{"meta":{"query_hash":"ba6b2ee6b50d","filters":{"venue":"Journal of Electronic Testing"},"cohort_total":53,"direct_labels_cover":1,"predictions_cover":53,"exported":53,"export_cap":100000,"truncated":false,"label_status":"direct model label, unvalidated","prediction_status":"machine_predicted_unvalidated (Codex and Gemma teacher distillation)","score_status":"score_only:v0-immature-baseline","snapshot":{"source":"OpenAlex, pinned release, all 482 partitions","release":"2026-06-24","frame_built":"2026-07-12"},"permalink":"https://metacan.xera.ac/q/ba6b2ee6b50d","api":"https://metacan.xera.ac/api/v1/cohort?venue=Journal+of+Electronic+Testing"},"results":[{"id":"W143503425","doi":"10.1023/a:1008325420970","title":"Catastrophic Short and Open Fault Detection in Bipolar CML Circuits: A Case Study","year":2000,"lang":"en","type":"article","venue":"Journal of Electronic Testing","topic":"VLSI and Analog Circuit Testing","field":"Computer Science","cited_by":1,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of British Columbia","funders":"","keywords":"Synchronous optical networking; Current-mode logic; Computer science; Electronic circuit; Computer hardware; Electronic engineering; Embedded system; Logic gate; Parallel computing; Engineering; Algorithm; Electrical engineering; Telecommunications","score_opus":0.03231726207961784,"score_gpt":0.28118444223029215,"score_spread":0.24886718015067433,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W143503425","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"codex-gemma-dda1882f352a","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9891079,0.0012640845,0.0092197275,0.00004274625,0.000040248873,0.00019455988,2.7057803e-7,0.000029849454,0.00010063037],"genre_scores_gemma":[0.9994219,0.0000097048505,0.00039055847,0.00005335413,0.00009977841,0.0000040699924,9.3710234e-8,0.000011320953,0.0000092392775],"study_design_codex":"design_other","study_design_gemma":"case_report","domain_scores_codex":[0.9982878,0.00015902088,0.0005646398,0.00027428765,0.00023280056,0.00048143728],"domain_scores_gemma":[0.99910635,0.00024035806,0.00020723784,0.00021088972,0.00012326722,0.00011188913],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0015583307,0.00014749906,0.0002867597,0.00023648325,0.00022216715,0.00033742728,0.0006942424,0.00004034946,0.0000061761234],"category_scores_gemma":[0.00035432304,0.00013661775,0.000034003842,0.0008991259,0.00001896531,0.0010469664,0.0001162405,0.0006615972,0.0000015440661],"study_design_candidate":"design_other","study_design_consensus":null,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[9.201387e-7,0.00014511085,0.02664016,0.0000056244094,0.000020150012,0.0036293664,0.0006413416,0.0014967353,0.0021042526,0.000016210262,0.0000012913871,0.96529883],"study_design_scores_gemma":[0.005762795,0.011727305,0.076878145,0.00076119264,0.00019976414,0.47459736,0.0028271095,0.42067668,0.0012429616,0.0029733048,0.0008903426,0.001463049],"about_ca_topic_score_codex":0.00068200275,"about_ca_topic_score_gemma":0.0005975572,"teacher_disagreement_score":0.9638358,"about_ca_system_score_codex":0.00018749665,"about_ca_system_score_gemma":0.00031079917,"threshold_uncertainty_score":0.557111},"labels":[],"label_agreement":null},{"id":"W1505256921","doi":"10.1023/a:1012820722053","title":"Why is Combinational ATPG Efficiently Solvable for Practical VLSI Circuits?","year":2001,"lang":"en","type":"article","venue":"Journal of Electronic Testing","topic":"Low-power high-performance VLSI design","field":"Engineering","cited_by":5,"is_retracted":false,"has_abstract":false,"route_ca_aff":false,"route_ca_fund":true,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"","funders":"Natural Sciences and Engineering Research Council of Canada; Centre International de Recherche sur le Cancer","keywords":"Bounded function; Class (philosophy); Combinational logic; Automatic test pattern generation; Computer science; Electronic circuit; Algorithm; Discrete mathematics; Mathematics; Logic gate; Engineering; Artificial intelligence; Electrical engineering","score_opus":0.0278164503253915,"score_gpt":0.26473689423399577,"score_spread":0.23692044390860426,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W1505256921","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"codex-gemma-dda1882f352a","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.7196935,0.0019270618,0.26865324,0.0025134361,0.0011185246,0.00048646212,0.000005399856,0.00029283456,0.005309545],"genre_scores_gemma":[0.9925885,0.000025075622,0.006440048,0.00037145565,0.00040408905,0.0000089806135,0.0000019513802,0.000056103632,0.00010376334],"study_design_codex":"simulation_or_modeling","study_design_gemma":"simulation_or_modeling","domain_scores_codex":[0.9981728,0.000022473398,0.000547558,0.00013391717,0.00040847357,0.0007147836],"domain_scores_gemma":[0.998398,0.0007189851,0.00023793246,0.0001312828,0.00040065616,0.000113147],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.000817749,0.00018073172,0.00026770876,0.00020534337,0.0001423364,0.00008363373,0.00021311795,0.000088228866,0.000073655145],"category_scores_gemma":[0.00065125595,0.00017404875,0.00011156615,0.00046198178,0.000026408397,0.0005483946,0.00001511357,0.00056934566,0.000016903605],"study_design_candidate":"simulation_or_modeling","study_design_consensus":"simulation_or_modeling","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00016633459,0.001204134,0.016199937,0.000539543,0.001110444,0.00027445122,0.0012896827,0.5855622,0.09237289,0.01523419,0.23914802,0.046898138],"study_design_scores_gemma":[0.0034839679,0.0017927443,0.002129095,0.00025982957,0.00018133108,0.002746572,0.00007866036,0.8382699,0.008167071,0.004384152,0.13787508,0.0006315897],"about_ca_topic_score_codex":0.0000027641363,"about_ca_topic_score_gemma":0.0000030256622,"teacher_disagreement_score":0.27289504,"about_ca_system_score_codex":0.0004443338,"about_ca_system_score_gemma":0.00039956716,"threshold_uncertainty_score":0.70975024},"labels":[],"label_agreement":null},{"id":"W1531051146","doi":"10.1023/a:1012755219655","title":"Reducing Test Time in the High-Volume Production of Analog Circuits using Efficient Test-Vector Generation and Interpolation Techniques","year":2001,"lang":"en","type":"article","venue":"Journal of Electronic Testing","topic":"VLSI and Analog Circuit Testing","field":"Computer Science","cited_by":0,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"D-Wave Systems (Canada)","funders":"","keywords":"Transfer function; Algorithm; Function (biology); Set (abstract data type); Interpolation (computer graphics); Computer science; Fault (geology); Test set; Automatic test pattern generation; Transfer (computing); Mathematics; Engineering; Electronic circuit; Artificial intelligence","score_opus":0.024767836864387667,"score_gpt":0.24828090061623573,"score_spread":0.22351306375184807,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W1531051146","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"codex-gemma-dda1882f352a","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.93584055,0.00026072102,0.0631802,0.0003991724,0.00008245144,0.00013882737,2.6234463e-7,0.000034537625,0.00006327977],"genre_scores_gemma":[0.993489,0.0000063737953,0.0060626063,0.00003342525,0.00038789902,0.0000015635885,5.424966e-7,0.000009121163,0.000009416453],"study_design_codex":"bench_or_experimental","study_design_gemma":"simulation_or_modeling","domain_scores_codex":[0.998419,0.000121296485,0.00062780257,0.00021923803,0.0003062949,0.00030639526],"domain_scores_gemma":[0.99815077,0.00054485473,0.000775983,0.00018085194,0.00031404707,0.00003352015],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.002116906,0.00012460757,0.00021390113,0.00031756354,0.00016337665,0.0001077142,0.00031885967,0.00004781825,0.000001347785],"category_scores_gemma":[0.0034385514,0.00009947224,0.000039897892,0.0010187317,0.000037625225,0.0004462125,0.000039759132,0.0003619996,3.9287957e-7],"study_design_candidate":"simulation_or_modeling","study_design_consensus":null,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[6.15658e-7,0.00011932912,0.023979716,0.00001601087,0.000007522866,0.000015460477,0.00058868283,0.010314939,0.8771387,0.00017817302,0.00001887167,0.08762201],"study_design_scores_gemma":[0.00015863604,0.0006188897,0.025142407,0.00039051397,0.00002651957,0.0022319339,0.00003810584,0.9590226,0.011799429,0.00041696412,0.00000836528,0.00014563005],"about_ca_topic_score_codex":0.00006811405,"about_ca_topic_score_gemma":0.000008036946,"teacher_disagreement_score":0.94870764,"about_ca_system_score_codex":0.00018886945,"about_ca_system_score_gemma":0.0002342085,"threshold_uncertainty_score":0.41165158},"labels":[],"label_agreement":null},{"id":"W1555935381","doi":"10.1023/a:1008365918776","title":"Diagnosis Method Using ΔIDDQ Probabilistic Signatures: Theory and Results","year":2000,"lang":"en","type":"article","venue":"Journal of Electronic Testing","topic":"VLSI and Analog Circuit Testing","field":"Computer Science","cited_by":4,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":true,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"École de Technologie Supérieure","funders":"Natural Sciences and Engineering Research Council of Canada","keywords":"Robustness (evolution); Computer science; Engineering","score_opus":0.02693613044304337,"score_gpt":0.28762815525512364,"score_spread":0.26069202481208026,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W1555935381","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"codex-gemma-dda1882f352a","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.6274374,0.0068539763,0.36287656,0.00043494537,0.0001412141,0.00018536719,0.0000017570356,0.00013841596,0.0019303232],"genre_scores_gemma":[0.93727684,0.000026316186,0.062244553,0.00016541217,0.0002315864,0.000001608438,1.6418575e-7,0.00001355358,0.000039984086],"study_design_codex":"design_other","study_design_gemma":"simulation_or_modeling","domain_scores_codex":[0.9978365,0.00039498755,0.00067532767,0.00027669818,0.0002871376,0.0005293886],"domain_scores_gemma":[0.99490225,0.0040234816,0.0005254018,0.00021737974,0.00020519929,0.00012629056],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.004242643,0.000164928,0.00028075243,0.00014292846,0.00023482944,0.00017447959,0.00053085294,0.00006696719,0.000009885885],"category_scores_gemma":[0.005142278,0.00013647215,0.00007640311,0.00059348176,0.00003937897,0.00050312566,0.000055312394,0.00061471417,0.0000014113136],"study_design_candidate":"design_other","study_design_consensus":null,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.0000087064755,0.00006635633,0.00079449144,0.000028619894,0.000046133577,0.00010246029,0.0005519637,0.029473878,0.0023110372,0.008329726,0.000043808002,0.95824283],"study_design_scores_gemma":[0.0022032852,0.0016003085,0.004788655,0.0014491596,0.00022015203,0.0066685,0.00010447736,0.72739494,0.0013102784,0.25184175,0.0015519316,0.00086653675],"about_ca_topic_score_codex":0.00001783539,"about_ca_topic_score_gemma":0.0000030129577,"teacher_disagreement_score":0.9573763,"about_ca_system_score_codex":0.00013392848,"about_ca_system_score_gemma":0.00039243768,"threshold_uncertainty_score":0.6156159},"labels":[],"label_agreement":null},{"id":"W1592870878","doi":"10.1023/a:1012207210784","title":"Design for Delay Testability in High-Speed Digital ICs","year":2001,"lang":"en","type":"article","venue":"Journal of Electronic Testing","topic":"VLSI and Analog Circuit Testing","field":"Computer Science","cited_by":2,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of Waterloo","funders":"","keywords":"Testability; Computer science; Reliability engineering; Embedded system; Engineering","score_opus":0.04282486703744718,"score_gpt":0.2572983600603183,"score_spread":0.21447349302287114,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W1592870878","genre_codex":"methods","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"codex-gemma-dda1882f352a","genre_candidate":"empirical","genre_consensus":null,"domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.36568952,0.0002173324,0.63353765,0.00019977786,0.00007016852,0.00010115177,3.0789005e-7,0.000039182192,0.00014490305],"genre_scores_gemma":[0.9773548,0.0000028189315,0.02238055,0.00006207105,0.00016901475,0.0000017603081,3.4378664e-7,0.000012132164,0.000016494729],"study_design_codex":"design_other","study_design_gemma":"simulation_or_modeling","domain_scores_codex":[0.9981663,0.000061083454,0.00063655665,0.00022071398,0.00025062982,0.00066470733],"domain_scores_gemma":[0.99676025,0.0021550641,0.00046009495,0.00017377552,0.00035303074,0.00009781371],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0016675559,0.00014413889,0.00027566345,0.00017416751,0.000107205604,0.00021379284,0.0006226642,0.000053621905,0.0000015745098],"category_scores_gemma":[0.0029806616,0.000128983,0.00008364272,0.0007950477,0.000024006964,0.0009801663,0.000053843756,0.0004098974,0.0000017282832],"study_design_candidate":"simulation_or_modeling","study_design_consensus":null,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.000016639126,0.00048760243,0.1755556,0.000042670174,0.00005388766,0.00036877408,0.00047334502,0.07546505,0.009019297,0.0045229024,0.00011440149,0.7338798],"study_design_scores_gemma":[0.0022537818,0.0023783662,0.016386777,0.00026952158,0.000026827656,0.0035924967,0.00005252224,0.8931532,0.0007450091,0.08027704,0.00033973347,0.00052469963],"about_ca_topic_score_codex":0.000011556488,"about_ca_topic_score_gemma":0.000005862042,"teacher_disagreement_score":0.81768817,"about_ca_system_score_codex":0.00030367528,"about_ca_system_score_gemma":0.00064248726,"threshold_uncertainty_score":0.5259774},"labels":[],"label_agreement":null},{"id":"W1968180136","doi":"10.1007/s10836-009-5124-4","title":"Low-Cost 20 Gbps Digital Test Signal Synthesis Using SiGe and InP Logic","year":2010,"lang":"en","type":"article","venue":"Journal of Electronic Testing","topic":"Semiconductor Lasers and Optical Devices","field":"Engineering","cited_by":4,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Air Canada","funders":"Georgia Institute of Technology","keywords":"Materials science; SIGNAL (programming language); Electronic engineering; Optoelectronics; Computer science; Embedded system; Computer hardware; Engineering; Programming language","score_opus":0.015506629055392827,"score_gpt":0.21994626645915924,"score_spread":0.20443963740376642,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W1968180136","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"codex-gemma-dda1882f352a","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9979327,0.00049680023,0.00062277325,0.000031248124,0.00013665603,0.000052238378,0.0000051168545,0.000049057082,0.0006734643],"genre_scores_gemma":[0.9977656,0.000008381775,0.0017940238,0.000027196165,0.00036629464,9.533158e-7,4.3857938e-7,0.000030501005,0.000006631707],"study_design_codex":"bench_or_experimental","study_design_gemma":"simulation_or_modeling","domain_scores_codex":[0.9989136,0.000008338992,0.00036205325,0.00010831335,0.00016322432,0.00044449462],"domain_scores_gemma":[0.9985039,0.0010249835,0.00013822695,0.000082385326,0.000103328806,0.000147137],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00024155734,0.00016474315,0.0002491449,0.00010135528,0.000073545685,0.0001280965,0.00015254924,0.00008829552,0.00005407283],"category_scores_gemma":[0.0012527993,0.0001378735,0.000060854563,0.00019277177,0.00004900894,0.00045274952,0.000024551331,0.00076513924,0.0000043397013],"study_design_candidate":"bench_or_experimental","study_design_consensus":null,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.000011251865,0.00007468072,0.02256961,0.000075484546,0.00007942166,0.00008726765,0.000051701973,0.00963477,0.9374436,0.0001126309,0.00005402875,0.029805556],"study_design_scores_gemma":[0.0013951947,0.0008272771,0.01226737,0.0010147564,0.00039513147,0.005282367,0.00028403554,0.76538867,0.205776,0.004207102,0.0016615775,0.0015005125],"about_ca_topic_score_codex":0.0000039387783,"about_ca_topic_score_gemma":0.000008305407,"teacher_disagreement_score":0.75575393,"about_ca_system_score_codex":0.00007686079,"about_ca_system_score_gemma":0.00009327615,"threshold_uncertainty_score":0.56223184},"labels":[],"label_agreement":null},{"id":"W1979404875","doi":"10.1007/s10836-005-1543-z","title":"Functional Fault Equivalence and Diagnostic Test Generation in Combinational Logic Circuits Using Conventional ATPG","year":2005,"lang":"en","type":"article","venue":"Journal of Electronic Testing","topic":"VLSI and Analog Circuit Testing","field":"Computer Science","cited_by":25,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of Toronto","funders":"","keywords":"Automatic test pattern generation; Combinational logic; Computer science; Equivalence (formal languages); Algorithm; Reliability engineering; Sequential logic; Fault coverage; Parallel computing; Electronic circuit; Logic gate; Engineering; Mathematics; Electrical engineering; Discrete mathematics","score_opus":0.06617603612310759,"score_gpt":0.274039001556087,"score_spread":0.20786296543297944,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W1979404875","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"codex-gemma-dda1882f352a","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.7214885,0.0017967854,0.27545843,0.0007954002,0.00015724203,0.00008648052,0.0000011086578,0.000031879466,0.00018418877],"genre_scores_gemma":[0.99418044,0.000012416989,0.0050583193,0.0002066532,0.00051562453,0.0000019835675,0.0000023615657,0.00000797534,0.000014195379],"study_design_codex":"simulation_or_modeling","study_design_gemma":"simulation_or_modeling","domain_scores_codex":[0.9982592,0.0000746685,0.0005907226,0.00023217492,0.00044525482,0.0003979982],"domain_scores_gemma":[0.9967809,0.0021703641,0.0004801742,0.00009059352,0.00039257322,0.00008543741],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.001032999,0.00013752529,0.00018867635,0.00024878085,0.00020922642,0.00013526727,0.0002683701,0.000054533408,0.0000147341825],"category_scores_gemma":[0.0047183684,0.00013733612,0.000052038144,0.0004960427,0.000047198144,0.0009763471,0.00006323941,0.00041597182,0.0000034287864],"study_design_candidate":"simulation_or_modeling","study_design_consensus":"simulation_or_modeling","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.0000010724833,0.00070459605,0.21522067,0.000051155763,0.00005359117,0.00014957853,0.00024596276,0.31674647,0.09970283,0.072010264,0.00024826985,0.29486552],"study_design_scores_gemma":[0.000917148,0.0002744307,0.07834149,0.00016963203,0.000015950402,0.0023644527,0.000010560602,0.9084009,0.0003184672,0.008937309,0.000051079,0.0001986138],"about_ca_topic_score_codex":0.000008845192,"about_ca_topic_score_gemma":0.000013484612,"teacher_disagreement_score":0.59165436,"about_ca_system_score_codex":0.0003466856,"about_ca_system_score_gemma":0.0005630116,"threshold_uncertainty_score":0.56486684},"labels":[],"label_agreement":null},{"id":"W1988957663","doi":"10.1007/s10836-005-6142-5","title":"An Analog Circuit Fault Characterization Methodology","year":2005,"lang":"en","type":"article","venue":"Journal of Electronic Testing","topic":"VLSI and Analog Circuit Testing","field":"Computer Science","cited_by":2,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of British Columbia","funders":"","keywords":"Computer science; Interpolation (computer graphics); Fault (geology); Impulse (physics); Algorithm; Fault coverage; Data mining; Electronic circuit; Artificial intelligence; Engineering","score_opus":0.07310959031122055,"score_gpt":0.3039439901987346,"score_spread":0.23083439988751403,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W1988957663","genre_codex":"methods","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"codex-gemma-dda1882f352a","genre_candidate":"empirical","genre_consensus":null,"domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.29295287,0.00016822714,0.7059445,0.00034703617,0.000108375185,0.00003326407,2.7993374e-7,0.00007458407,0.0003709053],"genre_scores_gemma":[0.9647774,0.0000051147604,0.033955842,0.00043166114,0.000793809,8.930401e-7,0.0000016368051,0.000012559516,0.000021050902],"study_design_codex":"design_other","study_design_gemma":"simulation_or_modeling","domain_scores_codex":[0.9980806,0.00027931097,0.0005971384,0.00022439723,0.00027136225,0.00054717803],"domain_scores_gemma":[0.9979649,0.0005030966,0.0007627989,0.00025569517,0.00037788125,0.00013559853],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.002016789,0.00014049135,0.00028355606,0.00024997818,0.00015877401,0.00013732947,0.0008726453,0.00007107856,0.000009758584],"category_scores_gemma":[0.001135509,0.0001290071,0.00007988993,0.00064896833,0.00002230956,0.0013603538,0.000039572413,0.0005024764,0.0000074713066],"study_design_candidate":"simulation_or_modeling","study_design_consensus":null,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[5.569328e-7,0.000062927145,0.00414263,0.000005346144,0.000021717,0.000025289792,0.0003310127,0.002939474,0.2312376,0.008490102,0.000008506275,0.75273484],"study_design_scores_gemma":[0.0013887674,0.002797531,0.066986,0.00021313968,0.00009829384,0.008535141,0.00008223059,0.8811813,0.011615845,0.022419984,0.0038214566,0.0008603074],"about_ca_topic_score_codex":0.000006661644,"about_ca_topic_score_gemma":0.000006731683,"teacher_disagreement_score":0.87824184,"about_ca_system_score_codex":0.00017264474,"about_ca_system_score_gemma":0.00042041697,"threshold_uncertainty_score":0.52607566},"labels":[],"label_agreement":null},{"id":"W1998292906","doi":"10.1007/s10836-009-5127-1","title":"Testing Multilayer Flexible Wireless Multisensor Platforms","year":2009,"lang":"en","type":"article","venue":"Journal of Electronic Testing","topic":"VLSI and Analog Circuit Testing","field":"Computer Science","cited_by":3,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Simon Fraser University","funders":"","keywords":"Embedded system; Wireless; System testing; Computer science; Reliability (semiconductor); Integration testing; Bandwidth (computing); Engineering; Computer hardware; Power (physics); Computer network; Telecommunications","score_opus":0.03771603001357316,"score_gpt":0.2655309691858157,"score_spread":0.22781493917224255,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W1998292906","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"codex-gemma-dda1882f352a","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.8426809,0.0005972092,0.15362279,0.000294282,0.00021056864,0.0001117203,3.4543797e-7,0.0003076355,0.0021745837],"genre_scores_gemma":[0.9504135,0.000002225399,0.0487471,0.00032892675,0.00043240137,8.3904365e-7,2.2226995e-7,0.00001729424,0.00005744679],"study_design_codex":"design_other","study_design_gemma":"simulation_or_modeling","domain_scores_codex":[0.99726033,0.000035718116,0.00085467275,0.0003150748,0.00052161573,0.0010125884],"domain_scores_gemma":[0.99693966,0.0009676294,0.00094428635,0.00031669385,0.0006213428,0.00021040834],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0011186709,0.00026125848,0.0004131427,0.00027777645,0.00032089275,0.00022962091,0.0010658734,0.0000874968,0.000003252241],"category_scores_gemma":[0.0023363216,0.000219284,0.00014084009,0.0011909191,0.000027779422,0.0011348956,0.00007279482,0.0008629875,0.000011792725],"study_design_candidate":"simulation_or_modeling","study_design_consensus":null,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.000001925838,0.0001264679,0.007925541,0.000014191478,0.000027240345,0.0001994813,0.0002504638,0.006717709,0.07998857,0.003719122,0.000072200746,0.9009571],"study_design_scores_gemma":[0.0016659022,0.0020946276,0.03671107,0.00070113956,0.000045959285,0.005647863,0.000073602474,0.9248277,0.010677474,0.016550865,0.0002771562,0.00072666904],"about_ca_topic_score_codex":0.000015959986,"about_ca_topic_score_gemma":0.000002124343,"teacher_disagreement_score":0.91810995,"about_ca_system_score_codex":0.00023532298,"about_ca_system_score_gemma":0.0005560007,"threshold_uncertainty_score":0.8942142},"labels":[],"label_agreement":null},{"id":"W1999402023","doi":"10.1007/s10836-007-5035-1","title":"Design of Low Power & Reliable Networks on Chip Through Joint Crosstalk Avoidance and Multiple Error Correction Coding","year":2008,"lang":"en","type":"article","venue":"Journal of Electronic Testing","topic":"Interconnection Networks and Systems","field":"Computer Science","cited_by":45,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of British Columbia","funders":"","keywords":"Retransmission; Dependability; Computer science; Error detection and correction; Network on a chip; Crosstalk; Dissipation; Interconnection; Embedded system; System on a chip; Chip; Energy consumption; Electronic engineering; Coding (social sciences); Engineering; Algorithm; Electrical engineering; Computer network; Telecommunications","score_opus":0.055383048353529286,"score_gpt":0.252881047933277,"score_spread":0.1974979995797477,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W1999402023","genre_codex":"methods","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"codex-gemma-dda1882f352a","genre_candidate":"empirical","genre_consensus":null,"domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.2321785,0.00063899887,0.765705,0.00005256944,0.0010453456,0.000102728525,9.759519e-8,0.00003095696,0.0002458335],"genre_scores_gemma":[0.9866389,0.000044136264,0.012814897,0.00008857394,0.00022921948,0.0000015525802,1.4432017e-7,0.0000137448005,0.00016885709],"study_design_codex":"simulation_or_modeling","study_design_gemma":"simulation_or_modeling","domain_scores_codex":[0.9983213,0.00012986353,0.00065379177,0.00021017126,0.00026193695,0.00042292543],"domain_scores_gemma":[0.9978606,0.0006627518,0.00088992,0.00019697624,0.0003306212,0.000059139868],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00108033,0.00015129162,0.00033090977,0.00009344605,0.00032128918,0.00007254837,0.00023260262,0.00007866576,0.000003933896],"category_scores_gemma":[0.0005549443,0.00012868691,0.000079114914,0.00038046952,0.000047668396,0.0004899176,0.000044171244,0.00058971945,0.0000015252492],"study_design_candidate":"simulation_or_modeling","study_design_consensus":"simulation_or_modeling","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.000081000195,0.00008044549,0.0021429213,0.000016438651,0.000037537015,0.000021561216,0.0010832882,0.987774,0.0053669624,0.00056982064,0.0020163804,0.0008096059],"study_design_scores_gemma":[0.00060861674,0.0011423783,0.00130783,0.00063737866,0.000006395835,0.002449228,0.000038855906,0.99130505,0.0016876813,0.00033419085,0.00031884847,0.00016353348],"about_ca_topic_score_codex":0.000037868787,"about_ca_topic_score_gemma":0.000008645183,"teacher_disagreement_score":0.7544604,"about_ca_system_score_codex":0.00017498725,"about_ca_system_score_gemma":0.00017530199,"threshold_uncertainty_score":0.52476996},"labels":[],"label_agreement":null},{"id":"W2002234294","doi":"10.1023/a:1027418704942","title":"On Faster IDDQ Measurements","year":2003,"lang":"en","type":"article","venue":"Journal of Electronic Testing","topic":"Integrated Circuits and Semiconductor Failure Analysis","field":"Engineering","cited_by":0,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"École de Technologie Supérieure","funders":"","keywords":"Key (lock); Computer science; Algorithm; Operating system","score_opus":0.03105263204613115,"score_gpt":0.21953119749502248,"score_spread":0.18847856544889133,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2002234294","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"codex-gemma-dda1882f352a","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9563751,0.0011235842,0.0025113577,0.000022235254,0.00028436998,0.000039436323,3.4775326e-7,0.00004831994,0.03959523],"genre_scores_gemma":[0.999448,0.0000039918154,0.0003030145,0.000061840234,0.0000788166,5.5515403e-7,2.1498286e-7,0.000021617972,0.000081949474],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.99900115,0.00003535332,0.0003266094,0.00006573385,0.0002404945,0.0003306893],"domain_scores_gemma":[0.9994701,0.000084811094,0.00010974521,0.00009106461,0.00018795174,0.00005631878],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0004388076,0.000118152566,0.0001881116,0.00015205235,0.000039946997,0.000033159737,0.00011055007,0.000045787398,0.00009758883],"category_scores_gemma":[0.00039450126,0.00009367864,0.00009290005,0.00027864394,0.0000066705047,0.00011080195,0.0000016224275,0.0004667094,0.000015224471],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00002339688,0.00017781027,0.0063100685,0.0000765984,0.0017954892,0.00008642348,0.00054795895,0.38951132,0.5576953,0.013571916,0.006613149,0.02359053],"study_design_scores_gemma":[0.009693112,0.0073527466,0.0022476958,0.0030758951,0.0025098003,0.005003031,0.0016596436,0.10951087,0.7034565,0.06412403,0.08695795,0.004408683],"about_ca_topic_score_codex":0.0000019358927,"about_ca_topic_score_gemma":0.00000477162,"teacher_disagreement_score":0.28000045,"about_ca_system_score_codex":0.0002280564,"about_ca_system_score_gemma":0.00008814508,"threshold_uncertainty_score":0.3820104},"labels":[],"label_agreement":null},{"id":"W2012213246","doi":"10.1007/s10836-013-5431-7","title":"Single-Event Transient Measurements on a DC/DC Pulse Width Modulator Using Heavy Ion, Proton, and Pulsed Laser","year":2014,"lang":"en","type":"article","venue":"Journal of Electronic Testing","topic":"Radiation Effects in Electronics","field":"Engineering","cited_by":6,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":true,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of Saskatchewan","funders":"Natural Sciences and Engineering Research Council of Canada; China Institute of Atomic Energy; Cisco Systems","keywords":"Proton; Laser; Pulsed laser; Transient (computer programming); Heavy ion; Pulse (music); Ion; Pulse-width modulation; Materials science; Atomic physics; Optics; Nuclear physics; Physics; Voltage; Detector; Computer science","score_opus":0.024950671294057526,"score_gpt":0.23946156473249391,"score_spread":0.21451089343843638,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2012213246","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"codex-gemma-dda1882f352a","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9772728,0.00070150604,0.020859411,0.00009642588,0.0002634048,0.00046849318,8.096463e-7,0.00009384956,0.0002432853],"genre_scores_gemma":[0.9977369,0.0000057557613,0.0017339818,0.000080283055,0.00034130734,0.000011944926,8.7324247e-7,0.00008210488,0.000006848106],"study_design_codex":"simulation_or_modeling","study_design_gemma":"simulation_or_modeling","domain_scores_codex":[0.99756783,0.0001539256,0.0006944579,0.0002174351,0.0005798756,0.0007864885],"domain_scores_gemma":[0.99883544,0.0002331936,0.00032581892,0.00020502297,0.00021830012,0.00018223844],"candidate_categories":["metaepi_narrow"],"consensus_categories":[],"category_scores_codex":[0.0014260275,0.00029800792,0.00039175362,0.00024845335,0.00013996592,0.00007827777,0.00018254433,0.0001042561,0.000008019544],"category_scores_gemma":[0.0006485715,0.00028319005,0.00010072719,0.00036825016,0.000028356899,0.0002650277,0.0000112510825,0.00070459,0.000002007449],"study_design_candidate":"simulation_or_modeling","study_design_consensus":"simulation_or_modeling","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00005581462,0.00012913533,0.000531904,0.0000945491,0.00010736989,0.000004472363,0.00009821499,0.905918,0.07512629,0.000035784422,0.0000300694,0.017868422],"study_design_scores_gemma":[0.0014531891,0.0019636862,0.00091878464,0.00036976987,0.00009614669,0.00027943336,0.000006732569,0.92573047,0.06724211,0.00062748545,0.0009831015,0.0003291032],"about_ca_topic_score_codex":0.000005658365,"about_ca_topic_score_gemma":0.000008472144,"teacher_disagreement_score":0.020464087,"about_ca_system_score_codex":0.0011630387,"about_ca_system_score_gemma":0.00019702844,"threshold_uncertainty_score":0.99996203},"labels":[],"label_agreement":null},{"id":"W2013029218","doi":"10.1007/s10836-010-5148-9","title":"Defining and Providing Coverage for Assertion-Based Dynamic Verification","year":2010,"lang":"en","type":"article","venue":"Journal of Electronic Testing","topic":"Formal Methods in Verification","field":"Computer Science","cited_by":9,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"McGill University; CMC Microsystems (Canada)","funders":"","keywords":"Assertion; Nondeterministic algorithm; Computer science; Programming language; Automaton; Property (philosophy); Key (lock); Code coverage; Theoretical computer science; Algorithm; Software; Computer security","score_opus":0.014214017486795101,"score_gpt":0.2958769194560997,"score_spread":0.28166290196930455,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2013029218","genre_codex":"methods","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"codex-gemma-dda1882f352a","genre_candidate":"methods","genre_consensus":null,"domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.3136696,0.00011057792,0.6857036,0.00016173618,0.00018374599,0.00008864866,2.5357375e-7,0.00002743524,0.000054427033],"genre_scores_gemma":[0.5544883,9.730479e-7,0.445441,0.000030262348,0.000026508773,0.000004624008,3.964373e-7,0.0000052817336,0.0000026568325],"study_design_codex":"bench_or_experimental","study_design_gemma":"simulation_or_modeling","domain_scores_codex":[0.99906266,0.000047095804,0.0003422333,0.00014471821,0.00015680198,0.00024650202],"domain_scores_gemma":[0.9982495,0.00067235075,0.00057391194,0.0001743705,0.00028019314,0.000049707734],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0018644171,0.00008147553,0.000119596276,0.00012269292,0.00016323951,0.00013254612,0.00031872466,0.000052020143,6.424312e-7],"category_scores_gemma":[0.0030558787,0.00007711703,0.00003859535,0.0002388931,0.000019080702,0.00060196064,0.000019537309,0.00037943217,5.4744766e-7],"study_design_candidate":"simulation_or_modeling","study_design_consensus":null,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00004536539,0.00007154125,0.0047279624,0.00008395962,0.000022960481,0.0000022061697,0.00023007572,0.004417538,0.39141044,0.22498496,0.000014029427,0.373989],"study_design_scores_gemma":[0.0003933299,0.000383425,0.007802136,0.00004311041,0.000012626181,0.00012276355,0.0000072289777,0.9713351,0.010794888,0.008681653,0.00032083382,0.000102897466],"about_ca_topic_score_codex":0.0000021699575,"about_ca_topic_score_gemma":0.0000036561923,"teacher_disagreement_score":0.9669176,"about_ca_system_score_codex":0.000101103724,"about_ca_system_score_gemma":0.00043590684,"threshold_uncertainty_score":0.3658393},"labels":[],"label_agreement":null},{"id":"W2016501039","doi":"10.1007/s10836-011-5206-y","title":"Analysis of Resistive Open Defects in Drowsy SRAM Cells","year":2011,"lang":"en","type":"article","venue":"Journal of Electronic Testing","topic":"Semiconductor materials and devices","field":"Engineering","cited_by":2,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Polytechnique Montréal; Concordia University","funders":"","keywords":"Static random-access memory; Resistive touchscreen; Fault (geology); Voltage; Embedded system; Engineering; Electrical engineering; Electronic engineering; Reliability engineering; Computer hardware; Computer science","score_opus":0.04106123653918303,"score_gpt":0.24908396542026573,"score_spread":0.2080227288810827,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2016501039","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"codex-gemma-dda1882f352a","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.99562556,0.0007664714,0.00005052598,0.0000013813018,0.00010722199,0.000050917475,0.0000014989316,0.00001176833,0.0033846518],"genre_scores_gemma":[0.998648,0.000012427279,0.0012709682,0.000008252992,0.00003898644,0.0000011045395,4.0992052e-7,0.000013382785,0.0000065038953],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9990605,0.000037355938,0.0004820309,0.000073698924,0.00010418545,0.00024223547],"domain_scores_gemma":[0.9993084,0.00017946235,0.00028038002,0.00009864291,0.00009382446,0.000039262966],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00056847284,0.0000911957,0.00039826435,0.00032725395,0.00001428419,0.00002458991,0.00029032558,0.000041429812,0.000079034675],"category_scores_gemma":[0.00015890454,0.000080807506,0.00007469918,0.0007159517,0.00001194851,0.00020198086,0.00003403288,0.00017280098,0.0000012121553],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.000072427676,0.00008968571,0.05516021,0.0000881811,0.0009968358,0.000045142504,0.001177846,0.047844652,0.8932023,0.00028515942,0.00007598763,0.00096156984],"study_design_scores_gemma":[0.0014125835,0.00095369766,0.27960208,0.00056058355,0.001704796,0.00006444861,0.0005697687,0.039004978,0.6726248,0.0027334446,0.00020479802,0.0005640274],"about_ca_topic_score_codex":0.00017863179,"about_ca_topic_score_gemma":0.00016070885,"teacher_disagreement_score":0.22444187,"about_ca_system_score_codex":0.000110708395,"about_ca_system_score_gemma":0.00008302651,"threshold_uncertainty_score":0.32952344},"labels":[],"label_agreement":null},{"id":"W2024266646","doi":"10.1007/s10836-005-4819-4","title":"A Realistic Timing Test Model and Its Applications in High-Speed Interconnect Devices","year":2005,"lang":"en","type":"article","venue":"Journal of Electronic Testing","topic":"VLSI and Analog Circuit Testing","field":"Computer Science","cited_by":0,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":true,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of British Columbia","funders":"Natural Sciences and Engineering Research Council of Canada; CMC Microsystems","keywords":"Test (biology); Interconnection; Computer science; Focus (optics); Reliability engineering; Simulation; Engineering; Embedded system; Telecommunications","score_opus":0.03608723652672524,"score_gpt":0.272369330211523,"score_spread":0.23628209368479774,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2024266646","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"codex-gemma-dda1882f352a","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.79661256,0.0026069821,0.19893123,0.0009386702,0.000023561714,0.00013138098,9.800663e-7,0.00007529817,0.00067930284],"genre_scores_gemma":[0.9894078,0.000012277891,0.010274541,0.00012838337,0.00014372989,0.0000023665004,3.5600272e-7,0.000009873109,0.000020672927],"study_design_codex":"design_other","study_design_gemma":"simulation_or_modeling","domain_scores_codex":[0.99869615,0.00003216851,0.00049913104,0.0001991893,0.00016984416,0.00040349818],"domain_scores_gemma":[0.99788725,0.0013124733,0.0004050317,0.00012971174,0.0001769722,0.00008852812],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0006832414,0.00012649284,0.00022223491,0.00022539748,0.000120126504,0.000114884235,0.00048039373,0.00003888553,0.0000010047262],"category_scores_gemma":[0.0014546494,0.00011431723,0.000034391218,0.0005176968,0.000013776399,0.0006485397,0.000079960446,0.00041267544,0.0000019695142],"study_design_candidate":"simulation_or_modeling","study_design_consensus":null,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.0000016616448,0.00032278892,0.027609704,0.00011687089,0.000045707926,0.000056666195,0.0014914665,0.34690604,0.03047887,0.05420297,0.000037057987,0.5387302],"study_design_scores_gemma":[0.00027929823,0.0001271258,0.0020224869,0.00019619298,0.000014571335,0.0003828264,0.000028154987,0.99226016,0.00021897178,0.004297171,0.000038921047,0.00013411726],"about_ca_topic_score_codex":0.000021011652,"about_ca_topic_score_gemma":0.00009618761,"teacher_disagreement_score":0.64535415,"about_ca_system_score_codex":0.00017610019,"about_ca_system_score_gemma":0.00027532328,"threshold_uncertainty_score":0.4661721},"labels":[],"label_agreement":null},{"id":"W2027766149","doi":"10.1007/s10836-009-5108-4","title":"Fault Detection Structures of the S-boxes and the Inverse S-boxes for the Advanced Encryption Standard","year":2009,"lang":"en","type":"article","venue":"Journal of Electronic Testing","topic":"Cryptographic Implementations and Security","field":"Computer Science","cited_by":42,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Western University","funders":"","keywords":"Inverse; Advanced Encryption Standard; Encryption; Computer science; Fault detection and isolation; Algorithm; Computer engineering; Fault (geology); Embedded system; Fault coverage; Parallel computing; Cryptography; Mathematics; Engineering; Electronic circuit; Computer network; Artificial intelligence","score_opus":0.011817747974241437,"score_gpt":0.2725081471953783,"score_spread":0.26069039922113685,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2027766149","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"codex-gemma-dda1882f352a","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.72651434,0.0009871637,0.26981783,0.0022452394,0.00014443956,0.00026302598,0.0000014460913,0.000009600812,0.00001692919],"genre_scores_gemma":[0.9930493,0.000049617804,0.0066897436,0.00013871994,0.00006532521,0.0000028575355,7.515869e-8,0.0000023848572,0.000001947586],"study_design_codex":"design_other","study_design_gemma":"theoretical_or_conceptual","domain_scores_codex":[0.99914545,0.00007841593,0.00029871435,0.00007909222,0.00022134952,0.0001769589],"domain_scores_gemma":[0.99839383,0.0007097843,0.00049119984,0.00015306339,0.0002348062,0.000017295803],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00093474635,0.0000716335,0.000118256896,0.000052355383,0.00040677853,0.00007812918,0.00035706334,0.000019938596,0.0000011064876],"category_scores_gemma":[0.0004991968,0.00003239806,0.000093689996,0.0003419207,0.00008308297,0.00023419994,0.0000317123,0.00021822938,1.428919e-8],"study_design_candidate":"theoretical_or_conceptual","study_design_consensus":null,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00032178155,0.000027671455,0.00078898616,0.000019681036,0.00009653381,5.954994e-7,0.0036106624,0.0069026435,0.027280409,0.15034442,0.00012269201,0.81048393],"study_design_scores_gemma":[0.005901487,0.0025175007,0.048290443,0.00010276944,0.00019437293,0.0004206565,0.0016662193,0.16414297,0.021552473,0.75202155,0.0029527405,0.00023679271],"about_ca_topic_score_codex":0.00001711647,"about_ca_topic_score_gemma":0.00018510202,"teacher_disagreement_score":0.8102471,"about_ca_system_score_codex":0.000041572894,"about_ca_system_score_gemma":0.00011654635,"threshold_uncertainty_score":0.31286526},"labels":[],"label_agreement":null},{"id":"W2036706191","doi":"10.1007/s10836-006-9502-x","title":"TBSA: Threshold-Based Simulation Accuracy Method for Fast Analog DC Fault Simulation","year":2006,"lang":"en","type":"article","venue":"Journal of Electronic Testing","topic":"VLSI and Analog Circuit Testing","field":"Computer Science","cited_by":1,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Polytechnique Montréal","funders":"","keywords":"Benchmark (surveying); Speedup; Convergence (economics); Computer science; Algorithm; Fault (geology); Parametric statistics; Parallel computing; Mathematics; Statistics","score_opus":0.03682807068470644,"score_gpt":0.3307642513125956,"score_spread":0.2939361806278892,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2036706191","genre_codex":"methods","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"codex-gemma-dda1882f352a","genre_candidate":"methods","genre_consensus":null,"domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.05286281,0.0003004767,0.94597155,0.00023262728,0.00011338657,0.00016669305,0.0000010377844,0.000097623495,0.00025379064],"genre_scores_gemma":[0.9061174,3.17862e-7,0.093162045,0.0001284969,0.0005495904,0.000003017207,0.0000031290824,0.00001871796,0.000017284447],"study_design_codex":"simulation_or_modeling","study_design_gemma":"simulation_or_modeling","domain_scores_codex":[0.9978027,0.00009420408,0.0008081184,0.0002809409,0.00040723124,0.0006068419],"domain_scores_gemma":[0.9928257,0.004906474,0.0011291186,0.00023146837,0.00083123235,0.00007602359],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0015898439,0.00019901908,0.00031500275,0.00028097123,0.000299281,0.00022312546,0.000551455,0.000084494175,0.0000027729066],"category_scores_gemma":[0.0021753765,0.00018123128,0.00018931272,0.00077956927,0.000015853677,0.0008586009,0.000034509423,0.00038467834,0.0000016729329],"study_design_candidate":"simulation_or_modeling","study_design_consensus":"simulation_or_modeling","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.000002491291,0.00004886751,0.0024450778,0.000017204544,0.000013320293,0.000007164535,0.000028608152,0.89150196,0.004410652,0.0016124736,0.000020201387,0.099891946],"study_design_scores_gemma":[0.0007635018,0.00036325658,0.002303531,0.00009794991,0.00003836415,0.000045951452,0.000006586503,0.9798416,0.00074265973,0.015332522,0.00027195798,0.00019212399],"about_ca_topic_score_codex":0.00003044934,"about_ca_topic_score_gemma":0.000017537724,"teacher_disagreement_score":0.8532546,"about_ca_system_score_codex":0.00025474335,"about_ca_system_score_gemma":0.000529883,"threshold_uncertainty_score":0.7390397},"labels":[],"label_agreement":null},{"id":"W2039810869","doi":"10.1007/s10836-011-5226-7","title":"Tungsten Lamps as an Affordable Light Source for Testing of Photovoltaic Cells","year":2011,"lang":"en","type":"article","venue":"Journal of Electronic Testing","topic":"Organic Electronics and Photovoltaics","field":"Engineering","cited_by":12,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Simon Fraser University","funders":"","keywords":"Photovoltaic system; Light source; Materials science; Optoelectronics; Tungsten; Silicon; Optics; Electrical engineering; Engineering; Physics; Metallurgy","score_opus":0.02189312402226936,"score_gpt":0.21200564082233833,"score_spread":0.19011251680006896,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2039810869","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"codex-gemma-dda1882f352a","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.99200296,0.0012868037,0.003287522,0.000007025553,0.00020387107,0.00024440003,0.0000034980471,0.000117747484,0.002846191],"genre_scores_gemma":[0.9852729,0.00002126315,0.01415651,0.000026614996,0.00026464873,0.0000062416075,0.0000012307314,0.0001117611,0.00013885135],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9978498,0.000030595107,0.00081498927,0.0001741355,0.00025436236,0.00087610865],"domain_scores_gemma":[0.9982064,0.00040740595,0.00052895246,0.00024541744,0.00044159414,0.00017022772],"candidate_categories":["metaepi_narrow"],"consensus_categories":[],"category_scores_codex":[0.0009308791,0.00026494596,0.00046734014,0.0001897125,0.00011094698,0.00003331462,0.00042832276,0.0001292644,0.000040410043],"category_scores_gemma":[0.0004661288,0.00025317277,0.00014596024,0.000518118,0.000024420273,0.0003004494,0.000029809742,0.00062354316,0.0000034113239],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.000040492818,0.00008881522,0.0008147897,0.00012982478,0.000111326764,0.000007026111,0.00054897054,0.003976315,0.9915429,0.00023973199,0.000179208,0.0023206386],"study_design_scores_gemma":[0.000670954,0.002586723,0.00007605483,0.00015779473,0.00012451122,0.0003258465,0.00013369143,0.045101937,0.9414853,0.0055133156,0.0035241703,0.00029968537],"about_ca_topic_score_codex":0.0000919168,"about_ca_topic_score_gemma":0.00004067279,"teacher_disagreement_score":0.050057545,"about_ca_system_score_codex":0.0002265582,"about_ca_system_score_gemma":0.00047046944,"threshold_uncertainty_score":0.9999921},"labels":[],"label_agreement":null},{"id":"W2042512025","doi":"10.1007/s10836-009-5131-5","title":"Qualifying Serial Interface Jitter Rapidly and Cost-effectively","year":2010,"lang":"en","type":"article","venue":"Journal of Electronic Testing","topic":"VLSI and Analog Circuit Testing","field":"Computer Science","cited_by":3,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"McGill University","funders":"","keywords":"Jitter; Transmitter; Computer science; Bit error rate; Interface (matter); Computer hardware; Electronic engineering; Real-time computing; Embedded system; Engineering; Telecommunications; Decoding methods; Parallel computing","score_opus":0.023635359675852823,"score_gpt":0.2826714233076269,"score_spread":0.25903606363177406,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2042512025","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"codex-gemma-dda1882f352a","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.77838933,0.00031834625,0.21982042,0.00036605526,0.000475244,0.0000934113,2.1099368e-7,0.00005991664,0.00047705957],"genre_scores_gemma":[0.9904516,0.000002348057,0.008843818,0.00013997893,0.00052940566,0.0000018076424,7.1409936e-8,0.000012619215,0.000018349388],"study_design_codex":"design_other","study_design_gemma":"simulation_or_modeling","domain_scores_codex":[0.99855566,0.000094714385,0.00041208856,0.0002113109,0.00022938762,0.00049686426],"domain_scores_gemma":[0.9981066,0.0008635305,0.0004925974,0.00016604784,0.00024285329,0.0001283907],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0015669928,0.00015006254,0.00024818958,0.00014260378,0.0001771686,0.00024636535,0.0005297492,0.00006568435,0.000005255833],"category_scores_gemma":[0.0017468205,0.00012904343,0.00006319596,0.000320406,0.000041710126,0.00070846383,0.00012156698,0.0010498088,0.0000035428054],"study_design_candidate":"simulation_or_modeling","study_design_consensus":null,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.0000038984617,0.00005442089,0.014495723,0.000029358394,0.00004485064,0.000058768073,0.0009041934,0.0003934241,0.42188498,0.0032799316,0.00013826547,0.5587122],"study_design_scores_gemma":[0.014545494,0.010206747,0.11762682,0.0023945044,0.0003707955,0.05253069,0.0007897842,0.5915479,0.12388188,0.06530042,0.016547153,0.0042578187],"about_ca_topic_score_codex":0.00001544917,"about_ca_topic_score_gemma":0.000016801132,"teacher_disagreement_score":0.59115446,"about_ca_system_score_codex":0.00006176364,"about_ca_system_score_gemma":0.00027955903,"threshold_uncertainty_score":0.5262238},"labels":[],"label_agreement":null},{"id":"W2045192830","doi":"10.1007/s10836-011-5237-4","title":"A Fault Detection Scheme for the FPGA Implementation of SHA-1 and SHA-512 Round Computations","year":2011,"lang":"en","type":"article","venue":"Journal of Electronic Testing","topic":"Cryptographic Implementations and Security","field":"Computer Science","cited_by":9,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Western University","funders":"","keywords":"Computer science; Hash function; Redundancy (engineering); Cryptographic hash function; Field-programmable gate array; Secure Hash Algorithm; Computation; Cryptography; Overhead (engineering); Parallel computing; SHA-2; Fault injection; Checksum; Embedded system; Algorithm; Software","score_opus":0.060921887296104676,"score_gpt":0.3200257502180179,"score_spread":0.25910386292191323,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2045192830","genre_codex":"methods","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"codex-gemma-dda1882f352a","genre_candidate":"empirical","genre_consensus":null,"domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.4038935,0.00024265822,0.59549874,0.00013411752,0.000058378584,0.00014528492,0.000001692098,0.000009277475,0.0000163386],"genre_scores_gemma":[0.9413392,0.00001020838,0.05855054,0.00003685121,0.00004791664,0.00000877367,6.3769323e-7,0.0000046987516,0.0000011755046],"study_design_codex":"design_other","study_design_gemma":"simulation_or_modeling","domain_scores_codex":[0.9990456,0.000036283014,0.0004365662,0.00010177829,0.00016154085,0.00021819938],"domain_scores_gemma":[0.9985246,0.00043810907,0.00053582515,0.00010187647,0.00036545377,0.00003413187],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0007535046,0.00007433523,0.00011538138,0.00013991912,0.0002561102,0.00006461398,0.00023112443,0.000019824629,0.000007849904],"category_scores_gemma":[0.00009859218,0.00005717366,0.000066197565,0.00039638378,0.000031218715,0.0004115802,0.000041826315,0.00014481288,1.12713096e-7],"study_design_candidate":"design_other","study_design_consensus":null,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.000055930876,0.00020949652,0.016170762,0.000084038766,0.0003699704,0.0000031523057,0.011946834,0.00055248843,0.014748334,0.079953074,0.00012911868,0.8757768],"study_design_scores_gemma":[0.0054253936,0.0057930425,0.26684982,0.00012109731,0.00034256905,0.0010340409,0.007634403,0.5444006,0.023486177,0.14298177,0.0013802536,0.00055084965],"about_ca_topic_score_codex":0.00017549552,"about_ca_topic_score_gemma":0.00035414824,"teacher_disagreement_score":0.87522596,"about_ca_system_score_codex":0.000048031838,"about_ca_system_score_gemma":0.00016661151,"threshold_uncertainty_score":0.23314743},"labels":[],"label_agreement":null},{"id":"W2048887088","doi":"10.1007/s10836-008-5088-9","title":"Modeling and Evaluating Errors Due to Random Clock Shifts in Quantum-Dot Cellular Automata Circuits","year":2008,"lang":"en","type":"article","venue":"Journal of Electronic Testing","topic":"Quantum-Dot Cellular Automata","field":"Computer Science","cited_by":7,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of British Columbia","funders":"","keywords":"Quantum dot cellular automaton; Adder; Cellular automaton; Computer science; Gaussian; Electronic circuit; Standard deviation; Phase (matter); Algorithm; Electronic engineering; Topology (electrical circuits); Mathematics; Physics; Engineering; Electrical engineering; Quantum mechanics; Statistics; Telecommunications","score_opus":0.053703584695196475,"score_gpt":0.2834961300481714,"score_spread":0.22979254535297494,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2048887088","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"codex-gemma-dda1882f352a","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.8188195,0.002164019,0.17807773,0.00035365327,0.00018675318,0.00023252027,3.336213e-7,0.00010646971,0.0000590168],"genre_scores_gemma":[0.9782309,0.000018355826,0.021434352,0.000119634264,0.00014375435,0.000005591327,5.538927e-7,0.00003833073,0.000008520022],"study_design_codex":"simulation_or_modeling","study_design_gemma":"simulation_or_modeling","domain_scores_codex":[0.99578667,0.00036779212,0.001309479,0.0005210048,0.0009426671,0.0010723721],"domain_scores_gemma":[0.9975529,0.0007278008,0.00057124154,0.00053159485,0.00033304913,0.0002834608],"candidate_categories":["metaepi_narrow"],"consensus_categories":[],"category_scores_codex":[0.0041921902,0.00032271768,0.0006921916,0.0006188107,0.0003001754,0.00014909921,0.0012451608,0.00010068536,0.0000036376139],"category_scores_gemma":[0.0026799764,0.0003128554,0.000119371136,0.0012588878,0.00003975003,0.0009324867,0.00034197696,0.0009319991,0.000011007536],"study_design_candidate":"simulation_or_modeling","study_design_consensus":"simulation_or_modeling","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00010578297,0.0003263614,0.0030727398,0.00013073855,0.000120501856,0.0034163336,0.0065314975,0.799415,0.1402772,0.0066218544,0.000069620604,0.03991237],"study_design_scores_gemma":[0.0022611325,0.00064593117,0.0013772278,0.00032562972,0.000022537657,0.0031017319,0.00005280446,0.9871599,0.00095001666,0.0037559832,0.000015436954,0.00033165616],"about_ca_topic_score_codex":0.000092306946,"about_ca_topic_score_gemma":0.000025869418,"teacher_disagreement_score":0.18774492,"about_ca_system_score_codex":0.00036159012,"about_ca_system_score_gemma":0.0011149044,"threshold_uncertainty_score":0.99993235},"labels":[],"label_agreement":null},{"id":"W2050770656","doi":"10.1007/s10836-007-5036-0","title":"Scan Division Algorithm for Shift and Capture Power Reduction for At-Speed Test Using Skewed-Load Test Application Strategy","year":2008,"lang":"en","type":"article","venue":"Journal of Electronic Testing","topic":"VLSI and Analog Circuit Testing","field":"Computer Science","cited_by":1,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"McMaster University","funders":"","keywords":"Automatic test pattern generation; Partition (number theory); Fault coverage; Reduction (mathematics); Power (physics); Test compression; Algorithm; Division (mathematics); Computer science; Test (biology); Fault (geology); Real-time computing; Engineering; Electronic circuit; Mathematics; Electrical engineering; Arithmetic","score_opus":0.02796782504774324,"score_gpt":0.26565660688886955,"score_spread":0.2376887818411263,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2050770656","genre_codex":"methods","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"codex-gemma-dda1882f352a","genre_candidate":"empirical","genre_consensus":null,"domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.22516195,0.0009761662,0.7731334,0.00018054114,0.000098089586,0.00031753202,0.0000049411,0.000058898833,0.00006848688],"genre_scores_gemma":[0.95249164,0.0000066641,0.04707158,0.000031221538,0.00033490683,0.0000056831086,0.0000022115898,0.000022447266,0.000033655564],"study_design_codex":"design_other","study_design_gemma":"simulation_or_modeling","domain_scores_codex":[0.99823236,0.000025522442,0.00054116704,0.00033873974,0.00030888972,0.000553309],"domain_scores_gemma":[0.9972134,0.0010785119,0.0007776882,0.0001828002,0.00061960047,0.00012797251],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0008677667,0.00019421979,0.00027752446,0.00013566407,0.0006691786,0.00010915914,0.00033421273,0.00009230735,7.570208e-7],"category_scores_gemma":[0.0012712793,0.00017925829,0.00010025084,0.00040929636,0.000050163675,0.00058664207,0.000057467336,0.00029620758,4.7429555e-7],"study_design_candidate":"simulation_or_modeling","study_design_consensus":null,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.000005568595,0.0003328577,0.012026209,0.000078475234,0.000059269827,0.000022141128,0.0010563312,0.006775392,0.278486,0.0008476238,0.00027073655,0.7000394],"study_design_scores_gemma":[0.0012889076,0.0016978064,0.007975879,0.00018217051,0.00005299234,0.004215436,0.00006762531,0.9757111,0.002961449,0.0052000238,0.00027380744,0.00037278372],"about_ca_topic_score_codex":0.0000393868,"about_ca_topic_score_gemma":0.000007638146,"teacher_disagreement_score":0.9689357,"about_ca_system_score_codex":0.00051126466,"about_ca_system_score_gemma":0.0007127054,"threshold_uncertainty_score":0.7309941},"labels":[],"label_agreement":null},{"id":"W2051713040","doi":"10.1007/s10836-014-5492-2","title":"Single Event Resilient Dynamic Logic Designs","year":2014,"lang":"en","type":"article","venue":"Journal of Electronic Testing","topic":"Radiation Effects in Electronics","field":"Engineering","cited_by":4,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":true,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of Saskatchewan","funders":"Natural Sciences and Engineering Research Council of Canada; Fundamental Research Funds for the Central Universities; University of Saskatchewan; Texas A and M University","keywords":"Charge sharing; Node (physics); Computer science; Inverter; Capacitor; Electronic engineering; Domino logic; Logic family; Logic gate; Event (particle physics); Differential (mechanical device); Logic synthesis; Electrical engineering; Engineering; Embedded system; Voltage; Physics","score_opus":0.01345552873136608,"score_gpt":0.23883098849007647,"score_spread":0.2253754597587104,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2051713040","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"codex-gemma-dda1882f352a","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.7467778,0.0033283054,0.24647996,0.0001390857,0.00047782704,0.00014003739,3.989469e-7,0.00020676159,0.0024498403],"genre_scores_gemma":[0.994756,0.000010747979,0.004890757,0.00005188046,0.0002049967,0.0000024824328,6.37857e-7,0.000046519992,0.000036012323],"study_design_codex":"simulation_or_modeling","study_design_gemma":"simulation_or_modeling","domain_scores_codex":[0.9983459,0.000103656785,0.0005154953,0.000111611786,0.0002844111,0.00063891226],"domain_scores_gemma":[0.9987059,0.0006368847,0.00026222414,0.0001727571,0.00012816039,0.00009402599],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0010323179,0.00017100429,0.00025355892,0.00017703949,0.00006915197,0.000037398117,0.00025454612,0.000073706884,0.000013602593],"category_scores_gemma":[0.0010680155,0.00016092141,0.00009629359,0.00034014712,0.000020212317,0.00015635836,0.000012967841,0.000619931,0.000011961586],"study_design_candidate":"simulation_or_modeling","study_design_consensus":"simulation_or_modeling","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.000006131195,0.000034744637,0.00006957547,0.00002294102,0.00004197217,0.000004663043,0.00003642824,0.9391473,0.030433822,0.00087682373,0.00019952901,0.029126046],"study_design_scores_gemma":[0.0003931919,0.0012289577,0.0006191567,0.00007973565,0.000043045584,0.0003568157,0.0000092493665,0.9843207,0.0029079085,0.0072184056,0.0026237047,0.00019912876],"about_ca_topic_score_codex":0.0000013655292,"about_ca_topic_score_gemma":0.000010385025,"teacher_disagreement_score":0.24797818,"about_ca_system_score_codex":0.0011394572,"about_ca_system_score_gemma":0.00014180827,"threshold_uncertainty_score":0.65621847},"labels":[],"label_agreement":null},{"id":"W2053538227","doi":"10.1007/s10836-013-5364-1","title":"A Bulk Built-In Voltage Sensor to Detect Physical Location of Single-Event Transients","year":2013,"lang":"en","type":"article","venue":"Journal of Electronic Testing","topic":"Radiation Effects in Electronics","field":"Engineering","cited_by":18,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":true,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of Saskatchewan","funders":"CMC Microsystems","keywords":"Voltage; Overhead (engineering); CMOS; Transistor; Electrical engineering; Grid; Event (particle physics); Electronic engineering; Engineering; Computer science; Physics","score_opus":0.009095666424434847,"score_gpt":0.23150464384857483,"score_spread":0.22240897742413998,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2053538227","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"codex-gemma-dda1882f352a","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9581006,0.00049607776,0.04084455,0.000074099844,0.00010190153,0.00023995223,3.9851423e-7,0.00004123128,0.000101158024],"genre_scores_gemma":[0.99786025,0.000002371877,0.0019015616,0.000019018351,0.0001586511,0.00000921384,3.3810693e-7,0.00003926159,0.000009332066],"study_design_codex":"simulation_or_modeling","study_design_gemma":"simulation_or_modeling","domain_scores_codex":[0.99848986,0.000044954857,0.00054309843,0.00011036371,0.0002915096,0.00052019884],"domain_scores_gemma":[0.99892926,0.00035631235,0.00020215064,0.00014304603,0.0002768488,0.00009237875],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0003684664,0.00015616471,0.00030503116,0.00026819884,0.000021480484,0.000021190212,0.00019584912,0.00005482363,0.000006681694],"category_scores_gemma":[0.0007341721,0.00015505569,0.00007139276,0.00086796563,0.000018376748,0.0002664159,0.000008725606,0.00044681446,0.000010068516],"study_design_candidate":"simulation_or_modeling","study_design_consensus":"simulation_or_modeling","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.0000076499655,0.000049932256,0.000110994835,0.000053864125,0.000027080176,0.0000025726156,0.00021707526,0.7272329,0.24895123,0.0000352405,0.000028826165,0.02328269],"study_design_scores_gemma":[0.0008131657,0.0015439015,0.005713603,0.0003410018,0.000043070806,0.0001152371,0.000047354122,0.9211861,0.06846023,0.0013331085,0.00014466574,0.00025858267],"about_ca_topic_score_codex":0.00003636652,"about_ca_topic_score_gemma":0.00003271253,"teacher_disagreement_score":0.19395322,"about_ca_system_score_codex":0.00070835324,"about_ca_system_score_gemma":0.00016044543,"threshold_uncertainty_score":0.63229877},"labels":[],"label_agreement":null},{"id":"W2056507375","doi":"10.1023/b:jett.0000023680.46155.65","title":"Testability Trade-Offs for BIST Data Paths","year":2004,"lang":"en","type":"article","venue":"Journal of Electronic Testing","topic":"VLSI and Analog Circuit Testing","field":"Computer Science","cited_by":0,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"McMaster University","funders":"","keywords":"Testability; Dissipation; Overhead (engineering); Design for testing; Embedded system; Built-in self-test; Reliability (semiconductor); Reliability engineering; Power (physics); Computer science; Engineering; Electrical engineering","score_opus":0.06976933420710488,"score_gpt":0.2916669194292798,"score_spread":0.22189758522217493,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2056507375","genre_codex":"methods","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"codex-gemma-dda1882f352a","genre_candidate":"empirical","genre_consensus":null,"domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.08363665,0.0017485486,0.9116155,0.002093567,0.00025137942,0.00017672789,0.0000065355925,0.00012368405,0.00034742686],"genre_scores_gemma":[0.94876873,0.0000042619013,0.05066361,0.00016716836,0.00037484645,0.0000017091529,0.0000020628734,0.000013418428,0.000004198957],"study_design_codex":"design_other","study_design_gemma":"simulation_or_modeling","domain_scores_codex":[0.9980591,0.00004269801,0.00062378315,0.00033270483,0.00030762336,0.00063407747],"domain_scores_gemma":[0.99757004,0.00089248095,0.0005811882,0.0006329438,0.00019477142,0.00012860374],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0020490834,0.00015285071,0.00027421484,0.000103533945,0.0002271736,0.00015768327,0.0019213978,0.000049486218,0.0000011375505],"category_scores_gemma":[0.0036853852,0.00013256667,0.000095859796,0.0005506137,0.00003723446,0.00095643953,0.00016560328,0.00044814218,0.0000014297477],"study_design_candidate":"design_other","study_design_consensus":null,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.0000028941813,0.00033668228,0.009835035,0.00008633326,0.00006436109,0.00007835729,0.00037102032,0.0032820413,0.010235695,0.01538121,0.00021058497,0.9601158],"study_design_scores_gemma":[0.0082721785,0.00707016,0.040370632,0.0013675927,0.00028992316,0.010229528,0.00026297188,0.5437551,0.0051975483,0.3701166,0.011098508,0.0019692194],"about_ca_topic_score_codex":0.00002111241,"about_ca_topic_score_gemma":0.000017039076,"teacher_disagreement_score":0.9581466,"about_ca_system_score_codex":0.00025491082,"about_ca_system_score_gemma":0.0014232707,"threshold_uncertainty_score":0.5405912},"labels":[],"label_agreement":null},{"id":"W2057757407","doi":"10.1023/b:jett.0000042513.15382.e7","title":"Efficient Realization of Parity Prediction Functions in FPGAs","year":2004,"lang":"en","type":"article","venue":"Journal of Electronic Testing","topic":"VLSI and Analog Circuit Testing","field":"Computer Science","cited_by":10,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of Saskatchewan","funders":"","keywords":"Field-programmable gate array; Benchmark (surveying); XOR gate; Realization (probability); Electronic circuit; Combinational logic; Gate array; Computer science; Algorithm; Parity (physics); Exclusive or; Boolean function; Logic gate; Mathematics; Arithmetic; Computer hardware; Engineering; Electrical engineering","score_opus":0.01807379146384248,"score_gpt":0.2325454924355357,"score_spread":0.21447170097169324,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2057757407","genre_codex":"methods","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"codex-gemma-dda1882f352a","genre_candidate":"empirical","genre_consensus":null,"domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.47616056,0.00018376336,0.5230371,0.000076532386,0.00009417923,0.000034267312,3.0507908e-7,0.000023706325,0.00038960637],"genre_scores_gemma":[0.99801767,0.000002055138,0.00186913,0.00001661238,0.00008519409,7.288039e-7,4.3545893e-7,0.000004419782,0.000003746581],"study_design_codex":"simulation_or_modeling","study_design_gemma":"simulation_or_modeling","domain_scores_codex":[0.9988161,0.000044685297,0.0005210991,0.00011501211,0.00024755672,0.00025555133],"domain_scores_gemma":[0.9989466,0.00014591076,0.0004905603,0.00011925141,0.00025431204,0.000043369448],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00087067107,0.00006987621,0.00014956779,0.000224389,0.000074198644,0.000026328868,0.00023176004,0.000036454603,9.942149e-7],"category_scores_gemma":[0.0008897308,0.00006536542,0.000049389113,0.0009326818,0.000017007653,0.00018020137,0.000028278571,0.0002889329,7.7493917e-7],"study_design_candidate":"simulation_or_modeling","study_design_consensus":"simulation_or_modeling","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[8.66621e-7,0.00014664061,0.025698634,0.000015015699,0.000009527445,0.000011136666,0.0002824518,0.93856263,0.005051862,0.011470925,0.000007680769,0.018742654],"study_design_scores_gemma":[0.0019954285,0.0014861878,0.12976807,0.0009098129,0.00004277297,0.0011672245,0.0001228549,0.82723093,0.0018778408,0.03510782,0.00005456284,0.0002364828],"about_ca_topic_score_codex":0.000071667746,"about_ca_topic_score_gemma":0.000027608105,"teacher_disagreement_score":0.52185714,"about_ca_system_score_codex":0.000287229,"about_ca_system_score_gemma":0.00051088224,"threshold_uncertainty_score":0.26655245},"labels":[],"label_agreement":null},{"id":"W2058763883","doi":"10.1007/s10836-014-5448-6","title":"The Effect of Temperature-Induced Quiescent Operating Point Shift on Single-Event Transient Sensitivity in Analog/Mixed-Signal Circuits","year":2014,"lang":"en","type":"article","venue":"Journal of Electronic Testing","topic":"Radiation Effects in Electronics","field":"Engineering","cited_by":2,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":true,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of Saskatchewan","funders":"Natural Sciences and Engineering Research Council of Canada; Cisco Systems","keywords":"Spice; Comparator; Analogue electronics; SIGNAL (programming language); Transient (computer programming); Analog signal; Electronic circuit; Mixed-signal integrated circuit; Sensitivity (control systems); Amplifier; Electronic engineering; Operational amplifier; Pulse-width modulation; Electrical engineering; Computer science; Engineering; Voltage; CMOS; Digital signal processing","score_opus":0.0065177934456944605,"score_gpt":0.2163019450339828,"score_spread":0.20978415158828836,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2058763883","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"codex-gemma-dda1882f352a","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.99610347,0.00054159475,0.0022625062,0.00012310727,0.0003376045,0.00027288336,7.644386e-7,0.000048322603,0.0003097579],"genre_scores_gemma":[0.99960315,0.000005411271,0.000050467057,0.000026288524,0.0002560518,0.000005850209,8.7667166e-7,0.00005042932,0.0000014898401],"study_design_codex":"simulation_or_modeling","study_design_gemma":"simulation_or_modeling","domain_scores_codex":[0.99692464,0.0006973962,0.0008858005,0.00018787076,0.0005052282,0.00079906656],"domain_scores_gemma":[0.9959772,0.0032181833,0.0003764037,0.00022550992,0.000106132815,0.00009657254],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.004876445,0.00030238667,0.0005375041,0.00021554944,0.00015253451,0.00007086515,0.00022311039,0.000121696605,0.0000018889207],"category_scores_gemma":[0.0014687623,0.00022406557,0.00017376427,0.00052510196,0.000033656008,0.00016205682,0.0000119077495,0.0014449777,0.0000013049784],"study_design_candidate":"simulation_or_modeling","study_design_consensus":"simulation_or_modeling","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.000028793584,0.000042320407,0.0006351524,0.00005883842,0.00006706157,0.00001398156,0.000172673,0.7578624,0.2070228,0.0002489171,0.000017581897,0.033829488],"study_design_scores_gemma":[0.0018951272,0.0073887357,0.015736245,0.0007817002,0.00007989694,0.00030461175,0.000038312748,0.63463503,0.33848447,0.00019290112,0.000073550575,0.00038945928],"about_ca_topic_score_codex":0.000012569735,"about_ca_topic_score_gemma":0.0001737231,"teacher_disagreement_score":0.13146165,"about_ca_system_score_codex":0.0010859938,"about_ca_system_score_gemma":0.00018042022,"threshold_uncertainty_score":0.91371286},"labels":[],"label_agreement":null},{"id":"W2060707258","doi":"10.1007/s10836-012-5338-8","title":"Single-Event Effects Analysis of a Pulse Width Modulator IC in a DC/DC Converter","year":2012,"lang":"en","type":"article","venue":"Journal of Electronic Testing","topic":"Radiation Effects in Electronics","field":"Engineering","cited_by":11,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of Saskatchewan","funders":"","keywords":"Pulse-width modulation; Electrical engineering; Materials science; Electronic engineering; CMOS; Modulation (music); Optoelectronics; Physics; Engineering; Voltage; Acoustics","score_opus":0.008301655587354321,"score_gpt":0.22690261433546,"score_spread":0.21860095874810567,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2060707258","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"codex-gemma-dda1882f352a","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.98105174,0.0052739223,0.013051431,0.000019825784,0.00023651692,0.00014379314,9.422235e-7,0.00004318662,0.00017865126],"genre_scores_gemma":[0.99876827,0.000011513226,0.00096144434,0.000029759985,0.0001689706,0.000005780229,0.0000015319662,0.000044955807,0.000007744278],"study_design_codex":"simulation_or_modeling","study_design_gemma":"simulation_or_modeling","domain_scores_codex":[0.9977438,0.00012766963,0.000792766,0.00011548748,0.00035409635,0.00086620625],"domain_scores_gemma":[0.9982705,0.00083476957,0.00043811253,0.000206608,0.0001146093,0.00013540346],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00111863,0.00021948075,0.0006443655,0.00087416737,0.00002742552,0.000019054585,0.0002189374,0.00010535319,0.00002171424],"category_scores_gemma":[0.0007544597,0.0002123415,0.00023566818,0.0018120788,0.000023510418,0.0003747359,0.000017755356,0.00064139074,0.0000026120495],"study_design_candidate":"simulation_or_modeling","study_design_consensus":"simulation_or_modeling","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.000024672305,0.00027516563,0.03122606,0.0001450671,0.0012726727,0.000012016817,0.00045176395,0.88281125,0.055450562,0.00023285508,0.000036566096,0.028061375],"study_design_scores_gemma":[0.0008256277,0.0006288426,0.042623144,0.00015420101,0.0007949651,0.000091809976,0.000013622989,0.9409646,0.013305235,0.00023963247,0.0001098386,0.00024851708],"about_ca_topic_score_codex":0.000015761134,"about_ca_topic_score_gemma":0.000032339223,"teacher_disagreement_score":0.058153342,"about_ca_system_score_codex":0.0011124593,"about_ca_system_score_gemma":0.0001511945,"threshold_uncertainty_score":0.86590356},"labels":[],"label_agreement":null},{"id":"W2063830984","doi":"10.1007/s10836-013-5399-3","title":"Online Testable Approaches in Reversible Logic","year":2013,"lang":"en","type":"article","venue":"Journal of Electronic Testing","topic":"Quantum Computing Algorithms and Architecture","field":"Computer Science","cited_by":17,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of Lethbridge","funders":"","keywords":"Correctness; Computer science; Overhead (engineering); Mathematical proof; Logic synthesis; Electronic circuit; Logic gate; Computer engineering; Theoretical computer science; Reliability engineering; Computer architecture; Algorithm; Programming language; Engineering; Mathematics","score_opus":0.044122191953623165,"score_gpt":0.24023292485865586,"score_spread":0.1961107329050327,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2063830984","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"codex-gemma-dda1882f352a","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.85319054,0.0015965123,0.14023615,0.003841574,0.00016942223,0.00014222894,2.6088813e-7,0.00007322965,0.00075009745],"genre_scores_gemma":[0.7854017,0.0000031969043,0.21419734,0.00018845516,0.00015135513,8.678607e-7,1.9804011e-7,0.0000069205275,0.000049978],"study_design_codex":"design_other","study_design_gemma":"simulation_or_modeling","domain_scores_codex":[0.9986347,0.00006803414,0.0003990954,0.00016984587,0.00021260961,0.00051573984],"domain_scores_gemma":[0.998922,0.00036553168,0.0003307602,0.00018203665,0.0001256223,0.00007405061],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0006163321,0.00011764809,0.00021904723,0.00020670504,0.00007026366,0.00011087839,0.0007095075,0.000041197498,0.0000059337594],"category_scores_gemma":[0.00041700035,0.00009119983,0.000057947716,0.00077658414,0.000018993816,0.00040172832,0.00012929241,0.0006712554,0.0000057246502],"study_design_candidate":"simulation_or_modeling","study_design_consensus":null,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.000008058412,0.0009547013,0.013010668,0.00006260322,0.000060167327,0.00017575928,0.00097032107,0.35084152,0.0042415336,0.01288959,0.001395335,0.6153897],"study_design_scores_gemma":[0.0003411443,0.00044189373,0.0064727943,0.00011348194,0.0000036371177,0.00061339623,0.000039599996,0.9594381,0.00015521872,0.032010946,0.00023513846,0.00013465468],"about_ca_topic_score_codex":0.000054526095,"about_ca_topic_score_gemma":0.000006692763,"teacher_disagreement_score":0.61525506,"about_ca_system_score_codex":0.00011157915,"about_ca_system_score_gemma":0.00030389216,"threshold_uncertainty_score":0.3719021},"labels":[],"label_agreement":null},{"id":"W2065353631","doi":"10.1007/s10836-013-5393-9","title":"A Library-Based Early Soft Error Sensitivity Analysis Technique for SRAM-Based FPGA Design","year":2013,"lang":"en","type":"article","venue":"Journal of Electronic Testing","topic":"Radiation Effects in Electronics","field":"Engineering","cited_by":14,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Polytechnique Montréal; CMC Microsystems (Canada); École de Technologie Supérieure","funders":"","keywords":"Static random-access memory; Field-programmable gate array; Sensitivity (control systems); Soft error; Computer science; Embedded system; Computer hardware; Electronic engineering; Engineering","score_opus":0.013511741953754148,"score_gpt":0.22404027896873716,"score_spread":0.210528537014983,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2065353631","genre_codex":"methods","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"codex-gemma-dda1882f352a","genre_candidate":"empirical","genre_consensus":null,"domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.12542745,0.00030570696,0.87299097,0.00019723226,0.0000612609,0.00067530473,0.0000036633812,0.0002718039,0.00006659397],"genre_scores_gemma":[0.88027877,4.5488065e-7,0.11925711,0.00010943799,0.00015686441,0.00009362516,0.000004294233,0.00008539666,0.000014049011],"study_design_codex":"simulation_or_modeling","study_design_gemma":"simulation_or_modeling","domain_scores_codex":[0.99784684,0.0002085894,0.0006207801,0.00019296938,0.00028953626,0.00084125355],"domain_scores_gemma":[0.99604756,0.0028630963,0.0004178865,0.00025484734,0.0002675852,0.00014903596],"candidate_categories":["metaepi_narrow"],"consensus_categories":[],"category_scores_codex":[0.0012871556,0.00028054297,0.0005140818,0.0006584368,0.00011185213,0.00013839063,0.00023705378,0.00016052839,0.000034907644],"category_scores_gemma":[0.00090641726,0.00027353677,0.00034491665,0.0014153686,0.000030936964,0.0005748593,0.000009214452,0.0007283642,0.0000052936834],"study_design_candidate":"simulation_or_modeling","study_design_consensus":"simulation_or_modeling","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.000026426123,0.0000403964,0.00069735246,0.00005025927,0.000325744,0.000007932259,0.000015483716,0.9771213,0.018018367,0.000033363172,0.00045551715,0.0032078712],"study_design_scores_gemma":[0.00054505444,0.0007542335,0.0014210183,0.000056755078,0.00037476548,0.00003182426,0.0000030034844,0.9583435,0.037156302,0.0008718488,0.00017084024,0.00027086295],"about_ca_topic_score_codex":0.000016948648,"about_ca_topic_score_gemma":0.0000069138464,"teacher_disagreement_score":0.75485134,"about_ca_system_score_codex":0.00046523567,"about_ca_system_score_gemma":0.0007652575,"threshold_uncertainty_score":0.9999717},"labels":[],"label_agreement":null},{"id":"W2078068977","doi":"10.1007/s10836-012-5289-0","title":"High Speed On-Chip Signal Generation for Debug and Diagnosis","year":2012,"lang":"en","type":"article","venue":"Journal of Electronic Testing","topic":"Advancements in PLL and VCO Technologies","field":"Engineering","cited_by":1,"is_retracted":false,"has_abstract":true,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"McGill University","funders":"","keywords":"Phase-locked loop; Electronic engineering; Delta-sigma modulation; CMOS; Computer science; SIGNAL (programming language); Filter (signal processing); Time domain; Chip; Digital signal processing; Frequency domain; Software portability; Digital signal processor; Engineering; Computer hardware; Embedded system; Electrical engineering; Phase noise","score_opus":0.03852424400412385,"score_gpt":0.25816769457102806,"score_spread":0.2196434505669042,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2078068977","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"codex-gemma-dda1882f352a","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9786185,0.0023949426,0.018493753,0.00007449488,0.00020382422,0.00007060362,0.0000011702965,0.00007117894,0.0000715193],"genre_scores_gemma":[0.98393065,0.000083645384,0.015374354,0.000025950496,0.00055608357,0.0000054676475,6.868913e-7,0.0000146572675,0.000008530626],"study_design_codex":"design_other","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9993863,0.000005824478,0.0001934144,0.00004537331,0.00007816031,0.0002909233],"domain_scores_gemma":[0.9994889,0.0003027213,0.00008934478,0.000045055036,0.000040825766,0.00003314849],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00021029125,0.00008278183,0.00011805119,0.00006759675,0.0000580242,0.000014978436,0.00006154839,0.000038427337,0.0000057173575],"category_scores_gemma":[0.00034061837,0.00006935114,0.000024515206,0.000071698036,0.000011917199,0.00017996345,0.000009005788,0.00018667917,6.697341e-7],"study_design_candidate":"bench_or_experimental","study_design_consensus":null,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.000054520166,0.0001849601,0.043477017,0.000119221855,0.00031226178,0.0000061140645,0.00021751015,0.19931282,0.15438347,0.015132505,0.004207994,0.5825916],"study_design_scores_gemma":[0.004265706,0.005664085,0.009972667,0.0005100198,0.00037639425,0.00059593376,0.00028574004,0.35013705,0.5724901,0.03451836,0.019867927,0.0013160252],"about_ca_topic_score_codex":7.589569e-7,"about_ca_topic_score_gemma":9.206952e-7,"teacher_disagreement_score":0.5812756,"about_ca_system_score_codex":0.000097262135,"about_ca_system_score_gemma":0.000013715575,"threshold_uncertainty_score":0.28280574},"labels":[],"label_agreement":null},{"id":"W2078296499","doi":"10.1007/s10836-005-0335-9","title":"Incremental Design Debugging in a Logic Synthesis Environment","year":2005,"lang":"en","type":"article","venue":"Journal of Electronic Testing","topic":"VLSI and Analog Circuit Testing","field":"Computer Science","cited_by":1,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of Toronto","funders":"","keywords":"Debugging; Programming language; Computer science; Algorithmic program debugging; Computer architecture; Arithmetic; Mathematics","score_opus":0.03815471650241003,"score_gpt":0.23273880808506633,"score_spread":0.1945840915826563,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2078296499","genre_codex":"methods","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"codex-gemma-dda1882f352a","genre_candidate":"empirical","genre_consensus":null,"domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.1531018,0.0017719158,0.8431181,0.00109027,0.000046873916,0.000100110614,1.0973257e-7,0.00006686211,0.00070396235],"genre_scores_gemma":[0.9216311,0.0000101242995,0.07802958,0.00016358336,0.00014876234,0.0000028612478,3.068274e-8,0.000008627694,0.000005344967],"study_design_codex":"design_other","study_design_gemma":"simulation_or_modeling","domain_scores_codex":[0.99827003,0.00014142846,0.00053711486,0.00018339288,0.00030730292,0.00056072173],"domain_scores_gemma":[0.9983976,0.0009280042,0.00041217025,0.00014828517,0.000035911045,0.00007806029],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.001767058,0.00013316507,0.00022185275,0.00022687022,0.00009938858,0.00007806969,0.00060868857,0.00003681824,0.000012916537],"category_scores_gemma":[0.0008482524,0.00011974557,0.00006491804,0.00033205093,0.000017835722,0.000556131,0.00008390623,0.00041038656,0.000011913741],"study_design_candidate":"simulation_or_modeling","study_design_consensus":null,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.0000016829403,0.00016798855,0.009531537,0.000009003797,0.000032104614,0.00015054904,0.00029095763,0.10047019,0.024539322,0.0016121656,0.000043397777,0.8631511],"study_design_scores_gemma":[0.00096015824,0.0008054235,0.010061314,0.000529511,0.000048592658,0.0029623597,0.00008230953,0.9621966,0.01211355,0.009289083,0.000398656,0.00055246236],"about_ca_topic_score_codex":0.000010375225,"about_ca_topic_score_gemma":0.000004898798,"teacher_disagreement_score":0.86259866,"about_ca_system_score_codex":0.000595878,"about_ca_system_score_gemma":0.00027738334,"threshold_uncertainty_score":0.48830825},"labels":[],"label_agreement":null},{"id":"W2085629207","doi":"10.1007/s10836-013-5398-4","title":"A Fault Tolerant Hierarchical Network on Chip Router Architecture","year":2013,"lang":"en","type":"article","venue":"Journal of Electronic Testing","topic":"Interconnection Networks and Systems","field":"Computer Science","cited_by":3,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"McGill University","funders":"","keywords":"Retransmission; Network on a chip; Redundancy (engineering); Virtual channel; Fault tolerance; Router; Latency (audio); Computer science; Network packet; Embedded system; Computer network; Distributed computing; Engineering; Channel (broadcasting)","score_opus":0.013691614012416716,"score_gpt":0.22269823189506682,"score_spread":0.2090066178826501,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2085629207","genre_codex":"methods","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"codex-gemma-dda1882f352a","genre_candidate":"empirical","genre_consensus":null,"domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.3707038,0.00052021886,0.6188596,0.0038959992,0.0013535619,0.00023692298,1.6546237e-7,0.000097677505,0.0043321],"genre_scores_gemma":[0.984676,0.0000014587683,0.012073788,0.0009832348,0.0020614984,0.0000056072827,1.4114536e-7,0.000013057399,0.00018523973],"study_design_codex":"simulation_or_modeling","study_design_gemma":"simulation_or_modeling","domain_scores_codex":[0.9980158,0.00017970546,0.00057261175,0.0002030003,0.0003541178,0.0006747241],"domain_scores_gemma":[0.9984359,0.0005345234,0.00041676153,0.00024925423,0.00022651367,0.00013703608],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00073492416,0.00016488333,0.0002922963,0.000115330135,0.00014072731,0.00026249618,0.0006582409,0.00007541682,0.000024460584],"category_scores_gemma":[0.00018364788,0.00011518125,0.00015291659,0.00039575296,0.000018751789,0.00027648068,0.000067989364,0.0010950031,0.000027643297],"study_design_candidate":"simulation_or_modeling","study_design_consensus":"simulation_or_modeling","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00006030194,0.00017046575,0.0017548237,0.000025639709,0.00018378423,0.00011341645,0.0010941852,0.6480015,0.0012344145,0.05760971,0.01796455,0.27178723],"study_design_scores_gemma":[0.00087889255,0.00285881,0.0041032713,0.00060037157,0.000014891206,0.003918907,0.000021577333,0.9282057,0.00009808714,0.046222493,0.012678896,0.00039810376],"about_ca_topic_score_codex":0.000021471247,"about_ca_topic_score_gemma":0.000008941634,"teacher_disagreement_score":0.6139722,"about_ca_system_score_codex":0.00012017932,"about_ca_system_score_gemma":0.00018599525,"threshold_uncertainty_score":0.47573045},"labels":[],"label_agreement":null},{"id":"W2087652213","doi":"10.1007/s10836-009-5125-3","title":"Applications for Low Frequency Impedance Analysis Systems","year":2009,"lang":"en","type":"article","venue":"Journal of Electronic Testing","topic":"Electrical and Bioimpedance Tomography","field":"Engineering","cited_by":3,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Thames Valley Children's Centre; Simon Fraser University","funders":"","keywords":"Instrumentation (computer programming); Electrical impedance; Electronic engineering; Electrical conductor; Electrical engineering; Computer science; Materials science; Engineering","score_opus":0.006762265601904397,"score_gpt":0.22538414293133752,"score_spread":0.2186218773294331,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2087652213","genre_codex":"methods","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"codex-gemma-dda1882f352a","genre_candidate":"empirical","genre_consensus":null,"domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.2640622,0.024131747,0.7094812,0.00015426616,0.000120119774,0.00047865818,0.000007614945,0.00024772665,0.001316464],"genre_scores_gemma":[0.9951406,0.000051330717,0.0044285567,0.000025742793,0.00030941507,0.000016434644,0.0000016330674,0.000011220832,0.0000150517335],"study_design_codex":"simulation_or_modeling","study_design_gemma":"simulation_or_modeling","domain_scores_codex":[0.9988566,0.000012100831,0.00045783794,0.00009624013,0.00015062689,0.00042660354],"domain_scores_gemma":[0.9991854,0.00020040422,0.00020277755,0.00011350064,0.00022016895,0.00007778662],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00030051052,0.000119787335,0.00029607557,0.0002928524,0.00007028277,0.00004008095,0.0001979048,0.000052121177,0.0000017356032],"category_scores_gemma":[0.00008065036,0.00010084274,0.0002335615,0.0018143794,0.000009729645,0.00012165135,0.000002278078,0.00027527817,0.0000010515165],"study_design_candidate":"simulation_or_modeling","study_design_consensus":"simulation_or_modeling","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.000041106356,0.00029697924,0.01211602,0.00034439878,0.002444882,0.000016387477,0.000104092105,0.55346584,0.16166313,0.016093936,0.001055016,0.2523582],"study_design_scores_gemma":[0.0011399592,0.0022697242,0.01044431,0.00017599051,0.0018700855,0.00030161976,0.000040914245,0.94860035,0.0036636996,0.026271967,0.004391875,0.00082951976],"about_ca_topic_score_codex":0.0000028768413,"about_ca_topic_score_gemma":0.0000025829297,"teacher_disagreement_score":0.73107845,"about_ca_system_score_codex":0.0001301201,"about_ca_system_score_gemma":0.00006912203,"threshold_uncertainty_score":0.41122478},"labels":[],"label_agreement":null},{"id":"W2089243034","doi":"10.1007/s10836-010-5186-3","title":"Experimental Results for Slow-speed Timing Characterization of High-speed Pipelined Datapaths","year":2010,"lang":"en","type":"article","venue":"Journal of Electronic Testing","topic":"VLSI and Analog Circuit Testing","field":"Computer Science","cited_by":0,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of Waterloo","funders":"","keywords":"Pipeline (software); Static timing analysis; CMOS; Computer science; Clock rate; Electronic engineering; Clock signal; Computer hardware; Embedded system; Electronic circuit; Engineering; Electrical engineering","score_opus":0.03216843612402115,"score_gpt":0.2735571862808576,"score_spread":0.24138875015683647,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2089243034","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"codex-gemma-dda1882f352a","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.8476084,0.000049295784,0.15140586,0.0002076523,0.00042268014,0.00012551686,0.000007560868,0.000047985457,0.00012509001],"genre_scores_gemma":[0.9819362,9.4992544e-7,0.017386764,0.000055063905,0.00055975124,9.201322e-7,0.000013599144,0.00001615323,0.00003056724],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.9980615,0.000040630006,0.00089097477,0.0002421074,0.0003099964,0.00045479275],"domain_scores_gemma":[0.9971563,0.0005163907,0.0013347806,0.00028836945,0.0006098301,0.00009429832],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.001273206,0.000155511,0.0003174298,0.00018417028,0.00015336549,0.00010028287,0.00075147214,0.00006926661,0.000002339675],"category_scores_gemma":[0.002388513,0.00014302369,0.00008807361,0.00047573744,0.00003007709,0.00077947904,0.000085320826,0.00043139354,0.0000011673494],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.000008912028,0.00007963426,0.00016996083,0.000012499412,0.000015856825,0.000006270734,0.00025992034,0.00016264286,0.97000843,0.0014157924,0.000030458086,0.02782964],"study_design_scores_gemma":[0.0032475744,0.001453049,0.0035834566,0.000286166,0.000045379362,0.00060717727,0.000062258376,0.4017482,0.58694464,0.0012780422,0.00035597844,0.00038805197],"about_ca_topic_score_codex":0.000016225064,"about_ca_topic_score_gemma":0.0000023436903,"teacher_disagreement_score":0.40158555,"about_ca_system_score_codex":0.000070589565,"about_ca_system_score_gemma":0.00043081393,"threshold_uncertainty_score":0.58323365},"labels":[],"label_agreement":null},{"id":"W2105094812","doi":"10.1007/s10836-011-5271-2","title":"Tester Memory Requirements and Test Application Time Reduction for Delay Faults with Digital Captureless Test Sensors","year":2011,"lang":"en","type":"article","venue":"Journal of Electronic Testing","topic":"VLSI and Analog Circuit Testing","field":"Computer Science","cited_by":0,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"École de Technologie Supérieure","funders":"","keywords":"Test compression; Reduction (mathematics); Overhead (engineering); Computer science; Embedded system; Compression (physics); Real-time computing; Volume (thermodynamics); Computer hardware; Automatic test pattern generation; Engineering; Electronic circuit; Electrical engineering","score_opus":0.022116438809302256,"score_gpt":0.22184872883180035,"score_spread":0.1997322900224981,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2105094812","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"codex-gemma-dda1882f352a","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.85346687,0.00024738576,0.1445057,0.00015291195,0.00006219394,0.0003496367,0.000003405725,0.00011858971,0.0010933086],"genre_scores_gemma":[0.9889488,0.0000014922409,0.010681635,0.000031277,0.00021600437,0.000007794161,0.0000014790651,0.000020782882,0.00009073157],"study_design_codex":"design_other","study_design_gemma":"simulation_or_modeling","domain_scores_codex":[0.99856836,0.000017687553,0.0004426657,0.00028318007,0.000245062,0.00044306074],"domain_scores_gemma":[0.9978229,0.0007284198,0.0006892385,0.00019487776,0.00045194195,0.00011266979],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0004938296,0.00017592231,0.00022107433,0.00013272786,0.00017988491,0.000121939265,0.00033817216,0.000055415087,9.120692e-7],"category_scores_gemma":[0.0010820605,0.00014144434,0.00004555976,0.0003489253,0.000049034054,0.0011196977,0.000043573644,0.00026630785,0.0000031185627],"study_design_candidate":"simulation_or_modeling","study_design_consensus":null,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.000029809476,0.0009973431,0.13404623,0.00017916808,0.00020726337,0.00011901763,0.0032823961,0.0011472736,0.1320338,0.0009176291,0.00025884915,0.72678125],"study_design_scores_gemma":[0.010790055,0.025639273,0.09169427,0.0027628657,0.0007139172,0.0604421,0.0011127382,0.7406498,0.040832043,0.020777391,0.00088250404,0.0037029965],"about_ca_topic_score_codex":0.000009802173,"about_ca_topic_score_gemma":0.0000020635512,"teacher_disagreement_score":0.73950255,"about_ca_system_score_codex":0.00011951078,"about_ca_system_score_gemma":0.00022167854,"threshold_uncertainty_score":0.5767933},"labels":[],"label_agreement":null},{"id":"W2109298620","doi":"10.1023/a:1023713517064","title":"Leakage Current in Sub-Quarter Micron MOSFET: A Perspective on Stressed Delta IDDQ Testing","year":2003,"lang":"en","type":"article","venue":"Journal of Electronic Testing","topic":"Advanced Materials and Semiconductor Technologies","field":"Materials Science","cited_by":17,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":true,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of Waterloo","funders":"Natural Sciences and Engineering Research Council of Canada","keywords":"Leakage (economics); Transistor; Voltage; Materials science; Threshold voltage; Electrical engineering; Electronic engineering; Nuclear engineering; Optoelectronics; Engineering","score_opus":0.03256182599490741,"score_gpt":0.29049569512355555,"score_spread":0.25793386912864813,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2109298620","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"codex-gemma-dda1882f352a","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.99611056,0.0027142894,0.0002762087,0.00008629224,0.00031116974,0.00013370975,0.000004886832,0.000071351205,0.0002915328],"genre_scores_gemma":[0.99644893,0.000027695334,0.0033512672,0.00002864298,0.00010769352,0.0000053125877,4.033504e-7,0.000025651329,0.00000440367],"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","domain_scores_codex":[0.99798006,0.00013058148,0.0006344732,0.0002920603,0.00025757207,0.00070527743],"domain_scores_gemma":[0.9982749,0.00049563363,0.00066784373,0.00019522524,0.00030919738,0.000057164994],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0008158696,0.0002301718,0.0003911866,0.00021358345,0.000111865185,0.000086337655,0.00031658728,0.000079923724,0.000029281786],"category_scores_gemma":[0.004115638,0.00019085348,0.00005820417,0.00038510104,0.00006821645,0.00031433973,0.00003540832,0.000621576,0.000012421441],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00004466002,0.00011271809,0.00092869595,0.000022987679,0.0000048386287,0.000037162557,0.00015404627,0.0015040941,0.99452746,0.001285773,0.000040882293,0.0013366695],"study_design_scores_gemma":[0.0011156654,0.0013980543,0.0008801085,0.00071415363,0.000022129929,0.00031176666,0.0011046043,0.00025937028,0.9747965,0.018823843,0.00022609468,0.0003477311],"about_ca_topic_score_codex":0.000029095196,"about_ca_topic_score_gemma":0.000028708673,"teacher_disagreement_score":0.019730994,"about_ca_system_score_codex":0.0007500338,"about_ca_system_score_gemma":0.0003274253,"threshold_uncertainty_score":0.7782779},"labels":[],"label_agreement":null},{"id":"W2114359066","doi":"10.1023/a:1023717617973","title":"Thermal Testing of Analogue Integrated Circuits: A Case Study","year":2003,"lang":"en","type":"article","venue":"Journal of Electronic Testing","topic":"VLSI and Analog Circuit Testing","field":"Computer Science","cited_by":0,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of British Columbia","funders":"","keywords":"Bridging (networking); Electronic circuit; Operational amplifier; Fault (geology); Waveform; Electronic engineering; Computer science; Thermal; Fault coverage; Amplifier; Reliability engineering; Engineering; Electrical engineering; Physics; Voltage; CMOS","score_opus":0.043169338756530944,"score_gpt":0.26527274950966556,"score_spread":0.2221034107531346,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2114359066","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"codex-gemma-dda1882f352a","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.93826497,0.00044832885,0.05962664,0.000017375514,0.000118776945,0.00013120902,4.5068785e-7,0.00006748625,0.0013247374],"genre_scores_gemma":[0.99382216,5.1692757e-7,0.006018912,0.000037917296,0.000090431226,0.0000019324873,1.3011896e-7,0.000019157009,0.0000088182505],"study_design_codex":"design_other","study_design_gemma":"simulation_or_modeling","domain_scores_codex":[0.9971742,0.0003760338,0.001069741,0.0002782876,0.00042673395,0.0006750033],"domain_scores_gemma":[0.9957279,0.0015151767,0.0012747505,0.0003388976,0.0010028027,0.0001404675],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.002719696,0.00023112209,0.0004753271,0.00034062442,0.00022103301,0.000112137786,0.0007178903,0.000057623885,0.000005093782],"category_scores_gemma":[0.0070496593,0.000193842,0.00011587396,0.002179538,0.00004204911,0.0005610461,0.00006242176,0.00080883934,0.0000014480586],"study_design_candidate":"design_other","study_design_consensus":null,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.0000017156386,0.0013670453,0.3770485,0.00007048877,0.00036603672,0.015506729,0.0040122415,0.02110545,0.06156665,0.0032973203,0.00002356093,0.5156343],"study_design_scores_gemma":[0.010555661,0.025590405,0.029884335,0.0025651944,0.0008487631,0.40806344,0.020775497,0.47190684,0.01697479,0.009466091,0.0003240646,0.00304492],"about_ca_topic_score_codex":0.00022756583,"about_ca_topic_score_gemma":0.00004007887,"teacher_disagreement_score":0.51258934,"about_ca_system_score_codex":0.00017649442,"about_ca_system_score_gemma":0.0013115084,"threshold_uncertainty_score":0.84396094},"labels":[],"label_agreement":null},{"id":"W2159145160","doi":"10.1007/s10836-013-5379-7","title":"Correlation of Heavy-Ion and Laser Testing on a DC/DC PWM Controller","year":2013,"lang":"en","type":"article","venue":"Journal of Electronic Testing","topic":"Radiation Effects in Electronics","field":"Engineering","cited_by":7,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":true,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of Saskatchewan","funders":"China Institute of Atomic Energy; CMC Microsystems","keywords":"Laser; Pulse-width modulation; Heavy ion; Materials science; Pulsed laser; Ion; Wavelength; Ultrafast laser spectroscopy; Controller (irrigation); Pulse (music); Transient (computer programming); Optoelectronics; Atomic physics; Optics; Physics; Voltage; Computer science; Detector","score_opus":0.007710728141407867,"score_gpt":0.20636812785608133,"score_spread":0.19865739971467347,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2159145160","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"codex-gemma-dda1882f352a","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.99249107,0.0012806297,0.0045044404,0.00008851936,0.00016752005,0.00022225127,5.833302e-7,0.00007162479,0.0011733547],"genre_scores_gemma":[0.9979092,0.000011140023,0.0017456766,0.000041534826,0.00022127613,0.00000623098,5.932778e-7,0.000040101088,0.000024234545],"study_design_codex":"simulation_or_modeling","study_design_gemma":"simulation_or_modeling","domain_scores_codex":[0.9985278,0.00006643384,0.00059248024,0.00011030244,0.0002620148,0.00044093715],"domain_scores_gemma":[0.9975354,0.0015709255,0.00042758943,0.00010144012,0.0002822381,0.00008242252],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00061070424,0.00017308109,0.0003247381,0.00020597983,0.00006814397,0.000039274943,0.000109915636,0.000091888556,0.000012769689],"category_scores_gemma":[0.0018324283,0.00015841867,0.000055981254,0.00035888745,0.000026377655,0.0003160616,0.000010581511,0.0006628159,0.0000064031756],"study_design_candidate":"simulation_or_modeling","study_design_consensus":"simulation_or_modeling","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.000025329286,0.000029398254,0.0026330347,0.00004448535,0.000069822854,0.0000022117035,0.00006641237,0.9417571,0.020497983,0.00028504664,0.00024388985,0.034345314],"study_design_scores_gemma":[0.001047342,0.0010610486,0.009392724,0.00019253719,0.000040695428,0.00016443031,0.000017430568,0.9824338,0.0037278351,0.0016475815,0.00011718716,0.00015737653],"about_ca_topic_score_codex":0.000015612566,"about_ca_topic_score_gemma":0.000004164545,"teacher_disagreement_score":0.04067674,"about_ca_system_score_codex":0.0003232302,"about_ca_system_score_gemma":0.00010931876,"threshold_uncertainty_score":0.64601254},"labels":[],"label_agreement":null},{"id":"W2167640923","doi":"10.1007/s10836-009-5137-z","title":"Using Stochastic Differential Equation for Verification of Noise in Analog/RF Circuits","year":2010,"lang":"en","type":"article","venue":"Journal of Electronic Testing","topic":"Analog and Mixed-Signal Circuit Design","field":"Engineering","cited_by":6,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of British Columbia; Concordia University","funders":"","keywords":"Noise (video); Electronic circuit; Electronic engineering; Computer science; Analogue electronics; Process (computing); Face (sociological concept); Engineering; Electrical engineering; Artificial intelligence","score_opus":0.05071285545504216,"score_gpt":0.2646978286925901,"score_spread":0.21398497323754795,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2167640923","genre_codex":"methods","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"codex-gemma-dda1882f352a","genre_candidate":"empirical","genre_consensus":null,"domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.4894799,0.00011449214,0.5101671,0.0000011495042,0.00012054151,0.00007029776,0.0000010205717,0.0000098681185,0.00003563918],"genre_scores_gemma":[0.9992948,0.0000016281862,0.000452679,0.000002605531,0.00021881517,0.0000029886223,0.0000023000816,0.0000218787,0.000002284245],"study_design_codex":"bench_or_experimental","study_design_gemma":"simulation_or_modeling","domain_scores_codex":[0.9989662,0.000019636671,0.0005050501,0.000080237,0.00014846506,0.000280415],"domain_scores_gemma":[0.9991016,0.00029565013,0.00028648798,0.00008099551,0.00019034346,0.000044919463],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00048633557,0.000102814185,0.00022829372,0.00023982006,0.00003603664,0.000014814249,0.00012106486,0.0000768236,0.00000704612],"category_scores_gemma":[0.00057099055,0.000104562154,0.00007056992,0.000246398,0.00001805049,0.00014867257,0.000002965971,0.00040393654,4.150165e-7],"study_design_candidate":"simulation_or_modeling","study_design_consensus":null,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.000009077796,0.000025656216,0.00036540447,0.000039340244,0.000024048768,0.0000010379601,0.00008057501,0.19640757,0.79237044,0.0024293705,0.000004001505,0.008243501],"study_design_scores_gemma":[0.0013642121,0.00041920273,0.0083455015,0.0002180221,0.00015678267,0.00013956774,0.000058131092,0.95476687,0.020852268,0.013407869,0.000011670224,0.00025990847],"about_ca_topic_score_codex":0.000011403415,"about_ca_topic_score_gemma":0.000017559827,"teacher_disagreement_score":0.7715182,"about_ca_system_score_codex":0.00013594923,"about_ca_system_score_gemma":0.0001772126,"threshold_uncertainty_score":0.4263921},"labels":[],"label_agreement":null},{"id":"W2190904686","doi":"10.1007/s10836-015-5549-x","title":"Simulation and Experimental Evaluation of a Soft Error Tolerant Layout for SRAM 6T Bitcell in 65nm Technology","year":2015,"lang":"en","type":"article","venue":"Journal of Electronic Testing","topic":"Radiation Effects in Electronics","field":"Engineering","cited_by":5,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of Saskatchewan; Dalhousie University","funders":"","keywords":"Soft error; Static random-access memory; Computer science; Integrated circuit layout; Electronic engineering; Scheme (mathematics); Engineering; Integrated circuit; Mathematics","score_opus":0.05273067149341603,"score_gpt":0.3369088862991162,"score_spread":0.28417821480570016,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2190904686","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"codex-gemma-dda1882f352a","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9876617,0.004507282,0.007269762,0.000044380056,0.00010126025,0.00028709567,5.7849456e-7,0.000033850363,0.00009407452],"genre_scores_gemma":[0.9975445,5.784371e-8,0.0023405394,0.000005333088,0.00006985384,0.000013635256,7.699466e-7,0.000022831655,0.0000024440285],"study_design_codex":"simulation_or_modeling","study_design_gemma":"simulation_or_modeling","domain_scores_codex":[0.99885637,0.000046496585,0.00044070414,0.00008558411,0.00026681967,0.0003040046],"domain_scores_gemma":[0.9989482,0.0003662206,0.00023984024,0.00007651836,0.00032659364,0.000042623902],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0015860797,0.00010392961,0.00021822177,0.00031958046,0.000022762979,0.000010930993,0.00008508071,0.00008884589,0.0000018527488],"category_scores_gemma":[0.0014085358,0.000105438856,0.00003038123,0.0003129369,0.000019714522,0.00017160941,0.000009214415,0.00024995,2.3757329e-7],"study_design_candidate":"simulation_or_modeling","study_design_consensus":"simulation_or_modeling","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.000028353417,0.00003288796,0.00042121272,0.000019631741,0.00002084349,6.0947923e-7,0.00031011837,0.99480706,0.0012313076,0.00010852566,0.000010583319,0.003008873],"study_design_scores_gemma":[0.0015793574,0.000725812,0.00016153256,0.000058333368,0.00003540154,0.000036874848,0.000154305,0.9933125,0.0015485148,0.002243097,0.000052998963,0.00009131124],"about_ca_topic_score_codex":0.0000023873652,"about_ca_topic_score_gemma":0.000009186021,"teacher_disagreement_score":0.009882818,"about_ca_system_score_codex":0.0006983168,"about_ca_system_score_gemma":0.00033923378,"threshold_uncertainty_score":0.42996716},"labels":[{"model":"gemma","categories":[],"domain":null,"study_design":"simulation_or_modeling","genre":"empirical","about_ca_system":false,"about_ca_topic":false,"confidence":"low"},{"model":"gpt","categories":[],"domain":null,"study_design":"simulation_or_modeling","genre":"empirical","about_ca_system":false,"about_ca_topic":false,"confidence":"low"}],"label_agreement":"agree"},{"id":"W2205197796","doi":"10.1007/s10836-015-5559-8","title":"Layout-based Single Event Mitigation Techniques for Dynamic Logic Circuits","year":2015,"lang":"en","type":"article","venue":"Journal of Electronic Testing","topic":"Radiation Effects in Electronics","field":"Engineering","cited_by":0,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of Saskatchewan","funders":"","keywords":"Event (particle physics); Computer science; CMOS; Reliability (semiconductor); Logic gate; Electronic engineering; Logic family; Set (abstract data type); Electronic circuit; Logic synthesis; Power (physics); Charge sharing; Reduction (mathematics); Electrical engineering; Engineering; Voltage; Mathematics; Physics","score_opus":0.021724021870352418,"score_gpt":0.26522186624263966,"score_spread":0.24349784437228725,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2205197796","genre_codex":"methods","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"codex-gemma-dda1882f352a","genre_candidate":"empirical","genre_consensus":null,"domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.43830815,0.0030801552,0.5563137,0.00026325812,0.0004170301,0.00047083347,0.0000035138282,0.0004296925,0.00071368244],"genre_scores_gemma":[0.9865238,0.00000186045,0.013116211,0.00006673958,0.00020557849,0.000017510049,0.0000049887126,0.000051193932,0.000012115122],"study_design_codex":"simulation_or_modeling","study_design_gemma":"simulation_or_modeling","domain_scores_codex":[0.9986265,0.000047662892,0.00047504072,0.00010356497,0.0002551891,0.00049209344],"domain_scores_gemma":[0.9986927,0.00041510587,0.00030414332,0.000121488476,0.0003647605,0.00010179435],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0010089085,0.00015825842,0.00023023378,0.0001958781,0.000048414415,0.0000402322,0.0001881001,0.00009339609,0.0000020371447],"category_scores_gemma":[0.00119959,0.00015790571,0.000097040676,0.00030222637,0.000017411974,0.00020365717,0.0000056634335,0.00037536936,0.0000018097229],"study_design_candidate":"simulation_or_modeling","study_design_consensus":"simulation_or_modeling","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.000008951639,0.000045444587,0.00007296856,0.000052160383,0.00003888151,0.0000034962802,0.00006364182,0.9408294,0.022254806,0.0002671623,0.00026442672,0.03609866],"study_design_scores_gemma":[0.0006279095,0.0015542625,0.00008710161,0.00011368402,0.0000519187,0.00012780903,0.000017050384,0.9736068,0.015189221,0.006663021,0.0017625346,0.00019865306],"about_ca_topic_score_codex":0.000001361055,"about_ca_topic_score_gemma":0.000008472642,"teacher_disagreement_score":0.5482156,"about_ca_system_score_codex":0.001761423,"about_ca_system_score_gemma":0.00047426505,"threshold_uncertainty_score":0.64392084},"labels":[],"label_agreement":null},{"id":"W2289165590","doi":"10.1007/s10836-016-5573-5","title":"A 10-Transistor 65 nm SRAM Cell Tolerant to Single-Event Upsets","year":2016,"lang":"en","type":"article","venue":"Journal of Electronic Testing","topic":"Radiation Effects in Electronics","field":"Engineering","cited_by":8,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":true,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Dalhousie University; University of Saskatchewan","funders":"Natural Sciences and Engineering Research Council of Canada; University of Saskatchewan","keywords":"Static random-access memory; Transistor; Event (particle physics); Memory cell; Optoelectronics; Computer science; Materials science; Physics; Electrical engineering; Engineering; Computer hardware; Voltage","score_opus":0.007699281476847848,"score_gpt":0.19669064218001303,"score_spread":0.1889913607031652,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2289165590","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"codex-gemma-dda1882f352a","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9395359,0.0030578473,0.051930152,0.0006313723,0.00052118825,0.00027157573,0.0000037400341,0.0002442984,0.0038039365],"genre_scores_gemma":[0.996324,0.000006185506,0.002639775,0.00006987098,0.00042352863,0.000006613532,3.3908893e-7,0.00007492914,0.00045477346],"study_design_codex":"simulation_or_modeling","study_design_gemma":"simulation_or_modeling","domain_scores_codex":[0.99787754,0.00006168045,0.0006464634,0.00016697762,0.0003741595,0.0008731981],"domain_scores_gemma":[0.9985834,0.0005670783,0.00023190009,0.00021492074,0.00019165892,0.00021104846],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00064106996,0.00024077842,0.00033901684,0.00024003822,0.00006786713,0.00003953087,0.0003206934,0.00008857105,0.00016936433],"category_scores_gemma":[0.0004980497,0.000188485,0.00014450373,0.00039701833,0.000016789823,0.00023195472,0.000014828914,0.0004065646,0.000099175275],"study_design_candidate":"simulation_or_modeling","study_design_consensus":"simulation_or_modeling","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00005866302,0.00010370481,0.00006926996,0.000058484027,0.00009006803,0.00003210286,0.00016533755,0.7294497,0.17294024,0.00008567069,0.003369471,0.09357727],"study_design_scores_gemma":[0.0069782967,0.014084613,0.0018261058,0.0019545795,0.00044854285,0.0021829726,0.00005922755,0.41124308,0.19769156,0.0023522202,0.35864103,0.0025377735],"about_ca_topic_score_codex":0.0000023786672,"about_ca_topic_score_gemma":0.000012360517,"teacher_disagreement_score":0.35527155,"about_ca_system_score_codex":0.0015824382,"about_ca_system_score_gemma":0.00029332488,"threshold_uncertainty_score":0.76861954},"labels":[],"label_agreement":null},{"id":"W2293212301","doi":"10.1007/s10836-015-5551-3","title":"Double Node Upsets Hardened Latch Circuits","year":2015,"lang":"en","type":"article","venue":"Journal of Electronic Testing","topic":"Radiation Effects in Electronics","field":"Engineering","cited_by":77,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":true,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of Saskatchewan","funders":"National Natural Science Foundation of China; CMC Microsystems","keywords":"Upset; Soft error; Redundancy (engineering); Node (physics); Modular design; Computer science; Single event upset; Electronic engineering; Embedded system; Computer hardware; Engineering","score_opus":0.030265961625977618,"score_gpt":0.246214496380894,"score_spread":0.21594853475491638,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2293212301","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"codex-gemma-dda1882f352a","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.9754966,0.005945312,0.007194793,0.00017543347,0.00084177527,0.0001461428,8.964731e-7,0.00027399062,0.009925086],"genre_scores_gemma":[0.9978281,0.000011525042,0.0014438413,0.0000495679,0.0005220449,0.0000031872898,0.0000010787398,0.000060171373,0.00008047577],"study_design_codex":"simulation_or_modeling","study_design_gemma":"simulation_or_modeling","domain_scores_codex":[0.9982471,0.000041345113,0.00049769686,0.00011059504,0.00040693948,0.0006963102],"domain_scores_gemma":[0.99885434,0.00022816731,0.00023617435,0.00018024335,0.00030539578,0.0001956788],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0010135318,0.00018238334,0.00029330564,0.0001751491,0.000051757976,0.00006153209,0.00030530637,0.00009478121,0.00001189457],"category_scores_gemma":[0.0005084851,0.00018141438,0.000081367645,0.00045384752,0.00001657898,0.00032995193,0.00001597941,0.0007678802,0.00002783298],"study_design_candidate":"simulation_or_modeling","study_design_consensus":"simulation_or_modeling","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.000013263532,0.000020605137,0.000731987,0.000020891328,0.00008534001,0.000022023385,0.00016970478,0.98753625,0.0022536984,0.00025345766,0.002671537,0.006221246],"study_design_scores_gemma":[0.00561089,0.0012060764,0.0015134368,0.00019729894,0.00016336657,0.0022908126,0.0000782322,0.94471717,0.011845971,0.005475997,0.02614471,0.00075602555],"about_ca_topic_score_codex":0.000008108957,"about_ca_topic_score_gemma":0.00001090071,"teacher_disagreement_score":0.042819064,"about_ca_system_score_codex":0.0010033768,"about_ca_system_score_gemma":0.0005940902,"threshold_uncertainty_score":0.7397863},"labels":[],"label_agreement":null},{"id":"W2303463411","doi":"10.1007/s10836-016-5577-1","title":"Exemplar-based Failure Triage for Regression Design Debugging","year":2016,"lang":"en","type":"article","venue":"Journal of Electronic Testing","topic":"Machine Learning and Data Classification","field":"Computer Science","cited_by":1,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of Toronto","funders":"","keywords":"Debugging; Computer science; Metric (unit); Triage; Flexibility (engineering); Process (computing); Reliability engineering; Data mining; Engineering; Programming language; Mathematics","score_opus":0.05114569072665122,"score_gpt":0.2914108569765113,"score_spread":0.2402651662498601,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2303463411","genre_codex":"methods","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"codex-gemma-dda1882f352a","genre_candidate":"methods","genre_consensus":null,"domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.004333054,0.00024068895,0.9882252,0.0068949177,0.00008792771,0.0000993737,4.4632066e-7,0.00007338981,0.000044969158],"genre_scores_gemma":[0.7337514,0.0000015847332,0.2659965,0.00006887845,0.00011701066,0.0000044027615,4.4926148e-7,0.0000091917245,0.000050558425],"study_design_codex":"design_other","study_design_gemma":"simulation_or_modeling","domain_scores_codex":[0.99873817,0.00016200016,0.0003595089,0.0001740501,0.00021912873,0.00034713547],"domain_scores_gemma":[0.9969754,0.0018104581,0.00067299,0.0002482615,0.000222423,0.000070472],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0019580284,0.000104324514,0.00016469271,0.00014928673,0.00016128564,0.000087821965,0.00055533927,0.000045812045,0.000003939205],"category_scores_gemma":[0.0034483108,0.00006089995,0.000072696785,0.0002419917,0.000010081066,0.00046834286,0.000028943992,0.0002112809,0.0000028250456],"study_design_candidate":"simulation_or_modeling","study_design_consensus":null,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00014192834,0.00008267257,0.0021443162,0.000033109074,0.000033945547,0.000016673304,0.00009239998,0.0026522116,0.19675851,0.010143494,0.0054025664,0.7824982],"study_design_scores_gemma":[0.0073495377,0.0038488735,0.0029957748,0.0018758576,0.00009141905,0.0006907676,0.00002578541,0.8615492,0.04038938,0.030894604,0.04962106,0.0006677459],"about_ca_topic_score_codex":0.0000013644319,"about_ca_topic_score_gemma":0.0000012106076,"teacher_disagreement_score":0.858897,"about_ca_system_score_codex":0.00013692761,"about_ca_system_score_gemma":0.0005355097,"threshold_uncertainty_score":0.41281992},"labels":[],"label_agreement":null},{"id":"W2460589855","doi":"10.1007/s10836-016-5604-2","title":"A Jitter Injection Signal Generation and Extraction System for Embedded Test of High-Speed Data I/O","year":2016,"lang":"en","type":"article","venue":"Journal of Electronic Testing","topic":"Advancements in PLL and VCO Technologies","field":"Engineering","cited_by":9,"is_retracted":false,"has_abstract":true,"route_ca_aff":true,"route_ca_fund":true,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"McGill University","funders":"Canadian Network for Research and Innovation in Machining Technology, Natural Sciences and Engineering Research Council of Canada","keywords":"Transceiver; Jitter; CMOS; SIGNAL (programming language); Electronic engineering; Chip; Transmission (telecommunications); Voltage; Computer science; Computer hardware; Sampling (signal processing); Electronic circuit; Engineering; Electrical engineering","score_opus":0.04205751978642033,"score_gpt":0.2742954812027525,"score_spread":0.23223796141633216,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2460589855","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"codex-gemma-dda1882f352a","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.6053207,0.00034521028,0.39393154,0.00006029944,0.00015066996,0.00008299627,0.000008028854,0.00007421374,0.000026328882],"genre_scores_gemma":[0.98719615,0.000024808482,0.012553352,0.000003253389,0.00019301551,0.000002017536,0.0000022540146,0.000012922499,0.000012222083],"study_design_codex":"bench_or_experimental","study_design_gemma":"simulation_or_modeling","domain_scores_codex":[0.99936694,0.000010000749,0.00030581027,0.000081640355,0.00008863592,0.00014699789],"domain_scores_gemma":[0.99920636,0.00032684443,0.00023683297,0.00010876923,0.00010690816,0.000014288721],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00034755637,0.00007353261,0.00013457934,0.000089808615,0.000034981604,0.000012990471,0.00010152341,0.00004461859,0.0000016715272],"category_scores_gemma":[0.00041760897,0.000051960527,0.000015149275,0.00008119267,0.0000147746005,0.00045820666,0.000021204967,0.000111133304,2.0332013e-7],"study_design_candidate":"bench_or_experimental","study_design_consensus":null,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.000016090493,0.00001593947,0.0006386899,0.00007047755,0.000043052463,0.0000011170865,0.000018820632,0.008360301,0.9106657,0.00035645778,0.00019068239,0.0796227],"study_design_scores_gemma":[0.0028644192,0.002602808,0.0017647427,0.00095925794,0.00020148537,0.0011770414,0.00034611786,0.524165,0.46166202,0.0030654778,0.00080452923,0.00038710993],"about_ca_topic_score_codex":0.000001997093,"about_ca_topic_score_gemma":0.000004101895,"teacher_disagreement_score":0.5158047,"about_ca_system_score_codex":0.00013467479,"about_ca_system_score_gemma":0.000034302244,"threshold_uncertainty_score":0.21188888},"labels":[],"label_agreement":null},{"id":"W2582843339","doi":"10.1007/s10836-016-5639-4","title":"Fast and Automated Electromigration Analysis for CMOS RF PA Design","year":2017,"lang":"en","type":"article","venue":"Journal of Electronic Testing","topic":"Copper Interconnects and Reliability","field":"Materials Science","cited_by":4,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Carleton University","funders":"National Natural Science Foundation of China","keywords":"Reliability (semiconductor); Electromigration; Parametric statistics; Electronic engineering; CMOS; Process (computing); Parametric model; Sampling (signal processing); Engineering; Power (physics); Radio frequency; Computer science; Electrical engineering","score_opus":0.04114188414690397,"score_gpt":0.30825217548876577,"score_spread":0.2671102913418618,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2582843339","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"codex-gemma-dda1882f352a","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.94911027,0.00031367532,0.04981646,0.00042422325,0.0000964198,0.00014267195,0.0000019635509,0.000043430617,0.000050898892],"genre_scores_gemma":[0.9897318,0.0000072481134,0.010060699,0.000023684539,0.00012882144,0.0000042852917,4.2769938e-7,0.0000086998625,0.00003433202],"study_design_codex":"bench_or_experimental","study_design_gemma":"simulation_or_modeling","domain_scores_codex":[0.99886763,0.00006367096,0.00040029074,0.00016852234,0.00014811994,0.00035177727],"domain_scores_gemma":[0.9981353,0.0004716638,0.00076836377,0.00020966298,0.0003492301,0.00006573098],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0017999308,0.00010729025,0.00029982533,0.0001024825,0.0004472303,0.00031254056,0.00026349505,0.000050767456,0.000025077523],"category_scores_gemma":[0.0023166584,0.00007866829,0.00010789841,0.00010871827,0.00005659297,0.00032424444,0.000031748186,0.00014856172,0.0000014900448],"study_design_candidate":"bench_or_experimental","study_design_consensus":null,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.00011090991,0.000048499605,0.006504038,0.00002101233,0.00014933966,0.0000040459163,0.00013338105,0.0059604472,0.98192394,0.00011504444,0.00019317816,0.0048361477],"study_design_scores_gemma":[0.0014376186,0.0029307904,0.051410496,0.00013921187,0.0010971043,0.00026024933,0.000088414046,0.7142125,0.22298291,0.0048966156,0.0001854194,0.00035866894],"about_ca_topic_score_codex":0.000051443167,"about_ca_topic_score_gemma":0.00007901305,"teacher_disagreement_score":0.75894105,"about_ca_system_score_codex":0.00012544179,"about_ca_system_score_gemma":0.000239971,"threshold_uncertainty_score":0.34397793},"labels":[],"label_agreement":null},{"id":"W2754168658","doi":"10.1007/s10836-017-5682-9","title":"Formal Methods Based Synthesis of Single Event Transient Tolerant Combinational Circuits","year":2017,"lang":"en","type":"article","venue":"Journal of Electronic Testing","topic":"Radiation Effects in Electronics","field":"Engineering","cited_by":0,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Concordia University; Polytechnique Montréal","funders":"","keywords":"Soft error; Combinational logic; Computer science; Overhead (engineering); Satisfiability; Digital electronics; Boolean satisfiability problem; Algorithm; Propagation of uncertainty; Satisfiability modulo theories; Set (abstract data type); Transient (computer programming); Event (particle physics); Computer engineering; Electronic circuit; Logic gate; Electronic engineering; Engineering","score_opus":0.02178487622943101,"score_gpt":0.2873000894017003,"score_spread":0.26551521317226934,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2754168658","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"codex-gemma-dda1882f352a","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.66825134,0.0013434202,0.32701355,0.00020708959,0.00049967866,0.00017821754,0.0000040127106,0.00006171658,0.0024410004],"genre_scores_gemma":[0.99097204,0.000003564469,0.008860862,0.0000135686405,0.00010466347,0.00000554994,5.6946675e-7,0.00003420635,0.0000049936793],"study_design_codex":"simulation_or_modeling","study_design_gemma":"simulation_or_modeling","domain_scores_codex":[0.99825394,0.00010650502,0.0006609214,0.000095500334,0.00036716266,0.00051594607],"domain_scores_gemma":[0.99753714,0.0012176158,0.00065985596,0.00024473525,0.00026332203,0.00007731118],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.001902083,0.00015972152,0.00036220142,0.00018265768,0.00017935206,0.00005053203,0.00041786357,0.00007384886,0.000017938359],"category_scores_gemma":[0.0019379435,0.00015710003,0.00016822023,0.0001265258,0.000042972242,0.0004088152,0.00001193656,0.00041850717,7.6913574e-7],"study_design_candidate":"simulation_or_modeling","study_design_consensus":"simulation_or_modeling","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.000005621068,0.00009322782,0.00014400874,0.000077646466,0.00009830743,0.0000045513984,0.00005231174,0.77056956,0.047889397,0.00043389414,0.00002883471,0.18060265],"study_design_scores_gemma":[0.0007245985,0.00053807726,0.007913915,0.00021879115,0.00009942202,0.00012151435,0.000008655587,0.9147529,0.07445238,0.0005880708,0.00040312417,0.0001785701],"about_ca_topic_score_codex":0.000003876657,"about_ca_topic_score_gemma":0.0000045381717,"teacher_disagreement_score":0.3227207,"about_ca_system_score_codex":0.00054354744,"about_ca_system_score_gemma":0.00035803078,"threshold_uncertainty_score":0.6406353},"labels":[],"label_agreement":null},{"id":"W2998594652","doi":"10.1007/s10836-019-05832-w","title":"Multi-PVT-Point Analysis and Comparison of Recent Small-Delay Defect Quality Metrics","year":2019,"lang":"en","type":"article","venue":"Journal of Electronic Testing","topic":"VLSI and Analog Circuit Testing","field":"Computer Science","cited_by":4,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":true,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"École de Technologie Supérieure; Polytechnique Montréal","funders":"Canadian Network for Research and Innovation in Machining Technology, Natural Sciences and Engineering Research Council of Canada","keywords":"Quality (philosophy); Reliability engineering; Point (geometry); Computer science; Mathematics; Engineering; Physics; Geometry","score_opus":0.089299062747093,"score_gpt":0.33709499259028486,"score_spread":0.24779592984319188,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W2998594652","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"codex-gemma-dda1882f352a","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.62031007,0.0016266948,0.3777065,0.000074859694,0.00006455753,0.000057832418,4.8371453e-7,0.000023044297,0.00013598165],"genre_scores_gemma":[0.9556488,0.000024287923,0.04423483,0.000037539747,0.000035932822,4.3036698e-7,5.3036234e-7,0.000007777914,0.0000098647115],"study_design_codex":"observational","study_design_gemma":"simulation_or_modeling","domain_scores_codex":[0.9975904,0.00023513006,0.0010583947,0.00026475708,0.00039911605,0.00045217315],"domain_scores_gemma":[0.9957816,0.0015927028,0.0015867718,0.0003033385,0.00061324646,0.00012234699],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0030320333,0.00015946597,0.0006997844,0.0005913636,0.00009034999,0.0000886154,0.00057125767,0.00006271076,0.0000075479384],"category_scores_gemma":[0.0027702833,0.00013575835,0.0002487342,0.0028950137,0.00002643655,0.00028343737,0.00012339956,0.000550729,0.0000018402134],"study_design_candidate":"observational","study_design_consensus":null,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.0000022910137,0.0001893104,0.8318843,0.000052516294,0.00049926405,0.000008663489,0.0004981496,0.009531655,0.0126916105,0.0007922269,0.0000061118403,0.14384389],"study_design_scores_gemma":[0.0012974606,0.0012604711,0.16650628,0.00013704962,0.0005803164,0.00022286651,0.00023454938,0.82534313,0.0029810441,0.0009377209,0.00008940117,0.00040970164],"about_ca_topic_score_codex":0.00009037902,"about_ca_topic_score_gemma":0.00006802113,"teacher_disagreement_score":0.8158115,"about_ca_system_score_codex":0.00016607375,"about_ca_system_score_gemma":0.00029814616,"threshold_uncertainty_score":0.5536065},"labels":[],"label_agreement":null},{"id":"W3039205666","doi":"10.1007/s10836-020-05890-5","title":"Evaluation of Ionizing Radiation Effects on Device Modules Used in Wireless-Based Monitoring Systems","year":2020,"lang":"en","type":"article","venue":"Journal of Electronic Testing","topic":"Radiation Effects in Electronics","field":"Engineering","cited_by":4,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Western University","funders":"","keywords":"Microcontroller; Wireless; Commercial off-the-shelf; Transmission (telecommunications); Embedded system; Electromagnetic shielding; Computer science; Ionizing radiation; Radiation; Reliability (semiconductor); Computer hardware; Electronic engineering; Engineering; Electrical engineering; Software; Telecommunications; Irradiation; Physics","score_opus":0.0381793060633342,"score_gpt":0.27628255016027975,"score_spread":0.23810324409694555,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W3039205666","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"codex-gemma-dda1882f352a","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.99025536,0.0041592605,0.004713642,0.000056947152,0.0003503498,0.0003269568,5.1984773e-7,0.000069476475,0.00006746899],"genre_scores_gemma":[0.9990287,0.000011437488,0.00040806874,0.000011272158,0.00047712642,0.000014271215,0.0000011789451,0.000047704616,2.2940283e-7],"study_design_codex":"simulation_or_modeling","study_design_gemma":"simulation_or_modeling","domain_scores_codex":[0.99749035,0.0003544709,0.0006962444,0.00013793801,0.00091873255,0.00040228394],"domain_scores_gemma":[0.99765915,0.0012866918,0.00049410306,0.00011833791,0.00036203832,0.000079701524],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0025219463,0.00018379638,0.00037480218,0.0002936697,0.000040222734,0.000035674566,0.00018351024,0.00009451824,0.0000011106453],"category_scores_gemma":[0.002153219,0.00019422507,0.00007007995,0.00076603197,0.000008715654,0.00024981127,0.000005994846,0.0006252873,0.0000016461547],"study_design_candidate":"simulation_or_modeling","study_design_consensus":"simulation_or_modeling","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.000015882506,0.000019016636,0.0044828514,0.00022061139,0.000053454234,0.0000035260355,0.0001422685,0.9147448,0.040378366,0.000075001655,0.0000053969093,0.039858818],"study_design_scores_gemma":[0.001346484,0.0005647402,0.0069089574,0.00060805265,0.00010242833,0.000008157506,0.00002847036,0.935121,0.055093046,0.00006881349,0.000009598479,0.00014024157],"about_ca_topic_score_codex":0.000009722366,"about_ca_topic_score_gemma":0.000003354738,"teacher_disagreement_score":0.039718576,"about_ca_system_score_codex":0.0016067722,"about_ca_system_score_gemma":0.0004468383,"threshold_uncertainty_score":0.7920268},"labels":[],"label_agreement":null},{"id":"W3157381594","doi":"10.1007/s10836-021-05941-5","title":"Radiation Tolerant SRAM Cell Design in 65nm Technology","year":2021,"lang":"en","type":"article","venue":"Journal of Electronic Testing","topic":"Radiation Effects in Electronics","field":"Engineering","cited_by":6,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":true,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"Dalhousie University","funders":"Natural Sciences and Engineering Research Council of Canada","keywords":"Dice; Static random-access memory; Schematic; CMOS; Overhead (engineering); Radiation hardening; Radiation; Chip; Radiation tolerance; Embedded system; Computer hardware; Engineering; Electronic engineering; Computer science; Electrical engineering; Physics; Detector","score_opus":0.007361684263400895,"score_gpt":0.20746162943071852,"score_spread":0.20009994516731763,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W3157381594","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"codex-gemma-dda1882f352a","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.91974616,0.017805023,0.060625076,0.00026147906,0.00033616804,0.00013989133,3.6599522e-7,0.00014963542,0.0009361919],"genre_scores_gemma":[0.9908138,0.000027416409,0.008928141,0.000029816547,0.00014051441,0.0000045756983,6.846896e-7,0.000035185574,0.000019849187],"study_design_codex":"simulation_or_modeling","study_design_gemma":"simulation_or_modeling","domain_scores_codex":[0.99857897,0.000088734545,0.00050289783,0.00011105066,0.00017885795,0.0005394911],"domain_scores_gemma":[0.99902034,0.0004655717,0.00018801357,0.00013806397,0.00014266833,0.00004534445],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00066090684,0.00013573951,0.00025560445,0.00036788563,0.000036354224,0.000028078872,0.00016911834,0.00012586158,0.000013167921],"category_scores_gemma":[0.00069662614,0.00014752997,0.000050448645,0.0011259399,0.000012719559,0.00018250739,0.0000113036285,0.00087461807,0.000005685366],"study_design_candidate":"simulation_or_modeling","study_design_consensus":"simulation_or_modeling","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.000004846575,0.000031229414,0.0006171048,0.000020921765,0.00001998874,0.0000686989,0.00005436849,0.96608275,0.010903658,0.00024669644,0.00012259604,0.021827145],"study_design_scores_gemma":[0.00064412726,0.00027616762,0.00064001064,0.000061361156,0.000020672025,0.00053402607,0.000029921433,0.9687021,0.02529195,0.0025984256,0.0010471228,0.00015411207],"about_ca_topic_score_codex":0.000001785372,"about_ca_topic_score_gemma":0.00000772542,"teacher_disagreement_score":0.071067646,"about_ca_system_score_codex":0.00085135334,"about_ca_system_score_gemma":0.00057155336,"threshold_uncertainty_score":0.60160977},"labels":[],"label_agreement":null},{"id":"W3159140662","doi":"10.1023/a:1015035222259","title":"CMOS Differential and Absolute Thermal Sensors","year":2002,"lang":"en","type":"article","venue":"Journal of Electronic Testing","topic":"Advancements in PLL and VCO Technologies","field":"Engineering","cited_by":14,"is_retracted":false,"has_abstract":false,"route_ca_aff":true,"route_ca_fund":false,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"University of British Columbia","funders":"","keywords":"Computer science; Programming language","score_opus":0.01713318464238801,"score_gpt":0.20238975200813944,"score_spread":0.18525656736575144,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W3159140662","genre_codex":"empirical","genre_gemma":"empirical","domain_codex":null,"domain_gemma":null,"model_version":"codex-gemma-dda1882f352a","genre_candidate":"empirical","genre_consensus":"empirical","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.99455476,0.0024685706,0.0016740472,0.000048887247,0.00015931515,0.000026535274,3.63834e-7,0.000116948744,0.00095058995],"genre_scores_gemma":[0.99786764,0.0001271271,0.001773938,0.000006888162,0.00012805827,6.3589954e-7,6.2620835e-8,0.00001458034,0.00008107521],"study_design_codex":"design_other","study_design_gemma":"simulation_or_modeling","domain_scores_codex":[0.99935097,0.0000065241247,0.00021139317,0.00005374841,0.000096278876,0.00028111367],"domain_scores_gemma":[0.99972016,0.00007641692,0.00008306252,0.00006305944,0.000029124685,0.000028179935],"candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.000063038744,0.00009144569,0.00013177123,0.00006351756,0.000046706657,0.000018178169,0.00009645816,0.00003972244,0.000040913645],"category_scores_gemma":[0.00010786495,0.000074973235,0.000026995414,0.00009064442,0.000027190537,0.00011976146,0.000020637568,0.0003483337,0.0000024901635],"study_design_candidate":"simulation_or_modeling","study_design_consensus":null,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":false,"about_ca_system_consensus":false,"study_design_scores_codex":[0.000023298408,0.00011009181,0.006188456,0.00011963465,0.0004378014,0.00014533284,0.00051793235,0.10382442,0.16390523,0.0012110499,0.0018399637,0.72167677],"study_design_scores_gemma":[0.0025098338,0.001539751,0.0144683905,0.0003421752,0.00018694908,0.00208628,0.00031867423,0.948018,0.014727852,0.0054708417,0.009419364,0.00091189716],"about_ca_topic_score_codex":4.7860715e-7,"about_ca_topic_score_gemma":4.6225733e-7,"teacher_disagreement_score":0.8441936,"about_ca_system_score_codex":0.000054055574,"about_ca_system_score_gemma":0.000005030287,"threshold_uncertainty_score":0.30573198},"labels":[],"label_agreement":null},{"id":"W4245342073","doi":"10.1007/s10836-015-5557-x","title":"Editorial","year":2015,"lang":"es","type":"editorial","venue":"Journal of Electronic Testing","topic":"","field":"","cited_by":0,"is_retracted":false,"has_abstract":false,"route_ca_aff":false,"route_ca_fund":true,"route_ca_venue":false,"route_about_ca":false,"ca_institutions":"","funders":"Industrial Technology Research Institute; Dalhousie University; National Taiwan University; China University of Petroleum, Beijing","keywords":"Computer science","score_opus":0.020658779463525907,"score_gpt":0.2989060449690467,"score_spread":0.2782472655055208,"validation_status":"score_only:v0-immature-baseline","prediction":{"id":"W4245342073","genre_codex":"editorial","genre_gemma":"editorial","domain_codex":null,"domain_gemma":null,"model_version":"codex-gemma-dda1882f352a","genre_candidate":"editorial","genre_consensus":"editorial","domain_candidate":null,"domain_consensus":null,"prediction_status":"machine_predicted_unvalidated","genre_scores_codex":[0.0018129501,0.0076550706,0.000026393134,0.000069718226,0.9878352,0.00031386208,0.00012205119,0.00012450444,0.0020402016],"genre_scores_gemma":[0.00364431,0.00008403893,0.0010224635,0.000008094686,0.9941241,0.000005035312,0.000044598764,0.00070816465,0.00035919994],"study_design_codex":"not_applicable","study_design_gemma":"not_applicable","domain_scores_codex":[0.9823531,0.0010527301,0.0039696093,0.00075658824,0.00869861,0.0031693976],"domain_scores_gemma":[0.9578913,0.008186445,0.013256588,0.00078224024,0.018801903,0.0010815492],"candidate_categories":["metaresearch","metaepi_narrow","research_integrity","insufficient_payload"],"consensus_categories":["metaepi_narrow","research_integrity"],"category_scores_codex":[0.016203616,0.0014281449,0.0028764424,0.0013054205,0.00036041831,0.0007753334,0.0025872644,0.0026029136,0.00007561696],"category_scores_gemma":[0.12752394,0.0013446742,0.00091839564,0.0019563504,0.0002572394,0.0011589347,0.00035119202,0.015839357,0.0010153914],"study_design_candidate":"not_applicable","study_design_consensus":"not_applicable","about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_system_candidate":true,"about_ca_system_consensus":true,"study_design_scores_codex":[0.0012323869,0.0003342668,0.00012258832,0.00015132569,0.0009299278,0.00015478212,0.00015962952,0.0014557351,0.002048354,0.000060317776,0.99191165,0.0014390474],"study_design_scores_gemma":[0.005173319,0.007195997,0.000009068295,0.0022262062,0.0017028139,0.0007774238,0.000070956085,0.00036181242,0.000052218627,0.0028555414,0.97844666,0.0011279682],"about_ca_topic_score_codex":0.00011515803,"about_ca_topic_score_gemma":0.000023770654,"teacher_disagreement_score":0.111320324,"about_ca_system_score_codex":0.010980642,"about_ca_system_score_gemma":0.055475563,"threshold_uncertainty_score":0.9998469},"labels":[],"label_agreement":null}]}