MétaCan
Menu
Back to cohort
Record W2080426093 · doi:10.1088/0960-1317/16/8/020

Processing of a semiconductor wafer using the femtosecond laser directly from an oscillator

2006· article· en· W2080426093 on OpenAlexaff
Krishnan Venkatakrishnan, Bo Tan

Bibliographic record

VenueJournal of Micromechanics and Microengineering · 2006
Typearticle
Languageen
FieldEngineering
TopicIntegrated Circuits and Semiconductor Failure Analysis
Canadian institutionsToronto Metropolitan University
Fundersnot available
KeywordsFemtosecondWaferMaterials scienceLaserOptoelectronicsSemiconductorSemiconductor device fabricationPulse (music)Focused ion beamElectronic engineeringOpticsEngineeringIonPhysics

Abstract

fetched live from OpenAlex

A focused ion beam (FIB) is extensively used in various semiconductor processing applications, although the process is expensive and slow. In this paper we introduce an alternative technique using femtosecond laser pulse emitting directly from a laser oscillator. We demonstrated layer-by-layer removal in an IC circuit for inspection/failure analysis without damaging the underlying structures. There are two prime advantages of this technique. Firstly, the cost of the system is a fraction of that of a FIB machine. Secondly, the machine time is significantly shortened compared to that of a FIB process. Means to improve the accuracy, quality and resolution using a femtosecond laser pulse from the oscillator is discussed.

Fetched live from OpenAlex and de-inverted. Abstracts are not stored in this database: the inverted indexes are 8.6 GB of the frame’s 9.3 GB of text, and the host has 13 GB free.

How this classification was reachedexpand

Full frame machine prediction

Teacher imitation

Not calibrated prevalence, not ground truth. Human validation pending. The Gemma side is a direct model label for every work in the frame, read from the title-only record. The Codex side is a classifier learned from the 10,348 direct Codex labels and calibrated to design-weighted sample rates; fields without enough sample support carry no Codex call. Candidate is the union of the two sides; consensus is their intersection. These outputs are machine_predicted_unvalidated and are not human labels.

metaresearch head score (Codex)0.000
metaresearch head score (Gemma)0.000
Version: metacan-v3-hybrid-931329e0061cValidation status: machine_predicted_unvalidated
Candidate categoriesnone
Consensus categoriesnone
DomainCandidate signal: none · Consensus signal: none
Study designCandidate signal: Bench or experimental · Consensus signal: Bench or experimental
GenreCandidate signal: Empirical · Consensus signal: Empirical
Teacher disagreement score0.001
Threshold uncertainty score0.005

Distilled classifier scores by category (both heads)

CategoryCodexGemma
Metaresearch0.0000.000
Meta-epidemiology (narrow)0.0000.000
Meta-epidemiology (broad)0.0000.000
Bibliometrics0.0000.000
Science and technology studies0.0000.000
Scholarly communication0.0000.000
Open science0.0000.000
Research integrity0.0000.000
Insufficient payload (model declined to judge)0.0010.000

Machine scores (provisional)

The two teacher heads of the student model, read on this work. A score orders the frame for review; it never asserts a category, and the validation status ships verbatim with every row.

Baseline scores from an immature model (maturity gate not passed, 7 training rounds). Scores rank; they never assert a category.

Opus teacher head0.007
GPT teacher head0.196
Teacher spread0.189 · how far apart the two teachers sit on this one work
Validation statusscore_only:v0-immature-baseline · verbatim from the scoring run: score_only means the number may rank works, and no category label ships from it

Classification

machine, unvalidated

Machine predicted; a candidate call from one source (direct Gemma or distilled Codex), not a consensus.

The models applied no category: nothing in the taxonomy fit this work.
Study designBench or experimental
Domainnot available
GenreEmpirical

How this classification was reached, model by model and score by score, is at the end of the page under "How this classification was reached".

Quick stats

Citations4
Published2006
Admission routes1
Has abstractyes

Explore more

Same venueJournal of Micromechanics and MicroengineeringSame topicIntegrated Circuits and Semiconductor Failure AnalysisFrench-language works237,207