{"meta":{"page":1,"per_page":50,"max_per_page":100,"total":4,"total_is_capped":false,"direct_labels_cover":0,"predictions_cover":4,"direct_label_status":"direct model label, unvalidated","prediction_status":"machine_predicted_unvalidated (Codex and Gemma teacher distillation)","score_status":"score_only:v0-immature-baseline (scores rank; they never assert a category)","snapshot":{"source":"OpenAlex, pinned release, all 482 partitions","release":"2026-06-24","frame_built":"2026-07-12"},"query_hash":"fb06d09db288","filters":{"venue":"2017 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)"}},"results":[{"id":"W4242053016","doi":"10.1109/iccad.2017.8203770","title":"Fault injection attack on deep neural network","year":2017,"lang":"en","type":"article","venue":"2017 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)","topic":"Adversarial Robustness in Machine Learning","field":"Computer Science","cited_by":181,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":false,"ca_fund":true,"ca_venue":false,"about_ca":false},"ca_institutions":"","funders":"Guangdong Academy of Sciences; National Natural Science Foundation of China; Canadian Institute for Advanced Research","keywords":"Fault injection; Artificial neural network; Computer science; Fault (geology); Set (abstract data type); Gradient descent; Deep neural networks; Artificial intelligence; Descent (aeronautics); Class (philosophy); Control theory (sociology); Engineering","retraction":null,"screen_n_in":null,"score":{"opus":0.16177474869558,"gpt":0.3634640765171886,"spread":0.2016893278216086,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"codex-gemma-dda1882f352a","candidate_categories":["metaepi_narrow","sts","scholarly_communication","open_science","insufficient_payload"],"consensus_categories":[],"category_scores_codex":[0.001021917,0.0006349946,0.000529676,0.0003247311,0.001407132,0.00234076,0.008173797,0.0002928305,0.0001387497],"category_scores_gemma":[0.0006346,0.0006248796,0.0002357891,0.0001689607,0.0002133378,0.001690002,0.001310551,0.001150872,0.0008242636],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0002843994,"about_ca_system_score_gemma":0.0001704563,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.0001055464,"about_ca_topic_score_gemma":0.00002738336,"domain_scores_codex":[0.9953523,0.0005147927,0.0006779606,0.001398008,0.001267527,0.0007893887],"domain_scores_gemma":[0.9945521,0.0006990288,0.001023041,0.002825303,0.0006252514,0.0002752723],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"simulation_or_modeling","study_design_gemma":"simulation_or_modeling","study_design_scores_codex":[0.0002369037,0.0001592108,0.0006560653,0.000009757334,0.0001346073,0.0001575584,0.0002637726,0.7885212,0.0002029415,0.1022902,0.01304063,0.09432716],"study_design_scores_gemma":[0.001114006,0.0007749257,0.004874839,0.0001795539,0.00001451267,0.00008194346,0.000008626589,0.9778507,0.0002517104,0.01279882,0.001404401,0.0006459561],"study_design_candidate":"simulation_or_modeling","study_design_consensus":"simulation_or_modeling","genre_codex":"methods","genre_gemma":"empirical","genre_scores_codex":[0.00700575,0.00001221038,0.9616195,0.003901824,0.01406721,0.0004729175,0.000005395864,0.0004479132,0.01246728],"genre_scores_gemma":[0.8602988,0.0000218849,0.1342157,0.001280988,0.003072834,0.00004640673,0.00001829162,0.00004881776,0.0009962281],"genre_candidate":"methods","genre_consensus":null,"teacher_disagreement_score":0.8532931,"threshold_uncertainty_score":0.9999537,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W4253889669","doi":"10.1109/iccad.2017.8203766","title":"An automated SAT-based method for the design of on-chip bit-flip detectors","year":2017,"lang":"en","type":"article","venue":"2017 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)","topic":"VLSI and Analog Circuit Testing","field":"Computer Science","cited_by":1,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"McMaster University","funders":"","keywords":"Computer science; Pruning; Detector; Bit (key); Computer hardware; Chip; Flip chip; 8-bit; Computer engineering; Algorithm; Parallel computing","retraction":null,"screen_n_in":null,"score":{"opus":0.2204056047715306,"gpt":0.3943213707587686,"spread":0.173915765987238,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"codex-gemma-dda1882f352a","candidate_categories":["metaepi_narrow","scholarly_communication","open_science"],"consensus_categories":[],"category_scores_codex":[0.002434112,0.0005184907,0.0005403414,0.0003876367,0.0009963465,0.001305065,0.008854404,0.0002019973,0.00002949808],"category_scores_gemma":[0.001036769,0.000405388,0.0002544519,0.000161087,0.0002136566,0.0007090865,0.0002653205,0.0003977424,0.00007475013],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0001179336,"about_ca_system_score_gemma":0.0005481361,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.000153315,"about_ca_topic_score_gemma":0.00001201575,"domain_scores_codex":[0.9960948,0.0006330572,0.0007244132,0.001050646,0.0009112297,0.0005858375],"domain_scores_gemma":[0.9907139,0.004230455,0.00107234,0.002825102,0.000932785,0.0002254454],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"design_other","study_design_gemma":"simulation_or_modeling","study_design_scores_codex":[0.0002169904,0.0009530938,0.000641887,0.00007125502,0.000578972,0.00009942766,0.000731224,0.2630595,0.07681609,0.1056604,0.007882882,0.5432883],"study_design_scores_gemma":[0.001167906,0.001223274,0.00294421,0.0002696863,0.00002960485,0.0000187965,0.000009811089,0.9589071,0.02709443,0.007787346,0.00009532322,0.0004524785],"study_design_candidate":"simulation_or_modeling","study_design_consensus":null,"genre_codex":"methods","genre_gemma":"empirical","genre_scores_codex":[0.002235088,0.00001243146,0.9919392,0.00150729,0.002408476,0.0008871506,0.00003801171,0.0005441157,0.0004282296],"genre_scores_gemma":[0.6848087,0.000005721909,0.3140195,0.0006200405,0.0003628278,0.000088573,0.00001087544,0.00003094118,0.00005274898],"genre_candidate":"methods","genre_consensus":null,"teacher_disagreement_score":0.6958476,"threshold_uncertainty_score":0.9998398,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W4237737171","doi":"10.1109/iccad.2017.8203814","title":"Power scheduling with active power grids","year":2017,"lang":"en","type":"article","venue":"2017 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)","topic":"Low-power high-performance VLSI design","field":"Engineering","cited_by":1,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"University of Toronto","funders":"","keywords":"Computer science; Netlist; Power gating; Power network design; Voltage; Voltage drop; Overheating (electricity); Chip; Power management; Switched-mode power supply; Power (physics); Electronic engineering; Electrical engineering; Embedded system; Engineering; Transistor; Telecommunications","retraction":null,"screen_n_in":null,"score":{"opus":0.06052821395272844,"gpt":0.2817277224876469,"spread":0.2211995085349185,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"codex-gemma-dda1882f352a","candidate_categories":["metaepi_narrow","scholarly_communication","insufficient_payload"],"consensus_categories":[],"category_scores_codex":[0.0004518201,0.0007405994,0.0005814877,0.0004271007,0.0005295002,0.001083232,0.003277586,0.0002942201,0.0006248971],"category_scores_gemma":[0.0001201027,0.0006693106,0.000157683,0.0001144473,0.0002638701,0.001593433,0.00026527,0.0008541808,0.001221624],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.000343247,"about_ca_system_score_gemma":0.0002311529,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.00002738658,"about_ca_topic_score_gemma":0.000008664122,"domain_scores_codex":[0.9967385,0.0000929043,0.0005708574,0.0008433044,0.001019288,0.0007351764],"domain_scores_gemma":[0.9965031,0.0002360845,0.0003878268,0.001918509,0.0006517404,0.0003027013],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"simulation_or_modeling","study_design_gemma":"simulation_or_modeling","study_design_scores_codex":[0.005866413,0.002074427,0.005372223,0.0003552499,0.007592718,0.002681179,0.007638267,0.4897982,0.1229297,0.160262,0.1111735,0.08425616],"study_design_scores_gemma":[0.006011549,0.002284905,0.02064421,0.001649158,0.0001037116,0.0002751583,0.0001833328,0.8708746,0.08360617,0.005365927,0.005695671,0.003305607],"study_design_candidate":"simulation_or_modeling","study_design_consensus":"simulation_or_modeling","genre_codex":"methods","genre_gemma":"empirical","genre_scores_codex":[0.2255117,0.00004263626,0.7041748,0.0009273178,0.009334919,0.000906923,0.0000773537,0.0009080388,0.05811637],"genre_scores_gemma":[0.954406,0.00006643847,0.04388309,0.0002309479,0.0006031711,0.00008034182,0.00002344573,0.0001220445,0.0005844823],"genre_candidate":"empirical","genre_consensus":null,"teacher_disagreement_score":0.7288943,"threshold_uncertainty_score":0.9999537,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W4240951904","doi":"10.1109/iccad.2017.8203831","title":"Power grid verification under transient constraints","year":2017,"lang":"en","type":"article","venue":"2017 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)","topic":"Low-power high-performance VLSI design","field":"Engineering","cited_by":1,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"University of Toronto","funders":"","keywords":"Transient (computer programming); Grid; Computer science; Bounded function; Power grid; Power (physics); Voltage; Electronic engineering; Current (fluid); Model checking; Control theory (sociology); Reliability engineering; Electrical engineering; Algorithm; Mathematics; Engineering; Physics","retraction":null,"screen_n_in":null,"score":{"opus":0.09172781133126588,"gpt":0.2933560621734064,"spread":0.2016282508421405,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"codex-gemma-dda1882f352a","candidate_categories":["metaepi_narrow","insufficient_payload"],"consensus_categories":[],"category_scores_codex":[0.0005212718,0.0005644922,0.0004449162,0.0003333338,0.0004208195,0.0008325131,0.00270114,0.0002739537,0.000900318],"category_scores_gemma":[0.00007074213,0.0005757624,0.0001697484,0.0000801877,0.0003623145,0.0009494466,0.0001086136,0.0005511863,0.001505862],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0003055379,"about_ca_system_score_gemma":0.000172942,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.00001706099,"about_ca_topic_score_gemma":0.000005378448,"domain_scores_codex":[0.9971036,0.0001007648,0.0006580039,0.0007178814,0.0008278766,0.0005919023],"domain_scores_gemma":[0.9971021,0.0001756573,0.000295983,0.001732199,0.0004388247,0.0002552696],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"not_applicable","study_design_gemma":"simulation_or_modeling","study_design_scores_codex":[0.001017777,0.001322957,0.001040979,0.0002499963,0.00244248,0.0005070765,0.003131793,0.2200495,0.2176468,0.1896402,0.2581947,0.1047559],"study_design_scores_gemma":[0.004766081,0.0008691898,0.0323333,0.0008407695,0.00008690116,0.0001822077,0.0001160329,0.8798531,0.05877113,0.007372817,0.0123427,0.002465811],"study_design_candidate":"simulation_or_modeling","study_design_consensus":null,"genre_codex":"methods","genre_gemma":"empirical","genre_scores_codex":[0.06057241,0.00003667765,0.8806303,0.001450095,0.0153184,0.0008276507,0.0001185589,0.0006980302,0.04034784],"genre_scores_gemma":[0.9836156,0.0001593645,0.01463181,0.0002667225,0.0007239897,0.00007568376,0.00005631412,0.00007849765,0.0003919505],"genre_candidate":"empirical","genre_consensus":null,"teacher_disagreement_score":0.9230433,"threshold_uncertainty_score":0.9996694,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null}]}