{"id":"W4299553075","doi":"10.31399/asm.edfa.2001-1.p035","title":"Backside Analysis: Focused-Ion-Beam Applications for Flip Chip Packaged ICs","year":2001,"lang":"en","type":"article","venue":"EDFA Technical Articles","topic":"Integrated Circuits and Semiconductor Failure Analysis","field":"Engineering","cited_by":0,"is_retracted":false,"has_abstract":true,"ca_institutions":"Advanced Micro Devices (Canada)","funders":"","keywords":"Flip chip; Integrated circuit; Focused ion beam; Chip; Materials science; Electronic circuit; Debugging; Waveform; Electronic engineering; Optoelectronics; Computer science; Electrical engineering; Engineering; Nanotechnology; Ion; Voltage; Chemistry","routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false,"invisible_to_affiliation_only":false},"retraction":null,"screen":null,"direct_labels":[],"prediction":{"model_version":"metacan-v3-hybrid-931329e0061c","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.00020539,0.0007360286,0.0003874,0.0008939085,0.0003886257,0.0006078818,0.0007384658,0.0008316324,0.005288498],"category_scores_gemma":[0.0005358959,0.0003761137,0.0002773606,0.0003924896,0.0002903418,0.0005222318,0.0005407311,0.0004252872,0.001967771],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0002838098,"about_ca_system_score_gemma":0.0002026476,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.001132998,"about_ca_topic_score_gemma":0.002157448,"domain_scores_codex":[0.9997744,0.00002060174,0.000008016173,0.00002960094,0.0001437142,0.00002364376],"domain_scores_gemma":[0.999541,0.0000875314,0.00004631703,0.00006803917,0.0002351641,0.00002190045],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","study_design_scores_codex":[0.0002745176,0.00005817685,0.002467419,0.0002845391,0.00003864736,0.0007276116,0.0001914411,0.00281132,0.862006,0.0007531585,0.005214268,0.125173],"study_design_scores_gemma":[0.00003526483,0.0003535233,0.01022231,0.00005761695,0.00005684325,0.001696652,0.00009662809,0.03245846,0.9417114,0.000789394,0.01247589,0.00004598353],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","genre_codex":"methods","genre_gemma":"methods","genre_scores_codex":[0.4164988,0.004763672,0.5371004,0.001010218,0.0003531783,0.0002985819,0.001057972,0.01069176,0.02822534],"genre_scores_gemma":[0.780063,0.001346498,0.2017555,0.0005026184,0.00009383385,0.00006611374,0.0006574012,0.0005291402,0.01498592],"genre_candidate":"methods","genre_consensus":"methods","teacher_disagreement_score":0.005288498,"threshold_uncertainty_score":0.01769185,"prediction_status":"machine_predicted_unvalidated"},"machine_scores":{"provisional":true,"baseline":true,"maturity_gate_passed":false,"score_opus":0.01553149033212995,"score_gpt":0.2308204814283278,"score_spread":0.2152889910961979,"validation_status":"score_only:v0-immature-baseline","note":"Baseline scores from an immature model (maturity gate not passed). Scores rank; they never assert a category."}}