{"id":"W2066977219","doi":"10.1155/2014/529392","title":"Gate-Level Circuit Reliability Analysis: A Survey","year":2014,"lang":"en","type":"article","venue":"VLSI design","topic":"Radiation Effects in Electronics","field":"Engineering","cited_by":23,"is_retracted":false,"has_abstract":true,"ca_institutions":"University of Windsor","funders":"","keywords":"Reliability (semiconductor); Reliability engineering; Computer science; Nanoelectronics; Circuit design; Electronic circuit; Electronic engineering; Engineering; Electrical engineering; Embedded system; Materials science","routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false,"invisible_to_affiliation_only":false},"retraction":null,"screen":null,"direct_labels":[],"prediction":{"model_version":"codex-gemma-dda1882f352a","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.002198032,0.0001508839,0.0002509925,0.0001679024,0.00004637491,0.000037982,0.0002073523,0.0001021471,0.00006771328],"category_scores_gemma":[0.0005565675,0.0001562085,0.00008964095,0.0009208462,0.00002318044,0.00009082333,0.00000872365,0.0001707319,0.0001631804],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0001629724,"about_ca_system_score_gemma":0.00002820335,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.00006687256,"about_ca_topic_score_gemma":0.00005913707,"domain_scores_codex":[0.9985857,0.0004473194,0.0002248473,0.0002274875,0.0001872635,0.0003273784],"domain_scores_gemma":[0.99855,0.0007565151,0.00003250563,0.0005197321,0.00005831767,0.0000829495],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"simulation_or_modeling","study_design_gemma":"simulation_or_modeling","study_design_scores_codex":[0.000003187567,0.00001283282,0.00167676,0.00001435191,0.0001660475,4.174085e-7,0.00005856669,0.9918274,0.0002734783,0.0002240631,0.001361565,0.004381367],"study_design_scores_gemma":[0.000149358,0.0000386363,0.1076616,0.000002513276,0.0001027763,6.255886e-7,0.000001391022,0.8891342,0.001177558,0.0007069951,0.0008346864,0.000189705],"study_design_candidate":"simulation_or_modeling","study_design_consensus":"simulation_or_modeling","genre_codex":"methods","genre_gemma":"empirical","genre_scores_codex":[0.0636482,0.00009456558,0.9339287,0.00001142936,0.000176526,0.0001762568,0.00001061593,0.0003980112,0.001555664],"genre_scores_gemma":[0.9974126,0.0000101335,0.002282611,0.00003832867,0.00005051177,0.00001782026,0.00002223608,0.00003358939,0.0001322222],"genre_candidate":"empirical","genre_consensus":null,"teacher_disagreement_score":0.9337643,"threshold_uncertainty_score":0.6369996,"prediction_status":"machine_predicted_unvalidated"},"machine_scores":{"provisional":true,"baseline":true,"maturity_gate_passed":false,"score_opus":0.03676786238635493,"score_gpt":0.2226252141503688,"score_spread":0.1858573517640139,"validation_status":"score_only:v0-immature-baseline","note":"Baseline scores from an immature model (maturity gate not passed). Scores rank; they never assert a category."}}