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Record W4389476214 · doi:10.1145/3613424.3614304

Impact of Voltage Scaling on Soft Errors Susceptibility of Multicore Server CPUs

2023· article· en· W4389476214 on OpenAlexafffund
Dimitris Agiakatsikas, George N. Papadimitriou, Vasileios Karakostas, Dimitris Gizopoulos, Mihalis Psarakis, C. Bélanger-Champagne, E. W. Blackmore

Bibliographic record

Venuenot available
Typearticle
Languageen
FieldEngineering
TopicRadiation Effects in Electronics
Canadian institutionsTRIUMF
FundersHORIZON EUROPE Framework ProgrammeHorizon 2020 Framework ProgrammeHellenic Foundation for Research and InnovationEuropean CommissionTRIUMF
KeywordsDependabilityMicroprocessorComputer scienceSoft errorVoltageEmbedded systemMulti-core processorReliability (semiconductor)Frequency scalingPower (physics)Single event upsetComputer hardwareStatic random-access memoryElectronic engineeringElectrical engineeringEngineeringOperating system

Abstract

fetched live from OpenAlex

Microprocessor power consumption and dependability are both crucial challenges that designers have to cope with due to shrinking feature sizes and increasing transistor counts in a single chip. These two challenges are mutually destructive: microprocessor reliability deteriorates at lower supply voltages that save power. An important dependability metric for microprocessors is their radiation-induced soft error rate (SER). This work goes beyond state-of-the-art by assessing the trade-offs between voltage scaling and soft error rate (SER) on a microprocessor system executing workloads on real hardware and a full software stack setup. We analyze data from accelerated neutron radiation testing for nominal and reduced microprocessor operating voltages. We perform our experiments on a 64-bit Armv8 multicore microprocessor built on 28 nm process technology. We show that the SER of SRAM arrays can increase up to 40.4% when the device operates at reduced supply voltage levels. To put our findings into context, we also estimate the radiation-induced Failures in Time (FIT) rate of various workloads for all the studied voltage levels. Our results show that the total and the Silent Data Corruptions (SDC) FIT of the microprocessor operating at voltage-scaled conditions can be 6.6 × and 16 × larger than at the nominal voltage, respectively. Moreover, changes in the microprocessor’s clock frequency do not have a noticeable impact on its soft error susceptibility. The findings of this work can aid computer architects in striking a balance between power and dependability, thus, designing more robust and efficient microprocessors.

Fetched live from OpenAlex and de-inverted. Abstracts are not stored in this database: the inverted indexes are 8.6 GB of the frame’s 9.3 GB of text, and the host has 13 GB free.

How this classification was reachedexpand

Full frame machine prediction

Teacher imitation

Not calibrated prevalence, not ground truth. Human validation pending. The Gemma side is a direct model label for every work in the frame, read from the title-only record. The Codex side is a classifier learned from the 10,348 direct Codex labels and calibrated to design-weighted sample rates; fields without enough sample support carry no Codex call. Candidate is the union of the two sides; consensus is their intersection. These outputs are machine_predicted_unvalidated and are not human labels.

metaresearch head score (Codex)0.000
metaresearch head score (Gemma)0.004
Version: metacan-v3-hybrid-931329e0061cValidation status: machine_predicted_unvalidated
Candidate categoriesnone
Consensus categoriesnone
DomainCandidate signal: none · Consensus signal: none
Study designCandidate signal: Bench or experimental · Consensus signal: Bench or experimental
GenreCandidate signal: Empirical · Consensus signal: Empirical
Teacher disagreement score0.001
Threshold uncertainty score0.004

Distilled classifier scores by category (both heads)

CategoryCodexGemma
Metaresearch0.0000.004
Meta-epidemiology (narrow)0.0000.000
Meta-epidemiology (broad)0.0000.000
Bibliometrics0.0010.001
Science and technology studies0.0000.000
Scholarly communication0.0000.001
Open science0.0000.000
Research integrity0.0000.000
Insufficient payload (model declined to judge)0.0010.000

Machine scores (provisional)

The two teacher heads of the student model, read on this work. A score orders the frame for review; it never asserts a category, and the validation status ships verbatim with every row.

Baseline scores from an immature model (maturity gate not passed, 7 training rounds). Scores rank; they never assert a category.

Opus teacher head0.012
GPT teacher head0.275
Teacher spread0.263 · how far apart the two teachers sit on this one work
Validation statusscore_only:v0-immature-baseline · verbatim from the scoring run: score_only means the number may rank works, and no category label ships from it

Classification

machine, unvalidated

Machine predicted; a candidate call from one source (direct Gemma or distilled Codex), not a consensus.

The models applied no category: nothing in the taxonomy fit this work.
Study designBench or experimental
Domainnot available
GenreEmpirical

How this classification was reached, model by model and score by score, is at the end of the page under "How this classification was reached".

Quick stats

Citations14
Published2023
Admission routes2
Has abstractyes

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Same topicRadiation Effects in ElectronicsFrench-language works237,207