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Uncertainty analysis for the coefficient of band-to-band absorption of crystalline silicon

2015· article· en· 498 citations· W1606941831 on OpenAlex· 10.1063/1.4923379

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Canadian funderA Canadian agency funded it. The work may carry no Canadian affiliation at all.

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Opus teacher head0.019
GPT teacher head0.264
Teacher spread
0.245 · how far apart the two teachers sit on this one work
Validation status
score_only:v0-immature-baseline · verbatim from the scoring run: score_only means the number may rank works, and no category label ships from it

Abstract

We analyze the uncertainty of the coefficient of band-to-band absorption of crystalline silicon. For this purpose, we determine the absorption coefficient at room temperature (295 K) in the wavelength range from 250 to 1450 nm using four different measurement methods. The data presented in this work derive from spectroscopic ellipsometry, measurements of reflectance and transmittance, spectrally resolved luminescence measurements and spectral responsivity measurements. A systematic measurement uncertainty analysis based on the Guide to the expression of uncertainty in measurement (GUM) as well as an extensive characterization of the measurement setups are carried out for all methods. We determine relative uncertainties of the absorption coefficient of 0.4% at 250 nm, 11% at 600 nm, 1.4% at 1000 nm, 12% at 1200 nm and 180% at 1450 nm. The data are consolidated by intercomparison of results obtained at different institutions and using different measurement approaches.

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The record

Venue
AIP Advances
Topic
Photonic and Optical Devices
Field
Engineering
Canadian institutions
Funders
Institute of Gender and HealthLeibniz-GemeinschaftGottfried Wilhelm Leibniz Universität HannoverDeutsche ForschungsgemeinschaftDeutsche Bundesstiftung Umwelt
Keywords
Attenuation coefficientMaterials scienceTransmittanceAbsorption (acoustics)SiliconMeasurement uncertaintyOpticsCrystalline siliconAnalytical Chemistry (journal)EllipsometryTemperature coefficientMolar absorptivityWavelengthOptoelectronicsThin filmChemistryPhysicsNanotechnology
Has abstract in OpenAlex
yes