{"id":"W2467562523","doi":"10.31399/asm.cp.istfa2015p0344","title":"Tester Assisted Multiple Emission Microscopy","year":2015,"lang":"en","type":"article","venue":"Proceedings - International Symposium for Testing and Failure Analysis","topic":"Integrated Circuits and Semiconductor Failure Analysis","field":"Engineering","cited_by":0,"is_retracted":false,"has_abstract":true,"ca_institutions":"Infineon Technologies (Canada)","funders":"","keywords":"Iddq testing; Microscopy; Materials science; Atomic force microscopy; Current (fluid); Computer science; Nanotechnology; Optoelectronics; Optics; Engineering; Electrical engineering; Physics; CMOS","routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false,"invisible_to_affiliation_only":false},"retraction":null,"screen":null,"direct_labels":[],"prediction":{"model_version":"metacan-v3-hybrid-931329e0061c","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0007579413,0.0006850744,0.0004505062,0.0009249239,0.0003981425,0.0008795634,0.001466932,0.001379765,0.0164633],"category_scores_gemma":[0.0006612458,0.0004775533,0.000327475,0.0004384713,0.000366614,0.0007869581,0.0009420916,0.001041413,0.003490322],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0005200518,"about_ca_system_score_gemma":0.0004742861,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.0006492804,"about_ca_topic_score_gemma":0.001700748,"domain_scores_codex":[0.9992441,0.0001097144,0.00004243155,0.000222003,0.0002866183,0.00009515866],"domain_scores_gemma":[0.9991309,0.0002525763,0.00008683843,0.0002192505,0.0002534679,0.00005701058],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","study_design_scores_codex":[0.00004906111,0.00003073323,0.0003793443,0.00008206079,0.00001016629,0.000121385,0.00004663219,0.0004459548,0.983263,0.001179675,0.001181645,0.01321026],"study_design_scores_gemma":[0.00003273253,0.0001618207,0.002424287,0.0000173081,0.00001642274,0.0007740277,0.00006305058,0.03427374,0.9389388,0.0005504118,0.02268173,0.00006567512],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","genre_codex":"methods","genre_gemma":"empirical","genre_scores_codex":[0.2810098,0.001008243,0.6783184,0.0004653873,0.0003172836,0.0004444926,0.002305671,0.01300413,0.02312665],"genre_scores_gemma":[0.5091676,0.0005247646,0.4575015,0.0003041594,0.0000589523,0.0005736572,0.001926924,0.001097383,0.02884519],"genre_candidate":"empirical","genre_consensus":null,"teacher_disagreement_score":0.0164633,"threshold_uncertainty_score":0.05507523,"prediction_status":"machine_predicted_unvalidated"},"machine_scores":{"provisional":true,"baseline":true,"maturity_gate_passed":false,"score_opus":0.02614856157457974,"score_gpt":0.2472140759193491,"score_spread":0.2210655143447694,"validation_status":"score_only:v0-immature-baseline","note":"Baseline scores from an immature model (maturity gate not passed). Scores rank; they never assert a category."}}