{"id":"W4242195281","doi":"10.1142/s0129156401001088","title":"RF CMOS RELIABILITY","year":2001,"lang":"en","type":"article","venue":"International Journal of High Speed Electronics and Systems","topic":"Semiconductor materials and devices","field":"Engineering","cited_by":9,"is_retracted":false,"has_abstract":true,"ca_institutions":"McMaster University","funders":"","keywords":"NMOS logic; CMOS; Reliability (semiconductor); Transistor; Amplifier; Hot-carrier injection; Materials science; Electrical engineering; Electronic engineering; Electronic circuit; Noise (video); Optoelectronics; Voltage; Power (physics); Engineering; Computer science; Physics","routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false,"invisible_to_affiliation_only":false},"retraction":null,"screen":null,"direct_labels":[],"prediction":{"model_version":"metacan-v3-hybrid-931329e0061c","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0002849759,0.0005594997,0.0005122991,0.0003969481,0.0003988489,0.0006057385,0.0006444403,0.0005553624,0.006881467],"category_scores_gemma":[0.00108173,0.0002816149,0.0004534748,0.0002718675,0.0002489343,0.0008924319,0.0004282932,0.0003887017,0.002686764],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0006482852,"about_ca_system_score_gemma":0.0002964895,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.0005024504,"about_ca_topic_score_gemma":0.0005922972,"domain_scores_codex":[0.9996364,0.0000299739,0.00001378654,0.00007520169,0.0001829309,0.00006170326],"domain_scores_gemma":[0.9995372,0.0001922578,0.00006890721,0.00005739738,0.0001349553,0.000009279895],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"design_other","study_design_gemma":"not_applicable","study_design_scores_codex":[0.000134665,0.00005315436,0.004002407,0.002746279,0.000183663,0.0007397321,0.0006378775,0.1727273,0.336709,0.1015728,0.01906196,0.3614312],"study_design_scores_gemma":[0.00004486902,0.001274021,0.01484211,0.0008421747,0.0004170325,0.006648723,0.0003710572,0.1900173,0.2982296,0.08163862,0.4054534,0.0002210659],"study_design_candidate":"not_applicable","study_design_consensus":null,"genre_codex":"methods","genre_gemma":"empirical","genre_scores_codex":[0.226373,0.1204947,0.4229639,0.002892246,0.001195387,0.0002334713,0.00202474,0.0031404,0.2206822],"genre_scores_gemma":[0.8958851,0.03778294,0.02961057,0.0003126382,0.0004965142,0.0001537084,0.0007492837,0.0003895118,0.03461982],"genre_candidate":"empirical","genre_consensus":null,"teacher_disagreement_score":0.006881467,"threshold_uncertainty_score":0.0230208,"prediction_status":"machine_predicted_unvalidated"},"machine_scores":{"provisional":true,"baseline":true,"maturity_gate_passed":false,"score_opus":0.008853379923957549,"score_gpt":0.2308468901136795,"score_spread":0.2219935101897219,"validation_status":"score_only:v0-immature-baseline","note":"Baseline scores from an immature model (maturity gate not passed). Scores rank; they never assert a category."}}