{"id":"W2376944097","doi":"","title":"General Auto Test and Fault Diagnosis System for Electronic Circuits","year":2005,"lang":"en","type":"article","venue":"Yuhang jice jishu","topic":"Engineering and Test Systems","field":"Engineering","cited_by":0,"is_retracted":false,"has_abstract":true,"ca_institutions":"CAE (Canada)","funders":"","keywords":"Fault (geology); Test (biology); Electronic circuit; Digital electronics; Fault coverage; Reliability engineering; Engineering; Automatic test pattern generation; Analogue electronics; Calibration; Electronic engineering; Computer science; Embedded system; Electrical engineering; Mathematics","routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false,"invisible_to_affiliation_only":false},"retraction":null,"screen":null,"direct_labels":[],"prediction":{"model_version":"codex-gemma-dda1882f352a","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0001438977,0.0001866712,0.0002137727,0.00007869757,0.00006541745,0.00006133066,0.0001091641,0.0001058463,0.000005465784],"category_scores_gemma":[0.00004967901,0.0001979456,0.00005389082,0.000122445,0.000009269832,0.0001221276,0.00001256474,0.0001225835,0.00004437025],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0002088771,"about_ca_system_score_gemma":0.00001289297,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.00002591386,"about_ca_topic_score_gemma":0.00004404468,"domain_scores_codex":[0.999019,0.000007691992,0.0002033198,0.0001989521,0.0001041632,0.0004668697],"domain_scores_gemma":[0.9994779,0.0001750026,0.00002338331,0.0001924209,0.00003135921,0.00009999532],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"simulation_or_modeling","study_design_gemma":"simulation_or_modeling","study_design_scores_codex":[0.00001389443,0.0003637689,0.03999817,0.01237138,0.001061846,0.00005587967,0.004081848,0.4784964,0.1315581,0.02068507,0.09520967,0.216104],"study_design_scores_gemma":[0.001274387,0.0001702229,0.004792883,0.0004212067,0.0001084074,0.0001206673,0.0001231069,0.7184544,0.01727142,0.00002441209,0.2563396,0.0008993046],"study_design_candidate":"simulation_or_modeling","study_design_consensus":"simulation_or_modeling","genre_codex":"empirical","genre_gemma":"empirical","genre_scores_codex":[0.9619192,0.01041019,0.01723574,0.0002409966,0.001103998,0.0009009608,0.00009766336,0.003310427,0.004780771],"genre_scores_gemma":[0.9976366,0.00009256324,0.000440934,0.0000262764,0.0008326967,0.0003737484,0.00001299183,0.00007301243,0.0005112169],"genre_candidate":"empirical","genre_consensus":"empirical","teacher_disagreement_score":0.239958,"threshold_uncertainty_score":0.8071989,"prediction_status":"machine_predicted_unvalidated"},"machine_scores":{"provisional":true,"baseline":true,"maturity_gate_passed":false,"score_opus":0.007049995894505353,"score_gpt":0.1966820700903075,"score_spread":0.1896320741958022,"validation_status":"score_only:v0-immature-baseline","note":"Baseline scores from an immature model (maturity gate not passed). Scores rank; they never assert a category."}}