{"id":"W2010735430","doi":"10.1016/j.microrel.2003.09.009","title":"A relation model of gate oxide yield and reliability","year":2004,"lang":"en","type":"article","venue":"Microelectronics Reliability","topic":"Semiconductor materials and devices","field":"Engineering","cited_by":23,"is_retracted":false,"has_abstract":false,"ca_institutions":"University of Alberta","funders":"National Science Foundation","keywords":"Reliability (semiconductor); Burn-in; Reliability engineering; Yield (engineering); Function (biology); Failure rate; Computer science; Engineering; Materials science; Thermodynamics; Physics","routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false,"invisible_to_affiliation_only":false},"retraction":null,"screen":null,"direct_labels":[],"prediction":{"model_version":"metacan-v3-hybrid-931329e0061c","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0006912055,0.0006367948,0.0005247451,0.001003989,0.0005394995,0.001012883,0.001439097,0.001400842,0.006983559],"category_scores_gemma":[0.003893239,0.0003460736,0.000800201,0.0008449607,0.000773463,0.003418199,0.0006004731,0.001106664,0.001402135],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.001148479,"about_ca_system_score_gemma":0.0006385935,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.003679831,"about_ca_topic_score_gemma":0.00230855,"domain_scores_codex":[0.9996489,0.0000979144,0.00001211699,0.0001048254,0.00009507037,0.00004105755],"domain_scores_gemma":[0.9989624,0.0006573167,0.00007224891,0.0001131308,0.0001593459,0.00003550446],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"theoretical_or_conceptual","study_design_gemma":"simulation_or_modeling","study_design_scores_codex":[0.00005056576,0.00008303462,0.0009105999,0.00009366637,0.00004192936,0.0002028286,0.0002572318,0.2596011,0.005459995,0.7111248,0.003535743,0.01863854],"study_design_scores_gemma":[0.00001419712,0.00004262996,0.0004923929,0.0000117504,0.00003911438,0.00009788723,0.00002131294,0.7497807,0.0008717001,0.2438871,0.004727382,0.0000138899],"study_design_candidate":"simulation_or_modeling","study_design_consensus":null,"genre_codex":"methods","genre_gemma":"empirical","genre_scores_codex":[0.06018531,0.001547535,0.8851084,0.002145776,0.0001544242,0.0000903998,0.0005734935,0.0007632457,0.0494314],"genre_scores_gemma":[0.8991512,0.001744158,0.0561953,0.0004329513,0.000288287,0.0001796109,0.000419939,0.000286987,0.04130158],"genre_candidate":"empirical","genre_consensus":null,"teacher_disagreement_score":0.006983559,"threshold_uncertainty_score":0.02336228,"prediction_status":"machine_predicted_unvalidated"},"machine_scores":{"provisional":true,"baseline":true,"maturity_gate_passed":false,"score_opus":0.009992094874209906,"score_gpt":0.2046338221035005,"score_spread":0.1946417272292906,"validation_status":"score_only:v0-immature-baseline","note":"Baseline scores from an immature model (maturity gate not passed). Scores rank; they never assert a category."}}