{"id":"W2106290576","doi":"10.1109/tdmr.2004.826591","title":"CMOS IC Technology Scaling and Its Impact on Burn-In","year":2004,"lang":"en","type":"article","venue":"IEEE Transactions on Device and Materials Reliability","topic":"Semiconductor materials and devices","field":"Engineering","cited_by":38,"is_retracted":false,"has_abstract":true,"ca_institutions":"University of Waterloo","funders":"","keywords":"Burn-in; Thermal runaway; CMOS; Junction temperature; Leakage (economics); Scaling; Reliability (semiconductor); Materials science; Burn out; Thermal; Electrical engineering; Electronic engineering; Engineering physics; Engineering; Nuclear engineering; Optoelectronics; Physics","routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false,"invisible_to_affiliation_only":false},"retraction":null,"screen":null,"direct_labels":[],"prediction":{"model_version":"codex-gemma-dda1882f352a","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0002835364,0.0002377448,0.0003600619,0.0001879883,0.00007333385,0.00006982665,0.0000760699,0.0002081352,0.0001065757],"category_scores_gemma":[0.000009140853,0.000197617,0.00003483651,0.0001784343,0.00004651811,0.0001746576,0.000001895123,0.0001395884,0.00003317386],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0001434541,"about_ca_system_score_gemma":0.0000186384,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.0002084806,"about_ca_topic_score_gemma":0.0000397668,"domain_scores_codex":[0.9989272,0.00003403728,0.0003301953,0.0003175785,0.00008787424,0.0003030721],"domain_scores_gemma":[0.9995716,0.000056366,0.00003023071,0.0002258205,0.00002757104,0.00008845894],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","study_design_scores_codex":[0.0001019811,0.00009959348,0.00004368438,0.0003531536,0.00002622232,0.000006871534,0.0002138919,0.02696206,0.9707869,0.00006922259,0.000003005505,0.001333407],"study_design_scores_gemma":[0.0006694471,0.0001412114,0.001341145,0.000167128,0.0000235937,0.00001758343,0.00007838078,0.0002459291,0.9960698,0.0009408671,0.0000619511,0.0002429705],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","genre_codex":"empirical","genre_gemma":"empirical","genre_scores_codex":[0.9974024,0.0002507491,0.0007259992,0.000119123,0.0008559451,0.000296163,0.00007037683,0.0002461454,0.00003311704],"genre_scores_gemma":[0.9992167,0.0004840794,0.0001258403,0.00005410439,0.0000364123,0.0000496898,0.000001986984,0.00002741158,0.00000379928],"genre_candidate":"empirical","genre_consensus":"empirical","teacher_disagreement_score":0.02671613,"threshold_uncertainty_score":0.8058589,"prediction_status":"machine_predicted_unvalidated"},"machine_scores":{"provisional":true,"baseline":true,"maturity_gate_passed":false,"score_opus":0.009856214302165113,"score_gpt":0.2533488184691662,"score_spread":0.2434926041670011,"validation_status":"score_only:v0-immature-baseline","note":"Baseline scores from an immature model (maturity gate not passed). Scores rank; they never assert a category."}}