{"id":"W2013590297","doi":"10.1149/1.2728811","title":"On-Wafer Test Method of Metal-Insulator-Metal Capacitor Life using Time Dependent Dielectric Breakdown","year":2007,"lang":"en","type":"article","venue":"ECS Transactions","topic":"Semiconductor materials and devices","field":"Engineering","cited_by":1,"is_retracted":false,"has_abstract":true,"ca_institutions":"Spinologics (Canada)","funders":"","keywords":"Time-dependent gate oxide breakdown; Wafer; Materials science; Dielectric strength; Capacitor; Mean time between failures; Test method; Electronic engineering; Dielectric; Insulator (electricity); Reliability (semiconductor); Voltage; Gate dielectric; Optoelectronics; Electrical engineering; Reliability engineering; Engineering; Failure rate; Transistor","routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false,"invisible_to_affiliation_only":false},"retraction":null,"screen":null,"direct_labels":[],"prediction":{"model_version":"codex-gemma-dda1882f352a","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0003017242,0.0001989806,0.0003118565,0.0002326305,0.00008560636,0.00002482506,0.0001068113,0.0001233416,0.0008919398],"category_scores_gemma":[0.00003241099,0.0001913445,0.0001338755,0.0003269953,0.00002342455,0.0001636357,0.000002470817,0.0001666715,0.0000664997],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.00007059138,"about_ca_system_score_gemma":0.00002968268,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.0001284203,"about_ca_topic_score_gemma":0.00002052088,"domain_scores_codex":[0.9989055,0.00002798767,0.0003766219,0.0001832626,0.0002123938,0.0002941976],"domain_scores_gemma":[0.9992399,0.0003170508,0.00005053916,0.0002160129,0.00004792202,0.0001285811],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","study_design_scores_codex":[0.00001209252,0.00008215566,0.00001670994,0.00004007824,0.0001521143,0.000003188962,0.0001199671,0.02066543,0.978166,0.00003909994,0.00001753444,0.0006855658],"study_design_scores_gemma":[0.0003867328,0.00007065356,0.0006712115,0.0000251498,0.0002116449,0.00004559456,0.00005295738,0.02142565,0.9762865,0.00007714524,0.0004513017,0.0002955018],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","genre_codex":"empirical","genre_gemma":"empirical","genre_scores_codex":[0.8047269,0.0002940772,0.1921802,0.000007442373,0.0008434888,0.0001408949,0.00009162896,0.0001991693,0.001516173],"genre_scores_gemma":[0.9948959,0.00001694112,0.004754552,0.00002380516,0.0001517924,0.000005366288,0.000004420824,0.00004854884,0.0000986117],"genre_candidate":"empirical","genre_consensus":"empirical","teacher_disagreement_score":0.1901691,"threshold_uncertainty_score":0.9766115,"prediction_status":"machine_predicted_unvalidated"},"machine_scores":{"provisional":true,"baseline":true,"maturity_gate_passed":false,"score_opus":0.01453280373627711,"score_gpt":0.2451498706233741,"score_spread":0.230617066887097,"validation_status":"score_only:v0-immature-baseline","note":"Baseline scores from an immature model (maturity gate not passed). Scores rank; they never assert a category."}}