{"id":"W7132881053","doi":"","title":"Hot-Carrier Injection Reliability Characterization of n-LDMOS Transistors and Stress Tests in a Buck Converter Configuration","year":2024,"lang":"","type":"dissertation","venue":"TSpace","topic":"Silicon Carbide Semiconductor Technologies","field":"Engineering","cited_by":0,"is_retracted":false,"has_abstract":true,"ca_institutions":"University of Toronto","funders":"","keywords":"Reliability (semiconductor); LDMOS; Voltage; Buck converter; Transistor; Stress (linguistics); Voltage drop; Power semiconductor device; Safe operating area","routes":{"ca_aff":true,"ca_fund":false,"ca_venue":false,"about_ca":false,"invisible_to_affiliation_only":false},"retraction":null,"screen":null,"direct_labels":[],"prediction":{"model_version":"codex-gemma-dda1882f352a","candidate_categories":["metaepi_narrow"],"consensus_categories":[],"category_scores_codex":[0.0002660196,0.0006545666,0.0008502642,0.0008218621,0.00004738996,0.00009498538,0.0002021951,0.00129067,0.0001897251],"category_scores_gemma":[0.0003320386,0.0007640434,0.0001400047,0.0008767933,0.0001890414,0.0004269778,0.00002580005,0.0009956979,0.00001427817],"about_ca_system_candidate":false,"about_ca_system_consensus":false,"about_ca_system_score_codex":0.0004410456,"about_ca_system_score_gemma":0.0001420277,"about_ca_topic_candidate":false,"about_ca_topic_consensus":false,"about_ca_topic_score_codex":0.0008431338,"about_ca_topic_score_gemma":0.0008530627,"domain_scores_codex":[0.9972906,0.0001043562,0.001018155,0.0008548102,0.0003539069,0.0003781866],"domain_scores_gemma":[0.9986324,0.0001605161,0.0003182495,0.0005666528,0.000241424,0.00008072201],"domain_codex":null,"domain_gemma":null,"domain_candidate":null,"domain_consensus":null,"study_design_codex":"bench_or_experimental","study_design_gemma":"bench_or_experimental","study_design_scores_codex":[0.0001314404,0.00004921732,0.006489994,0.004051393,0.00009307599,0.000005597437,0.02789534,0.0003751261,0.9571817,0.0001531488,0.00001967918,0.003554315],"study_design_scores_gemma":[0.0009363486,0.0002882108,0.1834031,0.002568815,0.0003424744,0.00001361964,0.01433969,0.03779405,0.7588663,0.0002801667,0.0001029448,0.001064344],"study_design_candidate":"bench_or_experimental","study_design_consensus":"bench_or_experimental","genre_codex":"empirical","genre_gemma":"empirical","genre_scores_codex":[0.9945469,0.0009958829,0.0001009998,0.0001905029,0.00204878,0.001204825,0.0001911103,0.0003483839,0.0003726361],"genre_scores_gemma":[0.9971682,0.0006194353,0.00002104085,0.000008747145,0.00006907754,0.0001445701,0.00100106,0.0001260239,0.000841792],"genre_candidate":"empirical","genre_consensus":"empirical","teacher_disagreement_score":0.1983154,"threshold_uncertainty_score":0.9994811,"prediction_status":"machine_predicted_unvalidated"},"machine_scores":{"provisional":true,"baseline":true,"maturity_gate_passed":false,"score_opus":0.01115505681702954,"score_gpt":0.267342662370911,"score_spread":0.2561876055538815,"validation_status":"score_only:v0-immature-baseline","note":"Baseline scores from an immature model (maturity gate not passed). Scores rank; they never assert a category."}}