MétaCan
Menu
Back to cohort
Record W1506429504 · doi:10.1109/test.1995.529814

Synthesized transparent BIST for detecting scrambled pattern-sensitive faults in RAMs

2002· article· en· W1506429504 on OpenAlex

Why this work is in the frame

A frame that forgets how it found something cannot be audited. These are the routes that admitted this work.

affAt least one author lists a Canadian institution in the pinned OpenAlex snapshot.

Bibliographic record

Venuenot available
Typearticle
Languageen
FieldComputer Science
TopicVLSI and Analog Circuit Testing
Canadian institutionsUniversity of Alberta
Fundersnot available
KeywordsBuilt-in self-testAliasingSignature (topology)Computer scienceVHDLLinear feedback shift registerFault coverageScheme (mathematics)Fault (geology)Embedded systemShift registerComputer hardwareElectronic circuitParallel computingField-programmable gate arrayEngineeringChipMathematicsArtificial intelligence

Abstract

fetched live from OpenAlex

This paper describes a synthesizable, transparent, built-in self-test (BIST) scheme for random-access memories (RAMs). By altering only two parameters in a VHDL specification, BIST circuits can be automatically generated to detect 2-, 3- or 4-cell write-triggered coupling faults as well as two different classes of 5-cell faults. The 5-cell faults represent either unlinked scrambled active physical neighborhood pattern-sensitive faults (PNPSFs), or arbitrary combinations of unlinked scrambled active, static, and passive PNPSFs. The BIST scheme uses a modified version of Nicolaidis' method to make the applied tests transparent; thus the data that were held in the RAM at the start of the test will be restored by the end of the test, if no faults are present. All single faults of the above fault types, as well as most other standard fault types, are guaranteed to be detected because of the use of an aliasing-free signature analyzer. By comparing numerous intermediate signatures, the new design has a very low probability of aliasing when multiple faults are present.

Fetched live from OpenAlex and de-inverted. Abstracts are not stored in this database: the inverted indexes are 8.6 GB of the frame’s 9.3 GB of text, and the host has 13 GB free.

Full frame distilled prediction

Teacher imitation

Not calibrated prevalence, not ground truth. Human validation pending. Learned from the 10,348 direct Codex labels and 10,348 direct Gemma labels. Candidate is the union of thresholded teacher heads; consensus is their intersection. These outputs are machine_predicted_unvalidated and are not human labels or direct frontier model labels.

metaresearch head score (Codex)0.000
metaresearch head score (Gemma)0.000
Version: codex-gemma-dda1882f352aValidation status: machine_predicted_unvalidated
Candidate categoriesnone
Consensus categoriesnone
DomainCandidate signal: none · Consensus signal: none
Study designCandidate signal: Other design · Consensus signal: none
GenreCandidate signal: Empirical · Consensus signal: none
Teacher disagreement score0.995
Threshold uncertainty score0.528

Codex and Gemma teacher scores by category

CategoryCodexGemma
Metaresearch0.0000.000
Meta-epidemiology (narrow)0.0000.000
Meta-epidemiology (broad)0.0000.000
Bibliometrics0.0000.000
Science and technology studies0.0000.000
Scholarly communication0.0000.000
Open science0.0000.000
Research integrity0.0000.000
Insufficient payload (model declined to judge)0.0000.000

Machine scores (provisional)

The two teacher heads of the student model, read on this work. A score orders the frame for review; it never asserts a category, and the validation status ships verbatim with every row.

Baseline scores from an immature model (maturity gate not passed, 7 training rounds). Scores rank; they never assert a category.

Opus teacher head0.067
GPT teacher head0.258
Teacher spread0.191 · how far apart the two teachers sit on this one work
Validation statusscore_only:v0-immature-baseline · verbatim from the scoring run: score_only means the number may rank works, and no category label ships from it

Quick stats

Citations38
Published2002
Admission routes1
Has abstractyes

Explore more

Same topicVLSI and Analog Circuit TestingFrench-language works237,207