{"id":"W2115695824","doi":"10.1109/imtc.2007.379055","title":"VLSI Circuit Test Vector Compression Technique","year":2007,"lang":"en","type":"article","venue":"Conference proceedings - IEEE Instrumentation/Measurement Technology Conference","topic":"VLSI and Analog Circuit Testing","field":"Computer Science","cited_by":3,"is_retracted":false,"has_abstract":true,"ca_institutions":"University of Ottawa","funders":"","keywords":"Lossless compression; Computer science; Computer hardware; Very-large-scale integration; Test vector; Data compression; Chip; Embedded system; Overhead (engineering); Benchmark (surveying); Test compression; Automatic test pattern generation; Test set; Electronic circuit; Engineering; Algorithm; Electrical engineering","routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false,"invisible_to_affiliation_only":false},"retraction":null,"screen":null,"direct_labels":[],"prediction":{"model_version":"codex-gemma-dda1882f352a","candidate_categories":["metaepi_narrow"],"consensus_categories":[],"category_scores_codex":[0.001810089,0.0006520316,0.0005752392,0.001119671,0.0007107545,0.0007774569,0.00286398,0.0005424555,0.00007545015],"category_scores_gemma":[0.0007825899,0.0006738966,0.0001143392,0.002032617,0.0004967014,0.001604578,0.0003942291,0.0009582363,0.0001188678],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0004973945,"about_ca_system_score_gemma":0.0006086046,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.00002746577,"about_ca_topic_score_gemma":0.00002911505,"domain_scores_codex":[0.9948421,0.00002604111,0.001106148,0.001404993,0.001388429,0.001232336],"domain_scores_gemma":[0.9954349,0.0001142277,0.0007514115,0.0006613045,0.002724161,0.0003139625],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","study_design_scores_codex":[0.000002437297,0.0002198645,0.03902834,0.00008756644,0.00003530179,0.00002013923,0.0005647906,7.455853e-7,0.7021058,0.09795606,0.0002283345,0.1597506],"study_design_scores_gemma":[0.001693205,0.0007569685,0.01404108,0.001380515,0.00006404835,0.0003446937,0.001649835,0.005879174,0.9242703,0.04715901,0.001086819,0.001674323],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","genre_codex":"methods","genre_gemma":"empirical","genre_scores_codex":[0.106492,0.00007992829,0.8752416,0.001605004,0.0006073085,0.001241873,0.000006557918,0.002455586,0.01227007],"genre_scores_gemma":[0.9902349,0.00003368594,0.008939413,0.0002584476,0.0001042073,0.000302704,0.000006370932,0.00003808743,0.00008223855],"genre_candidate":"empirical","genre_consensus":null,"teacher_disagreement_score":0.8837428,"threshold_uncertainty_score":0.9995712,"prediction_status":"machine_predicted_unvalidated"},"machine_scores":{"provisional":true,"baseline":true,"maturity_gate_passed":false,"score_opus":0.06027188924241896,"score_gpt":0.2651712639284405,"score_spread":0.2048993746860215,"validation_status":"score_only:v0-immature-baseline","note":"Baseline scores from an immature model (maturity gate not passed). Scores rank; they never assert a category."}}