{"meta":{"page":1,"per_page":50,"max_per_page":100,"total":747,"total_is_capped":false,"direct_labels_cover":1,"predictions_cover":747,"direct_label_status":"direct model label, unvalidated","prediction_status":"machine_predicted_unvalidated (Codex and Gemma teacher distillation)","score_status":"score_only:v0-immature-baseline (scores rank; they never assert a category)","snapshot":{"source":"OpenAlex, pinned release, all 482 partitions","release":"2026-06-24","frame_built":"2026-07-12","author_layer_release":"2026-06-26"},"query_hash":"332cdad4ccae","filters":{"topic":"VLSI and Analog Circuit Testing"}},"results":[{"id":"W2166163625","doi":"10.1109/tcad.2004.829797","title":"Scan Architecture With Mutually Exclusive Scan Segment Activation for Shift- and Capture-Power Reduction","year":2004,"lang":"en","type":"article","venue":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","topic":"VLSI and Analog Circuit Testing","field":"Computer Science","cited_by":194,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"McMaster University","funders":"Engineering and Physical Sciences Research Council","keywords":"Reduction (mathematics); Architecture; Power (physics); Computer science; History; Mathematics; Physics; Geometry","authors":[{"name":"Paul Rosinger","is_ca":true},{"name":"Bashir M. Al‐Hashimi","is_ca":false},{"name":"Nicola Nicolici","is_ca":true}],"retraction":null,"screen_n_in":null,"score":{"opus":0.02114667296479314,"gpt":0.2195087792749494,"spread":0.1983621063101562,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"metacan-v3-hybrid-931329e0061c","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0001937628,0.0003528168,0.0002145755,0.0005821569,0.0002148207,0.0002802732,0.0008716538,0.0003712833,0.003469075],"category_scores_gemma":[0.0004863504,0.000192543,0.0003095309,0.0004406272,0.0002580172,0.0005864084,0.0004268871,0.0003407372,0.000728579],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0001997935,"about_ca_system_score_gemma":0.0003970155,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.0004250505,"about_ca_topic_score_gemma":0.001705892,"domain_scores_codex":[0.9997223,0.0000698691,0.00002434223,0.00004243218,0.0001019083,0.00003921496],"domain_scores_gemma":[0.9993871,0.000198565,0.0001040529,0.0001296734,0.0001566709,0.00002398522],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"bench_or_experimental","study_design_gemma":"simulation_or_modeling","study_design_scores_codex":[0.0007128753,0.0001885191,0.00416459,0.0003603803,0.0001122173,0.0005153086,0.0002061026,0.04378882,0.5162497,0.01322821,0.002600777,0.4178725],"study_design_scores_gemma":[0.0001805709,0.003374953,0.01062185,0.00006967382,0.0003729387,0.003609339,0.0001573947,0.3250184,0.6116084,0.01127941,0.03361956,0.00008748461],"study_design_candidate":"simulation_or_modeling","study_design_consensus":null,"genre_codex":"methods","genre_gemma":"empirical","genre_scores_codex":[0.3876276,0.0008033211,0.5938424,0.0003106782,0.00004457852,0.000172543,0.0001881135,0.003635951,0.01337482],"genre_scores_gemma":[0.863816,0.0002708862,0.1300538,0.0001408348,0.00002915219,0.0001436328,0.0002607658,0.0001368083,0.005148168],"genre_candidate":"empirical","genre_consensus":null,"teacher_disagreement_score":0.003469075,"threshold_uncertainty_score":0.0116052,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W2101752872","doi":"10.1109/test.1993.470621","title":"A BIST scheme for an SNR test of a sigma-delta ADC","year":2002,"lang":"en","type":"article","venue":"","topic":"VLSI and Analog Circuit Testing","field":"Computer Science","cited_by":171,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"McGill University","funders":"","keywords":"Built-in self-test; Delta-sigma modulation; Computer science; Very-large-scale integration; Scheme (mathematics); Noise (video); Chip; Electronic engineering; Embedded system; Artificial intelligence; Engineering; CMOS; Mathematics; Telecommunications","authors":[{"name":"M.F. Toner","is_ca":true},{"name":"Gordon W. Roberts","is_ca":true}],"retraction":null,"screen_n_in":null,"score":{"opus":0.0724292665033,"gpt":0.2652030924780689,"spread":0.1927738259747689,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"metacan-v3-hybrid-931329e0061c","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0003567925,0.000327863,0.0002041482,0.0006884906,0.0003121637,0.0005758088,0.0007597129,0.0005095913,0.003905237],"category_scores_gemma":[0.001404644,0.0001515743,0.0001951294,0.0002875978,0.0003522387,0.0006259385,0.0003743639,0.0005059523,0.00100375],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0003656179,"about_ca_system_score_gemma":0.0003106212,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.0002228101,"about_ca_topic_score_gemma":0.0005447203,"domain_scores_codex":[0.9996042,0.0000689155,0.00003474568,0.00005887481,0.0002056919,0.0000276323],"domain_scores_gemma":[0.9994711,0.0001559823,0.00006478227,0.0001112468,0.0001629215,0.00003392638],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","study_design_scores_codex":[0.00065529,0.0001629765,0.001194548,0.0001735831,0.00003862888,0.000334807,0.0001174576,0.005244992,0.5814855,0.0285145,0.002555964,0.3795219],"study_design_scores_gemma":[0.0001822102,0.002329326,0.003226158,0.00008110684,0.00009916712,0.004094258,0.00005310079,0.2458386,0.7059458,0.009081521,0.02898045,0.00008825593],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","genre_codex":"methods","genre_gemma":"empirical","genre_scores_codex":[0.05587929,0.0005953621,0.9235826,0.0003899836,0.0003389264,0.0002865148,0.000206568,0.004868042,0.01385272],"genre_scores_gemma":[0.6760862,0.0001872732,0.3171322,0.0005050743,0.0001387636,0.000114856,0.0002078575,0.00009791517,0.00552985],"genre_candidate":"empirical","genre_consensus":null,"teacher_disagreement_score":0.003905237,"threshold_uncertainty_score":0.01306432,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W2162281676","doi":"10.1109/vtest.1996.510896","title":"Oscillation-test strategy for analog and mixed-signal integrated circuits","year":2002,"lang":"en","type":"article","venue":"","topic":"VLSI and Analog Circuit Testing","field":"Computer Science","cited_by":170,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"Polytechnique Montréal","funders":"","keywords":"Oscillation (cell signaling); Analogue electronics; Automatic test pattern generation; Electronic circuit; Electronic engineering; Computer science; Operational amplifier; Test method; Mixed-signal integrated circuit; Design for testing; Amplifier; Control theory (sociology); Engineering; Electrical engineering; Mathematics; Artificial intelligence; CMOS; Statistics","authors":[{"name":"K. Arabi","is_ca":true},{"name":"Bożena Kamińska","is_ca":true}],"retraction":null,"screen_n_in":null,"score":{"opus":0.05099020794584744,"gpt":0.2457374621294725,"spread":0.194747254183625,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"metacan-v3-hybrid-931329e0061c","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0002618383,0.0004543625,0.0002523419,0.0004709225,0.0002334272,0.0003093165,0.0007578037,0.0003281604,0.00150947],"category_scores_gemma":[0.0007301634,0.0001173227,0.0001674963,0.0003396882,0.0003461658,0.0005200588,0.0003393853,0.0003025658,0.0002514633],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0003079241,"about_ca_system_score_gemma":0.0002678189,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.0006096991,"about_ca_topic_score_gemma":0.0007452814,"domain_scores_codex":[0.999674,0.00007296826,0.0000223769,0.00004845729,0.0001570328,0.00002516462],"domain_scores_gemma":[0.9997452,0.00009526533,0.00002925062,0.00003282497,0.0000819966,0.0000155344],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"design_other","study_design_gemma":"bench_or_experimental","study_design_scores_codex":[0.0003351263,0.00009776386,0.001978601,0.0002766936,0.0000362049,0.000492354,0.0001529916,0.01578466,0.3759651,0.05329365,0.002732293,0.5488546],"study_design_scores_gemma":[0.0001755798,0.00214211,0.004033291,0.00007723946,0.00009974778,0.002735248,0.00007710336,0.5779272,0.3358336,0.03854463,0.0382672,0.00008694748],"study_design_candidate":"bench_or_experimental","study_design_consensus":null,"genre_codex":"methods","genre_gemma":"empirical","genre_scores_codex":[0.04047272,0.0007642744,0.9523654,0.0001091113,0.00006886871,0.0001005958,0.0000501356,0.000674834,0.005393999],"genre_scores_gemma":[0.6694847,0.0003826999,0.3255264,0.0001753064,0.00005272273,0.0001713039,0.0002003733,0.00005829689,0.003948092],"genre_candidate":"empirical","genre_consensus":null,"teacher_disagreement_score":0.00150947,"threshold_uncertainty_score":0.005049646,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W2122317343","doi":"10.1109/issre.1996.558835","title":"A practical strategy for testing pair-wise coverage of network interfaces","year":2002,"lang":"en","type":"article","venue":"","topic":"VLSI and Analog Circuit Testing","field":"Computer Science","cited_by":159,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":true,"ca_venue":false,"about_ca":false},"ca_institutions":"University of Ottawa","funders":"Instituto de Telecomunicações; University of Ottawa","keywords":"Computer science; Set (abstract data type); Network element; Test (biology); Distributed computing; Data mining; Algorithm; Computer network","authors":[{"name":"Alan Williams","is_ca":true},{"name":"Robert L. Probert","is_ca":true}],"retraction":null,"screen_n_in":null,"score":{"opus":0.1546248558246452,"gpt":0.3097686194146347,"spread":0.1551437635899895,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"metacan-v3-hybrid-931329e0061c","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.007337789,0.001503856,0.0008759529,0.001328176,0.000685869,0.0008536506,0.001441424,0.001245741,0.00395308],"category_scores_gemma":[0.03335282,0.0005601929,0.0007363826,0.000956062,0.002321242,0.001520367,0.001274212,0.001517209,0.0009104034],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0005822207,"about_ca_system_score_gemma":0.001247723,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.0004982736,"about_ca_topic_score_gemma":0.000752727,"domain_scores_codex":[0.9890708,0.006925272,0.0004213096,0.00130117,0.001982564,0.000298955],"domain_scores_gemma":[0.9818866,0.01188887,0.001395494,0.002924741,0.001678482,0.0002258049],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"design_other","study_design_gemma":"bench_or_experimental","study_design_scores_codex":[0.001139988,0.001039103,0.007974383,0.0006083317,0.0003149047,0.0002746784,0.0005160574,0.0829476,0.1686148,0.08290666,0.003335868,0.6503276],"study_design_scores_gemma":[0.0009832513,0.01118282,0.007709448,0.000187407,0.0003268209,0.001882185,0.0006535798,0.4723783,0.3123092,0.1720112,0.02006169,0.0003139765],"study_design_candidate":"bench_or_experimental","study_design_consensus":null,"genre_codex":"methods","genre_gemma":"empirical","genre_scores_codex":[0.01230517,0.00002853085,0.9856865,0.00009687014,0.00001585274,0.0003618135,0.000050662,0.0003835642,0.001070979],"genre_scores_gemma":[0.1146874,0.00003043079,0.8832128,0.0001598099,0.000009398249,0.001222032,0.000126268,0.00006559105,0.0004862152],"genre_candidate":"empirical","genre_consensus":null,"teacher_disagreement_score":0.007337789,"threshold_uncertainty_score":0.03880644,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W2145515320","doi":"10.1109/test.1988.207790","title":"Testing and diagnosis of interconnects using boundary scan architecture","year":2003,"lang":"en","type":"article","venue":"","topic":"VLSI and Analog Circuit Testing","field":"Computer Science","cited_by":142,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"McGill University","funders":"","keywords":"Test vector; Boundary scan; Built-in self-test; Computer science; Automatic test pattern generation; Interconnection; Architecture; Test (biology); Scan chain; Embedded system; Engineering; Artificial intelligence; Test set; Integrated circuit; Electrical engineering; Telecommunications; Electronic circuit","authors":[{"name":"A.S.M. Hassan","is_ca":true},{"name":"Janusz Rajski","is_ca":true},{"name":"V.K. Agarwal","is_ca":true}],"retraction":null,"screen_n_in":null,"score":{"opus":0.0359491927124583,"gpt":0.2463296707293581,"spread":0.2103804780168998,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"metacan-v3-hybrid-931329e0061c","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0001851313,0.0003169741,0.0002429146,0.0005859305,0.0002661498,0.0004487119,0.0007508287,0.0005974885,0.002133553],"category_scores_gemma":[0.001061986,0.0001864075,0.0001882718,0.0002546138,0.0005141625,0.0007256316,0.0004591579,0.0003476088,0.0004428188],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0002859072,"about_ca_system_score_gemma":0.0003715781,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.0006106654,"about_ca_topic_score_gemma":0.001019201,"domain_scores_codex":[0.999674,0.00009157701,0.00001378372,0.00005305922,0.0001289066,0.00003865998],"domain_scores_gemma":[0.999305,0.0003046546,0.0000687861,0.0001230067,0.0001641745,0.00003444538],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","study_design_scores_codex":[0.0004976055,0.0001290373,0.004393109,0.0003065149,0.00004435497,0.0008690135,0.000348663,0.04794971,0.6595511,0.03696561,0.002591681,0.2463536],"study_design_scores_gemma":[0.0000948517,0.001913434,0.004818231,0.00007691859,0.00006093635,0.002383457,0.00012095,0.4995437,0.4577852,0.01837395,0.01477639,0.00005194055],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","genre_codex":"methods","genre_gemma":"empirical","genre_scores_codex":[0.289232,0.0006052097,0.692701,0.000242557,0.00005906671,0.0001217115,0.0001492852,0.004389244,0.01249993],"genre_scores_gemma":[0.8484027,0.0001343246,0.1482764,0.00006541258,0.00001703948,0.00007778877,0.0002203577,0.00008554253,0.002720364],"genre_candidate":"empirical","genre_consensus":null,"teacher_disagreement_score":0.002133553,"threshold_uncertainty_score":0.007137418,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W2141261568","doi":"10.1109/tcad.2008.2009158","title":"Algorithms for State Restoration and Trace-Signal Selection for Data Acquisition in Silicon Debug","year":2009,"lang":"en","type":"article","venue":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","topic":"VLSI and Analog Circuit Testing","field":"Computer Science","cited_by":130,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"McMaster University","funders":"","keywords":"Debugging; Observability; Computer science; TRACE (psycholinguistics); State (computer science); Background debug mode interface; Embedded system; Software bug; Computer engineering; Algorithm; Software; Programming language; Mathematics","authors":[{"name":"Ho Fai Ko","is_ca":true},{"name":"Nicola Nicolici","is_ca":true}],"retraction":null,"screen_n_in":null,"score":{"opus":0.07637195429485057,"gpt":0.2836938625974128,"spread":0.2073219083025623,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"metacan-v3-hybrid-931329e0061c","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.002525256,0.002067527,0.001426768,0.003069908,0.0008953707,0.001671191,0.002431614,0.00125053,0.003960434],"category_scores_gemma":[0.01384506,0.0006504553,0.0008454408,0.001939435,0.001290448,0.003004386,0.002550154,0.002404234,0.001829716],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.001524459,"about_ca_system_score_gemma":0.00279349,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.002765215,"about_ca_topic_score_gemma":0.004055374,"domain_scores_codex":[0.9972115,0.0008119019,0.0002682644,0.0004672857,0.0009798508,0.0002610513],"domain_scores_gemma":[0.9942351,0.002964271,0.0007441246,0.0008906151,0.000987437,0.0001785608],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"design_other","study_design_gemma":"simulation_or_modeling","study_design_scores_codex":[0.0006052527,0.0002365376,0.002161993,0.0001874193,0.00005256965,0.0001051944,0.0003089426,0.1060948,0.02189291,0.03378257,0.004412062,0.8301597],"study_design_scores_gemma":[0.0000904426,0.0001822885,0.0005144249,0.00003602859,0.00002188515,0.0001100856,0.00006007334,0.9474491,0.02056726,0.02640734,0.00451457,0.000046565],"study_design_candidate":"simulation_or_modeling","study_design_consensus":null,"genre_codex":"methods","genre_gemma":"methods","genre_scores_codex":[0.002994821,0.00009029524,0.9942904,0.00004195732,0.00001343854,0.00005433042,0.0000250391,0.002234752,0.0002550585],"genre_scores_gemma":[0.04575704,0.00009137743,0.9526722,0.00004314085,0.00001797181,0.0002540182,0.0002121368,0.0002980431,0.000653955],"genre_candidate":"methods","genre_consensus":"methods","teacher_disagreement_score":0.003960434,"threshold_uncertainty_score":0.01335496,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W2148218783","doi":"10.5555/882452.874385","title":"Improving Compression Ratio, Area Overhead, and Test Application Time for System-on-a-Chip Test Data Compression/Decompression","year":2002,"lang":"en","type":"article","venue":"ePrints Soton (University of Southampton)","topic":"VLSI and Analog Circuit Testing","field":"Computer Science","cited_by":126,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"McMaster University","funders":"","keywords":"Compression ratio; Computer science; Huffman coding; Test compression; Data compression; Data compression ratio; Lossless compression; Golomb coding; Overhead (engineering); Test data; System on a chip; Algorithm; Computer hardware; Embedded system; Automatic test pattern generation; Image compression; Electronic circuit; Engineering; Artificial intelligence; Image processing","authors":[{"name":"P.T. Gonciari","is_ca":false},{"name":"Bashir M. Al‐Hashimi","is_ca":false},{"name":"Nicola Nicolici","is_ca":true}],"retraction":null,"screen_n_in":null,"score":{"opus":0.03391430186975637,"gpt":0.2163484797465334,"spread":0.182434177876777,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"metacan-v3-hybrid-931329e0061c","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0003199769,0.0004559437,0.0002733177,0.0008844682,0.0002236847,0.0003832914,0.0004144283,0.0003602427,0.002128701],"category_scores_gemma":[0.001920125,0.0001404474,0.0001845228,0.0004620657,0.000261729,0.0007881682,0.0002448276,0.000375483,0.0004397165],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.000372346,"about_ca_system_score_gemma":0.000496932,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.0004967696,"about_ca_topic_score_gemma":0.001364018,"domain_scores_codex":[0.9995479,0.00006701603,0.00002687323,0.00004120395,0.0002848794,0.0000319816],"domain_scores_gemma":[0.998958,0.0004891569,0.000107735,0.0001465724,0.0002632556,0.00003519926],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"design_other","study_design_gemma":"bench_or_experimental","study_design_scores_codex":[0.0004992798,0.0001422569,0.001872245,0.0001335666,0.00003504492,0.000161747,0.00006909086,0.01640566,0.3140292,0.003785347,0.001333282,0.6615333],"study_design_scores_gemma":[0.0001055641,0.0007531492,0.003997772,0.00002943377,0.00009249146,0.001235107,0.00005316076,0.3144375,0.670285,0.001772093,0.007201996,0.00003659767],"study_design_candidate":"bench_or_experimental","study_design_consensus":null,"genre_codex":"methods","genre_gemma":"empirical","genre_scores_codex":[0.2096169,0.0009162432,0.7819371,0.0002904391,0.00007083046,0.0001252935,0.00007372715,0.002367658,0.004601856],"genre_scores_gemma":[0.6719703,0.0003276228,0.3244077,0.0001172752,0.00006549008,0.00007990169,0.0002170268,0.0001703297,0.002644307],"genre_candidate":"empirical","genre_consensus":null,"teacher_disagreement_score":0.002128701,"threshold_uncertainty_score":0.007121205,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W2123205813","doi":"10.1109/fmcad.2008.ecp.9","title":"BackSpace: Formal Analysis for Post-Silicon Debug","year":2008,"lang":"en","type":"article","venue":"","topic":"VLSI and Analog Circuit Testing","field":"Computer Science","cited_by":91,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"University of British Columbia","funders":"Semiconductor Research Corporation","keywords":"Debugging; Computer science; Implementation; Embedded system; Overhead (engineering); Software bug; Chip; Formal verification; System on a chip; State (computer science); Computer architecture; Silicon chip; Computer engineering; Silicon; Software engineering; Programming language; Software; Telecommunications","authors":[{"name":"Flavio M. De Paula","is_ca":true},{"name":"Marcel Gort","is_ca":true},{"name":"Alan J. Hu","is_ca":true},{"name":"Steven J. E. Wilton","is_ca":true},{"name":"Jin Yang","is_ca":false}],"retraction":null,"screen_n_in":null,"score":{"opus":0.02930155781293106,"gpt":0.2456417960978555,"spread":0.2163402382849244,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"metacan-v3-hybrid-931329e0061c","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.005041858,0.001976804,0.0009921172,0.00249267,0.0009793004,0.002730953,0.002545855,0.001355755,0.006715816],"category_scores_gemma":[0.01483763,0.0009852331,0.002863666,0.001090742,0.004400639,0.005969631,0.002892652,0.00384123,0.001587372],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.002051387,"about_ca_system_score_gemma":0.002538565,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.002301829,"about_ca_topic_score_gemma":0.002058263,"domain_scores_codex":[0.9956058,0.001828108,0.0002927671,0.0004557174,0.001498069,0.0003194862],"domain_scores_gemma":[0.9884753,0.007737963,0.000632239,0.002068314,0.000937502,0.0001487226],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"theoretical_or_conceptual","study_design_gemma":"theoretical_or_conceptual","study_design_scores_codex":[0.0001740655,0.0001939246,0.001134198,0.0004943288,0.00008926715,0.0003158645,0.0005432675,0.1304949,0.01062023,0.6545578,0.006760519,0.1946216],"study_design_scores_gemma":[0.00005801794,0.00007876065,0.0001410418,0.0001403834,0.00005220999,0.0001244022,0.00007375031,0.4279442,0.01043101,0.5463667,0.01452897,0.00006058568],"study_design_candidate":"theoretical_or_conceptual","study_design_consensus":"theoretical_or_conceptual","genre_codex":"methods","genre_gemma":"methods","genre_scores_codex":[0.001187625,0.00009777537,0.9962637,0.0001352783,0.00003329622,0.00004121271,0.0000452466,0.001338098,0.0008577507],"genre_scores_gemma":[0.1653711,0.0005606918,0.8278978,0.0004892151,0.0001720651,0.0004322581,0.0004224413,0.001467773,0.003186705],"genre_candidate":"methods","genre_consensus":"methods","teacher_disagreement_score":0.006715816,"threshold_uncertainty_score":0.0266642,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W2106883354","doi":"10.1145/1403375.1403689","title":"Automated trace signals identification and state restoration for improving observability in post-silicon validation","year":2008,"lang":"en","type":"article","venue":"","topic":"VLSI and Analog Circuit Testing","field":"Computer Science","cited_by":91,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"McMaster University","funders":"","keywords":"Observability; TRACE (psycholinguistics); Computer science; Identification (biology); Chip; State (computer science); Set (abstract data type); Embedded system; Software bug; System on a chip; Software; Real-time computing; Computer hardware; Algorithm; Operating system; Mathematics","authors":[{"name":"Ho Fai Ko","is_ca":true},{"name":"Nicola Nicolici","is_ca":true}],"retraction":null,"screen_n_in":null,"score":{"opus":0.04660860301341917,"gpt":0.2749030463532001,"spread":0.2282944433397809,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"metacan-v3-hybrid-931329e0061c","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.001251648,0.0006491987,0.0007215109,0.00141067,0.0004094176,0.0006864073,0.001236936,0.0005226481,0.001391922],"category_scores_gemma":[0.007026698,0.0002839332,0.000390895,0.0008286179,0.000914077,0.001626154,0.0009068145,0.0008667756,0.0002161513],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0004979921,"about_ca_system_score_gemma":0.001276151,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.001220364,"about_ca_topic_score_gemma":0.001900022,"domain_scores_codex":[0.9981112,0.0006464168,0.0001016912,0.0002948617,0.0006991332,0.0001466227],"domain_scores_gemma":[0.9939897,0.003070743,0.0008592157,0.001509833,0.0004844228,0.00008618504],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"design_other","study_design_gemma":"bench_or_experimental","study_design_scores_codex":[0.0008214656,0.0004256488,0.005605395,0.0001616048,0.00005218967,0.0002894573,0.0004257028,0.1700604,0.1591385,0.01741609,0.001021671,0.6445819],"study_design_scores_gemma":[0.00005709079,0.000337477,0.002316201,0.00001753676,0.00002418536,0.0002454016,0.00005635377,0.8408613,0.1422742,0.01216653,0.001605835,0.00003793783],"study_design_candidate":"bench_or_experimental","study_design_consensus":null,"genre_codex":"methods","genre_gemma":"empirical","genre_scores_codex":[0.09575643,0.0001285577,0.8998756,0.00008147144,0.00001202036,0.00006025085,0.00006197122,0.003541566,0.0004821144],"genre_scores_gemma":[0.7227439,0.00006151045,0.2763245,0.00003575542,0.00001160972,0.0000816496,0.0001415582,0.0001155415,0.0004838617],"genre_candidate":"empirical","genre_consensus":null,"teacher_disagreement_score":0.00141067,"threshold_uncertainty_score":0.006619453,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W4251954744","doi":"10.1109/dac.1990.114927","title":"Chortle: a technology mapping program for lookup table-based field programmable gate arrays","year":2002,"lang":"en","type":"article","venue":"27th ACM/IEEE Design Automation Conference","topic":"VLSI and Analog Circuit Testing","field":"Computer Science","cited_by":88,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"University of Toronto","funders":"","keywords":"Lookup table; Computer science; Combinational logic; Table (database); Boolean function; Function (biology); Truth table; Logic synthesis; Algorithm; Logic gate; Theoretical computer science; Parallel computing; Data mining; Programming language","authors":[{"name":"Robert J. Francis","is_ca":true},{"name":"Jonathan Rose","is_ca":true},{"name":"Kevin Chung","is_ca":true}],"retraction":null,"screen_n_in":null,"score":{"opus":0.09718467946465961,"gpt":0.2815929967923899,"spread":0.1844083173277303,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"metacan-v3-hybrid-931329e0061c","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0003074724,0.001094578,0.0004437376,0.0008244138,0.0004180018,0.0008008464,0.001181941,0.0004397356,0.02088922],"category_scores_gemma":[0.001113907,0.0005689315,0.0004734525,0.0004590921,0.0004098412,0.001055388,0.0008026314,0.0008205739,0.003874473],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0007160379,"about_ca_system_score_gemma":0.001036966,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.002836686,"about_ca_topic_score_gemma":0.004975733,"domain_scores_codex":[0.9997423,0.00003828354,0.00001376165,0.00005710359,0.0001209255,0.00002765624],"domain_scores_gemma":[0.9996582,0.0001935389,0.00003327146,0.00004095341,0.00005878396,0.00001526923],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"design_other","study_design_gemma":"not_applicable","study_design_scores_codex":[0.0005180535,0.0001865811,0.00171305,0.0006034237,0.00006559664,0.0004870175,0.000240691,0.09388538,0.04330805,0.02947035,0.06444258,0.7650793],"study_design_scores_gemma":[0.0002849528,0.0001982982,0.0006857429,0.00006627706,0.00003574895,0.0005148519,0.0001014648,0.7856753,0.05575495,0.03056945,0.1260381,0.00007475018],"study_design_candidate":"not_applicable","study_design_consensus":null,"genre_codex":"methods","genre_gemma":"methods","genre_scores_codex":[0.005266666,0.00009967029,0.9268693,0.0000959979,0.00003595886,0.0002396749,0.0003932583,0.06017524,0.006824258],"genre_scores_gemma":[0.06468098,0.0001427465,0.9176533,0.0001270773,0.00001902097,0.0006121334,0.001249737,0.004020788,0.01149421],"genre_candidate":"methods","genre_consensus":"methods","teacher_disagreement_score":0.02088922,"threshold_uncertainty_score":0.06988144,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W2113717210","doi":"10.1109/test.2007.4437613","title":"On using lossless compression of debug data in embedded logic analysis","year":2007,"lang":"en","type":"article","venue":"","topic":"VLSI and Analog Circuit Testing","field":"Computer Science","cited_by":81,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"McMaster University","funders":"","keywords":"Lossless compression; Computer science; Debugging; Lossy compression; Data compression; Embedded system; Algorithm; Programming language; Artificial intelligence","authors":[{"name":"Ehab Anis","is_ca":true},{"name":"Nicola Nicolici","is_ca":true}],"retraction":null,"screen_n_in":null,"score":{"opus":0.1207292016652535,"gpt":0.3636850731487797,"spread":0.2429558714835262,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"metacan-v3-hybrid-931329e0061c","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.001770534,0.0009001752,0.0004310493,0.001160006,0.0003784248,0.001083403,0.001235293,0.0007001117,0.00137868],"category_scores_gemma":[0.008975414,0.0002972619,0.000203317,0.001210813,0.001384244,0.003811661,0.001052658,0.0008660722,0.0004143062],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0006938134,"about_ca_system_score_gemma":0.0003759958,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.0005255711,"about_ca_topic_score_gemma":0.0007136712,"domain_scores_codex":[0.9989323,0.0003013371,0.00004516947,0.0001169109,0.0005347668,0.00006954867],"domain_scores_gemma":[0.9923454,0.005097126,0.0005660441,0.001280707,0.0006014732,0.0001093305],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"design_other","study_design_gemma":"not_applicable","study_design_scores_codex":[0.00271988,0.0002954417,0.005344422,0.0003587016,0.0000681806,0.0003999164,0.0003673785,0.07220532,0.2497879,0.02617885,0.001757464,0.6405166],"study_design_scores_gemma":[0.0001428612,0.001029168,0.002986486,0.00007615674,0.00006614662,0.0009491377,0.00009413343,0.5104902,0.4570624,0.02170017,0.005329813,0.00007327806],"study_design_candidate":"not_applicable","study_design_consensus":null,"genre_codex":"methods","genre_gemma":"methods","genre_scores_codex":[0.2140191,0.003027944,0.7753242,0.0007487518,0.00007052985,0.0001969701,0.0001086788,0.001901116,0.004602766],"genre_scores_gemma":[0.7019506,0.001323963,0.2931957,0.0003372287,0.0001487377,0.0001305154,0.0001802243,0.0002220114,0.002511096],"genre_candidate":"methods","genre_consensus":"methods","teacher_disagreement_score":0.001770534,"threshold_uncertainty_score":0.009363651,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W2151815468","doi":"10.1109/test.1993.470638","title":"Analog circuit testing based on sensitivity computation and new circuit modeling","year":2002,"lang":"en","type":"article","venue":"","topic":"VLSI and Analog Circuit Testing","field":"Computer Science","cited_by":80,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"Polytechnique Montréal","funders":"","keywords":"Testability; Sensitivity (control systems); Computer science; Computation; Fault (geology); Circuit extraction; Analogue electronics; Equivalent circuit; Electronic engineering; Electronic circuit; Algorithm; Reliability engineering; Engineering; Electrical engineering; Voltage","authors":[{"name":"N.B. Hamida","is_ca":true},{"name":"Bożena Kamińska","is_ca":true}],"retraction":null,"screen_n_in":null,"score":{"opus":0.1408990496125411,"gpt":0.2466705602292986,"spread":0.1057715106167575,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"metacan-v3-hybrid-931329e0061c","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0005109549,0.0007955623,0.0005287522,0.001638969,0.0001782355,0.000882762,0.0008860902,0.0004518894,0.002780671],"category_scores_gemma":[0.001951218,0.0003012556,0.0007307178,0.0006367174,0.0009445079,0.001521927,0.0006503921,0.0007928368,0.0003944413],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.001053318,"about_ca_system_score_gemma":0.0003178201,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.0009788162,"about_ca_topic_score_gemma":0.0006083814,"domain_scores_codex":[0.9991684,0.0002219597,0.00003301179,0.00009651502,0.0004433776,0.00003687043],"domain_scores_gemma":[0.9991191,0.0005322912,0.00006660793,0.0001417393,0.0001212754,0.00001901429],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"simulation_or_modeling","study_design_gemma":"simulation_or_modeling","study_design_scores_codex":[0.00009145862,0.00006273839,0.000595703,0.0002019977,0.00009241553,0.0003265044,0.0001413543,0.5791043,0.04642238,0.2554933,0.001991644,0.1154761],"study_design_scores_gemma":[0.00000602563,0.00003480717,0.0001767804,0.00001347978,0.00001176438,0.000147841,0.000004300205,0.9478053,0.005586582,0.04353474,0.00266345,0.00001487533],"study_design_candidate":"simulation_or_modeling","study_design_consensus":"simulation_or_modeling","genre_codex":"methods","genre_gemma":"methods","genre_scores_codex":[0.009528033,0.0004269563,0.9830464,0.0001096174,0.00004550957,0.00003960707,0.00004208478,0.0007714439,0.005990364],"genre_scores_gemma":[0.6643211,0.001445286,0.3251659,0.000197063,0.0001755048,0.0002102562,0.0002343728,0.0002220697,0.008028519],"genre_candidate":"methods","genre_consensus":"methods","teacher_disagreement_score":0.002780671,"threshold_uncertainty_score":0.009302258,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W2167138995","doi":"10.1109/test.1990.113997","title":"A method to calculate necessary assignments in algorithmic test pattern generation","year":2002,"lang":"en","type":"article","venue":"","topic":"VLSI and Analog Circuit Testing","field":"Computer Science","cited_by":80,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"McGill University","funders":"","keywords":"Computer science; Test (biology); Reliability engineering; Engineering; Geology","authors":[{"name":"Janusz Rajski","is_ca":true},{"name":"Henry Cox","is_ca":true}],"retraction":null,"screen_n_in":null,"score":{"opus":0.05087255836574261,"gpt":0.2814902490136559,"spread":0.2306176906479133,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"metacan-v3-hybrid-931329e0061c","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.001247874,0.001285064,0.000869367,0.002150584,0.0009065972,0.001533116,0.002188053,0.001210556,0.009363362],"category_scores_gemma":[0.007918683,0.0007057112,0.0009556376,0.001580685,0.001339581,0.002123431,0.001411882,0.001708285,0.002686991],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0008377024,"about_ca_system_score_gemma":0.001464929,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.001145299,"about_ca_topic_score_gemma":0.001082323,"domain_scores_codex":[0.9979522,0.0005012056,0.0001583602,0.0003419657,0.0009082675,0.0001378993],"domain_scores_gemma":[0.9971294,0.001548139,0.0001717887,0.0004953919,0.0005894648,0.00006585997],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"design_other","study_design_gemma":"simulation_or_modeling","study_design_scores_codex":[0.0001855803,0.0001923925,0.000673836,0.0003243923,0.00005498234,0.0001699701,0.0001754845,0.05584896,0.01779878,0.1322679,0.008531281,0.7837765],"study_design_scores_gemma":[0.0002108278,0.0002875501,0.0003108439,0.00009831826,0.00006920642,0.0005523479,0.00005319662,0.7426048,0.03662682,0.1840778,0.03503459,0.00007371053],"study_design_candidate":"simulation_or_modeling","study_design_consensus":null,"genre_codex":"methods","genre_gemma":"methods","genre_scores_codex":[0.0008901245,0.0000271198,0.9973179,0.0000337168,0.00002272364,0.00005725595,0.00001814185,0.0007407351,0.0008922893],"genre_scores_gemma":[0.02264864,0.0000370393,0.9754314,0.0000613857,0.0000245829,0.000253808,0.0001134872,0.00024373,0.001185952],"genre_candidate":"methods","genre_consensus":"methods","teacher_disagreement_score":0.009363362,"threshold_uncertainty_score":0.03132355,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W2162979607","doi":"10.1109/date.2007.364595","title":"Low Cost Debug Architecture using Lossy Compression for Silicon Debug","year":2007,"lang":"en","type":"article","venue":"","topic":"VLSI and Analog Circuit Testing","field":"Computer Science","cited_by":74,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"McMaster University","funders":"","keywords":"Debugging; Background debug mode interface; Computer science; Lossy compression; Embedded system; Field-programmable gate array; TRACE (psycholinguistics); Computer architecture; Operating system","authors":[{"name":"Ehab Anis","is_ca":true},{"name":"Nicola Nicolici","is_ca":true}],"retraction":null,"screen_n_in":null,"score":{"opus":0.03580331556783997,"gpt":0.295253755879413,"spread":0.259450440311573,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"metacan-v3-hybrid-931329e0061c","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0003396001,0.0005927512,0.0003700212,0.001035748,0.0003717644,0.0007547595,0.001652657,0.0005579308,0.007558053],"category_scores_gemma":[0.0009046824,0.0002625455,0.000173891,0.0007101639,0.0003624361,0.001582455,0.0008358199,0.0006609213,0.001358518],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0004844289,"about_ca_system_score_gemma":0.0004943761,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.0006395262,"about_ca_topic_score_gemma":0.001350748,"domain_scores_codex":[0.9996431,0.00005281863,0.00001924466,0.00005773892,0.0001824687,0.00004468105],"domain_scores_gemma":[0.9994889,0.0001641952,0.00005080198,0.0001589074,0.0001151377,0.00002211439],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"design_other","study_design_gemma":"bench_or_experimental","study_design_scores_codex":[0.001085916,0.0003109043,0.002375964,0.0002943451,0.00006325988,0.0003503594,0.0002021019,0.01508195,0.2679712,0.01239491,0.008941286,0.6909278],"study_design_scores_gemma":[0.0002994492,0.001803079,0.00289778,0.00007560418,0.0001180965,0.001879419,0.0001105694,0.4011403,0.5441802,0.008239914,0.03913866,0.00011696],"study_design_candidate":"bench_or_experimental","study_design_consensus":null,"genre_codex":"methods","genre_gemma":"empirical","genre_scores_codex":[0.07774392,0.0009195184,0.9027566,0.0004121377,0.0001346772,0.0002932019,0.0001818483,0.01044089,0.007117265],"genre_scores_gemma":[0.6356087,0.0004069239,0.3503549,0.0004766333,0.0001242894,0.0003064972,0.000420164,0.0002938469,0.01200809],"genre_candidate":"empirical","genre_consensus":null,"teacher_disagreement_score":0.007558053,"threshold_uncertainty_score":0.02528417,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W2169375167","doi":"10.1109/test.1988.207853","title":"Stuck-open and transition fault testing in CMOS complex gates","year":2003,"lang":"en","type":"article","venue":"","topic":"VLSI and Analog Circuit Testing","field":"Computer Science","cited_by":72,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"McGill University","funders":"","keywords":"CMOS; Computer science; Logic gate; Transition (genetics); Fault (geology); Embedded system; Electronic engineering; Engineering; Algorithm; Chemistry","authors":[{"name":"Henry Cox","is_ca":true},{"name":"Janusz Rajski","is_ca":true}],"retraction":null,"screen_n_in":null,"score":{"opus":0.08930063950557257,"gpt":0.2817644205198935,"spread":0.1924637810143209,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"metacan-v3-hybrid-931329e0061c","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0003630402,0.0006448409,0.0003958334,0.001031243,0.0002292817,0.0006649208,0.0006058019,0.0004238898,0.002355462],"category_scores_gemma":[0.001835587,0.00015762,0.0004016332,0.000981899,0.000835109,0.001209894,0.0005441707,0.0002688217,0.0001673912],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0005600597,"about_ca_system_score_gemma":0.0002602214,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.001175007,"about_ca_topic_score_gemma":0.001198781,"domain_scores_codex":[0.9994609,0.0001576903,0.00003514767,0.00008986867,0.0002094631,0.00004698812],"domain_scores_gemma":[0.9991753,0.0005237475,0.00010918,0.0001016439,0.00006814315,0.00002193126],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"simulation_or_modeling","study_design_gemma":"bench_or_experimental","study_design_scores_codex":[0.001023214,0.0001091976,0.003467029,0.0004394205,0.00006709043,0.0008941884,0.0002705611,0.4248202,0.1354654,0.1217419,0.001790936,0.3099109],"study_design_scores_gemma":[0.0000793217,0.0008472366,0.001837825,0.0000453281,0.00003308645,0.0008385256,0.00004772458,0.8521583,0.07529141,0.06191444,0.006866341,0.00004050927],"study_design_candidate":"bench_or_experimental","study_design_consensus":null,"genre_codex":"methods","genre_gemma":"empirical","genre_scores_codex":[0.2285316,0.0010999,0.762128,0.0001365881,0.00004942348,0.0000970926,0.0003878041,0.001031892,0.006537752],"genre_scores_gemma":[0.8733749,0.00033575,0.1235457,0.00007657545,0.00001963101,0.00006093592,0.00030154,0.00006887018,0.002215925],"genre_candidate":"empirical","genre_consensus":null,"teacher_disagreement_score":0.002355462,"threshold_uncertainty_score":0.007879794,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W2133447618","doi":"10.1109/iccad.1989.77016","title":"A diagnosis method using pseudo-random vectors without intermediate signatures","year":2003,"lang":"en","type":"article","venue":"","topic":"VLSI and Analog Circuit Testing","field":"Computer Science","cited_by":70,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"McGill University","funders":"","keywords":"Signature (topology); Pseudorandom number generator; Computer science; Fraction (chemistry); Combinational logic; Resolution (logic); Fault (geology); Algorithm; Scheme (mathematics); Computer engineering; Data mining; Theoretical computer science; Artificial intelligence; Logic gate; Mathematics","authors":[{"name":"Robert Aitken","is_ca":true},{"name":"V.K. Agarwal","is_ca":true}],"retraction":null,"screen_n_in":null,"score":{"opus":0.02936040818826101,"gpt":0.297521670914599,"spread":0.268161262726338,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"metacan-v3-hybrid-931329e0061c","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0006318535,0.0007110301,0.0005649549,0.001765921,0.0004387257,0.001088713,0.001279434,0.001030798,0.004410961],"category_scores_gemma":[0.002616313,0.0003919719,0.0004403373,0.0005482657,0.0008280622,0.001600514,0.00100792,0.0009227049,0.001791109],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0006624881,"about_ca_system_score_gemma":0.0008220506,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.0005914177,"about_ca_topic_score_gemma":0.0006791995,"domain_scores_codex":[0.9988932,0.0001891459,0.00007225128,0.0002518563,0.0005282999,0.00006520235],"domain_scores_gemma":[0.9987453,0.0004600256,0.0001132428,0.0002487806,0.0003771177,0.00005561542],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"design_other","study_design_gemma":"simulation_or_modeling","study_design_scores_codex":[0.0002968355,0.00008224041,0.0007078376,0.0002607629,0.00003890931,0.0002621531,0.0001336464,0.01891377,0.08348215,0.06662565,0.004773625,0.8244224],"study_design_scores_gemma":[0.0001681774,0.0004353201,0.0006646902,0.00007140025,0.00005872687,0.001931896,0.00004261577,0.7623779,0.1597899,0.03750981,0.03681748,0.000132167],"study_design_candidate":"simulation_or_modeling","study_design_consensus":null,"genre_codex":"methods","genre_gemma":"empirical","genre_scores_codex":[0.001771279,0.00006774092,0.9960436,0.00005895168,0.00005200761,0.00004618323,0.00002276044,0.001151921,0.0007855953],"genre_scores_gemma":[0.1095722,0.0001505135,0.8847011,0.0001589068,0.00006141964,0.000145303,0.0001585041,0.0001473974,0.004904552],"genre_candidate":"empirical","genre_consensus":null,"teacher_disagreement_score":0.004410961,"threshold_uncertainty_score":0.01475608,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W2134886801","doi":"10.5555/1129601.1129724","title":"Post-verification debugging of hierarchical designs","year":2005,"lang":"en","type":"article","venue":"International Conference on Computer Aided Design","topic":"VLSI and Analog Circuit Testing","field":"Computer Science","cited_by":69,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"University of Toronto","funders":"","keywords":"Debugging; Computer science; Benchmark (surveying); Boolean satisfiability problem; Algorithmic program debugging; Exploit; Programming language; Computer engineering; Theoretical computer science","authors":[{"name":"Moayad Fahim Ali","is_ca":true},{"name":"S. Safarpour","is_ca":true},{"name":"Andreas Veneris","is_ca":true},{"name":"Magdy S. Abadir","is_ca":false},{"name":"Rolf Drechsler","is_ca":false}],"retraction":null,"screen_n_in":null,"score":{"opus":0.1056795001799317,"gpt":0.3028347411936196,"spread":0.1971552410136879,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"metacan-v3-hybrid-931329e0061c","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.002622098,0.0006302903,0.0005448498,0.0008677221,0.0004528066,0.0006610104,0.00119012,0.0005573603,0.002789937],"category_scores_gemma":[0.007879614,0.000357619,0.0004992927,0.0004053935,0.0006678235,0.001290891,0.0009605957,0.0006940415,0.0004597689],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0005985022,"about_ca_system_score_gemma":0.001175242,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.001061681,"about_ca_topic_score_gemma":0.002109756,"domain_scores_codex":[0.9971047,0.001196197,0.000140387,0.000333586,0.0009812504,0.0002439399],"domain_scores_gemma":[0.9925591,0.003256029,0.0008578661,0.002228712,0.0009948442,0.0001034486],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"design_other","study_design_gemma":"simulation_or_modeling","study_design_scores_codex":[0.0007833767,0.0001593352,0.004999316,0.0004621671,0.00007471671,0.0009974473,0.0006413209,0.1924526,0.1237807,0.0616115,0.002732585,0.611305],"study_design_scores_gemma":[0.00007204083,0.00050217,0.001819019,0.00008188996,0.00005894331,0.0005319159,0.0001001079,0.7717821,0.185363,0.03166677,0.007984649,0.00003737258],"study_design_candidate":"simulation_or_modeling","study_design_consensus":null,"genre_codex":"methods","genre_gemma":"empirical","genre_scores_codex":[0.0495037,0.0002076688,0.9462618,0.00006871783,0.00002253612,0.00006846579,0.00006872773,0.002483698,0.001314714],"genre_scores_gemma":[0.5957246,0.0001161277,0.4020742,0.0000469875,0.00001406998,0.00005530798,0.000171606,0.0001768555,0.00162032],"genre_candidate":"empirical","genre_consensus":null,"teacher_disagreement_score":0.002789937,"threshold_uncertainty_score":0.01386714,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W1902647564","doi":"10.1109/test.1995.529939","title":"A built-in self-test strategy for wireless communication systems","year":2002,"lang":"en","type":"article","venue":"","topic":"VLSI and Analog Circuit Testing","field":"Computer Science","cited_by":69,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":true,"ca_venue":false,"about_ca":false},"ca_institutions":"McGill University","funders":"Natural Sciences and Engineering Research Council of Canada","keywords":"Baseband; Intermodulation; Wireless; Electronic engineering; Computer science; Communications system; Band-pass filter; Radio frequency; Software-defined radio; Telecommunications; Electrical engineering; Engineering; Bandwidth (computing); Amplifier","authors":[{"name":"B.R. Veillette","is_ca":true},{"name":"Gordon W. Roberts","is_ca":true}],"retraction":null,"screen_n_in":null,"score":{"opus":0.05681011577298303,"gpt":0.2632821612724989,"spread":0.2064720454995158,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"metacan-v3-hybrid-931329e0061c","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0003855878,0.0003769587,0.000253438,0.0004741783,0.0003433206,0.0004353058,0.0007022923,0.0004451991,0.001367804],"category_scores_gemma":[0.001340601,0.0001570529,0.0002064453,0.0001414375,0.0007528297,0.0008578684,0.0004164858,0.0004450151,0.0005648279],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0002180403,"about_ca_system_score_gemma":0.0002663623,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.0001284468,"about_ca_topic_score_gemma":0.0002382439,"domain_scores_codex":[0.9995075,0.0001721093,0.00002847764,0.00006397371,0.0001951422,0.00003277344],"domain_scores_gemma":[0.9989805,0.0002846335,0.0001488277,0.0002801536,0.0002502158,0.00005569524],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"bench_or_experimental","study_design_gemma":"simulation_or_modeling","study_design_scores_codex":[0.0002633262,0.0003439878,0.002109908,0.0002017538,0.00003574403,0.0002538154,0.0002657587,0.004818105,0.6981611,0.02284395,0.001041097,0.2696615],"study_design_scores_gemma":[0.00009330108,0.004435905,0.004573188,0.00007307526,0.00009299186,0.00281158,0.00009645805,0.0719318,0.8875903,0.009763962,0.01847262,0.00006477777],"study_design_candidate":"simulation_or_modeling","study_design_consensus":null,"genre_codex":"methods","genre_gemma":"methods","genre_scores_codex":[0.1225142,0.0004015529,0.8687513,0.0003240417,0.00006831442,0.0002775333,0.00003180201,0.001754061,0.005877281],"genre_scores_gemma":[0.6975509,0.0002070343,0.296188,0.0003505531,0.00006643038,0.0001454897,0.00006720946,0.0001123873,0.005311914],"genre_candidate":"methods","genre_consensus":"methods","teacher_disagreement_score":0.001367804,"threshold_uncertainty_score":0.004575789,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W2098178883","doi":"10.1109/isqed.2007.38","title":"Assertion Checkers in Verification, Silicon Debug and In-Field Diagnosis","year":2007,"lang":"en","type":"article","venue":"","topic":"VLSI and Analog Circuit Testing","field":"Computer Science","cited_by":65,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"McGill University","funders":"","keywords":"Assertion; Debugging; Computer science; Generator (circuit theory); Functional verification; Formal verification; Software bug; Programming language; Electronic circuit; Embedded system; Computer architecture; Computer engineering; Software; Engineering","authors":[{"name":"M. Boulé","is_ca":true},{"name":"Jean-Samuel Chenard","is_ca":true},{"name":"Željko Žilić","is_ca":true}],"retraction":null,"screen_n_in":null,"score":{"opus":0.01623133635316808,"gpt":0.2574395404424716,"spread":0.2412082040893035,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"metacan-v3-hybrid-931329e0061c","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.007539266,0.0009774477,0.0009685982,0.002278329,0.001061688,0.00327973,0.001930536,0.001754624,0.004598537],"category_scores_gemma":[0.0138653,0.001115635,0.001163749,0.002058947,0.004642587,0.005598875,0.001925808,0.003168332,0.001521108],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0009956217,"about_ca_system_score_gemma":0.001599439,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.001527657,"about_ca_topic_score_gemma":0.00123921,"domain_scores_codex":[0.9937763,0.003018918,0.0004678648,0.0006804861,0.001742368,0.0003139999],"domain_scores_gemma":[0.9882069,0.008228654,0.0007460169,0.001902709,0.0007421339,0.0001735398],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"theoretical_or_conceptual","study_design_gemma":"simulation_or_modeling","study_design_scores_codex":[0.0002585651,0.00009778199,0.001203374,0.0006893388,0.0000685759,0.0004113381,0.0004752368,0.02550567,0.01069038,0.7469425,0.005594676,0.2080625],"study_design_scores_gemma":[0.0001831481,0.0004813424,0.0004643022,0.0005233023,0.0001681994,0.00103524,0.0001730877,0.2235226,0.05084663,0.6224441,0.1000475,0.0001106089],"study_design_candidate":"simulation_or_modeling","study_design_consensus":null,"genre_codex":"methods","genre_gemma":"methods","genre_scores_codex":[0.00356738,0.002289555,0.9880926,0.000442442,0.0001807642,0.00007532051,0.00006019151,0.001572494,0.003719297],"genre_scores_gemma":[0.1918869,0.004056728,0.7969913,0.0006177989,0.0003751214,0.0002341183,0.000302838,0.0004723257,0.005062867],"genre_candidate":"methods","genre_consensus":"methods","teacher_disagreement_score":0.007539266,"threshold_uncertainty_score":0.03987193,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W2147419146","doi":"10.1109/cicc.2001.929724","title":"Programmable logic IP cores in SoC design: opportunities and challenges","year":2002,"lang":"en","type":"article","venue":"","topic":"VLSI and Analog Circuit Testing","field":"Computer Science","cited_by":62,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"University of British Columbia","funders":"","keywords":"Programmable logic device; Simple programmable logic device; Programmable Array Logic; Logic synthesis; Computer science; Programmable logic array; Complex programmable logic device; Computer architecture; Logic family; Logic gate; Erasable programmable logic device; Mainstream; System on a chip; Macrocell array; Embedded system","authors":[{"name":"Steven J. E. Wilton","is_ca":true},{"name":"R. Saleh","is_ca":true}],"retraction":null,"screen_n_in":null,"score":{"opus":0.3906517160995529,"gpt":0.2660823575266489,"spread":0.124569358572904,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"metacan-v3-hybrid-931329e0061c","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.002435822,0.0007068763,0.0004861198,0.0003936801,0.0007452406,0.002351459,0.0008471984,0.001377209,0.002653145],"category_scores_gemma":[0.002496314,0.0004878306,0.0002883292,0.000535697,0.001528995,0.005325472,0.0009119153,0.00167824,0.000744496],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0004871601,"about_ca_system_score_gemma":0.001026114,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.0004043957,"about_ca_topic_score_gemma":0.0009326178,"domain_scores_codex":[0.999002,0.0003809582,0.0000569124,0.00007624826,0.0003941156,0.00008973238],"domain_scores_gemma":[0.9983149,0.000957969,0.00008057888,0.0001236102,0.000420575,0.0001023922],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"design_other","study_design_gemma":"theoretical_or_conceptual","study_design_scores_codex":[0.0002155953,0.0001316089,0.00311364,0.001208863,0.00002191144,0.001026773,0.0006449284,0.02046073,0.01026217,0.4101087,0.008389696,0.5444154],"study_design_scores_gemma":[0.0001146792,0.0007609543,0.001104637,0.0006187821,0.0000578782,0.002403431,0.0018239,0.1331241,0.015982,0.6440066,0.1999088,0.00009425106],"study_design_candidate":"theoretical_or_conceptual","study_design_consensus":null,"genre_codex":"methods","genre_gemma":"methods","genre_scores_codex":[0.1065082,0.09185539,0.65583,0.03617544,0.001033637,0.0001829719,0.00008168133,0.0007594057,0.1075732],"genre_scores_gemma":[0.5689254,0.05936967,0.3455209,0.002639443,0.001833721,0.0002674795,0.00007462125,0.000152759,0.02121605],"genre_candidate":"methods","genre_consensus":"methods","teacher_disagreement_score":0.002653145,"threshold_uncertainty_score":0.01288199,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W2081479998","doi":"10.1002/jcd.10059","title":"Covering arrays with mixed alphabet sizes","year":2003,"lang":"en","type":"article","venue":"Journal of Combinatorial Designs","topic":"VLSI and Analog Circuit Testing","field":"Computer Science","cited_by":62,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"Carleton University; Statistics Canada; University of Ottawa","funders":"","keywords":"Alphabet; Combinatorics; Row; Mathematics; Type (biology); Column (typography); Row and column spaces; Geometry; Computer science; Connection (principal bundle)","authors":[{"name":"Lucia Moura","is_ca":true},{"name":"John Stardom","is_ca":true},{"name":"Brett Stevens","is_ca":true},{"name":"Alan Williams","is_ca":true}],"retraction":null,"screen_n_in":null,"score":{"opus":0.02449294922199977,"gpt":0.230801669306003,"spread":0.2063087200840032,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"metacan-v3-hybrid-931329e0061c","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0007734483,0.0005290529,0.000526297,0.001080305,0.0006651594,0.001376003,0.0006881527,0.0005589171,0.004571223],"category_scores_gemma":[0.00537529,0.0004049614,0.0004407119,0.001292552,0.0006613967,0.002095084,0.001234235,0.0006607292,0.0008988497],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0004763101,"about_ca_system_score_gemma":0.0003087057,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.0001638919,"about_ca_topic_score_gemma":0.0002667021,"domain_scores_codex":[0.9979668,0.0006127593,0.000213756,0.0003312528,0.0005676939,0.0003078116],"domain_scores_gemma":[0.9926051,0.003644862,0.001004136,0.001415603,0.00089316,0.0004371729],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"theoretical_or_conceptual","study_design_gemma":"theoretical_or_conceptual","study_design_scores_codex":[0.00150641,0.0001723889,0.009925456,0.0004741564,0.000123515,0.001660142,0.0006495559,0.09766234,0.1589009,0.4205428,0.009918951,0.2984634],"study_design_scores_gemma":[0.0001523389,0.0009398113,0.00423072,0.0001668361,0.0001392605,0.004065576,0.000397522,0.3965662,0.1543714,0.378444,0.06036628,0.0001601034],"study_design_candidate":"theoretical_or_conceptual","study_design_consensus":"theoretical_or_conceptual","genre_codex":"methods","genre_gemma":"empirical","genre_scores_codex":[0.4502081,0.0007530196,0.509109,0.0005423342,0.0002346591,0.0001582966,0.0007591204,0.001936476,0.03629919],"genre_scores_gemma":[0.8329303,0.0001962338,0.1615169,0.0002195818,0.00009704083,0.000218216,0.0005369205,0.000131097,0.004153602],"genre_candidate":"empirical","genre_consensus":null,"teacher_disagreement_score":0.004571223,"threshold_uncertainty_score":0.01529229,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W4237135760","doi":"10.1109/date.2008.4484858","title":"Automated Trace Signals Identification and State Restoration for Improving Observability in Post-Silicon Validation","year":2008,"lang":"en","type":"article","venue":"2008 Design, Automation and Test in Europe","topic":"VLSI and Analog Circuit Testing","field":"Computer Science","cited_by":55,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"McMaster University","funders":"","keywords":"Observability; TRACE (psycholinguistics); Computer science; Identification (biology); Chip; Set (abstract data type); State (computer science); Software bug; Embedded system; Real-time computing; Software; Computer hardware; Algorithm; Operating system; Mathematics","authors":[{"name":"Ho Fai Ko","is_ca":true},{"name":"Nicola Nicolici","is_ca":true}],"retraction":null,"screen_n_in":null,"score":{"opus":0.04872749868183594,"gpt":0.2643035914894865,"spread":0.2155760928076506,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"metacan-v3-hybrid-931329e0061c","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.001383673,0.0006582042,0.0007463743,0.001538821,0.0004146063,0.0007298256,0.001246555,0.0005323216,0.001447961],"category_scores_gemma":[0.007453529,0.0002858955,0.0003931161,0.0008415699,0.0008817267,0.001588232,0.0009390921,0.0008724502,0.0002302541],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0005192811,"about_ca_system_score_gemma":0.001343173,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.001210441,"about_ca_topic_score_gemma":0.0017419,"domain_scores_codex":[0.9977643,0.0007614476,0.0001166047,0.0003353448,0.0008553995,0.000166855],"domain_scores_gemma":[0.9937174,0.003112135,0.000968808,0.001575255,0.0005313086,0.00009503282],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"design_other","study_design_gemma":"bench_or_experimental","study_design_scores_codex":[0.0008846018,0.0004895171,0.006067407,0.000156616,0.00005432521,0.0002799572,0.0004647446,0.1539394,0.14477,0.01588313,0.001095386,0.6759149],"study_design_scores_gemma":[0.0000674901,0.0003913061,0.002843961,0.00002018876,0.00002756793,0.0002784698,0.0000591409,0.8368331,0.1457698,0.01191916,0.001747285,0.00004256742],"study_design_candidate":"bench_or_experimental","study_design_consensus":null,"genre_codex":"methods","genre_gemma":"empirical","genre_scores_codex":[0.1106012,0.0001401388,0.8843368,0.00008697889,0.00001431433,0.00007360944,0.00006946881,0.004116531,0.0005609011],"genre_scores_gemma":[0.7506198,0.00005673425,0.2484343,0.00003571789,0.00001206726,0.00008140351,0.0001457204,0.0001107829,0.0005033759],"genre_candidate":"empirical","genre_consensus":null,"teacher_disagreement_score":0.001538821,"threshold_uncertainty_score":0.007317662,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W2116003598","doi":"10.1109/vtest.1997.599445","title":"A novel probabilistic approach for IC diagnosis based on differential quiescent current signatures","year":2002,"lang":"en","type":"article","venue":"","topic":"VLSI and Analog Circuit Testing","field":"Computer Science","cited_by":55,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"École de Technologie Supérieure","funders":"","keywords":"Robustness (evolution); Probabilistic logic; Subthreshold conduction; Computer science; Current (fluid); Differential (mechanical device); Algorithm; Electronic engineering; Artificial intelligence; Engineering; Transistor; Electrical engineering; Voltage","authors":[{"name":"Claude Thibeault","is_ca":true}],"retraction":null,"screen_n_in":null,"score":{"opus":0.05985015777979617,"gpt":0.2507324536236062,"spread":0.1908822958438101,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"metacan-v3-hybrid-931329e0061c","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0008736693,0.0008137007,0.0007500591,0.002123886,0.0004178719,0.001054322,0.001788165,0.00124332,0.001482228],"category_scores_gemma":[0.00507475,0.0003898846,0.0007978281,0.001013558,0.001244545,0.002238028,0.001353683,0.0009654965,0.0006212756],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0006236403,"about_ca_system_score_gemma":0.0008169884,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.0008555602,"about_ca_topic_score_gemma":0.0007681539,"domain_scores_codex":[0.9986473,0.0002415008,0.00008075583,0.0002498632,0.0006988752,0.00008174127],"domain_scores_gemma":[0.9978854,0.001144256,0.0002648341,0.0002138493,0.0004285591,0.00006304955],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"design_other","study_design_gemma":"simulation_or_modeling","study_design_scores_codex":[0.000276995,0.0001122902,0.003688775,0.000506634,0.0001189199,0.0007708173,0.0003128338,0.1989885,0.06295639,0.1163513,0.002374875,0.6135417],"study_design_scores_gemma":[0.00003037899,0.0001527317,0.0008289484,0.0000351179,0.00006297755,0.001275004,0.00003407699,0.9158725,0.02136709,0.05500207,0.005282619,0.00005649924],"study_design_candidate":"simulation_or_modeling","study_design_consensus":null,"genre_codex":"methods","genre_gemma":"methods","genre_scores_codex":[0.001693469,0.0001106164,0.9973655,0.00005953082,0.00001174587,0.00002026686,0.00002157596,0.0002226173,0.000494684],"genre_scores_gemma":[0.2530011,0.0004290044,0.7441548,0.0002530868,0.0001305551,0.0001500137,0.0001736165,0.0000969887,0.001610844],"genre_candidate":"methods","genre_consensus":"methods","teacher_disagreement_score":0.002123886,"threshold_uncertainty_score":0.00495851,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W2043080690","doi":"10.1002/jcd.20035","title":"Group construction of covering arrays","year":2004,"lang":"en","type":"article","venue":"Journal of Combinatorial Designs","topic":"VLSI and Analog Circuit Testing","field":"Computer Science","cited_by":55,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"Carleton University; University of Ottawa","funders":"","keywords":"Combinatorics; Mathematics; Group (periodic table); Extension (predicate logic); Column (typography); Set (abstract data type); Algebraic number; Geometry; Physics; Computer science; Connection (principal bundle); Mathematical analysis","authors":[{"name":"Karen Meagher","is_ca":true},{"name":"Brett Stevens","is_ca":true}],"retraction":null,"screen_n_in":null,"score":{"opus":0.0227440757569816,"gpt":0.2350932994631618,"spread":0.2123492237061801,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"metacan-v3-hybrid-931329e0061c","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0004310869,0.0004024992,0.0004240389,0.001132471,0.0007959191,0.001108051,0.0004965175,0.0004667186,0.004915149],"category_scores_gemma":[0.001717866,0.0002927813,0.0006153769,0.0009674688,0.001162101,0.0009860368,0.001839491,0.0008848289,0.0009840024],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0005343963,"about_ca_system_score_gemma":0.0004883885,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.0004754671,"about_ca_topic_score_gemma":0.000428933,"domain_scores_codex":[0.9988084,0.0003029981,0.00005878941,0.0002039575,0.0003396986,0.0002861872],"domain_scores_gemma":[0.9986029,0.00041258,0.0002046525,0.0003887239,0.0002219733,0.0001691003],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"theoretical_or_conceptual","study_design_gemma":"theoretical_or_conceptual","study_design_scores_codex":[0.0004312245,0.0001240461,0.002398228,0.0002157257,0.0000527386,0.0007902978,0.00117336,0.02749309,0.07223331,0.7571414,0.00790001,0.1300466],"study_design_scores_gemma":[0.0001577768,0.00076319,0.002045784,0.00008744832,0.00009069222,0.001549557,0.0004976114,0.1192805,0.1262014,0.6302014,0.1190308,0.00009385782],"study_design_candidate":"theoretical_or_conceptual","study_design_consensus":"theoretical_or_conceptual","genre_codex":"methods","genre_gemma":"empirical","genre_scores_codex":[0.4355928,0.0004168365,0.4717995,0.0005256929,0.0004513288,0.000247126,0.0002953142,0.001530243,0.08914122],"genre_scores_gemma":[0.8876497,0.0001730098,0.1024549,0.0001823104,0.00009631678,0.0001469193,0.000313779,0.000159214,0.008823908],"genre_candidate":"empirical","genre_consensus":null,"teacher_disagreement_score":0.004915149,"threshold_uncertainty_score":0.01644284,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W2131374318","doi":"10.1109/vtest.1994.292334","title":"Multifrequency testability analysis for analog circuits","year":2002,"lang":"en","type":"article","venue":"","topic":"VLSI and Analog Circuit Testing","field":"Computer Science","cited_by":54,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"Polytechnique Montréal","funders":"","keywords":"Testability; Computer science; Analogue electronics; Design for testing; Electronic circuit; Mixed-signal integrated circuit; Electronic engineering; Electrical engineering; Reliability engineering; Engineering","authors":[{"name":"Mohamed Slamani","is_ca":true},{"name":"Bożena Kamińska","is_ca":true}],"retraction":null,"screen_n_in":null,"score":{"opus":0.06612392002490318,"gpt":0.2549004185651289,"spread":0.1887764985402257,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"metacan-v3-hybrid-931329e0061c","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0003237645,0.0003699347,0.0002367571,0.001657921,0.0002267783,0.000488076,0.0002285226,0.0002575812,0.002421919],"category_scores_gemma":[0.002333896,0.00007386385,0.0003784309,0.0005554884,0.0004558173,0.0007083893,0.0003301647,0.0004111859,0.0001164831],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0006459964,"about_ca_system_score_gemma":0.0001953267,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.001511912,"about_ca_topic_score_gemma":0.0007037679,"domain_scores_codex":[0.9996818,0.00007787222,0.00001236771,0.0000427326,0.0001526555,0.00003256199],"domain_scores_gemma":[0.9989181,0.0007456423,0.0001304573,0.00005907644,0.0001245567,0.00002216081],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"simulation_or_modeling","study_design_gemma":"simulation_or_modeling","study_design_scores_codex":[0.0001541454,0.00006880553,0.003281713,0.0002309153,0.00005896192,0.0002373867,0.0002145811,0.4099885,0.06344387,0.2606129,0.0009065525,0.2608017],"study_design_scores_gemma":[0.00001188135,0.00008301525,0.001537027,0.00002072468,0.00001169176,0.0001448126,0.00002792232,0.8823859,0.007950827,0.1061213,0.001694702,0.00001022218],"study_design_candidate":"simulation_or_modeling","study_design_consensus":"simulation_or_modeling","genre_codex":"methods","genre_gemma":"empirical","genre_scores_codex":[0.0981366,0.0006658806,0.897155,0.0001521633,0.00001641496,0.00002373658,0.00005552284,0.0001943245,0.003600235],"genre_scores_gemma":[0.9305872,0.0004106816,0.06695554,0.00004512169,0.00005535927,0.00003606284,0.0001170652,0.0000309352,0.001761985],"genre_candidate":"empirical","genre_consensus":null,"teacher_disagreement_score":0.002421919,"threshold_uncertainty_score":0.008102119,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W2075105459","doi":"10.1049/ip-cdt:20045019","title":"Resource-constrained system-on-a-chip test: a survey","year":2005,"lang":"en","type":"article","venue":"IEE Proceedings - Computers and Digital Techniques","topic":"VLSI and Analog Circuit Testing","field":"Computer Science","cited_by":54,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"McMaster University","funders":"","keywords":"Reuse; Test (biology); Computer science; Test Management Approach; Resource (disambiguation); Key (lock); Embedded system; Engineering; Operating system","authors":[{"name":"Qiang Xu","is_ca":true},{"name":"Nicola Nicolici","is_ca":true}],"retraction":null,"screen_n_in":null,"score":{"opus":0.01729743171286061,"gpt":0.2237829421351339,"spread":0.2064855104222733,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"metacan-v3-hybrid-931329e0061c","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0007610661,0.0005428508,0.0008428523,0.001876828,0.0002862386,0.001256602,0.0009887692,0.0006409462,0.002739092],"category_scores_gemma":[0.001779686,0.0002642172,0.0003271449,0.003291271,0.0003015777,0.001597529,0.0004241293,0.0004036399,0.001186805],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0003319046,"about_ca_system_score_gemma":0.0007995242,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.00133684,"about_ca_topic_score_gemma":0.001665692,"domain_scores_codex":[0.9992707,0.0001320311,0.00006754944,0.00008419398,0.0003918714,0.00005361784],"domain_scores_gemma":[0.998403,0.0009289215,0.0001129467,0.00008336162,0.0004035249,0.00006829117],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"design_other","study_design_gemma":"not_applicable","study_design_scores_codex":[0.00009222884,0.00008499364,0.002704687,0.001795436,0.0000351559,0.0001784554,0.00005976469,0.006676135,0.002985214,0.005455246,0.009098767,0.9708339],"study_design_scores_gemma":[0.00009364093,0.001360868,0.01266157,0.002305888,0.000259427,0.005989475,0.0006520424,0.07924688,0.01139489,0.02491128,0.8610212,0.0001027275],"study_design_candidate":"not_applicable","study_design_consensus":null,"genre_codex":"review","genre_gemma":"review","genre_scores_codex":[0.03244506,0.6616098,0.2556779,0.001954963,0.0006381711,0.0003049668,0.0005150069,0.001001732,0.04585237],"genre_scores_gemma":[0.2222321,0.645894,0.1116869,0.001562203,0.001414776,0.0003579167,0.001954818,0.0002510791,0.01464624],"genre_candidate":"review","genre_consensus":"review","teacher_disagreement_score":0.002739092,"threshold_uncertainty_score":0.009163201,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W1881506156","doi":"10.1109/test.1996.557094","title":"LIMSoft: automated tool for design and test integration of analog circuits","year":2002,"lang":"en","type":"article","venue":"","topic":"VLSI and Analog Circuit Testing","field":"Computer Science","cited_by":50,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"Université de Montréal; Polytechnique Montréal","funders":"","keywords":"Sensitivity (control systems); Computer science; Analogue electronics; Automatic test pattern generation; Fault (geology); Design for testing; Electronic circuit; Built-in self-test; Electronic engineering; Fault detection and isolation; Computation; Reliability engineering; Embedded system; Engineering; Algorithm; Electrical engineering; Artificial intelligence","authors":[{"name":"N.B. Hamida","is_ca":true},{"name":"Khaled Saab","is_ca":true},{"name":"D. Marche","is_ca":true},{"name":"Bożena Kamińska","is_ca":true},{"name":"G. Quesnel","is_ca":true}],"retraction":null,"screen_n_in":null,"score":{"opus":0.05381373514173774,"gpt":0.2522790968109267,"spread":0.198465361669189,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"metacan-v3-hybrid-931329e0061c","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00189363,0.002031832,0.0008738151,0.001988636,0.0004386195,0.001343108,0.002204364,0.0008672333,0.01805963],"category_scores_gemma":[0.00593175,0.001060504,0.001044575,0.000917518,0.0007998358,0.001947312,0.001559102,0.001569501,0.00389287],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0007058813,"about_ca_system_score_gemma":0.0009921461,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.0009828709,"about_ca_topic_score_gemma":0.00115332,"domain_scores_codex":[0.9981788,0.0005146935,0.0001386549,0.000218581,0.0008254136,0.0001237689],"domain_scores_gemma":[0.9960462,0.002671262,0.0002989779,0.0005542155,0.0003523346,0.00007698205],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"design_other","study_design_gemma":"bench_or_experimental","study_design_scores_codex":[0.0007775122,0.0002538718,0.002403709,0.001234232,0.0001918521,0.0007876341,0.0003204806,0.06454364,0.04382964,0.0282238,0.04673267,0.8107008],"study_design_scores_gemma":[0.0004692499,0.0005428393,0.001903695,0.0003103095,0.0001485054,0.001596172,0.00008523907,0.7521914,0.09186565,0.05705239,0.09368826,0.0001463759],"study_design_candidate":"bench_or_experimental","study_design_consensus":null,"genre_codex":"methods","genre_gemma":"methods","genre_scores_codex":[0.002811207,0.0001644376,0.9249478,0.00004905001,0.0000270822,0.00006397742,0.000396627,0.0698194,0.001720429],"genre_scores_gemma":[0.1225143,0.0002916775,0.8624831,0.000304895,0.00007376827,0.0006946993,0.002863245,0.006437802,0.004336518],"genre_candidate":"methods","genre_consensus":"methods","teacher_disagreement_score":0.01805963,"threshold_uncertainty_score":0.06041551,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W2120428171","doi":"","title":"Using Sparse Crossbars within LUT Clusters","year":2001,"lang":"en","type":"article","venue":"","topic":"VLSI and Analog Circuit Testing","field":"Computer Science","cited_by":49,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"University of Toronto","funders":"","keywords":"Crossbar switch; Lookup table; Parallel computing; Computer science; Overhead (engineering); Path (computing); Spare part; Cluster (spacecraft); Routing (electronic design automation); Field-programmable gate array; Block (permutation group theory); Sparse matrix; Algorithm; Topology (electrical circuits); Embedded system; Mathematics; Computer network; Engineering; Combinatorics; Physics; Telecommunications","authors":[{"name":"Guy Lemieux","is_ca":true},{"name":"David Lewis","is_ca":true}],"retraction":null,"screen_n_in":null,"score":{"opus":0.0873540685684595,"gpt":0.2931558043266532,"spread":0.2058017357581937,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"metacan-v3-hybrid-931329e0061c","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0002225301,0.0004836586,0.000251372,0.0003461508,0.0002722161,0.0006118495,0.0006826818,0.0002159999,0.003297824],"category_scores_gemma":[0.0007070461,0.0002498459,0.0002195053,0.0005248536,0.0003452596,0.00106072,0.0005672692,0.0002593609,0.0004244808],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0003676903,"about_ca_system_score_gemma":0.0003902605,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.002210859,"about_ca_topic_score_gemma":0.005111966,"domain_scores_codex":[0.999783,0.00005926523,0.00001374351,0.00004952768,0.00005200227,0.00004260727],"domain_scores_gemma":[0.9994223,0.0001726596,0.0001010131,0.0001592807,0.0001045196,0.00004026463],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","study_design_scores_codex":[0.001030754,0.0002359095,0.005306599,0.0004716757,0.0001812419,0.0004611982,0.000292147,0.2723317,0.4533581,0.02467755,0.002879744,0.2387733],"study_design_scores_gemma":[0.0001536902,0.003117891,0.005022996,0.00007328125,0.0001998674,0.0008088379,0.0001918339,0.4913143,0.4547191,0.01351862,0.0307995,0.00008002189],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","genre_codex":"empirical","genre_gemma":"empirical","genre_scores_codex":[0.6706201,0.0006881112,0.3174189,0.0002380354,0.0001146806,0.0000767876,0.0001781029,0.003543358,0.007121717],"genre_scores_gemma":[0.9215466,0.0001931951,0.07474475,0.00005312394,0.00002044851,0.00002329992,0.0001576333,0.00006863507,0.003192173],"genre_candidate":"empirical","genre_consensus":"empirical","teacher_disagreement_score":0.003297824,"threshold_uncertainty_score":0.01103234,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W2161191982","doi":"10.1109/19.982974","title":"Fault tolerance in systems design in VLSI using data compression under constraints of failure probabilities","year":2001,"lang":"en","type":"article","venue":"IEEE Transactions on Instrumentation and Measurement","topic":"VLSI and Analog Circuit Testing","field":"Computer Science","cited_by":49,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"University of Ottawa","funders":"Université Libanaise","keywords":"Overhead (engineering); Very-large-scale integration; Benchmark (surveying); Built-in self-test; Computer science; Combinational logic; Fault coverage; Electronic circuit; Algorithm; Computer engineering; Logic gate; Engineering; Embedded system","authors":[{"name":"S.R. Das","is_ca":true},{"name":"C. V. Ramamoorthy","is_ca":false},{"name":"Mansour H. Assaf","is_ca":true},{"name":"Emil M. Petriu","is_ca":true},{"name":"Wen-Ben Jone","is_ca":false}],"retraction":null,"screen_n_in":null,"score":{"opus":0.1771011726762866,"gpt":0.299519638197174,"spread":0.1224184655208874,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"metacan-v3-hybrid-931329e0061c","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.001000667,0.0005858822,0.0006108673,0.0009114775,0.0002660387,0.0009981779,0.0004841755,0.0004242144,0.001065826],"category_scores_gemma":[0.005174379,0.000291509,0.0003783494,0.001066624,0.0007011794,0.001411975,0.0007005539,0.0004673084,0.0002709616],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0005128664,"about_ca_system_score_gemma":0.000604114,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.0005652824,"about_ca_topic_score_gemma":0.0006687492,"domain_scores_codex":[0.999235,0.0002432724,0.00005059338,0.00005943589,0.0003588168,0.00005287684],"domain_scores_gemma":[0.9979464,0.001374165,0.0001948162,0.0002923158,0.0001671312,0.00002501694],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"simulation_or_modeling","study_design_gemma":"simulation_or_modeling","study_design_scores_codex":[0.0002397482,0.00004514455,0.001429309,0.0002356711,0.00006178855,0.0002452405,0.0002306078,0.6462653,0.02557524,0.0738882,0.0005874729,0.2511963],"study_design_scores_gemma":[0.00004735163,0.0002469314,0.0004406934,0.00005714143,0.00003074607,0.0002124463,0.00003385863,0.92488,0.02813898,0.04292869,0.002967185,0.00001594544],"study_design_candidate":"simulation_or_modeling","study_design_consensus":"simulation_or_modeling","genre_codex":"methods","genre_gemma":"empirical","genre_scores_codex":[0.06182639,0.001221798,0.9332804,0.000244743,0.00002502772,0.00007590649,0.00003867909,0.000580614,0.002706406],"genre_scores_gemma":[0.7502116,0.00165394,0.2461641,0.00008995432,0.00009470393,0.0002479898,0.0001184346,0.00008368288,0.001335711],"genre_candidate":"empirical","genre_consensus":null,"teacher_disagreement_score":0.001065826,"threshold_uncertainty_score":0.005292118,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W4229759008","doi":"10.1109/edtc.1995.470387","title":"Complexity of sequential ATPG","year":2002,"lang":"en","type":"article","venue":"","topic":"VLSI and Analog Circuit Testing","field":"Computer Science","cited_by":49,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"McGill University","funders":"","keywords":"Automatic test pattern generation; Computer science; Sequential logic; Retiming; Key (lock); Encoding (memory); Algorithm; Test (biology); Computer engineering; Electronic circuit; Theoretical computer science; Logic gate; Artificial intelligence; Engineering","authors":[{"name":"T.E. Marchok","is_ca":false},{"name":"Aiman H. El‐Maleh","is_ca":false},{"name":"W. Maly","is_ca":false},{"name":"Janusz Rajski","is_ca":true}],"retraction":null,"screen_n_in":null,"score":{"opus":0.1490572095897546,"gpt":0.262172857151821,"spread":0.1131156475620664,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"metacan-v3-hybrid-931329e0061c","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.001176531,0.0003540635,0.0004513425,0.000875077,0.0004474572,0.00147353,0.000741063,0.0004996503,0.005534742],"category_scores_gemma":[0.01325389,0.0003584587,0.0005281035,0.0008306773,0.0008651739,0.00250684,0.0007739692,0.0008461617,0.0005063069],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.001303809,"about_ca_system_score_gemma":0.00135403,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.001374594,"about_ca_topic_score_gemma":0.001881881,"domain_scores_codex":[0.9972413,0.0005895147,0.0001757175,0.0003177248,0.001460538,0.0002152211],"domain_scores_gemma":[0.9850327,0.01143438,0.000925104,0.001295678,0.001118635,0.0001936628],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"simulation_or_modeling","study_design_gemma":"theoretical_or_conceptual","study_design_scores_codex":[0.0009025212,0.0001528715,0.00794238,0.0006367643,0.00009074868,0.0007855514,0.0004517467,0.4563619,0.02785223,0.242418,0.004347067,0.2580582],"study_design_scores_gemma":[0.00006330481,0.0002695685,0.002226811,0.00003702364,0.00005181053,0.0006364553,0.00008772932,0.7378482,0.01224647,0.2402501,0.006250556,0.00003206275],"study_design_candidate":"theoretical_or_conceptual","study_design_consensus":null,"genre_codex":"methods","genre_gemma":"empirical","genre_scores_codex":[0.340624,0.001037303,0.6256739,0.001527653,0.00009213023,0.0002496003,0.0007650483,0.001463469,0.02856691],"genre_scores_gemma":[0.914501,0.000413301,0.07938457,0.0001736365,0.00006859492,0.0001916723,0.0006957554,0.0001561337,0.004415454],"genre_candidate":"empirical","genre_consensus":null,"teacher_disagreement_score":0.005534742,"threshold_uncertainty_score":0.01851553,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W2099502153","doi":"10.1109/etw.2001.946668","title":"A packet switching communication-based test access mechanism for system chips","year":2005,"lang":"en","type":"article","venue":"","topic":"VLSI and Analog Circuit Testing","field":"Computer Science","cited_by":49,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"University of British Columbia","funders":"","keywords":"Computer science; Scalability; Modular design; Computer architecture; Architecture; Network packet; Embedded system; Packet switching; Computer network; Interconnection; Distributed computing; Operating system","authors":[{"name":"M. Nahvi","is_ca":true},{"name":"A. Ivanov","is_ca":true}],"retraction":null,"screen_n_in":null,"score":{"opus":0.03761777233947965,"gpt":0.2802328528097221,"spread":0.2426150804702424,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"metacan-v3-hybrid-931329e0061c","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0007148815,0.0003536778,0.0002556986,0.000914219,0.0003568965,0.0007727333,0.001743995,0.0005620021,0.002194291],"category_scores_gemma":[0.001596009,0.0001619542,0.0002452366,0.0004716975,0.0004764659,0.001141252,0.0005569606,0.0005886178,0.0003985612],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0005965951,"about_ca_system_score_gemma":0.0005568449,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.0003213976,"about_ca_topic_score_gemma":0.0003948227,"domain_scores_codex":[0.9994341,0.0001437506,0.00004027201,0.00007988923,0.0002271806,0.00007482459],"domain_scores_gemma":[0.9988362,0.0003278595,0.0001795775,0.0003002314,0.0002936845,0.0000625219],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"design_other","study_design_gemma":"bench_or_experimental","study_design_scores_codex":[0.001135581,0.0004042423,0.006192621,0.0006716695,0.0002215667,0.0007324581,0.0003457522,0.03787169,0.3371376,0.1391269,0.01099625,0.4651636],"study_design_scores_gemma":[0.0002759726,0.003877103,0.00442868,0.0001011908,0.0003563825,0.002110248,0.00008486037,0.4817216,0.4214521,0.01756404,0.06791119,0.0001166451],"study_design_candidate":"bench_or_experimental","study_design_consensus":null,"genre_codex":"methods","genre_gemma":"empirical","genre_scores_codex":[0.1201887,0.0006361899,0.8677155,0.0003177367,0.0002010695,0.000317303,0.0001290689,0.00502051,0.005473912],"genre_scores_gemma":[0.8823609,0.0001670027,0.113875,0.0002465239,0.00009196615,0.0001876782,0.0001458036,0.00006959794,0.002855567],"genre_candidate":"empirical","genre_consensus":null,"teacher_disagreement_score":0.002194291,"threshold_uncertainty_score":0.00734061,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W2345908052","doi":"10.1109/tcad.2016.2565204","title":"Signal-Tracing Techniques for In-System FPGA Debugging of High-Level Synthesis Circuits","year":2016,"lang":"en","type":"article","venue":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","topic":"VLSI and Analog Circuit Testing","field":"Computer Science","cited_by":46,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":true,"ca_venue":false,"about_ca":false},"ca_institutions":"University of British Columbia","funders":"Natural Sciences and Engineering Research Council of Canada","keywords":"Debugging; Tracing; Field-programmable gate array; Computer science; SIGNAL (programming language); Electronic circuit; Embedded system; Computer hardware; Programming language; Engineering; Electrical engineering","authors":[{"name":"Jeffrey Goeders","is_ca":true},{"name":"Steven J. E. Wilton","is_ca":true}],"retraction":null,"screen_n_in":null,"score":{"opus":0.05055470192711235,"gpt":0.2394350009629695,"spread":0.1888802990358572,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"metacan-v3-hybrid-931329e0061c","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0006637005,0.0005886122,0.0002137534,0.001036749,0.0002970746,0.0006327707,0.0008760989,0.0003804762,0.003725202],"category_scores_gemma":[0.003498817,0.0002877393,0.0002198003,0.000574338,0.0003922717,0.0007798534,0.0004321914,0.0006424326,0.0005295471],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0006690554,"about_ca_system_score_gemma":0.0007605521,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.001575766,"about_ca_topic_score_gemma":0.002824557,"domain_scores_codex":[0.9993201,0.000225266,0.00005329711,0.00008013604,0.0002620433,0.0000591009],"domain_scores_gemma":[0.9972998,0.001181403,0.0002923806,0.0008795458,0.0003014213,0.0000454882],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"design_other","study_design_gemma":"bench_or_experimental","study_design_scores_codex":[0.0006470815,0.0002223576,0.004975716,0.0003476884,0.00006130267,0.000355387,0.0008587686,0.06506713,0.2310577,0.0181796,0.003497004,0.6747303],"study_design_scores_gemma":[0.00008728606,0.0004720291,0.002467946,0.00006665333,0.00005394885,0.0004929145,0.0001019455,0.4889889,0.4824066,0.009076755,0.015743,0.00004206544],"study_design_candidate":"bench_or_experimental","study_design_consensus":null,"genre_codex":"methods","genre_gemma":"empirical","genre_scores_codex":[0.02733549,0.0001272612,0.9630167,0.00005832062,0.00001832871,0.00004571796,0.00006586005,0.007844714,0.001487659],"genre_scores_gemma":[0.4877437,0.0002111142,0.5086397,0.00007090867,0.00001801875,0.00007515801,0.0001739585,0.0006501819,0.002417212],"genre_candidate":"empirical","genre_consensus":null,"teacher_disagreement_score":0.003725202,"threshold_uncertainty_score":0.01246202,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W2109096321","doi":"10.1109/ftcs.1988.5299","title":"An iterative technique for calculating aliasing probability of linear feedback signature registers","year":2003,"lang":"en","type":"article","venue":"","topic":"VLSI and Analog Circuit Testing","field":"Computer Science","cited_by":45,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"McGill University","funders":"","keywords":"Aliasing; Signature (topology); Computer science; Algorithm; Constant (computer programming); Polynomial; Iterative method; Probability of error; Mathematics; Theoretical computer science; Artificial intelligence","authors":[{"name":"A. Ivanov","is_ca":true},{"name":"V.K. Agarwal","is_ca":true}],"retraction":null,"screen_n_in":null,"score":{"opus":0.03868602943129575,"gpt":0.2928940745332264,"spread":0.2542080451019307,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"metacan-v3-hybrid-931329e0061c","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.001737734,0.001196975,0.0006908041,0.00213508,0.0006599105,0.001346519,0.002063901,0.0009738457,0.004585977],"category_scores_gemma":[0.0159016,0.0006385701,0.00102918,0.001331096,0.0009837708,0.002036667,0.00152575,0.001564054,0.001437985],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.001427183,"about_ca_system_score_gemma":0.001850865,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.002645836,"about_ca_topic_score_gemma":0.003730046,"domain_scores_codex":[0.9977544,0.0005110984,0.0001189162,0.0002479284,0.001214785,0.0001529206],"domain_scores_gemma":[0.993405,0.003243604,0.0007804898,0.0008537921,0.001568725,0.0001483428],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"design_other","study_design_gemma":"simulation_or_modeling","study_design_scores_codex":[0.0006402141,0.0001635327,0.004112189,0.0002826606,0.0002140982,0.0005542391,0.0006830898,0.2713946,0.08290938,0.1227658,0.002415929,0.5138642],"study_design_scores_gemma":[0.00002303897,0.000103228,0.0009755539,0.00002965915,0.00003515926,0.0004059382,0.00002651992,0.9227014,0.04740555,0.02650311,0.001727813,0.00006308114],"study_design_candidate":"simulation_or_modeling","study_design_consensus":null,"genre_codex":"methods","genre_gemma":"methods","genre_scores_codex":[0.002570163,0.00002167768,0.9963845,0.00001833532,0.000005509758,0.0000282796,0.00001568157,0.0004404244,0.0005153632],"genre_scores_gemma":[0.1237489,0.0001188268,0.8735101,0.00005329027,0.00002686527,0.0001880607,0.0000872966,0.0002326482,0.002034033],"genre_candidate":"methods","genre_consensus":"methods","teacher_disagreement_score":0.004585977,"threshold_uncertainty_score":0.01534164,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W2098854373","doi":"10.1109/test.2008.4700594","title":"Distributed Embedded Logic Analysis for Post-Silicon Validation of SOCs","year":2008,"lang":"en","type":"article","venue":"","topic":"VLSI and Analog Circuit Testing","field":"Computer Science","cited_by":44,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"McMaster University","funders":"","keywords":"Observability; Debugging; Computer science; Embedded system; Background debug mode interface; System on a chip; TRACE (psycholinguistics); Chip; Silicon; Computer architecture; Real-time computing; Operating system","authors":[{"name":"Ho Fai Ko","is_ca":true},{"name":"Adam B. Kinsman","is_ca":true},{"name":"Nicola Nicolici","is_ca":true}],"retraction":null,"screen_n_in":null,"score":{"opus":0.0469125481870312,"gpt":0.2695609108127107,"spread":0.2226483626256795,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"metacan-v3-hybrid-931329e0061c","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0009565449,0.0006200587,0.0004153868,0.0006788025,0.0003696931,0.0006689576,0.0009899437,0.0004380235,0.001733784],"category_scores_gemma":[0.003017311,0.0001952366,0.0003555925,0.0003272909,0.0006404687,0.0009626335,0.0005648254,0.0005791238,0.0001986062],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0007916092,"about_ca_system_score_gemma":0.001196091,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.000971459,"about_ca_topic_score_gemma":0.001499711,"domain_scores_codex":[0.9991102,0.0003168779,0.00003435482,0.0001593318,0.0002942746,0.00008500306],"domain_scores_gemma":[0.9980564,0.0009400515,0.0001921382,0.000449341,0.0003188138,0.00004315786],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"simulation_or_modeling","study_design_gemma":"bench_or_experimental","study_design_scores_codex":[0.0008132741,0.0002636297,0.006105402,0.0002975247,0.0001105217,0.0003405927,0.0001998039,0.4278183,0.2121929,0.03493897,0.001482021,0.315437],"study_design_scores_gemma":[0.00006548654,0.0001979066,0.0009458637,0.0000125012,0.00002950998,0.00007989441,0.00002191018,0.9171584,0.06901887,0.01071414,0.001745267,0.00001008766],"study_design_candidate":"bench_or_experimental","study_design_consensus":null,"genre_codex":"methods","genre_gemma":"methods","genre_scores_codex":[0.06628334,0.000227734,0.9304939,0.0001013065,0.00002640923,0.00003913677,0.00003422266,0.001740117,0.001053728],"genre_scores_gemma":[0.8887873,0.00009222747,0.1099786,0.0000473642,0.00001348144,0.00006221378,0.0000645413,0.00006971022,0.0008845641],"genre_candidate":"methods","genre_consensus":"methods","teacher_disagreement_score":0.001733784,"threshold_uncertainty_score":0.005800068,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W2126554652","doi":"10.1109/vtest.1994.292333","title":"A BIST technique for a frequency response and intermodulation distortion test of a sigma-delta ADC","year":2002,"lang":"en","type":"article","venue":"","topic":"VLSI and Analog Circuit Testing","field":"Computer Science","cited_by":44,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"McGill University","funders":"","keywords":"Intermodulation; Distortion (music); Delta-sigma modulation; Built-in self-test; Computer science; Electronic engineering; Automatic test equipment; Test (biology); Engineering; Reliability engineering; Bandwidth (computing); Telecommunications","authors":[{"name":"M.F. Toner","is_ca":true},{"name":"Gordon W. Roberts","is_ca":true}],"retraction":null,"screen_n_in":null,"score":{"opus":0.02728308106564063,"gpt":0.2423833384803464,"spread":0.2151002574147057,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"metacan-v3-hybrid-931329e0061c","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0002647217,0.0003482646,0.0002989581,0.0008055783,0.0002734765,0.0003966122,0.0006377732,0.0004993968,0.002493168],"category_scores_gemma":[0.0009127193,0.0002020437,0.0002442351,0.0004771354,0.0003772635,0.000536752,0.0003616419,0.000556764,0.0007622041],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.000332872,"about_ca_system_score_gemma":0.0002856004,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.0003108383,"about_ca_topic_score_gemma":0.0007797164,"domain_scores_codex":[0.9995762,0.00006247,0.00002309064,0.00004534633,0.0002650767,0.00002778318],"domain_scores_gemma":[0.999658,0.0001072427,0.00005157677,0.00006205614,0.0001002033,0.00002087709],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"bench_or_experimental","study_design_gemma":"simulation_or_modeling","study_design_scores_codex":[0.000238932,0.00006553432,0.0006093915,0.0001585097,0.0000328046,0.000304332,0.00008312488,0.00168296,0.7220625,0.0126051,0.001766802,0.26039],"study_design_scores_gemma":[0.00008221731,0.001455341,0.003431222,0.00005086061,0.00007357896,0.008312279,0.00005302433,0.07419621,0.8699538,0.003608158,0.03872165,0.00006167977],"study_design_candidate":"simulation_or_modeling","study_design_consensus":null,"genre_codex":"methods","genre_gemma":"methods","genre_scores_codex":[0.05654995,0.001780969,0.9220893,0.00048691,0.0002917021,0.0001984803,0.0002137688,0.003336002,0.01505294],"genre_scores_gemma":[0.5595716,0.000681758,0.428775,0.0006318979,0.0001502369,0.0001238873,0.000354356,0.0001416936,0.009569624],"genre_candidate":"methods","genre_consensus":"methods","teacher_disagreement_score":0.002493168,"threshold_uncertainty_score":0.008340478,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W2118869825","doi":"10.1109/cicc.1997.606616","title":"Improving the testability of mixed-signal integrated circuits","year":2002,"lang":"en","type":"article","venue":"","topic":"VLSI and Analog Circuit Testing","field":"Computer Science","cited_by":44,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"McGill University","funders":"","keywords":"Testability; Mixed-signal integrated circuit; Computer science; Design for testing; Electronic circuit; SIGNAL (programming language); Automatic test equipment; Integrated circuit; Automatic test pattern generation; Test (biology); Electronic engineering; Reliability engineering; Engineering; Electrical engineering","authors":[{"name":"Gordon W. Roberts","is_ca":true}],"retraction":null,"screen_n_in":null,"score":{"opus":0.03060742267965042,"gpt":0.2069769710523585,"spread":0.1763695483727081,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"metacan-v3-hybrid-931329e0061c","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.001068987,0.0007289945,0.0004018567,0.001086588,0.0003195327,0.0009333343,0.001130044,0.0006717565,0.003032572],"category_scores_gemma":[0.005343091,0.0002181672,0.0003682553,0.0006406301,0.0006209576,0.001613898,0.0006140437,0.000642892,0.0005204686],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0004426826,"about_ca_system_score_gemma":0.0002615537,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.0003591536,"about_ca_topic_score_gemma":0.0005712196,"domain_scores_codex":[0.9986879,0.0003972382,0.00008208887,0.000149713,0.0005839168,0.00009901809],"domain_scores_gemma":[0.9980976,0.001148036,0.0001246876,0.0002605231,0.0003374492,0.00003167961],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"design_other","study_design_gemma":"bench_or_experimental","study_design_scores_codex":[0.0002268191,0.0001280512,0.0009222328,0.0004090021,0.00005686238,0.0002055684,0.0001478486,0.02970978,0.1666028,0.06512292,0.001227269,0.7352409],"study_design_scores_gemma":[0.0001198,0.001367837,0.001911191,0.0001876583,0.0001305331,0.001263846,0.00009353382,0.2655888,0.6260849,0.05810411,0.04508535,0.00006236017],"study_design_candidate":"bench_or_experimental","study_design_consensus":null,"genre_codex":"methods","genre_gemma":"empirical","genre_scores_codex":[0.05506153,0.003715043,0.9273434,0.0003425688,0.0001345994,0.0001244173,0.00003908066,0.00134647,0.01189289],"genre_scores_gemma":[0.5698342,0.003369452,0.4205678,0.0002400753,0.0001971058,0.0001157265,0.0001304428,0.0001582648,0.005386945],"genre_candidate":"empirical","genre_consensus":null,"teacher_disagreement_score":0.003032572,"threshold_uncertainty_score":0.01014495,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W2903881552","doi":"10.1109/fpl.2018.00079","title":"Machine-Learning Based Congestion Estimation for Modern FPGAs","year":2018,"lang":"en","type":"article","venue":"","topic":"VLSI and Analog Circuit Testing","field":"Computer Science","cited_by":44,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"University of Guelph","funders":"","keywords":"Router; Computer science; Field-programmable gate array; Routing (electronic design automation); Estimation; Artificial intelligence; Machine learning; Embedded system; Computer network; Engineering","authors":[{"name":"Dani Maarouf","is_ca":true},{"name":"Abeer Al-Hyari","is_ca":true},{"name":"Ziad Abuowaimer","is_ca":true},{"name":"Timothy J. Martin","is_ca":true},{"name":"Andrew David Gunter","is_ca":true},{"name":"Gary Gréwal","is_ca":true},{"name":"Shawki Areibi","is_ca":true},{"name":"Anthony Vannelli","is_ca":true}],"retraction":null,"screen_n_in":null,"score":{"opus":0.02685172438486516,"gpt":0.2616475089000211,"spread":0.2347957845151559,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"metacan-v3-hybrid-931329e0061c","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0006875972,0.0009478421,0.0006209793,0.0007008113,0.0003315055,0.0005767008,0.0008722674,0.000611748,0.00135184],"category_scores_gemma":[0.00278109,0.0003819178,0.0003455247,0.0004817427,0.0004210687,0.001192063,0.0004405914,0.0008795182,0.0002315305],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.001077852,"about_ca_system_score_gemma":0.0008292845,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.006299942,"about_ca_topic_score_gemma":0.006563385,"domain_scores_codex":[0.9996505,0.00008037328,0.00001767887,0.00008847007,0.0001016138,0.00006144194],"domain_scores_gemma":[0.9988438,0.0005827384,0.0002038033,0.0001077982,0.000215258,0.00004646667],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"simulation_or_modeling","study_design_gemma":"simulation_or_modeling","study_design_scores_codex":[0.00004081447,0.00001877647,0.001337658,0.00001365904,0.00001307603,0.00003063776,0.000007946508,0.9699434,0.001445235,0.0005551016,0.0003170497,0.02627664],"study_design_scores_gemma":[0.000001118941,0.00001039852,0.0001354782,0.000001026718,0.000001680431,0.000005627818,0.000001089769,0.9990257,0.0003799955,0.0003861419,0.00005008424,0.000001594217],"study_design_candidate":"simulation_or_modeling","study_design_consensus":"simulation_or_modeling","genre_codex":"methods","genre_gemma":"empirical","genre_scores_codex":[0.1270865,0.0006616528,0.868984,0.0002554738,0.00005253992,0.00003961649,0.00009610412,0.001669695,0.001154443],"genre_scores_gemma":[0.9468498,0.000179005,0.05124962,0.00004882068,0.00002778818,0.00003634285,0.0001133931,0.00006706906,0.001428228],"genre_candidate":"empirical","genre_consensus":null,"teacher_disagreement_score":0.006299942,"threshold_uncertainty_score":0.01252657,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W2104554794","doi":"10.1109/test.1996.557078","title":"An integration of memory-based analog signal generation into current DFT architectures","year":2002,"lang":"en","type":"article","venue":"","topic":"VLSI and Analog Circuit Testing","field":"Computer Science","cited_by":43,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"McGill University","funders":"","keywords":"Computer science; Mixed-signal integrated circuit; Overhead (engineering); Encoding (memory); Electronic engineering; Computer hardware; Boundary scan; Analogue electronics; Analog signal; Analog multiplier; SIGNAL (programming language); Integrated circuit; Aperiodic graph; Bitstream; Built-in self-test; Embedded system; Electronic circuit; Digital signal processing; Engineering; Electrical engineering; Decoding methods; Algorithm","authors":[{"name":"E.M. Hawrysh","is_ca":true},{"name":"Gordon W. Roberts","is_ca":true}],"retraction":null,"screen_n_in":null,"score":{"opus":0.04898350996980444,"gpt":0.2752475536855735,"spread":0.226264043715769,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"metacan-v3-hybrid-931329e0061c","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0003152238,0.0002654949,0.0001421552,0.0005987472,0.00017479,0.0004914035,0.0007665996,0.0002956559,0.002306768],"category_scores_gemma":[0.0009996183,0.0001306761,0.0001556822,0.000293555,0.0004502338,0.001085186,0.0002821347,0.0003590516,0.000440986],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0003050015,"about_ca_system_score_gemma":0.0002151163,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.0003395382,"about_ca_topic_score_gemma":0.0008192382,"domain_scores_codex":[0.9997723,0.00004343712,0.00001533648,0.00002705532,0.0001222749,0.00001956666],"domain_scores_gemma":[0.999518,0.0001984386,0.00003674672,0.0001157916,0.0001177404,0.00001333327],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"design_other","study_design_gemma":"bench_or_experimental","study_design_scores_codex":[0.0002445316,0.0001551066,0.001339595,0.0001996928,0.00002435821,0.0002008123,0.0001403386,0.00741819,0.2196152,0.09748266,0.0008329161,0.6723467],"study_design_scores_gemma":[0.0001294253,0.003666998,0.003338297,0.000133497,0.0001593629,0.002769425,0.0001313688,0.2246531,0.6284136,0.06172303,0.07479832,0.00008359191],"study_design_candidate":"bench_or_experimental","study_design_consensus":null,"genre_codex":"methods","genre_gemma":"empirical","genre_scores_codex":[0.05465058,0.001100566,0.9281815,0.0002865734,0.0001194945,0.00009901945,0.00003504856,0.001166138,0.01436107],"genre_scores_gemma":[0.6343685,0.0007291866,0.3577814,0.0002293397,0.0001199348,0.00007477417,0.00007537291,0.00007656542,0.006544908],"genre_candidate":"empirical","genre_consensus":null,"teacher_disagreement_score":0.002306768,"threshold_uncertainty_score":0.007716894,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W2146816098","doi":"10.1109/test.1990.114032","title":"Testability preserving transformations in multi-level logic synthesis","year":2002,"lang":"en","type":"article","venue":"","topic":"VLSI and Analog Circuit Testing","field":"Computer Science","cited_by":42,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"McGill University","funders":"","keywords":"Cube (algebra); Testability; Simple (philosophy); Factorization; Set (abstract data type); Computer science; Algebraic expression; Simplicity; Representation (politics); Decomposition; Mathematics; Algorithm; Theoretical computer science; Duality (order theory); Algebraic number; Discrete mathematics; Algebra over a field; Combinatorics; Pure mathematics; Programming language","authors":[{"name":"Janusz Rajski","is_ca":true},{"name":"J. Vasudevamurthy","is_ca":true}],"retraction":null,"screen_n_in":null,"score":{"opus":0.1949750028860675,"gpt":0.2761554089616707,"spread":0.08118040607560323,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"metacan-v3-hybrid-931329e0061c","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0005346824,0.0005026794,0.0003964282,0.0006961414,0.0003164019,0.0009354263,0.0005949895,0.0003791015,0.002104086],"category_scores_gemma":[0.001547845,0.0002374115,0.0006677572,0.0004774282,0.0008867516,0.001508406,0.0006259296,0.0008312513,0.0005030658],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0007017499,"about_ca_system_score_gemma":0.0004081925,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.0006234884,"about_ca_topic_score_gemma":0.0007564148,"domain_scores_codex":[0.9992505,0.0001929519,0.00005766991,0.0001214303,0.0002831955,0.00009431577],"domain_scores_gemma":[0.9993105,0.0002922443,0.00007111877,0.0002176608,0.00009023884,0.00001820673],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"design_other","study_design_gemma":"simulation_or_modeling","study_design_scores_codex":[0.0002757735,0.0001142615,0.0005638438,0.0002682068,0.00003488057,0.0002705579,0.0002665338,0.155527,0.08792379,0.2085261,0.001640924,0.5445881],"study_design_scores_gemma":[0.00006633701,0.0003921878,0.0002984154,0.00005714393,0.00004430805,0.0002966108,0.00005154048,0.6282065,0.1607939,0.1960066,0.01375264,0.00003391891],"study_design_candidate":"simulation_or_modeling","study_design_consensus":null,"genre_codex":"methods","genre_gemma":"empirical","genre_scores_codex":[0.02734289,0.0001905379,0.9680179,0.00007095819,0.00002140424,0.00004314019,0.00003782311,0.001083529,0.003191752],"genre_scores_gemma":[0.5175989,0.0002020461,0.4788877,0.00008456433,0.00003403764,0.0001014825,0.0001639665,0.0002085366,0.002718719],"genre_candidate":"empirical","genre_consensus":null,"teacher_disagreement_score":0.002104086,"threshold_uncertainty_score":0.007038832,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W2150848872","doi":"10.1109/test.1996.556944","title":"BIST fault diagnosis in scan-based VLSI environments","year":2002,"lang":"en","type":"article","venue":"","topic":"VLSI and Analog Circuit Testing","field":"Computer Science","cited_by":41,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"Nortel (Canada)","funders":"","keywords":"Very-large-scale integration; Benchmark (surveying); Built-in self-test; Fault coverage; Computer science; Fault (geology); Scheme (mathematics); Electronic circuit; Sequence (biology); Automatic test pattern generation; Signature (topology); Stuck-at fault; Fault detection and isolation; Computer engineering; Algorithm; Embedded system; Engineering; Artificial intelligence; Mathematics; Electrical engineering","authors":[{"name":"Yuejian Wu","is_ca":true},{"name":"Saman Adham","is_ca":true}],"retraction":null,"screen_n_in":null,"score":{"opus":0.02912415065550949,"gpt":0.214409014039662,"spread":0.1852848633841525,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"metacan-v3-hybrid-931329e0061c","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0002945923,0.0003348403,0.0003596797,0.0005622344,0.0001800186,0.000256204,0.0004817466,0.0005784164,0.0009923696],"category_scores_gemma":[0.002012311,0.0001524274,0.0001943071,0.0004056606,0.0003360827,0.0008318076,0.0005245606,0.0002171906,0.0003216695],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0002555836,"about_ca_system_score_gemma":0.000209199,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.0004556398,"about_ca_topic_score_gemma":0.0006059743,"domain_scores_codex":[0.9996746,0.00008951157,0.00001504164,0.00003650599,0.0001428274,0.00004158989],"domain_scores_gemma":[0.9987667,0.0007553432,0.0001593281,0.0001516625,0.0001376491,0.00002941536],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"design_other","study_design_gemma":"simulation_or_modeling","study_design_scores_codex":[0.001500907,0.0001394514,0.008820724,0.0003756607,0.00006731951,0.001772942,0.0002059291,0.247707,0.283427,0.01727071,0.002843251,0.4358692],"study_design_scores_gemma":[0.00005986945,0.0004992003,0.001732997,0.00002317693,0.00003029266,0.001309592,0.00005643525,0.8510725,0.1336784,0.009789241,0.001730063,0.00001828585],"study_design_candidate":"simulation_or_modeling","study_design_consensus":null,"genre_codex":"methods","genre_gemma":"empirical","genre_scores_codex":[0.2999251,0.0006221416,0.6941538,0.0002018376,0.00002080232,0.00005811387,0.0001486797,0.002529548,0.002339804],"genre_scores_gemma":[0.9160425,0.0002720116,0.08262306,0.00006822605,0.0000142116,0.00002767154,0.0001880868,0.00003822896,0.000726042],"genre_candidate":"empirical","genre_consensus":null,"teacher_disagreement_score":0.0009923696,"threshold_uncertainty_score":0.00331974,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W2159067451","doi":"10.1109/test.1997.639642","title":"Signal generation using periodic single and multi-bit sigma-delta modulated streams","year":2002,"lang":"en","type":"article","venue":"","topic":"VLSI and Analog Circuit Testing","field":"Computer Science","cited_by":41,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":true,"ca_venue":false,"about_ca":false},"ca_institutions":"McGill University","funders":"Natural Sciences and Engineering Research Council of Canada","keywords":"Bitstream; Computer science; Delta-sigma modulation; SIGNAL (programming language); Overhead (engineering); Bit (key); Electronic engineering; Computer hardware; 16-bit; Analog signal; Algorithm; Bandwidth (computing); Digital signal processing; Telecommunications; Engineering; Decoding methods","authors":[{"name":"B. Dufort","is_ca":true},{"name":"Gordon W. Roberts","is_ca":true}],"retraction":null,"screen_n_in":null,"score":{"opus":0.1142805878596741,"gpt":0.2426881042961566,"spread":0.1284075164364825,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"metacan-v3-hybrid-931329e0061c","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0003178698,0.0002095416,0.0002261452,0.0005255745,0.0001779763,0.0003240102,0.0005002069,0.0002522377,0.001747693],"category_scores_gemma":[0.0009064172,0.000149816,0.000160341,0.000298606,0.0002281033,0.0005355482,0.0003764334,0.0003405047,0.0004109831],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0001448523,"about_ca_system_score_gemma":0.000132494,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.00006464002,"about_ca_topic_score_gemma":0.0001741967,"domain_scores_codex":[0.9997411,0.00003810952,0.00001442002,0.00004495094,0.0001412663,0.00002009491],"domain_scores_gemma":[0.9995277,0.0001952528,0.00005978991,0.00008328284,0.00009954218,0.00003453072],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","study_design_scores_codex":[0.0005080309,0.0001163673,0.00160474,0.0002621155,0.00002709188,0.000406311,0.0002616021,0.005251351,0.5888504,0.01153193,0.0009621237,0.390218],"study_design_scores_gemma":[0.0001371449,0.00124022,0.001912361,0.00005469677,0.00003960016,0.0015889,0.00007611136,0.1090019,0.8639811,0.004233075,0.01768851,0.00004647884],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","genre_codex":"methods","genre_gemma":"empirical","genre_scores_codex":[0.265639,0.0008586947,0.7221202,0.0002218456,0.0002615379,0.0002616594,0.0001588024,0.001411269,0.009066956],"genre_scores_gemma":[0.6926146,0.0003633795,0.3015364,0.0001078092,0.00008339305,0.0001151989,0.0001557099,0.0001099512,0.00491355],"genre_candidate":"empirical","genre_consensus":null,"teacher_disagreement_score":0.001747693,"threshold_uncertainty_score":0.00584662,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W2068731843","doi":"10.1049/el:20010981","title":"Simultaneous reduction in volume of test data andpowerdissipation for systems-on-a-chip","year":2001,"lang":"en","type":"article","venue":"Electronics Letters","topic":"VLSI and Analog Circuit Testing","field":"Computer Science","cited_by":41,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"McMaster University","funders":"","keywords":"Dissipation; Chip; Volume (thermodynamics); Test compression; Power (physics); System on a chip; Test data; Data compression; Reduction (mathematics); Compression (physics); Electronic engineering; Computer science; Electrical engineering; Embedded system; Materials science; Automatic test pattern generation; Engineering; Algorithm; Mathematics; Electronic circuit; Physics","authors":[{"name":"Paul Rosinger","is_ca":false},{"name":"P.T. Gonciari","is_ca":false},{"name":"B.M. Al-Hashimi","is_ca":false},{"name":"Nicola Nicolici","is_ca":true}],"retraction":null,"screen_n_in":null,"score":{"opus":0.02269982165538808,"gpt":0.2592860816184447,"spread":0.2365862599630566,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"metacan-v3-hybrid-931329e0061c","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0005373309,0.0008472715,0.0005543898,0.001027676,0.0001783407,0.0008321976,0.0009813845,0.0004918046,0.003858804],"category_scores_gemma":[0.003478552,0.0002549683,0.0003569284,0.001161913,0.0004702328,0.002025093,0.0006235393,0.000482768,0.0008806587],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0002851401,"about_ca_system_score_gemma":0.0003105729,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.0001009761,"about_ca_topic_score_gemma":0.0003992991,"domain_scores_codex":[0.9992285,0.0001082537,0.00004295447,0.0000848546,0.0004645768,0.00007090044],"domain_scores_gemma":[0.9963722,0.002334585,0.0002862277,0.0004448916,0.0004788793,0.0000832146],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","study_design_scores_codex":[0.0006439873,0.0001248527,0.002280671,0.000438031,0.000040979,0.0003154332,0.0001275676,0.03102658,0.532992,0.008899636,0.001373276,0.4217369],"study_design_scores_gemma":[0.0001393329,0.003231518,0.01190757,0.0001020985,0.0001928895,0.004043275,0.0001650317,0.2012008,0.7351424,0.0206681,0.02313836,0.00006864817],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","genre_codex":"methods","genre_gemma":"empirical","genre_scores_codex":[0.4580179,0.01015479,0.5115647,0.00224774,0.0002671212,0.0001863509,0.0005684615,0.003711691,0.01328124],"genre_scores_gemma":[0.8658726,0.003159409,0.1235764,0.0003633859,0.0003630184,0.0001785777,0.0008803517,0.000430381,0.005175805],"genre_candidate":"empirical","genre_consensus":null,"teacher_disagreement_score":0.003858804,"threshold_uncertainty_score":0.012909,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W2042692297","doi":"10.1145/1837274.1837300","title":"Bridging pre-silicon verification and post-silicon validation","year":2010,"lang":"en","type":"article","venue":"","topic":"VLSI and Analog Circuit Testing","field":"Computer Science","cited_by":40,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"University of British Columbia","funders":"","keywords":"Silicon; Emulation; Computer science; Bridging (networking); Scope (computer science); Formal verification; Systems engineering; Engineering; Materials science; Theoretical computer science; Programming language; Optoelectronics","authors":[{"name":"Amir Nahir","is_ca":false},{"name":"Avi Ziv","is_ca":false},{"name":"Rajesh Galivanche","is_ca":false},{"name":"Alan J. Hu","is_ca":true},{"name":"M. Abramovici","is_ca":false},{"name":"Albert Camilleri","is_ca":false},{"name":"Bob Bentley","is_ca":false},{"name":"Harry Foster","is_ca":false},{"name":"Valeria Bertacco","is_ca":false},{"name":"Shakti Kapoor","is_ca":false}],"retraction":null,"screen_n_in":null,"score":{"opus":0.01230324504264087,"gpt":0.2378768151217093,"spread":0.2255735700790684,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"metacan-v3-hybrid-931329e0061c","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0187192,0.0009960083,0.001206419,0.001909816,0.000785285,0.00397164,0.002741671,0.002709096,0.006039447],"category_scores_gemma":[0.02124381,0.0006849431,0.0008890312,0.0007141029,0.003483724,0.007819891,0.00390163,0.003462518,0.001764319],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.001436113,"about_ca_system_score_gemma":0.003157627,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.0003756398,"about_ca_topic_score_gemma":0.0008011776,"domain_scores_codex":[0.985913,0.006065243,0.0007314771,0.0009548397,0.00557581,0.0007595778],"domain_scores_gemma":[0.9603353,0.02469883,0.001362705,0.005540146,0.007611205,0.0004518235],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"design_other","study_design_gemma":"bench_or_experimental","study_design_scores_codex":[0.0003216807,0.000179552,0.002330204,0.001688889,0.0001059972,0.0007757552,0.001603117,0.01957992,0.03204856,0.3825073,0.008892296,0.5499668],"study_design_scores_gemma":[0.0001138518,0.0009623986,0.002768521,0.002650267,0.0000945765,0.001893098,0.001437282,0.07015986,0.1347264,0.4260601,0.3589675,0.0001660126],"study_design_candidate":"bench_or_experimental","study_design_consensus":null,"genre_codex":"methods","genre_gemma":"empirical","genre_scores_codex":[0.02201992,0.01603748,0.8885396,0.00778668,0.001409488,0.0002728247,0.00007610909,0.001162875,0.06269494],"genre_scores_gemma":[0.5134294,0.0193394,0.435668,0.004051884,0.0009316126,0.0003528151,0.0003719348,0.0009991551,0.0248559],"genre_candidate":"empirical","genre_consensus":null,"teacher_disagreement_score":0.0187192,"threshold_uncertainty_score":0.09899777,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W2104231257","doi":"10.14288/1.0065086","title":"Testing for floating gates defects in CMOS circuits","year":2009,"lang":"en","type":"article","venue":"cIRcle (University of British Columbia)","topic":"VLSI and Analog Circuit Testing","field":"Computer Science","cited_by":40,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"University of British Columbia","funders":"","keywords":"Transistor; CMOS; Logic gate; Voltage; Electronic circuit; Electronic engineering; Fault (geology); Electrical engineering; Computer science; Engineering","authors":[],"retraction":null,"screen_n_in":null,"score":{"opus":0.01786950400671526,"gpt":0.1907498786979128,"spread":0.1728803746911975,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"metacan-v3-hybrid-931329e0061c","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0003693989,0.0003969019,0.0002007986,0.0006496589,0.000155179,0.0004000655,0.0005539326,0.0004278031,0.0006372225],"category_scores_gemma":[0.002578028,0.0001149565,0.0002981028,0.0002565729,0.0006853695,0.0009641774,0.0002638804,0.00025413,0.00007160723],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0005619606,"about_ca_system_score_gemma":0.0002788832,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.0007472906,"about_ca_topic_score_gemma":0.0006198957,"domain_scores_codex":[0.9995825,0.00005084415,0.0000180089,0.00007127741,0.0002323646,0.00004503937],"domain_scores_gemma":[0.9985915,0.0009468531,0.0002085835,0.0001140573,0.0001075189,0.00003154836],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","study_design_scores_codex":[0.0008332005,0.0002265367,0.01932201,0.0004038696,0.0001067555,0.001248164,0.0003854673,0.1926928,0.4650337,0.03943717,0.0005739532,0.2797363],"study_design_scores_gemma":[0.00008933746,0.002788696,0.006813621,0.00005830139,0.0000945449,0.002169603,0.00009818644,0.6613026,0.2963765,0.02740585,0.002759299,0.00004341438],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","genre_codex":"empirical","genre_gemma":"empirical","genre_scores_codex":[0.7573568,0.0009883856,0.2388662,0.0001289723,0.00002029262,0.00003668636,0.00004893248,0.0002959933,0.002257727],"genre_scores_gemma":[0.9862773,0.0002067821,0.01302835,0.00002194248,0.00001004626,0.00001033592,0.00003443005,0.00001134329,0.0003995337],"genre_candidate":"empirical","genre_consensus":"empirical","teacher_disagreement_score":0.0007472906,"threshold_uncertainty_score":0.004077375,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W2073321629","doi":"10.1109/tvlsi.2013.2255071","title":"Incremental Trace-Buffer Insertion for FPGA Debug","year":2013,"lang":"en","type":"article","venue":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","topic":"VLSI and Analog Circuit Testing","field":"Computer Science","cited_by":39,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"University of British Columbia","funders":"","keywords":"Debugging; Computer science; TRACE (psycholinguistics); Field-programmable gate array; Embedded system; Routing (electronic design automation); Tracing; Background debug mode interface; Observability; Computer hardware; Process (computing); Parallel computing","authors":[{"name":"Eddie Hung","is_ca":true},{"name":"Steven J. E. Wilton","is_ca":true}],"retraction":null,"screen_n_in":null,"score":{"opus":0.02087027236584845,"gpt":0.2391193351511538,"spread":0.2182490627853053,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"metacan-v3-hybrid-931329e0061c","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.000467875,0.0006148486,0.0002145465,0.000608621,0.0002213187,0.0005592981,0.001411519,0.0003775972,0.003558659],"category_scores_gemma":[0.002913123,0.0002621221,0.0002139071,0.0003930254,0.0004326102,0.001609376,0.0006066452,0.0006595967,0.0004028409],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0003478052,"about_ca_system_score_gemma":0.0007154629,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.0005880054,"about_ca_topic_score_gemma":0.001048255,"domain_scores_codex":[0.9997049,0.00009224988,0.00001511473,0.00004584041,0.00009120976,0.00005068741],"domain_scores_gemma":[0.9977882,0.001135215,0.0001932279,0.000666292,0.0001444087,0.00007265095],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"design_other","study_design_gemma":"bench_or_experimental","study_design_scores_codex":[0.001318704,0.0002923672,0.008101828,0.0003767252,0.00005044875,0.0006513181,0.0005539774,0.05103494,0.3159772,0.02661232,0.003887587,0.5911427],"study_design_scores_gemma":[0.0001521752,0.001382203,0.002386013,0.00008144086,0.00008229045,0.001374803,0.0001861125,0.3682596,0.5959371,0.01230695,0.01777126,0.0000800689],"study_design_candidate":"bench_or_experimental","study_design_consensus":null,"genre_codex":"methods","genre_gemma":"empirical","genre_scores_codex":[0.1519949,0.0007945152,0.8310063,0.0002391966,0.0000855846,0.0001372203,0.0001073684,0.01187468,0.003760069],"genre_scores_gemma":[0.7659073,0.0002083491,0.2318189,0.0001001405,0.00001603083,0.00005805948,0.0001671527,0.0002845064,0.00143951],"genre_candidate":"empirical","genre_consensus":null,"teacher_disagreement_score":0.003558659,"threshold_uncertainty_score":0.0119049,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W1506429504","doi":"10.1109/test.1995.529814","title":"Synthesized transparent BIST for detecting scrambled pattern-sensitive faults in RAMs","year":2002,"lang":"en","type":"article","venue":"","topic":"VLSI and Analog Circuit Testing","field":"Computer Science","cited_by":38,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"University of Alberta","funders":"","keywords":"Built-in self-test; Aliasing; Signature (topology); Computer science; VHDL; Linear feedback shift register; Fault coverage; Scheme (mathematics); Fault (geology); Embedded system; Shift register; Computer hardware; Electronic circuit; Parallel computing; Field-programmable gate array; Engineering; Chip; Mathematics; Artificial intelligence","authors":[{"name":"B.F. Cockburn","is_ca":true},{"name":"Y.-F.N. Sat","is_ca":true}],"retraction":null,"screen_n_in":null,"score":{"opus":0.06674458028199143,"gpt":0.2578270476015098,"spread":0.1910824673195183,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"metacan-v3-hybrid-931329e0061c","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0001796864,0.0002836591,0.0002315813,0.0003800079,0.0001088633,0.0002890509,0.0004846915,0.0002786102,0.001058665],"category_scores_gemma":[0.0009463879,0.0001425588,0.0002052103,0.0001327629,0.0002434753,0.0004085711,0.0002547345,0.0002734647,0.0003025777],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0002240679,"about_ca_system_score_gemma":0.000154671,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.0001642949,"about_ca_topic_score_gemma":0.0003529786,"domain_scores_codex":[0.9996971,0.00005892573,0.00001872599,0.00004143745,0.0001533594,0.00003045732],"domain_scores_gemma":[0.9995245,0.000155236,0.0001173644,0.0001112551,0.00007115456,0.00002060013],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","study_design_scores_codex":[0.0004312458,0.00006568521,0.0007692238,0.0001806611,0.0000196419,0.0004137828,0.0001416572,0.01495021,0.8747424,0.01388622,0.000702315,0.09369706],"study_design_scores_gemma":[0.0000643533,0.000555775,0.0008537868,0.00002208717,0.00003569527,0.0004558011,0.00001953235,0.1416812,0.846449,0.002900616,0.006936271,0.00002587845],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","genre_codex":"methods","genre_gemma":"empirical","genre_scores_codex":[0.3651314,0.0005879875,0.6228297,0.0001362579,0.000146668,0.0001293853,0.0001704712,0.004510207,0.006357919],"genre_scores_gemma":[0.8330162,0.0001686379,0.163055,0.00009506657,0.00002589325,0.00007008894,0.0002203671,0.0001824757,0.003166268],"genre_candidate":"empirical","genre_consensus":null,"teacher_disagreement_score":0.001058665,"threshold_uncertainty_score":0.003541589,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W2161969300","doi":"10.1109/ftcs.1988.5309","title":"A reconvergent fanout analysis for efficient exact fault simulation of combinational circuits","year":2003,"lang":"en","type":"article","venue":"","topic":"VLSI and Analog Circuit Testing","field":"Computer Science","cited_by":38,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"McGill University","funders":"","keywords":"Fault (geology); Benchmark (surveying); Line (geometry); Tracing; Combinational logic; Algorithm; Computer science; Mathematics; Logic gate","authors":[{"name":"F. Maamari","is_ca":true},{"name":"Janusz Rajski","is_ca":true}],"retraction":null,"screen_n_in":null,"score":{"opus":0.03696100882501352,"gpt":0.2770968476242611,"spread":0.2401358387992475,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"metacan-v3-hybrid-931329e0061c","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0003977171,0.0006472311,0.000407734,0.0005543248,0.0003052203,0.0004683491,0.0005958306,0.0003981619,0.003619305],"category_scores_gemma":[0.001534931,0.000278101,0.0005181293,0.0002752836,0.0003993286,0.000794342,0.0003250541,0.0005221942,0.0002660572],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0006781032,"about_ca_system_score_gemma":0.0004761842,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.005700456,"about_ca_topic_score_gemma":0.005481356,"domain_scores_codex":[0.9997985,0.00006759937,0.000009064227,0.00002550824,0.0000770391,0.00002242742],"domain_scores_gemma":[0.9994006,0.0003814647,0.0000409559,0.0000881327,0.0000768933,0.00001194092],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"simulation_or_modeling","study_design_gemma":"simulation_or_modeling","study_design_scores_codex":[0.00005621935,0.00001537865,0.0003500333,0.00003121939,0.00001244014,0.00006070743,0.00003991053,0.9555049,0.008179504,0.01171735,0.00032836,0.02370402],"study_design_scores_gemma":[0.000002698054,0.000009790067,0.00003028877,0.000002043735,0.000001757866,0.000007573616,0.000001393476,0.9964941,0.001280967,0.001854021,0.0003138529,0.000001399425],"study_design_candidate":"simulation_or_modeling","study_design_consensus":"simulation_or_modeling","genre_codex":"methods","genre_gemma":"empirical","genre_scores_codex":[0.05233934,0.0001500971,0.9432994,0.00006007238,0.00001236334,0.00003452076,0.00007999509,0.0009631116,0.003061146],"genre_scores_gemma":[0.7854723,0.0002421869,0.2104653,0.00005915387,0.00002122024,0.0001042097,0.00023172,0.000236095,0.003167825],"genre_candidate":"empirical","genre_consensus":null,"teacher_disagreement_score":0.005700456,"threshold_uncertainty_score":0.01210779,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W2535860792","doi":"10.1145/2966986.2980085","title":"GPlace","year":2016,"lang":"en","type":"article","venue":"","topic":"VLSI and Analog Circuit Testing","field":"Computer Science","cited_by":38,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"University of Guelph","funders":"","keywords":"Field-programmable gate array; CONTEST; Routing (electronic design automation); Computer science; Placer mining; Parallel computing; Embedded system; Computer architecture","authors":[{"name":"Ryan Pattison","is_ca":true},{"name":"Ziad Abuowaimer","is_ca":true},{"name":"Shawki Areibi","is_ca":true},{"name":"Gary Gréwal","is_ca":true},{"name":"Anthony Vannelli","is_ca":true}],"retraction":null,"screen_n_in":null,"score":{"opus":0.01264829160820416,"gpt":0.2036184632224662,"spread":0.1909701716142621,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"metacan-v3-hybrid-931329e0061c","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0006208097,0.001333762,0.0004943815,0.001194134,0.0003497779,0.001370686,0.002493748,0.0009446875,0.07781787],"category_scores_gemma":[0.002086442,0.0007516153,0.0007545754,0.0009213866,0.0004890749,0.002405558,0.001459032,0.001272635,0.031758],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0005406994,"about_ca_system_score_gemma":0.0007563633,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.001263523,"about_ca_topic_score_gemma":0.001906239,"domain_scores_codex":[0.9994125,0.00005653873,0.00004161314,0.0001352811,0.0002808722,0.00007319196],"domain_scores_gemma":[0.999246,0.0002071659,0.00007610986,0.0002529837,0.0001782084,0.00003952789],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"design_other","study_design_gemma":"bench_or_experimental","study_design_scores_codex":[0.001123205,0.0001592656,0.001977052,0.001488354,0.0001357466,0.0005191594,0.0003751207,0.01287213,0.02846439,0.02994532,0.4096045,0.5133357],"study_design_scores_gemma":[0.0004191658,0.0004334581,0.0016736,0.0001493989,0.000068016,0.001098993,0.00008481924,0.06898861,0.06476392,0.02186652,0.8403296,0.0001238806],"study_design_candidate":"bench_or_experimental","study_design_consensus":null,"genre_codex":"methods","genre_gemma":"empirical","genre_scores_codex":[0.01542928,0.001723185,0.4591898,0.0004746865,0.0005310602,0.0005792057,0.009909875,0.4194603,0.09270264],"genre_scores_gemma":[0.1936618,0.002492539,0.453302,0.002034139,0.0002172278,0.001389844,0.0495039,0.07628915,0.2211094],"genre_candidate":"empirical","genre_consensus":null,"teacher_disagreement_score":0.07781787,"threshold_uncertainty_score":0,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W3216071695","doi":"10.1109/mwsym.1999.779470","title":"An aggressive approach to parameter extraction","year":2003,"lang":"en","type":"article","venue":"","topic":"VLSI and Analog Circuit Testing","field":"Computer Science","cited_by":37,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"McMaster University","funders":"","keywords":"Extraction (chemistry); Estimation theory; Uniqueness; Computer science; Selection (genetic algorithm); Algorithm; Filter (signal processing); Mathematical optimization; Mathematics; Artificial intelligence; Chromatography; Computer vision","authors":[{"name":"Mohamed H. Bakr","is_ca":true},{"name":"J.W. Bandler","is_ca":true},{"name":"N. Georgieva","is_ca":true}],"retraction":null,"screen_n_in":null,"score":{"opus":0.03337927121888983,"gpt":0.2817394544827005,"spread":0.2483601832638107,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"metacan-v3-hybrid-931329e0061c","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.001413715,0.001315643,0.001043728,0.001433426,0.0007482757,0.001377315,0.001334372,0.00142175,0.002359196],"category_scores_gemma":[0.006993652,0.0006684803,0.0005798225,0.0009352161,0.001209659,0.002398588,0.002390815,0.002510032,0.001541407],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.000526075,"about_ca_system_score_gemma":0.0008166163,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.000663158,"about_ca_topic_score_gemma":0.0007946971,"domain_scores_codex":[0.9979609,0.0004013403,0.0001291547,0.0003311223,0.001061622,0.0001157606],"domain_scores_gemma":[0.9973791,0.0009879919,0.0002440082,0.0008312866,0.0004900736,0.00006765809],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"design_other","study_design_gemma":"bench_or_experimental","study_design_scores_codex":[0.0003370817,0.0001040921,0.001201968,0.0001397056,0.0000821534,0.0002611401,0.00023136,0.1783854,0.1265922,0.05763588,0.003267633,0.6317614],"study_design_scores_gemma":[0.00002713389,0.0001359085,0.0003459245,0.00002423017,0.00002184738,0.0004659928,0.0000296143,0.9061538,0.04685729,0.03604548,0.009842952,0.00004981286],"study_design_candidate":"bench_or_experimental","study_design_consensus":null,"genre_codex":"methods","genre_gemma":"methods","genre_scores_codex":[0.002670637,0.00007243171,0.9960692,0.00006795101,0.00001217677,0.00002946616,0.00001225365,0.0004079307,0.0006580036],"genre_scores_gemma":[0.1394776,0.000138791,0.856731,0.0001947664,0.00005089253,0.0001339273,0.0001103924,0.0002116116,0.00295103],"genre_candidate":"methods","genre_consensus":"methods","teacher_disagreement_score":0.002359196,"threshold_uncertainty_score":0.007892251,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W2044605272","doi":"10.1109/tvlsi.2012.2202409","title":"Scalable Signal Selection for Post-Silicon Debug","year":2012,"lang":"en","type":"article","venue":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","topic":"VLSI and Analog Circuit Testing","field":"Computer Science","cited_by":36,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"University of British Columbia","funders":"","keywords":"Observability; Computer science; Scalability; Debugging; Benchmark (surveying); Computer engineering; Metric (unit); Theoretical computer science; Embedded system; Algorithm; Engineering; Mathematics","authors":[{"name":"Eddie Hung","is_ca":true},{"name":"Steven J. E. Wilton","is_ca":true}],"retraction":null,"screen_n_in":null,"score":{"opus":0.0193880468798241,"gpt":0.2453616756555041,"spread":0.22597362877568,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"metacan-v3-hybrid-931329e0061c","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0008600656,0.0008432002,0.000409613,0.001299306,0.0004405886,0.0006082649,0.0008667893,0.0004548749,0.002069589],"category_scores_gemma":[0.00422823,0.0002745191,0.0003264348,0.000723657,0.0006127637,0.001360787,0.0007704437,0.0006414409,0.0003530161],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0007081584,"about_ca_system_score_gemma":0.0009498943,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.001192706,"about_ca_topic_score_gemma":0.00263944,"domain_scores_codex":[0.9990829,0.0002948379,0.00003032495,0.000151695,0.0003601168,0.00007997099],"domain_scores_gemma":[0.9962255,0.002295174,0.0004482298,0.0006833443,0.0002716414,0.00007616545],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"design_other","study_design_gemma":"bench_or_experimental","study_design_scores_codex":[0.0007247391,0.0002280414,0.009837383,0.0001641943,0.00005830747,0.0001927444,0.0003455307,0.1924468,0.1612126,0.02287695,0.002278179,0.6096346],"study_design_scores_gemma":[0.00008714924,0.000376467,0.002493978,0.00002223437,0.00002531415,0.0002081655,0.00009763315,0.8946226,0.08031249,0.01698168,0.004741518,0.00003073441],"study_design_candidate":"bench_or_experimental","study_design_consensus":null,"genre_codex":"methods","genre_gemma":"empirical","genre_scores_codex":[0.1151366,0.0003892036,0.8789409,0.0001942317,0.00002094294,0.00009167647,0.00006207058,0.003735734,0.001428643],"genre_scores_gemma":[0.7268308,0.0001346073,0.27142,0.00005064137,0.00002118998,0.00006638064,0.0001558563,0.000200564,0.00111992],"genre_candidate":"empirical","genre_consensus":null,"teacher_disagreement_score":0.002069589,"threshold_uncertainty_score":0.006923497,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null}]}