{"id":"W1541778057","doi":"10.1109/isqed.2005.17","title":"Analysis and Design of LVTSCR-based EOS/ESD Protection Circuits for Burn-in Environment","year":2005,"lang":"en","type":"article","venue":"","topic":"Electrostatic Discharge in Electronics","field":"Engineering","cited_by":7,"is_retracted":false,"has_abstract":true,"ca_institutions":"University of Waterloo","funders":"","keywords":"Electrostatic discharge; Burn-in; CMOS; Voltage; Materials science; Electrical engineering; MOSFET; Electronic circuit; Gate oxide; Breakdown voltage; Stress (linguistics); Electronic engineering; Optoelectronics; Engineering; Transistor","routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false,"invisible_to_affiliation_only":false},"retraction":null,"screen":null,"direct_labels":[],"prediction":{"model_version":"codex-gemma-dda1882f352a","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0002229448,0.00009999238,0.0001727559,0.0001966088,0.00001560053,0.000008449298,0.0000476366,0.00004876466,0.00006400496],"category_scores_gemma":[0.00001403071,0.0001011866,0.00004471522,0.0002274721,0.00001371014,0.00006144118,0.000003362144,0.0000694315,0.000002763132],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0001272505,"about_ca_system_score_gemma":0.00001383507,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.0000145946,"about_ca_topic_score_gemma":0.00006418925,"domain_scores_codex":[0.9993035,0.00001818004,0.0002165433,0.000135749,0.00009798197,0.0002280933],"domain_scores_gemma":[0.9997486,0.00005982483,0.00003001803,0.0001221305,0.00000948385,0.00002996666],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"simulation_or_modeling","study_design_gemma":"simulation_or_modeling","study_design_scores_codex":[0.00001020107,0.00005189707,0.0004192172,0.00005047647,0.0001384596,2.125543e-7,0.00009267314,0.8838013,0.09254019,0.0001723448,0.00002497963,0.02269808],"study_design_scores_gemma":[0.0003966863,0.0001193105,0.0005855002,0.000005232357,0.00009186097,4.432594e-7,0.000008509771,0.8131847,0.1850401,0.0001939873,0.0002666077,0.0001071372],"study_design_candidate":"simulation_or_modeling","study_design_consensus":"simulation_or_modeling","genre_codex":"methods","genre_gemma":"empirical","genre_scores_codex":[0.103789,0.0002311106,0.8951895,0.00007169526,0.000007336876,0.0005438682,0.000003428096,0.0000469468,0.0001171343],"genre_scores_gemma":[0.9864655,0.0000490119,0.01317642,0.00001752082,0.00001209415,0.0001765904,0.000006138458,0.00001813163,0.00007866673],"genre_candidate":"empirical","genre_consensus":null,"teacher_disagreement_score":0.8826764,"threshold_uncertainty_score":0.4126271,"prediction_status":"machine_predicted_unvalidated"},"machine_scores":{"provisional":true,"baseline":true,"maturity_gate_passed":false,"score_opus":0.01230701035993695,"score_gpt":0.2042631532667428,"score_spread":0.1919561429068058,"validation_status":"score_only:v0-immature-baseline","note":"Baseline scores from an immature model (maturity gate not passed). Scores rank; they never assert a category."}}