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Record W2692165

Etude de la sensibilité de technologies CMOS/BULK et CMOS/SOI partiellement désertée très largement sub-microniques dans l'environnement radiatif terrestre

2004· dissertation· fr· W2692165 on OpenAlex

Why this work is in the frame

A frame that forgets how it found something cannot be audited. These are the routes that admitted this work.

aboutThe title or abstract carries a Canadian signal from the geographic lexicon.
no affNo Canadian affiliation: this work is invisible to an affiliation-only frame.
No Canadian affiliation. An affiliation-only frame, the usual design, would never have seen this work. It is one of the works that make the case for inverting the frame.

Bibliographic record

Venuenot available
Typedissertation
Languagefr
FieldEngineering
TopicRadiation Effects in Electronics
Canadian institutionsnot available
Fundersnot available
KeywordsSilicon on insulatorSoft errorCMOSUpsetPhysicsMonte Carlo methodMaterials scienceNeutronElectrical engineeringSiliconOptoelectronicsElectronic engineeringEngineeringNuclear physicsMechanical engineeringMathematics
DOInot available

Abstract

fetched live from OpenAlex

As the dimensions and operating voltages of semiconductor devices are continually reduced to satisfy the increasin demand for higher density and lower, their sensitivity to Soft Error Rates (SER) increases. These non destructive events correspond to a radiation-induced loss of ligical information in a memory cell. In the terrestrial environment, the two major sources of radiations are the atmospheric neutrons and the alpha particles resulting from the natural radioactivty. This study aims at comparing the Soft Error Rates et ground level in Ultra Deep Sub-Micron (UDSM) bulk and commercial Silicon On Insulator (SOI) technologies. Experimental SER tests are perfomed using different irradiation facilities : the Los Alamos neutron source, mono-energic sources of protons and neutrons and radioactive alpha sources, respectively located in the US, Canada and France. Results are given for SRAMs in the CMOS 250, 180, 130 and 90 nm technological nodes. They are used to state on the robustness difference between bulk and SOI up-to-date technologies. The modelling part relies on the rectangular Parallelepiped simulation methodology. Two probalistic Monte-Carlo codes, for the neutrons and alpha particles, were developed and calibrated to determine the key parameters driven the sensitivity of highly integrated technologies. These tools allow to investigate the influence on SER of the critical charge, the sensitive volume, the bipolar effect in SOI and the multiple bit upset rates. Finally, SER predictions are given for future 65 nm technology nodes and a promisingtechnology architecture (Fully Depleted SOI). Hence, the sensitivty of Bulk and SOI technologies is compared down to the 65 nm technological node.

Fetched live from OpenAlex and de-inverted. Abstracts are not stored in this database: the inverted indexes are 8.6 GB of the frame’s 9.3 GB of text, and the host has 13 GB free.

Full frame distilled prediction

Teacher imitation

Not calibrated prevalence, not ground truth. Human validation pending. Learned from the 10,348 direct Codex labels and 10,348 direct Gemma labels. Candidate is the union of thresholded teacher heads; consensus is their intersection. These outputs are machine_predicted_unvalidated and are not human labels or direct frontier model labels.

metaresearch head score (Codex)0.002
metaresearch head score (Gemma)0.000
Version: codex-gemma-dda1882f352aValidation status: machine_predicted_unvalidated
Candidate categoriesMeta-epidemiology (narrow), Research integrity
Consensus categoriesMeta-epidemiology (narrow)
DomainCandidate signal: none · Consensus signal: none
Study designCandidate signal: Simulation or modeling · Consensus signal: none
GenreCandidate signal: Empirical · Consensus signal: Empirical
Teacher disagreement score0.694
Threshold uncertainty score1.000

Codex and Gemma teacher scores by category

CategoryCodexGemma
Metaresearch0.0020.000
Meta-epidemiology (narrow)0.0010.002
Meta-epidemiology (broad)0.0010.000
Bibliometrics0.0000.000
Science and technology studies0.0000.000
Scholarly communication0.0000.000
Open science0.0010.000
Research integrity0.0020.002
Insufficient payload (model declined to judge)0.0000.000

Machine scores (provisional)

The two teacher heads of the student model, read on this work. A score orders the frame for review; it never asserts a category, and the validation status ships verbatim with every row.

Baseline scores from an immature model (maturity gate not passed, 7 training rounds). Scores rank; they never assert a category.

Opus teacher head0.004
GPT teacher head0.243
Teacher spread0.239 · how far apart the two teachers sit on this one work
Validation statusscore_only:v0-immature-baseline · verbatim from the scoring run: score_only means the number may rank works, and no category label ships from it

Quick stats

Citations5
Published2004
Admission routes1
Has abstractyes

Explore more

Same topicRadiation Effects in ElectronicsFrench-language works237,207