{"id":"W2467562523","doi":"10.31399/asm.cp.istfa2015p0344","title":"Tester Assisted Multiple Emission Microscopy","year":2015,"lang":"en","type":"article","venue":"Proceedings - International Symposium for Testing and Failure Analysis","topic":"Integrated Circuits and Semiconductor Failure Analysis","field":"Engineering","cited_by":0,"is_retracted":false,"has_abstract":true,"ca_institutions":"Infineon Technologies (Canada)","funders":"","keywords":"Iddq testing; Microscopy; Materials science; Atomic force microscopy; Current (fluid); Computer science; Nanotechnology; Optoelectronics; Optics; Engineering; Electrical engineering; Physics; CMOS","routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false,"invisible_to_affiliation_only":false},"retraction":null,"screen":null,"direct_labels":[],"prediction":{"model_version":"codex-gemma-dda1882f352a","candidate_categories":["metaepi_narrow"],"consensus_categories":[],"category_scores_codex":[0.0002942419,0.0002831275,0.0003776774,0.0004101857,0.0001343968,0.0003604149,0.0002627675,0.0001553569,0.00001771654],"category_scores_gemma":[0.0005124701,0.0002513308,0.0002170544,0.00101309,0.00004545362,0.0003667759,0.00003697583,0.0001879686,0.000006579545],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0001340104,"about_ca_system_score_gemma":0.00001907553,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.0001297584,"about_ca_topic_score_gemma":0.00003811302,"domain_scores_codex":[0.9985581,0.0000053828,0.0004243804,0.0004060894,0.0002941949,0.0003118392],"domain_scores_gemma":[0.9983943,0.0001530793,0.0001233631,0.000102265,0.001003886,0.0002230765],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"bench_or_experimental","study_design_gemma":"simulation_or_modeling","study_design_scores_codex":[0.00003249901,0.00007275323,0.2426963,0.00008318471,0.003485171,0.00000307749,0.000947353,0.003047792,0.7335973,0.0002189666,0.01377426,0.002041401],"study_design_scores_gemma":[0.001645239,0.0001655184,0.002687511,0.0001436644,0.003884977,0.00006566967,0.001515087,0.8980154,0.04320287,0.0006859353,0.04688779,0.001100286],"study_design_candidate":"simulation_or_modeling","study_design_consensus":null,"genre_codex":"empirical","genre_gemma":"empirical","genre_scores_codex":[0.9771619,0.0002876635,0.008222741,0.001294615,0.0004564975,0.0003418693,0.0001221488,0.0008171892,0.01129537],"genre_scores_gemma":[0.9882986,0.00001243048,0.01039906,0.00008771144,0.0002678921,0.00005976631,0.0001297912,0.00004241382,0.000702364],"genre_candidate":"empirical","genre_consensus":"empirical","teacher_disagreement_score":0.8949677,"threshold_uncertainty_score":0.9999939,"prediction_status":"machine_predicted_unvalidated"},"machine_scores":{"provisional":true,"baseline":true,"maturity_gate_passed":false,"score_opus":0.02614856157457974,"score_gpt":0.2472140759193491,"score_spread":0.2210655143447694,"validation_status":"score_only:v0-immature-baseline","note":"Baseline scores from an immature model (maturity gate not passed). Scores rank; they never assert a category."}}