{"id":"W2982656188","doi":"10.1109/mwscas.2019.8884830","title":"Allocating Gate Reliability for Circuit Reliability Optimization","year":2019,"lang":"en","type":"article","venue":"","topic":"Radiation Effects in Electronics","field":"Engineering","cited_by":1,"is_retracted":false,"has_abstract":true,"ca_institutions":"University of Windsor","funders":"","keywords":"Reliability (semiconductor); Computer science; Reliability engineering; Circuit reliability; Digital electronics; Logic gate; Electronic circuit; Engineering; Algorithm; Electrical engineering","routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false,"invisible_to_affiliation_only":false},"retraction":null,"screen":null,"direct_labels":[],"prediction":{"model_version":"codex-gemma-dda1882f352a","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0005831482,0.0001231038,0.0001484019,0.0000364607,0.00003941398,0.00002616176,0.0001264679,0.000096069,0.0001965358],"category_scores_gemma":[0.0003050854,0.0001263218,0.00006157518,0.0001529307,0.0000136519,0.0001989893,0.00001092491,0.0001192423,0.00006215616],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0002921407,"about_ca_system_score_gemma":0.00003007817,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.00001074278,"about_ca_topic_score_gemma":0.000002879513,"domain_scores_codex":[0.9990812,0.00002803509,0.0002514084,0.0002404383,0.0001163493,0.0002825929],"domain_scores_gemma":[0.9990849,0.0003077643,0.000031814,0.000438309,0.00009095041,0.00004627189],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"simulation_or_modeling","study_design_gemma":"simulation_or_modeling","study_design_scores_codex":[0.000003418763,0.00001101112,0.0004986437,0.0001452914,0.000007911012,2.270647e-8,0.00004452961,0.995917,0.0003587385,0.001169932,0.0002608339,0.001582635],"study_design_scores_gemma":[0.00026967,0.00004625148,0.0004125167,0.000006937957,0.000007345715,5.19162e-7,0.000009145065,0.9947476,0.001537695,0.001064923,0.001742796,0.0001545614],"study_design_candidate":"simulation_or_modeling","study_design_consensus":"simulation_or_modeling","genre_codex":"methods","genre_gemma":"empirical","genre_scores_codex":[0.2800984,0.00005050687,0.7011014,0.0000923881,0.0005928741,0.001126257,0.000005047769,0.0008156138,0.01611754],"genre_scores_gemma":[0.9756129,0.000008674377,0.02371597,0.00005525623,0.00005379158,0.0000811733,0.00002420481,0.00004113161,0.0004068628],"genre_candidate":"empirical","genre_consensus":null,"teacher_disagreement_score":0.6955145,"threshold_uncertainty_score":0.5151255,"prediction_status":"machine_predicted_unvalidated"},"machine_scores":{"provisional":true,"baseline":true,"maturity_gate_passed":false,"score_opus":0.004683942487770941,"score_gpt":0.2007295974188288,"score_spread":0.1960456549310578,"validation_status":"score_only:v0-immature-baseline","note":"Baseline scores from an immature model (maturity gate not passed). Scores rank; they never assert a category."}}