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Record W2058020757 · doi:10.1117/12.380097

<title>Intelligent high-sensitivity CCD line scan camera with embedded image processing algorithms</title>

2000· article· en· W2058020757 on OpenAlexaff
Dan A. Lehotsky

Bibliographic record

VenueProceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2000
Typearticle
Languageen
FieldEngineering
TopicCCD and CMOS Imaging Sensors
Canadian institutionsDalsa Corporation
Fundersnot available
KeywordsFirmwareComputer scienceThresholdingImage processingArtificial intelligenceComputer hardwareSmart cameraDigital image processingController (irrigation)Computer visionCamera moduleField-programmable gate arrayGrayscaleAlgorithmEmbedded systemImage (mathematics)

Abstract

fetched live from OpenAlex

A high performance, high sensitivity, CCD line scan camera for use in machine vision systems is presented. The camera incorporates an on-board micro-controller as well as PLD's (programmable logic devices) that allow computer control of image acquisition, image processing, and image analysis. The micro-controller/PLD combination provide embedded image processing/analysis capability whereby data compression can be achieved thus reducing the system hardware requirements. Users have control over algorithm parameters thus allowing for dynamic changes in the inspection target. Algorithms and micro-controller firmware are completely in-system programmable via a serial communications link. Static and adaptive gray scale thresholding algorithms are presented as well as a sample application where a maximum of twenty cameras can be networked together to a single host computer. Applications for the camera include web inspection, parts inspection, template matching and gauging.

Fetched live from OpenAlex and de-inverted. Abstracts are not stored in this database: the inverted indexes are 8.6 GB of the frame’s 9.3 GB of text, and the host has 13 GB free.

How this classification was reachedexpand

Full frame distilled prediction

Teacher imitation

Not calibrated prevalence, not ground truth. Human validation pending. Learned from the 10,348 direct Codex labels and 10,348 direct Gemma labels. Candidate is the union of thresholded teacher heads; consensus is their intersection. These outputs are machine_predicted_unvalidated and are not human labels or direct frontier model labels.

metaresearch head score (Codex)0.000
metaresearch head score (Gemma)0.000
Version: codex-gemma-dda1882f352aValidation status: machine_predicted_unvalidated
Candidate categoriesMeta-epidemiology (narrow)
Consensus categoriesnone
DomainCandidate signal: none · Consensus signal: none
Study designCandidate signal: Bench or experimental · Consensus signal: none
GenreCandidate signal: Empirical · Consensus signal: Empirical
Teacher disagreement score0.626
Threshold uncertainty score1.000

Codex and Gemma teacher scores by category

CategoryCodexGemma
Metaresearch0.0000.000
Meta-epidemiology (narrow)0.0000.000
Meta-epidemiology (broad)0.0000.000
Bibliometrics0.0000.000
Science and technology studies0.0000.000
Scholarly communication0.0000.000
Open science0.0000.000
Research integrity0.0000.000
Insufficient payload (model declined to judge)0.0000.000

Machine scores (provisional)

The two teacher heads of the student model, read on this work. A score orders the frame for review; it never asserts a category, and the validation status ships verbatim with every row.

Baseline scores from an immature model (maturity gate not passed, 7 training rounds). Scores rank; they never assert a category.

Opus teacher head0.007
GPT teacher head0.214
Teacher spread0.207 · how far apart the two teachers sit on this one work
Validation statusscore_only:v0-immature-baseline · verbatim from the scoring run: score_only means the number may rank works, and no category label ships from it

Classification

machine, unvalidated

Machine predicted; a candidate call from one teacher head, not a consensus.

Study designBench or experimental
Domainnot available
GenreEmpirical

How this classification was reached, model by model and score by score, is at the end of the page under "How this classification was reached".

Quick stats

Citations2
Published2000
Admission routes1
Has abstractyes

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Same venueProceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIESame topicCCD and CMOS Imaging SensorsFrench-language works237,207