{"meta":{"page":1,"per_page":50,"max_per_page":100,"total":1,"total_is_capped":false,"direct_labels_cover":0,"predictions_cover":1,"direct_label_status":"direct model label, unvalidated","prediction_status":"machine_predicted_unvalidated (Codex and Gemma teacher distillation)","score_status":"score_only:v0-immature-baseline (scores rank; they never assert a category)","snapshot":{"source":"OpenAlex, pinned release, all 482 partitions","release":"2026-06-24","frame_built":"2026-07-12"},"query_hash":"aa6893923766","filters":{"venue":"American Journal of Advanced Technology and Engineering Solutions"}},"results":[{"id":"W7160149882","doi":"10.63125/nwsgxf14","title":"Quantitative Simulation-Based Model for Short-Circuit Analysis, Arc-Flash Risk Evaluation, and Protection Coordination in Industrial Electrical Systems","year":2023,"lang":"","type":"article","venue":"American Journal of Advanced Technology and Engineering Solutions","topic":"Electrical Fault Detection and Protection","field":"Engineering","cited_by":0,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"Oralys (Canada)","funders":"","keywords":"Reliability (semiconductor); Key (lock); Electric potential energy; System safety; Electrical equipment; Safety Equipment; Clearing","retraction":null,"screen_n_in":null,"score":{"opus":0.04157077521409635,"gpt":0.3050083752213727,"spread":0.2634376000072763,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"codex-gemma-dda1882f352a","candidate_categories":["metaepi_narrow"],"consensus_categories":[],"category_scores_codex":[0.001526237,0.0002982918,0.0006838412,0.005636108,0.0003145794,0.00005160352,0.0001078295,0.0003756964,0.000001221426],"category_scores_gemma":[0.002975048,0.0003417066,0.0001482496,0.009840684,0.0001604894,0.0003007112,0.00001776512,0.00120433,8.777641e-7],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.000514512,"about_ca_system_score_gemma":0.0001454611,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.00002198878,"about_ca_topic_score_gemma":0.00003596623,"domain_scores_codex":[0.9977649,0.0001472485,0.0009265188,0.0003514432,0.0003026588,0.0005072097],"domain_scores_gemma":[0.9979069,0.000813671,0.0004156148,0.0001582831,0.0005818284,0.0001237333],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"simulation_or_modeling","study_design_gemma":"simulation_or_modeling","study_design_scores_codex":[0.0001658702,0.00003524095,0.0004778044,0.00003494528,0.0004033896,0.000001168609,0.00009817442,0.8977828,0.003640707,0.001083033,0.000003364359,0.0962735],"study_design_scores_gemma":[0.00135825,0.001362711,0.001607579,0.0001098018,0.0007469914,0.00001207075,0.0002057799,0.9926098,0.0001791461,0.001381417,0.0001161245,0.0003103268],"study_design_candidate":"simulation_or_modeling","study_design_consensus":"simulation_or_modeling","genre_codex":"methods","genre_gemma":"empirical","genre_scores_codex":[0.3237435,0.0009843435,0.673832,0.0002386835,0.0002141956,0.00080356,0.00002313515,0.0001589394,0.000001631837],"genre_scores_gemma":[0.9962052,0.0003370988,0.003031138,0.000002933418,0.00006525574,0.0002983653,0.000009957759,0.00003891101,0.00001119719],"genre_candidate":"empirical","genre_consensus":null,"teacher_disagreement_score":0.6724616,"threshold_uncertainty_score":0.9999035,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null}]}