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Record W4416368549 · doi:10.1109/tdmr.2025.3634716

On-Silicon Characterization of CDM-Like Stress in Long Interconnects Using vf-TLP in Nanometric ICs

2025· article· W4416368549 on OpenAlexaff
Mihaela-Daniela Dobre, Chyh-Yih Chang, Chi‐Kuang Chen, Philippe Coll, Gheorghe Brezeanu

Bibliographic record

VenueIEEE Transactions on Device and Materials Reliability · 2025
Typearticle
Language
FieldEngineering
TopicElectrostatic Discharge in Electronics
Canadian institutionsMicrosemi (Canada)
Fundersnot available
KeywordsNMOS logicElectrostatic dischargeRobustness (evolution)CMOSDissipationCapacitanceElectric power transmissionInterconnectionTransmission line

Abstract

fetched live from OpenAlex

This work presents a comprehensive silicon-based validation methodology for Charged Device Model Electrostatic Discharge (CDM-ESD) protection strategies in a 28 nm thin-oxide CMOS process. The approach evaluates multiple protection topologies such as duo/trio diodes, and grounded-gate nMOS (ggNMOS), using very-fast Transmission Line Pulse (vf-TLP) testing. Failure analysis (FA) via Scanning Electron Microscopy (SEM) is used to correlate electrical degradation with physical damage post-stress. In-depth analysis is performed from three key perspectives: the influence of averaging window selection on I–V curve fidelity, extraction and interpretation of decoupling capacitance and energy dissipation efficiency under CDM-like stress. Results highlight both the strengths and limitations of each protection method under fast transients, offering insight into optimal ESD design for long interconnect paths. Practical enhancements to the vf-TLP setup are also discussed. This study identifies layout-induced failure mechanisms too. The proposed framework enhances CDM robustness validation and informs future ESD strategies in scaled nodes.

Fetched live from OpenAlex and de-inverted. Abstracts are not stored in this database: the inverted indexes are 8.6 GB of the frame’s 9.3 GB of text, and the host has 13 GB free.

How this classification was reachedexpand

Full frame machine prediction

Teacher imitation

Not calibrated prevalence, not ground truth. Human validation pending. The Gemma side is a direct model label for every work in the frame, read from the title-only record. The Codex side is a classifier learned from the 10,348 direct Codex labels and calibrated to design-weighted sample rates; fields without enough sample support carry no Codex call. Candidate is the union of the two sides; consensus is their intersection. These outputs are machine_predicted_unvalidated and are not human labels.

metaresearch head score (Codex)0.000
metaresearch head score (Gemma)0.001
Version: metacan-v3-hybrid-931329e0061cValidation status: machine_predicted_unvalidated
Candidate categoriesnone
Consensus categoriesnone
DomainCandidate signal: none · Consensus signal: none
Study designCandidate signal: Bench or experimental · Consensus signal: Bench or experimental
GenreCandidate signal: Empirical · Consensus signal: Empirical
Teacher disagreement score0.001
Threshold uncertainty score0.003

Distilled classifier scores by category (both heads)

CategoryCodexGemma
Metaresearch0.0000.001
Meta-epidemiology (narrow)0.0000.000
Meta-epidemiology (broad)0.0000.000
Bibliometrics0.0000.000
Science and technology studies0.0000.000
Scholarly communication0.0000.000
Open science0.0010.000
Research integrity0.0000.000
Insufficient payload (model declined to judge)0.0010.000

Machine scores (provisional)

The two teacher heads of the student model, read on this work. A score orders the frame for review; it never asserts a category, and the validation status ships verbatim with every row.

Baseline scores from an immature model (maturity gate not passed, 7 training rounds). Scores rank; they never assert a category.

Opus teacher head0.009
GPT teacher head0.249
Teacher spread0.241 · how far apart the two teachers sit on this one work
Validation statusscore_only:v0-immature-baseline · verbatim from the scoring run: score_only means the number may rank works, and no category label ships from it

Classification

machine, unvalidated

Machine predicted; a candidate call from one source (direct Gemma or distilled Codex), not a consensus.

The models applied no category: nothing in the taxonomy fit this work.
Study designBench or experimental
Domainnot available
GenreEmpirical

How this classification was reached, model by model and score by score, is at the end of the page under "How this classification was reached".

Quick stats

Citations0
Published2025
Admission routes1
Has abstractyes

Explore more

Same venueIEEE Transactions on Device and Materials ReliabilitySame topicElectrostatic Discharge in ElectronicsFrench-language works237,207