Employing transistor reliability testing as an FA tool for understanding HTOL product BIST failures
Bibliographic record
Abstract
We observed large Vmin shift on products produced using 28nm process during high temperature operating life (HTOL) testing. Failure analysis (FA) revealed that some of the n-channel metal oxide semiconductor field-effect (MOSFET) transistors of the failing cells have very low threshold (Vt) voltages. Those measured Vt values were unexpected and caused concern. In this study, we present the use of transistor reliability testing using nano-probing as an FA tool for understanding the built-in self-test (BIST) failures that we observed on some products during HTOL qualification. The study identified that the Vt shift was due to parametric shift under off-state stress. We found that the off-state stress (Vd = Vs = Vstress and Vg=0) caused the Vt to shift to lower value creating large imbalance in the cells, which caused Vmin failure. A correlation was found between the initial Vt value and the Vt shift. The finding led to employing additional Vmin guardband and changes in the stress pattern used during HTOL stress.
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How this classification was reachedexpand
Full frame distilled prediction
Teacher imitationNot calibrated prevalence, not ground truth. Human validation pending. Learned from the 10,348 direct Codex labels and 10,348 direct Gemma labels. Candidate is the union of thresholded teacher heads; consensus is their intersection. These outputs are machine_predicted_unvalidated and are not human labels or direct frontier model labels.
Codex and Gemma teacher scores by category
| Category | Codex | Gemma |
|---|---|---|
| Metaresearch | 0.000 | 0.000 |
| Meta-epidemiology (narrow) | 0.000 | 0.000 |
| Meta-epidemiology (broad) | 0.000 | 0.000 |
| Bibliometrics | 0.000 | 0.000 |
| Science and technology studies | 0.000 | 0.000 |
| Scholarly communication | 0.000 | 0.000 |
| Open science | 0.000 | 0.000 |
| Research integrity | 0.000 | 0.000 |
| Insufficient payload (model declined to judge) | 0.000 | 0.000 |
Machine scores (provisional)
The two teacher heads of the student model, read on this work. A score orders the frame for review; it never asserts a category, and the validation status ships verbatim with every row.
Baseline scores from an immature model (maturity gate not passed, 7 training rounds). Scores rank; they never assert a category.
score_only:v0-immature-baseline · verbatim from the scoring run: score_only means the number may rank works, and no category label ships from itClassification
machine, unvalidatedMachine predicted; a candidate call from one teacher head, not a consensus.
How this classification was reached, model by model and score by score, is at the end of the page under "How this classification was reached".