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Record W2089377766 · doi:10.1109/ipfa.2007.4378091

Soft Defects: Challenge and Chance for Failure Analysis

2007· article· en· W2089377766 on OpenAlexaff
Christian Burmer, Christof Brillert, Zhongling Qian

Bibliographic record

Venuenot available
Typearticle
Languageen
FieldEngineering
TopicIntegrated Circuits and Semiconductor Failure Analysis
Canadian institutionsInfineon Technologies (Canada)
Fundersnot available
KeywordsSIGNAL (programming language)Computer scienceReliability engineeringSignal-flow graphLogic gateElectronic engineeringEngineeringAlgorithmElectrical engineeringProgramming language

Abstract

fetched live from OpenAlex

Failure analysis on advanced logic and mixed signal ICs more and more has to deal with so called 'soft defects'. In this paper, an analysis flow especially for parameter dependent scan fails is presented. For the two major localization techniques, namely soft defect localization (SDL) and internal signal measurement enhanced activation and localization procedures using test systems are proposed.

Fetched live from OpenAlex and de-inverted. Abstracts are not stored in this database: the inverted indexes are 8.6 GB of the frame’s 9.3 GB of text, and the host has 13 GB free.

How this classification was reachedexpand

Full frame machine prediction

Teacher imitation

Not calibrated prevalence, not ground truth. Human validation pending. The Gemma side is a direct model label for every work in the frame, read from the title-only record. The Codex side is a classifier learned from the 10,348 direct Codex labels and calibrated to design-weighted sample rates; fields without enough sample support carry no Codex call. Candidate is the union of the two sides; consensus is their intersection. These outputs are machine_predicted_unvalidated and are not human labels.

metaresearch head score (Codex)0.005
metaresearch head score (Gemma)0.016
Version: metacan-v3-hybrid-931329e0061cValidation status: machine_predicted_unvalidated
Candidate categoriesnone
Consensus categoriesnone
DomainCandidate signal: none · Consensus signal: none
Study designCandidate signal: Not applicable · Consensus signal: none
GenreCandidate signal: Empirical · Consensus signal: none
Teacher disagreement score0.006
Threshold uncertainty score0.027

Distilled classifier scores by category (both heads)

CategoryCodexGemma
Metaresearch0.0050.016
Meta-epidemiology (narrow)0.0010.000
Meta-epidemiology (broad)0.0010.001
Bibliometrics0.0030.001
Science and technology studies0.0010.003
Scholarly communication0.0030.007
Open science0.0010.002
Research integrity0.0020.002
Insufficient payload (model declined to judge)0.0060.001

Machine scores (provisional)

The two teacher heads of the student model, read on this work. A score orders the frame for review; it never asserts a category, and the validation status ships verbatim with every row.

Baseline scores from an immature model (maturity gate not passed, 7 training rounds). Scores rank; they never assert a category.

Opus teacher head0.009
GPT teacher head0.216
Teacher spread0.207 · how far apart the two teachers sit on this one work
Validation statusscore_only:v0-immature-baseline · verbatim from the scoring run: score_only means the number may rank works, and no category label ships from it

Classification

machine, unvalidated

Machine predicted; a candidate call from one source (direct Gemma or distilled Codex), not a consensus.

The models applied no category: nothing in the taxonomy fit this work.
Study designNot applicable
Domainnot available
GenreEmpirical

How this classification was reached, model by model and score by score, is at the end of the page under "How this classification was reached".

Quick stats

Citations7
Published2007
Admission routes1
Has abstractyes

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Same topicIntegrated Circuits and Semiconductor Failure AnalysisFrench-language works237,207