MétaCan
Menu
Back to cohort
Record W4416885086 · doi:10.37665/sraacij89955

Electroplate Bumping without Photoresist and Si Dice Stacking with TSV for 3D Packaging

2009· article· W4416885086 on OpenAlexaff
Jiheon Jun, Inrak Kim, Younggon Lee, Jae Pil Jung, Sung Jun Hong, Y. Zhou

Bibliographic record

VenueSoldering and Reliability Conferences · 2009
Typearticle
Language
FieldEngineering
Topic3D IC and TSV technologies
Canadian institutionsUniversity of Waterloo
Fundersnot available
KeywordsBumpingElectroplatingWaferSolderingPlating (geology)Deep reactive-ion etchingFlip chipStackingSiliconEtching (microfabrication)

Abstract

fetched live from OpenAlex

ABSTRACT A novel process of direct solder bumping on a Si wafer without PR (Photoresist), namely non-PR bumping, and stacking of TSV (Through Silicon Via) embedded Si dice were investigated to achieve cost reduction and higher productivity in three dimensional electronics packaging. The stacking of bumped Si dice, produced by non-PR method, was studied as well. Vias were produced by the DRIE (Deep Reactive Ion Etching) on the Si wafer with 40μm in diameter. SiO 2 , Ti and Au layers were formed on the via wall and pulsed wave electroplating was applied to plug the via with Cu. Then the Si wafer was grinded by CMP (Chemical Mechanical Polishing) to the thickness of 70μm until the both sides of Cu plugged vias were exposed. DC (Direct Current) electroplating was performed to fabricate Sn and near eutectic Sn-Ag bumps on the Cu plugged vias in the Si die. The reduction current was supplied through the Cu plugging to its top surface for solder bumping. To optimize the plating process, the current density and plating time were varied up to 40mA/cm 2 and 60 min, respectively. Bumped Si dice were stacked and assembled by reflow soldering in air at 255°C. The solder bumps were fabricated successfully without PR on the Cu plugged vias. The periphery of the bump was not so round as that with PR. However, it had an almost round periphery, and the surface of the bump showed a facet growth in Sn bumps while Sn-Ag bumps presented composite morphologies of hemispheric shape with Ag dendrites on their surface. The weight percent of Ag in Sn-Ag bumps were close to eutectic Sn-Ag composition. Three layers of Si dice with Sn bumps were stacked and assembled without any failure. In the bonding interface between Cu plug and solder bump, Cu 6 Sn 5 IMC was observed by FESEM (Field Emission Scanning Electron Microscope) and EDS (Energy Dispersive Spectroscope) analysis. From these results, three dimensional stacking of TSV embedded Si dice and non-PR electroplating of micro bumps on vias were achieved successfully.

Fetched live from OpenAlex and de-inverted. Abstracts are not stored in this database: the inverted indexes are 8.6 GB of the frame’s 9.3 GB of text, and the host has 13 GB free.

How this classification was reachedexpand

Full frame machine prediction

Teacher imitation

Not calibrated prevalence, not ground truth. Human validation pending. The Gemma side is a direct model label for every work in the frame, read from the title-only record. The Codex side is a classifier learned from the 10,348 direct Codex labels and calibrated to design-weighted sample rates; fields without enough sample support carry no Codex call. Candidate is the union of the two sides; consensus is their intersection. These outputs are machine_predicted_unvalidated and are not human labels.

metaresearch head score (Codex)0.000
metaresearch head score (Gemma)0.000
Version: metacan-v3-hybrid-931329e0061cValidation status: machine_predicted_unvalidated
Candidate categoriesnone
Consensus categoriesnone
DomainCandidate signal: none · Consensus signal: none
Study designCandidate signal: Bench or experimental · Consensus signal: Bench or experimental
GenreCandidate signal: Empirical · Consensus signal: Empirical
Teacher disagreement score0.001
Threshold uncertainty score0.003

Distilled classifier scores by category (both heads)

CategoryCodexGemma
Metaresearch0.0000.000
Meta-epidemiology (narrow)0.0000.000
Meta-epidemiology (broad)0.0000.000
Bibliometrics0.0000.000
Science and technology studies0.0000.000
Scholarly communication0.0000.000
Open science0.0000.000
Research integrity0.0000.000
Insufficient payload (model declined to judge)0.0010.000

Machine scores (provisional)

The two teacher heads of the student model, read on this work. A score orders the frame for review; it never asserts a category, and the validation status ships verbatim with every row.

Baseline scores from an immature model (maturity gate not passed, 7 training rounds). Scores rank; they never assert a category.

Opus teacher head0.011
GPT teacher head0.226
Teacher spread0.216 · how far apart the two teachers sit on this one work
Validation statusscore_only:v0-immature-baseline · verbatim from the scoring run: score_only means the number may rank works, and no category label ships from it

Classification

machine, unvalidated

Machine predicted; a candidate call from one source (direct Gemma or distilled Codex), not a consensus.

The models applied no category: nothing in the taxonomy fit this work.
Study designBench or experimental
Domainnot available
GenreEmpirical

How this classification was reached, model by model and score by score, is at the end of the page under "How this classification was reached".

Quick stats

Citations0
Published2009
Admission routes1
Has abstractyes

Explore more

Same venueSoldering and Reliability ConferencesSame topic3D IC and TSV technologiesFrench-language works237,207