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Record W4389476214 · doi:10.1145/3613424.3614304

Impact of Voltage Scaling on Soft Errors Susceptibility of Multicore Server CPUs

2023· article· en· W4389476214 on OpenAlex

Why this work is in the frame

A frame that forgets how it found something cannot be audited. These are the routes that admitted this work.

affAt least one author lists a Canadian institution in the pinned OpenAlex snapshot.
fundA Canadian funder is recorded on the work.

Bibliographic record

Venuenot available
Typearticle
Languageen
FieldEngineering
TopicRadiation Effects in Electronics
Canadian institutionsTRIUMF
FundersHORIZON EUROPE Framework ProgrammeHorizon 2020 Framework ProgrammeHellenic Foundation for Research and InnovationEuropean CommissionTRIUMF
KeywordsDependabilityMicroprocessorComputer scienceSoft errorVoltageEmbedded systemMulti-core processorReliability (semiconductor)Frequency scalingPower (physics)Single event upsetComputer hardwareStatic random-access memoryElectronic engineeringElectrical engineeringEngineeringOperating system

Abstract

fetched live from OpenAlex

Microprocessor power consumption and dependability are both crucial challenges that designers have to cope with due to shrinking feature sizes and increasing transistor counts in a single chip. These two challenges are mutually destructive: microprocessor reliability deteriorates at lower supply voltages that save power. An important dependability metric for microprocessors is their radiation-induced soft error rate (SER). This work goes beyond state-of-the-art by assessing the trade-offs between voltage scaling and soft error rate (SER) on a microprocessor system executing workloads on real hardware and a full software stack setup. We analyze data from accelerated neutron radiation testing for nominal and reduced microprocessor operating voltages. We perform our experiments on a 64-bit Armv8 multicore microprocessor built on 28 nm process technology. We show that the SER of SRAM arrays can increase up to 40.4% when the device operates at reduced supply voltage levels. To put our findings into context, we also estimate the radiation-induced Failures in Time (FIT) rate of various workloads for all the studied voltage levels. Our results show that the total and the Silent Data Corruptions (SDC) FIT of the microprocessor operating at voltage-scaled conditions can be 6.6 × and 16 × larger than at the nominal voltage, respectively. Moreover, changes in the microprocessor’s clock frequency do not have a noticeable impact on its soft error susceptibility. The findings of this work can aid computer architects in striking a balance between power and dependability, thus, designing more robust and efficient microprocessors.

Fetched live from OpenAlex and de-inverted. Abstracts are not stored in this database: the inverted indexes are 8.6 GB of the frame’s 9.3 GB of text, and the host has 13 GB free.

Full frame distilled prediction

Teacher imitation

Not calibrated prevalence, not ground truth. Human validation pending. Learned from the 10,348 direct Codex labels and 10,348 direct Gemma labels. Candidate is the union of thresholded teacher heads; consensus is their intersection. These outputs are machine_predicted_unvalidated and are not human labels or direct frontier model labels.

metaresearch head score (Codex)0.000
metaresearch head score (Gemma)0.000
Version: codex-gemma-dda1882f352aValidation status: machine_predicted_unvalidated
Candidate categoriesnone
Consensus categoriesnone
DomainCandidate signal: none · Consensus signal: none
Study designCandidate signal: Simulation or modeling · Consensus signal: Simulation or modeling
GenreCandidate signal: Empirical · Consensus signal: Empirical
Teacher disagreement score0.182
Threshold uncertainty score0.417

Codex and Gemma teacher scores by category

CategoryCodexGemma
Metaresearch0.0000.000
Meta-epidemiology (narrow)0.0000.000
Meta-epidemiology (broad)0.0000.000
Bibliometrics0.0000.000
Science and technology studies0.0000.000
Scholarly communication0.0000.000
Open science0.0000.000
Research integrity0.0000.000
Insufficient payload (model declined to judge)0.0000.000

Machine scores (provisional)

The two teacher heads of the student model, read on this work. A score orders the frame for review; it never asserts a category, and the validation status ships verbatim with every row.

Baseline scores from an immature model (maturity gate not passed, 7 training rounds). Scores rank; they never assert a category.

Opus teacher head0.012
GPT teacher head0.275
Teacher spread0.263 · how far apart the two teachers sit on this one work
Validation statusscore_only:v0-immature-baseline · verbatim from the scoring run: score_only means the number may rank works, and no category label ships from it

Quick stats

Citations14
Published2023
Admission routes2
Has abstractyes

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Same topicRadiation Effects in ElectronicsFrench-language works237,207