{"id":"W1922915833","doi":"10.1109/icvd.2000.812609","title":"Hierarchical test generation for systems on a chip","year":2002,"lang":"en","type":"article","venue":"","topic":"VLSI and Analog Circuit Testing","field":"Computer Science","cited_by":8,"is_retracted":false,"has_abstract":true,"ca_institutions":"Advanced Micro Devices (Canada)","funders":"Semiconductor Research Corporation","keywords":"Testability; Design for testing; Automatic test pattern generation; Computer science; System on a chip; Embedded system; Chip; Logic synthesis; Computer architecture; Core (optical fiber); Logic gate; Reliability engineering; Engineering; Electronic circuit; Algorithm","routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false,"invisible_to_affiliation_only":false},"retraction":null,"screen":null,"direct_labels":[],"prediction":{"model_version":"codex-gemma-dda1882f352a","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0001165057,0.0000591702,0.00006590479,0.00004252541,0.0001235417,0.0001563823,0.0002206306,0.00002704392,0.000008430157],"category_scores_gemma":[0.0001454723,0.00004711322,0.00003024725,0.0001105456,0.000007665456,0.0001114634,0.0000183478,0.00004905747,0.00007640179],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.00001368873,"about_ca_system_score_gemma":0.000006051599,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.000006641552,"about_ca_topic_score_gemma":0.00000199889,"domain_scores_codex":[0.999403,0.00001519054,0.0001102719,0.0002088203,0.0001089881,0.0001537496],"domain_scores_gemma":[0.9994895,0.0002118913,0.00002381999,0.0001950554,0.00002844033,0.00005129113],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"theoretical_or_conceptual","study_design_gemma":"simulation_or_modeling","study_design_scores_codex":[9.802615e-8,0.0002519832,0.001268065,0.0000315342,0.000008900836,0.000009974308,0.0003515833,0.001529513,0.01303555,0.5198675,0.02347452,0.4401708],"study_design_scores_gemma":[0.0001198036,0.0001246909,0.0001291487,0.000009451893,9.597751e-7,0.00001133094,0.000002034561,0.9971561,0.000316692,0.0002097241,0.001846539,0.00007350834],"study_design_candidate":"simulation_or_modeling","study_design_consensus":null,"genre_codex":"methods","genre_gemma":"empirical","genre_scores_codex":[0.006627235,0.00005984147,0.9661468,0.0009920161,0.0002981187,0.0001809946,0.000001499949,0.0002358144,0.02545773],"genre_scores_gemma":[0.9945675,0.000001424927,0.002803317,0.0003882778,0.0005027276,0.00002433855,0.00000148303,0.000004091404,0.001706825],"genre_candidate":"empirical","genre_consensus":null,"teacher_disagreement_score":0.9956266,"threshold_uncertainty_score":0.1921221,"prediction_status":"machine_predicted_unvalidated"},"machine_scores":{"provisional":true,"baseline":true,"maturity_gate_passed":false,"score_opus":0.07613928659928185,"score_gpt":0.2476974535768787,"score_spread":0.1715581669775968,"validation_status":"score_only:v0-immature-baseline","note":"Baseline scores from an immature model (maturity gate not passed). Scores rank; they never assert a category."}}