{"id":"W2062753030","doi":"10.1109/isqed.2007.63","title":"DFT and Test: Ensuring Product Quality","year":2007,"lang":"en","type":"article","venue":"","topic":"Integrated Circuits and Semiconductor Failure Analysis","field":"Engineering","cited_by":0,"is_retracted":false,"has_abstract":true,"ca_institutions":"Advanced Micro Devices (Canada)","funders":"","keywords":"Design for manufacturability; Automatic test pattern generation; Reliability engineering; Design for testing; Computer science; Test (biology); Yield (engineering); Quality (philosophy); Product (mathematics); Engineering; Electronic circuit; Electrical engineering","routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false,"invisible_to_affiliation_only":false},"retraction":null,"screen":null,"direct_labels":[],"prediction":{"model_version":"metacan-v3-hybrid-931329e0061c","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.007655214,0.000827906,0.001028123,0.001371511,0.0006722042,0.003590909,0.002230664,0.002550903,0.007891734],"category_scores_gemma":[0.02404474,0.0005241518,0.0004355369,0.0008923962,0.002816289,0.003734059,0.002489409,0.00147931,0.004308499],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.001274459,"about_ca_system_score_gemma":0.002556724,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.001896896,"about_ca_topic_score_gemma":0.001029436,"domain_scores_codex":[0.9930396,0.00163718,0.0004259821,0.000551843,0.00402515,0.0003202814],"domain_scores_gemma":[0.9787558,0.008888768,0.002070717,0.004827743,0.004749194,0.0007077804],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"design_other","study_design_gemma":"not_applicable","study_design_scores_codex":[0.000221469,0.0001047355,0.003721166,0.000637612,0.0000521919,0.0003050253,0.0003235519,0.01350536,0.01533884,0.08222649,0.02271412,0.8608495],"study_design_scores_gemma":[0.000406847,0.001708668,0.01124359,0.001102321,0.0001756078,0.002442433,0.0009178823,0.1286896,0.05321112,0.3785151,0.4213671,0.0002196368],"study_design_candidate":"not_applicable","study_design_consensus":null,"genre_codex":"methods","genre_gemma":"empirical","genre_scores_codex":[0.02481286,0.01064031,0.9021466,0.01505439,0.001124023,0.0002788055,0.0004714582,0.005523656,0.03994795],"genre_scores_gemma":[0.4250171,0.007687381,0.5381829,0.004087513,0.001359051,0.000442456,0.001056549,0.001209105,0.020958],"genre_candidate":"empirical","genre_consensus":null,"teacher_disagreement_score":0.007891734,"threshold_uncertainty_score":0.04048514,"prediction_status":"machine_predicted_unvalidated"},"machine_scores":{"provisional":true,"baseline":true,"maturity_gate_passed":false,"score_opus":0.01245162517784238,"score_gpt":0.2341889875649573,"score_spread":0.221737362387115,"validation_status":"score_only:v0-immature-baseline","note":"Baseline scores from an immature model (maturity gate not passed). Scores rank; they never assert a category."}}