Preface to special issue on Microscopy of Semiconducting Materials 2017 (MSM‐XX)
Notice bibliographique
Résumé
This issue contains selected invited and contributed presentations from the 20th international conference on ‘Microscopy of Semiconducting Materials’ (MSM-XX) which was held at Lady Margaret Hall, University of Oxford, 9–13 April 2017. The meeting was organised by the Royal Microscopical Society (RMS), supported by the Institute of Physics and the European Microscopy Society and kindly sponsored by five companies: Hitachi High-Technologies Europe, ISS Group Ltd, JEOL (UK) Ltd, Leica Microsystems and LOT - Quantum Design. This conference series has, since its inauguration by Anthony (‘Tony’) G Cullis in 1979, been held biennially in odd years and since 2003 alternates between locations in Oxford and Cambridge. It deals with advances in semiconductor studies carried out by all forms of electron and scanning probe microscopy with high spatial resolution, as well as new methods of imaging, diffraction, spectroscopy and signal quantification. This field has been flourishing for now more than three decades, due to the need for materials and device characterisation at the atomic level to continuously explore new materials and concepts for electronic and optoelectronic device applications. The meeting was attended by 69 delegates from 19 countries, comprising ten European countries as well as Australia, Canada, China, India, Israel, Japan, Russia, Singapore and the USA. We had a total of 71 contributions, which included 11 invited talks, 29 contributed conference talks, 4 company presentations and 27 posters. The dozen papers published in this special issue of Journal of Microscopy have each undergone full peer review by two or three reviewers, guaranteeing contributions are of high standard. Table 1 lists the materials studied in these articles and the methods used, from which it can be seen that a wide range of semiconductors have been covered, and that annular dark-field scanning transmission electron microscopy (ADF-STEM) imaging was the most popular technique by far. Two students were awarded prizes for the high quality of their poster presentations. Their contributions on studies of core-shell nanowires (by James A Gott, University of Warwick, 1st place) and thin wetting layers (by Veronica Braza, Universidad de Cádiz, 2nd place) documented well the high standard of electron microscopy that is now achieved by young scientists. We express our gratitude to Lady Margaret Hall for provision of excellent accommodation, superb lecture facilities, including technical support, and perfect catering. We would like to also thank the staff of the RMS for their expert help in planning and running the meeting - in particular Karina Lang - and for their professional support and always joyful approach to anything. Finally, we are grateful to Jill Hobbs as the Editorial Office Manager for the Journal of Microscopy at Wiley, as well as to the numerous contributors and reviewers for helping us to put together this special issue. Lannon Quad courtyard at early morning and at night (left), poster session in the Pipe Partridge building along with tea served in the courtyard (right).
Récupéré en direct depuis OpenAlex et désinversé. Les résumés ne sont pas conservés dans cette base de données : les index inversés représentent 8,6 Go des 9,3 Go de texte de la base, et le serveur dispose de 13 Go libres.
Comment cette classification a été obtenuedéplier
Prédiction distillée sur la base complète
Imitation des enseignantsNi prévalence calibrée, ni vérité terrain. Validation humaine à venir. Apprise à partir de 10 348 étiquettes directes de Codex et de 10 348 étiquettes directes de Gemma. Le mode candidate est l'union des têtes enseignantes seuillées; le consensus est leur intersection. Ces sorties portent le statut machine_predicted_unvalidated et ne sont ni des étiquettes humaines ni des étiquettes directes de modèles de pointe.
Scores Codex et Gemma par catégorie
| Catégorie | Codex | Gemma |
|---|---|---|
| Métarecherche | 0,001 | 0,000 |
| Méta-épidémiologie (sens strict) | 0,000 | 0,000 |
| Méta-épidémiologie (sens large) | 0,001 | 0,000 |
| Bibliométrie | 0,000 | 0,000 |
| Études des sciences et des technologies | 0,000 | 0,000 |
| Communication savante | 0,000 | 0,001 |
| Science ouverte | 0,001 | 0,000 |
| Intégrité de la recherche | 0,000 | 0,000 |
| Charge utile insuffisante (le modèle a refusé de juger) | 0,002 | 0,000 |
Scores machine (provisoires)
Les deux têtes enseignantes du modèle étudiant, lues sur ce travail. Un score ordonne la base pour la relecture; il n'affirme jamais une catégorie, et le statut de validation accompagne chaque rangée tel quel.
Scores de référence d'un modèle non mature (critères de maturité non atteints, 7 itérations). Un score ordonne; il n'affirme jamais une catégorie.
score_only:v0-immature-baseline · tel quel depuis la passe de notation : score_only signifie que le nombre peut ordonner les travaux, et qu'aucune étiquette de catégorie n'en découleClassification
machine, non validéePrédiction automatique; un appel candidat d’une seule tête enseignante, pas un consensus.
Le détail, modèle par modèle et score par score, se trouve en fin de page sous « Comment cette classification a été obtenue ».