Design of wireless on-wafer submicron characterization system
Why this work is in the frame
A frame that forgets how it found something cannot be audited. These are the routes that admitted this work.
Bibliographic record
Abstract
A wireless technique for the testing of very large scale ICs and wafers is presented. This test technique uses standard CMOS to achieve wireless parametric testing. This technique has virtually no area overhead, minimal power requirements, and no process or design changes are required. Most compelling is that wafer contact is not required, thereby enabling the in-line process control/monitoring of the manufacture of VLSI wafers or chips. Simulations of representative VLSI antenna designs are presented along with experimental results from the implementation of the antenna coupling and communications link. Also presented are specific circuit simulations showing the characteristics of operation under a range of conditions. The technique is demonstrated experimentally in discrete form with operation at voltages as low as 1 V with submilliwatt power levels. This technique can be implemented with a requirement of 1/10 000th the area of a Pentium-class VLSI circuit, allowing contactless testing of wafers before packaging
Fetched live from OpenAlex and de-inverted. Abstracts are not stored in this database: the inverted indexes are 8.6 GB of the frame’s 9.3 GB of text, and the host has 13 GB free.
Full frame distilled prediction
Teacher imitationNot calibrated prevalence, not ground truth. Human validation pending. Learned from the 10,348 direct Codex labels and 10,348 direct Gemma labels. Candidate is the union of thresholded teacher heads; consensus is their intersection. These outputs are machine_predicted_unvalidated and are not human labels or direct frontier model labels.
Codex and Gemma teacher scores by category
| Category | Codex | Gemma |
|---|---|---|
| Metaresearch | 0.001 | 0.000 |
| Meta-epidemiology (narrow) | 0.000 | 0.000 |
| Meta-epidemiology (broad) | 0.000 | 0.000 |
| Bibliometrics | 0.000 | 0.001 |
| Science and technology studies | 0.000 | 0.000 |
| Scholarly communication | 0.000 | 0.001 |
| Open science | 0.001 | 0.000 |
| Research integrity | 0.000 | 0.000 |
| Insufficient payload (model declined to judge) | 0.000 | 0.000 |
Machine scores (provisional)
The two teacher heads of the student model, read on this work. A score orders the frame for review; it never asserts a category, and the validation status ships verbatim with every row.
Baseline scores from an immature model (maturity gate not passed, 7 training rounds). Scores rank; they never assert a category.
score_only:v0-immature-baseline · verbatim from the scoring run: score_only means the number may rank works, and no category label ships from it