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Record W4416884546 · doi:10.37665/sryfxiq90242

Dielectric Material Damage Vs. Conductive Anodic Filament Formation

2013· article· W4416884546 on OpenAlex

Why this work is in the frame

A frame that forgets how it found something cannot be audited. These are the routes that admitted this work.

affAt least one author lists a Canadian institution in the pinned OpenAlex snapshot.

Bibliographic record

VenueSoldering and Reliability Conferences · 2013
Typearticle
Language
FieldEngineering
TopicElectronic Packaging and Soldering Technologies
Canadian institutionsIntertek (Canada)
Fundersnot available
KeywordsSolderingPrinted circuit boardElectrical conductorAnodeDielectricDegradation (telecommunications)CapacitanceMaterial properties

Abstract

fetched live from OpenAlex

ABSTRACT It should be noted that this is an overview paper that represents the early stages of an ongoing investigation into the causes and effects between conductive anodic filament (CAF) formation and printed wiring board (PWB) material damage. Our belief is that certain or specific types of material damage can increase the propensity for CAF formation. The preliminary data collected suggests is that there is no statistical correlation between the general definition of material damage (cohesive failure) and CAF. The resulting dichotomy is that we find no CAF failures in some coupons that have obvious material damage and we find CAF failures in coupons that don’t exhibit material damage. Since the advent of the European Union’s legislation for Restriction on Hazardous Substances (RoHS) lead (Pb) was removed from solder in surface finishes and pastes used in the component assembly process. The alternative metals and alloys to traditional tin/lead (Sn/Pb) solder required that the assembly temperatures be increased to achieve the higher melting point of the lead free solders. The traditional assembly temperature reached a level of 230°C, lead-free can require up to a maximum of 260°C, although most assembly houses are using a more modest 245°C. Multiple exposures to the additional 15°C to 30°C has demonstrated a negatively impact to the integrity of the FR4 and halogen free dielectric material used in PWB'substrates. Quantification of material damage is now possible through new techniques that utilize capacitance measurements to identify specific levels of bulk capacitance change that signify degradation within the resin system. This technique was employed to non-destructively identify both the locations within the construction and the magnitude of the change, traditional microsectioning was completed to confirm the results of the capacitance testing. This new technique, including equipment used is described Many of the commercially available materials have not demonstrated sufficient robustness when exposed to multiple lead-free assembly and rework thermal excursions. The reality is that these higher assembly and rework temperatures are increasing the risk of material damage. One would naturally expect that the increasing levels of material damage would produce an opportunistic path that would provide an increased possibility for CAF growth. In order to understand this very complex environment it is necessary to lay the ground work for how and effective quantification can be determined. This paper reviews the results of some initial work, our strategy for improved test vehicles design, including features for measuring material damage and CAF formation, the assembly and rework environments, the material and CAF testing methodology and the protocols that will be used. Our ultimate objective is to establish whether correlation can be found between the various types of material damage and the propensity to CAF failure.

Fetched live from OpenAlex and de-inverted. Abstracts are not stored in this database: the inverted indexes are 8.6 GB of the frame’s 9.3 GB of text, and the host has 13 GB free.

Full frame distilled prediction

Teacher imitation

Not calibrated prevalence, not ground truth. Human validation pending. Learned from the 10,348 direct Codex labels and 10,348 direct Gemma labels. Candidate is the union of thresholded teacher heads; consensus is their intersection. These outputs are machine_predicted_unvalidated and are not human labels or direct frontier model labels.

metaresearch head score (Codex)0.000
metaresearch head score (Gemma)0.000
Version: codex-gemma-dda1882f352aValidation status: machine_predicted_unvalidated
Candidate categoriesMeta-epidemiology (narrow)
Consensus categoriesnone
DomainCandidate signal: none · Consensus signal: none
Study designCandidate signal: Simulation or modeling · Consensus signal: none
GenreCandidate signal: Empirical · Consensus signal: Empirical
Teacher disagreement score0.582
Threshold uncertainty score1.000

Codex and Gemma teacher scores by category

CategoryCodexGemma
Metaresearch0.0000.000
Meta-epidemiology (narrow)0.0010.001
Meta-epidemiology (broad)0.0010.000
Bibliometrics0.0000.000
Science and technology studies0.0000.001
Scholarly communication0.0010.001
Open science0.0000.000
Research integrity0.0000.001
Insufficient payload (model declined to judge)0.0000.000

Machine scores (provisional)

The two teacher heads of the student model, read on this work. A score orders the frame for review; it never asserts a category, and the validation status ships verbatim with every row.

Baseline scores from an immature model (maturity gate not passed, 7 training rounds). Scores rank; they never assert a category.

Opus teacher head0.012
GPT teacher head0.213
Teacher spread0.201 · how far apart the two teachers sit on this one work
Validation statusscore_only:v0-immature-baseline · verbatim from the scoring run: score_only means the number may rank works, and no category label ships from it