{"id":"W1666433991","doi":"10.1109/ipfa.2003.1222743","title":"Application of memory tester for non-destructive detection of micro-crack and crack patterns in flash memory devices","year":2004,"lang":"en","type":"article","venue":"","topic":"Integrated Circuits and Semiconductor Failure Analysis","field":"Engineering","cited_by":0,"is_retracted":false,"has_abstract":true,"ca_institutions":"Advanced Micro Devices (Canada)","funders":"","keywords":"Flash memory; Computer science; Non-volatile memory; Memory leak; Memory cell; Flash (photography); Semiconductor memory; Memory management; Computer hardware; Electrical engineering; Engineering; Transistor; Optics; Voltage; Physics","routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false,"invisible_to_affiliation_only":false},"retraction":null,"screen":null,"direct_labels":[],"prediction":{"model_version":"metacan-v3-hybrid-931329e0061c","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0003174982,0.000290521,0.0002334021,0.0005518839,0.0001499715,0.000319392,0.0007797137,0.0006652707,0.0009148377],"category_scores_gemma":[0.0009292141,0.0001799293,0.0001917044,0.0001177603,0.0002519591,0.0005792039,0.00035598,0.0003348502,0.0002853658],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.000102665,"about_ca_system_score_gemma":0.0001547896,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.0001844788,"about_ca_topic_score_gemma":0.0004323188,"domain_scores_codex":[0.999711,0.00004441032,0.00001346189,0.00004205118,0.0001625918,0.00002651209],"domain_scores_gemma":[0.9991303,0.0003395167,0.0001065747,0.0001063372,0.0002704612,0.00004674583],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","study_design_scores_codex":[0.0001209745,0.00005470884,0.007073959,0.0001437602,0.00001717644,0.0005804602,0.0001301953,0.0003888628,0.9320465,0.0007662327,0.0002977319,0.05837944],"study_design_scores_gemma":[0.00003793686,0.001015077,0.01162932,0.00003708054,0.00005814071,0.005716573,0.0002044474,0.02891272,0.9465202,0.0005482404,0.005279353,0.00004097769],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","genre_codex":"methods","genre_gemma":"empirical","genre_scores_codex":[0.4902004,0.00238303,0.5013508,0.0002946986,0.0001858503,0.000164326,0.0001374334,0.001793492,0.003489993],"genre_scores_gemma":[0.902298,0.0005528672,0.09435669,0.0001519282,0.00003464699,0.00004985167,0.00008358368,0.00005941095,0.002413052],"genre_candidate":"empirical","genre_consensus":null,"teacher_disagreement_score":0.0009148377,"threshold_uncertainty_score":0.00306046,"prediction_status":"machine_predicted_unvalidated"},"machine_scores":{"provisional":true,"baseline":true,"maturity_gate_passed":false,"score_opus":0.005243827254258779,"score_gpt":0.2032787527368597,"score_spread":0.1980349254826009,"validation_status":"score_only:v0-immature-baseline","note":"Baseline scores from an immature model (maturity gate not passed). Scores rank; they never assert a category."}}