{"id":"W4404848983","doi":"10.1109/itc51657.2024.00055","title":"Digital Scan and ATPG for Analog Circuits","year":2024,"lang":"en","type":"article","venue":"","topic":"Integrated Circuits and Semiconductor Failure Analysis","field":"Engineering","cited_by":4,"is_retracted":false,"has_abstract":true,"ca_institutions":"Siemens (Canada)","funders":"","keywords":"Automatic test pattern generation; Computer science; Electronic circuit; Digital electronics; Analogue electronics; Electronic engineering; Electrical engineering; Engineering","routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false,"invisible_to_affiliation_only":false},"retraction":null,"screen":null,"direct_labels":[],"prediction":{"model_version":"metacan-v3-hybrid-931329e0061c","candidate_categories":[],"consensus_categories":[],"category_scores_codex":[0.0005142424,0.0009008174,0.0003881625,0.0009543187,0.000455017,0.001289819,0.0008511543,0.0008703923,0.04727028],"category_scores_gemma":[0.002003867,0.0003773826,0.0004914672,0.001062818,0.0008378912,0.001302571,0.0007062,0.001386845,0.01697714],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0007657738,"about_ca_system_score_gemma":0.0006396896,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.0005179676,"about_ca_topic_score_gemma":0.0009041749,"domain_scores_codex":[0.9989561,0.0002427895,0.00007247051,0.0001546473,0.0005148188,0.00005909639],"domain_scores_gemma":[0.999122,0.0003177093,0.0000746584,0.0002819267,0.000180579,0.00002316171],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"design_other","study_design_gemma":"bench_or_experimental","study_design_scores_codex":[0.0002159831,0.00008082209,0.0003854846,0.001106503,0.00004306123,0.0004406657,0.0001816024,0.008401399,0.04283938,0.2316986,0.0753926,0.639214],"study_design_scores_gemma":[0.0001410423,0.0004600115,0.0004662017,0.0002624844,0.0000494377,0.001680027,0.00005103027,0.04023539,0.07915114,0.0981489,0.7792878,0.00006661355],"study_design_candidate":"bench_or_experimental","study_design_consensus":null,"genre_codex":"methods","genre_gemma":"empirical","genre_scores_codex":[0.004056818,0.004330995,0.8742379,0.001096722,0.0009127402,0.0003147684,0.0009659646,0.0136228,0.1004613],"genre_scores_gemma":[0.158553,0.005443254,0.6805786,0.002759911,0.0006904209,0.001059251,0.003307414,0.002674781,0.1449334],"genre_candidate":"empirical","genre_consensus":null,"teacher_disagreement_score":0.04727028,"threshold_uncertainty_score":0.1581348,"prediction_status":"machine_predicted_unvalidated"},"machine_scores":{"provisional":true,"baseline":true,"maturity_gate_passed":false,"score_opus":0.008178518875195332,"score_gpt":0.2031279775616487,"score_spread":0.1949494586864533,"validation_status":"score_only:v0-immature-baseline","note":"Baseline scores from an immature model (maturity gate not passed). Scores rank; they never assert a category."}}