{"id":"W2058843548","doi":"10.1016/j.microrel.2007.01.081","title":"Dynamic behavior of resistive faults in nanometer technology","year":2007,"lang":"en","type":"article","venue":"Microelectronics Reliability","topic":"VLSI and Analog Circuit Testing","field":"Computer Science","cited_by":7,"is_retracted":false,"has_abstract":false,"ca_institutions":"Toronto Metropolitan University","funders":"","keywords":"Resistive touchscreen; CMOS; Resistor; Electronic circuit; Transistor; Electronic engineering; Nanometre; Materials science; Fault (geology); Logic gate; Electrical engineering; Engineering; Optoelectronics; Voltage","routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false,"invisible_to_affiliation_only":false},"retraction":null,"screen":null,"direct_labels":[],"prediction":{"model_version":"metacan-v3-hybrid-931329e0061c","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0001492955,0.0001821388,0.000172926,0.0005823919,0.0001839152,0.0003045268,0.0003870833,0.0004120592,0.002566497],"category_scores_gemma":[0.002296015,0.0001244273,0.0001132668,0.0004143914,0.0003467046,0.0007627273,0.0001823301,0.0003791989,0.0002583624],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0004552669,"about_ca_system_score_gemma":0.0001459019,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.0007485774,"about_ca_topic_score_gemma":0.0007569819,"domain_scores_codex":[0.9998952,0.00001277,0.000003220235,0.00002410204,0.00003795271,0.00002672143],"domain_scores_gemma":[0.9990718,0.0005141446,0.0001378278,0.00008314631,0.0001270825,0.00006601017],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"simulation_or_modeling","study_design_gemma":"simulation_or_modeling","study_design_scores_codex":[0.001287496,0.0005022457,0.02060903,0.0002661705,0.0001046209,0.001512693,0.0005277403,0.4272861,0.3958902,0.05966417,0.003088967,0.08926057],"study_design_scores_gemma":[0.00005900799,0.0005863991,0.01711129,0.00003452785,0.00003987045,0.0008179182,0.0001463935,0.9105896,0.05145407,0.01639587,0.002717845,0.00004720729],"study_design_candidate":"simulation_or_modeling","study_design_consensus":"simulation_or_modeling","genre_codex":"empirical","genre_gemma":"empirical","genre_scores_codex":[0.9810379,0.0009427807,0.01128877,0.0003137519,0.0000257336,0.00001458785,0.0002298205,0.0003208751,0.005825717],"genre_scores_gemma":[0.9985672,0.00008593192,0.0004604309,0.00001841777,0.000006999196,0.000003701856,0.00006757931,0.00001238054,0.0007771558],"genre_candidate":"empirical","genre_consensus":"empirical","teacher_disagreement_score":0.002566497,"threshold_uncertainty_score":0.008585751,"prediction_status":"machine_predicted_unvalidated"},"machine_scores":{"provisional":true,"baseline":true,"maturity_gate_passed":false,"score_opus":0.005357918778952152,"score_gpt":0.2509441040758872,"score_spread":0.2455861852969351,"validation_status":"score_only:v0-immature-baseline","note":"Baseline scores from an immature model (maturity gate not passed). Scores rank; they never assert a category."}}