{"id":"W2085837170","doi":"10.1007/s10845-014-0956-x","title":"Simulation-based optimization of sampling plans to reduce inspections while mastering the risk exposure in semiconductor manufacturing","year":2014,"lang":"en","type":"article","venue":"Journal of Intelligent Manufacturing","topic":"Manufacturing Process and Optimization","field":"Engineering","cited_by":26,"is_retracted":false,"has_abstract":false,"ca_institutions":"Polytechnique Montréal","funders":"Natural Sciences and Engineering Research Council of Canada","keywords":"Metrology; Reliability engineering; Semiconductor device fabrication; Wafer fabrication; Context (archaeology); Quality assurance; Engineering; Reliability (semiconductor); Quality (philosophy); Product (mathematics); Process (computing); Production line; Computer science; Manufacturing engineering; Wafer; Risk analysis (engineering); Operations management; Mechanical engineering; Mathematics; Power (physics)","routes":{"ca_aff":true,"ca_fund":true,"ca_venue":false,"about_ca":false,"invisible_to_affiliation_only":false},"retraction":null,"screen":null,"direct_labels":[],"prediction":{"model_version":"codex-gemma-dda1882f352a","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0006129089,0.0002616386,0.0003608797,0.0005855582,0.000125649,0.00009134025,0.0003529918,0.0001071964,0.0001008381],"category_scores_gemma":[0.0002169302,0.0002110909,0.0001380078,0.0001641201,0.00002417008,0.0002990817,0.00004354704,0.0004885465,0.000003741225],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0001869971,"about_ca_system_score_gemma":0.00002526904,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.00002831632,"about_ca_topic_score_gemma":0.00003639719,"domain_scores_codex":[0.9980986,0.00007269806,0.001013319,0.0001897586,0.0003344176,0.0002912492],"domain_scores_gemma":[0.9984915,0.0005789007,0.0004326311,0.0002790462,0.0001064893,0.000111465],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"simulation_or_modeling","study_design_gemma":"simulation_or_modeling","study_design_scores_codex":[0.00004574034,0.00002638011,0.0005291402,0.0001316707,0.00003974625,0.000001294025,0.0008260135,0.9923151,0.0005694143,0.000005525668,0.000006326397,0.005503635],"study_design_scores_gemma":[0.0002723575,0.00006858687,0.002644822,0.0003066152,0.00003295755,0.000004827443,0.0002350886,0.5886967,0.4069069,0.00004718173,0.0005914768,0.0001924584],"study_design_candidate":"simulation_or_modeling","study_design_consensus":"simulation_or_modeling","genre_codex":"methods","genre_gemma":"empirical","genre_scores_codex":[0.4953004,0.00005554512,0.5039016,0.00004213688,0.0003983721,0.0001468019,0.000005637935,0.0000387453,0.0001107534],"genre_scores_gemma":[0.9862227,0.00008656987,0.01333433,0.00003300427,0.0002440643,0.00000756344,0.000005045478,0.00005260826,0.00001410017],"genre_candidate":"empirical","genre_consensus":null,"teacher_disagreement_score":0.4909223,"threshold_uncertainty_score":0.8608037,"prediction_status":"machine_predicted_unvalidated"},"machine_scores":{"provisional":true,"baseline":true,"maturity_gate_passed":false,"score_opus":0.0249327460876572,"score_gpt":0.2488971023312455,"score_spread":0.2239643562435883,"validation_status":"score_only:v0-immature-baseline","note":"Baseline scores from an immature model (maturity gate not passed). Scores rank; they never assert a category."}}