{"id":"W4242195281","doi":"10.1142/s0129156401001088","title":"RF CMOS RELIABILITY","year":2001,"lang":"en","type":"article","venue":"International Journal of High Speed Electronics and Systems","topic":"Semiconductor materials and devices","field":"Engineering","cited_by":9,"is_retracted":false,"has_abstract":true,"ca_institutions":"McMaster University","funders":"","keywords":"NMOS logic; CMOS; Reliability (semiconductor); Transistor; Amplifier; Hot-carrier injection; Materials science; Electrical engineering; Electronic engineering; Electronic circuit; Noise (video); Optoelectronics; Voltage; Power (physics); Engineering; Computer science; Physics","routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false,"invisible_to_affiliation_only":false},"retraction":null,"screen":null,"direct_labels":[],"prediction":{"model_version":"codex-gemma-dda1882f352a","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0002870401,0.0000878162,0.0001860961,0.00008023356,0.00001736849,0.0001258923,0.000178726,0.00004790391,0.0000423224],"category_scores_gemma":[0.00001889171,0.00007078421,0.00004338873,0.00004042164,0.00001300784,0.0001704397,0.00001283276,0.0001172498,0.000005455042],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0001076803,"about_ca_system_score_gemma":0.00002486035,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.00006136054,"about_ca_topic_score_gemma":0.000005856638,"domain_scores_codex":[0.9991365,0.00001344422,0.0003867628,0.00006831231,0.0002579848,0.0001369627],"domain_scores_gemma":[0.9995109,0.00003421347,0.0001127786,0.00006813032,0.0002185074,0.00005545216],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"bench_or_experimental","study_design_gemma":"not_applicable","study_design_scores_codex":[0.0003990178,0.0001672237,0.01389663,0.0001841768,0.00134816,0.0003591337,0.0005403283,0.06943443,0.8749406,0.02262856,0.01022678,0.005874985],"study_design_scores_gemma":[0.005891216,0.001070823,0.01800221,0.000696463,0.0001818759,0.01166752,0.0006421078,0.05546502,0.07254758,0.01695027,0.8155028,0.001382074],"study_design_candidate":"bench_or_experimental","study_design_consensus":null,"genre_codex":"empirical","genre_gemma":"empirical","genre_scores_codex":[0.9907873,0.005120749,0.0001898323,0.0001378889,0.003040626,0.0000408749,0.000005257133,0.00002287157,0.0006545742],"genre_scores_gemma":[0.9971005,0.002048114,0.00002875163,0.0000230934,0.0007121573,5.530993e-7,0.00000246791,0.0000119644,0.00007243627],"genre_candidate":"empirical","genre_consensus":"empirical","teacher_disagreement_score":0.805276,"threshold_uncertainty_score":0.2886496,"prediction_status":"machine_predicted_unvalidated"},"machine_scores":{"provisional":true,"baseline":true,"maturity_gate_passed":false,"score_opus":0.008853379923957549,"score_gpt":0.2308468901136795,"score_spread":0.2219935101897219,"validation_status":"score_only:v0-immature-baseline","note":"Baseline scores from an immature model (maturity gate not passed). Scores rank; they never assert a category."}}