MétaCan
Menu
Back to cohort
Record W2059625562 · doi:10.1109/tdmr.2012.2232671

A New SEC-DED Error Correction Code Subclass for Adjacent MBU Tolerance in Embedded Memory

2012· article· en· W2059625562 on OpenAlexaff
Adam Neale, Manoj Sachdev

Bibliographic record

VenueIEEE Transactions on Device and Materials Reliability · 2012
Typearticle
Languageen
FieldEngineering
TopicRadiation Effects in Electronics
Canadian institutionsUniversity of Waterloo
Fundersnot available
KeywordsError detection and correctionComputer scienceOverhead (engineering)Soft errorArithmeticScalabilityAlgorithmBit error rateParallel computingComputer hardwareComputer engineeringDecoding methodsElectronic engineeringMathematicsEngineeringProgramming language

Abstract

fetched live from OpenAlex

The reliability concern associated with radiation-induced soft errors in embedded memories increases as semiconductor technology scales deep into the sub-40-nm regime. As the memory bit-cell area is reduced, single event upsets (SEUs) that would have once corrupted only a single bit-cell are now capable of upsetting multiple adjacent memory bit-cells per particle strike. While these error types are beyond the error handling capabilities of the commonly used single error correction double error detection (SEC-DED) error correction codes (ECCs) in embedded memories, the overhead associated with moving to more sophisticated double error correction (DEC) codes is considered to be too costly. To address this, designers have begun leveraging selective bit placement to design SEC-DED codes capable of double adjacent error correction (DAEC) or triple adjacent error detection (TAED). These codes can be implemented for the same check-bit overhead as the conventional SEC-DED codes; however, no codes have been developed that use both DAEC and TAED together. In this paper, a new ECC scheme is introduced that provides not only the basic SEC-DED coverage but also both DAEC and scalable adjacent error detection ($x$AED) with a reduction in miscorrection probability as well. Codes capable of up to 11-bit AED have been developed for both 16- and 32-bit standard memory word sizes, and a (39, 32) SEC-DED-DAEC-TAED code implementation that uses the same number of check-bits as a conventional 32-data-bit SEC-DED code is presented.

Fetched live from OpenAlex and de-inverted. Abstracts are not stored in this database: the inverted indexes are 8.6 GB of the frame’s 9.3 GB of text, and the host has 13 GB free.

How this classification was reachedexpand

Full frame machine prediction

Teacher imitation

Not calibrated prevalence, not ground truth. Human validation pending. The Gemma side is a direct model label for every work in the frame, read from the title-only record. The Codex side is a classifier learned from the 10,348 direct Codex labels and calibrated to design-weighted sample rates; fields without enough sample support carry no Codex call. Candidate is the union of the two sides; consensus is their intersection. These outputs are machine_predicted_unvalidated and are not human labels.

metaresearch head score (Codex)0.000
metaresearch head score (Gemma)0.001
Version: metacan-v3-hybrid-931329e0061cValidation status: machine_predicted_unvalidated
Candidate categoriesnone
Consensus categoriesnone
DomainCandidate signal: none · Consensus signal: none
Study designCandidate signal: Theoretical or conceptual · Consensus signal: none
GenreCandidate signal: Methods · Consensus signal: Methods
Teacher disagreement score0.002
Threshold uncertainty score0.007

Distilled classifier scores by category (both heads)

CategoryCodexGemma
Metaresearch0.0000.001
Meta-epidemiology (narrow)0.0000.000
Meta-epidemiology (broad)0.0000.000
Bibliometrics0.0010.001
Science and technology studies0.0000.000
Scholarly communication0.0010.001
Open science0.0010.001
Research integrity0.0000.001
Insufficient payload (model declined to judge)0.0020.001

Machine scores (provisional)

The two teacher heads of the student model, read on this work. A score orders the frame for review; it never asserts a category, and the validation status ships verbatim with every row.

Baseline scores from an immature model (maturity gate not passed, 7 training rounds). Scores rank; they never assert a category.

Opus teacher head0.012
GPT teacher head0.252
Teacher spread0.240 · how far apart the two teachers sit on this one work
Validation statusscore_only:v0-immature-baseline · verbatim from the scoring run: score_only means the number may rank works, and no category label ships from it

Classification

machine, unvalidated

Machine predicted; a candidate call from one source (direct Gemma or distilled Codex), not a consensus.

The models applied no category: nothing in the taxonomy fit this work.
Study designTheoretical or conceptual
Domainnot available
GenreMethods

How this classification was reached, model by model and score by score, is at the end of the page under "How this classification was reached".

Quick stats

Citations91
Published2012
Admission routes1
Has abstractyes

Explore more

Same venueIEEE Transactions on Device and Materials ReliabilitySame topicRadiation Effects in ElectronicsFrench-language works237,207