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Record W2053161408 · doi:10.2320/matertrans.m2009314

A New Non-PRM Bumping Process by Electroplating on Si Die for Three Dimensional Packaging

2010· article· en· W2053161408 on OpenAlex

Why this work is in the frame

A frame that forgets how it found something cannot be audited. These are the routes that admitted this work.

affAt least one author lists a Canadian institution in the pinned OpenAlex snapshot.

Bibliographic record

VenueMATERIALS TRANSACTIONS · 2010
Typearticle
Languageen
FieldEngineering
Topic3D IC and TSV technologies
Canadian institutionsUniversity of Waterloo
FundersNational Research Foundation of KoreaNational Research Foundation
KeywordsBumpingMaterials scienceElectroplatingWaferEtching (microfabrication)PolishingLayer (electronics)MetallurgyDeep reactive-ion etchingSolderingChemical-mechanical planarizationReactive-ion etchingSiliconComposite materialOptoelectronics

Abstract

fetched live from OpenAlex

A new bumping process on a Si die by electroplating without a photo-resist-mold (PRM) was assessed for the three dimensional (3D) stacking of Si dice. In this process, solder bumps were deposited selectively onto the surface of a Cu plugged-through silicon-via (TSV) in a Si die. Since lithography related processes to make a PRM for solder bumping were omitted, it can reduce the production time and cost for bumping. The substrate was a Si wafer, and TSVs were produced by deep-ion-reactive-etching (DRIE). As an insulation layer, SiO2 was formed by high-density-plasma-chemical-vapor-deposition (HDPCVD) or wet oxidation method. A Ti adhesion and an Au seed layers were deposited by sputtering. Cu was plugged into the vias by pulsed direct-current (DC) electroplating. The backside of the Si wafer was ground by chemical-mechanical-polishing (CMP). Sn bumps were electroplated on the Cu plugged vias by a current supplied through a Cu-overplated layer (COL) on the vias surface. As experimental results, wet oxidation provided a uniform SiO2 thickness through the via depth, whereas the SiO2 thickness by HDPCVD decreased with the via depth. The Ti and Au thicknesses also decreased along the via depth. In electroplating for Cu plugging, defect-free Cu plug was achieved by pulsed DC for 18 h, where one cycle composed of a 5 s cathodic term with −12.2 mA·cm−2 and a 25 s anodic term with 2.3 mA·cm−2. Sn bumping using COL without PRM was accomplished successfully at a current density of −30 mA·cm−2 for 15 min. The diameter and height of the Sn bumps ranged from 48.5 to 52 μm and 22 to 25 μm, respectively. The bumps had a rivet head shape without a columnar part and showed facets on the bump surface. The COL was removed by CMP without damage to the bumps.

Fetched live from OpenAlex and de-inverted. Abstracts are not stored in this database: the inverted indexes are 8.6 GB of the frame’s 9.3 GB of text, and the host has 13 GB free.

Full frame distilled prediction

Teacher imitation

Not calibrated prevalence, not ground truth. Human validation pending. Learned from the 10,348 direct Codex labels and 10,348 direct Gemma labels. Candidate is the union of thresholded teacher heads; consensus is their intersection. These outputs are machine_predicted_unvalidated and are not human labels or direct frontier model labels.

metaresearch head score (Codex)0.000
metaresearch head score (Gemma)0.000
Version: codex-gemma-dda1882f352aValidation status: machine_predicted_unvalidated
Candidate categoriesnone
Consensus categoriesnone
DomainCandidate signal: none · Consensus signal: none
Study designCandidate signal: Bench or experimental · Consensus signal: Bench or experimental
GenreCandidate signal: Empirical · Consensus signal: Empirical
Teacher disagreement score0.396
Threshold uncertainty score0.619

Codex and Gemma teacher scores by category

CategoryCodexGemma
Metaresearch0.0000.000
Meta-epidemiology (narrow)0.0000.000
Meta-epidemiology (broad)0.0000.000
Bibliometrics0.0000.000
Science and technology studies0.0000.000
Scholarly communication0.0000.000
Open science0.0000.000
Research integrity0.0000.000
Insufficient payload (model declined to judge)0.0000.000

Machine scores (provisional)

The two teacher heads of the student model, read on this work. A score orders the frame for review; it never asserts a category, and the validation status ships verbatim with every row.

Baseline scores from an immature model (maturity gate not passed, 7 training rounds). Scores rank; they never assert a category.

Opus teacher head0.006
GPT teacher head0.217
Teacher spread0.211 · how far apart the two teachers sit on this one work
Validation statusscore_only:v0-immature-baseline · verbatim from the scoring run: score_only means the number may rank works, and no category label ships from it