{"meta":{"page":1,"per_page":50,"max_per_page":100,"total":46,"total_is_capped":false,"direct_labels_cover":0,"predictions_cover":46,"direct_label_status":"direct model label, unvalidated","prediction_status":"machine_predicted_unvalidated (Codex and Gemma teacher distillation)","score_status":"score_only:v0-immature-baseline (scores rank; they never assert a category)","snapshot":{"source":"OpenAlex, pinned release, all 482 partitions","release":"2026-06-24","frame_built":"2026-07-12","author_layer_release":"2026-06-26"},"query_hash":"92f52aa94312","filters":{"venue":"Proceedings - International Symposium for Testing and Failure Analysis"}},"results":[{"id":"W3111786897","doi":"10.31399/asm.cp.istfa2001p0043","title":"Resistive Interconnection Localization","year":2001,"lang":"en","type":"article","venue":"Proceedings - International Symposium for Testing and Failure Analysis","topic":"Integrated Circuits and Semiconductor Failure Analysis","field":"Engineering","cited_by":35,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"Advanced Micro Devices (Canada)","funders":"","keywords":"Interconnection; Resistive touchscreen; Electrical conductor; Optoelectronics; Materials science; Laser; SIGNAL (programming language); Microscope; Electrical engineering; Electronic engineering; Optics; Computer science; Engineering; Physics; Telecommunications","authors":[{"name":"Edward I. Cole","is_ca":false},{"name":"Paiboon Tangyunyong","is_ca":false},{"name":"C.F. Hawkins","is_ca":false},{"name":"Michael R. Bruce","is_ca":true},{"name":"Victoria J. Bruce","is_ca":true},{"name":"Wan-Loong Chong","is_ca":true},{"name":"Rosalinda M. Ring","is_ca":true}],"retraction":null,"screen_n_in":null,"score":{"opus":0.01202809313699221,"gpt":0.2183114304989144,"spread":0.2062833373619222,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"codex-gemma-dda1882f352a","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0002031573,0.0002183913,0.0002792424,0.0004925489,0.0001873425,0.0002550719,0.000168694,0.0001192071,0.00005450406],"category_scores_gemma":[0.0002440931,0.0002096762,0.0001836722,0.001323577,0.00004015622,0.0003859195,0.00001961083,0.0001385113,0.000005162097],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0001190807,"about_ca_system_score_gemma":0.000006232417,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.0001469057,"about_ca_topic_score_gemma":0.0001217924,"domain_scores_codex":[0.9988527,0.000004738148,0.0003588035,0.0003520103,0.000196348,0.00023543],"domain_scores_gemma":[0.9989005,0.0001107868,0.00007403686,0.00007049012,0.0007600196,0.00008415644],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"observational","study_design_gemma":"simulation_or_modeling","study_design_scores_codex":[0.0001649029,0.0002153635,0.4806612,0.0003154061,0.0210869,0.0000138793,0.003784397,0.1100967,0.3302983,0.01604718,0.01806977,0.01924594],"study_design_scores_gemma":[0.0003754615,0.00007576342,0.0009315091,0.00006369461,0.002200994,0.00003689163,0.0008904604,0.9620438,0.004352661,0.001163326,0.0273971,0.0004683485],"study_design_candidate":"simulation_or_modeling","study_design_consensus":null,"genre_codex":"empirical","genre_gemma":"empirical","genre_scores_codex":[0.712328,0.0003534188,0.2415673,0.002185606,0.0007244226,0.0005659667,0.00009846016,0.001506526,0.04067026],"genre_scores_gemma":[0.99723,0.00008831666,0.001747885,0.00008433987,0.00028892,0.00006262432,0.0001081809,0.00003112336,0.0003585874],"genre_candidate":"empirical","genre_consensus":"empirical","teacher_disagreement_score":0.8519471,"threshold_uncertainty_score":0.8550346,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W2750334494","doi":"10.31399/asm.cp.istfa2017p0285","title":"Steps Toward Automated Deprocessing of Integrated Circuits","year":2017,"lang":"en","type":"article","venue":"Proceedings - International Symposium for Testing and Failure Analysis","topic":"Integrated Circuits and Semiconductor Failure Analysis","field":"Engineering","cited_by":25,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"Object Research Systems (Canada)","funders":"","keywords":"Workflow; Automation; Computer science; Bridging (networking); Suite; Embedded system; Node (physics); Computer hardware; Integrated circuit; Instrument control; Operating system; Engineering; Database; Mechanical engineering","authors":[{"name":"E.L. Principe","is_ca":false},{"name":"Navid Asadizanjani","is_ca":false},{"name":"Domenic Forte","is_ca":false},{"name":"Mark Tehranipoor","is_ca":false},{"name":"Robert Chivas","is_ca":false},{"name":"Michael DiBattista","is_ca":false},{"name":"Scott Silverman","is_ca":false},{"name":"Mike Marsh","is_ca":true},{"name":"Nicolas Piché","is_ca":true},{"name":"John Mastovich","is_ca":false}],"retraction":null,"screen_n_in":null,"score":{"opus":0.02191401069574563,"gpt":0.2543835412994946,"spread":0.232469530603749,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"codex-gemma-dda1882f352a","candidate_categories":["metaepi_narrow"],"consensus_categories":[],"category_scores_codex":[0.0003220671,0.0003082155,0.0005597071,0.000485282,0.000360066,0.0006168021,0.0006081588,0.0001728731,0.00002538879],"category_scores_gemma":[0.0006488907,0.0002811019,0.0002743885,0.0006288514,0.0001249076,0.0006176922,0.0000532391,0.0002063131,0.000001919458],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.00009041198,"about_ca_system_score_gemma":0.00002782644,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.0003482277,"about_ca_topic_score_gemma":0.00005369203,"domain_scores_codex":[0.9983726,0.000004600669,0.0005778137,0.0004259107,0.0003010673,0.0003180681],"domain_scores_gemma":[0.997849,0.0001014301,0.0004102707,0.0001910976,0.001336736,0.0001114689],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"bench_or_experimental","study_design_gemma":"simulation_or_modeling","study_design_scores_codex":[0.00002747929,0.0001113428,0.3492028,0.0006503323,0.0125718,0.000006145206,0.00185113,0.007266819,0.6072879,0.001910058,0.001841167,0.01727302],"study_design_scores_gemma":[0.0005979477,0.00006642597,0.005373757,0.0002153174,0.003034468,0.00002008673,0.0008191143,0.9620931,0.02480983,0.0004604856,0.001937576,0.0005719012],"study_design_candidate":"simulation_or_modeling","study_design_consensus":null,"genre_codex":"empirical","genre_gemma":"empirical","genre_scores_codex":[0.9779049,0.0002312483,0.008437966,0.0007038445,0.0003224675,0.0002895442,0.0002174962,0.001125049,0.01076744],"genre_scores_gemma":[0.9959589,0.00003323599,0.003529838,0.00002347633,0.0001349315,0.00004176162,0.00008810876,0.00004222119,0.0001475235],"genre_candidate":"empirical","genre_consensus":"empirical","teacher_disagreement_score":0.9548263,"threshold_uncertainty_score":0.9999641,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W936104161","doi":"10.31399/asm.cp.istfa2013p0264","title":"Electro Optical Terahertz Pulse Reflectometry—A Fast and Highly Accurate Non-Destructive Fault Isolation Technique for 3D Flip Chip Packages","year":2013,"lang":"en","type":"article","venue":"Proceedings - International Symposium for Testing and Failure Analysis","topic":"Terahertz technology and applications","field":"Engineering","cited_by":16,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"IBM (Canada)","funders":"","keywords":"Reflectometry; Terahertz radiation; Materials science; Chip; Microwave; Optoelectronics; Fault (geology); Electronic engineering; Time domain; Optics; Computer science; Electrical engineering; Engineering; Physics; Telecommunications","authors":[{"name":"Jesse Alton","is_ca":false},{"name":"Martin Igarashi","is_ca":false}],"retraction":null,"screen_n_in":null,"score":{"opus":0.007643405650920324,"gpt":0.2426213668071784,"spread":0.234977961156258,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"codex-gemma-dda1882f352a","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0001422395,0.0002379412,0.000268556,0.0004028906,0.0002297847,0.000245949,0.0001872996,0.0002046619,0.000005766329],"category_scores_gemma":[0.0002137105,0.0002286261,0.00009145539,0.0007176242,0.00007254326,0.0004383421,0.0000414499,0.0002075155,0.000001614579],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.00006654859,"about_ca_system_score_gemma":0.000006778745,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.00004296051,"about_ca_topic_score_gemma":0.00001140336,"domain_scores_codex":[0.9988712,0.000002623782,0.000320587,0.0004019485,0.0001160455,0.0002875863],"domain_scores_gemma":[0.9990151,0.0002362741,0.0001168623,0.00008416249,0.0004675028,0.00008009138],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"bench_or_experimental","study_design_gemma":"simulation_or_modeling","study_design_scores_codex":[0.0000248248,0.00004410646,0.02575007,0.0000977915,0.001032178,2.42243e-7,0.0002178076,0.0001885163,0.9393896,0.002504649,0.000508716,0.03024148],"study_design_scores_gemma":[0.001008518,0.0003643472,0.02626668,0.0001036185,0.001240893,0.00006915957,0.0002428563,0.8214039,0.1339136,0.01099667,0.003476016,0.0009137813],"study_design_candidate":"bench_or_experimental","study_design_consensus":null,"genre_codex":"empirical","genre_gemma":"empirical","genre_scores_codex":[0.6534501,0.00005812791,0.3407086,0.002611965,0.00005439353,0.001243229,0.00008085657,0.0005646544,0.00122809],"genre_scores_gemma":[0.8662682,0.00001980891,0.1318726,0.00003587487,0.0001225948,0.001511356,0.00007153396,0.0000309329,0.00006709655],"genre_candidate":"empirical","genre_consensus":"empirical","teacher_disagreement_score":0.8212153,"threshold_uncertainty_score":0.9323103,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W2356696037","doi":"10.31399/asm.cp.istfa2015p0035","title":"Combinational Logic Analysis Using Laser Voltage Probing","year":2015,"lang":"en","type":"article","venue":"Proceedings - International Symposium for Testing and Failure Analysis","topic":"Integrated Circuits and Semiconductor Failure Analysis","field":"Engineering","cited_by":11,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"Advanced Micro Devices (Canada)","funders":"","keywords":"Waveform; Combinational logic; Debugging; Truth table; Logic gate; Laser; Computer science; Electronic engineering; Voltage; State (computer science); Electrical engineering; Engineering; Algorithm; Physics; Optics","authors":[{"name":"Venkat Krishnan Ravikumar","is_ca":true},{"name":"Winson Lua","is_ca":true},{"name":"Seah Yi Xuan","is_ca":true},{"name":"Gopinath Ranganathan","is_ca":true},{"name":"Angeline Phoa","is_ca":true}],"retraction":null,"screen_n_in":null,"score":{"opus":0.03240336515866919,"gpt":0.2479719438277199,"spread":0.2155685786690508,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"codex-gemma-dda1882f352a","candidate_categories":["metaepi_narrow"],"consensus_categories":[],"category_scores_codex":[0.0005459935,0.0003506547,0.0005889769,0.001065261,0.0002427985,0.0005436002,0.000327309,0.000168809,0.00004620645],"category_scores_gemma":[0.0003196197,0.0003316214,0.000448368,0.003435133,0.00006828397,0.0005337035,0.00005091343,0.0002274429,0.000003846546],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0002470603,"about_ca_system_score_gemma":0.00003046462,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.0002851579,"about_ca_topic_score_gemma":0.00008762388,"domain_scores_codex":[0.9980206,0.000008857532,0.0005698021,0.0005260943,0.0004841728,0.0003904208],"domain_scores_gemma":[0.9977525,0.0001466625,0.000204377,0.0001208368,0.001556183,0.0002194305],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"simulation_or_modeling","study_design_gemma":"simulation_or_modeling","study_design_scores_codex":[0.00003739677,0.0002373198,0.2083737,0.0001808564,0.05477545,0.00001213136,0.002662088,0.622979,0.09637489,0.009176657,0.003948359,0.001242077],"study_design_scores_gemma":[0.0004720428,0.00004685975,0.0003673196,0.00002154319,0.01110903,0.00001456743,0.0008002446,0.9819873,0.001323407,0.001914203,0.001458621,0.0004848423],"study_design_candidate":"simulation_or_modeling","study_design_consensus":"simulation_or_modeling","genre_codex":"empirical","genre_gemma":"empirical","genre_scores_codex":[0.8875792,0.000274857,0.09414326,0.0008392697,0.0004659194,0.0005660692,0.0002680983,0.0009717125,0.01489162],"genre_scores_gemma":[0.9907175,0.000008823867,0.008173941,0.00008997499,0.0002328358,0.00005543624,0.0002488055,0.00004045208,0.0004322834],"genre_candidate":"empirical","genre_consensus":"empirical","teacher_disagreement_score":0.3590083,"threshold_uncertainty_score":0.9999136,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W2755307068","doi":"10.31399/asm.cp.istfa2017p0574","title":"Precision Xe Plasma FIB Delayering for Physical Failure Analysis of Sub-20 nm Microprocessor Devices","year":2017,"lang":"en","type":"article","venue":"Proceedings - International Symposium for Testing and Failure Analysis","topic":"Integrated Circuits and Semiconductor Failure Analysis","field":"Engineering","cited_by":10,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"Advanced Micro Devices (Canada)","funders":"","keywords":"Polishing; Materials science; Chemical-mechanical planarization; Plasma; Planar; Dielectric; Microprocessor; Optoelectronics; Porosity; Nanotechnology; Computer science; Composite material; Embedded system; Physics","authors":[{"name":"D. Zudhistira","is_ca":true},{"name":"Vignesh Viswanathan","is_ca":true},{"name":"V. Narang","is_ca":true},{"name":"J.M. Chin","is_ca":true},{"name":"S. Sharang","is_ca":false},{"name":"Karel Novotný","is_ca":false},{"name":"J. Vincen Oboňa","is_ca":false}],"retraction":null,"screen_n_in":null,"score":{"opus":0.01503492770299855,"gpt":0.2524067199841974,"spread":0.2373717922811989,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"codex-gemma-dda1882f352a","candidate_categories":["metaepi_narrow"],"consensus_categories":[],"category_scores_codex":[0.0003913455,0.0004496966,0.001034499,0.001035238,0.000554953,0.0006927053,0.0008050852,0.0002138095,0.00001479567],"category_scores_gemma":[0.0006000844,0.0004099614,0.000924329,0.001276292,0.0001103818,0.0007329933,0.00008908984,0.0002252766,0.000001495517],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.00009783747,"about_ca_system_score_gemma":0.0000221519,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.0001513232,"about_ca_topic_score_gemma":0.0007743778,"domain_scores_codex":[0.9976959,0.000006043898,0.0007213533,0.0007051975,0.0004221851,0.0004493623],"domain_scores_gemma":[0.9969144,0.0004081288,0.0006246538,0.0002821304,0.001622573,0.0001480807],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"bench_or_experimental","study_design_gemma":"simulation_or_modeling","study_design_scores_codex":[0.0001257438,0.0001569232,0.1125487,0.0005695389,0.0431601,0.000001969892,0.001533022,0.04686181,0.7866785,0.00128788,0.0009997012,0.006076118],"study_design_scores_gemma":[0.0005954537,0.0001271406,0.002084082,0.0001237684,0.01934893,0.000005200869,0.0004489759,0.9157141,0.05788129,0.0003461761,0.00274128,0.0005835763],"study_design_candidate":"simulation_or_modeling","study_design_consensus":null,"genre_codex":"empirical","genre_gemma":"empirical","genre_scores_codex":[0.9906293,0.00008790704,0.006882761,0.0005307827,0.0001160768,0.0003238142,0.0004291042,0.0001669088,0.0008333826],"genre_scores_gemma":[0.9917093,0.00002785997,0.00730822,0.00002132066,0.0003219398,0.0001477423,0.0002673424,0.00005734371,0.0001389219],"genre_candidate":"empirical","genre_consensus":"empirical","teacher_disagreement_score":0.8688523,"threshold_uncertainty_score":0.9998353,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W2314077839","doi":"10.31399/asm.cp.istfa2015p0388","title":"Plasma FIB DualBeam Delayering for Atomic Force NanoProbing of 14 nm FinFET Devices in an SRAM Array","year":2015,"lang":"en","type":"article","venue":"Proceedings - International Symposium for Testing and Failure Analysis","topic":"Integrated Circuits and Semiconductor Failure Analysis","field":"Engineering","cited_by":8,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"Chipworks (Canada); Mediprobe Research (Canada)","funders":"","keywords":"Materials science; Flatness (cosmology); Nanoscopic scale; Static random-access memory; Plasma; Optoelectronics; Electrical conductor; Voltage; Conductive atomic force microscopy; Nano-; Conductivity; Atomic force microscopy; Nanotechnology; Analytical Chemistry (journal); Electrical engineering; Composite material; Chemistry; Engineering","authors":[{"name":"Roger Alvis","is_ca":false},{"name":"Trevan Landin","is_ca":false},{"name":"Chad Rue","is_ca":false},{"name":"Peter Carleson","is_ca":false},{"name":"O.Yu. Sidorov","is_ca":false},{"name":"Andrew Erickson","is_ca":true},{"name":"Sean Zumwalt","is_ca":true},{"name":"Sinjin Dixon-Warren","is_ca":true},{"name":"Wanyi Liu","is_ca":false},{"name":"Shih‐Hsin Chang","is_ca":false},{"name":"Te-Fu Chang","is_ca":false},{"name":"Chia-Hsiang Yen","is_ca":false},{"name":"Pau-Sheng Kuo","is_ca":false},{"name":"Chih-Hsun Chu","is_ca":false}],"retraction":null,"screen_n_in":null,"score":{"opus":0.02290025096504117,"gpt":0.2441356368630735,"spread":0.2212353858980323,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"codex-gemma-dda1882f352a","candidate_categories":["metaepi_narrow"],"consensus_categories":[],"category_scores_codex":[0.00051658,0.0002958598,0.0005361687,0.0006618863,0.00009436051,0.0002035294,0.0003221137,0.0001640924,0.000005098317],"category_scores_gemma":[0.0003355163,0.000288516,0.0002248544,0.0009202532,0.00004077257,0.0006472085,0.00002550949,0.0001655077,8.235237e-7],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.000145836,"about_ca_system_score_gemma":0.0000311517,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.0001611478,"about_ca_topic_score_gemma":0.0005305049,"domain_scores_codex":[0.9982777,0.000006185267,0.0006624423,0.0004353874,0.000257717,0.000360631],"domain_scores_gemma":[0.998509,0.0001835375,0.0002366614,0.0001044376,0.0008241225,0.0001421719],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"bench_or_experimental","study_design_gemma":"simulation_or_modeling","study_design_scores_codex":[0.00009185643,0.0001260338,0.1455081,0.0004457915,0.003741584,0.000001824758,0.004999352,0.148229,0.6913539,0.002005436,0.0004209139,0.003076249],"study_design_scores_gemma":[0.001161109,0.0002097053,0.000545938,0.0001780224,0.001346483,0.00001390917,0.001423573,0.9527662,0.03902908,0.001177457,0.001576977,0.0005715588],"study_design_candidate":"simulation_or_modeling","study_design_consensus":null,"genre_codex":"empirical","genre_gemma":"empirical","genre_scores_codex":[0.9918237,0.00008877287,0.006416962,0.0001595395,0.0001240862,0.0002784522,0.00006512718,0.000141031,0.0009023271],"genre_scores_gemma":[0.9871749,0.000009618098,0.01219793,0.00002719833,0.0001647448,0.0001390133,0.0001281408,0.00004653033,0.0001119454],"genre_candidate":"empirical","genre_consensus":"empirical","teacher_disagreement_score":0.8045372,"threshold_uncertainty_score":0.9999567,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W2474924212","doi":"10.31399/asm.cp.istfa2015p0082","title":"Extending Electrical Scanning Probe Microscopy Measurements of Semiconductor Devices Using Microwave Impedance Microscopy","year":2015,"lang":"en","type":"article","venue":"Proceedings - International Symposium for Testing and Failure Analysis","topic":"Near-Field Optical Microscopy","field":"Engineering","cited_by":7,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"Chipworks (Canada)","funders":"","keywords":"Materials science; Microscopy; Microwave; Scanning capacitance microscopy; Dopant; Optoelectronics; Planar; Capacitance; Semiconductor; Scanning probe microscopy; Dielectric spectroscopy; Electrical impedance; Scanning electron microscope; Analytical Chemistry (journal); Scanning confocal electron microscopy; Optics; Electrical engineering; Doping; Electrode; Chemistry; Computer science","authors":[{"name":"Benedict Drevniok","is_ca":true},{"name":"St. J. Dixon-Warren","is_ca":true},{"name":"Oskar Amster","is_ca":false},{"name":"Stuart Friedman","is_ca":false},{"name":"Yongliang Yang","is_ca":false}],"retraction":null,"screen_n_in":null,"score":{"opus":0.04409935955391604,"gpt":0.2993455135974926,"spread":0.2552461540435765,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"codex-gemma-dda1882f352a","candidate_categories":["metaepi_narrow"],"consensus_categories":[],"category_scores_codex":[0.0004680638,0.0003113477,0.0004810064,0.0003546672,0.0001233062,0.0002424687,0.0003306347,0.0001446672,0.000005081769],"category_scores_gemma":[0.0004971405,0.0003221776,0.0001662787,0.0009266771,0.00007905021,0.0004133956,0.00008198568,0.0002184025,0.000001573086],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0002417638,"about_ca_system_score_gemma":0.00004476163,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.00009859898,"about_ca_topic_score_gemma":0.00001297729,"domain_scores_codex":[0.998125,0.000008400584,0.0005986754,0.0004659423,0.0003561324,0.000445818],"domain_scores_gemma":[0.998377,0.0001510342,0.0002477053,0.00009982794,0.0009366238,0.0001878358],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","study_design_scores_codex":[0.00003011851,0.00002862941,0.1348466,0.0001259685,0.0006853718,5.595954e-7,0.0003001177,0.001010878,0.8625503,0.00005098921,0.0001492194,0.0002212906],"study_design_scores_gemma":[0.0006976668,0.0001113718,0.0005248922,0.0002507401,0.001014678,0.00003209804,0.0001872056,0.1647625,0.8314412,0.0002289799,0.000285438,0.0004631779],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","genre_codex":"empirical","genre_gemma":"empirical","genre_scores_codex":[0.9809693,0.0005866071,0.01698767,0.0001191817,0.0002308186,0.0003006964,0.00002646492,0.0001630352,0.000616305],"genre_scores_gemma":[0.7860637,0.000008601652,0.213621,0.00003658208,0.0001588523,0.00002642599,0.00001276636,0.00004208807,0.00003003836],"genre_candidate":"empirical","genre_consensus":"empirical","teacher_disagreement_score":0.1966333,"threshold_uncertainty_score":0.9999231,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W2523301604","doi":"10.31399/asm.cp.istfa2014p0210","title":"Feature Based Nondestructive Fault Isolation in Advanced IC Packages","year":2014,"lang":"en","type":"article","venue":"Proceedings - International Symposium for Testing and Failure Analysis","topic":"Integrated Circuits and Semiconductor Failure Analysis","field":"Engineering","cited_by":6,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"IBM (Canada)","funders":"","keywords":"Reflectometry; Fault (geology); Feature (linguistics); Computer science; Isolation (microbiology); Fault detection and isolation; Electronic engineering; Time domain; Feature extraction; Device under test; Engineering; Artificial intelligence; Scattering parameters; Computer vision","authors":[{"name":"K.C. Lee","is_ca":false},{"name":"Jesse Alton","is_ca":false},{"name":"Martin Igarashi","is_ca":false},{"name":"Stephane Barbeau","is_ca":true}],"retraction":null,"screen_n_in":null,"score":{"opus":0.00625808691992033,"gpt":0.2104052998299475,"spread":0.2041472129100272,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"codex-gemma-dda1882f352a","candidate_categories":["metaepi_narrow"],"consensus_categories":[],"category_scores_codex":[0.0002597705,0.0002652891,0.0003727419,0.0006229049,0.0001103254,0.0001989992,0.0001997943,0.0001602691,0.00001495164],"category_scores_gemma":[0.0003481994,0.0002505729,0.0001821958,0.001257681,0.00003590795,0.0003882663,0.00001506744,0.000248304,0.000002010995],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0001181476,"about_ca_system_score_gemma":0.000009914635,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.00006160254,"about_ca_topic_score_gemma":0.0001350264,"domain_scores_codex":[0.9987752,0.000008456263,0.000297256,0.0004133017,0.0002272739,0.0002784683],"domain_scores_gemma":[0.9989585,0.0002133805,0.00012818,0.00008816048,0.0005341856,0.00007762164],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"bench_or_experimental","study_design_gemma":"simulation_or_modeling","study_design_scores_codex":[0.0000627574,0.00008342584,0.3298986,0.0002410721,0.002832276,0.000002350035,0.001058947,0.1447887,0.5033107,0.004706343,0.001379607,0.01163519],"study_design_scores_gemma":[0.0006006421,0.00006638033,0.004008744,0.00007516826,0.0007172614,0.000004665327,0.0003065077,0.9852071,0.005344767,0.0009352863,0.002349886,0.0003836281],"study_design_candidate":"simulation_or_modeling","study_design_consensus":null,"genre_codex":"empirical","genre_gemma":"empirical","genre_scores_codex":[0.9331239,0.0001095466,0.0565586,0.002280228,0.0002346436,0.0003691967,0.00007457264,0.000446896,0.006802458],"genre_scores_gemma":[0.9851772,0.00001007945,0.01422065,0.00008114072,0.0001557451,0.00007410863,0.0001203595,0.00003275402,0.000127997],"genre_candidate":"empirical","genre_consensus":"empirical","teacher_disagreement_score":0.8404183,"threshold_uncertainty_score":0.9999946,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W3111651134","doi":"10.31399/asm.cp.istfa2017p0171","title":"Debugging Signal Corruption in Scan Chain Using Phase Laser Voltage Imaging","year":2017,"lang":"en","type":"article","venue":"Proceedings - International Symposium for Testing and Failure Analysis","topic":"Integrated Circuits and Semiconductor Failure Analysis","field":"Engineering","cited_by":5,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"Advanced Micro Devices (Canada)","funders":"","keywords":"Amplifier; SIGNAL (programming language); Computer science; Debugging; Fault (geology); Phase (matter); Laser; Electronic engineering; Engineering; Optics; Physics; Telecommunications; Geology; Bandwidth (computing)","authors":[{"name":"Gopinath Ranganathan","is_ca":true},{"name":"Venkat Krishnan Ravikumar","is_ca":true},{"name":"S.L. Phoa","is_ca":true},{"name":"Christopher Nemirow","is_ca":false},{"name":"Neel Leslie","is_ca":false}],"retraction":null,"screen_n_in":null,"score":{"opus":0.0200572446178853,"gpt":0.2700901931299561,"spread":0.2500329485120708,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"codex-gemma-dda1882f352a","candidate_categories":["metaepi_narrow"],"consensus_categories":[],"category_scores_codex":[0.0004547781,0.0002937654,0.0004079108,0.0006954012,0.0004694909,0.0008240047,0.0003855235,0.00009989498,0.00003720285],"category_scores_gemma":[0.0002458465,0.0002979886,0.000214134,0.0004897676,0.0000756532,0.0008405883,0.0000530245,0.0002458073,0.000001628976],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0002220896,"about_ca_system_score_gemma":0.00001798206,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.0007882916,"about_ca_topic_score_gemma":0.0002558923,"domain_scores_codex":[0.9984196,0.00000505522,0.0004724379,0.0004524601,0.000260146,0.0003903255],"domain_scores_gemma":[0.9989539,0.00008706047,0.0002577414,0.0001440722,0.000449294,0.0001078895],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"bench_or_experimental","study_design_gemma":"simulation_or_modeling","study_design_scores_codex":[0.00003630225,0.000101114,0.3853182,0.000114313,0.002093984,0.00001634234,0.0008310238,0.02649319,0.5698482,0.0005603142,0.0002731201,0.01431391],"study_design_scores_gemma":[0.0007908068,0.00002159837,0.001143034,0.000116528,0.001020892,0.00001751971,0.0003460149,0.9904203,0.004964726,0.0003139781,0.0004758871,0.0003686695],"study_design_candidate":"simulation_or_modeling","study_design_consensus":null,"genre_codex":"empirical","genre_gemma":"empirical","genre_scores_codex":[0.9771746,0.0001010448,0.01911469,0.0004329763,0.0001919492,0.0002162646,0.00006741636,0.0002313096,0.002469757],"genre_scores_gemma":[0.9968416,0.00001527456,0.002558924,0.00004367716,0.0002973625,0.00003861182,0.00006058437,0.00004269759,0.0001012858],"genre_candidate":"empirical","genre_consensus":"empirical","teacher_disagreement_score":0.9639271,"threshold_uncertainty_score":0.9999472,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W3116952266","doi":"10.31399/asm.cp.istfa2006p0311","title":"Applications of Soft Defect Localization (SDL) on AMD Advanced SOI Microprocessors","year":2006,"lang":"en","type":"article","venue":"Proceedings - International Symposium for Testing and Failure Analysis","topic":"Integrated Circuits and Semiconductor Failure Analysis","field":"Engineering","cited_by":4,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"Advanced Micro Devices (Canada)","funders":"","keywords":"Node (physics); Silicon on insulator; Computer science; Root cause; Voltage; Process (computing); Logic gate; Embedded system; Electronic engineering; Silicon; Electrical engineering; Materials science; Engineering; Reliability engineering; Optoelectronics; Operating system","authors":[{"name":"Yi-Xuan Seah","is_ca":true},{"name":"Murugesan Palaniappan","is_ca":true},{"name":"J.M. Chin","is_ca":true}],"retraction":null,"screen_n_in":null,"score":{"opus":0.005002173297937989,"gpt":0.2060167367376932,"spread":0.2010145634397552,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"codex-gemma-dda1882f352a","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0001543775,0.0002399756,0.0003490332,0.000517509,0.000180325,0.0001496982,0.0002187111,0.0001162262,0.00001675669],"category_scores_gemma":[0.00009327607,0.0002280901,0.0002700776,0.001405086,0.0000677749,0.0002032933,0.00001565565,0.000126827,0.000002906588],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.00007740912,"about_ca_system_score_gemma":0.00001289219,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.0001830222,"about_ca_topic_score_gemma":0.00008430819,"domain_scores_codex":[0.9986687,0.000003580416,0.0004830915,0.0003679584,0.0002504762,0.0002261973],"domain_scores_gemma":[0.9986416,0.0001352158,0.0002079329,0.00009522299,0.0008660753,0.00005402603],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"simulation_or_modeling","study_design_gemma":"simulation_or_modeling","study_design_scores_codex":[0.00005790759,0.0002662395,0.08729865,0.0005648618,0.005292337,0.000001073036,0.0006049563,0.4633181,0.4100722,0.0151004,0.002394452,0.01502883],"study_design_scores_gemma":[0.0009917362,0.0001839636,0.0007547463,0.0001775065,0.004425198,0.00001305179,0.0006234747,0.8926318,0.06462442,0.004662005,0.0299676,0.0009444489],"study_design_candidate":"simulation_or_modeling","study_design_consensus":"simulation_or_modeling","genre_codex":"empirical","genre_gemma":"empirical","genre_scores_codex":[0.6277001,0.0006812759,0.3502937,0.0007097608,0.0002006703,0.001039602,0.0003282754,0.000932646,0.01811397],"genre_scores_gemma":[0.9958385,0.00001702662,0.003326857,0.00003985177,0.0001650365,0.0001552946,0.0002068993,0.00003611536,0.0002143684],"genre_candidate":"empirical","genre_consensus":"empirical","teacher_disagreement_score":0.4293137,"threshold_uncertainty_score":0.9301245,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W3120081796","doi":"10.31399/asm.cp.istfa2008p0402","title":"Combining Refractive Solid Immersion Lens and Pulsed Laser Induced Techniques for Effective Defect Localization on Microprocessors","year":2008,"lang":"en","type":"article","venue":"Proceedings - International Symposium for Testing and Failure Analysis","topic":"Integrated Circuits and Semiconductor Failure Analysis","field":"Engineering","cited_by":4,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"Advanced Micro Devices (Canada)","funders":"","keywords":"Materials science; Lock-in amplifier; Laser; Amplifier; Immersion (mathematics); Optics; Lens (geology); Sensitivity (control systems); Image resolution; Optoelectronics; Microprocessor; Computer science; Electronic engineering; Computer hardware; Engineering; Physics; CMOS","authors":[{"name":"A.C.T. Quah","is_ca":false},{"name":"S. H. Goh","is_ca":false},{"name":"Venkat Krishnan Ravikumar","is_ca":true},{"name":"S.L. Phoa","is_ca":true},{"name":"V. Narang","is_ca":true},{"name":"J.M. Chin","is_ca":true},{"name":"C.M. Chua","is_ca":false},{"name":"J.C.H. Phang","is_ca":false}],"retraction":null,"screen_n_in":null,"score":{"opus":0.01493562697077971,"gpt":0.241247771264849,"spread":0.2263121442940693,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"codex-gemma-dda1882f352a","candidate_categories":["metaepi_narrow"],"consensus_categories":[],"category_scores_codex":[0.0002578563,0.0003017018,0.0004267812,0.0005465795,0.000395244,0.0001349205,0.0001297122,0.0001848978,0.000004260356],"category_scores_gemma":[0.0003155932,0.0002783347,0.0002238283,0.0007379117,0.00005667496,0.0003894623,0.00002167957,0.0002069065,9.150332e-7],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.000132019,"about_ca_system_score_gemma":0.00001126434,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.00009575942,"about_ca_topic_score_gemma":0.00001659346,"domain_scores_codex":[0.9986882,0.000008694932,0.0003520902,0.0004790996,0.0001997837,0.0002721962],"domain_scores_gemma":[0.9984573,0.0003589469,0.0001780385,0.00006765174,0.0008631076,0.00007491968],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"bench_or_experimental","study_design_gemma":"simulation_or_modeling","study_design_scores_codex":[0.0002237194,0.0001458727,0.03720817,0.0003160446,0.007188155,0.000003844143,0.002964909,0.006088545,0.9362323,0.0005977164,0.001306593,0.007724119],"study_design_scores_gemma":[0.001226288,0.0007525357,0.0006565152,0.0002709289,0.00321392,0.00004605307,0.001072435,0.5713951,0.4178903,0.0004731392,0.00211848,0.000884346],"study_design_candidate":"bench_or_experimental","study_design_consensus":null,"genre_codex":"empirical","genre_gemma":"empirical","genre_scores_codex":[0.9838598,0.00005891291,0.0131365,0.0003098448,0.00008767708,0.0006860221,0.00007636885,0.0003288895,0.001456039],"genre_scores_gemma":[0.9974436,0.0000660925,0.001711782,0.0001176374,0.0001371113,0.0002682226,0.0001503776,0.00004803991,0.0000571517],"genre_candidate":"empirical","genre_consensus":"empirical","teacher_disagreement_score":0.5653065,"threshold_uncertainty_score":0.9999669,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W3115183948","doi":"10.31399/asm.cp.istfa2013p0001","title":"Non-Destructive Open Fault Isolation in Flip-Chip Devices with Space-Domain Reflectometry","year":2013,"lang":"en","type":"article","venue":"Proceedings - International Symposium for Testing and Failure Analysis","topic":"Integrated Circuits and Semiconductor Failure Analysis","field":"Engineering","cited_by":4,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"Advanced Micro Devices (Canada)","funders":"","keywords":"Reflectometry; Fault detection and isolation; Chip; Squid; Electronic engineering; Fault (geology); Device under test; Time domain; Computer science; Materials science; Electrical engineering; Engineering; Scattering parameters; Computer vision; Geology","authors":[{"name":"Wentao Qiu","is_ca":true},{"name":"M. S. Wei","is_ca":true},{"name":"Jan O. Gaudestad","is_ca":false},{"name":"Vladimir V. Talanov","is_ca":false}],"retraction":null,"screen_n_in":null,"score":{"opus":0.01076484493990918,"gpt":0.2354607649499463,"spread":0.2246959200100372,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"codex-gemma-dda1882f352a","candidate_categories":["metaepi_narrow"],"consensus_categories":[],"category_scores_codex":[0.0002652226,0.0003085181,0.0004608965,0.000824809,0.0001474862,0.0007831764,0.0004281283,0.0001385065,0.00005905231],"category_scores_gemma":[0.00009728863,0.0002594755,0.0001151222,0.002213316,0.00004931884,0.00114213,0.00005607232,0.0002548423,0.000006739784],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0001635989,"about_ca_system_score_gemma":0.00001898143,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.00149269,"about_ca_topic_score_gemma":0.0007616155,"domain_scores_codex":[0.998466,0.000006533082,0.0004320663,0.0004905395,0.0002645206,0.0003403604],"domain_scores_gemma":[0.9987231,0.0001358171,0.0001805325,0.0001019093,0.0007524123,0.0001062043],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"observational","study_design_gemma":"simulation_or_modeling","study_design_scores_codex":[0.00005541404,0.00008616299,0.7332337,0.0001379559,0.005105798,0.000003592634,0.002591101,0.01200029,0.2413719,0.002504152,0.0008946594,0.002015237],"study_design_scores_gemma":[0.002434089,0.0003826899,0.06195865,0.0004324334,0.002440376,0.00005556466,0.00739939,0.9067266,0.00849981,0.005988197,0.001980276,0.001701894],"study_design_candidate":"simulation_or_modeling","study_design_consensus":null,"genre_codex":"empirical","genre_gemma":"empirical","genre_scores_codex":[0.9847085,0.00003589566,0.002713656,0.0007996605,0.00005314614,0.0004763351,0.00001988433,0.0001172656,0.01107566],"genre_scores_gemma":[0.9808504,0.000009935627,0.0184237,0.00006692077,0.0001244792,0.0002395325,0.00007261139,0.00004191076,0.0001705044],"genre_candidate":"empirical","genre_consensus":"empirical","teacher_disagreement_score":0.8947263,"threshold_uncertainty_score":0.9999858,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W2747147820","doi":"10.31399/asm.cp.istfa2017p0095","title":"Acoustic and Photoacoustic Inspection of Through-Silicon Vias in the GHz-Frequency Band","year":2017,"lang":"en","type":"article","venue":"Proceedings - International Symposium for Testing and Failure Analysis","topic":"Integrated Circuits and Semiconductor Failure Analysis","field":"Engineering","cited_by":4,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"University of Toronto; Toronto Metropolitan University","funders":"","keywords":"Interconnection; Through-silicon via; Materials science; Reliability (semiconductor); Silicon; Frequency band; Delamination (geology); Chip; Electronic engineering; Computer science; Optoelectronics; Engineering; Bandwidth (computing); Telecommunications","authors":[{"name":"Sebastian Brand","is_ca":false},{"name":"Michael Kögel","is_ca":false},{"name":"Frank Altmann","is_ca":false},{"name":"Ingrid DeWolf","is_ca":false},{"name":"Ahmad Khaled","is_ca":false},{"name":"Michael J. Moore","is_ca":true},{"name":"Eric M. Strohm","is_ca":true},{"name":"Michael C. Kolios","is_ca":true}],"retraction":null,"screen_n_in":null,"score":{"opus":0.01735958080617687,"gpt":0.2440274551315761,"spread":0.2266678743253992,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"codex-gemma-dda1882f352a","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.000334971,0.0001958892,0.0003281443,0.0002562772,0.0002954109,0.0003406834,0.0003389946,0.0001026154,0.000009492662],"category_scores_gemma":[0.0004557657,0.0001523271,0.0001214557,0.0003948908,0.0001247185,0.0004497524,0.00002187417,0.0001902635,4.456236e-7],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.00004969693,"about_ca_system_score_gemma":0.000008679324,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.000892277,"about_ca_topic_score_gemma":0.0004784033,"domain_scores_codex":[0.9989176,0.000005948734,0.0003731362,0.0002911566,0.0002147406,0.0001973849],"domain_scores_gemma":[0.9990856,0.0001815736,0.000210556,0.0001455202,0.0003410213,0.00003573955],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"bench_or_experimental","study_design_gemma":"simulation_or_modeling","study_design_scores_codex":[0.00002226381,0.00008604069,0.2872947,0.0003275584,0.002591367,0.000004755987,0.004964324,0.007270616,0.69327,0.002681454,0.0005956406,0.0008912826],"study_design_scores_gemma":[0.001530831,0.000258341,0.04581539,0.0003392269,0.006332377,0.00009318662,0.005297259,0.9119877,0.01863108,0.008138501,0.0006373638,0.0009388137],"study_design_candidate":"simulation_or_modeling","study_design_consensus":null,"genre_codex":"empirical","genre_gemma":"empirical","genre_scores_codex":[0.9906449,0.0001871965,0.001632254,0.0005039401,0.0001044396,0.000199717,0.00004017921,0.00007812075,0.006609208],"genre_scores_gemma":[0.9987781,0.0001142156,0.0008229973,0.00003585382,0.000125172,0.00005123973,0.00001722675,0.0000176895,0.00003750408],"genre_candidate":"empirical","genre_consensus":"empirical","teacher_disagreement_score":0.904717,"threshold_uncertainty_score":0.6211718,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W2954108375","doi":"10.31399/asm.cp.istfa2018p0232","title":"Integration of Probing Capability into Plasma FIB for In-Situ Delayering, Defect Inspection, and EBAC on BEOL Defects of Sub-20nm FinFET Devices","year":2018,"lang":"en","type":"article","venue":"Proceedings - International Symposium for Testing and Failure Analysis","topic":"Integrated Circuits and Semiconductor Failure Analysis","field":"Engineering","cited_by":4,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"Advanced Micro Devices (Canada)","funders":"","keywords":"Materials science; Chemical-mechanical planarization; Polishing; Plasma; Integrated circuit; Controllability; Optoelectronics; Nanotechnology; Focused ion beam; Process (computing); Computer science; Ion; Chemistry; Physics; Composite material","authors":[{"name":"D. Zudhistira","is_ca":true},{"name":"M. S. Wei","is_ca":true},{"name":"V. Narang","is_ca":true},{"name":"J.M. Chin","is_ca":true},{"name":"M. Šikula Sharang","is_ca":false},{"name":"Karel Novotný","is_ca":false},{"name":"G. Goupil","is_ca":false},{"name":"Jozef Vincenc Oboňa","is_ca":false},{"name":"Andreas Rummel","is_ca":false},{"name":"M. Kemmler","is_ca":false},{"name":"Stephan Kleindiek","is_ca":false}],"retraction":null,"screen_n_in":null,"score":{"opus":0.01191165191663113,"gpt":0.2326723709529978,"spread":0.2207607190363666,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"codex-gemma-dda1882f352a","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0004289382,0.0002410073,0.0004709266,0.0006510895,0.0001229175,0.00007993791,0.0001494504,0.0001383671,0.000003321291],"category_scores_gemma":[0.00053635,0.000221922,0.0002147356,0.0008613203,0.0001438628,0.0002962874,0.00002435153,0.0001384738,3.192419e-7],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0001123995,"about_ca_system_score_gemma":0.00001709154,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.0003885838,"about_ca_topic_score_gemma":0.003317812,"domain_scores_codex":[0.9986107,0.000008149137,0.0005938414,0.0003943586,0.0001868297,0.0002061189],"domain_scores_gemma":[0.9982512,0.0002762411,0.0002634492,0.00008719386,0.001065275,0.0000566425],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","study_design_scores_codex":[0.00006402052,0.00006691634,0.09284573,0.0004568734,0.001441629,1.908232e-7,0.002614572,0.002282324,0.8951687,0.002559626,0.0000941075,0.002405276],"study_design_scores_gemma":[0.001008451,0.0007622495,0.009722132,0.0005063774,0.001958353,0.00000895343,0.00139884,0.3691912,0.6128606,0.001759419,0.000281298,0.0005421175],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","genre_codex":"empirical","genre_gemma":"empirical","genre_scores_codex":[0.9950616,0.0000622288,0.003601752,0.00009723163,0.00007087539,0.0003159861,0.0000289618,0.00008288229,0.0006785061],"genre_scores_gemma":[0.995092,0.00002399395,0.004575992,0.00001393169,0.0001133139,0.000100111,0.0000463975,0.00002453194,0.000009736074],"genre_candidate":"empirical","genre_consensus":"empirical","teacher_disagreement_score":0.3669089,"threshold_uncertainty_score":0.9049718,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W3115278549","doi":"10.31399/asm.cp.istfa2000p0017","title":"Application of Single Contact Optical Beam Induced Currents (SCOBIC) for Backside Failure Analysis","year":2000,"lang":"en","type":"article","venue":"Proceedings - International Symposium for Testing and Failure Analysis","topic":"Integrated Circuits and Semiconductor Failure Analysis","field":"Engineering","cited_by":4,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"Advanced Micro Devices (Canada)","funders":"","keywords":"NMOS logic; Materials science; Optoelectronics; Substrate (aquarium); CMOS; Layer (electronics); Die (integrated circuit); Beam (structure); Power (physics); Electronic engineering; Electrical engineering; Optics; Engineering; Nanotechnology; Transistor; Voltage; Physics","authors":[{"name":"Murugesan Palaniappan","is_ca":false},{"name":"J.M. Chin","is_ca":false},{"name":"J.C.H. Phang","is_ca":false},{"name":"D.S.H. Chan","is_ca":false},{"name":"C.E. Soh","is_ca":true},{"name":"G. Gilfeather","is_ca":false}],"retraction":null,"screen_n_in":null,"score":{"opus":0.01386571004556713,"gpt":0.2342617746419134,"spread":0.2203960645963463,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"codex-gemma-dda1882f352a","candidate_categories":["metaepi_narrow"],"consensus_categories":[],"category_scores_codex":[0.000313612,0.0003778446,0.0008004631,0.0008303048,0.0001617001,0.0002205414,0.0003822123,0.0002320205,0.00008880602],"category_scores_gemma":[0.0002205167,0.0003632537,0.0007083922,0.00242596,0.00005180826,0.0003891048,0.00002217506,0.000199384,0.000003944502],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0001302986,"about_ca_system_score_gemma":0.00001600604,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.0001765907,"about_ca_topic_score_gemma":0.0001334561,"domain_scores_codex":[0.997798,0.000006132693,0.000818936,0.0006097502,0.0003646544,0.0004024752],"domain_scores_gemma":[0.9981368,0.0003507764,0.0002506631,0.0001752377,0.0009311803,0.0001553257],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"bench_or_experimental","study_design_gemma":"simulation_or_modeling","study_design_scores_codex":[0.00008503744,0.0002833768,0.06394494,0.0002631588,0.02563356,6.860426e-7,0.0007474212,0.02955398,0.8635591,0.002534198,0.0007686497,0.01262594],"study_design_scores_gemma":[0.001371048,0.0003641418,0.002371456,0.0001022665,0.02696156,0.00001138295,0.0006441941,0.8859097,0.07258474,0.0007539805,0.007826405,0.001099059],"study_design_candidate":"bench_or_experimental","study_design_consensus":null,"genre_codex":"empirical","genre_gemma":"empirical","genre_scores_codex":[0.9653959,0.00008951256,0.03076755,0.00051131,0.00009951337,0.0005601489,0.0002917037,0.0002673911,0.002016962],"genre_scores_gemma":[0.9919738,0.0000183127,0.006866719,0.00003225196,0.0002233919,0.0002224485,0.0005003682,0.00004620407,0.0001165744],"genre_candidate":"empirical","genre_consensus":"empirical","teacher_disagreement_score":0.8563558,"threshold_uncertainty_score":0.9998819,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W3114386684","doi":"10.31399/asm.cp.istfa2004p0151","title":"A Novel Approach for Enhancing Critical FIB Imaging for Failure Analysis and Circuit Edit Applications","year":2004,"lang":"en","type":"article","venue":"Proceedings - International Symposium for Testing and Failure Analysis","topic":"Integrated Circuits and Semiconductor Failure Analysis","field":"Engineering","cited_by":4,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"Fibics (Canada)","funders":"","keywords":"Focused ion beam; Materials science; Secondary electrons; Optoelectronics; Electrical conductor; Electrode; Nanotechnology; Ion; Electron; Composite material; Chemistry","authors":[{"name":"Joseph B. Myers","is_ca":false},{"name":"Marsha Abramo","is_ca":false},{"name":"M. Anderson","is_ca":true},{"name":"Michael W. Phaneuf","is_ca":true}],"retraction":null,"screen_n_in":null,"score":{"opus":0.01262473594366124,"gpt":0.2373649772598703,"spread":0.2247402413162091,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"codex-gemma-dda1882f352a","candidate_categories":["metaepi_narrow"],"consensus_categories":[],"category_scores_codex":[0.0004715929,0.0004255663,0.000709726,0.001021236,0.0004997799,0.0006083974,0.0003260274,0.0001624751,0.00000792658],"category_scores_gemma":[0.0005427737,0.0004255266,0.0006234501,0.001950186,0.0001137636,0.0004983857,0.00004011137,0.0002174646,5.281795e-7],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0001771206,"about_ca_system_score_gemma":0.00003091726,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.0001493567,"about_ca_topic_score_gemma":0.0001949158,"domain_scores_codex":[0.9976302,0.000003415386,0.0006804677,0.0008518804,0.0002908656,0.0005431377],"domain_scores_gemma":[0.9975235,0.0005340973,0.0001787975,0.0001547698,0.001405599,0.0002031618],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"bench_or_experimental","study_design_gemma":"simulation_or_modeling","study_design_scores_codex":[0.00006405408,0.0004488139,0.02928554,0.001868467,0.03684077,0.000001446756,0.002494663,0.07903605,0.7746469,0.06901235,0.001176575,0.005124376],"study_design_scores_gemma":[0.001740533,0.0001061432,0.0002784075,0.00009301191,0.028091,0.00005483852,0.002315133,0.9448153,0.009079806,0.00644508,0.005741619,0.001239087],"study_design_candidate":"simulation_or_modeling","study_design_consensus":null,"genre_codex":"methods","genre_gemma":"empirical","genre_scores_codex":[0.006873314,0.000181668,0.9897025,0.001158666,0.00006914961,0.0007366819,0.0004691806,0.000276093,0.0005327512],"genre_scores_gemma":[0.8563402,0.00001507628,0.140877,0.00009810104,0.0005962288,0.001432707,0.0005125196,0.00006182615,0.00006635745],"genre_candidate":"methods","genre_consensus":null,"teacher_disagreement_score":0.8657793,"threshold_uncertainty_score":0.9998196,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W2342102170","doi":"10.31399/asm.cp.istfa2015p0065","title":"How Xe and Ga FIB Differ in Inducing Lateral Damage on TEM Samples","year":2015,"lang":"en","type":"article","venue":"Proceedings - International Symposium for Testing and Failure Analysis","topic":"Integrated Circuits and Semiconductor Failure Analysis","field":"Engineering","cited_by":3,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"Oxford Instruments (Canada)","funders":"","keywords":"Focused ion beam; Materials science; Ion beam; Beam (structure); Polishing; Lamella (surface anatomy); Amorphous solid; Ion; Ion beam deposition; Beam energy; Optics; Composite material; Chemistry; Crystallography; Physics","authors":[{"name":"Tomáš Hrnčíř","is_ca":false},{"name":"Jozef Vincenc Oboňa","is_ca":false},{"name":"Martin Petrenec","is_ca":false},{"name":"Jan Michalička","is_ca":false},{"name":"Christian Lång","is_ca":true}],"retraction":null,"screen_n_in":null,"score":{"opus":0.02949128919004832,"gpt":0.2252477563487647,"spread":0.1957564671587164,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"codex-gemma-dda1882f352a","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0002830035,0.0002725427,0.0003899228,0.0006110437,0.00008849418,0.000546172,0.0001773972,0.0001331013,0.000005677478],"category_scores_gemma":[0.0003226897,0.0002390335,0.0001118156,0.00074475,0.00004228532,0.0004129125,0.00003600653,0.0002440415,9.973571e-7],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0001180511,"about_ca_system_score_gemma":0.000009622023,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.0002177839,"about_ca_topic_score_gemma":0.0001352692,"domain_scores_codex":[0.9987313,0.000007121596,0.0003030611,0.0004127885,0.0002523895,0.0002933565],"domain_scores_gemma":[0.9991885,0.0001432805,0.00009207003,0.00008051599,0.0003551834,0.0001404856],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"observational","study_design_gemma":"simulation_or_modeling","study_design_scores_codex":[0.00005755565,0.0001023458,0.830806,0.0001971204,0.003578723,0.00001289141,0.00465749,0.009746899,0.1398038,0.00514891,0.002476748,0.003411587],"study_design_scores_gemma":[0.002545361,0.0003748266,0.03443094,0.0004416409,0.002549855,0.00005114665,0.004198251,0.927484,0.01251702,0.003077585,0.01062189,0.001707536],"study_design_candidate":"simulation_or_modeling","study_design_consensus":null,"genre_codex":"empirical","genre_gemma":"empirical","genre_scores_codex":[0.9962739,0.0000789155,0.0003794295,0.001409628,0.0000858308,0.0001255685,0.00004591187,0.0001370959,0.001463715],"genre_scores_gemma":[0.9975389,0.00001965317,0.001723179,0.00007406179,0.000196566,0.0000432299,0.00007164326,0.00003233418,0.0003004564],"genre_candidate":"empirical","genre_consensus":"empirical","teacher_disagreement_score":0.9177371,"threshold_uncertainty_score":0.9747502,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W3113127598","doi":"10.31399/asm.cp.istfa2017p0221","title":"Laser Voltage Tracing for Electrical Fault Isolation of Circuits Propagating Aperiodic Signals","year":2017,"lang":"en","type":"article","venue":"Proceedings - International Symposium for Testing and Failure Analysis","topic":"Integrated Circuits and Semiconductor Failure Analysis","field":"Engineering","cited_by":2,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"Advanced Micro Devices (Canada)","funders":"","keywords":"Aperiodic graph; Tracing; Debugging; Voltage; Laser; Fault (geology); Computer science; Electronic engineering; Electrical engineering; Engineering; Optics; Physics; Mathematics","authors":[{"name":"Venkat Krishnan Ravikumar","is_ca":true},{"name":"Gopinath Ranganathan","is_ca":true},{"name":"S.L. Phoa","is_ca":true},{"name":"K. L. Pey","is_ca":true},{"name":"Christopher Nemirow","is_ca":false},{"name":"Neel Leslie","is_ca":false}],"retraction":null,"screen_n_in":null,"score":{"opus":0.01701425069394562,"gpt":0.24475298382483,"spread":0.2277387331308843,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"codex-gemma-dda1882f352a","candidate_categories":["metaepi_narrow"],"consensus_categories":[],"category_scores_codex":[0.0004312045,0.000264985,0.0005022145,0.0003907157,0.0005078284,0.0004944519,0.0004505602,0.0001580196,0.00001460272],"category_scores_gemma":[0.001278947,0.0002500514,0.0003422188,0.0004233763,0.00006673121,0.0005611457,0.00003620098,0.0001767247,8.231279e-7],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.00007665133,"about_ca_system_score_gemma":0.00001897656,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.00009288499,"about_ca_topic_score_gemma":0.00003435715,"domain_scores_codex":[0.9983929,0.000004098278,0.0005934535,0.0004097374,0.0002731112,0.0003267244],"domain_scores_gemma":[0.9979324,0.0002530882,0.0004422738,0.0001567923,0.001126499,0.00008895406],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"bench_or_experimental","study_design_gemma":"simulation_or_modeling","study_design_scores_codex":[0.00001582161,0.00004959172,0.04233606,0.0002325832,0.003131255,7.861325e-7,0.0005996591,0.006121387,0.9336741,0.0006571094,0.0004242339,0.01275744],"study_design_scores_gemma":[0.0004984645,0.0001046233,0.0008431576,0.0001036053,0.001881457,0.00000685246,0.0002023652,0.9437871,0.05118294,0.0006566856,0.0003782117,0.0003545236],"study_design_candidate":"bench_or_experimental","study_design_consensus":null,"genre_codex":"empirical","genre_gemma":"empirical","genre_scores_codex":[0.8521107,0.0001189743,0.1423243,0.0005594646,0.0001899227,0.0006948024,0.0001702206,0.000268642,0.003562925],"genre_scores_gemma":[0.9933805,0.00001408596,0.005898614,0.00002421967,0.0002771558,0.0001313403,0.00007101982,0.00004014002,0.0001629383],"genre_candidate":"empirical","genre_consensus":"empirical","teacher_disagreement_score":0.9376657,"threshold_uncertainty_score":0.9999952,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W2583649081","doi":"10.31399/asm.cp.istfa2016p0382","title":"Patterning in an Imperfect World—Limitations of Focused Ion Beam Systems and Their Effects on Advanced Applications at the 14 nm Process Node","year":2016,"lang":"en","type":"article","venue":"Proceedings - International Symposium for Testing and Failure Analysis","topic":"Integrated Circuits and Semiconductor Failure Analysis","field":"Engineering","cited_by":2,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"Fibics (Canada)","funders":"","keywords":"Limiting; Process (computing); Node (physics); Computer science; Imperfect; Dimension (graph theory); Nanotechnology; Process control; Materials science; Computer engineering; Engineering; Mechanical engineering; Mathematics","authors":[{"name":"Christopher M. Scheffler","is_ca":false},{"name":"Richard H. Livengood","is_ca":false},{"name":"Haripriya E. Prakasam","is_ca":false},{"name":"Michael W. Phaneuf","is_ca":true},{"name":"Ken Lagarec","is_ca":true}],"retraction":null,"screen_n_in":null,"score":{"opus":0.0152255067206852,"gpt":0.2292051184566174,"spread":0.2139796117359322,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"codex-gemma-dda1882f352a","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0002682318,0.0002269193,0.0003297171,0.0004888454,0.0001681707,0.0001143731,0.000204062,0.00007096825,0.000003053631],"category_scores_gemma":[0.0001934489,0.0001386216,0.0001059565,0.0008987388,0.00005362534,0.0002952986,0.00002206422,0.0001207272,8.621528e-7],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0001048888,"about_ca_system_score_gemma":0.000008051092,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.00005192641,"about_ca_topic_score_gemma":0.0003004149,"domain_scores_codex":[0.9988574,0.00001209904,0.000382725,0.0003616275,0.0001736941,0.0002124649],"domain_scores_gemma":[0.9982669,0.0009215731,0.0001813773,0.0001149066,0.000450695,0.00006457261],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"bench_or_experimental","study_design_gemma":"simulation_or_modeling","study_design_scores_codex":[0.00004033338,0.00006629078,0.1426766,0.0002892581,0.001451744,4.619703e-7,0.001786804,0.02617542,0.7994754,0.001086331,0.00006813,0.02688327],"study_design_scores_gemma":[0.004611443,0.0008071018,0.01859795,0.002246666,0.004115241,0.00003475572,0.004689423,0.6437372,0.3118861,0.002402766,0.004732733,0.00213861],"study_design_candidate":"bench_or_experimental","study_design_consensus":null,"genre_codex":"empirical","genre_gemma":"empirical","genre_scores_codex":[0.9930558,0.000165219,0.005221867,0.0004667042,0.00005480075,0.0004384297,0.00006534743,0.00009786667,0.0004339937],"genre_scores_gemma":[0.9989055,0.00004633746,0.000235579,0.00002887479,0.0001030647,0.000519591,0.00004148947,0.00002920168,0.0000903084],"genre_candidate":"empirical","genre_consensus":"empirical","teacher_disagreement_score":0.6175618,"threshold_uncertainty_score":0.5652824,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W3114038705","doi":"10.31399/asm.cp.istfa2002p0553","title":"Advanced sub 0.13µm Cu Devices – Failure Analysis and Circuit Edit With Improved FIB Chemical Processes and Beam Characteristics","year":2002,"lang":"en","type":"article","venue":"Proceedings - International Symposium for Testing and Failure Analysis","topic":"Integrated Circuits and Semiconductor Failure Analysis","field":"Engineering","cited_by":2,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"Fibics (Canada)","funders":"","keywords":"Etching (microfabrication); Materials science; Focused ion beam; Dielectric; Ion beam; Optoelectronics; Isotropic etching; Beam (structure); Nanotechnology; Ion; Optics; Chemistry; Layer (electronics)","authors":[{"name":"J. Casey","is_ca":false},{"name":"Thomas J. Gannon","is_ca":false},{"name":"Alex Krechmer","is_ca":false},{"name":"David Monforte","is_ca":false},{"name":"Nicholas Antoniou","is_ca":false},{"name":"Neil Bassom","is_ca":false},{"name":"Chuong Huynh","is_ca":false},{"name":"Brian Silva","is_ca":false},{"name":"Raymond Hill","is_ca":false},{"name":"George Gu","is_ca":false},{"name":"Valery Ray","is_ca":false},{"name":"A. Saxonis","is_ca":false},{"name":"Clive Chandler","is_ca":false},{"name":"Michael Megorden","is_ca":false},{"name":"Peter Carleson","is_ca":false},{"name":"Michael W. Phaneuf","is_ca":true},{"name":"Jian Li","is_ca":true}],"retraction":null,"screen_n_in":null,"score":{"opus":0.008604323796260489,"gpt":0.1916615396333342,"spread":0.1830572158370737,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"codex-gemma-dda1882f352a","candidate_categories":["metaepi_narrow"],"consensus_categories":[],"category_scores_codex":[0.0001864731,0.0005044682,0.0008141794,0.0007463843,0.0002489022,0.0006274497,0.0002621655,0.000214162,0.00003788061],"category_scores_gemma":[0.0003214102,0.0004353999,0.0001885794,0.002456388,0.0001409925,0.00065792,0.00005184528,0.0003080863,0.000001256107],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.00007384443,"about_ca_system_score_gemma":0.00001375403,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.000082794,"about_ca_topic_score_gemma":0.0002497915,"domain_scores_codex":[0.9978351,0.000005396852,0.0005751742,0.0007839662,0.0003447698,0.0004555825],"domain_scores_gemma":[0.9979482,0.0002556233,0.0002887633,0.0001358061,0.001141871,0.0002297671],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"bench_or_experimental","study_design_gemma":"simulation_or_modeling","study_design_scores_codex":[0.00006109401,0.000161748,0.4015513,0.001201481,0.02877968,0.000009722566,0.002315707,0.0007509084,0.5531942,0.000307975,0.0005098523,0.01115639],"study_design_scores_gemma":[0.002774089,0.0005547082,0.01058693,0.0005062387,0.052988,0.0002134644,0.002758594,0.8664647,0.05142215,0.0003963948,0.007813991,0.00352068],"study_design_candidate":"simulation_or_modeling","study_design_consensus":null,"genre_codex":"empirical","genre_gemma":"empirical","genre_scores_codex":[0.9948721,0.0004802189,0.002680433,0.0006506728,0.00005230863,0.0002738294,0.0001764023,0.0002988162,0.000515227],"genre_scores_gemma":[0.9956993,0.0001921671,0.003255626,0.000076652,0.0002812017,0.0001163089,0.000194795,0.00005565083,0.0001282934],"genre_candidate":"empirical","genre_consensus":"empirical","teacher_disagreement_score":0.8657138,"threshold_uncertainty_score":0.9998098,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W3117325263","doi":"10.31399/asm.cp.istfa2002p0747","title":"The Influence of Optical Beams on Semiconductor Devices During Failure Analysis","year":2002,"lang":"en","type":"article","venue":"Proceedings - International Symposium for Testing and Failure Analysis","topic":"Integrated Circuits and Semiconductor Failure Analysis","field":"Engineering","cited_by":2,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"Advanced Micro Devices (Canada)","funders":"","keywords":"Materials science; Optoelectronics; CMOS; Semiconductor; Transistor; Laser; Wavelength; Semiconductor laser theory; Laser beams; Optics; Electrical engineering; Engineering; Physics","authors":[{"name":"Charles Zhang","is_ca":true},{"name":"M. M. Thayer","is_ca":true},{"name":"Lowell Herlinger","is_ca":true},{"name":"G. Dabney","is_ca":true},{"name":"Manuel González","is_ca":true}],"retraction":null,"screen_n_in":null,"score":{"opus":0.01039218203180272,"gpt":0.2097385222427077,"spread":0.1993463402109049,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"codex-gemma-dda1882f352a","candidate_categories":["metaepi_narrow"],"consensus_categories":[],"category_scores_codex":[0.000305385,0.0003664949,0.0006009472,0.0007467106,0.0003760271,0.000358239,0.0005419233,0.0001697104,0.00004772899],"category_scores_gemma":[0.0004215882,0.0002780779,0.0005395105,0.002817964,0.0001404987,0.0003835205,0.0000472683,0.0003170418,0.000005447483],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0001017196,"about_ca_system_score_gemma":0.000006548059,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.00008949691,"about_ca_topic_score_gemma":0.0001491949,"domain_scores_codex":[0.9978391,0.000009418012,0.0007215549,0.000511743,0.0004903935,0.0004277845],"domain_scores_gemma":[0.9979655,0.0004812273,0.0002711119,0.0002055624,0.0009366715,0.0001399778],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"bench_or_experimental","study_design_gemma":"simulation_or_modeling","study_design_scores_codex":[0.00004275097,0.0001480679,0.2156217,0.0002582514,0.0421063,0.000004917612,0.001729404,0.2741258,0.4592941,0.004362121,0.001048989,0.001257583],"study_design_scores_gemma":[0.001253076,0.0002976499,0.03131121,0.0002727812,0.02960247,0.00004342058,0.002606428,0.8753536,0.05018591,0.0004843955,0.006799432,0.001789671],"study_design_candidate":"simulation_or_modeling","study_design_consensus":null,"genre_codex":"empirical","genre_gemma":"empirical","genre_scores_codex":[0.9969098,0.0001604219,0.0001736923,0.0008248207,0.00005741808,0.0001571023,0.00006001022,0.0001667222,0.001490002],"genre_scores_gemma":[0.9979777,0.00009461417,0.001298878,0.00004498478,0.0001628706,0.0000654499,0.00003259994,0.00003505946,0.000287873],"genre_candidate":"empirical","genre_consensus":"empirical","teacher_disagreement_score":0.6012278,"threshold_uncertainty_score":0.9999672,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W2471460436","doi":"10.31399/asm.cp.istfa2013p0118","title":"Implications of Helium and Neon Ion Beam Chemistry for Advanced Circuit Editing","year":2013,"lang":"en","type":"article","venue":"Proceedings - International Symposium for Testing and Failure Analysis","topic":"Integrated Circuits and Semiconductor Failure Analysis","field":"Engineering","cited_by":2,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"Fibics (Canada)","funders":"","keywords":"Neon; Sputtering; Etching (microfabrication); Ion beam; Helium; Focused ion beam; Optoelectronics; Deposition (geology); Materials science; Ion source; Ion; Dielectric; Nanotechnology; Engineering physics; Chemistry; Atomic physics; Thin film; Argon; Physics","authors":[{"name":"Huimeng Wu","is_ca":false},{"name":"David C. Ferranti","is_ca":false},{"name":"Lewis Stern","is_ca":false},{"name":"Deying Xia","is_ca":false},{"name":"M. W. Phaneuf","is_ca":true}],"retraction":null,"screen_n_in":null,"score":{"opus":0.01004632781496424,"gpt":0.211632194153473,"spread":0.2015858663385088,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"codex-gemma-dda1882f352a","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0001487172,0.0002042915,0.0003340746,0.0001938195,0.0001436676,0.0001588961,0.0001724529,0.0001137913,0.00002897737],"category_scores_gemma":[0.0002639491,0.0002005156,0.000174044,0.0005149993,0.00004943746,0.0003413109,0.00002329926,0.0001104955,6.175276e-7],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.00005214603,"about_ca_system_score_gemma":0.000008218266,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.0000846866,"about_ca_topic_score_gemma":0.000008568477,"domain_scores_codex":[0.9988633,0.0000015082,0.0004286508,0.0003352668,0.0001333172,0.0002379655],"domain_scores_gemma":[0.99838,0.0001867438,0.0001900183,0.00008106943,0.001072248,0.00008988615],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"bench_or_experimental","study_design_gemma":"simulation_or_modeling","study_design_scores_codex":[0.000003374774,0.00001939441,0.01469252,0.0002599641,0.001193435,4.349912e-8,0.0002773327,0.001472467,0.9767048,0.0006334349,0.000695931,0.004047344],"study_design_scores_gemma":[0.001883672,0.0002265374,0.00480967,0.0003740961,0.006185739,0.00004688569,0.004194509,0.625046,0.3363524,0.01201191,0.007389246,0.00147935],"study_design_candidate":"bench_or_experimental","study_design_consensus":null,"genre_codex":"empirical","genre_gemma":"empirical","genre_scores_codex":[0.9797799,0.0002466316,0.0127149,0.001478607,0.0001104918,0.0005475237,0.0001859602,0.0002372368,0.004698744],"genre_scores_gemma":[0.9955185,0.00003439839,0.003488869,0.00003092438,0.0002647309,0.0003085375,0.0001355047,0.00002961743,0.0001889329],"genre_candidate":"empirical","genre_consensus":"empirical","teacher_disagreement_score":0.6403524,"threshold_uncertainty_score":0.8176788,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W2751758248","doi":"10.31399/asm.cp.istfa2017p0446","title":"High Resolution Localization Using Lock-in Based Electron Beam Methods","year":2017,"lang":"en","type":"article","venue":"Proceedings - International Symposium for Testing and Failure Analysis","topic":"Integrated Circuits and Semiconductor Failure Analysis","field":"Engineering","cited_by":1,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"Infineon Technologies (Canada)","funders":"","keywords":"Cathode ray; Materials science; Beam (structure); Lock (firearm); Resolution (logic); Electron; Electron beam-induced current; Transistor; Root cause; Optics; Optoelectronics; Image resolution; Computer science; Physics; Electrical engineering; Engineering; Silicon; Voltage","authors":[{"name":"Felix Rolf","is_ca":true},{"name":"Christian Hollerith","is_ca":true},{"name":"Christian Feuerbaum","is_ca":true}],"retraction":null,"screen_n_in":null,"score":{"opus":0.02120122472125914,"gpt":0.2870937120421192,"spread":0.2658924873208601,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"codex-gemma-dda1882f352a","candidate_categories":["metaepi_narrow"],"consensus_categories":[],"category_scores_codex":[0.0005803894,0.000247969,0.0003851129,0.0005952068,0.0004092314,0.0005081957,0.0003311266,0.0001626792,0.00001557032],"category_scores_gemma":[0.0004998868,0.0002484699,0.0001805594,0.0006289333,0.00005768357,0.000499131,0.00002916845,0.0001958051,8.473799e-7],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.00022928,"about_ca_system_score_gemma":0.00001954809,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.001015217,"about_ca_topic_score_gemma":0.0001979362,"domain_scores_codex":[0.9985937,0.00001050231,0.0004382943,0.0004106745,0.0002190031,0.0003277606],"domain_scores_gemma":[0.9988537,0.0001159536,0.0002422772,0.000157578,0.0005562098,0.00007426496],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"simulation_or_modeling","study_design_gemma":"simulation_or_modeling","study_design_scores_codex":[0.00003254708,0.000058774,0.1072543,0.0001215105,0.001870119,0.000002221154,0.0002251544,0.5215828,0.3642642,0.002031119,0.0002826808,0.002274504],"study_design_scores_gemma":[0.0003541943,0.00003240674,0.00114863,0.00006471156,0.001026357,0.00000386843,0.00006405188,0.9714716,0.02420374,0.0006878707,0.0006585657,0.0002839825],"study_design_candidate":"simulation_or_modeling","study_design_consensus":"simulation_or_modeling","genre_codex":"empirical","genre_gemma":"empirical","genre_scores_codex":[0.5966484,0.000170542,0.3997075,0.0007372797,0.0003318769,0.0003538016,0.0000486377,0.0003189782,0.001682961],"genre_scores_gemma":[0.9554313,0.00001618428,0.0441128,0.00004133223,0.0001929355,0.00003828737,0.00007945794,0.00003467446,0.00005299822],"genre_candidate":"empirical","genre_consensus":"empirical","teacher_disagreement_score":0.4498888,"threshold_uncertainty_score":0.9999968,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W4388494366","doi":"10.31399/asm.cp.istfa2023p0500","title":"A Correlative Study of Silicon Carbide Power Devices Using Atom Probe Tomography and Transmission Electron Microscopy","year":2023,"lang":"en","type":"article","venue":"Proceedings - International Symposium for Testing and Failure Analysis","topic":"Advanced Materials Characterization Techniques","field":"Engineering","cited_by":1,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"McMaster University","funders":"","keywords":"Atom probe; Dopant; Materials science; Transmission electron microscopy; Silicon carbide; Semiconductor device; Silicon; Optoelectronics; Transistor; Molecular physics; Nanotechnology; Doping; Chemistry; Electrical engineering; Metallurgy","authors":[{"name":"Ramya Cuduvally","is_ca":true},{"name":"Bavley Guerguis","is_ca":true},{"name":"Brian Langelier","is_ca":true},{"name":"Nabil Bassim","is_ca":true},{"name":"Carmen M. Andrei","is_ca":true},{"name":"Travis Casagrande","is_ca":true},{"name":"Gabriel Arcuri","is_ca":true},{"name":"Stephen Russell","is_ca":false}],"retraction":null,"screen_n_in":null,"score":{"opus":0.01072765245645753,"gpt":0.2704197816098607,"spread":0.2596921291534032,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"codex-gemma-dda1882f352a","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0001419232,0.0001590827,0.0002607595,0.0004298307,0.00008803626,0.00007990841,0.00008787186,0.0000591877,0.000002696556],"category_scores_gemma":[0.00003517734,0.0001558934,0.00005369331,0.0008730302,0.00002629099,0.0002725639,0.00002850527,0.00006668547,1.188008e-7],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.00002910196,"about_ca_system_score_gemma":0.000004608652,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.00005163593,"about_ca_topic_score_gemma":0.000006538182,"domain_scores_codex":[0.9991399,0.000004904186,0.0003115104,0.000251595,0.0001402542,0.0001518044],"domain_scores_gemma":[0.9994292,0.00008164716,0.0001475134,0.00003958507,0.0002594855,0.00004254315],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","study_design_scores_codex":[0.00002060623,0.0000280593,0.1067816,0.0001016544,0.000411135,3.21157e-7,0.001470653,0.0007890776,0.8901758,0.00004966218,0.000006986081,0.0001645113],"study_design_scores_gemma":[0.001213904,0.0007189247,0.05025921,0.0004036749,0.001905503,0.00001506638,0.002123484,0.2883074,0.6527296,0.0008016597,0.0007374201,0.0007841295],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","genre_codex":"empirical","genre_gemma":"empirical","genre_scores_codex":[0.9911998,0.00003732127,0.007947193,0.0000432738,0.00003316262,0.0003399812,0.00002386773,0.0003177131,0.00005771934],"genre_scores_gemma":[0.9884042,0.00002468294,0.01141245,0.000006831814,0.00002523708,0.00006026338,0.00002702928,0.00002662891,0.00001271857],"genre_candidate":"empirical","genre_consensus":"empirical","teacher_disagreement_score":0.2875183,"threshold_uncertainty_score":0.635715,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W2525018093","doi":"10.31399/asm.cp.istfa2013p0243","title":"Physical and Electrical Performance Comparison of Identical 28 nm Qualcomm Telecommunication Die Produced by Samsung and TSMC","year":2013,"lang":"en","type":"article","venue":"Proceedings - International Symposium for Testing and Failure Analysis","topic":"Integrated Circuits and Semiconductor Failure Analysis","field":"Engineering","cited_by":1,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"Chipworks (Canada)","funders":"","keywords":"Die (integrated circuit); Static random-access memory; Characterization (materials science); Computer science; Competition (biology); Product (mathematics); Manufacturing engineering; Telecommunications; Electrical engineering; Materials science; Engineering; Mechanical engineering; Nanotechnology","authors":[{"name":"Anton Riley","is_ca":false},{"name":"Sean Zumwalt","is_ca":false},{"name":"Sinjin Dixon-Warren","is_ca":true},{"name":"G. Tomkins","is_ca":true}],"retraction":null,"screen_n_in":null,"score":{"opus":0.01204844523812396,"gpt":0.2454340059203482,"spread":0.2333855606822243,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"codex-gemma-dda1882f352a","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0002052824,0.0002148514,0.0004550368,0.0002410726,0.0001458763,0.0002065719,0.0001952162,0.00009431544,0.000007909855],"category_scores_gemma":[0.0002207372,0.0001925663,0.00009642632,0.0005125094,0.000092738,0.0004112179,0.00004935724,0.0002324456,0.000001097007],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.00004302766,"about_ca_system_score_gemma":0.000005730367,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.0001922084,"about_ca_topic_score_gemma":0.00001469042,"domain_scores_codex":[0.9987662,0.000009492308,0.0004565649,0.0003189004,0.0002200297,0.0002287687],"domain_scores_gemma":[0.9989214,0.000234677,0.0001572404,0.00009670381,0.0004937925,0.0000962105],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"bench_or_experimental","study_design_gemma":"simulation_or_modeling","study_design_scores_codex":[0.00001357402,0.0001355073,0.3036852,0.0001813695,0.001955807,9.707652e-8,0.001267333,0.0004847706,0.674677,0.0009536353,0.001111689,0.01553397],"study_design_scores_gemma":[0.0002960798,0.0001304943,0.006645329,0.00004575945,0.001125229,0.00000502999,0.0002860916,0.9619422,0.02865908,0.0002107683,0.0003598417,0.0002941193],"study_design_candidate":"simulation_or_modeling","study_design_consensus":null,"genre_codex":"empirical","genre_gemma":"empirical","genre_scores_codex":[0.9979562,0.0004486771,0.0005592122,0.0004411996,0.00002043281,0.0001770346,0.00001231866,0.00008222907,0.0003027425],"genre_scores_gemma":[0.9979284,0.0001373671,0.001655117,0.00001560525,0.0000801053,0.00006835087,0.00005078784,0.00002175401,0.00004249468],"genre_candidate":"empirical","genre_consensus":"empirical","teacher_disagreement_score":0.9614574,"threshold_uncertainty_score":0.7852626,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W2743252552","doi":"10.31399/asm.cp.istfa2008p0297","title":"Doping Profile Measurements in a 65-nm Commercial Product Using Atom Probe Tomography","year":2008,"lang":"en","type":"article","venue":"Proceedings - International Symposium for Testing and Failure Analysis","topic":"Advanced Materials Characterization Techniques","field":"Engineering","cited_by":1,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"Chipworks (Canada)","funders":"","keywords":"Atom probe; Doping; Dopant; Materials science; Resolution (logic); Atom (system on chip); Transistor; Image resolution; Optoelectronics; Microscopy; Tomography; Semiconductor; Analytical Chemistry (journal); Silicon; Optics; Nanotechnology; Computer science; Physics; Chemistry; Artificial intelligence","authors":[{"name":"L. Klibanov","is_ca":true},{"name":"Dick James","is_ca":true},{"name":"Dieter Isheim","is_ca":false}],"retraction":null,"screen_n_in":null,"score":{"opus":0.0381966071183536,"gpt":0.2582100440862681,"spread":0.2200134369679145,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"codex-gemma-dda1882f352a","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0002276471,0.0002182634,0.0003129306,0.0005334579,0.0001573195,0.0001019946,0.0001722719,0.00006671049,0.000008374758],"category_scores_gemma":[0.0001320672,0.0002331842,0.00009096704,0.0009822772,0.00004445441,0.0005063523,0.00004860448,0.0001063661,5.816219e-7],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0001113497,"about_ca_system_score_gemma":0.00001198568,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.00005315243,"about_ca_topic_score_gemma":0.00001210072,"domain_scores_codex":[0.9986946,0.000005908618,0.0004420966,0.0003508697,0.0002532052,0.0002533045],"domain_scores_gemma":[0.999263,0.0000357804,0.000158362,0.00006883759,0.0004186426,0.00005536596],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","study_design_scores_codex":[0.00001913247,0.00004123058,0.452049,0.0001521799,0.0003259574,9.729914e-7,0.000418629,0.001406851,0.5449699,0.00007061074,0.00005422871,0.0004913499],"study_design_scores_gemma":[0.00205997,0.0001745953,0.1181004,0.00087413,0.001166648,0.0001481755,0.0001927462,0.2785994,0.5928125,0.001113133,0.002714849,0.002043507],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","genre_codex":"empirical","genre_gemma":"empirical","genre_scores_codex":[0.9658782,0.00004252958,0.03228,0.000172197,0.0001354787,0.0005483068,0.00003824653,0.0004952921,0.0004096892],"genre_scores_gemma":[0.8665067,0.00001734072,0.132974,0.00002692771,0.0001897938,0.0001794605,0.00005376382,0.00003555001,0.0000164656],"genre_candidate":"empirical","genre_consensus":"empirical","teacher_disagreement_score":0.3339486,"threshold_uncertainty_score":0.9508976,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W3117171627","doi":"10.31399/asm.cp.istfa2007p0337","title":"Latch-Up Root Cause Analysis for New ASIC Design","year":2007,"lang":"en","type":"article","venue":"Proceedings - International Symposium for Testing and Failure Analysis","topic":"Integrated Circuits and Semiconductor Failure Analysis","field":"Engineering","cited_by":1,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"University of Waterloo","funders":"","keywords":"Interconnection; Application-specific integrated circuit; Root cause; Transistor; Wafer; Stress (linguistics); Guard (computer science); Computer science; Electronic engineering; Materials science; Electrical engineering; Optoelectronics; Engineering; Voltage; Reliability engineering; Telecommunications","authors":[{"name":"W. Danielak","is_ca":false},{"name":"Wagner Fontes dos Reis Machado","is_ca":false},{"name":"M. Jaffer","is_ca":false},{"name":"Sebastian M. Waldstein","is_ca":false},{"name":"A. Jordan","is_ca":false},{"name":"Manoj Sachdev","is_ca":true},{"name":"D. Li","is_ca":true}],"retraction":null,"screen_n_in":null,"score":{"opus":0.03024642475217485,"gpt":0.2534931092278402,"spread":0.2232466844756654,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"codex-gemma-dda1882f352a","candidate_categories":["metaepi_narrow"],"consensus_categories":[],"category_scores_codex":[0.000884466,0.000417362,0.000703098,0.001394871,0.0002541302,0.0004088592,0.0003877971,0.0002251541,0.00005644582],"category_scores_gemma":[0.0004450852,0.0003969622,0.0007292847,0.00331833,0.0000458724,0.0003985867,0.00002911899,0.000215877,0.000003718193],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0001730223,"about_ca_system_score_gemma":0.00003074296,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.0003310369,"about_ca_topic_score_gemma":0.0006073425,"domain_scores_codex":[0.9976884,0.000005901122,0.0007312361,0.0006285529,0.0003625976,0.0005833621],"domain_scores_gemma":[0.9976994,0.0006116737,0.0002290039,0.0001546717,0.001035679,0.0002695592],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"observational","study_design_gemma":"simulation_or_modeling","study_design_scores_codex":[0.0003166473,0.0002043284,0.3945282,0.0003495008,0.1609581,0.00001235352,0.004236472,0.1770833,0.2077512,0.0102417,0.02847203,0.01584619],"study_design_scores_gemma":[0.001336775,0.0002052765,0.003863818,0.00005881901,0.04316958,0.0000206386,0.0007895536,0.9137115,0.01644548,0.002330235,0.01675738,0.001310895],"study_design_candidate":"simulation_or_modeling","study_design_consensus":null,"genre_codex":"methods","genre_gemma":"empirical","genre_scores_codex":[0.1108288,0.000214049,0.8851875,0.0007507231,0.0003016033,0.0005113276,0.0000905963,0.0005182659,0.001597102],"genre_scores_gemma":[0.9659342,0.00002125222,0.03158835,0.0000773737,0.0005542526,0.00007764832,0.0002206173,0.00006347139,0.001462807],"genre_candidate":"empirical","genre_consensus":null,"teacher_disagreement_score":0.8551054,"threshold_uncertainty_score":0.9998482,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W4388506965","doi":"10.31399/asm.cp.istfa2023p0387","title":"FIB-SEM Tomography Acquisition and Data Processing Optimization for Logic and Memory Structures","year":2023,"lang":"en","type":"article","venue":"Proceedings - International Symposium for Testing and Failure Analysis","topic":"Integrated Circuits and Semiconductor Failure Analysis","field":"Engineering","cited_by":1,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"Fibics (Canada)","funders":"","keywords":"Distortion (music); Data acquisition; Computer science; Focused ion beam; Metrology; Resolution (logic); Image resolution; Electronic engineering; Computer engineering; Artificial intelligence; Computer hardware; Computer vision; Optics; Engineering","authors":[{"name":"Heiko Stegmann","is_ca":false},{"name":"Alexandre Laquerre","is_ca":true}],"retraction":null,"screen_n_in":null,"score":{"opus":0.02564927015598459,"gpt":0.2609055755951613,"spread":0.2352563054391767,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"codex-gemma-dda1882f352a","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0003218785,0.0002261068,0.0002957527,0.0006020652,0.0002796065,0.0004815689,0.0002131444,0.0001218377,0.000009153245],"category_scores_gemma":[0.0001807158,0.000207242,0.00008128221,0.001098774,0.00005997538,0.0005817249,0.00006911942,0.0001009047,2.350647e-7],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.00002479207,"about_ca_system_score_gemma":0.000007986071,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.00003469169,"about_ca_topic_score_gemma":0.00001606404,"domain_scores_codex":[0.9987434,0.000004023032,0.0003141993,0.0005212058,0.000174671,0.0002424846],"domain_scores_gemma":[0.9990753,0.0001530128,0.0001216927,0.00009917669,0.0004707442,0.00008007626],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"simulation_or_modeling","study_design_gemma":"simulation_or_modeling","study_design_scores_codex":[0.0002113426,0.0001294305,0.1286643,0.004548968,0.01910075,0.00000944156,0.006683047,0.4477232,0.2659815,0.009087261,0.01736243,0.1004983],"study_design_scores_gemma":[0.0002958647,0.00004028031,0.0007047062,0.00005008048,0.001429376,0.00001178298,0.0005475648,0.9940907,0.0005347859,0.00151358,0.0005153099,0.0002659264],"study_design_candidate":"simulation_or_modeling","study_design_consensus":"simulation_or_modeling","genre_codex":"empirical","genre_gemma":"empirical","genre_scores_codex":[0.8687871,0.002114156,0.119578,0.003548989,0.0003572235,0.001312793,0.001193946,0.00178609,0.00132173],"genre_scores_gemma":[0.9756913,0.0001684346,0.02267719,0.00006703857,0.0002265052,0.00007456911,0.001004586,0.00003517811,0.00005522717],"genre_candidate":"empirical","genre_consensus":"empirical","teacher_disagreement_score":0.5463675,"threshold_uncertainty_score":0.8451083,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W2337755335","doi":"10.31399/asm.cp.istfa2015p0378","title":"Analysis Approach on DMOS Transistor Vth Mismatch Due to Trapped Charges","year":2015,"lang":"en","type":"article","venue":"Proceedings - International Symposium for Testing and Failure Analysis","topic":"Integrated Circuits and Semiconductor Failure Analysis","field":"Engineering","cited_by":1,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"Infineon Technologies (Canada)","funders":"","keywords":"Transistor; Threshold voltage; Voltage; Sense (electronics); Static induction transistor; Electrical engineering; Materials science; Multiple-emitter transistor; Optoelectronics; Electronic engineering; Engineering","authors":[{"name":"Hashim Ismail","is_ca":false},{"name":"Ang Chung Keow","is_ca":false},{"name":"Kenny Gan Chye Siong","is_ca":true}],"retraction":null,"screen_n_in":null,"score":{"opus":0.02417713124025767,"gpt":0.2287427077559361,"spread":0.2045655765156784,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"codex-gemma-dda1882f352a","candidate_categories":["metaepi_narrow"],"consensus_categories":[],"category_scores_codex":[0.0005138754,0.0004470051,0.0008427406,0.001493425,0.0001680818,0.0003680354,0.0004392628,0.0001892909,0.00002865649],"category_scores_gemma":[0.0002418872,0.0004075013,0.0005982557,0.003869305,0.00004167396,0.0002746912,0.00002193976,0.0002544346,0.000008647665],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.00019689,"about_ca_system_score_gemma":0.0000217507,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.0002283717,"about_ca_topic_score_gemma":0.00008260459,"domain_scores_codex":[0.9976525,0.00001142026,0.0005921117,0.0007239677,0.0005602657,0.0004597875],"domain_scores_gemma":[0.9981799,0.0001297432,0.0001364819,0.0001783219,0.0009790318,0.0003964977],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"simulation_or_modeling","study_design_gemma":"simulation_or_modeling","study_design_scores_codex":[0.0004029433,0.0008100465,0.1171831,0.0005723191,0.1317898,0.00002668258,0.02553888,0.5470757,0.1317643,0.007638313,0.02899174,0.008206226],"study_design_scores_gemma":[0.0009792445,0.000272657,0.001081625,0.0000539034,0.01851522,0.00002537863,0.002617989,0.956637,0.004530859,0.0003154709,0.01370363,0.001267073],"study_design_candidate":"simulation_or_modeling","study_design_consensus":"simulation_or_modeling","genre_codex":"empirical","genre_gemma":"empirical","genre_scores_codex":[0.9041398,0.0002212477,0.06203954,0.003467424,0.0003710054,0.0008472558,0.0004709639,0.001103272,0.02733952],"genre_scores_gemma":[0.9890205,0.000009665817,0.009489558,0.0002022292,0.0003081252,0.0001899953,0.000287063,0.00005639605,0.0004364318],"genre_candidate":"empirical","genre_consensus":"empirical","teacher_disagreement_score":0.4095612,"threshold_uncertainty_score":0.9998377,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W2591188832","doi":"10.31399/asm.cp.istfa2012p0455","title":"Fabrication and Characterization of Helium and Neon Ion Deposited Platinum Wires for Circuit Edit Applications","year":2012,"lang":"en","type":"article","venue":"Proceedings - International Symposium for Testing and Failure Analysis","topic":"Integrated Circuits and Semiconductor Failure Analysis","field":"Engineering","cited_by":1,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"Fibics (Canada)","funders":"","keywords":"Materials science; Nanolithography; Ion beam; Focused ion beam; Neon; Platinum; Fabrication; Ion beam-assisted deposition; Deposition (geology); Nanotechnology; Ion; Dielectric; Ion beam deposition; Electrical resistivity and conductivity; Optoelectronics; Ion source; Conductivity; Electrical engineering; Atomic physics; Chemistry; Argon; Physics","authors":[{"name":"William B. Thompson","is_ca":false},{"name":"Lewis Stern","is_ca":false},{"name":"Huimeng Wu","is_ca":false},{"name":"Dave Ferranti","is_ca":false},{"name":"Deying Xia","is_ca":false},{"name":"Fouzia Khanom","is_ca":false},{"name":"Philip D. Rack","is_ca":false},{"name":"Carlos Gonzales","is_ca":false},{"name":"Michael W. Phaneuf","is_ca":true}],"retraction":null,"screen_n_in":null,"score":{"opus":0.01247026822303813,"gpt":0.215618957220003,"spread":0.2031486889969648,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"codex-gemma-dda1882f352a","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0002054626,0.0001803438,0.0002781756,0.0003489862,0.0001502356,0.0001237664,0.0000920347,0.0001133665,0.000004016404],"category_scores_gemma":[0.0001063708,0.0001774463,0.00008620357,0.0005504485,0.00004447034,0.0004494155,0.00001874202,0.00007773841,2.736542e-7],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.00003849842,"about_ca_system_score_gemma":0.000005157518,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.00004719571,"about_ca_topic_score_gemma":0.000009099332,"domain_scores_codex":[0.9990279,0.000003825897,0.0003722542,0.0002522709,0.0001414446,0.000202318],"domain_scores_gemma":[0.9988464,0.000144548,0.0002028474,0.00006157267,0.0006555355,0.00008915074],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"bench_or_experimental","study_design_gemma":"simulation_or_modeling","study_design_scores_codex":[0.000009473906,0.00003077877,0.1030377,0.000210124,0.0009602914,2.204434e-8,0.0007342218,0.00007548765,0.8879292,0.002390058,0.00008903838,0.004533627],"study_design_scores_gemma":[0.001551468,0.0002578814,0.05214826,0.0002509741,0.009077209,0.00004681603,0.001486262,0.7585729,0.1590898,0.001608241,0.01452663,0.001383542],"study_design_candidate":"bench_or_experimental","study_design_consensus":null,"genre_codex":"empirical","genre_gemma":"empirical","genre_scores_codex":[0.913786,0.0002510048,0.08416737,0.0003556478,0.0001114897,0.0005593874,0.0001860554,0.0001472635,0.0004357714],"genre_scores_gemma":[0.996217,0.00008153975,0.002475471,0.00002430504,0.000443266,0.0002632976,0.000399713,0.00002531055,0.00007011092],"genre_candidate":"empirical","genre_consensus":"empirical","teacher_disagreement_score":0.7584974,"threshold_uncertainty_score":0.7236051,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W2754714077","doi":"10.31399/asm.cp.istfa2017p0390","title":"Practical Dynamic Laser Stimulation Techniques for Complex Analog and Mixed Signal IC Failure Analysis","year":2017,"lang":"en","type":"article","venue":"Proceedings - International Symposium for Testing and Failure Analysis","topic":"Integrated Circuits and Semiconductor Failure Analysis","field":"Engineering","cited_by":1,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"Semtech (Canada)","funders":"","keywords":"SIGNAL (programming language); Electronic engineering; Computer science; Fault detection and isolation; Mixed-signal integrated circuit; Integrated circuit; Isolation (microbiology); Reliability engineering; Engineering; Electrical engineering","authors":[{"name":"Jeffrey S. Javier","is_ca":true},{"name":"Taylor Hurdle","is_ca":true},{"name":"Sammie Fernandez","is_ca":true},{"name":"Kari Van Vliet","is_ca":true}],"retraction":null,"screen_n_in":null,"score":{"opus":0.02730313060650525,"gpt":0.2904327430809753,"spread":0.26312961247447,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"codex-gemma-dda1882f352a","candidate_categories":["metaepi_narrow","scholarly_communication"],"consensus_categories":[],"category_scores_codex":[0.0005165055,0.0004122897,0.0007374455,0.0009130557,0.0007435298,0.001115246,0.000363574,0.0002503106,0.00004368036],"category_scores_gemma":[0.0005486667,0.0003881621,0.0004903655,0.0008094611,0.0001464382,0.0007941642,0.00006971496,0.0002516507,0.00000120357],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0001220212,"about_ca_system_score_gemma":0.00001924652,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.0001811033,"about_ca_topic_score_gemma":0.000636436,"domain_scores_codex":[0.9979598,0.00001099224,0.0006022601,0.0006829214,0.0003334827,0.0004105596],"domain_scores_gemma":[0.9976563,0.0003926318,0.0004125554,0.0002230345,0.001146703,0.0001687199],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"bench_or_experimental","study_design_gemma":"simulation_or_modeling","study_design_scores_codex":[0.0002210147,0.0003059933,0.4294807,0.0006961446,0.0725198,0.00001284943,0.001049879,0.01947058,0.4428783,0.006109806,0.010132,0.01712295],"study_design_scores_gemma":[0.0004847327,0.0001098327,0.008398955,0.00003984323,0.01344062,0.00001468845,0.0002858799,0.9689271,0.003987493,0.0009807714,0.002768802,0.0005612549],"study_design_candidate":"simulation_or_modeling","study_design_consensus":null,"genre_codex":"empirical","genre_gemma":"empirical","genre_scores_codex":[0.6392809,0.0001116044,0.3470032,0.007759287,0.0002072465,0.001375632,0.0008502512,0.0009980776,0.00241387],"genre_scores_gemma":[0.9464349,0.00002879805,0.0524212,0.00005399055,0.0001998182,0.0001672659,0.0004879121,0.00004720633,0.0001588926],"genre_candidate":"empirical","genre_consensus":"empirical","teacher_disagreement_score":0.9494566,"threshold_uncertainty_score":0.9999217,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W2753392553","doi":"10.31399/asm.cp.istfa2017p0501","title":"Influence of Sample Preparation on Intrinsic Stress Inside a Model Chip—Comparison of Results from Electric Read-Out and Raman Spectroscopy","year":2017,"lang":"en","type":"article","venue":"Proceedings - International Symposium for Testing and Failure Analysis","topic":"Thermography and Photoacoustic Techniques","field":"Engineering","cited_by":1,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"Infineon Technologies (Canada)","funders":"","keywords":"Raman spectroscopy; Resistive touchscreen; Stress (linguistics); Benchmark (surveying); Materials science; Chip; Sample (material); Spectroscopy; Optoelectronics; Electronic engineering; Analytical Chemistry (journal); Electrical engineering; Optics; Engineering; Physics; Chemistry; Chromatography","authors":[{"name":"T. Schaffus","is_ca":true},{"name":"Holger Pfaff","is_ca":true},{"name":"Pierre Albert","is_ca":true},{"name":"M. Schaffus","is_ca":true},{"name":"F. Kroninger","is_ca":true},{"name":"J. Krumschmidt","is_ca":true},{"name":"D. Debie","is_ca":true},{"name":"W. Breuer","is_ca":true},{"name":"Walter Mack","is_ca":true}],"retraction":null,"screen_n_in":null,"score":{"opus":0.01601009112492817,"gpt":0.2787975672386938,"spread":0.2627874761137656,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"codex-gemma-dda1882f352a","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0001538568,0.0001461473,0.0002993592,0.000256721,0.0001188075,0.0000993018,0.0002081677,0.00007839574,7.098789e-7],"category_scores_gemma":[0.0006213026,0.000143661,0.00007233721,0.000169556,0.00005094398,0.0002100871,0.00003517165,0.0001118215,3.409597e-8],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.00002241906,"about_ca_system_score_gemma":0.000007312214,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.0006185727,"about_ca_topic_score_gemma":0.00009973213,"domain_scores_codex":[0.999058,0.000003151069,0.0003952696,0.0002533706,0.0001707922,0.0001193861],"domain_scores_gemma":[0.9988886,0.0002920238,0.0003851411,0.0001308313,0.0002621087,0.00004127443],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"bench_or_experimental","study_design_gemma":"simulation_or_modeling","study_design_scores_codex":[0.0003844169,0.00009147018,0.2100666,0.0001483004,0.001055519,1.983168e-7,0.002872042,0.08523736,0.6973276,0.0008534294,0.00006844442,0.001894626],"study_design_scores_gemma":[0.0004068537,0.0002127523,0.034287,0.0001885191,0.000554091,5.295545e-7,0.00005601316,0.668034,0.2918229,0.004236408,0.0000142894,0.0001866768],"study_design_candidate":"bench_or_experimental","study_design_consensus":null,"genre_codex":"empirical","genre_gemma":"empirical","genre_scores_codex":[0.9929069,0.00003303276,0.005660241,0.00006177365,0.00001510341,0.0001587558,0.0006041576,0.00008699737,0.0004730031],"genre_scores_gemma":[0.9845554,0.00003745409,0.01526254,0.000004808053,0.00004650111,0.00002711114,0.00004860111,0.00001245353,0.000005191135],"genre_candidate":"empirical","genre_consensus":"empirical","teacher_disagreement_score":0.5827966,"threshold_uncertainty_score":0.5858326,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W2757767492","doi":"10.31399/asm.cp.istfa2017p0046","title":"Temperature-Dependent Die Warpage Measurements Up to 400°C","year":2017,"lang":"en","type":"article","venue":"Proceedings - International Symposium for Testing and Failure Analysis","topic":"Advanced Measurement and Metrology Techniques","field":"Engineering","cited_by":1,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"Infineon Technologies (Canada)","funders":"","keywords":"Die (integrated circuit); Materials science; Temperature measurement; Soldering; Profilometer; Composite material; Mechanical engineering; Engineering; Surface finish","authors":[{"name":"Tobias Mittereder","is_ca":true},{"name":"Bernhard Ferstl","is_ca":true},{"name":"Terry Heidmann","is_ca":true},{"name":"Christian Hollerith","is_ca":true}],"retraction":null,"screen_n_in":null,"score":{"opus":0.03513858414160745,"gpt":0.2807645852679036,"spread":0.2456260011262962,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"codex-gemma-dda1882f352a","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0004122752,0.0002240219,0.0002784851,0.0002712979,0.0004114984,0.0003485356,0.000427477,0.000101638,0.000007099438],"category_scores_gemma":[0.0006143413,0.0002153859,0.0001224172,0.0001453307,0.00003396652,0.0003791979,0.00008402541,0.0001443229,0.00000317343],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.00009695906,"about_ca_system_score_gemma":0.000005848103,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.00003163711,"about_ca_topic_score_gemma":0.00005712848,"domain_scores_codex":[0.998803,0.000002539008,0.0002639634,0.0003602275,0.0002899414,0.000280317],"domain_scores_gemma":[0.9990022,0.00004020559,0.0001271939,0.0001511502,0.0005523791,0.0001269057],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","study_design_scores_codex":[0.00005458924,0.00003449127,0.2533332,0.00008635342,0.002248235,0.000001722918,0.0003750173,0.001288636,0.7359548,0.0002563959,0.001987959,0.004378633],"study_design_scores_gemma":[0.005314724,0.000891115,0.07292508,0.0006869054,0.007892294,0.00004993129,0.0007071442,0.06335797,0.7691103,0.00613133,0.06904783,0.003885374],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","genre_codex":"empirical","genre_gemma":"empirical","genre_scores_codex":[0.9332044,0.0003274511,0.03227014,0.004816,0.001454419,0.001265198,0.0001085136,0.001773574,0.02478031],"genre_scores_gemma":[0.9814532,0.00003005914,0.01735366,0.00008575826,0.0002525342,0.0001740762,0.00001460485,0.0000317641,0.0006043454],"genre_candidate":"empirical","genre_consensus":"empirical","teacher_disagreement_score":0.1804081,"threshold_uncertainty_score":0.8783181,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W2469528592","doi":"10.31399/asm.cp.istfa2015p0092","title":"Circuit Tracing on Integrated Circuit Using FIB Passive Voltage Contrast Effect","year":2015,"lang":"en","type":"article","venue":"Proceedings - International Symposium for Testing and Failure Analysis","topic":"Integrated Circuits and Semiconductor Failure Analysis","field":"Engineering","cited_by":0,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"Fibics (Canada)","funders":"","keywords":"Tracing; Integrated circuit; Computer science; Voltage; Layer (electronics); Circuit extraction; Electronic circuit; Electronic engineering; Materials science; Electrical engineering; Optoelectronics; Equivalent circuit; Engineering; Nanotechnology","authors":[{"name":"A.R. Sorkin","is_ca":false},{"name":"Chris Pawlowicz","is_ca":false},{"name":"Alex Krechmer","is_ca":false},{"name":"Michael W. Phaneuf","is_ca":true}],"retraction":null,"screen_n_in":null,"score":{"opus":0.02634199767551785,"gpt":0.2373215922635275,"spread":0.2109795945880097,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"codex-gemma-dda1882f352a","candidate_categories":["metaepi_narrow"],"consensus_categories":[],"category_scores_codex":[0.0005407374,0.0005186331,0.0007454739,0.0007927832,0.0002286937,0.0005166042,0.000356557,0.0002430943,0.00003152495],"category_scores_gemma":[0.0008105453,0.0004600135,0.0003879163,0.001577376,0.00007604645,0.0005464043,0.00002815688,0.0004303638,0.000008648756],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0004175732,"about_ca_system_score_gemma":0.00003979112,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.0003363048,"about_ca_topic_score_gemma":0.00003889376,"domain_scores_codex":[0.9976941,0.00001651488,0.0006268704,0.0006424811,0.0004993906,0.0005206437],"domain_scores_gemma":[0.9977375,0.0003800813,0.0002378267,0.0001455486,0.001210348,0.0002887243],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"bench_or_experimental","study_design_gemma":"simulation_or_modeling","study_design_scores_codex":[0.0001787137,0.00023644,0.1197715,0.0004572343,0.02250079,0.00004707902,0.004585623,0.09636665,0.726308,0.009043712,0.003912842,0.01659147],"study_design_scores_gemma":[0.001847422,0.0004740575,0.0003606493,0.0003561075,0.005928521,0.00008399835,0.001693348,0.9597021,0.02372752,0.001210426,0.003363967,0.00125188],"study_design_candidate":"simulation_or_modeling","study_design_consensus":null,"genre_codex":"empirical","genre_gemma":"empirical","genre_scores_codex":[0.9551191,0.0001517533,0.0319036,0.0002193971,0.0005021937,0.0005443287,0.000207261,0.000702375,0.01065001],"genre_scores_gemma":[0.9983412,0.00001031197,0.00066188,0.00008673162,0.0004103804,0.00008139265,0.0001546697,0.00007552018,0.0001778856],"genre_candidate":"empirical","genre_consensus":"empirical","teacher_disagreement_score":0.8633354,"threshold_uncertainty_score":0.9997852,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W2467562523","doi":"10.31399/asm.cp.istfa2015p0344","title":"Tester Assisted Multiple Emission Microscopy","year":2015,"lang":"en","type":"article","venue":"Proceedings - International Symposium for Testing and Failure Analysis","topic":"Integrated Circuits and Semiconductor Failure Analysis","field":"Engineering","cited_by":0,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"Infineon Technologies (Canada)","funders":"","keywords":"Iddq testing; Microscopy; Materials science; Atomic force microscopy; Current (fluid); Computer science; Nanotechnology; Optoelectronics; Optics; Engineering; Electrical engineering; Physics; CMOS","authors":[{"name":"Christian Hollerith","is_ca":true},{"name":"Gerhard Borgmann","is_ca":true},{"name":"Wolfgang Schaller","is_ca":true},{"name":"Christian Burmer","is_ca":true},{"name":"Christof Brillert","is_ca":true}],"retraction":null,"screen_n_in":null,"score":{"opus":0.02614856157457974,"gpt":0.2472140759193491,"spread":0.2210655143447694,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"codex-gemma-dda1882f352a","candidate_categories":["metaepi_narrow"],"consensus_categories":[],"category_scores_codex":[0.0002942419,0.0002831275,0.0003776774,0.0004101857,0.0001343968,0.0003604149,0.0002627675,0.0001553569,0.00001771654],"category_scores_gemma":[0.0005124701,0.0002513308,0.0002170544,0.00101309,0.00004545362,0.0003667759,0.00003697583,0.0001879686,0.000006579545],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0001340104,"about_ca_system_score_gemma":0.00001907553,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.0001297584,"about_ca_topic_score_gemma":0.00003811302,"domain_scores_codex":[0.9985581,0.0000053828,0.0004243804,0.0004060894,0.0002941949,0.0003118392],"domain_scores_gemma":[0.9983943,0.0001530793,0.0001233631,0.000102265,0.001003886,0.0002230765],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"bench_or_experimental","study_design_gemma":"simulation_or_modeling","study_design_scores_codex":[0.00003249901,0.00007275323,0.2426963,0.00008318471,0.003485171,0.00000307749,0.000947353,0.003047792,0.7335973,0.0002189666,0.01377426,0.002041401],"study_design_scores_gemma":[0.001645239,0.0001655184,0.002687511,0.0001436644,0.003884977,0.00006566967,0.001515087,0.8980154,0.04320287,0.0006859353,0.04688779,0.001100286],"study_design_candidate":"simulation_or_modeling","study_design_consensus":null,"genre_codex":"empirical","genre_gemma":"empirical","genre_scores_codex":[0.9771619,0.0002876635,0.008222741,0.001294615,0.0004564975,0.0003418693,0.0001221488,0.0008171892,0.01129537],"genre_scores_gemma":[0.9882986,0.00001243048,0.01039906,0.00008771144,0.0002678921,0.00005976631,0.0001297912,0.00004241382,0.000702364],"genre_candidate":"empirical","genre_consensus":"empirical","teacher_disagreement_score":0.8949677,"threshold_uncertainty_score":0.9999939,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W4415990515","doi":"10.31399/asm.cp.istfa2025p0400","title":"EOTPR Fine Pitch Probing for Die-to-Die Interconnect Failure Analysis","year":2025,"lang":"","type":"article","venue":"Proceedings - International Symposium for Testing and Failure Analysis","topic":"Integrated Circuits and Semiconductor Failure Analysis","field":"Engineering","cited_by":0,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"Advanced Micro Devices (Canada)","funders":"Advanced Micro Devices","keywords":"Interconnection; Root cause; Granularity; Fault detection and isolation; Isolation (microbiology); TRACE (psycholinguistics); Integrated circuit packaging; Catastrophic failure; Fault (geology)","authors":[{"name":"Bernice Zee","is_ca":true},{"name":"Wen Qiu","is_ca":true},{"name":"Aaron Wai Ken Lee","is_ca":true},{"name":"Jesse Alton","is_ca":false},{"name":"Thomas P. White","is_ca":false},{"name":"David D. Kim","is_ca":false},{"name":"Martin Igarashi","is_ca":false}],"retraction":null,"screen_n_in":null,"score":{"opus":0.01291252494010365,"gpt":0.2484271748980187,"spread":0.235514649957915,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"codex-gemma-dda1882f352a","candidate_categories":["metaepi_narrow","scholarly_communication"],"consensus_categories":["metaepi_narrow"],"category_scores_codex":[0.001444871,0.001410789,0.002560383,0.005595657,0.001003803,0.00206136,0.001405776,0.0007058713,0.0001327506],"category_scores_gemma":[0.002416036,0.001423991,0.002664397,0.009039228,0.0001581079,0.0008789112,0.0003122945,0.0008139614,0.000011384],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0007265966,"about_ca_system_score_gemma":0.000129763,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.0009317863,"about_ca_topic_score_gemma":0.002828474,"domain_scores_codex":[0.9930599,0.00003426179,0.002314025,0.002385289,0.0007325071,0.001473986],"domain_scores_gemma":[0.9924026,0.001347956,0.0007733391,0.0005069838,0.004476911,0.0004921925],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"meta_analysis","study_design_gemma":"simulation_or_modeling","study_design_scores_codex":[0.000684731,0.000885452,0.106839,0.003691781,0.366532,0.00002244905,0.01020014,0.1600969,0.2841534,0.01979501,0.01680385,0.03029539],"study_design_scores_gemma":[0.001992896,0.0004627433,0.0006717499,0.0009595399,0.1021503,0.00001097207,0.003278747,0.8222353,0.01033081,0.002141518,0.05344173,0.002323677],"study_design_candidate":"simulation_or_modeling","study_design_consensus":null,"genre_codex":"methods","genre_gemma":"empirical","genre_scores_codex":[0.4245161,0.00407631,0.4989485,0.04576821,0.002691026,0.006940376,0.003287168,0.001975576,0.01179667],"genre_scores_gemma":[0.971132,0.0001477822,0.02178719,0.0004317962,0.0008405501,0.001080757,0.0006936399,0.0001541266,0.00373214],"genre_candidate":"empirical","genre_consensus":null,"teacher_disagreement_score":0.6621384,"threshold_uncertainty_score":0.9998642,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W3113771259","doi":"10.31399/asm.cp.istfa2002p0483","title":"Enhancements of Non-contact Measurements of Electrical Waveforms on the Proximity of a Signal Surface Using Groups of Pulses","year":2002,"lang":"en","type":"article","venue":"Proceedings - International Symposium for Testing and Failure Analysis","topic":"Force Microscopy Techniques and Applications","field":"Physics and Astronomy","cited_by":0,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"University of Manitoba","funders":"","keywords":"Duty cycle; Waveform; SIGNAL (programming language); Computer science; Electronic engineering; Sampling (signal processing); Electronic circuit; Noise (video); Signal-to-noise ratio (imaging); Image resolution; Electrical engineering; Voltage; Acoustics; Engineering; Physics; Artificial intelligence; Telecommunications; Image (mathematics); Detector","authors":[{"name":"Fenglei Du","is_ca":false},{"name":"Greg E. Bridges","is_ca":true},{"name":"D. J. Thomson","is_ca":true},{"name":"R. R. Goruganthu","is_ca":false},{"name":"Shawn McBride","is_ca":false},{"name":"Mike Santana","is_ca":false}],"retraction":null,"screen_n_in":null,"score":{"opus":0.03366002500513674,"gpt":0.2763259260736542,"spread":0.2426659010685175,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"codex-gemma-dda1882f352a","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0002300996,0.0001151529,0.0002825158,0.00009790817,0.00006908501,0.00001502559,0.000196269,0.00003029983,0.00004021292],"category_scores_gemma":[0.00002920954,0.00008402447,0.0001723676,0.0004991411,0.00005591455,0.000095171,0.00003564207,0.00006715226,1.038423e-7],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.00002218264,"about_ca_system_score_gemma":0.000009371341,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.0003344427,"about_ca_topic_score_gemma":0.000001140082,"domain_scores_codex":[0.9990035,0.000004135797,0.0004445553,0.0001741847,0.0002552606,0.0001183672],"domain_scores_gemma":[0.9985498,0.00009934262,0.0006318847,0.00006921586,0.0006259556,0.00002379183],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","study_design_scores_codex":[0.00002173399,0.0002458284,0.2198958,0.00004331888,0.0006743792,6.803351e-9,0.0001607658,0.0002260933,0.7762417,0.001988505,0.0000283679,0.0004735359],"study_design_scores_gemma":[0.0002728903,0.0002474796,0.001719276,0.000143215,0.0005428495,3.010194e-7,0.00009541426,0.1108298,0.8853052,0.0007274008,0.00001269799,0.0001035181],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","genre_codex":"empirical","genre_gemma":"empirical","genre_scores_codex":[0.9837967,0.00001001085,0.01455259,0.00009240293,0.000006367048,0.0002902442,0.00006742612,0.000006225204,0.001178089],"genre_scores_gemma":[0.9887195,0.000002016361,0.01117355,0.000005109518,0.00002487587,0.00002568237,0.00001127241,0.000007899162,0.00003004599],"genre_candidate":"empirical","genre_consensus":"empirical","teacher_disagreement_score":0.2181765,"threshold_uncertainty_score":0.3426418,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W4415990632","doi":"10.31399/asm.cp.istfa2025p0199","title":"3.5D Package Failure Analysis – The Challenges and Innovative Solutions to Successful Root Cause Analysis","year":2025,"lang":"","type":"article","venue":"Proceedings - International Symposium for Testing and Failure Analysis","topic":"Integrated Circuits and Semiconductor Failure Analysis","field":"Engineering","cited_by":0,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"Advanced Micro Devices (Canada)","funders":"","keywords":"Root cause; Root cause analysis; Root (linguistics); Sample (material); Power (physics); Integrated circuit packaging","authors":[{"name":"Wen Qiu","is_ca":true},{"name":"Bernice Zee","is_ca":true},{"name":"Jingwen Chen","is_ca":true}],"retraction":null,"screen_n_in":null,"score":{"opus":0.02463288642947839,"gpt":0.2563948779941797,"spread":0.2317619915647013,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"codex-gemma-dda1882f352a","candidate_categories":["metaepi_narrow","bibliometrics","sts","scholarly_communication"],"consensus_categories":[],"category_scores_codex":[0.00171447,0.001230835,0.002311298,0.007503752,0.001499082,0.001908511,0.001257316,0.0006003912,0.0001227185],"category_scores_gemma":[0.001553644,0.001041604,0.001605915,0.03369087,0.0003689228,0.0008830479,0.0004663547,0.0009755971,0.000009053592],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.000417395,"about_ca_system_score_gemma":0.0001107766,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.00161752,"about_ca_topic_score_gemma":0.01046435,"domain_scores_codex":[0.993768,0.00008378884,0.001871499,0.002101725,0.0009024891,0.001272536],"domain_scores_gemma":[0.9918659,0.001297104,0.0007587483,0.0006402523,0.005023046,0.0004150032],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"meta_analysis","study_design_gemma":"simulation_or_modeling","study_design_scores_codex":[0.0001038978,0.0003255539,0.2862991,0.0004977211,0.5735117,0.0000116946,0.0105393,0.04236702,0.01530705,0.06103778,0.003672948,0.006326313],"study_design_scores_gemma":[0.001155712,0.0002154722,0.04674983,0.0003374789,0.4032613,0.00001656986,0.01495553,0.515608,0.001361778,0.002231547,0.01171973,0.002387119],"study_design_candidate":"meta_analysis","study_design_consensus":null,"genre_codex":"empirical","genre_gemma":"empirical","genre_scores_codex":[0.7373171,0.01655656,0.1169064,0.1034859,0.001006642,0.00338175,0.002430115,0.001124619,0.01779094],"genre_scores_gemma":[0.9937791,0.0008875336,0.002674423,0.000352358,0.0003629451,0.0004117945,0.0003340133,0.0000768082,0.001120974],"genre_candidate":"empirical","genre_consensus":"empirical","teacher_disagreement_score":0.4732409,"threshold_uncertainty_score":0.9998008,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W3116435867","doi":"10.31399/asm.cp.istfa2004p0613","title":"DEI Analysis of an OTP EPROM: Dynamic Electroluminescence Imaging (DEI) Applied to an OTP EPROM Memory Device","year":2004,"lang":"en","type":"article","venue":"Proceedings - International Symposium for Testing and Failure Analysis","topic":"Integrated Circuits and Semiconductor Failure Analysis","field":"Engineering","cited_by":0,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"Institute for Microstructural Sciences","funders":"","keywords":"EPROM; Electroluminescence; CMOS; Photomultiplier; Non-volatile memory; Computer science; Computer hardware; Electrical engineering; Materials science; Engineering; Layer (electronics)","authors":[{"name":"John Hulse","is_ca":true},{"name":"D.J. Frank","is_ca":false},{"name":"M. Simard‐Normandin","is_ca":false}],"retraction":null,"screen_n_in":null,"score":{"opus":0.007820609583901898,"gpt":0.2344382693975807,"spread":0.2266176598136788,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"codex-gemma-dda1882f352a","candidate_categories":["metaepi_narrow"],"consensus_categories":[],"category_scores_codex":[0.0005656427,0.0005081598,0.0009492653,0.001938488,0.0002450141,0.0003737459,0.0007028089,0.0001605148,0.0000356026],"category_scores_gemma":[0.000172297,0.0005097238,0.0004475156,0.005026428,0.00008045788,0.0007374265,0.00005600118,0.000296297,0.000003625003],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0002930553,"about_ca_system_score_gemma":0.00004256757,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.0009757912,"about_ca_topic_score_gemma":0.001082499,"domain_scores_codex":[0.9969923,0.00001093542,0.0008816792,0.000984358,0.0005445394,0.0005862105],"domain_scores_gemma":[0.9977223,0.0001092447,0.0003152719,0.0003065693,0.001238743,0.0003078753],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"bench_or_experimental","study_design_gemma":"simulation_or_modeling","study_design_scores_codex":[0.00004421067,0.00017109,0.02057607,0.0001045265,0.01030842,0.000004298701,0.00190782,0.1363911,0.8258245,0.00101221,0.00003154848,0.003624207],"study_design_scores_gemma":[0.0007399282,0.0001827829,0.004524359,0.00008457254,0.01797456,0.00002211682,0.00194925,0.9354858,0.03712922,0.0006632308,0.0001893186,0.001054832],"study_design_candidate":"simulation_or_modeling","study_design_consensus":null,"genre_codex":"empirical","genre_gemma":"empirical","genre_scores_codex":[0.9805223,0.00009943327,0.016608,0.000451053,0.00007623592,0.0003506959,0.0001071535,0.0003636669,0.001421453],"genre_scores_gemma":[0.9838125,0.00001420037,0.01521081,0.000150343,0.0001430075,0.0001312337,0.0004079824,0.00007098044,0.00005900708],"genre_candidate":"empirical","genre_consensus":"empirical","teacher_disagreement_score":0.7990947,"threshold_uncertainty_score":0.9997354,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W4403685661","doi":"10.31399/asm.cp.istfa2024p0074","title":"Addressing the Cost and Execution Challenges of Scan Chain Testing and Failure Analysis of Complex IC’s","year":2024,"lang":"en","type":"article","venue":"Proceedings - International Symposium for Testing and Failure Analysis","topic":"Integrated Circuits and Semiconductor Failure Analysis","field":"Engineering","cited_by":0,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"Semtech (Canada)","funders":"","keywords":"Computer science; Reliability engineering; Engineering","authors":[{"name":"Alexander Flor","is_ca":true},{"name":"Jeffrey S. Javier","is_ca":true}],"retraction":null,"screen_n_in":null,"score":{"opus":0.06873226527710924,"gpt":0.2797518527883764,"spread":0.2110195875112672,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"codex-gemma-dda1882f352a","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0006190917,0.0002953364,0.000648667,0.001075647,0.0001907937,0.0003037546,0.0002105205,0.0001323888,0.00001390789],"category_scores_gemma":[0.0004078619,0.0002311276,0.0002514334,0.002452951,0.0001874638,0.0003009358,0.00005941706,0.0002235077,1.907656e-7],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.00006002597,"about_ca_system_score_gemma":0.00001678189,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.0003951287,"about_ca_topic_score_gemma":0.0003171195,"domain_scores_codex":[0.9983234,0.0000149841,0.0006084488,0.0004724933,0.0003164072,0.0002642057],"domain_scores_gemma":[0.9981256,0.0007231026,0.0002268161,0.0001130138,0.0007234425,0.00008804421],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"bench_or_experimental","study_design_gemma":"simulation_or_modeling","study_design_scores_codex":[0.00003695205,0.00009260596,0.1277898,0.002172545,0.05208192,0.000005632358,0.008714311,0.01995987,0.7126769,0.02034879,0.0008231733,0.05529747],"study_design_scores_gemma":[0.0002028284,0.00006744293,0.007883005,0.0003467252,0.01283105,0.0000215803,0.002765021,0.9718603,0.002404521,0.0004948868,0.0007873193,0.0003352651],"study_design_candidate":"simulation_or_modeling","study_design_consensus":null,"genre_codex":"empirical","genre_gemma":"empirical","genre_scores_codex":[0.9810679,0.005597089,0.004890598,0.003512869,0.000131144,0.0005310752,0.0003965842,0.0003516504,0.003521097],"genre_scores_gemma":[0.9964389,0.0002870857,0.00295902,0.00001972596,0.0001179163,0.0000455445,0.00006489615,0.00003097774,0.00003588743],"genre_candidate":"empirical","genre_consensus":"empirical","teacher_disagreement_score":0.9519005,"threshold_uncertainty_score":0.9425111,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W4307557622","doi":"10.31399/asm.cp.istfa2022p0319","title":"A Correlative Microscopic Workflow For Nanoscale Failure Analysis and Characterization of Advanced Electronics Packages","year":2022,"lang":"en","type":"article","venue":"Proceedings - International Symposium for Testing and Failure Analysis","topic":"Integrated Circuits and Semiconductor Failure Analysis","field":"Engineering","cited_by":0,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"Fibics (Canada)","funders":"","keywords":"Characterization (materials science); Workflow; Materials science; Focused ion beam; Sample (material); Computer science; Sample preparation; Nanotechnology; Nanoscopic scale; Chemistry","authors":[{"name":"Thomas Rodgers","is_ca":false},{"name":"Allen Gu","is_ca":false},{"name":"Greg M. Johnson","is_ca":false},{"name":"Masako Terada","is_ca":false},{"name":"Nathaniel Cohan","is_ca":false},{"name":"Vignesh Viswanathan","is_ca":false},{"name":"Michael W. Phaneuf","is_ca":true},{"name":"Joachim de Fourestier","is_ca":true},{"name":"Ethan Ruttan","is_ca":true},{"name":"Stewart McCracken","is_ca":false},{"name":"Suzanne Costello","is_ca":false},{"name":"Aidan M Robinson","is_ca":false},{"name":"Andrew Gibson","is_ca":false},{"name":"Alan Balfour","is_ca":false}],"retraction":null,"screen_n_in":null,"score":{"opus":0.005977493600999457,"gpt":0.2081514085129621,"spread":0.2021739149119627,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"codex-gemma-dda1882f352a","candidate_categories":["metaepi_narrow"],"consensus_categories":[],"category_scores_codex":[0.0002742285,0.0002741816,0.0005985592,0.0008196989,0.0003307376,0.0001397546,0.0002213946,0.00009647541,0.00003329453],"category_scores_gemma":[0.0001222943,0.0002810379,0.0003458765,0.002376432,0.00005531681,0.0002878926,0.00005141791,0.0002144815,1.782581e-7],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0001361571,"about_ca_system_score_gemma":0.0000202616,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.00003741739,"about_ca_topic_score_gemma":0.0000844496,"domain_scores_codex":[0.998438,0.00001115716,0.0005114143,0.0004761524,0.0002557476,0.0003075563],"domain_scores_gemma":[0.9986718,0.0002072964,0.0003114733,0.00009868279,0.0006355065,0.00007526484],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"bench_or_experimental","study_design_gemma":"simulation_or_modeling","study_design_scores_codex":[0.00004504551,0.00005252679,0.06516106,0.0001179892,0.01002909,3.82962e-7,0.001140159,0.00983599,0.9104133,0.0008651125,0.000122052,0.002217356],"study_design_scores_gemma":[0.001875891,0.0006397187,0.007508024,0.00009382948,0.02660081,0.00001956524,0.002775409,0.8727815,0.07177761,0.00127264,0.01338021,0.001274751],"study_design_candidate":"bench_or_experimental","study_design_consensus":null,"genre_codex":"empirical","genre_gemma":"empirical","genre_scores_codex":[0.9768801,0.0002317989,0.0210021,0.0005158082,0.000100465,0.0004174396,0.0005876104,0.0001280744,0.0001366057],"genre_scores_gemma":[0.9916671,0.00007395348,0.006764809,0.00003943123,0.00007037442,0.0003150176,0.0007525377,0.000036982,0.0002797994],"genre_candidate":"empirical","genre_consensus":"empirical","teacher_disagreement_score":0.8629456,"threshold_uncertainty_score":0.9999642,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W2581360948","doi":"10.31399/asm.cp.istfa2016p0480","title":"Elemental Characterization of Sub 20 nm Structures in Devices Using Low Energy SEM-EDS","year":2016,"lang":"en","type":"article","venue":"Proceedings - International Symposium for Testing and Failure Analysis","topic":"Electron and X-Ray Spectroscopy Techniques","field":"Materials Science","cited_by":0,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"Oxford Instruments (Canada)","funders":"","keywords":"Detector; Scanning electron microscope; Characterization (materials science); Materials science; Resolution (logic); Scanning transmission electron microscopy; Electronics; Energy (signal processing); Optoelectronics; Transmission electron microscopy; Semiconductor; X-ray detector; Elemental analysis; Nanotechnology; Optics; Computer science; Electrical engineering; Physics; Engineering; Chemistry; Composite material; Artificial intelligence","authors":[{"name":"James Sagar","is_ca":true},{"name":"James Holland","is_ca":true},{"name":"Simon Burgess","is_ca":true},{"name":"Connor W. McCarthy","is_ca":true},{"name":"Xiaobing Li","is_ca":true}],"retraction":null,"screen_n_in":null,"score":{"opus":0.009248835036303448,"gpt":0.2562916988970083,"spread":0.2470428638607049,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"codex-gemma-dda1882f352a","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0002408468,0.0001475378,0.0002428618,0.0003240935,0.00007894917,0.0001031908,0.0001955941,0.00006403273,0.00003591951],"category_scores_gemma":[0.00008173865,0.0001133234,0.00007356804,0.0004305716,0.00005455657,0.0004125492,0.00005204455,0.00003752766,2.482475e-7],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.00008401112,"about_ca_system_score_gemma":0.00001917905,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.0002131003,"about_ca_topic_score_gemma":0.0001434312,"domain_scores_codex":[0.9988557,0.000008172212,0.0003712527,0.0003251039,0.0002261412,0.0002136039],"domain_scores_gemma":[0.9991881,0.00006991401,0.0003456278,0.0000500227,0.0003055231,0.00004082461],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","study_design_scores_codex":[0.00002716123,0.00002546886,0.1125887,0.00002485532,0.00007143798,2.190844e-7,0.0000564732,0.000008045747,0.8850683,0.001567246,0.000008264682,0.0005538117],"study_design_scores_gemma":[0.000240429,0.00008090722,0.005254616,0.00009772349,0.0001540771,0.000004846912,0.00002492882,0.006245469,0.9865922,0.0009498047,0.0001956058,0.0001593482],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","genre_codex":"empirical","genre_gemma":"empirical","genre_scores_codex":[0.9924132,0.00002117066,0.00676493,0.0004408735,0.00004132689,0.00009251449,0.00006147707,0.00006135883,0.0001031902],"genre_scores_gemma":[0.9908693,0.00002859603,0.008820578,0.00005502777,0.0001087111,0.00002698772,0.00003339103,0.00001330332,0.00004414761],"genre_candidate":"empirical","genre_consensus":"empirical","teacher_disagreement_score":0.1073341,"threshold_uncertainty_score":0.4621195,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W4307557603","doi":"10.31399/asm.cp.istfa2022p0043","title":"Machine Learning Methods for FEOL/MEOL Defects Measurement through SRAM Bitmap","year":2022,"lang":"en","type":"article","venue":"Proceedings - International Symposium for Testing and Failure Analysis","topic":"Integrated Circuits and Semiconductor Failure Analysis","field":"Engineering","cited_by":0,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"Advanced Micro Devices (Canada)","funders":"","keywords":"Bitmap; Backpropagation; Static random-access memory; Computer science; Perceptron; Artificial neural network; Test data; Artificial intelligence; Computer hardware","authors":[{"name":"Ningmu Zou","is_ca":false},{"name":"Adam Rose","is_ca":true},{"name":"Raymond M. L. Ting","is_ca":false}],"retraction":null,"screen_n_in":null,"score":{"opus":0.03083500457353289,"gpt":0.2741240210742859,"spread":0.243289016500753,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"codex-gemma-dda1882f352a","candidate_categories":["metaepi_narrow"],"consensus_categories":[],"category_scores_codex":[0.00127079,0.0003454834,0.0005230631,0.0004380958,0.0007161121,0.0002624046,0.0003682056,0.00008985602,0.00007700241],"category_scores_gemma":[0.0006553311,0.0003407527,0.0004299835,0.001291894,0.00003543507,0.0002849717,0.00008490436,0.0004019842,0.000001177268],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0003258074,"about_ca_system_score_gemma":0.00002284483,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.0002027067,"about_ca_topic_score_gemma":0.0000357331,"domain_scores_codex":[0.9979952,0.00002797124,0.0005295119,0.0005554072,0.0004694085,0.0004225099],"domain_scores_gemma":[0.9982838,0.0003227512,0.0002192316,0.0001027828,0.0009773242,0.0000941269],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"bench_or_experimental","study_design_gemma":"simulation_or_modeling","study_design_scores_codex":[0.00010968,0.0002294758,0.03794232,0.0005681934,0.02071298,0.000003153653,0.004014812,0.2633449,0.6377428,0.01104218,0.004947623,0.01934196],"study_design_scores_gemma":[0.0005897607,0.0002256578,0.00005019749,0.0000286816,0.003387135,0.00001957905,0.0007629969,0.8568506,0.005785966,0.001943903,0.1298241,0.0005314593],"study_design_candidate":"simulation_or_modeling","study_design_consensus":null,"genre_codex":"methods","genre_gemma":"empirical","genre_scores_codex":[0.1256791,0.006583327,0.8344395,0.004798526,0.001872643,0.003089772,0.0006801301,0.00291492,0.0199421],"genre_scores_gemma":[0.9340565,0.00004581512,0.06401152,0.0001436479,0.0002436011,0.0007939245,0.000216553,0.00007560203,0.0004128684],"genre_candidate":"empirical","genre_consensus":null,"teacher_disagreement_score":0.8083773,"threshold_uncertainty_score":0.9999045,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W3114744922","doi":"10.31399/asm.cp.istfa2005p0245","title":"Dynamic Electroluminescence Imaging (DEI) as an “Optical Oscilloscope” Probe","year":2005,"lang":"en","type":"article","venue":"Proceedings - International Symposium for Testing and Failure Analysis","topic":"Integrated Circuits and Semiconductor Failure Analysis","field":"Engineering","cited_by":0,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"National Research Council Canada","funders":"","keywords":"Oscilloscope; Waveform; Bandwidth (computing); Computer science; Electroluminescence; Electronic engineering; Transmission (telecommunications); SIGNAL (programming language); Radio frequency; Electronic circuit; Electrical engineering; Optoelectronics; Materials science; Voltage; Engineering; Telecommunications; Detector","authors":[{"name":"John Hulse","is_ca":true},{"name":"Keith Sarault","is_ca":false},{"name":"M. Simard‐Normandin","is_ca":false}],"retraction":null,"screen_n_in":null,"score":{"opus":0.005898569836075854,"gpt":0.228291722573315,"spread":0.2223931527372391,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"codex-gemma-dda1882f352a","candidate_categories":["metaepi_narrow"],"consensus_categories":[],"category_scores_codex":[0.0002961772,0.0003464126,0.0004039441,0.0005035102,0.0002213485,0.000489642,0.0003941815,0.0001142994,0.00005623015],"category_scores_gemma":[0.0002227595,0.0003308967,0.0002265384,0.001075961,0.000075549,0.0008562256,0.00003307522,0.0002709711,0.00001305725],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0001924399,"about_ca_system_score_gemma":0.00002250417,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.0001194572,"about_ca_topic_score_gemma":0.0001837868,"domain_scores_codex":[0.9980898,0.000005257371,0.0004842944,0.0005900576,0.0003467365,0.0004838323],"domain_scores_gemma":[0.9987336,0.00008877598,0.0001171067,0.0001311034,0.000733575,0.0001958452],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"bench_or_experimental","study_design_gemma":"simulation_or_modeling","study_design_scores_codex":[0.00003550388,0.0001643551,0.05431589,0.0001109283,0.003512378,0.000006106371,0.0008857236,0.007283044,0.9115044,0.006180121,0.0008680703,0.01513348],"study_design_scores_gemma":[0.0003293754,0.00008040523,0.00050615,0.00004395843,0.001677717,0.0000613325,0.0003233688,0.9827716,0.008475831,0.0006054379,0.004591845,0.0005330221],"study_design_candidate":"simulation_or_modeling","study_design_consensus":null,"genre_codex":"empirical","genre_gemma":"empirical","genre_scores_codex":[0.9628535,0.0003341955,0.01919767,0.004065432,0.0001914545,0.0004375617,0.00005088387,0.001010753,0.01185854],"genre_scores_gemma":[0.9798746,0.00003762012,0.01901579,0.0001831474,0.000269097,0.00008005542,0.0001018565,0.0000531198,0.0003847138],"genre_candidate":"empirical","genre_consensus":"empirical","teacher_disagreement_score":0.9754885,"threshold_uncertainty_score":0.9999143,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W4415990578","doi":"10.31399/asm.cp.istfa2025p0129","title":"Laser Probe Techniques with Adaptive FPGA Device","year":2025,"lang":"","type":"article","venue":"Proceedings - International Symposium for Testing and Failure Analysis","topic":"Advanced Measurement and Metrology Techniques","field":"Engineering","cited_by":0,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"Advanced Micro Devices (Canada)","funders":"","keywords":"Field-programmable gate array; SIGNAL (programming language); Signal processing; Implementation; Artificial neural network; Dual (grammatical number); Laser; Quality (philosophy)","authors":[{"name":"Zhi Hao Ko","is_ca":true},{"name":"Amitesh Kumar","is_ca":false},{"name":"Jobin Thomas Valliyakalayil","is_ca":false}],"retraction":null,"screen_n_in":null,"score":{"opus":0.0149233598213682,"gpt":0.2537249738631503,"spread":0.2388016140417821,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"codex-gemma-dda1882f352a","candidate_categories":["metaepi_narrow"],"consensus_categories":[],"category_scores_codex":[0.0005502514,0.0005287223,0.0006589271,0.000963291,0.0003279341,0.000258212,0.0003928081,0.000282338,0.00001307367],"category_scores_gemma":[0.0002736117,0.0004929167,0.0002285001,0.001974647,0.0001511654,0.0005565612,0.0001153564,0.0004017676,0.000001021185],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.000253278,"about_ca_system_score_gemma":0.00004923016,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.00007255634,"about_ca_topic_score_gemma":0.00006722576,"domain_scores_codex":[0.9977484,0.000009505086,0.0006013432,0.0007911092,0.0003540221,0.0004956544],"domain_scores_gemma":[0.9973087,0.0002660682,0.0003155661,0.0001348007,0.001859757,0.0001151002],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"observational","study_design_gemma":"bench_or_experimental","study_design_scores_codex":[0.001323534,0.0008083471,0.6081399,0.002147675,0.04780495,0.00001707971,0.00166177,0.003793995,0.1953213,0.0236188,0.005145004,0.1102176],"study_design_scores_gemma":[0.004014037,0.002808455,0.006301349,0.004251276,0.03740774,0.00006539757,0.002049671,0.3174952,0.5233856,0.01515763,0.08319488,0.003868851],"study_design_candidate":"bench_or_experimental","study_design_consensus":null,"genre_codex":"methods","genre_gemma":"empirical","genre_scores_codex":[0.02488484,0.001006923,0.9120787,0.005136846,0.0002958643,0.002383561,0.0001283588,0.002103128,0.05198182],"genre_scores_gemma":[0.735262,0.0001197706,0.2624392,0.0001827,0.0001951765,0.0005802253,0.0000280787,0.00004572561,0.001147113],"genre_candidate":"methods","genre_consensus":null,"teacher_disagreement_score":0.7103772,"threshold_uncertainty_score":0.9997522,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null},{"id":"W2758510945","doi":"10.31399/asm.cp.istfa2017p0265","title":"Practicality of Single Microscope Failure Analysis for Fault Isolation, Analysis, and Advanced TEM Sample Preparation by the Integration EBAC and EDS on FIBSEM","year":2017,"lang":"en","type":"article","venue":"Proceedings - International Symposium for Testing and Failure Analysis","topic":"Integrated Circuits and Semiconductor Failure Analysis","field":"Engineering","cited_by":0,"is_retracted":false,"has_abstract":true,"routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false},"ca_institutions":"Oxford Instruments (Canada)","funders":"","keywords":"Fault detection and isolation; Detector; Computer science; Lamella (surface anatomy); Materials science; Workflow; Actuator; Artificial intelligence; Composite material","authors":[{"name":"John Lindsay","is_ca":true},{"name":"James Sagar","is_ca":true},{"name":"James Holland","is_ca":true},{"name":"J. D. S. Goulden","is_ca":true}],"retraction":null,"screen_n_in":null,"score":{"opus":0.01823347630736324,"gpt":0.2752578353781396,"spread":0.2570243590707764,"validation_status":"score_only:v0-immature-baseline"},"prediction":{"model_version":"codex-gemma-dda1882f352a","candidate_categories":["metaepi_narrow"],"consensus_categories":[],"category_scores_codex":[0.0006070188,0.0003364698,0.0006865431,0.0006063583,0.0006687585,0.0008341096,0.0003018739,0.0001802784,0.00001153614],"category_scores_gemma":[0.001509295,0.0002651396,0.0003860368,0.00122988,0.0001553797,0.000725342,0.00004567783,0.0001854457,2.309531e-7],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.00008067189,"about_ca_system_score_gemma":0.00001318012,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.000579451,"about_ca_topic_score_gemma":0.001200183,"domain_scores_codex":[0.9981337,0.00001838173,0.0006722423,0.0006106722,0.0003011388,0.0002638421],"domain_scores_gemma":[0.9969941,0.0007801782,0.0006546327,0.0002712552,0.001200823,0.00009901438],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"bench_or_experimental","study_design_gemma":"simulation_or_modeling","study_design_scores_codex":[0.0002297106,0.0001886973,0.231149,0.0002069136,0.04063053,2.749372e-7,0.002176122,0.01874489,0.6952772,0.002586971,0.001443797,0.007365926],"study_design_scores_gemma":[0.0008259717,0.0003560116,0.008744652,0.00007264369,0.03373304,0.000004163446,0.001333649,0.9039019,0.04554506,0.0009480938,0.003887675,0.0006470795],"study_design_candidate":"simulation_or_modeling","study_design_consensus":null,"genre_codex":"empirical","genre_gemma":"empirical","genre_scores_codex":[0.8415409,0.0002364332,0.1537317,0.002506297,0.00007405821,0.0006297256,0.0007537975,0.000111428,0.0004155707],"genre_scores_gemma":[0.986457,0.00007321047,0.01248474,0.00004680173,0.00009073129,0.0001224152,0.0005719273,0.00002490648,0.0001282553],"genre_candidate":"empirical","genre_consensus":"empirical","teacher_disagreement_score":0.885157,"threshold_uncertainty_score":0.9999801,"prediction_status":"machine_predicted_unvalidated"},"labels":[],"label_agreement":null}]}