{"id":"W2117274978","doi":"10.1016/j.micron.2004.02.003","title":"Radiation damage in the TEM and SEM","year":2004,"lang":"pt","type":"review","venue":"Micron","topic":"Electron and X-Ray Spectroscopy Techniques","field":"Materials Science","cited_by":2088,"is_retracted":false,"has_abstract":false,"ca_institutions":"University of Alberta","funders":"Natural Sciences and Engineering Research Council of Canada","keywords":"Radiation damage; Materials science; Ionization; Irradiation; Radiation; Radiolysis; Scanning electron microscope; Electron microscope; Electron; Cathode ray; Contamination; Atomic physics; Analytical Chemistry (journal); Optics; Composite material; Ion; Chemistry; Environmental chemistry; Physics; Nuclear physics","routes":{"ca_aff":true,"ca_fund":true,"ca_venue":false,"about_ca":false,"invisible_to_affiliation_only":false},"retraction":null,"screen":null}