{"id":"W2075491369","doi":"10.1149/2.001206esl","title":"Hot Carrier Effect on Gate-Induced Drain Leakage Current in n-MOSFETs with HfO2∕Ti1-xNx Gate Stacks","year":2012,"lang":"en","type":"article","venue":"Electrochemical and Solid-State Letters","topic":"Semiconductor materials and devices","field":"Engineering","cited_by":2,"is_retracted":false,"has_abstract":true,"ca_institutions":"University of British Columbia","funders":"National Science Council","keywords":"Materials science; Gate dielectric; Gate oxide; Optoelectronics; Leakage (economics); Metal gate; Oxide; Nitride; Transistor; Dielectric; Threshold voltage; High-κ dielectric; Voltage; Electrical engineering; Nanotechnology; Layer (electronics); Metallurgy","routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false,"invisible_to_affiliation_only":false},"retraction":null,"screen":null,"direct_labels":[],"prediction":{"model_version":"codex-gemma-dda1882f352a","candidate_categories":["metaepi_narrow"],"consensus_categories":[],"category_scores_codex":[0.0002000962,0.0004011566,0.0004356877,0.00010553,0.00005171534,0.00007481219,0.0001323524,0.00009661476,0.00003270445],"category_scores_gemma":[0.00001603341,0.000313344,0.00005354245,0.0001676856,0.00005307645,0.0002082309,0.00002955012,0.0004666891,0.00002328703],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0001109303,"about_ca_system_score_gemma":0.00001055243,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.00002010494,"about_ca_topic_score_gemma":0.00001282891,"domain_scores_codex":[0.9981537,0.00007216067,0.0002821256,0.0003286353,0.0002224278,0.0009409148],"domain_scores_gemma":[0.9993817,0.0001078136,0.00004412036,0.0002066137,0.00001293424,0.0002468791],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","study_design_scores_codex":[0.0001606677,0.00002931173,0.001069597,0.0001550601,0.00004012547,0.0000151111,0.0006342148,0.00008731116,0.9968397,0.00001082513,0.0004011104,0.000556991],"study_design_scores_gemma":[0.0009760526,0.0001908885,0.001489035,0.0001243671,0.00002341334,0.00001711015,0.00001726632,0.0002897149,0.9948537,0.00002943229,0.001487632,0.0005013905],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","genre_codex":"empirical","genre_gemma":"empirical","genre_scores_codex":[0.9983445,0.0005268948,0.00005260033,0.0001673597,0.0003016618,0.0002549401,0.00001292684,0.000166973,0.0001721722],"genre_scores_gemma":[0.9988362,0.00005926808,0.00002291827,0.000673399,0.0002459007,0.00005014887,0.00003726852,0.00006563306,0.000009255343],"genre_candidate":"empirical","genre_consensus":"empirical","teacher_disagreement_score":0.001985977,"threshold_uncertainty_score":0.9999319,"prediction_status":"machine_predicted_unvalidated"},"machine_scores":{"provisional":true,"baseline":true,"maturity_gate_passed":false,"score_opus":0.00655411760672667,"score_gpt":0.2289139831599118,"score_spread":0.2223598655531851,"validation_status":"score_only:v0-immature-baseline","note":"Baseline scores from an immature model (maturity gate not passed). Scores rank; they never assert a category."}}