99796593,0.00031674147,0.00029817573,0.000021237869,0.000011877969,0.000005411492,0.000114224684,0.000021971498,0.0012444302],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.99968064,0.00007690266,0.000051660056,0.00004854054,0.000077999954,0.00006431803],"domain_scores_gemma":[0.9991923,0.0002462354,0.000111543544,0.00006119658,0.00029431254,0.000094479794],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0003322069,0.00030595856,0.0004867532,0.0004715761,0.000436685,0.0006202509,0.00037649088,0.00040526633,0.0026644634],"category_scores_gemma":[0.0010317046,0.00031657724,0.00020997938,0.0004567265,0.000395089,0.00036455548,0.0002475409,0.0005126042,0.0004956644],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.004864627,0.00016232682,0.0012217185,0.00024197789,0.00004644642,0.00017433536,0.00019408179,0.0005019624,0.988689,0.00011211477,0.00017210165,0.003619308],"study_design_scores_gemma":[0.00001743506,0.00070277805,0.0032441474,0.000022526523,0.0000534537,0.000047788628,0.00009936003,0.0012095968,0.99335986,0.00001576425,0.0012149577,0.000012368804],"about_ca_topic_score_codex":0.0044700815,"about_ca_topic_score_gemma":0.0075182086,"teacher_disagreement_score":0.0044700815,"about_ca_system_score_codex":0.00030875314,"about_ca_system_score_gemma":0.00044279764,"threshold_uncertainty_score":0.008913577},"labels":[],"label_agreement":null},{"id":"W2965991721","doi":"10.1007/s11664-019-07478-y","title":"Effect of Microstructure and Magnetic Propertiesof Ba-Pb-Hexaferrite Particles on EMI Shielding Behaviorof Ba-Pb-Hexaferrite-Polyaniline-Wax Nanocomposites","year":2019,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Electromagnetic wave absorption materials","field":"Materials Science","cited_by":75,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of Calgary","funders":"Council of Scientific and Industrial Research, India","keywords":"Materials science; Microstructure; Nanocomposite; Composite material; Polyaniline; Coercivity; Magnetic nanoparticles; Electromagnetic shielding; Microwave; Nanoparticle; Nanotechnology; Condensed matter physics; Polymer","score_opus":0.004003646538490049,"score_gpt":0.2257473909951374,"score_spread":0.22174374445664735,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2965991721","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9989586,0.00023979791,0.0002976571,0.000012705383,0.000009547443,0.0000038531407,0.000022024922,0.00001505665,0.0004408967],"genre_scores_gemma":[0.99908984,0.000120132936,0.00030158387,0.000007725046,0.0000036866138,0.0000040183595,0.000025436011,0.0000088086435,0.00043871702],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9998665,0.000015110414,0.000009348901,0.00003058781,0.00003593561,0.000042663152],"domain_scores_gemma":[0.9997627,0.00006043498,0.00007297474,0.00001859512,0.000045499408,0.000039773266],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00020681767,0.00032149997,0.00017236419,0.00018319933,0.00019797192,0.00026760984,0.00015634777,0.00023749667,0.0013393079],"category_scores_gemma":[0.00030887825,0.0002893001,0.00014158177,0.0001515837,0.0002626334,0.00036331118,0.00014583518,0.00032818355,0.00017491887],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00017274344,0.00002114938,0.0001866965,0.00002912442,0.0000052471546,0.00003019938,0.000034385845,0.000104262355,0.99871624,0.000043788823,0.000013116454,0.0006430789],"study_design_scores_gemma":[0.000006371626,0.000100702884,0.0018564654,0.0000019928677,0.000011642384,0.000019097397,0.000016144375,0.00054666615,0.9972807,0.0000066204093,0.00015027498,0.000003259539],"about_ca_topic_score_codex":0.0008200079,"about_ca_topic_score_gemma":0.0019540566,"teacher_disagreement_score":0.0013393079,"about_ca_system_score_codex":0.00021804759,"about_ca_system_score_gemma":0.00012409904,"threshold_uncertainty_score":0.004480481},"labels":[],"label_agreement":null},{"id":"W2969749782","doi":"10.1007/s11664-019-07532-9","title":"Large-Area Die-Attachment Sintered by Organic-Free Ag Sintering Material at Low Temperature","year":2019,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Electronic Packaging and Soldering Technologies","field":"Engineering","cited_by":16,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of Waterloo","funders":"National Key Research and Development Program of China; National Natural Science Foundation of China","keywords":"Sintering; Materials science; Die (integrated circuit); Porosity; Composite material; Metallurgy; Cracking; Nanotechnology","score_opus":0.003708659736741373,"score_gpt":0.20038733264967384,"score_spread":0.19667867291293248,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2969749782","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9954391,0.00027029973,0.0015494123,0.00002222756,0.000050898176,0.000009400115,0.00012646917,0.00013583737,0.0023963817],"genre_scores_gemma":[0.99376935,0.0001613245,0.0019982946,0.000010125459,0.000008854327,0.0000077172035,0.00013587203,0.00002192046,0.003886558],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.99994445,0.0000016923268,0.0000022425527,0.000017005837,0.000023484465,0.000011125303],"domain_scores_gemma":[0.99994504,0.0000053407216,0.000011107595,0.000009607121,0.00002047216,0.000008405147],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.000063421954,0.00021074315,0.00018586744,0.00018535207,0.00020686067,0.00016356699,0.00021384005,0.0002074184,0.0019267107],"category_scores_gemma":[0.00006863231,0.00018109767,0.00011699529,0.00019393614,0.000104320214,0.00018393763,0.00014978826,0.00020230007,0.0005696994],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00004697402,0.000009707355,0.00036352337,0.00004082637,0.0000042372394,0.00008720131,0.000025340001,0.00018334105,0.99726844,0.000115548086,0.0001381212,0.0017167208],"study_design_scores_gemma":[0.000008677457,0.00013249934,0.0056922273,0.0000031350194,0.000012110005,0.0000869426,0.000034775134,0.0014224136,0.99096525,0.000024822915,0.0016131029,0.0000039922375],"about_ca_topic_score_codex":0.00034137492,"about_ca_topic_score_gemma":0.001574574,"teacher_disagreement_score":0.0019267107,"about_ca_system_score_codex":0.00013444373,"about_ca_system_score_gemma":0.00018821779,"threshold_uncertainty_score":0.006445527},"labels":[],"label_agreement":null},{"id":"W2970049327","doi":"10.1007/s11664-019-07558-z","title":"Single-Walled Carbon Nanotube Based Triboelectric Flexible Touch Sensors","year":2019,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Advanced Sensor and Energy Harvesting Materials","field":"Engineering","cited_by":11,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of Alberta","funders":"","keywords":"Triboelectric effect; Electronics; Carbon nanotube; Nanotechnology; Interface (matter); Materials science; Flexible electronics; Tactile sensor; Computer science; Electrical engineering; Engineering; Composite material; Artificial intelligence","score_opus":0.008009648454853944,"score_gpt":0.20296361979060157,"score_spread":0.19495397133574763,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2970049327","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.97455513,0.0020088977,0.013247622,0.00033472752,0.0003742764,0.00007671139,0.0004907806,0.00027860198,0.00863323],"genre_scores_gemma":[0.98401594,0.0005329634,0.009762697,0.000116916846,0.000035100285,0.000029835339,0.00014429582,0.000015799333,0.005346428],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.99976546,0.000021897242,0.0000123203,0.000055283726,0.00010872083,0.000036453574],"domain_scores_gemma":[0.99979466,0.000048809572,0.00003089472,0.000024329878,0.00006894855,0.000032325],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00012991532,0.000228952,0.00021747847,0.00046535433,0.00022227601,0.000460386,0.0004877739,0.00065435044,0.0017399556],"category_scores_gemma":[0.00035676785,0.00015151162,0.00014092206,0.00028874763,0.00021271063,0.0006213188,0.00027874706,0.00026617217,0.00042515568],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00008069065,0.000041375155,0.00026312406,0.000066608685,0.000010434177,0.00015523714,0.000021995986,0.00042256102,0.98822415,0.00037512885,0.00037100993,0.009967592],"study_design_scores_gemma":[0.0000083404575,0.00020821915,0.0018803115,0.000008769949,0.000012551702,0.00021537935,0.000032745116,0.011041366,0.9840082,0.00018058986,0.0023764004,0.000027132755],"about_ca_topic_score_codex":0.00015014561,"about_ca_topic_score_gemma":0.0006561799,"teacher_disagreement_score":0.0017399556,"about_ca_system_score_codex":0.0001727118,"about_ca_system_score_gemma":0.000091821144,"threshold_uncertainty_score":0.0058206916},"labels":[],"label_agreement":null},{"id":"W3035875795","doi":"10.1007/s11664-020-08242-3","title":"Flexible Ion-Gated Transistors Making Use of Poly-3-hexylthiophene (P3HT): Effect of the Molecular Weight on the Effectiveness of Gating and Device Performance","year":2020,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Organic Electronics and Photovoltaics","field":"Engineering","cited_by":7,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Polytechnique Montréal","funders":"","keywords":"Materials science; Gating; Transistor; Polyimide; Ion; Polymer; Ionic bonding; Ionic liquid; Optoelectronics; Thin-film transistor; Organic electronics; Organic semiconductor; Nanotechnology; Voltage; Layer (electronics); Chemistry; Organic chemistry; Composite material","score_opus":0.007876938641484178,"score_gpt":0.20292999136277795,"score_spread":0.19505305272129378,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W3035875795","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9983394,0.00017081664,0.001007297,0.000020734802,0.000015686373,0.0000044368917,0.00003958071,0.00003219519,0.0003698595],"genre_scores_gemma":[0.99844897,0.00014212515,0.00080685806,0.000013564671,0.0000039987913,0.0000034771633,0.000037959995,0.000011908598,0.0005311204],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.99993706,0.0000053119593,0.0000038510375,0.000014664733,0.000015615471,0.000023557215],"domain_scores_gemma":[0.99988973,0.00003561678,0.000023223742,0.000013315023,0.000011126976,0.000027049166],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00009478194,0.00022343894,0.00015453009,0.00008880545,0.00009724412,0.00032876286,0.00027072686,0.00022706046,0.0008917047],"category_scores_gemma":[0.00015745053,0.00011360675,0.00010877538,0.0001571068,0.00019373819,0.00034292677,0.00017207321,0.00023630542,0.00011630885],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00009034117,0.000015610825,0.00008923767,0.000011476657,0.0000030957924,0.0000402088,0.000011676837,0.00011068367,0.99853635,0.00006337313,0.000021266469,0.0010067805],"study_design_scores_gemma":[0.000011344259,0.00017452738,0.001177016,0.0000022088623,0.000010241766,0.00004491956,0.00000957381,0.0015996414,0.9967458,0.000030638264,0.0001894045,0.000004819108],"about_ca_topic_score_codex":0.00028326423,"about_ca_topic_score_gemma":0.0007921899,"teacher_disagreement_score":0.0008917047,"about_ca_system_score_codex":0.00009952785,"about_ca_system_score_gemma":0.00007515591,"threshold_uncertainty_score":0.0029830933},"labels":[],"label_agreement":null},{"id":"W3165743800","doi":"10.1007/s11664-021-08918-4","title":"Synthesis of NiCo2O4 Nanoneedles on rGO for Asymmetric Supercapacitors","year":2021,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Supercapacitor Materials and Fabrication","field":"Materials Science","cited_by":12,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Imperial Oil (Canada)","funders":"","keywords":"Supercapacitor; Graphene; Materials science; Nanocomposite; Capacitance; Oxide; Electrochemistry; Hydrothermal circulation; Chemical engineering; Hydrothermal synthesis; Nanotechnology; Composite material; Chemistry; Electrode; Metallurgy","score_opus":0.014585190224300881,"score_gpt":0.24686975041610784,"score_spread":0.23228456019180696,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W3165743800","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9838266,0.0010849532,0.007198154,0.000093308445,0.00009955221,0.00008362041,0.0002438596,0.00031657275,0.007053401],"genre_scores_gemma":[0.9905922,0.00028195156,0.0050984747,0.000037398866,0.000017032939,0.00005881973,0.00019168016,0.000045867386,0.0036766068],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.99988365,0.000008476513,0.000010798061,0.000029444833,0.000035623052,0.000031975633],"domain_scores_gemma":[0.999905,0.000014611955,0.00002270808,0.000013865201,0.000023846731,0.000019933661],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.000094439645,0.00031867088,0.00022333521,0.00039750873,0.00020656266,0.00019542224,0.00028424626,0.00031795376,0.0015385139],"category_scores_gemma":[0.00020968648,0.00017439078,0.0001454724,0.00017300966,0.000108536144,0.0003243137,0.00022458012,0.00022338932,0.0004203756],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.000041958858,0.000018004095,0.00005421239,0.000072623174,0.000003985211,0.00004877647,0.00001891351,0.0002706476,0.99621564,0.00017137222,0.00011646383,0.0029674226],"study_design_scores_gemma":[0.0000063490565,0.000078829944,0.0006427495,0.0000055437376,0.000006214236,0.000027183909,0.000013132736,0.00204821,0.99516404,0.00003899374,0.0019616364,0.0000071013897],"about_ca_topic_score_codex":0.00038521842,"about_ca_topic_score_gemma":0.0012067327,"teacher_disagreement_score":0.0015385139,"about_ca_system_score_codex":0.00027133746,"about_ca_system_score_gemma":0.00012843184,"threshold_uncertainty_score":0.005146861},"labels":[],"label_agreement":null},{"id":"W3210784899","doi":"10.1007/s11664-006-0315-6","title":"Foreword","year":2006,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"","field":"","cited_by":3,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of Toronto","funders":"","keywords":"Materials science; Philosophy","score_opus":0.0037826157599666465,"score_gpt":0.2241162159796708,"score_spread":0.22033360021970416,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W3210784899","genre_codex":"editorial","genre_gemma":"editorial","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"editorial","genre_consensus":"editorial","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.00059375376,0.011470169,0.0015756055,0.118607335,0.5434298,0.00025857848,0.0011993115,0.0006670064,0.32219848],"genre_scores_gemma":[0.0023436605,0.0031719874,0.000533197,0.040536404,0.04534464,0.00011184845,0.0005889783,0.00025808509,0.9071113],"study_design_codex":"not_applicable","study_design_gemma":"not_applicable","domain_scores_codex":[0.99910283,0.00007913267,0.000048297872,0.00012297483,0.0005336254,0.00011315789],"domain_scores_gemma":[0.9966037,0.00037707476,0.00013030753,0.0002321375,0.0020709052,0.0005858021],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0010983418,0.0008786107,0.000774272,0.0015602948,0.0023351237,0.003317264,0.0013152731,0.0040271115,0.24087077],"category_scores_gemma":[0.0056929523,0.00023890863,0.00068662246,0.0007108939,0.00059075374,0.0022864356,0.0019493047,0.0039541693,0.2350162],"study_design_candidate":"not_applicable","study_design_consensus":"not_applicable","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.000011469621,0.000009382611,0.00002599995,0.000046300713,0.00000130182,0.000025163466,0.0000072315024,0.0000068378795,0.00011720969,0.0013882156,0.97955453,0.018806346],"study_design_scores_gemma":[0.0000033738436,0.000009741651,0.00012734008,0.000055921624,0.0000024413055,0.000047377132,0.000016679125,0.000014951487,0.0001327168,0.0009006553,0.99868566,0.0000030035187],"about_ca_topic_score_codex":0.0026333318,"about_ca_topic_score_gemma":0.005227423,"teacher_disagreement_score":0.24087077,"about_ca_system_score_codex":0.0015035307,"about_ca_system_score_gemma":0.0022022433,"threshold_uncertainty_score":0},"labels":[],"label_agreement":null},{"id":"W4235996872","doi":"10.1007/s11664-010-1273-6","title":"A Cryo-XPS Study of Triammonium Citrate-KAuCl4-Na2SO3 Electroplating Solutions for Pb-Free Solder Packaging","year":2010,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Electronic Packaging and Soldering Technologies","field":"Engineering","cited_by":4,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":true,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of Alberta","funders":"Natural Sciences and Engineering Research Council of Canada","keywords":"X-ray photoelectron spectroscopy; Chemistry; Sodium sulfite; Sodium citrate; Sulfite; Inorganic chemistry; Chemical engineering; Cyanide; Sodium; Organic chemistry","score_opus":0.013901829811904293,"score_gpt":0.23834805861879355,"score_spread":0.22444622880688925,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W4235996872","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.98963785,0.0014143543,0.0057469606,0.00010952702,0.00006076617,0.00002101349,0.00016813556,0.000062983054,0.0027784102],"genre_scores_gemma":[0.99334335,0.00053582276,0.003476591,0.000065848544,0.000008110798,0.000012323399,0.00018590668,0.0000240197,0.002348058],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.99992514,0.00000816183,0.000004576259,0.000017259492,0.000029830344,0.000015071836],"domain_scores_gemma":[0.9999175,0.000019388312,0.00000977999,0.0000069097864,0.000039620372,0.00000689443],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00017910548,0.0002100609,0.00016505757,0.0001633385,0.00029153036,0.00024155085,0.00032538403,0.00040248313,0.0016303135],"category_scores_gemma":[0.00017325183,0.00017613327,0.00016662305,0.00017797358,0.00016844833,0.00029002808,0.00010980272,0.00030505736,0.00026460542],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.000060685576,0.000007827609,0.000087057575,0.000027530123,0.0000023755533,0.000030741725,0.000022720356,0.00002623325,0.9984535,0.00003929273,0.000045511035,0.00119651],"study_design_scores_gemma":[0.0000039401807,0.000108031294,0.0018672383,0.0000025925294,0.000006678259,0.000060900285,0.000037563223,0.00038717518,0.9968051,0.000020857971,0.00069701043,0.000002906019],"about_ca_topic_score_codex":0.00073524244,"about_ca_topic_score_gemma":0.0010898483,"teacher_disagreement_score":0.0016303135,"about_ca_system_score_codex":0.00015738553,"about_ca_system_score_gemma":0.00016207487,"threshold_uncertainty_score":0.005453944},"labels":[],"label_agreement":null},{"id":"W4242315864","doi":"10.1007/s11664-005-0150-1","title":"Foreword","year":2005,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"","field":"","cited_by":1,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"McGill University","funders":"","keywords":"Materials science","score_opus":0.006701250383440787,"score_gpt":0.25747024920943573,"score_spread":0.25076899882599496,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W4242315864","genre_codex":"editorial","genre_gemma":"editorial","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"editorial","genre_consensus":"editorial","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.0006011643,0.011444071,0.001597279,0.11789912,0.51883525,0.00026358603,0.001183891,0.0006776053,0.34749803],"genre_scores_gemma":[0.0021997625,0.0030144365,0.0005029012,0.036977634,0.039871644,0.00010143825,0.00054930896,0.00023421721,0.91654867],"study_design_codex":"not_applicable","study_design_gemma":"not_applicable","domain_scores_codex":[0.9990951,0.00007750076,0.00004662735,0.00011958364,0.0005499746,0.000111269],"domain_scores_gemma":[0.99669063,0.0003668445,0.00012517715,0.0002287556,0.002025844,0.00056277495],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0010847723,0.00085550034,0.0007592754,0.0015581822,0.0023247567,0.003352827,0.0013034535,0.0040716766,0.24415374],"category_scores_gemma":[0.005531489,0.00024050569,0.0006813984,0.0007163522,0.0005908374,0.0022838197,0.00191107,0.0039336393,0.23740694],"study_design_candidate":"not_applicable","study_design_consensus":"not_applicable","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.000010984818,0.0000091178745,0.000024218154,0.00004487817,0.0000012422151,0.000024400722,0.0000071163836,0.0000068926815,0.00012113663,0.0014390249,0.9796464,0.01866471],"study_design_scores_gemma":[0.0000032078465,0.000009349598,0.00012060244,0.00005315632,0.0000023238392,0.000043284916,0.000016345924,0.000014564832,0.00013416939,0.0008865811,0.9987136,0.0000028955474],"about_ca_topic_score_codex":0.0026569865,"about_ca_topic_score_gemma":0.0053749946,"teacher_disagreement_score":0.24415374,"about_ca_system_score_codex":0.0015185963,"about_ca_system_score_gemma":0.0021930775,"threshold_uncertainty_score":0},"labels":[],"label_agreement":null},{"id":"W4283464996","doi":"10.1007/s11664-022-09748-8","title":"Role of Deep Defects on the Transport Properties of Polycrystalline Thermoelectric Alloys and Composites","year":2022,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Advanced Thermoelectric Materials and Devices","field":"Materials Science","cited_by":1,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":true,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Polytechnique Montréal; Regroupement Québécois sur les Matériaux de Pointe","funders":"Natural Sciences and Engineering Research Council of Canada","keywords":"Crystallite; Materials science; Thermoelectric effect; Ternary operation; Grain boundary; Solid-state physics; Composite material; Extrusion; Seebeck coefficient; Thermoelectric materials; Perpendicular; Electrical resistivity and conductivity; Condensed matter physics; Grain size; Microstructure; Metallurgy; Thermodynamics; Geometry; Thermal conductivity; Electrical engineering","score_opus":0.00647869493447993,"score_gpt":0.19572671231824593,"score_spread":0.189248017383766,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W4283464996","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9977791,0.0005133131,0.0004312594,0.000029749435,0.000016622751,0.0000025923073,0.00005112229,0.00001738675,0.0011587159],"genre_scores_gemma":[0.9993789,0.000108275024,0.0001100184,0.000005121146,0.0000031696766,0.0000022882398,0.000036964077,0.0000129727905,0.000342197],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.99992883,0.0000082056595,0.0000039814163,0.000014179624,0.000023003468,0.0000218273],"domain_scores_gemma":[0.9995783,0.00020097627,0.000055126347,0.000041627787,0.00008015322,0.000043707914],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00014923925,0.00024286556,0.00023692625,0.00029170024,0.00028233675,0.00072365144,0.00025273697,0.00036081267,0.0016385027],"category_scores_gemma":[0.0005621725,0.00019065622,0.0000866048,0.00017184546,0.00040659192,0.00047826057,0.00025457863,0.00032377368,0.00018141446],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00085131923,0.00011109042,0.0041091056,0.00016987298,0.00003075584,0.00029087556,0.0001479498,0.0016989718,0.9846377,0.0021878213,0.00020944988,0.0055550747],"study_design_scores_gemma":[0.000043657896,0.00047029118,0.015447846,0.000048014845,0.00007908953,0.00037635097,0.00041278466,0.024048693,0.956002,0.00133216,0.0017046996,0.000034396802],"about_ca_topic_score_codex":0.00063600024,"about_ca_topic_score_gemma":0.0011085084,"teacher_disagreement_score":0.0016385027,"about_ca_system_score_codex":0.00019503673,"about_ca_system_score_gemma":0.00016655079,"threshold_uncertainty_score":0.0054813623},"labels":[],"label_agreement":null},{"id":"W4312204907","doi":"10.1007/s11664-022-10145-4","title":"Comparative Study of III-Nitride Nano-HEMTs on Different Substrates for Emerging High-Power Nanoelectronics and Millimetre Wave Applications","year":2022,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Ga2O3 and related materials","field":"Materials Science","cited_by":21,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Institut National de la Recherche Scientifique","funders":"Mission on Nano Science and Technology; Science and Engineering Research Board; Department of Science and Technology, Ministry of Science and Technology, India","keywords":"High-electron-mobility transistor; Materials science; Breakdown voltage; Optoelectronics; Gallium nitride; Silicon carbide; Sapphire; Transistor; Substrate (aquarium); Voltage; Electrical engineering; Nanotechnology; Metallurgy; Optics; Physics","score_opus":0.015402399592430095,"score_gpt":0.26784427668834093,"score_spread":0.2524418770959108,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W4312204907","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9969825,0.0005575765,0.00037925597,0.000019895426,0.000028692997,0.000005841662,0.00014093614,0.000015541174,0.0018697672],"genre_scores_gemma":[0.99686974,0.0002921252,0.0006590775,0.0000160033,0.000005854102,0.000007997863,0.00017416,0.000010950928,0.0019641698],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.99992883,0.0000053256817,0.0000038114326,0.000017689996,0.000028634506,0.000015760088],"domain_scores_gemma":[0.99989843,0.000022898364,0.0000151574,0.000011808063,0.000038644772,0.00001308439],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00009022583,0.00013882636,0.00019784813,0.00014426894,0.00019318683,0.00028928937,0.00023948995,0.0002510345,0.0013613611],"category_scores_gemma":[0.00015572688,0.00009721501,0.00014181415,0.00020937363,0.000104471525,0.00020241698,0.0000826173,0.00015212278,0.00017685843],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00012497827,0.000017094586,0.00074741704,0.00006495912,0.000013873552,0.0001667193,0.000042095307,0.00023293786,0.99665797,0.000115179406,0.000091565795,0.0017251933],"study_design_scores_gemma":[0.000009960776,0.00024358123,0.01286534,0.000013975939,0.000041362215,0.00022016773,0.00015452651,0.003034129,0.9819364,0.000056191748,0.0014179968,0.0000063800785],"about_ca_topic_score_codex":0.00062861387,"about_ca_topic_score_gemma":0.0015877979,"teacher_disagreement_score":0.0013613611,"about_ca_system_score_codex":0.00018433212,"about_ca_system_score_gemma":0.00008935062,"threshold_uncertainty_score":0.004554212},"labels":[],"label_agreement":null},{"id":"W4366685031","doi":"10.1007/s11664-023-10417-7","title":"Enhancing and Understanding the High Stretchability of Printable, Conductive Silver Nanowire Ink","year":2023,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Advanced Sensor and Energy Harvesting Materials","field":"Engineering","cited_by":12,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":true,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of Waterloo","funders":"Natural Sciences and Engineering Research Council of Canada","keywords":"Materials science; Electrical conductor; Inkwell; Conductive ink; Nanowire; Sintering; Composite material; Stretchable electronics; Silver nanoparticle; Printed electronics; Electrical resistivity and conductivity; Nanotechnology; Annealing (glass); Flexible electronics; Electronics; Nanoparticle; Sheet resistance; Layer (electronics); Electrical engineering","score_opus":0.016447965111678328,"score_gpt":0.2279306319755011,"score_spread":0.21148266686382278,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W4366685031","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.97179925,0.0010638832,0.019939153,0.00029673934,0.000080009544,0.000025691976,0.00011528739,0.00017730964,0.0065026097],"genre_scores_gemma":[0.9919757,0.0005040325,0.0052669183,0.000058883405,0.000019687688,0.000012270722,0.000060319468,0.000024308478,0.0020778496],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9998735,0.00000652495,0.000005618243,0.00003124878,0.000061120794,0.000021969747],"domain_scores_gemma":[0.9998499,0.00007108466,0.000035096684,0.000014642871,0.0000212563,0.000008076603],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00015428729,0.00021377888,0.00009916654,0.00011018052,0.00010654676,0.00039875458,0.0002924432,0.00034708943,0.00094455155],"category_scores_gemma":[0.000346845,0.000120567296,0.00014933404,0.00009414841,0.00025086486,0.0006264727,0.00020442113,0.00055709685,0.0002410923],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.000018064196,0.000019802326,0.00019456398,0.00007371615,0.0000023866319,0.00005478234,0.000028657929,0.00031539015,0.9950938,0.0006123632,0.000057254536,0.0035293046],"study_design_scores_gemma":[0.00000222669,0.000032037056,0.00035717175,0.0000019110662,0.0000026690889,0.000027470334,0.000014540393,0.0037433745,0.99516076,0.00011980905,0.00053518574,0.000002797739],"about_ca_topic_score_codex":0.00040811955,"about_ca_topic_score_gemma":0.0007947191,"teacher_disagreement_score":0.00094455155,"about_ca_system_score_codex":0.00026380792,"about_ca_system_score_gemma":0.00012553032,"threshold_uncertainty_score":0.003159821},"labels":[],"label_agreement":null},{"id":"W4382518292","doi":"10.1007/s11664-023-10552-1","title":"Preparation and Characterization of High-Performance Fe3O4/RGO Anode for Supercapacitors","year":2023,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Supercapacitor Materials and Fabrication","field":"Materials Science","cited_by":20,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Imperial Oil (Canada)","funders":"","keywords":"Supercapacitor; Materials science; Anode; Nanocomposite; Graphene; Capacitance; Electrochemistry; Oxide; Electrode; Chemical engineering; Cathode; Power density; Nanotechnology; Metallurgy; Chemistry; Power (physics)","score_opus":0.012076904915821434,"score_gpt":0.2513710374667846,"score_spread":0.23929413255096313,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W4382518292","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.98721457,0.00058829697,0.008246016,0.00015480474,0.000046022917,0.000082293285,0.0006657618,0.00016678804,0.0028353385],"genre_scores_gemma":[0.9867534,0.00040520186,0.008673902,0.00003311008,0.000018541426,0.00005641191,0.0007634464,0.00006371656,0.0032322395],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.99982053,0.000012076542,0.000017237782,0.000032510656,0.000079355144,0.00003828361],"domain_scores_gemma":[0.99987566,0.000019121067,0.000017098839,0.000017250015,0.00005423976,0.000016646005],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00028756054,0.00030992186,0.00032974096,0.00051094854,0.00029527055,0.00029474712,0.00046740889,0.00036320311,0.0008829508],"category_scores_gemma":[0.00031323786,0.00021514605,0.00019662986,0.00028503165,0.0001658358,0.00028819402,0.00019461632,0.00030421567,0.00035732254],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00003576626,0.000023289203,0.00014016594,0.000052799056,0.0000040714917,0.000059000267,0.000013681398,0.00017866836,0.99783176,0.000051439118,0.000076944765,0.0015324653],"study_design_scores_gemma":[0.000004935168,0.000055919823,0.0016944634,0.0000026029786,0.000005510621,0.000058845133,0.000011592676,0.001369919,0.9957482,0.00002449757,0.0010197178,0.0000038276266],"about_ca_topic_score_codex":0.0008635897,"about_ca_topic_score_gemma":0.0016504939,"teacher_disagreement_score":0.0008829508,"about_ca_system_score_codex":0.00027888955,"about_ca_system_score_gemma":0.00023619458,"threshold_uncertainty_score":0.0029537678},"labels":[],"label_agreement":null},{"id":"W4385740961","doi":"10.1007/s11664-023-10624-2","title":"Heat Transport in Hot Extruded Bulk Polycrystalline Thermoelectric Alloys Based on Bi2Te3","year":2023,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Thermal properties of materials","field":"Materials Science","cited_by":2,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":true,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Polytechnique Montréal","funders":"Natural Sciences and Engineering Research Council of Canada","keywords":"Materials science; Thermoelectric effect; Thermal conductivity; Seebeck coefficient; Thermoelectric materials; Condensed matter physics; Phonon scattering; Crystallite; Ternary operation; Anisotropy; Bismuth telluride; Scattering; Thermodynamics; Composite material; Metallurgy; Optics","score_opus":0.014006184230783255,"score_gpt":0.2371756553018696,"score_spread":0.22316947107108634,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W4385740961","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9990501,0.00019043949,0.00017061656,0.000022380002,0.000009712566,0.0000020259517,0.00007262824,0.000011195611,0.0004708658],"genre_scores_gemma":[0.9990471,0.000066406705,0.00011672358,0.000005197279,0.0000030827648,0.0000030635565,0.00007569591,0.000012353246,0.0006702414],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.99986863,0.000012285971,0.000004993676,0.000025673016,0.00004201832,0.000046297886],"domain_scores_gemma":[0.9998203,0.00007807672,0.000023742918,0.000013431236,0.00005302869,0.0000114315035],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00018325349,0.00021027368,0.00036502254,0.00019642859,0.00041269817,0.00064357795,0.00036086136,0.00033969778,0.0018484384],"category_scores_gemma":[0.00030452473,0.0002192833,0.00014858948,0.00040410802,0.00043315743,0.0005287971,0.00017188267,0.0004361587,0.00025985896],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.001264339,0.000069074784,0.0011571243,0.000108632594,0.000023130382,0.00020313363,0.00018093635,0.0014642215,0.9929086,0.0006537531,0.00024745738,0.0017197091],"study_design_scores_gemma":[0.00004555994,0.00024537006,0.0063155917,0.000014211396,0.000019357249,0.000049819773,0.00020386504,0.013221747,0.97905123,0.00009087009,0.0007296866,0.00001276953],"about_ca_topic_score_codex":0.0031238205,"about_ca_topic_score_gemma":0.0032391993,"teacher_disagreement_score":0.0031238205,"about_ca_system_score_codex":0.0006038739,"about_ca_system_score_gemma":0.00029528802,"threshold_uncertainty_score":0.006211281},"labels":[],"label_agreement":null},{"id":"W4389078414","doi":"10.1007/s11664-023-10749-4","title":"Study of Polymer-Dispersed Liquid Crystal (PDLC) Thin Film Technology for Smart Electronic Devices","year":2023,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Liquid Crystal Research Advancements","field":"Materials Science","cited_by":11,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"McMaster University","funders":"Higher Education Commision, Pakistan","keywords":"Materials science; Diglycidyl ether; Epoxy; Trimethylolpropane; Pentaerythritol; Curing (chemistry); Scanning electron microscope; Liquid crystal; Chemical engineering; Monomer; Polymer; Norbornene; Composite material; Polymer chemistry; Optoelectronics; Polyurethane; Bisphenol A","score_opus":0.02016968341965753,"score_gpt":0.3212868939941274,"score_spread":0.3011172105744699,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W4389078414","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9872387,0.00436297,0.005099669,0.00010948032,0.000030811832,0.00003374791,0.00006921004,0.000026898686,0.0030284945],"genre_scores_gemma":[0.9918755,0.0020514918,0.0034555104,0.000022710867,0.000013144769,0.000018779945,0.00006833691,0.000009484115,0.00248501],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.99993014,0.00000717183,0.000002615349,0.000015858079,0.000034011722,0.000010283141],"domain_scores_gemma":[0.9999218,0.000032365755,0.000011749488,0.00000402296,0.000023033337,0.000007024007],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00009955709,0.00014727018,0.00016296544,0.00013128143,0.00016764858,0.00029998907,0.00020517761,0.00021420735,0.0008924783],"category_scores_gemma":[0.0001857792,0.00010954744,0.00015430686,0.0001682217,0.00013883629,0.00039118613,0.00012533453,0.00031101232,0.00019838064],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.000027890042,0.000020067651,0.000100454774,0.000102049846,0.000003715195,0.000056225806,0.000030143417,0.00021005212,0.9969568,0.0002815049,0.000046981782,0.002164126],"study_design_scores_gemma":[0.000005608452,0.00018331019,0.00062113005,0.000007260354,0.000010893553,0.00006790121,0.00003748313,0.0046561523,0.992949,0.000041582138,0.001416423,0.0000033153515],"about_ca_topic_score_codex":0.00059389096,"about_ca_topic_score_gemma":0.0005836397,"teacher_disagreement_score":0.0008924783,"about_ca_system_score_codex":0.00022917586,"about_ca_system_score_gemma":0.00018305039,"threshold_uncertainty_score":0.0029856563},"labels":[],"label_agreement":null},{"id":"W4389724047","doi":"10.1007/s11664-023-10834-8","title":"Fabrication and Characterization of Nickel Ferrite-Based Ethanol Nanosensor","year":2023,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Gas Sensing Nanomaterials and Sensors","field":"Engineering","cited_by":7,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Etobicoke General Hospital","funders":"","keywords":"Nanosensor; Nickel; Fabrication; Solid-state physics; Ferrite (magnet); Materials science; Metallurgy; Characterization (materials science); Nanotechnology; Ethanol; Chemistry; Composite material; Medicine; Organic chemistry; Physics","score_opus":0.009011982585911979,"score_gpt":0.21067577268091844,"score_spread":0.20166379009500646,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W4389724047","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9413392,0.0008535018,0.047467444,0.00028990387,0.00011190293,0.00018462594,0.00063573965,0.00080943597,0.008308172],"genre_scores_gemma":[0.97092694,0.0003088955,0.019079441,0.00007433414,0.000012643584,0.00007201813,0.0004825478,0.00004084938,0.009002332],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.99967325,0.000019487725,0.000022688488,0.00007219476,0.0001755599,0.000036942325],"domain_scores_gemma":[0.99985826,0.000021496093,0.000024853354,0.000028328497,0.000054018292,0.000013032048],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00023138532,0.00024974492,0.0002638879,0.00030071093,0.00021642826,0.00030810531,0.00077915296,0.00035611322,0.0009160409],"category_scores_gemma":[0.0003090588,0.0002398908,0.00019903675,0.00020248417,0.00018211274,0.0003524576,0.00024277899,0.00023273143,0.00049130723],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.000033952903,0.000023698156,0.00017352325,0.000033779954,0.000004709906,0.000039226896,0.000019314111,0.00009954524,0.99683964,0.00008746283,0.000105859006,0.0025391504],"study_design_scores_gemma":[0.0000018144132,0.000020553027,0.00048713054,6.8276836e-7,0.0000030208755,0.000024917925,0.000008445457,0.0010708255,0.99751127,0.000008358097,0.0008603845,0.0000026763196],"about_ca_topic_score_codex":0.0011705128,"about_ca_topic_score_gemma":0.0033143421,"teacher_disagreement_score":0.0011705128,"about_ca_system_score_codex":0.00047531282,"about_ca_system_score_gemma":0.00024729487,"threshold_uncertainty_score":0.0034486651},"labels":[],"label_agreement":null},{"id":"W4393357362","doi":"10.1007/s11664-024-10961-w","title":"Design and One-Pot Green Synthesis of a Three-Component 1,1′-Bi(2-Naphthol)/Reduced Graphene Oxide@MnO2 Nanocomposite for Battery-Type Supercapacitor Applications: A Revolution in the World of Medicine","year":2024,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Supercapacitor Materials and Fabrication","field":"Materials Science","cited_by":0,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Queen's University","funders":"","keywords":"Graphene; Nanocomposite; Oxide; Supercapacitor; Component (thermodynamics); Battery (electricity); Nanotechnology; Materials science; Solid-state physics; Chemical engineering; Chemistry; Electrochemistry; Electrode; Engineering; Physics; Power (physics); Metallurgy; Physical chemistry; Condensed matter physics","score_opus":0.0290877875753883,"score_gpt":0.26822240496592614,"score_spread":0.23913461739053785,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W4393357362","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9062824,0.0021377108,0.07326361,0.000490493,0.00015153232,0.0003611695,0.00082016486,0.0006300242,0.015862895],"genre_scores_gemma":[0.9707685,0.0009147768,0.021831281,0.00007417953,0.0000118870985,0.000120414916,0.0003616453,0.00006648434,0.005850676],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.99995065,0.000003928035,0.00000413589,0.000015019532,0.000015568383,0.000010640474],"domain_scores_gemma":[0.99997866,0.0000019733295,0.000005552027,0.0000022333259,0.0000056264694,0.000005959217],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00008168328,0.00038337108,0.0001722776,0.00026256707,0.0002087089,0.0001963303,0.0003725226,0.00023899383,0.0009177763],"category_scores_gemma":[0.000060435013,0.00019848868,0.00024652813,0.00017651138,0.00009976883,0.00027995888,0.00021782567,0.0003317448,0.00051189156],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.000028992456,0.000060583687,0.000055712757,0.00011309891,0.000011005397,0.000067789064,0.000025154442,0.0004661401,0.9931846,0.00042245514,0.00016116363,0.0054033455],"study_design_scores_gemma":[0.000016312217,0.00023473012,0.00061132916,0.0000064907863,0.000025717185,0.000120030505,0.000024738014,0.0045994697,0.9881364,0.00015311604,0.0060574454,0.000014381129],"about_ca_topic_score_codex":0.00064338074,"about_ca_topic_score_gemma":0.0023446053,"teacher_disagreement_score":0.0009177763,"about_ca_system_score_codex":0.00029059465,"about_ca_system_score_gemma":0.00026268626,"threshold_uncertainty_score":0.0030702353},"labels":[],"label_agreement":null},{"id":"W4396891074","doi":"10.1007/s11664-024-11133-6","title":"Optimizing High-Transmission Conductive Windows with Antireflection Coating for Oblique Angle Light Incidence","year":2024,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Thin-Film Transistor Technologies","field":"Engineering","cited_by":3,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Mount Royal University","funders":"","keywords":"Oblique case; Materials science; Optics; Coating; Electrical conductor; Transmission (telecommunications); Angle of incidence (optics); Incidence (geometry); Optoelectronics; Composite material; Physics; Telecommunications; Computer science","score_opus":0.007624609832480919,"score_gpt":0.23219824718198762,"score_spread":0.2245736373495067,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W4396891074","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9774465,0.0008816855,0.01591877,0.00007594905,0.000087641616,0.000043101318,0.00015195034,0.00027832107,0.005116097],"genre_scores_gemma":[0.98204386,0.0006268304,0.015599561,0.000026604781,0.000016123786,0.000028965274,0.00013002894,0.00012022213,0.0014077144],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9997985,0.000009510759,0.000010193381,0.00004102718,0.00007353064,0.00006719917],"domain_scores_gemma":[0.99970955,0.000066142005,0.00009457172,0.000028751676,0.000064350694,0.000036551235],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00015660128,0.00059470604,0.0003205405,0.00023546224,0.00023160226,0.0010011351,0.0005189939,0.00039704994,0.0010012977],"category_scores_gemma":[0.00044666245,0.00032786018,0.00027250772,0.00029421793,0.00018112478,0.0005729642,0.00036365664,0.00042714417,0.00042520184],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00006834798,0.00004774585,0.00028988125,0.0000789745,0.0000099043045,0.00007714131,0.000027129709,0.00084724044,0.9946243,0.00045078638,0.000224924,0.003253588],"study_design_scores_gemma":[0.000022592787,0.00015669077,0.0010632265,0.000011726955,0.000024294064,0.00010607549,0.000039674844,0.0068001063,0.99006665,0.00008399876,0.0016112681,0.000013695249],"about_ca_topic_score_codex":0.00081705564,"about_ca_topic_score_gemma":0.0022018934,"teacher_disagreement_score":0.0010012977,"about_ca_system_score_codex":0.0003600262,"about_ca_system_score_gemma":0.00043531487,"threshold_uncertainty_score":0.0033496618},"labels":[],"label_agreement":null},{"id":"W4400346552","doi":"10.1007/s11664-024-11268-6","title":"Green Hydrothermal Preparation of Ag-CP Nanocomposites with Lily Bulbs for Non-Enzymatic Glucose Detection","year":2024,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Advanced Nanomaterials in Catalysis","field":"Materials Science","cited_by":3,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Concordia University","funders":"National Natural Science Foundation of China","keywords":"Hydrothermal circulation; Nanocomposite; Enzyme; Chemistry; Nanotechnology; Materials science; Botany; Chemical engineering; Nuclear chemistry; Biology; Biochemistry; Engineering","score_opus":0.006009277598917707,"score_gpt":0.2681302783571907,"score_spread":0.262121000758273,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W4400346552","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.98013216,0.00077110337,0.015153475,0.000097400625,0.0000532143,0.000030027879,0.00021743933,0.00050329725,0.003042007],"genre_scores_gemma":[0.98905236,0.00031274883,0.0071477112,0.00003657738,0.000010158664,0.00002611222,0.00017698103,0.00011587068,0.003121508],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.99991727,0.0000047914154,0.000005721632,0.000024335366,0.000028973194,0.000018894005],"domain_scores_gemma":[0.9999292,0.000012428086,0.000021040922,0.000007459081,0.000016818727,0.000012989592],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00009840464,0.0002874931,0.00020160609,0.00018398585,0.0001300431,0.00031558578,0.0003476781,0.0003233042,0.0009608265],"category_scores_gemma":[0.0001672483,0.00022507379,0.00023159652,0.000174861,0.00015466423,0.00032565993,0.0002631106,0.00054114463,0.0003553988],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.000023986448,0.000007802766,0.00003561932,0.00003214833,0.0000026751813,0.000025355866,0.000010050637,0.00003648091,0.9983382,0.000054538446,0.00004064538,0.0013924377],"study_design_scores_gemma":[0.0000025263814,0.000029329003,0.0002713704,0.0000014646569,0.0000040030245,0.00002675435,0.0000041576,0.0005512465,0.9985733,0.00001028947,0.0005232109,0.0000022583617],"about_ca_topic_score_codex":0.00041962153,"about_ca_topic_score_gemma":0.0011331824,"teacher_disagreement_score":0.0009608265,"about_ca_system_score_codex":0.00028061334,"about_ca_system_score_gemma":0.0001412196,"threshold_uncertainty_score":0.0032142997},"labels":[],"label_agreement":null},{"id":"W4402478565","doi":"10.1007/s11664-024-11423-z","title":"Compound Model of Twisted and Coiled Polymer Actuators Describing Relationship Between Output Force and Excitation Current","year":2024,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Advanced Sensor and Energy Harvesting Materials","field":"Engineering","cited_by":0,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Concordia University","funders":"Higher Education Discipline Innovation Project; National Natural Science Foundation of China","keywords":"Current (fluid); Excitation; Solid-state physics; Polymer; Actuator; Materials science; Condensed matter physics; Physics; Thermodynamics; Engineering; Electrical engineering; Composite material; Quantum mechanics","score_opus":0.05457862442186711,"score_gpt":0.2692670480159535,"score_spread":0.2146884235940864,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W4402478565","genre_codex":"methods","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":null,"domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.08633425,0.0011855991,0.75857157,0.000635694,0.00039839128,0.00022535288,0.0011884671,0.0008413839,0.15061925],"genre_scores_gemma":[0.87835443,0.0011002483,0.037358113,0.0001723895,0.00009564754,0.00038152968,0.0005455834,0.00014582505,0.0818463],"study_design_codex":"simulation_or_modeling","study_design_gemma":"simulation_or_modeling","domain_scores_codex":[0.9998282,0.000025605761,0.000009765976,0.00006132173,0.000052662166,0.000022351942],"domain_scores_gemma":[0.9998104,0.000054045388,0.000033080825,0.000030051828,0.00005383756,0.000018496288],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00020868938,0.000674607,0.000814144,0.0004993047,0.00052636646,0.0012550672,0.0016859793,0.002373044,0.009956596],"category_scores_gemma":[0.00037135746,0.00045179314,0.0006610577,0.00068834197,0.0007911925,0.0014513874,0.0005262147,0.0006958197,0.0020058355],"study_design_candidate":"simulation_or_modeling","study_design_consensus":"simulation_or_modeling","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00012673548,0.00007838686,0.0005750155,0.00034612895,0.000071997165,0.00091208186,0.00026254018,0.7328191,0.040125366,0.2104375,0.0019839255,0.012261247],"study_design_scores_gemma":[0.000014456639,0.000055795914,0.00026123138,0.000012187,0.00001721863,0.00018104634,0.000024730212,0.9795768,0.0019562256,0.01459929,0.00328298,0.000018024293],"about_ca_topic_score_codex":0.0014925692,"about_ca_topic_score_gemma":0.0012656233,"teacher_disagreement_score":0.009956596,"about_ca_system_score_codex":0.00050025695,"about_ca_system_score_gemma":0.0006852115,"threshold_uncertainty_score":0.03330815},"labels":[],"label_agreement":null},{"id":"W4405877369","doi":"10.1007/s11664-024-11674-w","title":"Fluorescence Spectra and Optical Transition Properties of Eu3+-Doped Ca3NbGa3Si2O14 Phosphor","year":2024,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Luminescence Properties of Advanced Materials","field":"Materials Science","cited_by":11,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Lockheed Martin (Canada)","funders":"","keywords":"Chromaticity; Phosphor; Photoluminescence; Emission spectrum; Doping; Fluorescence; Powder diffraction; Analytical Chemistry (journal); Chemistry; Diffraction; Spectral line; Materials science; Crystallography; Optics; Optoelectronics; Physics; Organic chemistry","score_opus":0.010706710219900868,"score_gpt":0.23144621652934658,"score_spread":0.22073950630944572,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W4405877369","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.99689215,0.0002249086,0.00068361446,0.000056839937,0.000005594572,0.0000034747427,0.00011627348,0.000051355597,0.001965805],"genre_scores_gemma":[0.9977926,0.00010002838,0.00043646002,0.00001651543,0.0000027605342,0.000003886782,0.000117560376,0.000014885753,0.0015152434],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9998833,0.000011125302,0.0000058449364,0.00003203832,0.000028230928,0.000039437316],"domain_scores_gemma":[0.9998627,0.000051847306,0.000018836878,0.000013728646,0.000034843208,0.000018062115],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00020268293,0.00019742413,0.00021580247,0.00023790437,0.00027387595,0.00026852687,0.00037727787,0.00027574878,0.0026555816],"category_scores_gemma":[0.00026074966,0.00011666742,0.00016046975,0.00020510113,0.0002908444,0.00027483358,0.00014389648,0.00025051567,0.00026947554],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00041525066,0.000025666453,0.00057810266,0.000038447357,0.0000075005073,0.000050940158,0.00006130987,0.00025528003,0.99594575,0.00034368626,0.000153228,0.0021248255],"study_design_scores_gemma":[0.00003064211,0.00018579396,0.0068602613,0.000008302332,0.000022223428,0.00010272266,0.00006415353,0.004981561,0.98677933,0.0000746171,0.0008760406,0.000014336719],"about_ca_topic_score_codex":0.003022057,"about_ca_topic_score_gemma":0.0022835713,"teacher_disagreement_score":0.003022057,"about_ca_system_score_codex":0.0004383169,"about_ca_system_score_gemma":0.00026913665,"threshold_uncertainty_score":0.008883834},"labels":[],"label_agreement":null},{"id":"W4411848516","doi":"10.1007/s11664-025-12093-1","title":"Effects of Doping, Transport Layer Thickness, and Composition on the Performance of Mixed Halide Perovskite Single-Junction Solar Cells","year":2025,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Perovskite Materials and Applications","field":"Engineering","cited_by":3,"is_retracted":false,"has_abstract":true,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Institut interdisciplinaire d'innovation technologique; Université de Sherbrooke","funders":"","keywords":"Perovskite (structure); Doping; Halide; Materials science; Layer (electronics); Solid-state physics; Optoelectronics; Chemistry; Chemical engineering; Composite material; Inorganic chemistry; Crystallography; Condensed matter physics; Physics","score_opus":0.004125721071380128,"score_gpt":0.18562037410148943,"score_spread":0.1814946530301093,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W4411848516","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9980597,0.00046075482,0.00062312844,0.000028656088,0.000009038458,0.00000700965,0.00017140461,0.000035113455,0.0006052328],"genre_scores_gemma":[0.9988569,0.00024508507,0.0006489422,0.0000073271813,0.0000019859049,0.0000054284087,0.000052726635,0.000009624576,0.00017190952],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9998766,0.000014930934,0.000013389544,0.000025616577,0.00004642245,0.00002308917],"domain_scores_gemma":[0.99977976,0.00010886256,0.000037030288,0.000012241094,0.00005043231,0.000011648552],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00026905324,0.00034064314,0.0003083657,0.00020482735,0.00019620903,0.00046871928,0.00030832927,0.00024078999,0.0006073192],"category_scores_gemma":[0.00045495035,0.00026431342,0.00018511839,0.0002791582,0.0001337461,0.0003093958,0.00013546873,0.00017876033,0.00015472795],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00035836338,0.00006966614,0.0029268423,0.00012942098,0.000041565287,0.00012775262,0.000034780005,0.009188286,0.98306125,0.00007815053,0.00008733859,0.0038965582],"study_design_scores_gemma":[0.000016382131,0.0003115955,0.0039972933,0.000012821698,0.00005697704,0.000049046223,0.000047525216,0.02423455,0.9709543,0.00003158124,0.00027570943,0.0000122128085],"about_ca_topic_score_codex":0.0017047289,"about_ca_topic_score_gemma":0.0028046651,"teacher_disagreement_score":0.0017047289,"about_ca_system_score_codex":0.0002857486,"about_ca_system_score_gemma":0.00024284079,"threshold_uncertainty_score":0.0033896565},"labels":[],"label_agreement":null},{"id":"W587379043","doi":"10.1007/s11664-015-3854-x","title":"Molybdenum, Tungsten, and Aluminium Substitution for Enhancement of the Thermoelectric Performance of Higher Manganese Silicides","year":2015,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Semiconductor materials and interfaces","field":"Physics and Astronomy","cited_by":40,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":true,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of Waterloo","funders":"Natural Sciences and Engineering Research Council of Canada; Région Normandie; Canadian Network for Research and Innovation in Machining Technology, Natural Sciences and Engineering Research Council of Canada","keywords":"Molybdenum; Materials science; Spark plasma sintering; Tungsten; Seebeck coefficient; Thermoelectric effect; Sintering; Metallurgy; Aluminium; Thermal conductivity; Analytical Chemistry (journal); Composite material; Chemistry; Organic chemistry","score_opus":0.01654157862019739,"score_gpt":0.25241010651376855,"score_spread":0.23586852789357116,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W587379043","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9990884,0.0002244491,0.00012102649,0.000017102982,0.000008954056,0.0000030734896,0.000016115027,0.0000060877155,0.0005148725],"genre_scores_gemma":[0.99904877,0.0001899408,0.00019444124,0.0000054077113,0.000002617653,0.0000024729306,0.000020477484,0.0000060479397,0.00052969955],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.99995327,0.000005708653,0.0000056805593,0.000007250941,0.000012230498,0.000015779455],"domain_scores_gemma":[0.9999459,0.000009480012,0.000013553484,0.000005994932,0.0000139388485,0.000011134808],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00011045634,0.00019237603,0.00019162598,0.00017925703,0.00012840355,0.00024902704,0.00027499162,0.00012553284,0.0006913059],"category_scores_gemma":[0.00016557761,0.000119784614,0.00014118297,0.0001695709,0.00013108803,0.00019339306,0.0002133651,0.00019871817,0.00012084089],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.0003651017,0.000029719748,0.00044546707,0.00009573207,0.000011152689,0.00007777976,0.00004549548,0.0002723426,0.9962768,0.00026209894,0.00006706851,0.002051124],"study_design_scores_gemma":[0.000019380705,0.00018080031,0.0010567378,0.000008434744,0.000020039692,0.000036829853,0.00003069365,0.0013038708,0.996491,0.00002983793,0.00081764814,0.0000047039503],"about_ca_topic_score_codex":0.00072799035,"about_ca_topic_score_gemma":0.0021992873,"teacher_disagreement_score":0.00072799035,"about_ca_system_score_codex":0.0001757392,"about_ca_system_score_gemma":0.00017842045,"threshold_uncertainty_score":0.0023126006},"labels":[],"label_agreement":null},{"id":"W835702715","doi":"10.1007/s11664-015-3914-2","title":"Humidity Sensor Based on PEDOT:PSS and Zinc Stannate Nano-composite","year":2015,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Gas Sensing Nanomaterials and Sensors","field":"Engineering","cited_by":38,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of Waterloo","funders":"","keywords":"Stannate; PEDOT:PSS; Materials science; Dielectric spectroscopy; Polystyrene sulfonate; Composite number; Relative humidity; Fourier transform infrared spectroscopy; Humidity; Repeatability; Nano-; Chemical engineering; Composite material; Analytical Chemistry (journal); Zinc; Layer (electronics); Chemistry; Organic chemistry; Chromatography","score_opus":0.01227467524060528,"score_gpt":0.21595585132365042,"score_spread":0.20368117608304515,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W835702715","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9813479,0.0015095583,0.014477607,0.00015652756,0.00017297888,0.000032429656,0.00018671344,0.00029195714,0.0018242947],"genre_scores_gemma":[0.9891277,0.0005229226,0.0075084986,0.000059023747,0.000013881194,0.000012395812,0.00010604585,0.000013265084,0.0026361619],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.99975103,0.000023772447,0.0000160323,0.0000688973,0.000103576145,0.000036625956],"domain_scores_gemma":[0.9998461,0.000036860933,0.000027896946,0.000014354449,0.00005605333,0.000018757832],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00024792925,0.00028854262,0.0003626713,0.00022527388,0.00017674532,0.0002974436,0.0005151552,0.00049231254,0.0007246911],"category_scores_gemma":[0.00027378718,0.00025602913,0.00023150977,0.000214686,0.00020625938,0.00047608232,0.00022858143,0.0002688663,0.0002482805],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.000077523066,0.000005275541,0.00011179089,0.000037818638,0.000004502458,0.000040246214,0.000008881458,0.000044027012,0.9985261,0.000049305287,0.0000305784,0.0010639095],"study_design_scores_gemma":[0.0000027941217,0.00003771615,0.0004457525,0.0000012906642,0.000007541244,0.000045841905,0.000009578244,0.0008506224,0.9982685,0.000009112766,0.00031864535,0.0000026211146],"about_ca_topic_score_codex":0.0004481246,"about_ca_topic_score_gemma":0.0011759262,"teacher_disagreement_score":0.0007246911,"about_ca_system_score_codex":0.00030545724,"about_ca_system_score_gemma":0.00019377071,"threshold_uncertainty_score":0.0024243593},"labels":[],"label_agreement":null},{"id":"W893824649","doi":"10.1007/s11664-015-3790-9","title":"Molybdenum Oxides Deposited by Modulated Pulse Power Magnetron Sputtering: Stoichiometry as a Function of Process Parameters","year":2015,"lang":"en","type":"article","venue":"Journal of Electronic Materials","topic":"Metal and Thin Film Mechanics","field":"Engineering","cited_by":9,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"General Dynamics (Canada)","funders":"","keywords":"Analytical Chemistry (journal); X-ray reflectivity; X-ray photoelectron spectroscopy; Materials science; Molybdenum; Ellipsometry; Sputtering; Thin film; Sputter deposition; Stoichiometry; Surface roughness; Chemistry; Nanotechnology; Chemical engineering; Metallurgy","score_opus":0.007755291307442525,"score_gpt":0.21065455290283278,"score_spread":0.20289926159539026,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W893824649","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"metacan-v3-hybrid-931329e0061c","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9982284,0.00021181843,0.0003818605,0.000021231685,0.000010182189,0.000005957155,0.00012435489,0.000032683525,0.0009835049],"genre_scores_gemma":[0.9985374,0.00017042155,0.00053714454,0.0000072147504,0.0000037101922,0.0000054199386,0.00014071589,0.000021359583,0.000576629],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9998505,0.000015176156,0.000012612495,0.000031310945,0.000067039255,0.000023368391],"domain_scores_gemma":[0.99969363,0.00011548241,0.00007139814,0.000029517083,0.0000689819,0.000021029506],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00027056842,0.00024375567,0.00031374028,0.00025422015,0.0002499338,0.0005318358,0.00039894378,0.00030509636,0.0016944612],"category_scores_gemma":[0.0009059194,0.00040146496,0.000092687405,0.0003224187,0.00020236026,0.0003328171,0.00014511995,0.0002377223,0.0002986732],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00043595364,0.000019435538,0.0014500688,0.000062618055,0.00000964684,0.00010661509,0.00006144617,0.00042370267,0.9957391,0.00009839139,0.00006584156,0.0015272256],"study_design_scores_gemma":[0.000019552084,0.00020797996,0.009722183,0.000008445251,0.000022143606,0.000104553765,0.000075475495,0.0028910234,0.98641986,0.00004101172,0.00048062636,0.000007170557],"about_ca_topic_score_codex":0.0014819984,"about_ca_topic_score_gemma":0.0033731451,"teacher_disagreement_score":0.0016944612,"about_ca_system_score_codex":0.00029180988,"about_ca_system_score_gemma":0.00022746308,"threshold_uncertainty_score":0.0056685805},"labels":[],"label_agreement":null}]}