{"id":"W4289886486","doi":"10.31399/asm.edfa.2007-1.p006","title":"Interconnect Layout Sensitivity and Yield Prediction","year":2007,"lang":"en","type":"article","venue":"EDFA Technical Articles","topic":"Integrated Circuits and Semiconductor Failure Analysis","field":"Engineering","cited_by":0,"is_retracted":false,"has_abstract":true,"ca_institutions":"Abbott (Canada)","funders":"","keywords":"Sensitivity (control systems); Interconnection; Very-large-scale integration; Measure (data warehouse); Computer science; Process (computing); Reliability engineering; Vulnerability (computing); Yield (engineering); Integrated circuit layout; Simple (philosophy); Physical design; Channel (broadcasting); Electronic engineering; Integrated circuit; Circuit design; Engineering; Data mining; Embedded system; Materials science; Telecommunications; Programming language","routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false,"invisible_to_affiliation_only":false},"retraction":null,"screen":null,"direct_labels":[],"prediction":{"model_version":"metacan-v3-hybrid-931329e0061c","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0009717937,0.0004946551,0.000414372,0.0008091689,0.0001703787,0.0005043033,0.0005103289,0.0006578906,0.001599369],"category_scores_gemma":[0.007121473,0.0004249469,0.0003175236,0.0006458007,0.0004443802,0.0008478165,0.0006844293,0.0005585694,0.0003140808],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.00121141,"about_ca_system_score_gemma":0.0004237858,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.004835893,"about_ca_topic_score_gemma":0.002372647,"domain_scores_codex":[0.9995401,0.000142079,0.00001505734,0.0001021274,0.0001258226,0.00007487322],"domain_scores_gemma":[0.9965438,0.002349869,0.0003724241,0.0003536029,0.0003046122,0.00007570712],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"simulation_or_modeling","study_design_gemma":"simulation_or_modeling","study_design_scores_codex":[0.00001747106,0.00001096146,0.003680899,0.000006385034,0.00001126905,0.00002740174,0.000005570777,0.9904906,0.001362489,0.001412413,0.0001864872,0.002788085],"study_design_scores_gemma":[9.554324e-7,0.00001049873,0.0010105,0.000001714512,0.000002684969,0.000011699,0.000001643187,0.9971179,0.0006748844,0.001108941,0.00005470193,0.000003822769],"study_design_candidate":"simulation_or_modeling","study_design_consensus":"simulation_or_modeling","genre_codex":"empirical","genre_gemma":"empirical","genre_scores_codex":[0.6367427,0.0005509367,0.3528987,0.0005216587,0.00004385288,0.00003479936,0.0005463937,0.0009508628,0.007710183],"genre_scores_gemma":[0.9961095,0.00005472708,0.003194857,0.00002947073,0.000008982922,0.00000519296,0.0001021413,0.00002556718,0.0004695224],"genre_candidate":"empirical","genre_consensus":"empirical","teacher_disagreement_score":0.004835893,"threshold_uncertainty_score":0.009615541,"prediction_status":"machine_predicted_unvalidated"},"machine_scores":{"provisional":true,"baseline":true,"maturity_gate_passed":false,"score_opus":0.01219957985813986,"score_gpt":0.2014852087334344,"score_spread":0.1892856288752945,"validation_status":"score_only:v0-immature-baseline","note":"Baseline scores from an immature model (maturity gate not passed). Scores rank; they never assert a category."}}