MétaCan
Menu
Back to cohort
Record W2047485186 · doi:10.1117/12.845561

Electronic noise comparison of amorphous silicon current mode and voltage mode active pixel sensors for large area digital x-ray imaging

2010· article· en· W2047485186 on OpenAlexaff
Dali Wu, N. Safavian, Mohammad Y. Yazdandoost, Mohammad Hadi Izadi, Karim S. Karim

Bibliographic record

VenueProceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2010
Typearticle
Languageen
FieldEngineering
TopicCCD and CMOS Imaging Sensors
Canadian institutionsUniversity of Waterloo
Fundersnot available
KeywordsFlicker noiseFlickerNoise (video)VoltageSiliconMaterials scienceNoise generatorPixelMode (computer interface)Y-factorOptoelectronicsAmorphous siliconElectrical engineeringElectronic engineeringOpticsComputer sciencePhysicsNoise figureEngineeringCrystalline siliconCMOSImage (mathematics)Artificial intelligence

Abstract

fetched live from OpenAlex

A detailed experimental and theoretical investigation of noise in both current mode and voltage mode amorphous silicon (a-Si) active pixel sensors (APS) has been performed. Both flicker (1/f) and thermal are considered in this study. The experimental result in this paper emphasizes the computation of the output noise variance. The theoretical analysis shows that the voltage mode APS has an advantage over the current mode APS in terms of the flicker noise due to the operation of the readout process. The experimental data are compared to the theoretical analysis and are in good agreement.

Fetched live from OpenAlex and de-inverted. Abstracts are not stored in this database: the inverted indexes are 8.6 GB of the frame’s 9.3 GB of text, and the host has 13 GB free.

How this classification was reachedexpand

Full frame distilled prediction

Teacher imitation

Not calibrated prevalence, not ground truth. Human validation pending. Learned from the 10,348 direct Codex labels and 10,348 direct Gemma labels. Candidate is the union of thresholded teacher heads; consensus is their intersection. These outputs are machine_predicted_unvalidated and are not human labels or direct frontier model labels.

metaresearch head score (Codex)0.000
metaresearch head score (Gemma)0.000
Version: codex-gemma-dda1882f352aValidation status: machine_predicted_unvalidated
Candidate categoriesMeta-epidemiology (narrow)
Consensus categoriesnone
DomainCandidate signal: none · Consensus signal: none
Study designCandidate signal: Bench or experimental · Consensus signal: none
GenreCandidate signal: Empirical · Consensus signal: Empirical
Teacher disagreement score0.758
Threshold uncertainty score1.000

Codex and Gemma teacher scores by category

CategoryCodexGemma
Metaresearch0.0000.000
Meta-epidemiology (narrow)0.0000.000
Meta-epidemiology (broad)0.0010.001
Bibliometrics0.0000.000
Science and technology studies0.0000.000
Scholarly communication0.0000.001
Open science0.0010.000
Research integrity0.0000.001
Insufficient payload (model declined to judge)0.0000.000

Machine scores (provisional)

The two teacher heads of the student model, read on this work. A score orders the frame for review; it never asserts a category, and the validation status ships verbatim with every row.

Baseline scores from an immature model (maturity gate not passed, 7 training rounds). Scores rank; they never assert a category.

Opus teacher head0.007
GPT teacher head0.239
Teacher spread0.232 · how far apart the two teachers sit on this one work
Validation statusscore_only:v0-immature-baseline · verbatim from the scoring run: score_only means the number may rank works, and no category label ships from it

Classification

machine, unvalidated

Machine predicted; a candidate call from one teacher head, not a consensus.

Study designBench or experimental
Domainnot available
GenreEmpirical

How this classification was reached, model by model and score by score, is at the end of the page under "How this classification was reached".

Quick stats

Citations1
Published2010
Admission routes1
Has abstractyes

Explore more

Same venueProceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIESame topicCCD and CMOS Imaging SensorsFrench-language works237,207