{"id":"W2062753030","doi":"10.1109/isqed.2007.63","title":"DFT and Test: Ensuring Product Quality","year":2007,"lang":"en","type":"article","venue":"","topic":"Integrated Circuits and Semiconductor Failure Analysis","field":"Engineering","cited_by":0,"is_retracted":false,"has_abstract":true,"ca_institutions":"Advanced Micro Devices (Canada)","funders":"","keywords":"Design for manufacturability; Automatic test pattern generation; Reliability engineering; Design for testing; Computer science; Test (biology); Yield (engineering); Quality (philosophy); Product (mathematics); Engineering; Electronic circuit; Electrical engineering","routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false,"invisible_to_affiliation_only":false},"retraction":null,"screen":null,"direct_labels":[],"prediction":{"model_version":"codex-gemma-dda1882f352a","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0003523189,0.00009146247,0.0001197455,0.00007031923,0.00003305076,0.00002659383,0.0000478531,0.00003696126,0.0001264939],"category_scores_gemma":[0.00008017617,0.00007433116,0.00002982196,0.0001494837,0.00001669915,0.00007715996,0.000006629162,0.000110841,0.00002181298],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.00002117599,"about_ca_system_score_gemma":0.000003677927,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.0001223168,"about_ca_topic_score_gemma":0.0002199708,"domain_scores_codex":[0.9994171,0.000005100859,0.0001790038,0.000129447,0.00007897341,0.000190337],"domain_scores_gemma":[0.9996614,0.00008753106,0.0000108859,0.0001460715,0.00003739845,0.0000566791],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","study_design_scores_codex":[0.000002620664,0.00003407992,0.05486418,0.0000965547,0.0001625753,0.00001676546,0.0007864409,0.0002232027,0.8870153,0.008101881,0.002892828,0.04580361],"study_design_scores_gemma":[0.0003757003,0.00003511581,0.09285723,0.00003019023,0.00008430581,0.00003882533,0.001157705,0.002551638,0.8655152,0.0005106882,0.0360084,0.0008349742],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","genre_codex":"empirical","genre_gemma":"empirical","genre_scores_codex":[0.9467605,0.000376647,0.001244163,0.00004108947,0.00008849799,0.00004500023,0.000001864473,0.000267441,0.05117475],"genre_scores_gemma":[0.998455,0.0000248161,0.0003332963,0.00004023504,0.00009082416,8.780172e-7,0.000002596233,0.00001258814,0.001039781],"genre_candidate":"empirical","genre_consensus":"empirical","teacher_disagreement_score":0.05169444,"threshold_uncertainty_score":0.3031137,"prediction_status":"machine_predicted_unvalidated"},"machine_scores":{"provisional":true,"baseline":true,"maturity_gate_passed":false,"score_opus":0.01245162517784238,"score_gpt":0.2341889875649573,"score_spread":0.221737362387115,"validation_status":"score_only:v0-immature-baseline","note":"Baseline scores from an immature model (maturity gate not passed). Scores rank; they never assert a category."}}