{"id":"W2112301210","doi":"10.1109/ias.1990.152287","title":"ESD latency effects in CMOS integrated circuits","year":2002,"lang":"en","type":"article","venue":"","topic":"Electrostatic Discharge in Electronics","field":"Engineering","cited_by":2,"is_retracted":false,"has_abstract":true,"ca_institutions":"Western University","funders":"","keywords":"CMOS; Electrostatic discharge; Electronic circuit; Integrated circuit; Electronic engineering; Amplitude; Iddq testing; Computer science; Reliability engineering; Engineering; Electrical engineering; Voltage; Physics","routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false,"invisible_to_affiliation_only":false},"retraction":null,"screen":null,"direct_labels":[],"prediction":{"model_version":"codex-gemma-dda1882f352a","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00007097617,0.0001559101,0.0001618715,0.0001129771,0.00001528822,0.00002285772,0.000135994,0.00007770917,0.0006042754],"category_scores_gemma":[0.00004862493,0.0001463631,0.00002972744,0.0004544942,0.00001182411,0.0001192535,0.000008134464,0.000297127,0.0004819098],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0001458596,"about_ca_system_score_gemma":0.000008374334,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.00002474979,"about_ca_topic_score_gemma":0.000130221,"domain_scores_codex":[0.9990513,0.00002082095,0.0001894161,0.0001434695,0.0001118396,0.0004831816],"domain_scores_gemma":[0.9996662,0.00007737808,0.00001057917,0.0001727233,0.00001722016,0.00005591474],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"design_other","study_design_gemma":"simulation_or_modeling","study_design_scores_codex":[0.000009574617,0.000822013,0.01397944,0.001023668,0.0003748672,0.0004801551,0.005756011,0.03508211,0.2228626,0.09201911,0.08946779,0.5381226],"study_design_scores_gemma":[0.001428857,0.0002312357,0.002222497,0.0001364358,0.00002050438,0.00003262039,0.00004291767,0.9205479,0.06042737,0.005884616,0.008227302,0.00079775],"study_design_candidate":"simulation_or_modeling","study_design_consensus":null,"genre_codex":"empirical","genre_gemma":"empirical","genre_scores_codex":[0.8261628,0.002855374,0.01159925,0.0001507571,0.0004043785,0.0005227539,0.000002846208,0.001258995,0.1570428],"genre_scores_gemma":[0.9977982,0.0001449206,0.0003453027,0.00008344942,0.0000180282,0.00003550193,0.000005545411,0.0000414564,0.001527588],"genre_candidate":"empirical","genre_consensus":"empirical","teacher_disagreement_score":0.8854658,"threshold_uncertainty_score":0.6616392,"prediction_status":"machine_predicted_unvalidated"},"machine_scores":{"provisional":true,"baseline":true,"maturity_gate_passed":false,"score_opus":0.00600961885235564,"score_gpt":0.1815087291755282,"score_spread":0.1754991103231726,"validation_status":"score_only:v0-immature-baseline","note":"Baseline scores from an immature model (maturity gate not passed). Scores rank; they never assert a category."}}