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Record W1543135069 · doi:10.1109/intlec.2004.1401516

Failures of MOSFETs in terrestrial power electronics due to single event burnout

2005· article· en· W1543135069 on OpenAlexaff
Carolyn Davidson, E. W. Blackmore, Jürgen Hess

Bibliographic record

Venuenot available
Typearticle
Languageen
FieldEngineering
TopicRadiation Effects in Electronics
Canadian institutionsTRIUMF
Fundersnot available
KeywordsElectronicsSemiconductor devicePower MOSFETCosmic rayMOSFETElectrical engineeringAvionicsPower electronicsPower semiconductor deviceHigh voltagePhysicsVoltageMaterials scienceEngineeringNuclear physicsAerospace engineeringTransistorNanotechnology

Abstract

fetched live from OpenAlex

Failures of semiconductor devices caused by cosmic radiation exposure is well known in space and avionics applications. However it is not well known that similar issues exist, to a lesser extent, for terrestrial applications. We have conducted research into the phenomenon of single event burnout (SEB) of high voltage power electronics semiconductor devices, specifically MOSFETs that are ubiquitously used in modern switchmode power electronics. The research revealed that SEB and related effects, caused by high-energy neutrons generated by the impact of cosmic radiation on our upper atmosphere, are a real possibility at ground level. An introduction and overview of the SEB effect, a review of existing literature indicating the flux and energy distribution of neutrons that reach the earth's surface and an overview of the structure of MOSFET devices indicating why they could be susceptible to the SEB effect is given. Experiments were conducted which demonstrated that random failures of high voltage MOSFET devices, when they are biased in the off state, do occur at a much higher rate than should otherwise be expected. A summary of experiments that were carried out at the TRIUMF cyclotron laboratory on both individual MOSFETs and on electronic equipment containing MOSFETs is presented. These experiments provide strong evidence that failures of MOSFETs and circuits using MOSFETs can be caused by neutrons with energy distributions similar to that experienced on the earth's surface.

Fetched live from OpenAlex and de-inverted. Abstracts are not stored in this database: the inverted indexes are 8.6 GB of the frame’s 9.3 GB of text, and the host has 13 GB free.

How this classification was reachedexpand

Full frame machine prediction

Teacher imitation

Not calibrated prevalence, not ground truth. Human validation pending. The Gemma side is a direct model label for every work in the frame, read from the title-only record. The Codex side is a classifier learned from the 10,348 direct Codex labels and calibrated to design-weighted sample rates; fields without enough sample support carry no Codex call. Candidate is the union of the two sides; consensus is their intersection. These outputs are machine_predicted_unvalidated and are not human labels.

metaresearch head score (Codex)0.000
metaresearch head score (Gemma)0.001
Version: metacan-v3-hybrid-931329e0061cValidation status: machine_predicted_unvalidated
Candidate categoriesnone
Consensus categoriesnone
DomainCandidate signal: none · Consensus signal: none
Study designCandidate signal: Bench or experimental · Consensus signal: Bench or experimental
GenreCandidate signal: Empirical · Consensus signal: Empirical
Teacher disagreement score0.001
Threshold uncertainty score0.004

Distilled classifier scores by category (both heads)

CategoryCodexGemma
Metaresearch0.0000.001
Meta-epidemiology (narrow)0.0000.000
Meta-epidemiology (broad)0.0000.000
Bibliometrics0.0010.001
Science and technology studies0.0000.001
Scholarly communication0.0000.000
Open science0.0000.000
Research integrity0.0010.000
Insufficient payload (model declined to judge)0.0010.000

Machine scores (provisional)

The two teacher heads of the student model, read on this work. A score orders the frame for review; it never asserts a category, and the validation status ships verbatim with every row.

Baseline scores from an immature model (maturity gate not passed, 7 training rounds). Scores rank; they never assert a category.

Opus teacher head0.004
GPT teacher head0.213
Teacher spread0.210 · how far apart the two teachers sit on this one work
Validation statusscore_only:v0-immature-baseline · verbatim from the scoring run: score_only means the number may rank works, and no category label ships from it

Classification

machine, unvalidated

Machine predicted; a candidate call from one source (direct Gemma or distilled Codex), not a consensus.

The models applied no category: nothing in the taxonomy fit this work.
Study designBench or experimental
Domainnot available
GenreEmpirical

How this classification was reached, model by model and score by score, is at the end of the page under "How this classification was reached".

Quick stats

Citations13
Published2005
Admission routes1
Has abstractyes

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Same topicRadiation Effects in ElectronicsFrench-language works237,207